JP2015225999A - Solder joint structure - Google Patents

Solder joint structure Download PDF

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JP2015225999A
JP2015225999A JP2014111088A JP2014111088A JP2015225999A JP 2015225999 A JP2015225999 A JP 2015225999A JP 2014111088 A JP2014111088 A JP 2014111088A JP 2014111088 A JP2014111088 A JP 2014111088A JP 2015225999 A JP2015225999 A JP 2015225999A
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solder
electrode plate
lead wire
aluminum
electrode
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哲也 桑田
tetsuya Kuwata
哲也 桑田
隆平 小山
Ryuhei Koyama
隆平 小山
浩明 牧添
Hiroaki Makizoe
浩明 牧添
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Shizuki Electric Co Inc
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Shizuki Electric Co Inc
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Abstract

PROBLEM TO BE SOLVED: To provide a solder joint structure which allows for highly reliable connection, without using a special solder for aluminum, even when an aluminum plate is used as an electrode plate.SOLUTION: In a solder joint structure for solder joining one end of a lead wire 2 to a metallicon electrode 1a of a capacitor element 1, and solder joining the other end of the lead wire 2 to an electrode plate 4, the electrode plate 4 is an aluminum plate 4b subjected to Ni plating or Sn plating to at least one of the front surface or back surface. While inserting the other end of the lead wire 2 into a through hole 4c provided in the electrode plate 4, solder joining is performed by straddling the solder 3 across the outer peripheral surface of the lead wire 2 and the front or back surface of the electrode plate 4, without bringing into contact with a hole wall surface 4d constituting the through hole 4c.

Description

この発明は、引出し線と電極板との半田接続構造に関する。   The present invention relates to a solder connection structure between a lead wire and an electrode plate.

コンデンサ素子のメタリコン電極に電極板を接続するに際し、例えば特許文献1に開示されているように、電極板から半田付け用の突起を延出し、この突起とメタリコン電極部とを直接、半田接続することは一般になされている。また、図5に示すように、電極板4をコンデンサ素子1の側面に沿わせるように配置し、メタリコン電極1aと電極板4の突起5とを半田3によって接続することも従来から行われている。   When the electrode plate is connected to the metallicon electrode of the capacitor element, for example, as disclosed in Patent Document 1, a soldering protrusion is extended from the electrode plate, and the protrusion and the metallicon electrode portion are directly connected by soldering. That is generally done. Further, as shown in FIG. 5, the electrode plate 4 is disposed along the side surface of the capacitor element 1, and the metallicon electrode 1 a and the protrusion 5 of the electrode plate 4 are connected by the solder 3 conventionally. Yes.

特開2004−349447号公報JP 2004-349447 A

ところで、電極板としてアルミ板を用いることがある。これは、電極板として一般的に用いられている銅板に比べ、軽量化やコスト削減を図ることができるためである。ただ、アルミニウム(AL)は半田濡れ性に劣ることから、半田接続する場合には、その表面にニッケル(Ni)や錫(Sn)等のメッキ処理を施し、半田付け性を改善することが多い。   By the way, an aluminum plate may be used as the electrode plate. This is because weight reduction and cost reduction can be achieved as compared with a copper plate generally used as an electrode plate. However, since aluminum (AL) is inferior in solder wettability, when soldered, the surface is often plated with nickel (Ni) or tin (Sn) to improve solderability. .

ところが、電極板は、通常、打ち抜き加工や切断加工によって形成されることから、メッキ処理を施していたとしても、加工断面からアルミ素地が露出することとなり、突起とメタリコン電極とを半田接続しようとしても、うまく接続させることが困難であった。具体的に説明すると、半田によって信頼性の高い接続を実現するには、半田で突起を包み込むようにしなければならないが、打ち抜き加工や切断加工によって、突起の両側面から半田濡れ性に劣るアルミ素地が露出していると、図6に示すように、溶融した半田3がその両側面5a、5aを避けるようにして位置することとなり、半田3で突起5を包み込むことが困難であった。   However, since the electrode plate is usually formed by punching or cutting, the aluminum substrate is exposed from the processed cross section even if the plating process is performed, and an attempt is made to solder-connect the protrusion and the metallicon electrode. Even difficult to connect well. Specifically, in order to achieve a reliable connection with solder, it is necessary to wrap the protrusions with solder, but the aluminum substrate is inferior in solder wettability from both sides of the protrusions by punching or cutting. 6, the melted solder 3 is positioned so as to avoid both side surfaces 5 a and 5 a as shown in FIG. 6, and it is difficult to wrap the protrusion 5 with the solder 3.

