JP2016038387A - 暴露装置用の複数のセンサを備えるセンサ装置 - Google Patents
暴露装置用の複数のセンサを備えるセンサ装置 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
- G01N17/002—Test chambers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
- G01N17/004—Investigating resistance of materials to the weather, to corrosion, or to light to light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
- G01N17/006—Investigating resistance of materials to the weather, to corrosion, or to light of metals
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Abstract
【解決手段】センサ装置100は、略正平行六面体の基本形状を有する、ステンレス鋼からなるセンサハウジング110を含む。センサハウジング110の第一外壁112の前方には、プレート111が第一外壁112から間隔を空けて該外壁に固定される。該固定は、プレート111の四隅の領域に配置された複数のねじ113によって施され、各ねじは、プレート111と第一外壁112との間のスペーサスリーブ114を通過し、第一外壁112の四隅の領域の対応する各ボア内に螺合される。ブラック標準センサ120はプレート111に固定され、暴露装置の動作中には暴露装置の照射源と対向する。
【選択図】図2
Description
Claims (15)
- 試料の暴露又は耐光性試験用装置(10)のためのセンサ装置(100)であって、
ブラック標準センサ(120)と、
紫外線照射センサ(130)と、
空気温度センサと、
湿度センサと
から成るグループから少なくとも二つのセンサが接続されるセンサハウジング(110)を備える、センサ装置(100)。 - ブラックパネルセンサ又はブラック標準センサ(120)は、センサハウジング(110)の外側壁(111)に固定される、請求項1に記載のセンサ装置(100)。
- 前記外側壁(111)は、プレート(111)によって形成され、前記センサハウジング(110)の第一外壁(112)から間隔を空けて配置される、請求項2に記載のセンサ装置(100)。
- 紫外線照射が通過するための照射通過開口は、前記プレート(111)及び前記第一外壁(112)に形成される、請求項3に記載のセンサ装置(100)。
- 空気温度センサ及び湿度センサに外気を通過させるための空気通路開口は、前記センサハウジング(110)の外壁(112)に形成される、請求項1から請求項4のいずれか一項に記載のセンサ装置(100)。
- 前記プレート(111)は前記空気通路開口を覆う、請求項3及び5に記載のセンサ装置(100)。
- バッテリー(150)又は充電式バッテリーは前記センサハウジング(110)内に配置される、請求項1から請求項6のいずれか一項に記載のセンサ装置(100)。
- 第一回路基板(160)は、制御部(270)を前記第一回路基板上に配置させつつ前記センサハウジング(110)内に配置され、前記各センサ(120、130)からの各出力信号を前記制御部に供給できる、請求項1から請求項7のいずれか一項に記載のセンサ装置(100)。
- 前記紫外線照射センサ(130)特有のデータを記憶する第一メモリ部(280)は、前記第一回路基板(160)上に配置される、請求項8に記載のセンサ装置(100)。
- 前記第一メモリ部(280)は、DRAM、特に強誘電体メモリ(FRAM)を有する、請求項9に記載のセンサ装置(100)。
- 前記制御部(270)は、前記装置(10)の照射源特有のデータを記録する第二メモリ部(271)を有する、請求項8から請求項10のいずれか一項に記載のセンサ装置(100)。
- 試料の暴露又は耐光性試験用の装置(10)であって、
暴露対象の試料を保持する保持装置と、
複数のセンサ、特に空気温度センサと湿度センサとが接続されるセンサハウジングを有するセンサ装置と
を備える、装置(10)。 - 前記空気温度センサ及び前記湿度センサは、前記センサハウジング内に設けられる共通ハウジングに配置される、請求項12に記載の装置(10)。
- 前記センサ装置は、前記センサハウジングに接続されるブラックパネルセンサ又はブラック標準センサと紫外線照射センサとをさらに有する、請求項12又は請求項13に記載の装置(10)。
- 暴露動作を制御する中央制御装置をさらに備え、
前記制御装置に、前記各センサのうちの少なくとも一つからの出力信号を供給できる、請求項12から請求項14のいずれか一項に記載の装置(10)。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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EP14180157.1A EP2982962B1 (de) | 2014-08-07 | 2014-08-07 | Sensoreinrichtung mit mehreren Sensoren für eine Bewitterungsvorrichtung |
EP14180157.1 | 2014-08-07 |
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JP2016038387A true JP2016038387A (ja) | 2016-03-22 |
JP6147819B2 JP6147819B2 (ja) | 2017-06-14 |
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JP2015155699A Active JP6147819B2 (ja) | 2014-08-07 | 2015-08-06 | 暴露装置用の複数のセンサを備えるセンサ装置 |
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US (1) | US9791363B2 (ja) |
EP (1) | EP2982962B1 (ja) |
JP (1) | JP6147819B2 (ja) |
CN (1) | CN105372170B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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EP3486635A1 (de) * | 2017-11-16 | 2019-05-22 | Atlas Material Testing Technology GmbH | Sensoreinrichtung mit einem luftmassensensor für eine bewitterungsvorrichtung |
US11868108B2 (en) * | 2021-06-29 | 2024-01-09 | Volvo Car Corporation | Artificial weathering of a multi-dimensional object |
Citations (7)
