JP2014134449A - Measurement device for concave surface optical element, measurement device for concave surface diffraction grating, and measurement device for flat surface diffraction grating - Google Patents

Measurement device for concave surface optical element, measurement device for concave surface diffraction grating, and measurement device for flat surface diffraction grating Download PDF

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JP2014134449A
JP2014134449A JP2013002447A JP2013002447A JP2014134449A JP 2014134449 A JP2014134449 A JP 2014134449A JP 2013002447 A JP2013002447 A JP 2013002447A JP 2013002447 A JP2013002447 A JP 2013002447A JP 2014134449 A JP2014134449 A JP 2014134449A
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diffraction grating
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JP6042213B2 (en
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Naoya Nakai
直也 中井
Yoshisada Ehata
佳定 江畠
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Hitachi High Tech Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a measurement device capable of quantitatively measuring a stray light value of a concave surface optical element in the same condition as a mounting state.SOLUTION: A measurement device of a concave surface optical element 7 includes: a concave surface optical element; a rotation stage 6 that rotates the concave optical element; a laser device 1 that can change a distance to the rotation stage and is a light source irradiating the concave surface optical element with light; and a photodetector 8 that forms a predetermined angle with a line connecting the light source and the rotation stage, can change the distance to the rotation stage, and detects light reflected at a position other than a light focusing-point out of light reflected from the concave surface optical element.

Description

本発明は凹面光学素子の測定装置及び凹面回折格子の測定装置並びに平面回折格子の測定装置に係わり、特に、凹面光学素子を反射する光のうち集光点以外の位置で反射してくる迷光或いは凹面回折格子又は平面回折格子を回折した回折光以外の迷光を測定するものに好適な凹面光学素子の測定装置及び凹面回折格子の測定装置並びに平面回折格子の測定装置の測定装置に関するものである。   The present invention relates to a concave optical element measuring device, a concave diffraction grating measuring device, and a planar diffraction grating measuring device, and in particular, stray light reflected at a position other than a condensing point in light reflected from the concave optical element or The present invention relates to a concave optical element measuring apparatus, a concave diffraction grating measuring apparatus, and a planar diffraction grating measuring apparatus suitable for measuring stray light other than diffracted light diffracted by a concave diffraction grating or a planar diffraction grating.

一般に、凹面光学素子が仕様通りになっているかの評価を行う場合、従来は、凹面光学素子曲率半径、面精度、面粗さ等の測定が行われていた。しかし、凹面光学素子を装置に実装した場合と同条件で、凹面光学素子単体の迷光(凹面光学素子からの反射光が、凹面光学素子の凹面最深部から曲率半径と角度によって決定される位置からずれた光)を測定することは行われていない。また、面精度が悪い或いは面粗さが大きい場合などは、迷光が大きいことは予想されるが、定量的に迷光量を把握することは行われていなかった。   In general, when evaluating whether or not a concave optical element is in accordance with specifications, conventionally, measurement of a concave optical element radius of curvature, surface accuracy, surface roughness, and the like has been performed. However, under the same conditions as when the concave optical element is mounted on the device, the stray light of the single concave optical element (from the position where the reflected light from the concave optical element is determined by the radius of curvature and angle from the deepest concave surface of the concave optical element) Measurement of shifted light) is not performed. Further, when the surface accuracy is poor or the surface roughness is large, stray light is expected to be large, but the amount of stray light has not been quantitatively grasped.

また、特許文献1のように、平面素子の1つである回折格子の迷光測定に関しては、その測定装置が提案されているが、測定対象は平面素子に限られており、凹面光学素子等の測定については考慮されていない。   Further, as in Patent Document 1, a measurement apparatus has been proposed for stray light measurement of a diffraction grating, which is one of planar elements, but the measurement target is limited to a planar element, such as a concave optical element. Measurement is not considered.

特開2006-337284号公報JP 2006-337284 A

一般に、凹面光学素子の評価は、曲率半径、面精度、面粗さ等の測定を行っている。しかしながら、凹面光学素子を装置に実装した場合と同条件で、凹面光学素子単体の迷光を測定することは行われていなかった。   In general, the concave optical element is evaluated by measuring a radius of curvature, surface accuracy, surface roughness, and the like. However, the stray light of a single concave optical element has not been measured under the same conditions as when the concave optical element is mounted on the apparatus.