また、仮に、半田によって突起を包み込むことができたとしても、アルミが半田に接触する(半田によって濡れた状態となる)と、接触部において電位差による電解腐食が生じる虞がある。特に、半田としてSn−Ag−Cu(錫―銀―銅)系の半田を用いた場合、錫の電極電位が−0.14V、銀の電極電位が0.8V、銅の電極電位が0.34Vであるのに対して、アルミの電極電位が−1.68Vであるため、アルミ素地と半田との接触部において、最大2.48Vの電位差が生じることとなり、結局のところ、安定した接続に至ることはない。   Even if the protrusions can be encapsulated by the solder, if the aluminum contacts the solder (becomes wet with the solder), there is a possibility that electrolytic corrosion due to a potential difference occurs at the contact portion. In particular, when Sn-Ag-Cu (tin-silver-copper) solder is used as the solder, the electrode potential of tin is -0.14 V, the electrode potential of silver is 0.8 V, and the electrode potential of copper is 0.1. In contrast to 34 V, the electrode potential of aluminum is −1.68 V. Therefore, a potential difference of 2.48 V at the maximum occurs at the contact portion between the aluminum substrate and the solder. It will not reach.

そこで、メタリコン電極と電極板とを直接接続するのではなく、引出し線を介してメタリコン電極と電極板とを接続することが考えられる。引出し線として、例えば銅等の半田濡れ性の良いものを用いたり、表面にメッキ処理を施したものを用いれば、図7に示すように、半田3によって引出し線2をしっかりと包み込むことができ、信頼性の高い接続が可能となる。   Therefore, it is conceivable to connect the metallicon electrode and the electrode plate via a lead wire instead of directly connecting the metallicon electrode and the electrode plate. As shown in FIG. 7, the lead wire 2 can be firmly wrapped by the solder 3 as shown in FIG. Highly reliable connection is possible.

ただ、上記引出し線による接続は、別途、引出し線と電極板との接続を行わなければならない。この際、メタリコン電極と引出し線との接続と同様に、半田接続することが考え
られるが、電極板に、引出し線を接続するための接続部(例えば溝等)を形成するにあたって、打ち抜き加工や切断加工を行えば、結局、アルミ素地が露出することとなり、上記課題を解決するに至らない。
However, the connection with the above-mentioned lead line must be separately connected with the lead line and the electrode plate. At this time, it is conceivable to make a solder connection in the same manner as the connection between the metallicon electrode and the lead wire. If the cutting process is performed, the aluminum substrate is eventually exposed, and the above problem cannot be solved.

なお、アルミ用の特殊な半田を用いれば、アルミ素地が露出している場合であっても半田接続が可能であるが、半田自体が高価なため、コスト増を招くこととなり、電極板としてアルミ板を用いる利点が小さくなる。   If a special solder for aluminum is used, solder connection is possible even when the aluminum substrate is exposed. However, since the solder itself is expensive, the cost increases, and aluminum is used as the electrode plate. The advantage of using a plate is reduced.

そこで、この発明は、上記課題を解決するためになされたものであって、電極板としてアルミ板を用いた場合でも、アルミ用の特殊な半田を用いることなく、信頼性の高い接続が可能な半田接続構造の提供を目的とする。   Therefore, the present invention has been made to solve the above-described problem, and even when an aluminum plate is used as an electrode plate, a highly reliable connection is possible without using a special solder for aluminum. The purpose is to provide a solder connection structure.

