JP2015129690A - Gauge inspection tool - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a tool suitable for variously changing an attitude of a dial gauge when the dial gauge is inspected.SOLUTION: A gauge inspection tool 100 includes: a hollow outer frame part 110 having a space inside; and a holding structure part 160 which is arranged inside the outer frame part 110 and which holds a dial gauge 10. The outer frame part 110 is shaped into a rectangular parallelepiped shape whose six faces have quadrangular shapes. An attitude of the gauge inspection tool 100 is changed in such a manner that each face of the gauge inspection tool 100 comes to the underside in order, so that the dial gauge 10 is inspected in each attitude.

Description

  The present invention relates to a gauge inspection jig. Specifically, the present invention relates to a jig suitable for changing the posture of a gauge in various ways when inspecting a gauge such as a dial gauge.

  For example, a dial gauge is known as a type of comparative length measuring device. The dial gauge includes a spindle type and a lever type. FIG. 13 is a view showing a state where the spindle type dial gauge 10 is set on the support stand 20 (Patent Document 1: Japanese Patent No. 3466402). With reference to FIG. 13, the dial gauge 10 and the column type stand 20 will be briefly described.

  The dial gauge 10 includes a cylindrical casing portion 11, a spindle 14 that can be moved up and down, and a stem 16 that protrudes from the casing portion 11. There is a dial (display unit) 12 on the front surface of the housing unit 11. Inside the housing 11 is a gear mechanism (not shown) that enlarges the displacement of the spindle 14 and transmits it to the pointer 13. A probe 15 is provided at the tip of the spindle 14. The stem 16 supports the spindle 14 so as to be slidable.

  The column type stand 20 is fixed to the column 21 having a measuring table 22 on the upper surface, a columnar column 23 erected on the table 21, and vertically adjustable to the column 23 so as to be rotatable. And a bracket 24 for holding a dial gauge 10 as a measuring instrument at the tip.

  The bracket 24 includes a first clamp portion 25A that clamps the stem 16 of the dial gauge 10 and a second clamp portion 25B that clamps the column 23. Each clamp portion 25A, 25B includes a holding hole 26A, 26B that sandwiches the stem 16 or the column 23, a slot groove formed in a part of the holding hole 26A, 26B, and a pair of clamps facing each other across the slot groove. Operation knobs 29A and 29B that elastically deform the pieces 28A, 28A, 28B, and 28B in a direction approaching each other.

  In use, the stem 16 of the dial gauge 10 is inserted into the holding hole 26A. At this time, the probe 15 is made to face downward. The dial 10 is fixed to the bracket 24 by tightening the operation knob 29A. In this way, the object to be measured is measured with the dial gauge 10 set on the stand 20.

By the way, the performance of the dial gauge is defined in ISO463 (Non-Patent Document 1) and JISB7503 (Non-Patent Document 2).
The manufacturer of the dial gauge must inspect whether the product dial gauge satisfies the standard values defined in ISO463 and JISB7503.
Conventionally, when inspecting the dial gauge, the indication accuracy, measuring force, and repeatability are inspected with the dial gauge 10 set on the stand 20.

Japanese Patent No. 3466402

http: // www. iso. org / iso / home / store / catalogue_ics / catalogue_detail_ics. htm? csnumber = 42802 http: // kikakurui. com / b7 / B7503-2011-01. html

  ISO 463 was revised in 2006, and JISB7503 was revised in 2011. The following points were added in these revisions. “Measurement characteristics when not specified by the manufacturer must meet the MPE and MPL values at any position and any position within the measurement range”. The maximum allowable error (MPE) of the dial gauge is the maximum value of the indication error allowed for the indication value. The permissible limit (MPL) is a limit value of the measuring force allowed in the specification with respect to the measuring force.

  Conventionally, since the measurement posture is not clearly stated, it is generally assumed that ISO and JIS are satisfied if the standard value is satisfied for the posture in which the measuring element faces downward. However, this revision has made it necessary to satisfy the standard values in other attitudes. However, it is impossible to inspect in any and all postures in terms of time, effort, cost, and reproducibility. As a manufacturer, in order to inspect that ISO and JIS standards are satisfied, a realistic measure is required in terms of time, labor, cost, and reproducibility.

  The objective of this invention is providing the jig | tool suitable for changing the attitude | position of a gauge variously, when inspecting a gauge.

