JP2015055622A - 多波長画像計測における雑音処型理画像表示装置 - Google Patents
多波長画像計測における雑音処型理画像表示装置 Download PDFInfo
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Abstract
【解決手段】画像センサーによるレシオ画像計測において、その測定結果をディスプレイに表示する際、画素毎の測定値のS/N比の二乗和の平方根をS/N指標として定義し、これを媒介変数としてディスプレイ上での表示輝度に重みをかける事により、高S/N領域と低S/N領域を統計学的に意味のある定量的な判別を行い科学的に測定対象物の解析を可能とする。
【選択図】図2
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Claims (1)
- レシオ画像をディスプレイ装置に疑似カラー表示する場合に、多波長画像検出器から異なる2つの波長の画像を取得し、波長毎のSN比の二乗和の平方根を算出してこれをS/N指標として定義し、ディスプレイ装置での表示輝度値にS/N指標で重みを積算して表示する事により、単にコントラストを調整するのではなく、統計学的に意味のある定量的な計算に基づいて高S/N領域を強調してディスプレイ装置に表示する事を可能とする。
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JP2015055622A true JP2015055622A (ja) | 2015-03-23 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN112368706A (zh) * | 2018-07-10 | 2021-02-12 | 索尼公司 | 信息处理装置、信息处理方法和程序 |
Citations (5)
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JP2001272336A (ja) * | 2000-03-23 | 2001-10-05 | Shimadzu Corp | 原子吸光分析装置 |
JP2003121266A (ja) * | 2001-10-11 | 2003-04-23 | Noritake Co Ltd | 温度分布測定方法および装置 |
US20040008753A1 (en) * | 2002-07-15 | 2004-01-15 | Noritake Co., Limited | Emissivity distribution measuring method and apparatus |
JP2010043979A (ja) * | 2008-08-13 | 2010-02-25 | Yuichi Kamata | 分光画像計測装置 |
JP2011183445A (ja) * | 2010-03-10 | 2011-09-22 | Jfe Steel Corp | 鋳片表面温度計測方法および鋳片表面温度計測装置 |
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001272336A (ja) * | 2000-03-23 | 2001-10-05 | Shimadzu Corp | 原子吸光分析装置 |
JP2003121266A (ja) * | 2001-10-11 | 2003-04-23 | Noritake Co Ltd | 温度分布測定方法および装置 |
US20040008753A1 (en) * | 2002-07-15 | 2004-01-15 | Noritake Co., Limited | Emissivity distribution measuring method and apparatus |
JP2004045306A (ja) * | 2002-07-15 | 2004-02-12 | Noritake Co Ltd | 放射率分布測定方法および装置 |
JP2010043979A (ja) * | 2008-08-13 | 2010-02-25 | Yuichi Kamata | 分光画像計測装置 |
JP2011183445A (ja) * | 2010-03-10 | 2011-09-22 | Jfe Steel Corp | 鋳片表面温度計測方法および鋳片表面温度計測装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112368706A (zh) * | 2018-07-10 | 2021-02-12 | 索尼公司 | 信息处理装置、信息处理方法和程序 |
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