上記課題を解決するため、本発明の半田接続構造は、コンデンサ素子1のメタリコン電極1aに引出し線2の一方端部を半田接続するとともに、電極板4に上記引出し線2の他方端部を半田接続する半田接続構造であって、上記電極板4は、その表面又は裏面の少なくとも一方にNiメッキ又はSnメッキが施されたアルミ板4bであり、上記電極板4に設けた貫通孔4cに上記引出し線2の他方端部を挿通させた状態において、半田3を、上記貫通孔4cを構成する孔壁面4dに接触させることなく、上記引出し線2の外周面と上記電極板4の表面又は裏面のメッキ面とに跨らせることで半田接続していることを特徴としている。また、孔壁面4dからアルミ素地を露出させても良い。   In order to solve the above problems, the solder connection structure of the present invention solders one end portion of the lead wire 2 to the metallicon electrode 1 a of the capacitor element 1 and solders the other end portion of the lead wire 2 to the electrode plate 4. In the solder connection structure to be connected, the electrode plate 4 is an aluminum plate 4b having Ni plating or Sn plating applied to at least one of its front and back surfaces, and the through hole 4c provided in the electrode plate 4 has the above described In a state where the other end portion of the lead wire 2 is inserted, the outer surface of the lead wire 2 and the surface or back surface of the electrode plate 4 are not brought into contact with the solder wall 3d of the hole wall surface 4d constituting the through hole 4c. It is characterized in that it is soldered by straddling the plating surface. Further, the aluminum substrate may be exposed from the hole wall surface 4d.

この発明の半田接続構造は、電極板に設けた貫通孔に引出し線の他方端部を挿通させた状態において、貫通孔を構成する孔壁面に接触させることなく、引出し線の外周面と電極板の表面又は裏面のメッキ面とに半田を跨らせることで半田接続していることから、電極板としてアルミ板を用いていても、信頼性の高い接続が可能となる。また、孔壁面からアルミ素地を露出させれば、自ずと半田とアルミとの接触を抑えることができる。なお、上記における接触とは、アルミ素地によって弾かれ略球状となった半田がアルミ素地に対して点接触している場合を含まず、アルミ素地が半田によって濡れた(半田と密着した)状態のことを指す。   In the solder connection structure of the present invention, in the state where the other end of the lead wire is inserted into the through hole provided in the electrode plate, the outer peripheral surface of the lead wire and the electrode plate are not brought into contact with the hole wall surface constituting the through hole. Since the solder connection is made by straddling the solder on the front or back plating surface, even if an aluminum plate is used as the electrode plate, a highly reliable connection is possible. Further, if the aluminum base is exposed from the hole wall surface, the contact between the solder and the aluminum can be naturally suppressed. In addition, the contact in the above does not include a case where the solder that is repelled by the aluminum base and becomes substantially spherical has a point contact with the aluminum base, and the aluminum base is wetted by the solder (adhered to the solder). Refers to that.

この発明の一実施形態に係る半田接続構造を示す斜視図である。1 is a perspective view showing a solder connection structure according to an embodiment of the present invention. 電極板と引出し線との接続状態を示す断面図である。It is sectional drawing which shows the connection state of an electrode plate and a leader line. 耐湿試験の結果であって、(a)がコンデンサの容量変化率を、(b)がESR変化を示すグラフである。It is a result of a moisture resistance test, (a) is a capacity | capacitance change rate of a capacitor | condenser, (b) is a graph which shows ESR change. 冷熱衝撃試験の結果を示すグラフである。It is a graph which shows the result of a thermal shock test. 従来のコンデンサ素子と電極板との接続状態を示す斜視図である。It is a perspective view which shows the connection state of the conventional capacitor | condenser element and an electrode plate. 電極板としてアルミ板を用いた場合のコンデンサ素子と電極板との接続状態を示す断面図である。It is sectional drawing which shows the connection state of the capacitor | condenser element and electrode plate at the time of using an aluminum plate as an electrode plate. コンデンサ素子と引出し線との接続状態を示す断面図である。It is sectional drawing which shows the connection state of a capacitor | condenser element and a leader line.

