JP2015506595A - プニクチド吸収体膜とエミッタ膜との間の伝導帯オフセットを低下させた光起電力デバイスの製造方法 - Google Patents
プニクチド吸収体膜とエミッタ膜との間の伝導帯オフセットを低下させた光起電力デバイスの製造方法 Download PDFInfo
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- 239000003607 modifier Substances 0.000 claims abstract description 32
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- 229910052725 zinc Inorganic materials 0.000 claims abstract description 17
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- 150000001875 compounds Chemical class 0.000 claims abstract description 11
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- 239000011574 phosphorus Substances 0.000 claims abstract description 10
- 239000004065 semiconductor Substances 0.000 claims description 122
- 238000000034 method Methods 0.000 claims description 51
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- 238000000151 deposition Methods 0.000 claims description 9
- 229910052738 indium Inorganic materials 0.000 claims description 9
- 238000010521 absorption reaction Methods 0.000 claims description 8
- 229910021476 group 6 element Inorganic materials 0.000 claims description 8
- 229910052791 calcium Inorganic materials 0.000 claims description 7
- 229910052796 boron Inorganic materials 0.000 claims description 6
- 239000002243 precursor Substances 0.000 claims description 6
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- 229910052708 sodium Inorganic materials 0.000 claims description 3
- 229910052714 tellurium Inorganic materials 0.000 claims description 3
- 229910052799 carbon Inorganic materials 0.000 claims description 2
- 229910052745 lead Inorganic materials 0.000 claims description 2
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- HOKBIQDJCNTWST-UHFFFAOYSA-N phosphanylidenezinc;zinc Chemical compound [Zn].[Zn]=P.[Zn]=P HOKBIQDJCNTWST-UHFFFAOYSA-N 0.000 abstract description 27
- 239000006011 Zinc phosphide Substances 0.000 abstract description 24
- 229940048462 zinc phosphide Drugs 0.000 abstract description 24
- 229910052751 metal Inorganic materials 0.000 abstract description 22
- 239000002184 metal Substances 0.000 abstract description 21
- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 abstract description 7
- 229910052755 nonmetal Inorganic materials 0.000 abstract description 6
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- ZSBXGIUJOOQZMP-JLNYLFASSA-N Matrine Chemical compound C1CC[C@H]2CN3C(=O)CCC[C@@H]3[C@@H]3[C@H]2N1CCC3 ZSBXGIUJOOQZMP-JLNYLFASSA-N 0.000 description 5
