JP2016063098A - Component mounting apparatus, mounting stage, and component mounting method - Google Patents

Component mounting apparatus, mounting stage, and component mounting method Download PDF

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JP2016063098A
JP2016063098A JP2014190623A JP2014190623A JP2016063098A JP 2016063098 A JP2016063098 A JP 2016063098A JP 2014190623 A JP2014190623 A JP 2014190623A JP 2014190623 A JP2014190623 A JP 2014190623A JP 2016063098 A JP2016063098 A JP 2016063098A
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mounting
component
substrate
stage
base material
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JP6428087B2 (en
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尚志 成田
Hisashi Narita
尚志 成田
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NEC Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a component mounting apparatus capable of mounting an electronic component of low heat resistance by suppressing reheating.SOLUTION: The component mounting apparatus suppresses reheating with heat heated by laser light by providing a contact surface with a substrate 10 with a heat conduction changing part 50 of heat conductivity lower than heat conductivity of a base material 21 of a mounting stage 20 for holding the substrate 10 by being in contant with the substrate 10 in accordance with a portion at which a mounting component 30 is mounted on the substrate 10 when melting solder 40 at a lower part of the mounting component 30 with the laser light.SELECTED DRAWING: Figure 1

Description

本発明は、耐熱性の低い電子部品を実装できる部品実装装置、搭載ステージおよび部品実装方法に関する。   The present invention relates to a component mounting apparatus, a mounting stage, and a component mounting method that can mount an electronic component with low heat resistance.

近年、インターネット環境の発達や消費電力の抑制などの社会動向に伴い、電子機器には、小型化、薄型化、大容量化、多機能化が求められる。電子機器の実装領域では、部品実装の高密度化が進展している。   In recent years, along with social trends such as the development of the Internet environment and the suppression of power consumption, electronic devices are required to be smaller, thinner, larger in capacity, and more multifunctional. In the mounting area of electronic devices, the density of component mounting is increasing.

このような中で、電子機器の基板には、IC(Integrated Circuit)、センサ、コネクタなど耐熱温度の異なる様々な部品が高密度に実装される。様々な部品を高密度に実装する際の温度管理は複雑である。一般的に、耐熱温度の高い部品は先に加熱実装され、耐熱温度の低い部品は後から加熱実装される。例えば、生産性の都合から、耐熱温度の高い部品はリフロー方式で一括加熱接合され、後から実装される耐熱温度の低い部品ははんだごてやパルスヒート方式などで個々に加熱接合される。このとき、後から実装される部品を個々に加熱することには、先に実装された部品の接合部が再加熱されるというリスクがある。部品の接合部が再加熱されることによって、接合部の接合品質や信頼性が低下する恐れがある。すなわち、部品実装の高密度化の進展に伴い、再加熱によるリスクが増大するという問題がある。   Under such circumstances, various components having different heat resistance temperatures, such as ICs (Integrated Circuits), sensors, and connectors, are mounted at high density on a substrate of an electronic device. Temperature management when mounting various parts at high density is complicated. In general, components with a high heat resistance temperature are heat-mounted first, and components with a low heat resistance temperature are heat-mounted later. For example, for the sake of productivity, parts having a high heat-resistant temperature are collectively heat-bonded by a reflow method, and components having low heat-resistant temperatures to be mounted later are individually heat-bonded by a soldering iron or a pulse heat method. At this time, individually heating components to be mounted later has a risk that the joint portion of the component mounted earlier is reheated. By reheating the joint part of components, there exists a possibility that the joint quality and reliability of a joint part may fall. That is, there is a problem that the risk due to reheating increases as the density of component mounting increases.

特許文献1には、光照射によるはんだ付け方法が開示されている。特許文献1の技術は、光照射の光量を受光量調整部材によって部品毎に調整して、光照射によるはんだ付け温度のムラを均一化する技術である。   Patent Document 1 discloses a soldering method by light irradiation. The technique of Patent Document 1 is a technique for adjusting the amount of light irradiation for each component by a light receiving amount adjusting member and uniformizing unevenness in soldering temperature due to light irradiation.

特許文献2には、フレキシブル基板にリフロー方式で部品をはんだ付けする装置が開示されている。特許文献2の技術では、耐熱部品と弱耐熱部品が実装されるフレキシブル基板を保持する基板保持板に、弱耐熱部品の被はんだ付け部分に対応して貫通穴を設ける。特許文献2の技術は、耐熱部品のリフロー方式でのはんだ付けの際に、貫通穴を介して赤外線による直接照射を行って弱耐熱部品も実装する技術である。   Patent Document 2 discloses an apparatus for soldering a component to a flexible substrate by a reflow method. In the technique of Patent Document 2, a through hole is provided in a substrate holding plate that holds a flexible substrate on which a heat resistant component and a weak heat resistant component are mounted, corresponding to a part to be soldered of the weak heat resistant component. The technique of Patent Document 2 is a technique for mounting a weak heat-resistant component by direct irradiation with infrared rays through a through hole when soldering the heat-resistant component by a reflow method.

特許文献3には、フレキシブル基板にリフロー方式で部品をはんだ付けするシステムが開示されている。具体的には、特許文献3の技術では、フレキシブル基板を保持するパレットに空洞を設け、空洞内の相転移材料によってパレットが保持するフレキシブル基板から熱を吸収する技術である。   Patent Document 3 discloses a system for soldering a component to a flexible substrate by a reflow method. Specifically, in the technique of Patent Document 3, a cavity is provided in a pallet holding a flexible substrate, and heat is absorbed from the flexible substrate held by the pallet by the phase change material in the cavity.

特許文献4には、部品をロウ付けする部品装着装置が開示されている。特許文献4の技術は、部品をロウ付けする際に局所的に加熱される部位とその周囲との温度差を抑制する技術である。   Patent Document 4 discloses a component mounting apparatus that brazes components. The technique of Patent Document 4 is a technique for suppressing a temperature difference between a portion that is locally heated and its surroundings when brazing a component.

特許文献5には、レーザ光照射による部品の実装方法が開示されている。特許文献5の技術では、基板の所定位置にレーザ光の波長を変換する変換素子を設ける。特許文献5の技術は、基板の所定位置では、レーザ光の波長が変換素子で変換された波長で、例えば絶縁樹脂を固化させて部品を実装する。特許文献5の技術は、基板の他の位置では、レーザ光の波長をそのままで透過させて、例えばはんだを溶融して部品を実装する。すなわち、特許文献5の技術は、レーザ光の波長を変換する変換素子の有無により、複数の接合素材による部品実装を実現する技術である。   Patent Document 5 discloses a component mounting method by laser light irradiation. In the technique of Patent Document 5, a conversion element that converts the wavelength of laser light is provided at a predetermined position on a substrate. In the technique of Patent Document 5, at a predetermined position of a substrate, for example, the wavelength of laser light is converted by a conversion element, and for example, an insulating resin is solidified to mount a component. In the technique of Patent Document 5, a component is mounted by melting the solder, for example, by transmitting the wavelength of the laser beam as it is at another position of the substrate. That is, the technique of Patent Document 5 is a technique for realizing component mounting using a plurality of bonding materials depending on the presence or absence of a conversion element that converts the wavelength of laser light.