次に、この発明の一実施形態について図面に基づいて詳細に説明する。図1、2は、この発明の半田接続構造を用いたコンデンサ素子1と電極板4との接続状態を示している。   Next, an embodiment of the present invention will be described in detail with reference to the drawings. 1 and 2 show a connection state between the capacitor element 1 and the electrode plate 4 using the solder connection structure of the present invention.

図において1は、コンデンサ素子である。コンデンサ素子1は、例えば絶縁性のフィルム上に金属が蒸着された金属化フィルムを巻回することでなるフィルムコンデンサであって、軸方向端部には金属を溶射してなるメタリコン電極1aが形成されている。そして、
このメタリコン電極1aには、引出し線2の一方端部が、図7に示すように半田3によって接続されている。なお、引出し線2は、外周面にメッキ処理(Niメッキ又はSnメッキ)2aが施された断面円形の銅線やアルミ線2bであるが、CP線等を用いても良い。
In the figure, reference numeral 1 denotes a capacitor element. The capacitor element 1 is a film capacitor formed by, for example, winding a metallized film in which a metal is vapor-deposited on an insulating film, and a metallicon electrode 1a formed by thermally spraying the metal is formed at an end in the axial direction. Has been. And
One end of the lead wire 2 is connected to the metallicon electrode 1a by solder 3 as shown in FIG. The lead wire 2 is a copper wire or an aluminum wire 2b having a circular cross section whose outer peripheral surface is plated (Ni plating or Sn plating) 2a. However, a CP wire or the like may be used.

4は、電極板である。電極板4は、互いに対向する表裏面にメッキ処理(Niメッキ又はSnメッキ)4aを施したアルミ板4bであって、引出し線2と対向する位置に、引出し線2の径より大とされ、引出し線2を挿通可能な貫通孔4cが設けられている。なお、貫通孔4cは、例えば打ち抜き加工によって形成され、貫通孔4cを形成する孔壁面4dからはアルミ素地が露出している。   4 is an electrode plate. The electrode plate 4 is an aluminum plate 4b that is plated (Ni plating or Sn plating) 4a on the front and back surfaces facing each other, and is made larger than the diameter of the lead wire 2 at a position facing the lead wire 2, A through hole 4c through which the lead wire 2 can be inserted is provided. The through hole 4c is formed, for example, by punching, and an aluminum substrate is exposed from the hole wall surface 4d that forms the through hole 4c.

上記電極板4と引出し線2の他方端部とは、以下の通りに接続される。まず、電極板4をコンデンサ素子1の側面に沿わせるようにして配置し、次に、引出し線2の他方端部を電極板4の貫通孔4cに挿通する。この際、引出し線2の先端が電極板4の表面よりも突出するようにしておく。そして、電極板4の表面から突出した引出し線2の先端の外周面と、電極板4の表面(メッキ面)とに溶融した半田3を跨らせるとともに、図2に示すように、半田3で引出し線2の突出部を包み込むようにする。なお、半田3としては、アルミ用の特殊な半田を用いず、一般的に使用される半田、例えばSn−Ag−Cu系の鉛フリー半田を使用する。   The electrode plate 4 and the other end of the lead wire 2 are connected as follows. First, the electrode plate 4 is disposed along the side surface of the capacitor element 1, and then the other end of the lead wire 2 is inserted into the through hole 4 c of the electrode plate 4. At this time, the leading end of the lead wire 2 is projected from the surface of the electrode plate 4. Then, the melted solder 3 is straddled between the outer peripheral surface of the leading end of the lead wire 2 protruding from the surface of the electrode plate 4 and the surface (plated surface) of the electrode plate 4, and as shown in FIG. Then, wrap around the protruding part of the lead wire 2. As the solder 3, a special solder for aluminum is not used, but generally used solder, for example, Sn-Ag-Cu-based lead-free solder is used.