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- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 4
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- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 3
- 238000005275 alloying Methods 0.000 description 3
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- 239000006104 solid solution Substances 0.000 description 3
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- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910005540 GaP Inorganic materials 0.000 description 2
- 229910000673 Indium arsenide Inorganic materials 0.000 description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- DBKNIEBLJMAJHX-UHFFFAOYSA-N [As]#B Chemical compound [As]#B DBKNIEBLJMAJHX-UHFFFAOYSA-N 0.000 description 2
- RNQKDQAVIXDKAG-UHFFFAOYSA-N aluminum gallium Chemical compound [Al].[Ga] RNQKDQAVIXDKAG-UHFFFAOYSA-N 0.000 description 2
- AJGDITRVXRPLBY-UHFFFAOYSA-N aluminum indium Chemical compound [Al].[In] AJGDITRVXRPLBY-UHFFFAOYSA-N 0.000 description 2
- CZJCMXPZSYNVLP-UHFFFAOYSA-N antimony zinc Chemical compound [Zn].[Sb] CZJCMXPZSYNVLP-UHFFFAOYSA-N 0.000 description 2
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 2
- FFBGYFUYJVKRNV-UHFFFAOYSA-N boranylidynephosphane Chemical compound P#B FFBGYFUYJVKRNV-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 230000003750 conditioning effect Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- RKTYLMNFRDHKIL-UHFFFAOYSA-N copper;5,10,15,20-tetraphenylporphyrin-22,24-diide Chemical compound [Cu+2].C1=CC(C(=C2C=CC([N-]2)=C(C=2C=CC=CC=2)C=2C=CC(N=2)=C(C=2C=CC=CC=2)C2=CC=C3[N-]2)C=2C=CC=CC=2)=NC1=C3C1=CC=CC=C1 RKTYLMNFRDHKIL-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
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- 229910052737 gold Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
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- 238000007254 oxidation reaction Methods 0.000 description 2
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- 230000006798 recombination Effects 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 239000011593 sulfur Substances 0.000 description 2
- IHGSAQHSAGRWNI-UHFFFAOYSA-N 1-(4-bromophenyl)-2,2,2-trifluoroethanone Chemical compound FC(F)(F)C(=O)C1=CC=C(Br)C=C1 IHGSAQHSAGRWNI-UHFFFAOYSA-N 0.000 description 1
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- UZIGZGIMMXFFGH-UHFFFAOYSA-N 12044-49-4 Chemical compound [Mg]=[As][Mg][As]=[Mg] UZIGZGIMMXFFGH-UHFFFAOYSA-N 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
