JP2016222485A - Laser processing method - Google Patents

Laser processing method Download PDF

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JP2016222485A
JP2016222485A JP2015109381A JP2015109381A JP2016222485A JP 2016222485 A JP2016222485 A JP 2016222485A JP 2015109381 A JP2015109381 A JP 2015109381A JP 2015109381 A JP2015109381 A JP 2015109381A JP 2016222485 A JP2016222485 A JP 2016222485A
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laser
glass substrate
hole
processing method
drilling
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薫 占部
Kaoru Urabe
薫 占部
伊藤 靖
Yasushi Ito
靖 伊藤
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Via Mechanics Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a laser processing method capable of drilling a small diameter hole without preheating and without causing crack, when drilling processing is performed on a glass substrate by using carbonic acid gas laser.SOLUTION: The laser processing method for drilling a hole on the glass substrate by using carbonic acid gas laser includes: a first step for forming a non-through hole by irradiating laser from a protection sheet side at a hole position of the glass substrate on which the protection sheet is attached; a second step for performing annealing process by removing the protection sheet from the glass substrate; and a third step for changing the non-through hole to a through hole by polishing a non-irradiated side of the laser on the glass substrate.SELECTED DRAWING: Figure 1

Description

本発明は、炭酸ガスレーザを用いてガラス基板に穴明け加工する場合に好適な加工方法に係るものである。   The present invention relates to a processing method suitable for drilling a glass substrate using a carbon dioxide laser.

近年、携帯電話、薄型テレビ、パソコンディスプレイ等の普及に伴い、ICチップとマザーボードとの熱膨張率の差を緩和するために、その中間的な熱膨張率を持つガラス基板に貫通穴を明け、貫通電極を形成してICチップへの中継基板(インターポーザ)とする需要が高まっている。   In recent years, with the spread of mobile phones, flat-screen TVs, personal computer displays, etc., in order to reduce the difference in thermal expansion coefficient between the IC chip and the motherboard, a through hole is made in a glass substrate having an intermediate thermal expansion coefficient. There is an increasing demand for forming a through-electrode to be a relay substrate (interposer) to an IC chip.

従来、ガラス基板への穴明けはドリル加工が主流であったが、ドリルの激しい磨耗やクラックが入りやすいなどの問題があった。そのため、レーザによる穴明け加工が検討されているが、高出力で生産性が期待できる炭酸ガスレーザでは、クラックが入りやすい等の問題点がある。
クラックの発生を抑えるため、ガラス基板を予熱して穴明けする方法や穴明け後にガラス基板をフッ酸溶液に浸漬する方法が特許文献1に開示されている。しかしながら、前者の方法では、予熱して温まった状態で穴明けしなければならず、レーザ加工装置に特別の工夫が必要である。また後者の方法では、穴明け加工部をフッ酸溶液で
溶かすために穴径が大きくなるという問題点がある。
Conventionally, drilling has been the mainstream for drilling holes in glass substrates, but there have been problems such as severe wear and cracking of the drill. For this reason, drilling with a laser has been studied. However, a carbon dioxide laser that can be expected to have high output and high productivity has problems such as easy cracking.
In order to suppress the occurrence of cracks, Patent Document 1 discloses a method of preheating and drilling a glass substrate and a method of immersing the glass substrate in a hydrofluoric acid solution after drilling. However, in the former method, holes must be drilled in a preheated and warm state, and a special device is required for the laser processing apparatus. Further, the latter method has a problem that the hole diameter is increased because the drilled portion is dissolved with a hydrofluoric acid solution.

特開平2−30390号公報JP-A-2-30390

そこで本発明は、炭酸ガスレーザを用いてガラス基板に穴明け加工する場合に、予熱を与えずに、小さな穴径もクラックが発生することなく穴明けすることができるレーザ加工方法を提供することを目的とする。   Therefore, the present invention provides a laser processing method capable of drilling a small hole diameter without causing cracks when drilling a glass substrate using a carbon dioxide laser without causing preheating. Objective.

上記課題を解決するため、請求項1に記載のレーザ加工方法においては、炭酸ガスレーザを用いてガラス基板に穴明けするレーザ加工方法において、保護シートが貼られたガラス基板の前記穴明け位置に前記保護シート側から前記レーザを照射して未貫通穴を形成する第一のステップと、前記ガラス基板から前記保護シートを除去してアニーリング処理を行う第二のステップと、前記ガラス基板の前記レーザの非照射側を研磨処理して前記未貫通穴を貫通穴に変える第三のステップとを有することを特徴とする。   In order to solve the above-mentioned problem, in the laser processing method according to claim 1, in the laser processing method for drilling a glass substrate using a carbon dioxide laser, the hole is formed in the glass substrate on which a protective sheet is pasted. A first step of irradiating the laser from the protective sheet side to form a non-through hole, a second step of removing the protective sheet from the glass substrate and performing an annealing process, and the laser of the glass substrate And a third step of polishing the non-irradiated side to change the non-through hole into a through hole.