通常、このような半田付けを行えば、引出し線2の外周面と貫通孔4cの孔壁面4dとの間に生じた隙間にも溶融した半田3が入り込んでいく。しかしながら、本発明では、貫通孔4cを構成する孔壁面4dに半田濡れ性に劣るアルミ素地が露出していることから、半田3が弾かれることとなり、隙間内に半田3が入り込むことはない。そのため、半田3とアルミ素地とが接触することはなく、電解腐食の発生を抑制することができる。また、仮に、半田3が引出し線2の外周面と貫通孔4cの孔壁面4dとの間に生じた隙間に入り込んだとしても、孔壁面4dが半田3によって濡れることはなく(孔壁面4dに半田3が密着することはなく)、電解腐食の発生は抑制されたままである。なお、半田3とアルミ素地との接触をより抑制するために、例えば、孔壁面4dに油膜等、半田濡れ性を低下させるものを塗布、形成するようにしても良い。また、同様に引出し線2の、孔壁面4dと対向する面に施しても良い。   Normally, when such soldering is performed, the melted solder 3 also enters the gap formed between the outer peripheral surface of the lead wire 2 and the hole wall surface 4d of the through hole 4c. However, in the present invention, since the aluminum substrate having poor solder wettability is exposed on the hole wall surface 4d constituting the through hole 4c, the solder 3 is repelled, and the solder 3 does not enter the gap. Therefore, the solder 3 and the aluminum substrate do not contact each other, and the occurrence of electrolytic corrosion can be suppressed. Further, even if the solder 3 enters the gap formed between the outer peripheral surface of the lead wire 2 and the hole wall surface 4d of the through hole 4c, the hole wall surface 4d is not wetted by the solder 3 (the hole wall surface 4d The solder 3 does not adhere), and the occurrence of electrolytic corrosion remains suppressed. In order to further suppress the contact between the solder 3 and the aluminum substrate, for example, an oil film or the like that reduces solder wettability may be applied and formed on the hole wall surface 4d. Similarly, the lead wire 2 may be provided on the surface facing the hole wall surface 4d.

このように構成された半田接続構造では、電極板4としてアルミ板4bを用いているにも拘らず、信頼性の高い接続が可能となる。すなわち、引出し線2と電極板4とを接続するにあたって、引出し線2の外周面と電極板4のメッキ面との間を半田3によって繋ぐことができ、電気的な接続は勿論のこと、機械的な接続をも満足させることができる。また、アルミ素地と半田3とが接触しないことから、電解腐食を抑制することができ、安定した接続を実現することができる。   In the solder connection structure configured as described above, despite the use of the aluminum plate 4b as the electrode plate 4, a highly reliable connection is possible. That is, when connecting the lead wire 2 and the electrode plate 4, the outer peripheral surface of the lead wire 2 and the plated surface of the electrode plate 4 can be connected by the solder 3. Can be satisfied. Moreover, since the aluminum base and the solder 3 do not contact, electrolytic corrosion can be suppressed and a stable connection can be realized.

以下、本発明の半田接続構造の有用性を確認するために行った実験結果について説明する。図3は、Niメッキ処理を施したアルミ板4bを電極板4とし、この電極板4とコンデンサ素子1とを上記半田接続構造によって接続し、樹脂ケースに入れて樹脂封止してなるコンデンサ(実施例1のコンデンサ)と、電極板4としてSnメッキ処理を施したアルミ板4bとし、その他の構成は実施例1のコンデンサと同様な実施例2のコンデンサとを、85℃/85%RH(相対湿度)環境下で電圧を印加し、2000時間通電した結果を示すものである。なお、比較対象として、従来から使用されている銅板を電極板4とし、引出し線2の外周面と電極板4の表面とに半田3を跨らせるとともに、引出し線2の外周面と貫通孔4cの孔壁面4dとの間にも半田3を浸入させた、従来の接続構造を採用した比較例1のコンデンサについても同様の試験を行っている。   The results of experiments conducted to confirm the usefulness of the solder connection structure of the present invention will be described below. In FIG. 3, an aluminum plate 4b that has been subjected to Ni plating treatment is used as an electrode plate 4, and this electrode plate 4 and the capacitor element 1 are connected by the above-described solder connection structure and placed in a resin case and sealed with a resin ( The capacitor of Example 1) and the aluminum plate 4b subjected to Sn plating treatment as the electrode plate 4, and the capacitor of Example 2 having the same configuration as that of the capacitor of Example 1 are connected at 85 ° C./85% RH ( Relative humidity) shows a result of applying a voltage under an environment and energizing for 2000 hours. As a comparison object, a conventionally used copper plate is used as the electrode plate 4, the solder 3 is straddled between the outer peripheral surface of the lead wire 2 and the surface of the electrode plate 4, and the outer peripheral surface of the lead wire 2 and the through hole A similar test is also performed on the capacitor of Comparative Example 1 employing the conventional connection structure in which the solder 3 is infiltrated between the hole wall surface 4d of 4c.