本発明は上述の点に鑑みなされたもので、その目的とするところは、迷光値を実装状態と同じ条件で定量的に測定することのできる凹面光学素子の測定装置及び凹面回折格子の測定装置並びに平面回折格子の測定装置を提供することにある。   SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and its object is to provide a concave optical element measuring device and a concave diffraction grating measuring device capable of quantitatively measuring stray light values under the same conditions as in the mounted state. Another object of the present invention is to provide a planar diffraction grating measuring device.

本発明の凹面光学素子の測定装置は、上記目的を達成するために、凹面光学素子と、該凹面光学素子を回転させる回転ステージと、該回転ステージとの距離が変更可能で、かつ、前記凹面光学素子に光を照射する光源と、該光源と前記回転ステージを結んだ直線と所定の角度をなすと共に、前記回転ステージとの距離が変更可能で、かつ、前記凹面光学素子を反射する光のうち集光点以外の光を検出する検出器とを備えていることを特徴とする。   In order to achieve the above object, the concave optical element measuring apparatus of the present invention can change the distance between the concave optical element, a rotary stage that rotates the concave optical element, and the rotary stage, and the concave surface. A light source that irradiates light to the optical element, and a straight line connecting the light source and the rotary stage forms a predetermined angle, the distance from the rotary stage is changeable, and light that reflects the concave optical element Of these, a detector for detecting light other than the condensing point is provided.

また、本発明の凹面回折格子の測定装置は、上記目的を達成するために、凹面回折格子と、該凹面回折格子を回転させる回転ステージと、前記凹面回折格子に光を照射する光源と、該光源と前記回転ステージを結んだ直線と所定の角度をなすと共に、前記回転ステージとの距離が変更可能で、かつ、前記凹面回折格子を回折した回折光以外の光を検出する検出器とを備えている特徴とする。   In order to achieve the above object, the concave diffraction grating measuring apparatus of the present invention includes a concave diffraction grating, a rotary stage that rotates the concave diffraction grating, a light source that irradiates light to the concave diffraction grating, A detector that detects a light other than the diffracted light that is diffracted by the concave diffraction grating and that forms a predetermined angle with a straight line connecting a light source and the rotary stage, can change a distance from the rotary stage. It is a characteristic.

また、前記光源は、レーザー装置と、該レーザー装置から照射されたレーザー光を焦点位置で集光する対物レンズと、該対物レンズが、前記回転ステージとの距離が変更可能なように移動可能に設置されている第1の直動ステージとから成り、かつ、前記レーザー光が焦点位置で集光する位置にはピンホールが設置されていることを特徴とする。   The light source is movable so that the distance between the laser device, an objective lens for condensing laser light emitted from the laser device at a focal position, and the rotation stage can be changed. It comprises a first linear motion stage installed, and a pinhole is installed at a position where the laser beam is condensed at a focal position.

また、前記光源と前記回転ステージを結んだ直線と所定の角度をなして第2の直動ステージが設置され、該第2の直動ステージには、前記検出器が、前記回転ステージとの距離が変更可能なように移動可能に設置されていることを特徴とする。   A second linear motion stage is installed at a predetermined angle with a straight line connecting the light source and the rotary stage, and the second linear motion stage has a distance between the detector and the rotary stage. It is characterized by being installed so that it can be changed.

また、前記検出器が、前記第2の直動ステージと共に円弧状に移動する円弧ステージを備えていることを特徴とする。   The detector may include an arc stage that moves in an arc shape together with the second linear motion stage.

また、前記検出器を前記円弧ステージに固定すると共に、前記回転ステージ上の前記凹面光学素子を回転させることで、前記凹面光学素子を反射する光のうち前記集光点以外の位置で反射してくる光を前記検出器で検出することを特徴とする。   Further, by fixing the detector to the arc stage and rotating the concave optical element on the rotary stage, the light reflected by the concave optical element is reflected at a position other than the condensing point. The incoming light is detected by the detector.

