JP2014230365A - Power supply device and electronic component testing device having the same - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a small, low-cost, low heat generation power supply device, capable of corresponding to different output ranges.SOLUTION: A power supply device 100 includes: a first boosting circuit 10 for boosting a first DC voltage Vs to a second DC voltage Vo1; a second boosting circuit 20, controlled to be turn on or turn off, for boosting the second DC voltage Vo1 to a third DC voltage Vo2 and outputting it at an output terminal OUT while the circuit is turned on, and for disabling the output of the third DC voltage Vo2 while the circuit is turned off; and a rectifier element D1, one end of which is connected to the second DC voltage Vo1 and the other end of which is connected to the output terminal OUT, for draining a current from the one end to the other end.

Description

  The present invention relates to a power supply apparatus that can handle different output ranges and an electronic component testing apparatus including the same.

  2. Description of the Related Art Conventionally, in a semiconductor static characteristic test apparatus for testing static characteristics of a diode or the like, a low withstand voltage element such as a Schottky diode (for example, a breakdown voltage of less than 100V) and a high breakdown voltage element such as a pn junction diode (for example, a breakdown voltage of 100V or more ) And the reverse direction characteristic test is conducted. The test range of the test apparatus is a low voltage small current (for example, V1: several hundreds V, I2: several mA) range (necessary range I) and a high voltage minute current (for example, V2: several thousand V, I1: several tens of tens). μA) range (required range II), low static voltage range for low withstand voltage devices, high voltage micro current range for high withstand voltage devices, reverse static characteristics A test is conducted.

  In order to realize this test apparatus, the output range of the power supply apparatus in the test apparatus needs to cover both the maximum output voltage (V2) and the maximum output current (I2) as shown in FIG. 1 configuration). As a power supply device that generates such a high voltage, for example, a device described in Patent Document 1 is known.

  Alternatively, as shown in FIG. 4, a power source I for a low voltage and small current range and a power source II for a high voltage and small current range are provided as power sources in the test apparatus. A second configuration for switching is also conceivable.

JP-A-10-257773

  However, in the first conventional configuration, as shown in FIG. 3, there is a large difference between the output range of the power supply device and the actual use range (required ranges I and II). It becomes bigger than necessary. Therefore, the power supply device and the test device have problems such as an increase in size, an increase in price, and an increase in heat generation.

  In the second conventional configuration, the output capacity of each power source can be reduced, so that the amount of heat generated can be reduced. However, when one power source is used, the other power source is not used, resulting in an increase in size and cost. The rising problem cannot be solved.

  SUMMARY OF THE INVENTION An object of the present invention is to provide a power supply device that is compatible with different output ranges, is small in size, is inexpensive, and has a low calorific value, and an electronic component testing device including the same.

A power supply device according to one embodiment of the present invention includes:
A first booster circuit for boosting the first DC voltage to the second DC voltage;
A second booster circuit that is controlled to be turned on or off, boosts the second DC voltage to a third DC voltage when turned on, outputs the third DC voltage to an output terminal, and stops output of the third DC voltage when turned off; ,
And a rectifying element that is supplied with the second DC voltage at one end, is connected to the output terminal at the other end, and flows current from the one end to the other end.

In the power supply device,
The maximum value of the current output from the first booster circuit may be larger than the maximum value of the current output from the second booster circuit.

In the power supply device,
The first booster circuit includes:
A first converter that converts the first DC voltage into a first AC voltage;
A first boost rectifier that boosts and rectifies the first AC voltage and outputs the second DC voltage.

In the power supply device,
The second booster circuit includes:
A switching element, wherein the second DC voltage is converted into a second AC voltage by the switching operation of the switching element when the second booster circuit is on, and the switching element is switched off when the second booster circuit is off. A second converter for stopping the switching operation;
A second step-up rectifier that boosts and rectifies the second AC voltage and outputs the third DC voltage.

An electronic component testing apparatus according to an aspect of the present invention is provided.
The power supply;
A test unit that applies a test voltage corresponding to the output voltage output from the output terminal of the power supply device to the electronic component to be tested, and tests a current flowing through the electronic component, and
The second booster circuit of the power supply device is controlled to be turned on or off according to the electrical characteristics of the electronic component.