また、請求項2に記載のレーザ加工方法においては、請求項1に記載のレーザ加工方法において、前記第一ステップにおいては、前記穴明け位置の各々毎にレーザパルスを1個ずつ照射しながら穴位置を移動させるサイクル加工で行うことを特徴とする。   Further, in the laser processing method according to claim 2, in the laser processing method according to claim 1, in the first step, the laser beam is irradiated with one laser pulse for each of the drilling positions. It is characterized in that it is carried out by cycle machining that moves the position.

また、請求項3に記載のレーザ加工方法においては、請求項1に記載のレーザ加工方法において、前記第三ステップにおいては、前記ガラス基板の前記レーザの照射側も研磨処理することを特徴とする。   Further, in the laser processing method according to claim 3, in the laser processing method according to claim 1, in the third step, the laser irradiation side of the glass substrate is also polished. .

本発明によれば、炭酸ガスレーザを用いてガラス基板に穴明け加工する場合に、予熱を与えずに、小さな穴径もクラックが発生することなく穴明けすることができるレーザ加工方法を提供することができる。   According to the present invention, when drilling a glass substrate using a carbon dioxide laser, a laser processing method capable of drilling a small hole diameter without causing cracks without preheating is provided. Can do.

本発明の一実施例となるレーザ加工方法を説明するための工程図で、(a)〜(d)はガラス基板の様子をとらえた断面図である。It is process drawing for demonstrating the laser processing method used as one Example of this invention, (a)-(d) is sectional drawing which caught the mode of the glass substrate. 本発明の一実施例で用いるレーザ加工装置の構成図である。It is a block diagram of the laser processing apparatus used by one Example of this invention.

本発明の一実施例となるレーザ加工方法について説明する。
先ず第1のステップとして、図1(a)に示すように穴明けを行うべきガラス基板1の表面に接着剤2が付いた保護シート3を貼ったワーク基板4を用意する。ガラス基板1は例えば無アルカリガラスを材料とするものであり、保護シート3は接着剤2をガラス基板1側に残さずに容易に剥がせるものである。
A laser processing method according to an embodiment of the present invention will be described.
First, as a first step, a work substrate 4 is prepared in which a protective sheet 3 with an adhesive 2 is attached to the surface of a glass substrate 1 to be drilled as shown in FIG. The glass substrate 1 is made of, for example, alkali-free glass, and the protective sheet 3 can be easily peeled off without leaving the adhesive 2 on the glass substrate 1 side.

次に、第2のステップとして、図1(b)に示すように、ワーク基板4の穴明け位置に炭酸ガスレーザを照射して未貫通穴5を形成する。この場合、保護シート3は穴明け加工により発生する溶融ガラス成分がガラス基板1の表面に付着するのを防ぐ働きをする。   Next, as a second step, as shown in FIG. 1 (b), a non-through hole 5 is formed by irradiating the hole position of the work substrate 4 with a carbon dioxide laser. In this case, the protective sheet 3 functions to prevent the molten glass component generated by drilling from adhering to the surface of the glass substrate 1.

ここで用いるレーザ加工装置の構成図を図2に示すが、ここでの構成は一般的なものである。図2において、4は図示しないテーブル上に載置された加工すべきワーク基板、22はレーザパルスL1を発振する炭酸ガスレーザ発振器、23は炭酸ガスレーザ発振器22から出力されたレーザパルスL1を加工方向と非加工方向の二通りに分岐させる音響光学変調器(以下AOMと略す)、24はAOM23において加工方向へ分岐されたレーザパルスL2を順次ワーク基板4の穴明け位置に照射するガルバノスキャナである。このガルバノスキャナ24は回転することによりレーザパルスL2を走査するようになっている。25はAOM23において非加工方向へ分岐されたレーザパルスL3を吸収するダンパである。   FIG. 2 shows a configuration diagram of the laser processing apparatus used here, and the configuration here is general. In FIG. 2, 4 is a work substrate to be processed placed on a table (not shown), 22 is a carbon dioxide laser oscillator that oscillates a laser pulse L1, and 23 is a laser pulse L1 output from the carbon dioxide laser oscillator 22 as a machining direction. An acousto-optic modulator (hereinafter abbreviated as AOM) for branching in two ways in the non-machining direction, and 24 is a galvano scanner that sequentially irradiates the drilling position of the work substrate 4 with the laser pulse L2 branched in the machining direction in the AOM. The galvano scanner 24 scans the laser pulse L2 by rotating. A damper 25 absorbs the laser pulse L3 branched in the non-machining direction in the AOM 23.