また、前記検出器を前記円弧ステージに固定すると共に、前記回転ステージを回転させて前記回折光を前記検出器に入射し、該検出器で前記回転ステージの回転角度を検出することで、前記凹面回折格子の溝本数を計測することを特徴とする。   In addition, the detector is fixed to the arc stage, the rotating stage is rotated, the diffracted light is incident on the detector, and the rotation angle of the rotating stage is detected by the detector. The number of grooves of the diffraction grating is measured.

更に、本発明の平面回折格子の測定装置は、上記目的を達成するために、平面回折格子と、該平面回折格子を回転させる回転ステージと、前記平面回折格子に光を照射する光源と、該光源と前記回転ステージを結んだ直線と所定の角度をなすと共に、前記回転ステージとの距離が変更可能で、かつ、前記平面回折格子を回折した回折光以外の光を検出する検出器とを備え、前記光源はレーザー装置であり、該レーザー装置と前記回転ステージを結んだ直線と所定の角度をなして第2の直動ステージが設置され、該第2の直動ステージには、前記回転ステージとの距離が変更可能なように前記検出器が移動可能に設置され、更に、前記検出器が前記第2の直動ステージと共に円弧状に移動する円弧ステージを備えていることを特徴とする。   Furthermore, in order to achieve the above object, the planar diffraction grating measuring apparatus of the present invention includes a planar diffraction grating, a rotating stage that rotates the planar diffraction grating, a light source that irradiates light to the planar diffraction grating, A detector that detects a light other than the diffracted light that is diffracted by the planar diffraction grating and that forms a predetermined angle with a straight line connecting a light source and the rotary stage and is capable of changing a distance from the rotary stage. The light source is a laser device, and a second linear motion stage is installed at a predetermined angle with a straight line connecting the laser device and the rotational stage, and the second linear motion stage includes the rotational stage. The detector is movably installed so that the distance between the detector and the second linear motion stage can be changed, and the detector further includes an arc stage that moves in an arc shape together with the second linear motion stage.

また、前記検出器を前記円弧ステージに固定すると共に、前記回転ステージを回転させて前記回折光を前記検出器に入射し、該検出器で前記回転ステージの回転角度を検出することで、前記平面回折格子の溝本数を計測することを特徴とする。   In addition, the detector is fixed to the arc stage, the rotating stage is rotated, the diffracted light is incident on the detector, and the rotation angle of the rotating stage is detected by the detector. The number of grooves of the diffraction grating is measured.

本発明によれば、迷光値を実装状態と同じ条件で定量的に得ることができる効果がある。   According to the present invention, there is an effect that the stray light value can be quantitatively obtained under the same conditions as the mounting state.

本発明の実施例1である凹面光学素子の測定装置を示す概略構成図である。It is a schematic block diagram which shows the measuring apparatus of the concave optical element which is Example 1 of this invention. 本発明の実施例2である凹面光学素子の測定装置を示す概略構成図である。It is a schematic block diagram which shows the measuring apparatus of the concave optical element which is Example 2 of this invention. 本発明の実施例4である平面光学素子の測定装置を示す概略構成図である。It is a schematic block diagram which shows the measuring apparatus of the planar optical element which is Example 4 of this invention.

以下、図示した実施例に基づいて本発明の凹面光学素子の測定装置及び凹面回折格子の測定装置並びに平面回折格子の測定装置を説明する。なお、各実施例において、同一構成部品には、同符号を使用する。   The concave optical element measuring apparatus, concave diffraction grating measuring apparatus, and planar diffraction grating measuring apparatus of the present invention will be described below based on the illustrated embodiments. In addition, in each Example, the same code | symbol is used for the same component.

図1に、本発明の実施例1である凹面光学素子の測定装置を示す。   FIG. 1 shows a concave optical element measuring apparatus that is Embodiment 1 of the present invention.