The gauge inspection jig of the present invention is
A gauge inspection jig used to inspect by changing the posture of the gauge to be inspected,
A hollow outer frame having a rectangular parallelepiped shape with six sides and a space inside;
A holding structure portion that is inside the outer frame portion and holds the gauge so that a relative posture is fixed to the outer frame portion.

In the present invention,
The outer frame portion is
Four under beams assembled in a rectangle,
Four upper beams assembled in a rectangle,
Four pillars connecting the vertices of the rectangle assembled with the lower beam and the rectangle assembled with the upper beam,
It is preferable that it consists only of a framework.

In the present invention,
Furthermore, it is preferable to have a camera that images the display unit of the gauge.

The gauge inspection jig of the present invention is
A gauge inspection jig used to inspect by changing the posture of the gauge to be inspected,
A hollow outer frame having a space inside;
A holding structure that is inside the outer frame and holds the gauge so that a relative posture is fixed with respect to the outer frame, and
The outer frame portion is a parallel polyhedron having an intersection angle between adjacent surfaces of 90 degrees when the six main surfaces are viewed.

The gauge inspection method of the present invention includes:
A gauge inspection method using the gauge inspection jig,
Attach the gauge to be inspected to the gauge inspection jig,
Change the posture of the gauge inspection jig so that each surface of the gauge inspection jig becomes the lower surface in order,
The gauge is inspected in each posture.

The figure which shows the test | inspection attitude | position of a dial gauge. The figure which shows the test | inspection attitude | position of a dial gauge. The figure which shows the test | inspection attitude | position of a dial gauge. The figure which shows a multi-position inspection jig. The figure which shows a mode that a dial gauge is test | inspected using a multi-position inspection jig | tool. The figure which shows a mode that a dial gauge is test | inspected using a multi-position inspection jig | tool. The figure which shows a mode that a dial gauge is test | inspected using a multi-position inspection jig | tool. The figure which shows a mode that a dial gauge is test | inspected using a multi-position inspection jig | tool. The figure which shows a mode that a dial gauge is test | inspected using a multi-position inspection jig | tool. The figure which shows the modification 1. FIG. The figure which shows the modification 2. FIG. The figure which shows the modification 3. The figure for demonstrating background art.

An embodiment of the present invention will be illustrated and described with reference to reference numerals attached to elements in the drawing.
(First embodiment)
In ISO and JIS, as a measurement characteristic of dial gauge,
“... any posture must meet MPE and MPL values”
It stipulates.
Here, in view of the internal structure of the dial gauge, the present inventors determined the posture to be inspected to the following six patterns.
FIG. 1, FIG. 2 and FIG. 3 show six patterns (A) to (F).

(A) Probe downward (B) Probe upward (C) Probe right (however, the scale is upward)
(D) Probe head facing right (however, scale is downward)
(E) Probe head facing right (however, the scale is facing forward)
(F) Probe head facing right (however, the scale is facing back)

  In this specification, “front” may be referred to as “front”, and “back” may be referred to as “rear”.

  These are selected as patterns of necessary and sufficient postures to ensure that the requirement “any posture” is satisfied. If one of these is missing, it may not always be guaranteed whether the measurement characteristics are satisfied depending on the posture used by the user. For example, (C) to (F) are all postures in which the dial gauge 10 is tilted sideways, and there may be an idea that only one of them may be used. In other words, there may be an idea that three patterns (A), (B), and (E) are sufficient. If this is the case, you may need to make a minor change to the stand-up stand of the background art. (For example, one roll shaft may be added to the bracket 24.)

  However, even if the measurement characteristics are satisfied with “(E) gauge head facing right (however, the scale is facing forward)”, the other (C), (D), and (F) also satisfy the same specifications. Not exclusively. This is because the internal structure of the dial gauge 10 is not symmetrical on the left and right and front and back. (To put it simply, the arrangement of the spindle guides, springs, and various gear mechanisms is not symmetrical, and it is not realistic to change the design to make them symmetrical.)

  Further, in addition to these six patterns, it may be possible to inspect in another posture, but it was determined that it is not necessary. For example, it may be possible to swing the tilt angle finely, such as 30 degrees or 45 degrees, but it is redundant, and it is not realistic considering time, labor, and cost. (Of course, there is nothing wrong with inspecting the tilt angle finely. It is just a matter of balancing time, effort, and cost.)