26は装置全体の動作を制御する全体制御部で、炭酸ガスレーザ発振器22での個々のレーザパルスL1の発振を指示するレーザ発振指令信号Sを出力するレーザ発振制御部27、AOM23の分岐動作を制御するAOM駆動信号Dを出力するAOM制御部28、ガルバノスキャナ24の動作を指示するガルバノ動作制御信号Gを出力するガルバノ制御部29を含む。
AOM駆動信号Dは、それがオンの時間帯でのみAOM23に入力されたレーザパルスL1を加工方向に分岐させてレーザパルスL2とし、それ以外の時間帯では非加工方向のレーザパルスL3としてダンパ25の方向に分岐させる。
ガルバノ動作制御信号Gは、オフの時間帯でガルバノスキャナ24を静止させ、オンの時間帯でガルバノスキャナ24を回転させる。ガルバノスキャナ24が静止した状態で一つの穴位置にレーザが照射され、ガルバノスキャナ24が回転することによってレーザパルスL2を次の穴位置に照射させるようになる。
An overall control unit 26 controls the operation of the entire apparatus. The laser oscillation control unit 27 outputs a laser oscillation command signal S instructing the oscillation of the individual laser pulses L1 from the carbon dioxide laser oscillator 22, and controls the branching operation of the AOM 23. An AOM control unit 28 that outputs an AOM drive signal D to be output, and a galvano control unit 29 that outputs a galvano operation control signal G instructing the operation of the galvano scanner 24.
In the AOM drive signal D, the laser pulse L1 input to the AOM 23 is branched into the machining direction only in the time period when the AOM drive signal D is on, and is made into a laser pulse L2. Branch in the direction of.
The galvano operation control signal G stops the galvano scanner 24 in the off time zone and rotates the galvano scanner 24 in the on time zone. The laser is irradiated to one hole position while the galvano scanner 24 is stationary, and the laser pulse L2 is irradiated to the next hole position by rotating the galvano scanner 24.

図2のレーザ加工装置において、ワーク基板4への未貫通穴5の形成は、サイクル加工によって行う。サイクル加工は、各穴位置毎にレーザパルスを1個ずつ照射しながら穴位置を移動させ、全ての穴位置について完了したら、必要な回数だけ同じ動作を繰り返すものである。   In the laser processing apparatus of FIG. 2, the formation of the non-through hole 5 in the work substrate 4 is performed by cycle processing. In the cycle machining, the hole position is moved while irradiating one laser pulse at each hole position, and when the process is completed for all the hole positions, the same operation is repeated as many times as necessary.

次に、第3のステップとして、未貫通穴5を形成したワーク基板4から保護シート3を剥がし、ガラス基板1のアニーリング処理を行う。その温度はガラス基板1の材料が無アルカリガラスの場合、その歪点である650℃であり、時間は10分間が望ましいが、ホウ珪酸ガラスやソーダライムガラス等の場合、温度と時間を変える必要がある。このアニーリング処理により、第2のステップでのレーザ加工で発生した未貫通穴5の周りの残留応力が緩和される。   Next, as a third step, the protective sheet 3 is peeled off from the work substrate 4 in which the non-through holes 5 are formed, and the glass substrate 1 is annealed. The temperature is 650 ° C. which is the strain point when the material of the glass substrate 1 is non-alkali glass, and the time is preferably 10 minutes, but in the case of borosilicate glass or soda lime glass, the temperature and time need to be changed. There is. By this annealing treatment, the residual stress around the non-through hole 5 generated by the laser processing in the second step is relieved.

次に、第4のステップとして、ガラス基板1の裏面側を研磨する。この場合の研磨量Aは、図1(c)から理解されるように、少なくとも未貫通穴5が貫通穴となれるような寸法にする必要がある。この研磨処理を行った後の様子を図1(d)に示すが、穴明け位置に貫通穴6が形成されたガラス基板1が完成する。   Next, as the fourth step, the back side of the glass substrate 1 is polished. As understood from FIG. 1C, the polishing amount A in this case needs to be at least a size such that the non-through hole 5 can be a through hole. FIG. 1D shows the state after the polishing process, and the glass substrate 1 in which the through holes 6 are formed at the drilling positions is completed.