In the electronic component testing apparatus,
The electronic component is a diode;
The second booster circuit of the power supply device is controlled to be turned on or off according to a reverse withstand voltage that is an electrical characteristic of the diode,
The test unit may test a reverse current flowing in the diode by applying a test voltage corresponding to an output voltage output from the output terminal of the power supply device as a reverse voltage to the diode.

In the electronic component testing apparatus,
The diode includes a pn junction diode and a Schottky diode,
The second booster circuit of the power supply device may be controlled to be turned on when a test target is the pn junction diode, and may be controlled to be turned off when the test target is the Schottky diode.

  According to the present invention, the power supply apparatus includes a first booster circuit that boosts the first DC voltage to the second DC voltage, and an output terminal that boosts the second DC voltage to the third DC voltage when turned on. And the second booster circuit that stops the output of the third DC voltage at the time of OFF, the second DC voltage is supplied to one end, the other end is connected to the output terminal, and the current is supplied from one end to the other end. A flow rectifying element. With this configuration, when the second booster circuit is off, the second DC voltage is output to the output terminal via the rectifier element. On the other hand, when the second booster circuit is on, a third DC voltage obtained by boosting the second DC voltage is output to the output terminal. At this time, since the third DC voltage is higher than the second DC voltage, the rectifying element does not conduct.

  Thus, in one output range, the second DC voltage is output to the output terminal using the first booster circuit, and in the other output range, the third DC voltage is used using the first and second booster circuits. Is output to the output terminal, the output capacity of the first booster circuit may be matched to one output range, and the overall output capacity of the first and second booster circuits may be matched to the other output range. Therefore, it is not necessary to increase the output capacities of the first and second booster circuits more than necessary. In addition, since both the first and second booster circuits are used when outputting the third DC voltage, an optimum device configuration without waste can be achieved. Further, since the output range can be switched only by controlling the second booster circuit to be on or off, there is no need to provide a switching element such as a switch between the first booster circuit and the output terminal.

  Therefore, it is possible to provide a power supply apparatus that can be used for different output ranges and that is small, inexpensive, and has a low calorific value.

1 is a block diagram of a power supply device according to a first embodiment of the present invention. (A) is a circuit diagram of the first booster circuit of FIG. 1, and (b) is a circuit diagram of the second booster circuit of FIG. It is a block diagram of the electronic component testing apparatus which concerns on the 2nd Embodiment of this invention. It is a figure explaining the output range of the conventional power supply device (1st structure). It is a figure explaining the output range of the conventional power supply device (2nd structure).

  Embodiments of the present invention will be described below with reference to the drawings. These embodiments do not limit the present invention.

(First embodiment)
FIG. 1 is a block diagram of a power supply device 100 according to the first embodiment. As shown in FIG. 1, the power supply apparatus 100 includes a first booster circuit 10, a second booster circuit 20, and a diode (rectifier element) D1.

  The first booster circuit 10 boosts the first DC voltage Vs output from the general-purpose DC power supply P to the second DC voltage Vo1.

The second booster circuit 20 is controlled to be turned on or off in accordance with the output range control signal CONT. When the second booster circuit 20 is turned on, the second DC voltage Vo1 is boosted to the third DC voltage Vo2 to the output terminal OUT of the power supply apparatus 100. The output of the third DC voltage Vo2 is stopped at the high resistance state when the output is off.
The ground terminal COM of the power supply apparatus 100 is grounded, and each voltage is a voltage with respect to the ground.

  In the diode D1, the second DC voltage Vo1 is supplied to the anode (one end), the cathode (the other end) is connected to the output terminal OUT, and a current flows from the anode to the cathode.

The maximum value of the current Io1 output from the first booster circuit 10 is larger than the maximum value of the current Io2 output from the second booster circuit 20. The product of the maximum value of the current Io1 and the second DC voltage Vo1 is substantially equal to the product of the maximum value of the current Io2 and the third DC voltage Vo2.
The boost ratio of the first booster circuit 10 and the boost ratio of the second booster circuit 20 may be the same or different.