特開2009−054749号公報(第5−7頁、図1、2)JP 2009-054749 A (page 5-7, FIGS. 1 and 2) 特開2006−040920号公報(第4−7頁、図1)Japanese Patent Laying-Open No. 2006-040920 (page 4-7, FIG. 1) 特開2004−511091号公報(第4−7頁、図2b)JP 2004-511091 A (page 4-7, FIG. 2b) 特開2004−290993号公報(第4−6頁、図1)Japanese Patent Laying-Open No. 2004-290993 (page 4-6, FIG. 1) 特開平9−260820号公報(第2、3頁、図2、3)Japanese Patent Laid-Open No. 9-260820 (2nd and 3rd pages, FIGS. 2 and 3)

特許文献1の技術は、光照射によるはんだ付け温度のムラを均一化し、一括してはんだ付けするものであって、耐熱性の低い電子部品を実装するものではない。   The technique of Patent Document 1 is to uniformize the unevenness of the soldering temperature due to light irradiation and perform soldering in a lump, and does not mount electronic components with low heat resistance.

特許文献2の技術は、フレキシブル基板の基板保持板に貫通穴を設けて赤外線を照射して弱耐熱部品のはんだ付け時間を短縮して、耐熱部品のリフロー方式のはんだ付けの際に一括してはんだ付けする技術である。しかし、特許文献2の技術は、リフロー方式のはんだ付けが許容されない、耐熱性の低い電子部品を実装するものではない。   The technology of Patent Document 2 provides a through hole in the substrate holding plate of the flexible substrate and irradiates infrared rays to shorten the soldering time of the weak heat-resistant component, and collectively when the reflow soldering of the heat-resistant component is performed. This is a soldering technique. However, the technique of Patent Document 2 does not mount an electronic component with low heat resistance, which does not allow reflow soldering.

特許文献3の技術は、リフローの際に、パレットが保持するフレキシブル基板から熱を吸収してフレキシブル基板の軟化を防ぎ、寸法安定性を確保する技術である。特許文献4の技術は、局所加熱部位とその周囲との温度差を抑制して、局所加熱で接合された部材の熱膨張による残留応力の発生や強度低下、破損などを軽減する技術である。特許文献3、4の技術は、特許文献1と同様に、部品を実装する部位およびその周囲の温度を均一化する技術であり、耐熱性の低い電子部品を実装するものではない。   The technique of Patent Document 3 is a technique for ensuring dimensional stability by absorbing heat from a flexible board held by a pallet during reflow to prevent softening of the flexible board. The technique of Patent Document 4 is a technique for reducing the occurrence of residual stress due to the thermal expansion of members joined by local heating, reduction in strength, damage, and the like by suppressing the temperature difference between the local heating site and its surroundings. The techniques of Patent Documents 3 and 4 are techniques for equalizing the temperature of the part mounting region and the surrounding temperature, as in Patent Document 1, and do not mount electronic components with low heat resistance.

特許文献5の技術は、レーザ光の波長を変換する変換素子を使用して、複数の接合素材による部品実装を実現する技術である。   The technique of patent document 5 is a technique which implement | achieves the component mounting by a some joining raw material using the conversion element which converts the wavelength of a laser beam.

このように、特許文献1から5の技術には、耐熱性の低い電子部品の実装できないという課題がある。   As described above, the techniques of Patent Documents 1 to 5 have a problem that electronic components with low heat resistance cannot be mounted.

本発明の目的は、上記の課題に鑑みてなされたもので、再加熱を抑制して耐熱性の低い電子部品を実装できる部品実装装置、搭載ステージおよび部品実装方法を提供することにある。   An object of the present invention is to provide a component mounting apparatus, a mounting stage, and a component mounting method capable of mounting an electronic component with low heat resistance while suppressing reheating.

本発明の部品実装装置は、第1実装部品を基板に実装する部位に対応して、基板と接触して保持する搭載ステージの母材より熱伝導率の低い第1部材の第1熱伝導変更部を基板との接触面に設けることを特徴とする。   In the component mounting apparatus of the present invention, the first thermal conductivity change of the first member having a lower thermal conductivity than the base material of the mounting stage that holds the first mounting component in contact with the substrate in correspondence with the portion where the first mounting component is mounted on the substrate. The portion is provided on the contact surface with the substrate.

本発明の搭載ステージは、第1実装部品を基板に実装する部位に対応して、基板と接触して保持する搭載ステージの母材より熱伝導率の低い第1部材の第1熱伝導変更部を基板との接触面に設けることを特徴とする。   The mounting stage of the present invention corresponds to a portion where the first mounting component is mounted on the substrate, and the first heat conduction changing portion of the first member having a lower thermal conductivity than the base material of the mounting stage that is in contact with the substrate and holds it. Is provided on the contact surface with the substrate.

本発明の部品実装方法は、基板と接触して保持する搭載ステージの母材より熱伝導率の低い第1部材の第1熱伝導変更部を搭載ステージの、第1実装部品を基板に実装する部位に対応する基板との接触面に設けて、第1実装部品の接合材を加熱して第1部品を実装することを特徴とする。   The component mounting method of the present invention mounts the first mounting component of the mounting stage on the first mounting component of the first member having a lower thermal conductivity than the base material of the mounting stage held in contact with the substrate. It is provided on the contact surface with the substrate corresponding to the part, and the first component is mounted by heating the bonding material of the first mounting component.

本発明によれば、再加熱を抑制して耐熱性の低い電子部品を実装できる。   According to the present invention, it is possible to mount an electronic component with low heat resistance while suppressing reheating.

本発明の第1の実施形態の部品実装装置の構成例を示した断面説明図である。It is a section explanatory view showing the example of composition of the component mounting device of a 1st embodiment of the present invention. 本発明の第2の実施形態の部品実装装置の構成例を示した断面説明図である。It is sectional explanatory drawing which showed the structural example of the component mounting apparatus of the 2nd Embodiment of this invention. 本発明の第3の実施形態の部品実装装置の構成例を示した断面説明図である。It is sectional explanatory drawing which showed the structural example of the component mounting apparatus of the 3rd Embodiment of this invention. 本発明の第4の実施形態の部品実装装置の構成例を示した断面説明図である。It is sectional explanatory drawing which showed the structural example of the component mounting apparatus of the 4th Embodiment of this invention. 本発明の第5の実施形態の部品実装装置の構成例を示した断面説明図である。It is sectional explanatory drawing which showed the structural example of the component mounting apparatus of the 5th Embodiment of this invention.