該図に示す如く、本実施例の凹面光学素子の測定装置は、凹面光学素子7と、この凹面光学素子7を回転させる回転ステージ6と、凹面光学素子7に光を照射するレーザー装置1と、、レーザー装置1から照射されたレーザー光を焦点位置で集光する対物レンズ3と、この対物レンズ3が、回転ステージ6との距離が変更可能なように移動可能に設置されている第1の直動ステージ5と、レーザー装置1からのレーザー光が焦点位置で集光する位置に設置されたピンホール4と、レーザー装置1と回転ステージ6を結んだ直線と所定の角度θをなすと共に、回転ステージ6との距離が変更可能で、かつ、凹面光学素子7を反射する光のうち集光点以外の位置で反射してくる光(迷光)を検出する光検知器8と、レーザー装置1と回転ステージ6を結んだ直線と所定の角度θをなした位置に設置され、光検知器8が回転ステージ6との距離が変更可能なように移動可能に設置されているた第2の直動ステージ11と、光検知器8が第2の直動ステージ11と共に円弧状に移動する円弧ステージ9とから概略構成されている。   As shown in the figure, the concave optical element measuring apparatus of this embodiment includes a concave optical element 7, a rotating stage 6 that rotates the concave optical element 7, and a laser device 1 that irradiates the concave optical element 7 with light. The objective lens 3 for condensing the laser light emitted from the laser device 1 at the focal position, and the objective lens 3 are installed so as to be movable so that the distance from the rotary stage 6 can be changed. The linear movement stage 5, the pinhole 4 installed at a position where the laser beam from the laser apparatus 1 is focused at the focal position, and a straight line connecting the laser apparatus 1 and the rotary stage 6 form a predetermined angle θ. A light detector 8 that detects a light (stray light) reflected at a position other than the condensing point among the light reflected from the concave optical element 7 and the distance to the rotary stage 6 can be changed; and a laser device 1 and rotating stage A second linear motion stage 11 that is installed at a position that forms a predetermined angle θ with a straight line connecting the two, and that the photodetector 8 is movably installed so that the distance from the rotary stage 6 can be changed. The optical detector 8 is generally composed of an arc stage 9 that moves together with the second linear motion stage 11 in an arc shape.

なお、符号2はレーザー装置1を一定の出力で駆動するレーザ電源、10は第1の直動ステージ5と第2の直動ステージ11及び回転ステージ6を駆動するステージ駆動装置、12は光検知器8の電流計、13は電流計12の電流値に基づいてデータ処理し、ステージ駆動装置10への第1の直動ステージ5と第2の直動ステージ11及び回転ステージ6の駆動指令を制御するステージ制御・データ処理装置である。   Reference numeral 2 denotes a laser power source for driving the laser device 1 with a constant output, 10 denotes a stage driving device for driving the first linear motion stage 5, the second linear motion stage 11 and the rotary stage 6, and 12 denotes light detection. The ammeter 13 of the device 8 processes data based on the current value of the ammeter 12, and issues a drive command for the first linear motion stage 5, the second linear motion stage 11, and the rotary stage 6 to the stage driving device 10. It is a stage control / data processing device to be controlled.

そして、本実施例では、レーザー装置1から出射したレーザー光15aは、対物レンズ3によって対物レンズ3の焦点位置で集光する。集光点に空間フィルタとしてピンホール4が設置されており、集光点を過ぎたレーザー光15bは、対物レンズ3の焦点距離fに従って特定の角度で広がることで球面波となり、回転ステージ6上に設置された測定対象となる凹面光学素子7に照射される。 In this embodiment, the laser beam 15 a emitted from the laser device 1 is condensed by the objective lens 3 at the focal position of the objective lens 3. Collecting pinhole 4 is installed as a spatial filter to light spot, the laser beam 15b past the focal point becomes a spherical wave by spreading at a specific angle according to the focal length f 0 of the objective lens 3, the rotary stage 6 Irradiated to the concave optical element 7 to be measured, which is installed above.

このとき、対物レンズ3とピンホール4の相対位置を保ったまま、両者を直動ステージ5によって動かすことで、凹面光学素子7の曲率半径Rとレーザー光15b(球面波)の曲率半径Rを一致させることができる。   At this time, while keeping the relative position of the objective lens 3 and the pinhole 4, both are moved by the linear motion stage 5, so that the curvature radius R of the concave optical element 7 and the curvature radius R of the laser beam 15b (spherical wave) are obtained. Can be matched.