図3(a)に示すように、1700時間あたりから容量が減少しており、これにより水
分がコンデンサ内部に浸入していることが分かる。しかしながら、図3(b)に示すように、1700時間以降も電解腐食によって生じるはずのESRの急激な上昇が見られない。また、実施例1、2のコンデンサとも、比較例1のコンデンサと同じ傾向を示していることから、従来の接続方法に比べて電解腐食が進んでいるとは言えず、有効な接続方法であることが分かる。
As shown in FIG. 3 (a), it can be seen that the capacity has decreased since around 1700 hours, and that moisture has entered the capacitor. However, as shown in FIG. 3B, there is no rapid increase in ESR that should occur due to electrolytic corrosion after 1700 hours. In addition, since the capacitors of Examples 1 and 2 show the same tendency as the capacitor of Comparative Example 1, it cannot be said that electrolytic corrosion has progressed compared to the conventional connection method, and is an effective connection method. I understand that.

また、図4は、上記コンデンサ(実施例1、実施例2、比較例1)を−40℃〜105℃のHS(温度サイクル)試験にかけた結果を示すものである。図4に示すように、実施例1、2のコンデンサは、比較例1のコンデンサと比較して大きな差は見受けられず、信頼性の高い接続となっていることが分かる。   FIG. 4 shows the results of subjecting the above capacitors (Example 1, Example 2, Comparative Example 1) to an HS (temperature cycle) test at −40 ° C. to 105 ° C. As shown in FIG. 4, it can be seen that the capacitors of Examples 1 and 2 do not show a large difference compared to the capacitor of Comparative Example 1, and are connected with high reliability.

以上に、この発明の代表的な実施形態について説明したが、この発明は上記実施形態に限定されるものではなく、この発明の範囲内で種々変更して実施することが可能である。例えば、上記実施例においては、電極板4の表面(図2において上面側)と引出し線2の外周面とを半田接続していたが、電極板4の裏面(図2において下面側)と引出し線2の外周面とを半田接続するようにしても良い。この場合、溶融した半田3が重力によって垂れ下がり、孔壁面4dに近接するといったことを抑制することができる。また、上記実施例では、電極板4の表裏面にメッキ処理が施されていたが、半田接続に用いる側のいずれか一方の面にのみメッキ処理を施すようにしても良い。   As mentioned above, although typical embodiment of this invention was described, this invention is not limited to the said embodiment, It can be implemented in various changes within the scope of this invention. For example, in the above embodiment, the surface of the electrode plate 4 (upper surface side in FIG. 2) and the outer peripheral surface of the lead wire 2 are connected by soldering, but the back surface of the electrode plate 4 (lower surface side in FIG. 2) and the drawer are connected. The outer peripheral surface of the wire 2 may be soldered. In this case, it can be suppressed that the molten solder 3 hangs down due to gravity and approaches the hole wall surface 4d. Moreover, in the said Example, although the plating process was performed to the front and back of the electrode plate 4, you may make it perform a plating process only to either one side of the side used for a solder connection.