以下に、本発明の実施形態について図面を参照して詳細に説明する。
(第1の実施形態)
本発明の第1の実施形態について説明する。図1は、本発明の第1の実施形態の部品実装装置101の構成例を示した断面説明図である。
Embodiments of the present invention will be described below in detail with reference to the drawings.
(First embodiment)
A first embodiment of the present invention will be described. FIG. 1 is an explanatory cross-sectional view showing a configuration example of a component mounting apparatus 101 according to the first embodiment of the present invention.

図1を参照して、本実施形態の部品実装装置101について説明する。部品実装装置101では、レーザ発振部(図示せず)によって出力されたレーザ光がレーザ光誘導部(図示せず、例えば光ファイバー)で誘導され、レーザ照射部110から外部に照射される。   With reference to FIG. 1, the component mounting apparatus 101 of this embodiment is demonstrated. In the component mounting apparatus 101, laser light output by a laser oscillation unit (not shown) is guided by a laser light guiding unit (not shown, for example, an optical fiber), and is irradiated from the laser irradiation unit 110 to the outside.

レーザ照射部110から照射されたレーザ光は、搭載ステージ20に保持された基板10の実装部品30下部のはんだ40を溶融する。レーザ照射部110のレーザ光の照射が停止されることで、実装部品30下部のはんだ40は凝固する。このように、レーザ照射部110のレーザ光によって、実装部品30は基板10に実装される。   The laser light emitted from the laser irradiation unit 110 melts the solder 40 under the mounting component 30 of the substrate 10 held on the mounting stage 20. When the laser irradiation of the laser irradiation unit 110 is stopped, the solder 40 under the mounting component 30 is solidified. Thus, the mounting component 30 is mounted on the substrate 10 by the laser light from the laser irradiation unit 110.

搭載ステージ20は水平面内のX方向およびY方向に移動するXYステージ(図示せず)に保持される。搭載ステージ20は基板10の実装部品30の実装位置に対応して、搭載ステージ母材21を貫通した充填部22を備える。充填部22は、搭載ステージ母材21より低い熱伝導率の部材が充填された熱伝導変更部50として、搭載ステージ20に設けられる。   The mounting stage 20 is held by an XY stage (not shown) that moves in the X and Y directions in the horizontal plane. The mounting stage 20 includes a filling portion 22 penetrating the mounting stage base material 21 corresponding to the mounting position of the mounting component 30 on the substrate 10. The filling unit 22 is provided on the mounting stage 20 as a heat conduction changing unit 50 filled with a member having a lower thermal conductivity than the mounting stage base material 21.

基板10は基板母材11と部品実装する実装面導通部12、裏面導通部13を備える。基板10には、周辺部品31と周辺部品32が既に実装面側に実装される。鉛直方向に移動するZステージ(図示せず)には、実装部品を吸着などの方法により把持する把持部(図示せず)が備えられる。実装部品30は、把持部に把持されて鉛直下方向に移動させられて、基板10の実装部位30の実装位置に載せられる。実装部品30は、耐熱性の低い、後付け部品として、レーザ照射部110のレーザ光によりはんだ40が溶融されて、実装位置の実装面導通部12に接合される。   The substrate 10 includes a substrate base material 11, a mounting surface conduction part 12 for mounting components, and a back surface conduction part 13. The peripheral component 31 and the peripheral component 32 are already mounted on the mounting surface side on the substrate 10. A Z stage (not shown) that moves in the vertical direction is provided with a gripping part (not shown) that grips a mounted component by a method such as suction. The mounting component 30 is gripped by the gripping portion, moved vertically downward, and placed on the mounting position of the mounting portion 30 of the substrate 10. The mounting component 30 is a post-installation component having low heat resistance, and the solder 40 is melted by the laser light from the laser irradiation unit 110 and joined to the mounting surface conduction unit 12 at the mounting position.

このとき、実装部品30下部のはんだ40はレーザ光によって加熱され、加えられた熱が周辺に熱伝導される。実装部品30下部の熱伝導変更部50は周辺の搭載ステージ母材21よりも熱伝導率が低いので、実装部品30下部のはんだ40に加えられる熱は維持される。一方、熱伝導変更部50に比べて、熱伝導変更部50の周辺の搭載ステージ母材21は熱伝導率が高いので、はんだ40に加えられた熱の周辺への伝導は周辺の搭載ステージ母材21に行われる。そのため、レーザ光により加えられる熱は実装部品30下部のはんだ40の溶融に有効に保持され、それ以外の熱は大部分周辺の搭載ステージ母材21に伝導し、周辺部品31、32の接合部への再加熱は軽減される。   At this time, the solder 40 under the mounting component 30 is heated by the laser beam, and the applied heat is thermally conducted to the periphery. Since the heat conduction changing portion 50 below the mounting component 30 has a lower thermal conductivity than the surrounding mounting stage base material 21, the heat applied to the solder 40 below the mounting component 30 is maintained. On the other hand, since the mounting stage base material 21 around the heat conduction changing unit 50 has a higher thermal conductivity than the heat conduction changing unit 50, the conduction of the heat applied to the solder 40 to the periphery is the peripheral mounting stage base. To the material 21. Therefore, the heat applied by the laser light is effectively held by melting the solder 40 below the mounting component 30, and the other heat is mostly transferred to the peripheral mounting stage base material 21, and the joints between the peripheral components 31 and 32. Reheating to is reduced.

このように、本実施形態の搭載ステージは、搭載ステージ母材に設けられた充填部に搭載ステージ母材より低い熱伝導率の部材が充填された熱伝導変更部を備える。熱伝導変更部は実装部品に対応して設けられ、実装部品の接合材に加えられる熱を維持して実装部品の実装を促進する。一方、実装部品の接合材に加えられる熱の周辺への伝導が、熱伝導変更部の周辺の搭載ステージ母材に行われるので、周辺部品への再加熱が抑制される。そのため、周辺部品の接合部への再加熱による接合品質の劣化のリスクが軽減される。   As described above, the mounting stage of the present embodiment includes a heat conduction changing unit in which a filling unit provided in the mounting stage base material is filled with a member having a lower thermal conductivity than the mounting stage base material. The heat conduction changing portion is provided corresponding to the mounting component, and promotes mounting of the mounting component by maintaining heat applied to the bonding material of the mounting component. On the other hand, the conduction of heat applied to the bonding material of the mounted component to the periphery is performed on the mounting stage base material around the heat conduction changing portion, so that reheating to the peripheral components is suppressed. For this reason, the risk of deterioration of the bonding quality due to reheating of the peripheral parts to the bonded portion is reduced.

以上のように、本実施形態の部品実装装置は、再加熱を抑制して耐熱性の低い電子部品を実装することができる。   As described above, the component mounting apparatus of this embodiment can mount an electronic component with low heat resistance while suppressing reheating.