Thus, the posture to be inspected was selected in the above 6 patterns.
Next, an inspection jig that can stably hold the dial gauge 10 to be inspected in the postures of the six patterns, has reproducibility, and has a simple structure is introduced.
As a result of diligent research, the present inventors conceived the jig 100 for gauge inspection shown in FIG. 4, and made the present invention as a result of repeated verification experiments.
There is no fixed name because there is no such inspection jig in the world.
Therefore, in this specification, the gauge inspection jig of the present embodiment is referred to as a “multi-position inspection jig”.

  The multi-posture inspection jig 100 has a rectangular parallelepiped shape with six sides and a hollow outer frame portion 110 having a space inside, and holds the dial gauge 10 and the measuring table 22 inside the outer frame portion 110. Holding structure portion 160.

Description will be made by defining the upper and lower sides based on the posture of FIG.
The outer frame portion 110 includes four lower beams 121, 122, 123, and 124 that constitute the lower surface, four upper beams 131, 132, 133, and 134 that constitute the upper surface, and four that connect the lower surface and the upper surface. Columns 141, 142, 143, 144.
The four lower beams 121, 122, 123, and 124 are assembled in a rectangular shape, and the four upper beams 131, 132, 133, and 134 are also assembled in a rectangular shape. 143 and 144 are connected.
Thereby, the outer frame part 110 is a hexahedral frame in which each surface is a quadrangle (rectangle).

Since only the hexahedral frame is not provided with a wall portion, the weight of the outer frame portion 110 can be considerably reduced, and the cost can be reduced from the viewpoint of material cost.
Also, because it is only a frame, there are many gaps and light enters inside. Therefore, the dial gauge 10 is held inside the outer frame portion 110, but a separate light source is not necessary for reading the dial (display portion) 12.
In addition, although the material of a beam or a column is not limited, For example, an aluminum alloy etc. will be preferable.

The holding structure 160 is
A support column 161 provided in parallel with the pillars 141, 142, 143, 144 inside the outer frame portion 110,
A gauge bracket 162 disposed on the column 161 and holding the dial gauge 10;
A measuring table bracket 163 disposed on the support column 161 and holding the measuring table 22.
The support column 161 is inside the outer frame unit 110. However, when the outer frame unit 110 has only a framework composed of beams and columns as shown in FIG. 4, the support column 161 is set up inside the outer frame unit 110. In this case, small beams 151 and 152 are provided.
That is, the small beams 151 and 152 parallel to each other are passed to the lower surface and the upper surface, respectively, and the support column 161 is set up between the two small beams 151 and 152.

  As the structure of the gauge bracket 162, the bracket 24 used for the support stand 20 described in the background art may be used. The gauge bracket 162 is fixed to the support column 161 so as to be position-adjustable and rotatable by sliding. The support bracket 161 is sandwiched at the proximal end and the stem 16 of the dial gauge 10 is sandwiched at the distal end.

  Further, the measuring column bracket 163 is provided on the support column 161 so as to be spaced apart from the gauge bracket 162. The structure of the measurement table bracket 163 may be substantially the same as the structure of the gauge bracket 162, and the measurement table 22 is sandwiched and held at the tip.

A method for inspecting the dial gauge 10 using the multi-position inspection jig 100 having such a configuration will be briefly described with reference to FIGS.
4 to FIG. 9, the point is that the posture of the dial gauge 10 is changed together with the multi-position inspection jig 100 taking advantage of the fact that the outer frame part 110 is a hexahedron. ,That's what it means.
Since the outer frame portion 110 is a hexahedron, it can be stably placed no matter which surface is the lower surface. Accordingly, the postures of the six patterns (A) to (F) are realized stably and with good reproducibility.
Specifically,
FIG. 4 corresponds to the pattern (A).
FIG. 5 corresponds to the pattern (B).
FIG. 6 corresponds to the pattern (C).
FIG. 7 corresponds to the pattern (D).
FIG. 8 corresponds to the pattern (E).
FIG. 9 corresponds to the pattern (F).

Incidentally, in measuring the MPE, a gauge block (not shown) is fixed to the measurement table 22, and the gauge block is repeatedly measured.
(It is natural that the multi-posture inspection jig 100 is firmly fixed so that the gauge block does not move away from the measuring table 22 even if the multi-position inspection jig 100 is laid down or turned over.)
In measuring the MPL, a measurement force is repeatedly measured by applying a tension gauge (not shown) to the probe 15.

  By using such a multi-posture inspection jig 100, it is possible to inspect whether the dial gauge 10 as a product satisfies the revised ISO and JIS.

