JP2016145737A5 - - Google Patents

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Publication number
JP2016145737A5
JP2016145737A5 JP2015022426A JP2015022426A JP2016145737A5 JP 2016145737 A5 JP2016145737 A5 JP 2016145737A5 JP 2015022426 A JP2015022426 A JP 2015022426A JP 2015022426 A JP2015022426 A JP 2015022426A JP 2016145737 A5 JP2016145737 A5 JP 2016145737A5
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JP
Japan
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liquid
temperature
microchannel
light
measuring
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JP2015022426A
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English (en)
Japanese (ja)
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JP2016145737A (ja
JP6631867B2 (ja
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Publication of JP2016145737A5 publication Critical patent/JP2016145737A5/ja
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JP2015022426A 2015-02-06 2015-02-06 マイクロ流路中の液体の温度測定方法 Active JP6631867B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015022426A JP6631867B2 (ja) 2015-02-06 2015-02-06 マイクロ流路中の液体の温度測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015022426A JP6631867B2 (ja) 2015-02-06 2015-02-06 マイクロ流路中の液体の温度測定方法

Publications (3)

Publication Number Publication Date
JP2016145737A JP2016145737A (ja) 2016-08-12
JP2016145737A5 true JP2016145737A5 (enrdf_load_stackoverflow) 2017-12-07
JP6631867B2 JP6631867B2 (ja) 2020-01-15

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JP2015022426A Active JP6631867B2 (ja) 2015-02-06 2015-02-06 マイクロ流路中の液体の温度測定方法

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JP (1) JP6631867B2 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7205123B2 (ja) * 2018-09-14 2023-01-17 横河電機株式会社 温度測定装置、温度測定システム、及び温度測定方法
JP7534244B2 (ja) * 2021-03-22 2024-08-14 アズビル株式会社 故障検知方法
JP2022146239A (ja) * 2021-03-22 2022-10-05 アズビル株式会社 濃度測定方法および装置
CN113218463B (zh) * 2021-05-08 2023-12-12 安图实验仪器(郑州)有限公司 微流控芯片微孔液量测量方法
JP7540564B1 (ja) 2023-09-21 2024-08-27 Toppanホールディングス株式会社 流速測定方法およびマイクロ流体システム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2194232A1 (en) * 1994-07-01 1996-01-18 Hans Van Der Woord A method for monitoring performance of an incubator module, said incubator module being comprised in an automated system for assaying multiple samples and a kit suitable for use in said method
WO2002090912A1 (fr) * 2001-05-07 2002-11-14 Kanagawa Academy Of Science And Technology Methode de mesure et de commande de la temperature d'une phase liquide dans un micropassage de mini circuit integre, dispositif pour la mise en oeuvre du procede et mini circuit integre
JP2005233802A (ja) * 2004-02-20 2005-09-02 Yokogawa Electric Corp 物理量計測装置およびその装置を用いて行う物理量校正方法
JP2009128024A (ja) * 2007-11-20 2009-06-11 Sony Corp 流路内を通流する液体の温度制御方法
JP2013113614A (ja) * 2011-11-25 2013-06-10 Nagoya Univ 蛍光温度計測方法及び蛍光温度計測システム

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