なお、本実施形態では、搭載ステージ母材の材質は限定されないが、一般的には鉄や銅、アルミニウムなどの金属および合金が適用される。熱伝導変更部として搭載ステージの充填部に充填される部材は、搭載ステージ母材より熱伝導率が低いものであればよい。例えば、ガラスや空気などでよい。   In the present embodiment, the material of the mounting stage base material is not limited, but generally metals and alloys such as iron, copper, and aluminum are applied. The member filled in the filling portion of the mounting stage as the heat conduction changing portion may be any member having a lower thermal conductivity than the mounting stage base material. For example, glass or air may be used.

また、本実施形態では、熱伝導変更部の数は1つとして説明したが、熱伝導変更部の数は1つ以上であれば限定されない。すなわち、熱伝導変更部は、実装部品に対応して搭載ステージに設けられればよい。   In the present embodiment, the number of heat conduction change units is described as one, but the number of heat conduction change units is not limited as long as the number is one or more. That is, the heat conduction changing unit may be provided on the mounting stage corresponding to the mounted component.

また、本実施形態では、熱伝導変更部の搭載ステージ表面での形状は限定されない。例えば、熱伝導変更部は、実装部品の基板表面に投影された外形に沿った形状でもよいし、実装部品の端子外形に沿った形状でもよい。すなわち、熱伝導変更部の表面形状は、他の実装部品の熱伝導変更部の表面形状または他の実装部品の実装部位と重複しなければよい。   Moreover, in this embodiment, the shape in the mounting stage surface of a heat conduction change part is not limited. For example, the heat conduction changing portion may have a shape along the outer shape projected on the substrate surface of the mounting component, or may have a shape along the terminal outer shape of the mounting component. That is, the surface shape of the heat conduction changing portion may not overlap with the surface shape of the heat conduction changing portion of another mounting component or the mounting site of another mounting component.

また。本実施形態では、搭載ステージがXYステージに保持されると説明した。しかし、搭載ステージがXYステージに保持されることに限定されない。例えば、搭載ステージは鉛直軸を回転軸とする回転ステージに保持されてもよい。すなわち、基板を保持した搭載ステージがさらに保持されるものであればよく、搭載ステージを移動させる移載ステージでもよいし、移動しない固定ステージでもよい。なお、固定ステージの時には、レーザ照射部が実装部品の接合材を溶融できる所定の位置に移動できてもよい。   Also. In the present embodiment, it has been described that the mounting stage is held by the XY stage. However, the mounting stage is not limited to being held on the XY stage. For example, the mounting stage may be held on a rotary stage having a vertical axis as a rotation axis. That is, it is sufficient if the mounting stage holding the substrate is further held, and it may be a transfer stage that moves the mounting stage, or a fixed stage that does not move. In the case of the fixed stage, the laser irradiation unit may be moved to a predetermined position where the bonding material of the mounted component can be melted.

また、本実施形態では、実装部品を把持する把持部を備えたZステージを備えると説明した。しかし、把持部およびZステージは備えなくてもよい。実装部品が搭載ステージに保持された基板の実装位置に位置合わせして載せられればよい。例えば、ロボットハンドや手で、実装部品は基板に載せられてもよい。
(第2の実施形態)
本発明の第2の実施形態について説明する。図2は、本発明の第2の実施形態の部品実装装置102の構成例を示した断面説明図である。
Moreover, in this embodiment, it demonstrated that the Z stage provided with the holding part which hold | grips a mounting component was provided. However, the grip portion and the Z stage may not be provided. It is only necessary that the mounting component is placed in alignment with the mounting position of the substrate held on the mounting stage. For example, the mounting component may be placed on the board with a robot hand or hand.
(Second Embodiment)
A second embodiment of the present invention will be described. FIG. 2 is an explanatory cross-sectional view showing a configuration example of the component mounting apparatus 102 according to the second embodiment of the present invention.

図2を参照して、本実施形態の部品実装装置102について説明する。部品実装装置102は、図1で説明した搭載ステージ20が搭載ステージ23に、充填部22が充填部24に、熱伝導変更部50が熱伝導変更部51に変更されていることが、第1の実施形態と相違する。よって、第1の実施形態と同一の構成要素には同一の参照番号を付記して、その説明を省略し、変更点を説明する。   With reference to FIG. 2, the component mounting apparatus 102 of this embodiment is demonstrated. In the component mounting apparatus 102, the mounting stage 20 described in FIG. 1 is changed to the mounting stage 23, the filling unit 22 is changed to the filling unit 24, and the heat conduction changing unit 50 is changed to the heat conduction changing unit 51. This is different from the embodiment. Therefore, the same components as those in the first embodiment are denoted by the same reference numerals, description thereof will be omitted, and changes will be described.

充填部24は、基板10の実装部品30の実装位置に対応して、搭載ステージ23の表面から所定の深さで設けられた凹部である。充填部24である凹部は、搭載ステージ23より低い熱伝導率の部材が充填された熱伝導変更部25として、搭載ステージ23に設けられる。なお、充填部24の凹部は充填されなくてもよい。充填部24の凹部は搭載ステージ母材21より熱伝導率の低い熱伝導変更部51として設けられる。   The filling portion 24 is a recess provided at a predetermined depth from the surface of the mounting stage 23 corresponding to the mounting position of the mounting component 30 on the substrate 10. The concave portion which is the filling portion 24 is provided on the mounting stage 23 as a heat conduction changing portion 25 filled with a member having a lower thermal conductivity than the mounting stage 23. In addition, the recessed part of the filling part 24 does not need to be filled. The concave portion of the filling portion 24 is provided as a heat conduction changing portion 51 having a thermal conductivity lower than that of the mounting stage base material 21.

このように、本実施形態では、搭載ステージ母材に設けられた充填部である凹部が、搭載ステージ母材より熱伝導率の低い熱伝導変更部として、実装部品の接合材に加えられる熱を維持して実装部品の実装を促進する。一方、実装部品の接合材に加えられる熱の周辺への伝導が、熱伝導変更部の周辺の搭載ステージ母材に行われるので、周辺部品への再加熱が抑制される。そのため、周辺部品の接合部への再加熱による接合品質の劣化のリスクが軽減される。さらに、本実施形態では、充填部への部材の充填量を削減、あるいは充填工程をなくすことができるので、搭載ステージの製造コストを低減できる。   As described above, in this embodiment, the concave portion, which is the filling portion provided in the mounting stage base material, serves as a heat conduction changing portion having a lower thermal conductivity than the mounting stage base material, and heat applied to the bonding material of the mounting component. Maintain and promote mounting of mounting components. On the other hand, the conduction of heat applied to the bonding material of the mounted component to the periphery is performed on the mounting stage base material around the heat conduction changing portion, so that reheating to the peripheral components is suppressed. For this reason, the risk of deterioration of the bonding quality due to reheating of the peripheral parts to the bonded portion is reduced. Furthermore, in this embodiment, since the filling amount of the member into the filling portion can be reduced or the filling step can be eliminated, the manufacturing cost of the mounting stage can be reduced.