  The first and second booster circuits 10 and 20 may have any circuit configuration as long as the first and second booster circuits 10 and 20 have the above-described boosting function. A specific example will be described below.

  2A is a circuit diagram of the first booster circuit 10 in FIG. 1, and FIG. 2B is a circuit diagram of the second booster circuit 20 in FIG.

  As illustrated in FIG. 2A, the first booster circuit 10 includes a first converter 11 and a first booster rectifier 12.

The first converter 11 converts the first DC voltage Vs into the first AC voltage Vac1.
The first converter 11 includes a transformer T11, a switching element TR11 that is an N-type FET, a switching element TR12 that is an N-type FET, a switching signal generator SG11, and an inverter INV11.

  The transformer T11 includes first and second windings L11 and L12 on the primary side and a winding L13 on the secondary side. The other end of the primary-side first winding L11 and one end of the primary-side second winding L12 are connected, and the first DC voltage Vs is supplied to the connection point. The turn ratio between the primary side and the secondary side of the transformer T11 is 1: n (n> 1).

The switching element TR11 is connected between one end of the primary side first winding L11 and the ground.
The switching element TR12 is connected between the other end of the primary side second winding L12 and the ground.

  The switching signal generator SG11 generates a switching signal having a predetermined frequency and supplies it to the control terminal of the switching element TR12 and the inverter INV11. The inverter INV11 supplies an inverted signal of the switching signal to the control terminal of the switching element TR11.

The first boost rectifier 12 boosts and rectifies the first AC voltage Vac1 and outputs a second DC voltage Vo1.
The first boost rectification unit 12 includes capacitors C11 to C15 and diodes D11 to D15. The first boost rectifier 12 is a Cockcroft-Walton circuit.

The capacitor C11 has one end connected to one end of the secondary winding L13 of the transformer T11 and grounded.
One end of the capacitor C12 is connected to the other end of the capacitor C11.
The capacitor C13 has one end connected to the other end of the capacitor C12, and outputs the second DC voltage Vo1 from the other end.

One end of the capacitor C14 is connected to the other end of the secondary winding L13 of the transformer T11.
One end of the capacitor C15 is connected to the other end of the capacitor C14.

The diode D11 has an anode connected to the other end of the secondary winding L13 of the transformer T11, and a cathode connected to a connection point between the capacitors C11 and C12.
The diode D12 has an anode connected to the cathode of the diode D11 and a cathode connected to a connection point between the capacitors C14 and C15.
The diode D13 has an anode connected to the cathode of the diode D12 and a cathode connected to a connection point between the capacitor C12 and the capacitor C13.

The diode D14 has an anode connected to the cathode of the diode D13 and a cathode connected to the other end of the capacitor C15.
The diode D15 has an anode connected to the cathode of the diode D14 and a cathode connected to the other end of the capacitor C13.

With this configuration, the first boost rectification unit 12 outputs the second DC voltage Vo1 having a value obtained by multiplying the maximum value of the first AC voltage Vac1 by five.
Therefore, the boost ratio of the first booster circuit 10 is n × 5. An arbitrary step-up ratio can be obtained by increasing / decreasing the turn ratio of the transformer T11 and the capacitance and the number of diodes of the first step-up rectifier 12.

  As shown in FIG. 2B, the second booster circuit 20 includes a second converter 21 and a second boost rectifier 22.

  The second conversion unit 21 includes a transformer T21, a switching element TR21 that is an N-type FET, a switching element Tr22 that is an N-type FET, a switching signal generation unit SG21, and an inverter INV21. Since the basic circuit configuration of the second conversion unit 21 is the same as that of the first conversion unit 11 in FIG. 2A, the description of the same part is omitted, and the description will focus on the differences.

  A second DC voltage Vo1 is supplied to a connection point between the other end of the primary winding L21 on the primary side of the transformer T21 and one end of the second winding L22 on the primary side. The turn ratio of the primary side and the secondary side of the transformer T21 may be the same as or different from the turn ratio of the transformer T11.