(Modification 1)
The modification 1 of the said embodiment is demonstrated.
When the posture of the dial gauge 10 is changed together with the multi posture inspection jig 100, the dial 12 faces in various directions. For example, in the pattern (D), the dial 12 faces downward. Then, there is a problem that the dial 12 is difficult to see. Even if the user looks into the dial 12, there is a possibility that a reading error due to parallax occurs. Therefore, as shown in FIG. 10, it is preferable to attach a camera 170 for imaging the dial 12 to the multi-position inspection jig 100. In order to hold the camera 170, the arm 171 protrudes from the pillars 141, 142, 143, and 144, and the camera 170 is held by the arm 171. The image data captured by the camera 170 may be taken into a computer (not shown) and processed.

(Modification 2)
Of course, the present invention is not limited to the above embodiment.
In constructing the outer frame portion 110, only the framework of the beam and the column is used in the above embodiment.
As a matter of course, the outer frame portion 110 may be formed of a wall 181 as shown in FIG.

(Modification 3)
In the above embodiment, the outer frame portion 110 is a parallelepiped whose each surface is “rectangular”. Of course, as shown in FIG. 12, a rectangular parallelepiped (cube) may be cut or rounded. In this case, if the corner is dropped, each surface is not strictly “rectangular”, but should be regarded as substantially rectangular and belong to the technical scope of the present invention. The shape of the outer frame portion 110 shown in FIG. 12 may be expressed as “a parallel polyhedron in which the intersection angle between adjacent surfaces is 90 degrees when viewing six main surfaces”.

Note that the present invention is not limited to the above-described embodiment, and can be changed as appropriate without departing from the spirit of the present invention.
It will be apparent that the multi-position inspection jig of the present invention is useful not only for spindle type dial gauges but also for inspection of lever type dial gauges.
Further, the gauge to be inspected is not limited to a so-called dial gauge that displays a dial with a gear type, but may be a digital dial gauge, that is, a digimatic indicator.

DESCRIPTION OF SYMBOLS 10 ... Dial gauge, 11 ... Housing | casing part, 12 ... Dial, 13 ... Pointer, 14 ... Spindle, 15 ... Measuring element, 16 ... Stem, 20 ... Prop-type stand, 21 ... Base, 22 ... Measuring stand, 23 ... posts, 24 ... brackets, 25A, 25B ... clamping parts, 26A, 26B ... holding holes, 28A, 28B ... clamping pieces, 29A, 29B ... operations, 100 ... multi-position inspection jigs, 110 ... outer frame parts, 121 122, 123, 124 ... lower beam, 131, 132, 133, 134 ... upper beam, 141, 142, 143, 144 ... pillar, 151, 152 ... small beam, 160 ... holding structure, 161 ... column, 162 ... Gauge bracket, 163 ... measurement stand bracket, 170 ... camera, 171 ... arm, 181 ... wall.

Claims (5)

A gauge inspection jig used to inspect by changing the posture of the gauge to be inspected,
A hollow outer frame having a rectangular parallelepiped shape with six sides and a space inside;
A gauge inspection jig, comprising: a holding structure portion that is inside the outer frame portion and holds the gauge so that a relative posture is fixed to the outer frame portion. The jig for gauge inspection according to claim 1,
The outer frame portion is
Four under beams assembled in a rectangle,
Four upper beams assembled in a rectangle,
Four pillars connecting the vertices of the rectangle assembled with the lower beam and the rectangle assembled with the upper beam,
Gauge inspection jig characterized by comprising only the framework. In the gauge inspection jig according to claim 1 or 2,
Furthermore, it has a camera which images the display part of the said gauge. The gauge inspection jig | tool characterized by the above-mentioned. A gauge inspection jig used to inspect by changing the posture of the gauge to be inspected,
A hollow outer frame having a space inside;
A holding structure that is inside the outer frame and holds the gauge so that a relative posture is fixed with respect to the outer frame, and
The outer frame portion is a parallel polyhedron having an intersection angle between adjacent surfaces of 90 degrees when viewing six main surfaces. Gauge inspection jig. A gauge inspection method using the gauge inspection jig according to any one of claims 1 to 4,
Attach the gauge to be inspected to the gauge inspection jig,
Change the posture of the gauge inspection jig so that each surface of the gauge inspection jig becomes the lower surface in order,
A gauge inspection method characterized by inspecting the gauge in each posture.

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