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JPS5937446A (ja) * | 1982-08-26 | 1984-02-29 | Yoichi Minematsu | 耐光性試験機用放射照度モニタ−装置 |
US4618776A (en) * | 1983-03-24 | 1986-10-21 | W. C. Heraeus Gmbh | Light and weather resistance sensing system with a sensed signal transmission channel |
JPH01242927A (ja) * | 1987-10-22 | 1989-09-27 | Atlas Electric Devices Co | 放射線センサー |
JP2004145257A (ja) * | 2002-04-23 | 2004-05-20 | Semiconductor Energy Lab Co Ltd | 発光装置及び該発光装置の生産システム |
JP2005308648A (ja) * | 2004-04-23 | 2005-11-04 | Fuji Xerox Co Ltd | 紫外線測定法、及び紫外線測定装置 |
JP3124486U (ja) * | 2006-06-09 | 2006-08-17 | スガ試験機株式会社 | 耐候光試験機搭載型連続測定器 |
JP2006258810A (ja) * | 2005-03-17 | 2006-09-28 | Atlas Material Testing Technology Llc | 促進耐候性試験装置用高設ブラックパネル |
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JP3124486B2 (ja) | 1996-05-09 | 2001-01-15 | 淳 中川 | 鉄骨柱と鉄骨梁の接合部構造 |
EP1325305B1 (en) * | 2000-09-15 | 2007-07-04 | Q-Lab Corporation | Multiple-blower relative humidity controlled test chamber |
US7346726B2 (en) | 2003-07-30 | 2008-03-18 | Nxp B.V. | Integrated circuit with dynamic communication service selection |
AU2004284370B2 (en) * | 2003-09-24 | 2007-12-20 | Q-Lab Corporation | Method and apparatus for determining the resistance of materials to light and corrosives |
DE102004037602B4 (de) * | 2004-08-03 | 2006-05-24 | Atlas Material Testing Technology Gmbh | Bewitterungsvorrichtung mit UV-Strahlungsquellen und Strahlungssensoren enthaltend einen zweifach kalibrierten UV-Sensor |
US20060254372A1 (en) * | 2005-05-16 | 2006-11-16 | Kurt Scott | Non-contact temperature sensor for a weathering test device |
JP3994199B1 (ja) * | 2007-02-16 | 2007-10-17 | スガ試験機株式会社 | 耐候試験機 |
CA2606986A1 (en) * | 2007-09-10 | 2009-03-10 | Veris Industries, Llc | Duct-mountable sensing unit |
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JP2014115205A (ja) * | 2012-12-11 | 2014-06-26 | Nagano Science Kk | 環境試験装置 |
-
2014
- 2014-08-07 EP EP14180157.1A patent/EP2982962B1/de active Active
-
2015
- 2015-07-27 US US14/810,128 patent/US9791363B2/en active Active
- 2015-08-06 CN CN201510475830.4A patent/CN105372170B/zh active Active
- 2015-08-06 JP JP2015155699A patent/JP6147819B2/ja active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5937446A (ja) * | 1982-08-26 | 1984-02-29 | Yoichi Minematsu | 耐光性試験機用放射照度モニタ−装置 |
US4618776A (en) * | 1983-03-24 | 1986-10-21 | W. C. Heraeus Gmbh | Light and weather resistance sensing system with a sensed signal transmission channel |
JPH01242927A (ja) * | 1987-10-22 | 1989-09-27 | Atlas Electric Devices Co | 放射線センサー |
JP2004145257A (ja) * | 2002-04-23 | 2004-05-20 | Semiconductor Energy Lab Co Ltd | 発光装置及び該発光装置の生産システム |
JP2005308648A (ja) * | 2004-04-23 | 2005-11-04 | Fuji Xerox Co Ltd | 紫外線測定法、及び紫外線測定装置 |
JP2006258810A (ja) * | 2005-03-17 | 2006-09-28 | Atlas Material Testing Technology Llc | 促進耐候性試験装置用高設ブラックパネル |
JP3124486U (ja) * | 2006-06-09 | 2006-08-17 | スガ試験機株式会社 | 耐候光試験機搭載型連続測定器 |
Also Published As
Publication number | Publication date |
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US9791363B2 (en) | 2017-10-17 |
US20160041084A1 (en) | 2016-02-11 |
EP2982962A1 (de) | 2016-02-10 |
EP2982962B1 (de) | 2020-01-01 |
JP6147819B2 (ja) | 2017-06-14 |
CN105372170B (zh) | 2018-10-16 |
CN105372170A (zh) | 2016-03-02 |
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