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- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
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- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- 240000002329 Inga feuillei Species 0.000 description 1
- 239000005953 Magnesium phosphide Substances 0.000 description 1
- 229910000861 Mg alloy Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910003086 Ti–Pt Inorganic materials 0.000 description 1
- 229910007657 ZnSb Inorganic materials 0.000 description 1
- KXNLCSXBJCPWGL-UHFFFAOYSA-N [Ga].[As].[In] Chemical compound [Ga].[As].[In] KXNLCSXBJCPWGL-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
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- FTWRSWRBSVXQPI-UHFFFAOYSA-N alumanylidynearsane;gallanylidynearsane Chemical compound [As]#[Al].[As]#[Ga] FTWRSWRBSVXQPI-UHFFFAOYSA-N 0.000 description 1
- LVQULNGDVIKLPK-UHFFFAOYSA-N aluminium antimonide Chemical compound [Sb]#[Al] LVQULNGDVIKLPK-UHFFFAOYSA-N 0.000 description 1
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 1
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- CVXNLQMWLGJQMZ-UHFFFAOYSA-N arsenic zinc Chemical compound [Zn].[As] CVXNLQMWLGJQMZ-UHFFFAOYSA-N 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- FSIONULHYUVFFA-UHFFFAOYSA-N cadmium arsenide Chemical compound [Cd].[Cd]=[As].[Cd]=[As] FSIONULHYUVFFA-UHFFFAOYSA-N 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
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- 238000002474 experimental method Methods 0.000 description 1
- VTGARNNDLOTBET-UHFFFAOYSA-N gallium antimonide Chemical compound [Sb]#[Ga] VTGARNNDLOTBET-UHFFFAOYSA-N 0.000 description 1
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 229910001849 group 12 element Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000011158 quantitative evaluation Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- WGPCGCOKHWGKJJ-UHFFFAOYSA-N sulfanylidenezinc Chemical compound [Zn]=S WGPCGCOKHWGKJJ-UHFFFAOYSA-N 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
- H01L31/072—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN heterojunction type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Photovoltaic Devices (AREA)
Abstract
Description
本出願は、35U.S.C.§119(e)に基づいて、「METHOD OF MAKING PHOTOVOLTAIC DEVICES WITH REDUCED CONDUCTION BAND OFFSET BETWEEN PNICTIDE ABSORBER FILMS AND EMITTER FILMS」の名称で2012年1月31日出願の米国特許仮出願第61/592,957号の優先権を主張する。本出願において、この出願の全体が参照により本明細書に組み込まれる。
本発明は、p型プニクチド半導体吸収体組成物およびn型II族/VI族組成物を組み込んだ固相接合の形成方法に関する。さらに具体的には、本発明は、吸収体とエミッタとの間の伝導帯オフセットを低下させる化学物質をエミッタ中に組み込むことにより、これらのヘテロ接合品質を改善する方法に関する。
