JP2016008956A5 - - Google Patents

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Publication number
JP2016008956A5
JP2016008956A5 JP2014131808A JP2014131808A JP2016008956A5 JP 2016008956 A5 JP2016008956 A5 JP 2016008956A5 JP 2014131808 A JP2014131808 A JP 2014131808A JP 2014131808 A JP2014131808 A JP 2014131808A JP 2016008956 A5 JP2016008956 A5 JP 2016008956A5
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JP
Japan
Prior art keywords
imaging
array
image
phase difference
region
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JP2014131808A
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English (en)
Japanese (ja)
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JP6524617B2 (ja
JP2016008956A (ja
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Priority claimed from JP2014131808A external-priority patent/JP6524617B2/ja
Priority to JP2014131808A priority Critical patent/JP6524617B2/ja
Priority to TW104116555A priority patent/TWI693391B/zh
Priority to CN201580027058.8A priority patent/CN106456070B/zh
Priority to EP15735749.2A priority patent/EP3161433A2/en
Priority to PCT/JP2015/003023 priority patent/WO2015198562A2/en
Priority to US15/313,173 priority patent/US11054304B2/en
Priority to KR1020167032066A priority patent/KR102425589B1/ko
Publication of JP2016008956A publication Critical patent/JP2016008956A/ja
Publication of JP2016008956A5 publication Critical patent/JP2016008956A5/ja
Publication of JP6524617B2 publication Critical patent/JP6524617B2/ja
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Expired - Fee Related legal-status Critical Current
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JP2014131808A 2014-06-26 2014-06-26 撮像装置および方法 Expired - Fee Related JP6524617B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2014131808A JP6524617B2 (ja) 2014-06-26 2014-06-26 撮像装置および方法
TW104116555A TWI693391B (zh) 2014-06-26 2015-05-22 成像裝置及方法
PCT/JP2015/003023 WO2015198562A2 (en) 2014-06-26 2015-06-17 Imaging device and method
EP15735749.2A EP3161433A2 (en) 2014-06-26 2015-06-17 Imaging device and method
CN201580027058.8A CN106456070B (zh) 2014-06-26 2015-06-17 成像装置和方法
US15/313,173 US11054304B2 (en) 2014-06-26 2015-06-17 Imaging device and method
KR1020167032066A KR102425589B1 (ko) 2014-06-26 2015-06-17 촬상 장치 및 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014131808A JP6524617B2 (ja) 2014-06-26 2014-06-26 撮像装置および方法

Publications (3)

Publication Number Publication Date
JP2016008956A JP2016008956A (ja) 2016-01-18
JP2016008956A5 true JP2016008956A5 (enExample) 2017-03-30
JP6524617B2 JP6524617B2 (ja) 2019-06-05

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Family Applications (1)

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JP2014131808A Expired - Fee Related JP6524617B2 (ja) 2014-06-26 2014-06-26 撮像装置および方法

Country Status (7)

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US (1) US11054304B2 (enExample)
EP (1) EP3161433A2 (enExample)
JP (1) JP6524617B2 (enExample)
KR (1) KR102425589B1 (enExample)
CN (1) CN106456070B (enExample)
TW (1) TWI693391B (enExample)
WO (1) WO2015198562A2 (enExample)

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WO2019098005A1 (ja) * 2017-11-16 2019-05-23 日本電気株式会社 光測定装置及び光測定方法
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CN112113661B (zh) * 2020-07-29 2021-07-13 西安交通大学 一种深度学习型快照式光谱成像装置及其探测方法
KR102755638B1 (ko) * 2021-02-05 2025-01-21 성균관대학교산학협력단 하이퍼 스펙트럴 카메라를 이용한 비접촉식 바이탈 사인 예측 방법, 비접촉식 바이탈 사인 예측 장치, 예측 방법을 수행하기 위한 컴퓨터 프로그램 및 컴퓨터 판독가능한 기록 매체
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