凹面光学素子7の曲率半径がRで、対物レンズ3の焦点距離がfのとき、対物レンズ3とピンホール4は、集光点と凹面光学素子7の凹面最深部との距離が曲率半径Rになるように設置すればよい。これは、曲率半径Rの球面波を凹面光学素子7に入射したのに等しい。 When the radius of curvature of the concave optical element 7 is R and the focal length of the objective lens 3 is f 0 , the distance between the focal point and the deepest concave surface of the concave optical element 7 is the radius of curvature of the objective lens 3 and the pinhole 4. What is necessary is just to install so that it may become R. This is equivalent to a spherical wave having a radius of curvature R entering the concave optical element 7.

凹面光学素子7に入射した球面波は、凹面光学素子7下部の回転ステージ6を回転させた角度(θ)の2倍の角度で反射され、凹面光学素子7の凹面最深部から曲率半径Rと角度θによって決定される位置Dに光線を含む平面内で集光するので、光検出器8をレーザー装置1から出射されたレーザー光軸に対して90°以下の角度θで設置された第2の直動ステージ11によって凹面光学素子7の凹面最深部から位置Dに動かす。この時の位置Dは、下式(1)により求められる。   The spherical wave incident on the concave optical element 7 is reflected at an angle twice the angle (θ) of rotating the rotary stage 6 below the concave optical element 7, and the radius of curvature R from the deepest concave surface of the concave optical element 7 Since the light is condensed at a position D determined by the angle θ within a plane including the light beam, the photodetector 8 is installed at an angle θ of 90 ° or less with respect to the laser optical axis emitted from the laser device 1. Is moved from the deepest part of the concave surface of the concave optical element 7 to the position D. The position D at this time is calculated | required by the following Formula (1).

Figure 2014134449
Figure 2014134449

そして、円弧ステージ9によって角度θを変化させながら、光検出器8によって凹面光学素子7を反射する光のうち集光点以外の位置に反射してくる光(迷光)Lを検出することで迷光値を測定することができる。   Then, the stray light is detected by detecting the light (stray light) L reflected at a position other than the condensing point among the light reflected from the concave optical element 7 by the photodetector 8 while changing the angle θ by the arc stage 9. The value can be measured.

なお、第1の直動ステージ5及び第2の直動ステージ11の原点位置は、ピンホール4と光検出器8の検出面が回転ステージ6の中心位置から同一の任意の位置とする。また、円弧ステージ9の原点位置は、レーザー装置1から出射されるレーザー光軸に対して第2の直動ステージ11の設置角度θと同一とする。   Note that the origin positions of the first linear motion stage 5 and the second linear motion stage 11 are arbitrary positions where the detection surfaces of the pinhole 4 and the photodetector 8 are the same from the center position of the rotary stage 6. The origin position of the arc stage 9 is the same as the installation angle θ of the second linear motion stage 11 with respect to the laser optical axis emitted from the laser device 1.

このような本実施例とすることにより、凹面光学素子7の迷光値を実装状態と同じ条件で定量的に測定することができる。   By setting it as such a present Example, the stray light value of the concave optical element 7 can be measured quantitatively on the same conditions as a mounting state.

図2に、本発明の実施例2である凹面光学素子の測定装置を示す。   FIG. 2 shows a concave optical element measuring apparatus that is Embodiment 2 of the present invention.

該図に示す本実施例の凹面光学素子の測定装置は、光検出器8を円弧ステージ9に固定すると共に、回転ステージ6上の凹面光学素子7を回転させることで、凹面光学素子7を反射する光のうち集光点以外の位置で反射してくる光(迷光)Lを光検出器8で検出するようにしたものである。   The concave optical element measuring apparatus of this embodiment shown in the figure reflects the concave optical element 7 by fixing the photodetector 8 to the arc stage 9 and rotating the concave optical element 7 on the rotary stage 6. The light (stray light) L reflected at a position other than the condensing point is detected by the photodetector 8.