  The switching signal generator SG21 is controlled to be turned on or off according to the output range control signal CONT, generates a switching signal having a predetermined frequency when turned on, and does not generate a switching signal when turned off.

  With this configuration, the second converter 20 converts the second DC voltage Vo1 into the second AC voltage Vac2 by the switching operation of the switching elements TR21 and TR22 when the second booster circuit 20 is turned on. The second converter 20 stops the switching operation of the switching elements TR21 and TR22 when the second booster circuit 20 is off, and does not output the second AC voltage Vac2.

  The second boost rectifier 22 boosts and rectifies the second AC voltage Vac2, and outputs a third DC voltage Vo2.

  The second boost rectifier 22 includes capacitors C21 to C25 and diodes D21 to D25. The second boost rectifier 22 is also a Cockcroft-Walton circuit. The circuit configuration of the second boost rectifier 22 is the same as that of the first boost rectifier 12 shown in FIG.

  With the above configuration, when the second booster circuit 20 is off, a voltage obtained by subtracting the forward voltage of the diode D1 from the second DC voltage Vo1 is output from the output terminal OUT as the output voltage Vout via the diode D1. The Further, the current Io1 is output from the output terminal OUT. In other words, the diode D1 functions to bypass the second DC voltage Vo1 and the current Io1 to the second booster circuit 20 that is turned off. This corresponds to an output range of a low voltage small current (for example, Vo1: several hundreds V, Io1: several mA). Since the forward voltage of the diode D1 is sufficiently lower than the second DC voltage Vo1, the second DC voltage Vo1 may be regarded as being output as the output voltage Vout.

On the other hand, when the second booster circuit 20 is on, the third DC voltage Vo2 obtained by boosting the second DC voltage Vo1 is directly output as the output voltage Vout from the output terminal OUT. Further, the current Io2 is output from the output terminal OUT. At this time, since the third DC voltage Vo2 is higher than the second DC voltage Vo1, the diode D1 does not conduct. This corresponds to an output range of a high voltage minute current (for example, Vo2: several thousand V, Io2: several hundred μA).
However, the numerical values of the second DC voltage Vo1, the third DC voltage Vo2, and the currents Io1 and Io2 are examples, and are not limited thereto.

  Thus, according to the present embodiment, in one output range, the first DC voltage Vo1 is output to the output terminal OUT via the diode D1 using the first booster circuit 10, and in the other output range, the first DC voltage Vo1 is output. In addition, the third DC voltage Vo2 is output to the output terminal OUT using both the second booster circuits 10 and 20. Thereby, the output capacity of the first booster circuit 10 may be matched to one output range, and the overall output capacity of the first and second booster circuits 10 and 20 may be matched to the other output range. Therefore, it is not necessary to increase the output capacities of the first and second booster circuits 10 and 20 more than necessary. In addition, since both the first and second booster circuits 10 and 20 are used when the third DC voltage Vo2 is output, an optimum device configuration without waste can be achieved.

  Further, by providing the diode D1, the output range can be switched only by controlling the second booster circuit 20 to be on or off, so that a switch or the like is provided between the first booster circuit 10 and the output terminal OUT. There is no need to provide a switching element.

  Therefore, it is possible to provide a power supply apparatus 100 that can be applied to different output ranges and that is small, inexpensive, and has a low heat generation amount.

  The rectifying element D1 has been described as a diode. However, the present invention is not limited to this, and any element having a rectifying function may be used.

(Second Embodiment)
The present embodiment relates to an electronic component testing apparatus including the power supply device 100 of the first embodiment.

  FIG. 3 is a block diagram of an electronic component testing apparatus according to the second embodiment. As shown in FIG. 3, the electronic component test apparatus includes the power supply device 100 according to the first embodiment and a test unit 110.

  The test unit 110 applies a test voltage Vtest corresponding to the output voltage Vout output from the output terminal OUT of the power supply apparatus 100 to the electronic component DUT to be tested, and tests the current flowing through the electronic component DUT. The test voltage Vtest may be equal to the output voltage Vout.

  The second booster circuit 20 of the power supply apparatus 100 is controlled to be turned on or off according to the electrical characteristics of the electronic component DUT.