また、引出し線2としては、図7に示すように断面円形のものに限らず、断面四角形状のもの等、種々の形状のものを使用可能であるし、箔状のものや板状のものを用いても良い。また、引出し線2の外周面全体にメッキ処理2aを施す必要はなく、半田付けに必要な部分や、孔壁面4dとの接触防止に用いる部分のみにメッキ処理2aを施すようにしても良いし、さらに、孔壁面4dに接触させないのであれば、メッキ処理2aを施さなくても良い。   Further, the lead wire 2 is not limited to a circular cross section as shown in FIG. 7, but can have various shapes such as a square cross section, a foil shape or a plate shape. May be used. Further, it is not necessary to apply the plating process 2a to the entire outer peripheral surface of the lead wire 2, and the plating process 2a may be applied only to a part necessary for soldering or a part used for preventing contact with the hole wall surface 4d. Furthermore, the plating process 2a may not be performed if the hole wall surface 4d is not brought into contact.

1・・コンデンサ素子、1a・・メタリコン電極、2・・引出し線、3・・半田、4・・電極板、4b・・アルミ板、4c・・貫通孔、4d・・孔壁面   1 .... Capacitor element, 1a ... Metallicon electrode, 2 .... Lead wire, 3 .... Solder, 4 .... Electrode plate, 4b ..., Aluminum plate, 4c ..., Through hole, 4d ..., Hole wall surface

Claims (2)

コンデンサ素子(1)のメタリコン電極(1a)に引出し線(2)の一方端部を半田接続するとともに、電極板(4)に上記引出し線(2)の他方端部を半田接続する半田接続構造であって、上記電極板(4)は、その表面又は裏面の少なくとも一方にNiメッキ又はSnメッキが施されたアルミ板(4b)であり、上記電極板(4)に設けた貫通孔(4c)に上記引出し線(2)の他方端部を挿通させた状態において、半田(3)を、上記貫通孔(4c)を構成する孔壁面(4d)に接触させることなく、上記引出し線(2)の外周面と上記電極板(4)の表面又は裏面のメッキ面とに跨らせることで半田接続していることを特徴とする半田接続構造。   A solder connection structure in which one end of the lead wire (2) is solder-connected to the metallicon electrode (1a) of the capacitor element (1) and the other end of the lead wire (2) is solder-connected to the electrode plate (4). The electrode plate (4) is an aluminum plate (4b) having Ni plating or Sn plating applied to at least one of its front and back surfaces, and through holes (4c) provided in the electrode plate (4). ) With the other end of the lead wire (2) inserted therethrough, the solder (3) does not contact the hole wall surface (4d) constituting the through hole (4c) and the lead wire (2 ) And an outer peripheral surface of the electrode plate (4) and a plated surface on the back surface of the electrode plate (4). 上記孔壁面(4d)からアルミ素地を露出させている請求項1に記載の半田接続構造。   The solder connection structure according to claim 1, wherein an aluminum substrate is exposed from the hole wall surface (4 d).
JP2014111088A 2014-05-29 2014-05-29 Solder joint structure Pending JP2015225999A (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5851438U (en) * 1981-10-02 1983-04-07 株式会社村田製作所 ceramic capacitor
JPS6133464U (en) * 1984-07-30 1986-02-28 三菱電線工業株式会社 Aluminum base board
JP2004022787A (en) * 2002-06-17 2004-01-22 Matsushita Electric Ind Co Ltd Metallized film capacitor
JP2006500790A (en) * 2002-09-27 2006-01-05 エーペーツェーオーエス アーゲー Electrical component element and apparatus comprising the component component
US20130164568A1 (en) * 2011-12-22 2013-06-27 Ki-Woong Kim Protective circuit module
JP2014017405A (en) * 2012-07-10 2014-01-30 Shizuki Electric Co Inc Capacitor

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5851438U (en) * 1981-10-02 1983-04-07 株式会社村田製作所 ceramic capacitor
JPS6133464U (en) * 1984-07-30 1986-02-28 三菱電線工業株式会社 Aluminum base board
JP2004022787A (en) * 2002-06-17 2004-01-22 Matsushita Electric Ind Co Ltd Metallized film capacitor
JP2006500790A (en) * 2002-09-27 2006-01-05 エーペーツェーオーエス アーゲー Electrical component element and apparatus comprising the component component
US20130164568A1 (en) * 2011-12-22 2013-06-27 Ki-Woong Kim Protective circuit module
JP2014017405A (en) * 2012-07-10 2014-01-30 Shizuki Electric Co Inc Capacitor

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