JP2016194455A5 - - Google Patents
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- JP2016194455A5 JP2016194455A5 JP2015074471A JP2015074471A JP2016194455A5 JP 2016194455 A5 JP2016194455 A5 JP 2016194455A5 JP 2015074471 A JP2015074471 A JP 2015074471A JP 2015074471 A JP2015074471 A JP 2015074471A JP 2016194455 A5 JP2016194455 A5 JP 2016194455A5
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015074471A JP6544562B2 (ja) | 2015-03-31 | 2015-03-31 | 磁性体の磁気特性の測定装置および測定方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015074471A JP6544562B2 (ja) | 2015-03-31 | 2015-03-31 | 磁性体の磁気特性の測定装置および測定方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2016194455A JP2016194455A (ja) | 2016-11-17 |
JP2016194455A5 true JP2016194455A5 (ja) | 2018-06-07 |
JP6544562B2 JP6544562B2 (ja) | 2019-07-17 |
Family
ID=57323101
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015074471A Active JP6544562B2 (ja) | 2015-03-31 | 2015-03-31 | 磁性体の磁気特性の測定装置および測定方法 |
Country Status (1)
Country | Link |
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JP (1) | JP6544562B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117148239B (zh) * | 2023-10-30 | 2024-02-20 | 华中科技大学 | 一种磁性颗粒等效磁矩测量方法及标准样品 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07280906A (ja) * | 1994-04-11 | 1995-10-27 | Hitachi Ltd | 微粒子磁気特性測定装置 |
JP3626162B2 (ja) * | 2002-10-17 | 2005-03-02 | 独立行政法人科学技術振興機構 | 磁性体試料の不可逆磁化率測定方法および装置 |
JP2005098804A (ja) * | 2003-09-24 | 2005-04-14 | Japan Science & Technology Agency | 磁気力顕微鏡用の磁性探針およびその製造方法 |
US20050088173A1 (en) * | 2003-10-24 | 2005-04-28 | Abraham David W. | Method and apparatus for tunable magnetic force interaction in a magnetic force microscope |
JP6167265B2 (ja) * | 2013-01-11 | 2017-07-26 | 国立大学法人秋田大学 | 磁性微粒子の磁気特性評価装置および磁気特性評価方法 |
JP6528334B2 (ja) * | 2014-05-24 | 2019-06-12 | 国立大学法人秋田大学 | 磁気力顕微鏡用探針の評価装置および評価方法、ならびに磁気力顕微鏡および磁気力顕微鏡の制御用磁場調整方法 |
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2015
- 2015-03-31 JP JP2015074471A patent/JP6544562B2/ja active Active
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