a.p型プニクチド半導体膜を用意するステップ、および
b.プニクチド半導体膜上に直接または間接的にカルコゲニド半導体膜を形成するステップであって、前記半導体カルコゲニド膜が少なくとも1種のII族元素、および少なくとも1種のVI族元素を含み、プニクチド半導体膜の近位のカルコゲニド半導体膜の少なくとも一部が、調整剤無添加の、またはより少ない量の少なくとも1種の調整剤を含む同じ条件下で形成され、他の条件は同じカルコゲニド半導体膜組成物に比べて、プニクチド半導体膜とカルコゲニド半導体膜との間の伝導帯オフセットを低下させる少なくとも1種の調整剤(好ましくは、その組成物と合金化可能な、Mgおよび/またはCaなどの金属であるが、しかし、他の実施例は、Sn、F、および/またはCdを含む)を組み込むステップ。
し、この方法は、
a.p型プニクチド半導体膜を用意するステップ、および
b.p型プニクチド半導体膜上に直接または間接的にn型半導体膜を形成するステップであって、
i.少なくとも1種のII族元素および少なくとも1種のVI族元素を含む化合
物を加熱し、蒸気化学種を生成するステップ;
ii.p型プニクチド半導体膜上に直接または間接的に蒸気化学種またはその誘
導体を沈着させるステップ、および
iii.p型プニクチド半導体膜の近位に形成されるn型半導体膜の少なくとも一部がMgおよび/またはCaの内の少なくとも1種を組み込むような条件下でn型半導体膜が沈着される時間の少なくとも一部の時間中に、MgおよびCaの内の少なくとも1種を共沈着させるステップ、
を含む形成ステップを含む。
(a)少なくとも1種のp型、プニクチド半導体組成物を含むp型吸収領域、および
(b)吸収領域上に直接または間接的に設けられたn型エミッタ領域であって、少なくとも1種のII族元素および少なくとも1種のVI族元素を含み、p型吸収領域に近位のn型エミッタ領域の少なくとも一部がMgおよび/またはCaの内の少なくとも1種を組み込んでいるn型エミッタ領域、
を含む。
ΔEc=χB−χA
で与えられるであろう。
aMg(x)Zn(1−x)S=xaMgS+(1−x)aZnS
aMg(3x)Zn3(1−x)P2=xaMg3P2+(1−x)aZn3P2
Eg、Mg(x)Zn(1−x)S=xEg、MgS+(1−x)Eg、ZnS-bx(1−x)
Eg、Mg(3x)Zn3(1−x)P2=xEg、Mg3P2+(1−x)Eg、Zn3P2-bx(1−x)
単一半導体の純粋相試料の内殻準位位置および価電子帯の頂上の高解像度XPS測定値が収集される。通常、表面汚染を回避するために、10nmを超える真空蒸着薄膜が使われる。この測定から、内殻準位(CL)と価電子帯の頂上(VBM)のエネルギー差(ECL A−EVBM A)が単一半導体(A)に対し高精度で測定される。この手続きが対象ヘテロ接合を含む両方の半導体に対し繰り返される。次に、1つの半導体のおおよそ5〜30オングストローム(0.5〜3nm)厚さの極薄膜が第2の半導体のバルク膜(10nm超)上に沈着されて薄いヘテロ接合が生成される。実際にヘテロ接合を検出するために、極薄膜の厚さは、ほぼ生成光電子の脱出深さである。通常は、より正確な測定のために幾つかの異なる膜厚(例えば、10、20、および30オングストローム)が使われ、種々の膜厚に対し得られた値の平均が使われる。ヘテロ接合は、2種の半導体の内殻準位間の正確なエネルギー差(△ECL B−A)に焦点を絞って、高解像度XPSを使用して再度探索される。次に、価電子帯オフセット(△EV)が、集められたXPSデータから次のようにして計算できる。
△EV=(ECL B−EVBM B)−(ECL A−EVBM A)−(△ECL B−A)
最後に、伝導帯オフセットは、ヘテロ接合(Eg、AおよびEg、B)を含む2種の半導体の既知のバンドギャップおよび測定された価電子帯オフセットから以下のように計算できる。
△EC=Eg、B−Eg、A−△EV
△EV=(ECL ZnS−EVBM ZnS)−(ECL Zn3P2−EVBM Zn3P2)−(△ECL ZnS−Zn3P2)
△EC=Eg、ZnS−Eg、Zn3P2−△EV
「METHODOLOGY FOR FORMING PNICTIDE COMPOSITIONS SUITABLE FOR USE IN MICROELECTRONIC DEVICES」という名称で2011年2月11日に出願の同時係属のKimball、らの米国特許仮出願第61/441,997号(代理人整理番号70360(DOW0039P1))、にさらに詳細に記載の技術とこれらの技術の実施に対応する装置に従って化合物原料および分子線エピタキシー(MBE)技術を使用して、縮退ドープされたp型GaAs(001)単結晶基板上に固相ZnS/Zn3P2ヘテロ接合太陽電池が作製される。成長は、10−10torrのベース圧力の超高真空(UHV)分子線エピタキシーチャンバ中で行われる。チャンバは、Zn3P2およびZnSの化合物原料、ならびにAl、Ag、Zn、およびMg元素を備えている。
リン化亜鉛膜成長は、クヌーセン流出セルから99.9999%のZn3P2を昇華させることにより行われる。流出セルは、350℃超に加熱され、移動可能なヌード電離真空計で測定して、5x10−7〜2x10−6Torrのビーム圧を生ずる。成長は、200℃の基板温度で行われる。膜沈着速度は、約0.3〜1.0オングストローム/sである。典型的な膜厚は、400〜500nmである。より厚い膜が可能であるが、より大きい成長速度またはより高いビーム圧が必要となる。Ag元素は、追加のAg源由来の共昇華により、成長プロセス中にドーパントとして組み込まれる。Ag源は700℃〜900℃の温度で操作される。Zn3P2成長直後に、基板温度がZnS沈着温度に下げられる。