以上、本実施形態の部品実装装置は、第1の実施形態と同様に、再加熱を抑制して耐熱性の低い電子部品を実装することができる。本実施形態は、搭載ステージの製造コストを低減することができる。   As described above, the component mounting apparatus according to the present embodiment can mount an electronic component with low heat resistance while suppressing reheating as in the first embodiment. This embodiment can reduce the manufacturing cost of the mounting stage.

なお、本実施形態では、充填部は搭載ステージから所定の深さを備えた凹部と説明した。しかし、充填部は搭載ステージに設けられた貫通穴のままでもよい。すなわち、充填部および熱伝導変更部を貫通穴のままとしても同様の効果が得られる。また、充填部を貫通穴のままとすることで、搭載ステージの製造コストはさらに低減することができる。
(第3の実施形態)
本発明の第3の実施形態について説明する。図3は、本発明の第3の実施形態の部品実装装置103の構成例を示した断面説明図である。
In the present embodiment, the filling portion has been described as a concave portion having a predetermined depth from the mounting stage. However, the filling portion may be a through hole provided in the mounting stage. That is, the same effect can be obtained even if the filling portion and the heat conduction changing portion are left as through holes. Moreover, the manufacturing cost of the mounting stage can be further reduced by leaving the filling portion as a through hole.
(Third embodiment)
A third embodiment of the present invention will be described. FIG. 3 is an explanatory cross-sectional view showing a configuration example of the component mounting apparatus 103 according to the third embodiment of the present invention.

図3を参照して、本実施形態の部品実装装置103について説明する。部品実装装置103は、図1で説明した搭載ステージ20が搭載ステージ25に、熱伝導変更部50が熱伝導変更部52に変更され、搭載ステージ母材21に冷却流路63が追加されていることが、第1の実施形態と相違する。よって、第1の実施形態と同一の構成要素には同一の参照番号を付記して、その説明を省略し、変更点を説明する。   With reference to FIG. 3, the component mounting apparatus 103 of this embodiment is demonstrated. In the component mounting apparatus 103, the mounting stage 20 described in FIG. 1 is changed to the mounting stage 25, the heat conduction changing unit 50 is changed to the heat conduction changing unit 52, and the cooling flow path 63 is added to the mounting stage base material 21. This is different from the first embodiment. Therefore, the same components as those in the first embodiment are denoted by the same reference numerals, description thereof will be omitted, and changes will be described.

充填部22は、基板10の実装部品30の実装位置に対応して、搭載ステージ25を貫通する貫通穴である。充填部22である貫通穴は、搭載ステージ25より熱伝導率の低い熱伝導変更部52として、搭載ステージ25に設けられる。   The filling portion 22 is a through hole that penetrates the mounting stage 25 corresponding to the mounting position of the mounting component 30 of the substrate 10. The through hole which is the filling portion 22 is provided in the mounting stage 25 as a heat conduction changing portion 52 having a lower thermal conductivity than the mounting stage 25.

搭載ステージ25の充填部22を除いた部位には、冷却媒体を流入させる流入口61と排出口62を備えた、冷却媒体を流動させる冷却流路63が設けられる。   A portion of the mounting stage 25 excluding the filling portion 22 is provided with a cooling flow path 63 for flowing the cooling medium, including an inlet 61 and a discharge port 62 for allowing the cooling medium to flow in.

実装部品30下部のはんだ40を加熱する熱の周辺への熱伝導は、熱伝導変更部52の周辺の搭載ステージ母材21に行われる。搭載ステージ母材21に伝わった熱は、流入口61から流入して冷却流路63の内部を流動する冷却媒体に伝えられる。冷却媒体に伝えられた熱は排出口62から外部に排熱される。さらに、流入口61から流入する冷却媒体によって、搭載ステージ母材21そのものが冷却される。そのため、実装部品30の周辺に位置する周辺部品31および32への再加熱はさらに抑制される。なお、冷却媒体を流動させるポンプや、冷却媒体の熱を廃棄する放熱フィンなどや冷却媒体を外部で循環させるパイプなどは図示しない。   Heat conduction to the periphery of the heat that heats the solder 40 under the mounting component 30 is performed on the mounting stage base material 21 around the heat conduction changing portion 52. The heat transferred to the mounting stage base material 21 is transferred from the inlet 61 to the cooling medium flowing in the cooling flow path 63. The heat transferred to the cooling medium is exhausted to the outside through the discharge port 62. Further, the mounting stage base material 21 itself is cooled by the cooling medium flowing in from the inlet 61. Therefore, reheating to the peripheral components 31 and 32 located around the mounting component 30 is further suppressed. Note that a pump for flowing the cooling medium, a radiating fin for discarding the heat of the cooling medium, a pipe for circulating the cooling medium outside, and the like are not shown.

このように、本実施形態では、搭載ステージ母材に設けられた冷却流路に冷却媒体を流動させることによって、実装部品の接合材を加熱する熱の周辺への熱伝導が、熱伝導変更部の周辺の搭載ステージ母材および冷却媒体に行われる。冷却媒体に伝えられた熱は冷却媒体により外部に運ばれて排熱される。搭載ステージ母材自体が冷却媒体により冷却されるので、周辺部品への再加熱がさらに抑制される。そのため、周辺部品の接合部への再加熱による接合品質の劣化のリスクがさらに軽減される。また、複数の実装部品が順次実装される際においても、搭載ステージの冷却効果が高められているので、基板母材や搭載ステージ母材への蓄熱が抑制され、再加熱のリスクは軽減される。   As described above, in this embodiment, the heat conduction to the periphery of the heat for heating the bonding material of the mounting component is performed by causing the cooling medium to flow in the cooling flow path provided in the mounting stage base material. Is carried out on the mounting stage base material and the cooling medium in the vicinity of. The heat transferred to the cooling medium is carried to the outside by the cooling medium and exhausted. Since the mounting stage base material itself is cooled by the cooling medium, reheating to the peripheral components is further suppressed. For this reason, the risk of deterioration of the bonding quality due to the reheating of the peripheral parts to the bonded portion is further reduced. Also, even when multiple mounting components are mounted in sequence, the cooling effect of the mounting stage is enhanced, so heat storage on the substrate base material and mounting stage base material is suppressed, and the risk of reheating is reduced. .