即ち、図1に示した実施例1の構成において、光検出器8を円弧ステージ9で動かさず原点に固定する。そして、回転ステージ6によって凹面光学素子7を回転させ、光検出器8によって集光点以外の位置に反射してくる光(迷光)Lを検出して迷光値を測定するものである。   That is, in the configuration of the first embodiment shown in FIG. 1, the photodetector 8 is fixed at the origin without being moved by the arc stage 9. Then, the concave optical element 7 is rotated by the rotating stage 6, and the light (stray light) L reflected to a position other than the condensing point is detected by the photodetector 8 to measure the stray light value.

このような本実施例の構成としても、実施例1と同様な効果を得ることができる。   Even with this configuration of the present embodiment, the same effects as those of the first embodiment can be obtained.

本発明の実施例3である凹面回折格子の測定装置について、以下に説明する。   An apparatus for measuring a concave diffraction grating, which is Embodiment 3 of the present invention, will be described below.

本実施例の凹面回折格子の測定装置は、特に、図示しないが、実施例1及び実施例2の構成において、凹面光学素子7を凹面回折格子に変えたものである(符号は、図1及び図2と同じものは、同符号を使用する)。   Although the concave diffraction grating measuring apparatus of the present embodiment is not particularly illustrated, the concave optical element 7 is changed to a concave diffraction grating in the configurations of the first and second embodiments (reference numerals are those shown in FIGS. 1 and 2). The same reference numerals are used for the same components as in FIG.

即ち、本実施例の凹面回折格子の測定装置は、凹面回折格子と、この凹面回折格子を回転させる回転ステージ6と、凹面回折格子に光を照射するレーザー装置1と、このレーザー装置1から照射されたレーザー光15aを焦点位置で集光する対物レンズ3と、この対物レンズ3が、回転ステージ6との距離が変更可能なように移動可能に設置されている第1の直動ステージ5と、レーザー装置1と回転ステージ6を結んだ直線と所定の角度をなして設置されている第2の直動ステージ11と、第2の直動ステージ11上に設置され、回転ステージ6との距離が変更可能で、かつ、凹面回折格子を回折した回折光以外の光を検出する光検出器8と、この光検出器8を第2の直動ステージ11と共に円弧状に移動する円弧ステージ9とから構成されている。   In other words, the concave diffraction grating measuring apparatus of the present embodiment includes a concave diffraction grating, a rotating stage 6 that rotates the concave diffraction grating, a laser device 1 that irradiates light to the concave diffraction grating, and an irradiation from the laser device 1. An objective lens 3 for condensing the laser beam 15a at a focal position, and a first linear motion stage 5 in which the objective lens 3 is movably installed so that the distance from the rotary stage 6 can be changed; The distance between the second linear motion stage 11 installed at a predetermined angle with the straight line connecting the laser device 1 and the rotary stage 6 and the rotary stage 6 installed on the second linear motion stage 11. And a photodetector 8 that detects light other than the diffracted light diffracted by the concave diffraction grating, and an arc stage 9 that moves the photodetector 8 together with the second linear motion stage 11 in an arc shape, Consists of To have.

そして、光検出器8を円弧ステージ9において原点位置に固定し、回転ステージ6を回転させて回折光を光検出器8に入射させ、回転ステージ6の回転角度αを記録することで、凹面回折格子の溝本数d(下式(2)参照)を計測することができる。   Then, the optical detector 8 is fixed at the origin position on the arc stage 9, the rotating stage 6 is rotated, the diffracted light is incident on the optical detector 8, and the rotational angle α of the rotating stage 6 is recorded, thereby concave diffraction. The number d of grooves in the lattice (see the following formula (2)) can be measured.

このとき、λを凹面回折格子に入射する光の波長、βを凹面回折格子の回折角度とすると、凹面回折格子の回折角度βは、0次光(正反射光)が光検出器8に入射される際の回転ステージ6の角度で得られる。   At this time, if λ is the wavelength of light incident on the concave diffraction grating and β is the diffraction angle of the concave diffraction grating, the diffraction angle β of the concave diffraction grating is zero-order light (regular reflection light) incident on the photodetector 8. It is obtained at the angle of the rotary stage 6 at the time.