ZnS成長は、99.9999%のZnS含有クヌーセン流出セルを使って行われる。流出セルは、沈着のために850℃に加熱される。これにより、約1.5x10−6Torrのビーム圧が生成される。ZnS成長の間、基板は、100℃に保持される。このビーム圧力と基板温度で、ZnS成長速度は、約1オングストローム/sである。100nmの厚さの膜が成長する。成長の間、AlとMgがZnSと共導入される。99.9999%のAl金属を満たした電子ビームエバポレーターを使ってAlが供給される。Al組み込みの程度、すなわち、ドーパント密度は、エバポレーターへの供給電源により制御される。成長膜中のAlの密度は、通常、1x1018〜1x1019cm−3である。Mgは、300℃〜600℃の動作温度の99.9999%のMgを満たした流出セルを使って供給される。Mgは、最初の10〜100nmの膜成長の間のみ、共導入される。代替実施形態では、Mgは、ZnS膜全体にわたり包含されてもよい。
Zn3P2およびZnS膜によりp―nヘテロ接合を形成する。これらの膜が成長した後、被処理物は装置から取り出され、別の装置に移されて、そこで70nmの酸化インジウムスズが透明導電酸化物として1x1mmシャドウマスク全体にわたりZnS上にスパッタリング沈着される。デバイスの光起電性能は、適切な照射の下で、例えば、AM1.51−SUN照射下で評価できる。
Claims (19)
- 固相光起電ヘテロ接合またはその前駆体の製造方法であって、
a.プニクチド半導体膜を用意するステップ、および
b.カルコゲニド半導体膜を直接または間接的に前記プニクチド半導体膜上に形成するステップであって、前記半導体カルコゲニド膜が、少なくとも1種のII族元素および少なくとも1種のVI族元素を含み、前記プニクチド半導体膜の近位の前記カルコゲニド半導体膜の少なくとも一部が、調整剤不含の、または少ない量の少なくとも1種の調整剤を含む同じ条件下で形成され、その他は同じカルコゲニド半導体膜組成物に比べて、前記プニクチド半導体膜と前記カルコゲニド半導体膜との間の伝導帯オフセットを下げる少なくとも1種の調整剤を組み込むステップ、
を含む方法。 - 前記プニクチド半導体膜が、亜鉛および3価のリンを含む請求項1に記載の方法。
- 前記プニクチド半導体膜が、合金組成物を含む請求項1に記載の方法。
- 前記合金組成物が、前記プニクチド半導体膜と前記カルコゲニド半導体膜との間の界面の近位にある請求項3に記載の方法。
- 前記プニクチド半導体膜が、Al、Ga、In、Tl、Sn、およびPbの内の少なくとも1種を含む請求項1に記載の方法。
- 前記プニクチド半導体膜が、B、F、S、Se、Te、C、O、およびHの内の少なくとも1種を含む請求項1に記載の方法。
- 前記カルコゲニド半導体膜が、Sおよび/またはSeを含む請求項1に記載の方法。
- 前記プニクチド半導体膜が、Zn、SおよびMgを含む請求項1に記載の方法。
- 前記カルコゲニド半導体膜が、Zn、S、SeおよびMgを含む請求項1に記載の方法。
- 前記少なくとも1種の調整剤が、前記プニクチド半導体膜と前記カルコゲニド半導体膜との間の前記伝導帯オフセットが0.1eV未満になるような量で使われる請求項1に記載の方法。
- 前記少なくとも1種の調整剤が、前記プニクチド半導体膜と前記カルコゲニド半導体膜との間の所望で、所定の伝導帯オフセットを実現するのに効果的な量で使われる請求項1に記載の方法。
- 前記少なくとも1種の調整剤が、Mg、Ca、Be、Li、Cu、Na、K、Sr、Sn、および/またはFの内の1種または複数種から選択される請求項1に記載の方法。
- 前記少なくとも1種の調整剤が、Mg、Ca、Be、Sr、Sn、および/またはFの内の1種または複数種から選択される請求項1に記載の方法。
- 前記少なくとも1種の調整剤がMgを含む請求項1に記載の方法。
- 前記カルコゲニド半導体膜が、前記少なくとも1種の調整剤の1〜80原子パーセントを含む部分を含む請求項1に記載の方法。
- 前記少なくとも1種の調整剤が、前記プニクチド半導体膜の近位の前記カルコゲニド半導体膜の一部中に組み込まれる請求項15に記載の方法。
- 前記少なくとも1種の調整剤が、1〜80原子パーセントの平均含量で前記カルコゲニド半導体膜の全体にわたり組み込まれる請求項15に記載の方法。
- 固相光起電ヘテロ接合またはその前駆体の製造方法であって、
a.p型プニクチド半導体膜を用意するステップ、および
b.前記p型プニクチド半導体膜上に直接または間接的にn型半導体膜を形成するステップであって、
i.少なくとも1種のII族元素および少なくとも1種のVI族元素を含む化合物を加熱して蒸気化学種を生成するステップ;
ii.前記蒸気化学種またはその誘導体を前記p型プニクチド半導体膜上に直接または間接的に沈着させるステップ、および
iii.前記p型プニクチド半導体膜の近位の前記形成されたn型半導体膜の少なくとも一部がMgおよび/またはCaの内の少なくとも1種を組み込むような条件下で前記n型半導体膜が沈着される時間の少なくとも一部の時間中にMgとCaの内の少なくとも1種を共沈着させるステップ、
を含む形成ステップ、
を含む方法。 - (a)少なくとも1種のp型プニクチド半導体組成物を含むp型領域、および
(b)前記吸収領域上に直接または間接的に設けられたn型領域であって、少なくとも1種のII族元素および少なくとも1種のVI族元素を含み、前記p型吸収領域の近位の前記n型領域の少なくとも一部がMgおよび/またはCaの内の少なくとも1種を組み込んだn型領域、
を含む光起電力デバイス。
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