以上、本実施形態の部品実装装置は、第1、第2の実施形態と同様に、再加熱を抑制して耐熱性の低い電子部品を実装することができる。さらに、本実施形態は、搭載ステージの冷却効果を高めるので、周辺部品への再加熱のリスクを軽減することができる。   As described above, the component mounting apparatus according to the present embodiment can mount an electronic component with low heat resistance while suppressing reheating as in the first and second embodiments. Furthermore, since this embodiment improves the cooling effect of the mounting stage, it is possible to reduce the risk of reheating the peripheral components.

なお、本実施形態の冷却媒体は、搭載ステージの冷却流路を流動して、搭載ステージを冷却できるものであればよい。例えば、冷却媒体は、水やゲル状の流体でもよいし、特定の元素の気体でもよい。
(第4の実施形態)
本発明の第4実施形態について説明する。図4、本発明の第4実施形態の部品実装装置104構成例を示した断面説明図である。
In addition, the cooling medium of this embodiment should just be a thing which can flow the cooling flow path of a mounting stage and can cool a mounting stage. For example, the cooling medium may be water or a gel fluid, or may be a gas of a specific element.
(Fourth embodiment)
A fourth embodiment of the present invention will be described. FIG. 4 is an explanatory cross-sectional view showing a configuration example of the component mounting apparatus 104 according to the fourth embodiment of the present invention.

図4参照して、本実施形態の部品実装装置104ついて説明する。部品実装装置104は、図1のレーザ照射部110がレーザ照射部111に、搭載ステージ20が搭載ステージ26に、充填部22が充填部27に、熱伝導変更部50が熱伝導変更部53に、基板10が基板14に変更されていることが第1の実施形態と相違する。よって、第1の実施形態と同一の構成要素には同一の参照番号を付記して、その説明を省略し、変更点を説明する。   With reference to FIG. 4, the component mounting apparatus 104 of this embodiment is demonstrated. In the component mounting apparatus 104, the laser irradiation unit 110 of FIG. 1 is the laser irradiation unit 111, the mounting stage 20 is the mounting stage 26, the filling unit 22 is the filling unit 27, and the heat conduction changing unit 50 is the heat conduction changing unit 53. The substrate 10 is changed to the substrate 14, which is different from the first embodiment. Therefore, the same components as those in the first embodiment are denoted by the same reference numerals, description thereof will be omitted, and changes will be described.

部品実装装置104では、レーザ発振部(図示せず)によって出力されたレーザ光がレーザ光誘導部(図示せず)で誘導され、レーザ照射部111から外部に照射される。レーザ照射部111から照射されたレーザ光は、搭載ステージ20を貫通した充填部27と基板14の裏面導通部13に設けられたホール15を通過し、基板母材11を透過して、実装部品30下部のはんだ40を溶融する。そのため、レーザ照射部111から照射されるレーザ光は基板14の基板母材11を透過する波長帯に変更されており、基板14の裏面導通部13にはホール15が設けられる。ホール15はレーザ光による加熱の効率化のため、裏面導通部13に設けられたレーザ光の通過孔で、実装部品30下部のはんだ40に対応して設けられる。レーザ照射部111のレーザ光の照射が停止されることで、実装部品30下部のはんだ40は凝固する。このように、レーザ照射部111のレーザ光によって、実装部品30は基板14に実装される。   In the component mounting apparatus 104, the laser beam output from the laser oscillation unit (not shown) is guided by the laser beam guiding unit (not shown) and is irradiated to the outside from the laser irradiation unit 111. The laser light emitted from the laser irradiation unit 111 passes through the filling part 27 penetrating the mounting stage 20 and the hole 15 provided in the back surface conduction part 13 of the substrate 14, passes through the substrate base material 11, and is mounted. The lower solder 40 is melted. Therefore, the laser light emitted from the laser irradiation unit 111 is changed to a wavelength band that transmits the substrate base material 11 of the substrate 14, and a hole 15 is provided in the back surface conduction unit 13 of the substrate 14. The hole 15 is a laser light passage hole provided in the back surface conductive portion 13 for efficiency of heating by laser light, and is provided corresponding to the solder 40 below the mounting component 30. When the laser irradiation of the laser irradiation unit 111 is stopped, the solder 40 under the mounting component 30 is solidified. As described above, the mounting component 30 is mounted on the substrate 14 by the laser light from the laser irradiation unit 111.

充填部27は、基板14の実装部品30の実装位置に対応して、搭載ステージ26を貫通する貫通穴である。充填部27である貫通穴は、搭載ステージ26より熱伝導率の低い熱伝導変更部53として、さらにレーザ照射部111からのレーザ光の通過孔として兼用される。なお、搭載ステージ26が、例えば、XYステージ(図示せず)に保持されていれば、XYステージにも、レーザ照射部111からのレーザ光を通過させる通過部が設けられればよい。   The filling portion 27 is a through hole that penetrates the mounting stage 26 corresponding to the mounting position of the mounting component 30 on the substrate 14. The through hole which is the filling portion 27 is also used as a heat conduction changing portion 53 having a lower thermal conductivity than the mounting stage 26 and also as a passage hole for laser light from the laser irradiation portion 111. Note that if the mounting stage 26 is held on, for example, an XY stage (not shown), the XY stage may be provided with a passing portion that allows the laser light from the laser irradiation unit 111 to pass therethrough.

このように、本実施形態では、搭載ステージ母材に設けられた熱伝導変更部をレーザ光の通過部として兼用して、基板裏面から基板母材を透過する波長帯のレーザ光で接合材を加熱して、実装部品が基板に実装される。そのため、レーザ光による実装部品や基板の損傷、はんだ飛散などのない実装品質が確保できる。また、本実施形態は、これまでの実施形態と同様に、周辺部品の接合部への再加熱も抑制することができる。   As described above, in this embodiment, the heat conduction changing portion provided in the mounting stage base material is also used as the laser light passing portion, and the bonding material is used with the laser beam in the wavelength band that transmits the substrate base material from the back surface of the substrate. The mounting component is mounted on the substrate by heating. For this reason, it is possible to ensure mounting quality free from damages of mounted components and substrates by laser light, solder scattering, and the like. Moreover, this embodiment can also suppress the reheating to the junction part of peripheral components similarly to the previous embodiment.

以上、本実施形態の部品実装装置は、これまでの実施形態と同様に、再加熱を抑制して耐熱性の低い電子部品を実装することができる。さらに、本実施形態は、基板裏面から加熱することで実装品質を向上することができる。   As described above, the component mounting apparatus according to the present embodiment can mount an electronic component with low heat resistance while suppressing reheating as in the previous embodiments. Furthermore, this embodiment can improve mounting quality by heating from the back surface of the substrate.

