JP2016506504A5 - - Google Patents

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Publication number
JP2016506504A5
JP2016506504A5 JP2015546110A JP2015546110A JP2016506504A5 JP 2016506504 A5 JP2016506504 A5 JP 2016506504A5 JP 2015546110 A JP2015546110 A JP 2015546110A JP 2015546110 A JP2015546110 A JP 2015546110A JP 2016506504 A5 JP2016506504 A5 JP 2016506504A5
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JP
Japan
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ray
energy
determined
information
photon
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JP2015546110A
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English (en)
Japanese (ja)
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JP6691775B2 (ja
JP2016506504A (ja
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Priority claimed from PCT/IB2013/058973 external-priority patent/WO2014087264A1/en
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Publication of JP2016506504A5 publication Critical patent/JP2016506504A5/ja
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JP2015546110A 2012-12-04 2013-09-29 Ｘ線画像情報の画像補正方法及び装置 Active JP6691775B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261733016P 2012-12-04 2012-12-04
US61/733,016 2012-12-04
PCT/IB2013/058973 WO2014087264A1 (en) 2012-12-04 2013-09-29 Method and apparatus for image correction of x-ray image information

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2019009856A Division JP6814235B2 (ja) 2012-12-04 2019-01-24 Ｘ線画像情報の画像補正方法及び装置

Publications (3)

Publication Number Publication Date
JP2016506504A JP2016506504A (ja) 2016-03-03
JP2016506504A5 true JP2016506504A5 (OSRAM) 2017-07-06
JP6691775B2 JP6691775B2 (ja) 2020-05-13

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ID=49911748

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JP2015546110A Active JP6691775B2 (ja) 2012-12-04 2013-09-29 Ｘ線画像情報の画像補正方法及び装置
JP2019009856A Active JP6814235B2 (ja) 2012-12-04 2019-01-24 Ｘ線画像情報の画像補正方法及び装置

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JP2019009856A Active JP6814235B2 (ja) 2012-12-04 2019-01-24 Ｘ線画像情報の画像補正方法及び装置

Country Status (7)

Country Link
US (1) US9746566B2 (OSRAM)
EP (1) EP2929372B1 (OSRAM)
JP (2) JP6691775B2 (OSRAM)
CN (1) CN104838288B (OSRAM)
BR (1) BR112015012779A2 (OSRAM)
RU (1) RU2015126606A (OSRAM)
WO (1) WO2014087264A1 (OSRAM)

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JP6242683B2 (ja) * 2012-12-27 2017-12-06 東芝メディカルシステムズ株式会社 Ｘ線ｃｔ装置及び制御方法
WO2014163187A1 (ja) * 2013-04-04 2014-10-09 株式会社 東芝 Ｘ線コンピュータ断層撮影装置
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
CN105793734B (zh) * 2013-11-27 2019-05-07 皇家飞利浦有限公司 用于探测光子的探测设备以及其方法
WO2015194512A1 (ja) * 2014-06-16 2015-12-23 株式会社東芝 フォトンカウンティング型ｘ線ｃｔ装置及びフォトンカウンティング型ｘ線診断装置
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
JP2016067947A (ja) * 2014-10-01 2016-05-09 株式会社東芝 Ｘ線ｃｔ装置、画像処理装置及び画像処理プログラム
US10660589B2 (en) 2014-12-16 2020-05-26 Koninklijke Philips N.V. Baseline shift determination for a photon detector
EP3350623B1 (en) 2015-09-18 2020-12-16 Koninklijke Philips N.V. Processing of a corrected x-ray detector signal
CN109313275B (zh) * 2016-06-07 2023-08-29 皇家飞利浦有限公司 针对辐射探测器的死区时间校准
WO2020039997A1 (ja) * 2018-08-22 2020-02-27 株式会社日立ハイテクノロジーズ 自動分析装置及び光計測方法
CN110956923B (zh) * 2019-12-24 2021-05-07 上海奕瑞光电子科技股份有限公司 低温多晶硅平板探测器像素电路及平板探测方法
EP3842839A1 (en) * 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
JP2024001425A (ja) * 2022-06-22 2024-01-10 キヤノンメディカルシステムズ株式会社 光子計数型ｘ線コンピュータ断層撮影装置、再構成処理装置、光子計数型情報取得方法、再構成処理方法、光子計数型情報取得プログラム、および再構成処理プログラム

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