JP2016516464A5 - - Google Patents

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Publication number
JP2016516464A5
JP2016516464A5 JP2015562518A JP2015562518A JP2016516464A5 JP 2016516464 A5 JP2016516464 A5 JP 2016516464A5 JP 2015562518 A JP2015562518 A JP 2015562518A JP 2015562518 A JP2015562518 A JP 2015562518A JP 2016516464 A5 JP2016516464 A5 JP 2016516464A5
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JP
Japan
Prior art keywords
image data
intensity
pixel
regression model
residual
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JP2015562518A
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English (en)
Japanese (ja)
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JP6251297B2 (ja
JP2016516464A (ja
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Priority claimed from PCT/IB2014/059770 external-priority patent/WO2014141163A2/en
Publication of JP2016516464A publication Critical patent/JP2016516464A/ja
Publication of JP2016516464A5 publication Critical patent/JP2016516464A5/ja
Application granted granted Critical
Publication of JP6251297B2 publication Critical patent/JP6251297B2/ja
Expired - Fee Related legal-status Critical Current
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JP2015562518A 2013-03-15 2014-03-14 デュアルエネルギー画像からの残差モード画像の決定 Expired - Fee Related JP6251297B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361787489P 2013-03-15 2013-03-15
US61/787,489 2013-03-15
PCT/IB2014/059770 WO2014141163A2 (en) 2013-03-15 2014-03-14 Determining a residual mode image from a dual energy image

Publications (3)

Publication Number Publication Date
JP2016516464A JP2016516464A (ja) 2016-06-09
JP2016516464A5 true JP2016516464A5 (OSRAM) 2017-06-01
JP6251297B2 JP6251297B2 (ja) 2017-12-20

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015562518A Expired - Fee Related JP6251297B2 (ja) 2013-03-15 2014-03-14 デュアルエネルギー画像からの残差モード画像の決定

Country Status (5)

Country Link
US (1) US9706968B2 (OSRAM)
EP (1) EP2973391B1 (OSRAM)
JP (1) JP6251297B2 (OSRAM)
CN (1) CN105122300B (OSRAM)
WO (1) WO2014141163A2 (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107111881B (zh) * 2014-12-16 2021-06-15 皇家飞利浦有限公司 对应性概率图驱动的可视化
JP7161212B2 (ja) 2017-05-16 2022-10-26 株式会社ジョブ Ｘ線検査におけるデータ処理装置及びデータ処理方法、並びに、その装置を搭載したｘ線検査装置
EP3441005B1 (de) * 2017-08-11 2022-04-06 Siemens Healthcare GmbH Analyse von läsionen mit hilfe der multi-energie-ct-bildgebung
CN107595311A (zh) * 2017-08-30 2018-01-19 沈阳东软医疗系统有限公司 双能量ct图像处理方法、装置以及设备
JP7120662B2 (ja) * 2017-09-22 2022-08-17 ザ・ユニバーシティ・オブ・シカゴ 低線量マルチスペクトルｘ線トモグラフィーのためのシステムおよび方法
US10830855B2 (en) * 2018-03-28 2020-11-10 University Of Virginia Patent Foundation Free-breathing cine DENSE imaging

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Publication number Priority date Publication date Assignee Title
US4789930A (en) 1985-11-15 1988-12-06 Picker International, Inc. Energy dependent gain correction for radiation detection
AUPO525897A0 (en) 1997-02-24 1997-03-20 Redflex Traffic Systems Pty Ltd Digital image processing
US20020186875A1 (en) * 2001-04-09 2002-12-12 Burmer Glenna C. Computer methods for image pattern recognition in organic material
WO2005101312A2 (en) * 2004-04-13 2005-10-27 Aic Fractal skr-method for evaluating image quality
US7599465B2 (en) 2004-11-19 2009-10-06 General Electric Company Detection of thrombi in CT using energy discrimination
US20080292194A1 (en) * 2005-04-27 2008-11-27 Mark Schmidt Method and System for Automatic Detection and Segmentation of Tumors and Associated Edema (Swelling) in Magnetic Resonance (Mri) Images
FR2932298B1 (fr) 2008-06-06 2010-07-30 Gen Electric Procede de traitement d'une image radiologique d'un organe
CN101394487B (zh) 2008-10-27 2011-09-14 华为技术有限公司 一种合成图像的方法与系统
CN102549623B (zh) 2009-06-10 2014-11-19 皇家飞利浦电子股份有限公司 用于将图像数据集可视化的可视化设备
EP2489008A1 (en) 2009-10-13 2012-08-22 Ramot at Tel-Aviv University Ltd. Method and system for processing an image
GB201006046D0 (en) * 2010-04-12 2010-05-26 Ge Healthcare Uk Ltd System and method for determining motion of a biological object
KR20120007892A (ko) 2010-07-15 2012-01-25 삼성전자주식회사 영상 처리 방법 및 장치와 이를 채용한 의료영상시스템
RU2596995C2 (ru) * 2010-11-26 2016-09-10 Конинклейке Филипс Электроникс Н.В. Устройство обработки изображения
US8818069B2 (en) * 2010-11-30 2014-08-26 General Electric Company Methods for scaling images to differing exposure times
JP6278519B2 (ja) * 2012-11-28 2018-02-21 国立研究開発法人科学技術振興機構 細胞観察装置、細胞観察方法及びそのプログラム

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