以上の実施例によれば、レーザ加工を行う段階では貫通穴をいきなり形成しないで未貫通穴とすることで、ガラス基板1へ与える残留応力を小さくできる。また、各穴位置毎にレーザパルスを1個ずつ照射しながら穴位置を移動させるサイクル加工で行うので、各穴位置毎に連続して複数のレーザパルスを照射するバースト加工と違って、ガラス基板1に与える残留応力を小さくでき、レーザ加工時でのクラックの発生を抑えることができる。
さらに裏面側の研磨処理を行う前にアニーリング処理を行うことで、レーザ加工によってガラス基板1に与えた残留応力を緩和するので、研磨処理時でのクラックの発生を抑えることができる。
従って、クラックを発生させないガラス基板の穴明け加工が可能となる。そして、特許文献1に開示されたような化学処理は行わないので、貫通穴6の穴径が大きくなってしまうようなことはない。
According to the above embodiment, the residual stress applied to the glass substrate 1 can be reduced by forming the non-through hole without suddenly forming the through hole at the stage of laser processing. In addition, since it is performed in a cycle process that moves the hole position while irradiating one laser pulse at each hole position, unlike the burst process in which a plurality of laser pulses are irradiated continuously at each hole position, a glass substrate 1 can be reduced, and the generation of cracks during laser processing can be suppressed.
Furthermore, by performing the annealing process before the back surface polishing process, the residual stress applied to the glass substrate 1 by the laser processing is relieved, so that the generation of cracks during the polishing process can be suppressed.
Therefore, it is possible to drill a glass substrate without generating cracks. And since the chemical treatment as disclosed in Patent Document 1 is not performed, the hole diameter of the through hole 6 is not increased.

なお、以上の実施例においては、ガラス基板1の表面に貼る保護シート3は、接着剤2が付いたものを使用したが、ガラス基板1の表面に密着できるものの場合には、必ずしも接着剤2が付いたものでなくても良い。   In the above embodiment, the protective sheet 3 attached to the surface of the glass substrate 1 is the one with the adhesive 2 attached. However, when the protective sheet 3 can adhere to the surface of the glass substrate 1, the adhesive 2 is not necessarily used. It does not have to be attached.

また、以上の実施例においては、ガラス基板1の裏面側だけを研磨処理するようにしたが、表面側も研磨処理するようにしても良い。このようにすることにより、表面側の粗さを裏面側に合わせることができ、かつガラス基板1の全体の厚さを均一とすることができる。   In the above embodiment, only the back surface side of the glass substrate 1 is polished. However, the front surface side may also be polished. By doing in this way, the roughness of the surface side can be matched with the back surface side, and the whole thickness of the glass substrate 1 can be made uniform.

1:ガラス基板、2:接着剤、3:保護シート、4:ワーク基板、5:未貫通穴
6:貫通穴、22:炭酸ガスレーザ発振器、23:AOM、24:ガルバノスキャナ
25:ダンパ、26:全体制御部、27:レーザ発振制御部、28:AOM制御部
29:ガルバノ制御部、L1〜L3:レーザパルス、S:レーザ発振指令信号
G:ガルバノ動作制御信号、D:AOM駆動信号
1: Glass substrate, 2: Adhesive, 3: Protection sheet, 4: Work substrate, 5: Non-through hole 6: Through hole, 22: Carbon dioxide laser oscillator, 23: AOM, 24: Galvano scanner 25: Damper, 26: Overall control unit, 27: laser oscillation control unit, 28: AOM control unit 29: galvano control unit, L1 to L3: laser pulse, S: laser oscillation command signal G: galvano operation control signal, D: AOM drive signal

Claims (3)

炭酸ガスレーザを用いてガラス基板に穴明けするレーザ加工方法において、保護シートが貼られたガラス基板の前記穴明け位置に前記保護シート側から前記レーザを照射して未貫通穴を形成する第一のステップと、前記ガラス基板から前記保護シートを除去してアニーリング処理を行う第二のステップと、前記ガラス基板の前記レーザの非照射側を研磨処理して前記未貫通穴を貫通穴に変える第三のステップとを有することを特徴とするレーザ加工方法。   In a laser processing method for drilling a glass substrate using a carbon dioxide laser, a first method of forming a non-through hole by irradiating the laser from the protective sheet side to the drilling position of the glass substrate on which a protective sheet is pasted A second step of removing the protective sheet from the glass substrate and performing an annealing treatment; and a third step of polishing the non-irradiation side of the laser of the glass substrate to convert the non-through holes into through holes. A laser processing method comprising the steps of: 請求項1に記載のレーザ加工方法において、前記第一ステップにおいては、前記穴明け位置の各々毎にレーザパルスを1個ずつ照射しながら穴位置を移動させるサイクル加工で行うことを特徴とするレーザ加工方法。   2. The laser processing method according to claim 1, wherein in the first step, laser processing is performed by cycle processing in which a hole position is moved while irradiating one laser pulse at each of the drilling positions. Processing method. 請求項1に記載のレーザ加工方法において、前記第三ステップにおいては、前記ガラス基板の前記レーザの照射側も研磨処理することを特徴とするレーザ加工方法。   2. The laser processing method according to claim 1, wherein in the third step, the laser irradiation side of the glass substrate is also polished.
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CN114933407A (en) * 2022-05-18 2022-08-23 常州亚玛顿股份有限公司 Preparation method of through hole glass substrate for mini LED backlight structure and backlight structure

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