JP2014501446A5 - - Google Patents
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- Publication number
- JP2014501446A5 JP2014501446A5 JP2013544804A JP2013544804A JP2014501446A5 JP 2014501446 A5 JP2014501446 A5 JP 2014501446A5 JP 2013544804 A JP2013544804 A JP 2013544804A JP 2013544804 A JP2013544804 A JP 2013544804A JP 2014501446 A5 JP2014501446 A5 JP 2014501446A5
- Authority
- JP
- Japan
- Prior art keywords
- trace
- sub
- bond pad
- metal layer
- traces
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002184 metal Substances 0.000 claims 15
- 238000000034 method Methods 0.000 claims 9
- 238000001465 metallisation Methods 0.000 claims 8
- 229910000679 solder Inorganic materials 0.000 claims 4
- 239000000758 substrate Substances 0.000 claims 4
- 238000000926 separation method Methods 0.000 claims 2
- 239000000463 material Substances 0.000 claims 1
- 239000002923 metal particle Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/970,464 US8531030B2 (en) | 2010-12-16 | 2010-12-16 | IC device having electromigration resistant feed line structures |
| US12/970,464 | 2010-12-16 | ||
| PCT/US2011/065355 WO2012083110A2 (en) | 2010-12-16 | 2011-12-16 | Ic device having electromigration resistant feed line structures |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014501446A JP2014501446A (ja) | 2014-01-20 |
| JP2014501446A5 true JP2014501446A5 (cg-RX-API-DMAC7.html) | 2015-02-05 |
| JP6053690B2 JP6053690B2 (ja) | 2016-12-27 |
Family
ID=46233313
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013544804A Active JP6053690B2 (ja) | 2010-12-16 | 2011-12-16 | エレクトロマイグレーション耐性フィードライン構造を有するｉｃデバイス |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8531030B2 (cg-RX-API-DMAC7.html) |
| JP (1) | JP6053690B2 (cg-RX-API-DMAC7.html) |
| CN (1) | CN103262228B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2012083110A2 (cg-RX-API-DMAC7.html) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8575007B2 (en) * | 2011-03-28 | 2013-11-05 | International Business Machines Corporation | Selective electromigration improvement for high current C4s |
| US9318414B2 (en) | 2013-10-29 | 2016-04-19 | Globalfoundries Inc. | Integrated circuit structure with through-semiconductor via |
| US9318413B2 (en) | 2013-10-29 | 2016-04-19 | Globalfoundries Inc. | Integrated circuit structure with metal cap and methods of fabrication |
| US9515035B2 (en) | 2014-12-19 | 2016-12-06 | International Business Machines Corporation | Three-dimensional integrated circuit integration |
| US10068181B1 (en) * | 2015-04-27 | 2018-09-04 | Rigetti & Co, Inc. | Microwave integrated quantum circuits with cap wafer and methods for making the same |
| US10289794B2 (en) | 2016-12-14 | 2019-05-14 | Taiwan Semiconductor Manufacturing Company Ltd. | Layout for semiconductor device including via pillar structure |
| US10833036B2 (en) | 2018-12-27 | 2020-11-10 | Texas Instruments Incorporated | Interconnect for electronic device |
| US11362047B2 (en) * | 2020-04-16 | 2022-06-14 | Texas Instruments Incorporated | Integrated system-in-package with radiation shielding |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5929521A (en) * | 1997-03-26 | 1999-07-27 | Micron Technology, Inc. | Projected contact structure for bumped semiconductor device and resulting articles and assemblies |
| US6960828B2 (en) * | 2002-06-25 | 2005-11-01 | Unitive International Limited | Electronic structures including conductive shunt layers |
| US7065721B2 (en) | 2003-07-28 | 2006-06-20 | Lsi Logic Corporation | Optimized bond out method for flip chip wafers |
| US7253528B2 (en) | 2005-02-01 | 2007-08-07 | Avago Technologies General Ip Pte. Ltd. | Trace design to minimize electromigration damage to solder bumps |
| JP4452217B2 (ja) * | 2005-07-04 | 2010-04-21 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置 |
| US8212357B2 (en) | 2008-08-08 | 2012-07-03 | International Business Machines Corporation | Combination via and pad structure for improved solder bump electromigration characteristics |
| US20100123215A1 (en) * | 2008-11-20 | 2010-05-20 | Qualcomm Incorporated | Capacitor Die Design for Small Form Factors |
| US8084858B2 (en) * | 2009-04-15 | 2011-12-27 | International Business Machines Corporation | Metal wiring structures for uniform current density in C4 balls |
-
2010
- 2010-12-16 US US12/970,464 patent/US8531030B2/en active Active
-
2011
- 2011-12-16 CN CN201180060401.0A patent/CN103262228B/zh active Active
- 2011-12-16 JP JP2013544804A patent/JP6053690B2/ja active Active
- 2011-12-16 WO PCT/US2011/065355 patent/WO2012083110A2/en not_active Ceased