  The electronic component DUT to be tested is not particularly limited, but may be a diode as shown in the figure, for example. In the case of a diode, the test unit 110 applies a test voltage Vtest as a reverse voltage to the diode, and tests the reverse current flowing through the diode. In addition, the second booster circuit 20 of the power supply device 100 is controlled to be turned on or off according to the reverse withstand voltage, which is an electrical characteristic of the diode.

  More specifically, the diode may include a pn junction diode and a Schottky diode. In this case, the second booster circuit 20 of the power supply apparatus 100 is controlled to be turned on when the test target is a pn junction diode, and is controlled to be turned off when the test target is a Schottky diode. The reverse current of the pn junction diode is smaller than the reverse current of the Schottky diode. The reverse breakdown voltage of the pn junction diode is higher than the reverse breakdown voltage of the Schottky diode.

  As described above, according to the present embodiment, since the electronic device test apparatus includes the power supply device 100 of the first embodiment, the low voltage and small current (for example, Vo1: several hundreds V, Io1: several mA). And a test range of high voltage minute current (for example, Vo2: several thousand V, Io2: several hundred μA). Therefore, for a low withstand voltage element such as a Schottky diode (for example, with a withstand voltage of less than 100V), it is a low voltage and low current test range, and for a high withstand voltage element such as a pn junction diode (for example, withstand voltage of 100V or more) Can perform a reverse static characteristic test in the high voltage microcurrent test range.

  The aspect of the present invention is not limited to the individual embodiments described above, and includes various modifications that can be conceived by those skilled in the art, and the effects of the present invention are not limited to the contents described above. That is, various additions, modifications, and partial deletions can be made without departing from the concept and spirit of the present invention derived from the contents defined in the claims and equivalents thereof.

10 first booster circuit 11 first converter 12 first booster rectifier 20 second booster circuit 21 first converter 22 first booster rectifier D1 diode (rectifier element)
100 Power supply device 110 Test unit DUT Electronic component (diode)

Claims (7)

A first booster circuit for boosting the first DC voltage to the second DC voltage;
A second booster circuit that is controlled to be turned on or off, boosts the second DC voltage to a third DC voltage when turned on, outputs the third DC voltage to an output terminal, and stops output of the third DC voltage when turned off; ,
A rectifying element, wherein the second DC voltage is supplied to one end, the other end is connected to the output terminal, and a current flows from the one end to the other end. 2. The power supply device according to claim 1, wherein a maximum value of a current output from the first booster circuit is larger than a maximum value of a current output from the second booster circuit. The first booster circuit includes:
A first converter that converts the first DC voltage into a first AC voltage;
The power supply device according to claim 1, further comprising: a first boost rectifier that boosts and rectifies the first AC voltage and outputs the second DC voltage. The second booster circuit includes:
A switching element, wherein the second DC voltage is converted into a second AC voltage by the switching operation of the switching element when the second booster circuit is on, and the switching element is switched off when the second booster circuit is off. A second converter for stopping the switching operation;
The second step-up rectification unit that steps up and rectifies the second AC voltage and outputs the third DC voltage. 4. The method according to claim 1, further comprising: Power supply. The power supply device according to any one of claims 1 to 4,
A test unit that applies a test voltage corresponding to the output voltage output from the output terminal of the power supply device to the electronic component to be tested, and tests a current flowing through the electronic component, and
The second booster circuit of the power supply device is controlled to be turned on or off according to the electrical characteristics of the electronic component.
An electronic component testing apparatus characterized by that. The electronic component is a diode;
The second booster circuit of the power supply device is controlled to be turned on or off according to a reverse withstand voltage that is an electrical characteristic of the diode,
The test unit applies a test voltage corresponding to an output voltage output from the output terminal of the power supply device as a reverse voltage to the diode, and tests a reverse current flowing in the diode. The electronic component testing apparatus according to claim 5. The diode includes a pn junction diode and a Schottky diode,
The second booster circuit of the power supply apparatus is controlled to be turned on when a test target is the pn junction diode, and is controlled to be turned off when the test target is the Schottky diode. Electronic component testing equipment.

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