なお、本実施形態の充填部は搭載ステージを貫通する貫通穴としてレーザ照射部のレーザ光を通過させると説明した。しかし、充填部は、レーザ光を透過できる部材であれば充填されてもよい。すなわち、搭載ステージ母材より熱伝導率が低く、レーザ光に対して低反射および高透過である部材であれば、充填部に充填されてもよい。例えば、基板母材がシリコンである場合、レーザ光は近赤外の波長帯とし、充填部に充填される部材は石英ガラスなどでよい。
(第5の実施形態)
本発明の第5の実施形態について説明する。図5は、本発明の第5の実施形態の部品実装装置105の構成例を示した断面説明図である。
In addition, it demonstrated that the filling part of this embodiment permeate | transmits the laser beam of a laser irradiation part as a through-hole which penetrates a mounting stage. However, the filling portion may be filled as long as it is a member that can transmit laser light. That is, the filling portion may be filled as long as it has a lower thermal conductivity than the mounting stage base material and has low reflection and high transmission with respect to the laser beam. For example, when the substrate base material is silicon, the laser light may be in the near infrared wavelength band, and the member filled in the filling portion may be quartz glass or the like.
(Fifth embodiment)
A fifth embodiment of the present invention will be described. FIG. 5 is an explanatory cross-sectional view showing a configuration example of a component mounting apparatus 105 according to the fifth embodiment of the present invention.

図5を参照して、本実施形態の部品実装装置105について説明する。部品実装装置105は、図4で説明した搭載ステージ26が搭載ステージ28に変更され、搭載ステージ母材21に冷却流路63が追加されていることが、第4の実施形態と相違する。よって、第4の実施形態と同一の構成要素には同一の参照番号を付記して、その説明を省略し、変更点を説明する。   With reference to FIG. 5, the component mounting apparatus 105 of this embodiment is demonstrated. The component mounting apparatus 105 is different from the fourth embodiment in that the mounting stage 26 described with reference to FIG. 4 is changed to a mounting stage 28 and a cooling flow path 63 is added to the mounting stage base material 21. Therefore, the same components as those in the fourth embodiment are denoted by the same reference numerals, description thereof will be omitted, and changes will be described.

搭載ステージ28の充填部27を除いた部位には、冷却媒体を流入させる流入口61と排出口62を備えた、冷却媒体を流動させる冷却流路63が設けられる。   A portion of the mounting stage 28 excluding the filling portion 27 is provided with a cooling flow path 63 for flowing the cooling medium, which includes an inlet 61 and an outlet 62 for allowing the cooling medium to flow in.

実装部品30下部のはんだ40を加熱する熱の周辺への熱伝導は、熱伝導変更部53の周辺の搭載ステージ母材21に行われる。搭載ステージ母材21に伝わった熱は、流入口61から流入して冷却流路63の内部を流動する冷却媒体に伝えられる。冷却媒体に伝えられた熱は排出口62から外部に排熱される。さらに、流入口61から流入する冷却媒体によって、搭載ステージ母材21そのものが冷却される。そのため、実装部品30の周辺に位置する周辺部品31および32への再加熱はさらに抑制される。なお、冷却媒体を流動させるポンプや、冷却媒体の熱を廃棄する放熱フィンなどや冷却媒体を外部で循環させるパイプなどは図示しない。   Heat conduction to the periphery of the heat for heating the solder 40 under the mounting component 30 is performed on the mounting stage base material 21 around the heat conduction changing portion 53. The heat transferred to the mounting stage base material 21 is transferred from the inlet 61 to the cooling medium flowing in the cooling flow path 63. The heat transferred to the cooling medium is exhausted to the outside through the discharge port 62. Further, the mounting stage base material 21 itself is cooled by the cooling medium flowing in from the inlet 61. Therefore, reheating to the peripheral components 31 and 32 located around the mounting component 30 is further suppressed. Note that a pump for flowing the cooling medium, a radiating fin for discarding the heat of the cooling medium, a pipe for circulating the cooling medium outside, and the like are not shown.

このように、本実施形態では、搭載ステージ母材に設けられた冷却流路に冷却媒体を流動させることによって、実装部品の接合材を加熱する熱の周辺への熱伝導が、熱伝導変更部の周辺の搭載ステージ母材および冷却媒体に行われる。冷却媒体に伝えられた熱は冷却媒体により外部に運ばれて廃熱される。搭載ステージ母材自体が冷却媒体により冷却されるので、周辺部品への再加熱がさらに抑制される。そのため、周辺部品の接合部への再加熱による接合品質の劣化のリスクがさらに軽減される。また、複数の実装部品が順次実装される際においても、搭載ステージの冷却効果が高められているので、基板母材や搭載ステージ母材への蓄熱が抑制され、再加熱のリスクは軽減される。   As described above, in this embodiment, the heat conduction to the periphery of the heat for heating the bonding material of the mounting component is performed by causing the cooling medium to flow in the cooling flow path provided in the mounting stage base material. Is carried out on the mounting stage base material and the cooling medium in the vicinity of. The heat transferred to the cooling medium is carried to the outside by the cooling medium and is wasted. Since the mounting stage base material itself is cooled by the cooling medium, reheating to the peripheral components is further suppressed. For this reason, the risk of deterioration of the bonding quality due to the reheating of the peripheral parts to the bonded portion is further reduced. Also, even when multiple mounting components are mounted in sequence, the cooling effect of the mounting stage is enhanced, so heat storage on the substrate base material and mounting stage base material is suppressed, and the risk of reheating is reduced. .

以上、本実施形態の部品実装装置は、第4の実施形態と同様に、再加熱を抑制して耐熱性の低い電子部品を実装することができる。さらに、本実施形態は、搭載ステージの冷却効果を高めるので、周辺部品への再加熱のリスクをさらに軽減することができる。   As described above, the component mounting apparatus according to the present embodiment can mount an electronic component with low heat resistance while suppressing reheating as in the fourth embodiment. Furthermore, since this embodiment enhances the cooling effect of the mounting stage, the risk of reheating the peripheral parts can be further reduced.

なお、本実施形態の冷却媒体は、搭載ステージの冷却流路を流動して、搭載ステージを冷却できるものであればよい。例えば、冷却媒体は、水やゲル状の流体でもよいし、特定の元素の気体でもよい。   In addition, the cooling medium of this embodiment should just be a thing which can flow the cooling flow path of a mounting stage and can cool a mounting stage. For example, the cooling medium may be water or a gel fluid, or may be a gas of a specific element.

なお、本願発明は、上述の各実施形態に限定されるものではなく、本願発明の要旨を逸脱しない範囲で種々変更、変形して実施することができる。   Note that the present invention is not limited to the above-described embodiments, and various modifications and changes can be made without departing from the spirit of the present invention.

例えば、本発明のレーザ照射部が実装部品を実装する基板の実装面側と裏面側のそれぞれに設けられて、レーザ光が実装部品の接合材に同時に照射されてもよい。基板の両面から接合材が同時に加熱されることで加熱時間が短縮され、周辺部品への再加熱のリスクはさらに軽減される。   For example, the laser irradiation unit of the present invention may be provided on each of the mounting surface side and the back surface side of the substrate on which the mounting component is mounted, and the laser beam may be simultaneously irradiated onto the bonding material of the mounting component. The heating time is shortened by simultaneously heating the bonding material from both sides of the substrate, and the risk of reheating the peripheral components is further reduced.

10、14 基板
11 基板母材
12 実装面導通部
13 裏面導通部
15 ホール
20、23、25、26、28 搭載ステージ
21 搭載ステージ母材
22、24、27 充填部
30 実装部品
31、32 周辺部品
40 はんだ
50、51、52、53 熱伝導変更部
61 流入口
62 排出口
63 冷却流路
101、102、103、104、105 部品実装装置
110、111 レーザ照射部
DESCRIPTION OF SYMBOLS 10, 14 Board | substrate 11 Substrate base material 12 Mounting surface conduction | electrical_connection part 13 Back surface conduction | electrical_connection part 15 Hole 20, 23, 25, 26, 28 Mounting stage 21 Mounting stage base material 22, 24, 27 Filling part 30 Mounting parts 31, 32 Peripheral parts 40 Solder 50, 51, 52, 53 Thermal conduction changer 61 Inlet 62 Discharge 63 Cooling channel 101, 102, 103, 104, 105 Component mounting device 110, 111 Laser irradiation unit

Claims (10)

第1実装部品を基板に実装する部位に対応して、前記基板と接触して保持する搭載ステージの母材より熱伝導率の低い第1部材の第1熱伝導変更部を前記基板との接触面に設ける
ことを特徴とする部品実装装置。
Corresponding to the portion where the first mounting component is mounted on the substrate, the first thermal conductivity changing portion of the first member having a lower thermal conductivity than the base material of the mounting stage that contacts and holds the substrate is in contact with the substrate. A component mounting apparatus provided on a surface.
前記第1熱伝導変更部が前記搭載ステージに設けられた充填部に前記第1部材が充填される
ことを特徴とする請求項1に記載の部品実装装置。
2. The component mounting apparatus according to claim 1, wherein the first member is filled in a filling portion provided on the mounting stage with the first heat conduction changing portion.
前記充填部が前記母材を貫通する
ことを特徴とする請求項2に記載の部品実装装置。
The component mounting apparatus according to claim 2, wherein the filling portion penetrates the base material.
前記第1部材が空気である
ことを特徴とする請求項1から3のいずれかに記載の部品実装装置。
The component mounting apparatus according to claim 1, wherein the first member is air.
前記基板の母材を透過する波長帯のレーザ光を照射するレーザ照射部を備え、
前記第1部材が前記レーザ光を透過する
ことを特徴とする請求項1から4のいずれかに記載の部品実装装置。
A laser irradiation unit that irradiates a laser beam having a wavelength band that transmits the base material of the substrate;
The component mounting apparatus according to claim 1, wherein the first member transmits the laser light.
前記第1熱伝導変更部が前記接触面から所定の深さを備える
ことを特徴とする請求項1、2または4のいずれかに記載の部品実装装置。
5. The component mounting apparatus according to claim 1, wherein the first heat conduction changing portion has a predetermined depth from the contact surface.
前記搭載ステージの前記充填部を除く部位に、冷却媒体を流入させる流入口と前記冷却媒体を排出する排出口を備えた冷却流路が設けられ、
前記冷却流路の内部に前記冷却媒体を流動させる
ことを特徴とする請求項2から6のいずれかに記載の部品実装装置。
A cooling flow path provided with an inflow port for allowing a cooling medium to flow in and a discharge port for discharging the cooling medium is provided in a portion excluding the filling portion of the mounting stage,
The component mounting apparatus according to claim 2, wherein the cooling medium is caused to flow inside the cooling flow path.
第2実装部品を前記基板に実装する部位に対応して、前記第1部材の第2熱伝導変更部と、
前記搭載ステージを保持して移動させる移載ステージを備える
ことを特徴とする請求項1から7のいずれかに記載の部品実装装置。
Corresponding to the site where the second mounting component is mounted on the substrate, the second heat conduction changing portion of the first member,
The component mounting apparatus according to claim 1, further comprising a transfer stage that holds and moves the mounting stage.
第1実装部品を基板に実装する部位に対応して、前記基板と接触して保持する搭載ステージの母材より熱伝導率の低い第1部材の第1熱伝導変更部を前記基板との接触面に設ける
ことを特徴とする搭載ステージ。
Corresponding to the portion where the first mounting component is mounted on the substrate, the first thermal conductivity changing portion of the first member having a lower thermal conductivity than the base material of the mounting stage that contacts and holds the substrate is in contact with the substrate. A mounting stage characterized by being provided on the surface.
基板と接触して保持する搭載ステージの母材より熱伝導率の低い第1部材の第1熱伝導変更部を前記搭載ステージの、第1実装部品を前記基板に実装する部位に対応する前記基板との接触面に設けて、前記第1実装部品の接合材を加熱して前記第1部品を実装する
ことを特徴とする部品実装方法。
The substrate corresponding to a portion of the mounting stage on which the first mounting component is mounted on the substrate, the first heat conduction changing portion of the first member having a lower thermal conductivity than the base material of the mounting stage held in contact with the substrate And mounting the first component by heating the bonding material of the first mounting component.
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WO2021201439A1 (en) * 2020-03-31 2021-10-07 스템코 주식회사 Workstage unit and reflow device equipped with same
KR20240037767A (en) * 2022-09-15 2024-03-22 박은정 A Reel to Reel Type of a Mounter

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JP2001210675A (en) * 2000-01-28 2001-08-03 Optrex Corp Pressure jointing device
JP2010166097A (en) * 2010-04-28 2010-07-29 Sony Chemical & Information Device Corp Connection method and connection structure obtained by using connection apparatus and the connection method

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Publication number Priority date Publication date Assignee Title
US4184623A (en) * 1976-09-09 1980-01-22 Burkhard Strasser Process for bonding circuit modules onto a thin-film circuit
JPH09260820A (en) * 1996-03-26 1997-10-03 Taiyo Yuden Co Ltd Electronic part mounting method
JPH1145910A (en) * 1997-07-25 1999-02-16 Seiko Epson Corp Apparatus and method for mounting electronic components
JP2001210675A (en) * 2000-01-28 2001-08-03 Optrex Corp Pressure jointing device
JP2010166097A (en) * 2010-04-28 2010-07-29 Sony Chemical & Information Device Corp Connection method and connection structure obtained by using connection apparatus and the connection method

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021201439A1 (en) * 2020-03-31 2021-10-07 스템코 주식회사 Workstage unit and reflow device equipped with same
KR20240037767A (en) * 2022-09-15 2024-03-22 박은정 A Reel to Reel Type of a Mounter
KR102693890B1 (en) * 2022-09-15 2024-08-09 레이저쎌 주식회사 A Reel to Reel Type of a Mounter

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