Figure 2014134449
Figure 2014134449

また、凹面回折格子の溝本数dを計測した後、光検出器8を円弧ステージ9によって移動しながら光検出器8によって回折光以外の光を検出することで、凹面回折格子の迷光を測定することができる。   Further, after measuring the number of grooves d of the concave diffraction grating, the stray light of the concave diffraction grating is measured by detecting light other than the diffracted light by the photodetector 8 while moving the photodetector 8 by the arc stage 9. be able to.

このような本実施例とすることにより、凹面回折格子の溝本数と迷光値を実装状態と同じ条件で定量的に測定することができる。   By setting it as such a present Example, the groove number and stray light value of a concave-surface diffraction grating can be measured quantitatively on the same conditions as a mounting state.

図3に、本発明の実施例4である平面光学素子の測定装置を示す。   FIG. 3 shows a planar optical element measuring apparatus that is Embodiment 4 of the present invention.

該図に示す本実施例の平面光学素子の測定装置は、実施例3において、対物レンズ3とピンホール4を排除し、かつ、凹面回折格子を平面回折格子に変更したものである。即ち、本実施例の平面光学素子の測定装置は、平面回折格子14と、この平面回折格子14を回転させる回転ステージ6と、平面回折格子14に光を照射するレーザー装置1と、レーザー装置1と回転ステージ6を結んだ直線と所定の角度をなして設置されている第2の直動ステージ11と、この第2の直動ステージ11上に設置され、回転ステージ6との距離が変更可能で、かつ、平面回折格子14で回折した回折光以外の光を検出する光検出器8と、この光検出器8を第2の直動ステージ11と共に円弧状に移動する円弧ステージ9とから概略構成されている。   The planar optical element measuring apparatus of this example shown in the figure is the same as that of Example 3, except that the objective lens 3 and the pinhole 4 are eliminated and the concave diffraction grating is changed to a planar diffraction grating. That is, the planar optical element measuring apparatus of the present embodiment includes a planar diffraction grating 14, a rotating stage 6 that rotates the planar diffraction grating 14, a laser apparatus 1 that irradiates the planar diffraction grating 14 with light, and a laser apparatus 1. The second linear motion stage 11 installed at a predetermined angle with the straight line connecting the rotary stage 6 and the rotary stage 6 and the distance between the second linear motion stage 11 and the rotary stage 6 can be changed. And a photodetector 8 that detects light other than the diffracted light diffracted by the planar diffraction grating 14 and an arc stage 9 that moves the photodetector 8 together with the second linear motion stage 11 in an arc shape. It is configured.

なお、符号2はレーザー装置1を一定の出力で駆動するレーザ電源、10は第1の直動ステージ5と第2の直動ステージ11及び回転ステージ6を駆動するステージ駆動装置、12は光検知器8の電流計、13は電流計12の電流値に基づいてデータ処理し、ステージ駆動装置10への第1の直動ステージ5と第2の直動ステージ11及び回転ステージ6の駆動指令を制御するステージ制御・データ処理装置である。   Reference numeral 2 denotes a laser power source for driving the laser device 1 with a constant output, 10 denotes a stage driving device for driving the first linear motion stage 5, the second linear motion stage 11 and the rotary stage 6, and 12 denotes light detection. The ammeter 13 of the device 8 processes data based on the current value of the ammeter 12, and issues a drive command for the first linear motion stage 5, the second linear motion stage 11, and the rotary stage 6 to the stage driving device 10. It is a stage control / data processing device to be controlled.

そして、本実施例では、光検出器8を円弧ステージ9に固定すると共に、回転ステージ8を回転させ、レーザー装置1から照射されて平面回折格子14で回折した回折光を光検出器8に入射し、この光検出器8で回転ステージ6の回転角度を検出することで、平面回折格子14の溝本数を計測するものである。   In this embodiment, the photodetector 8 is fixed to the arc stage 9 and the rotating stage 8 is rotated so that the diffracted light irradiated from the laser device 1 and diffracted by the planar diffraction grating 14 is incident on the photodetector 8. Then, the number of grooves of the planar diffraction grating 14 is measured by detecting the rotation angle of the rotary stage 6 with the photodetector 8.

また、平面回折格子14の溝本数を計測した後、光検出器8を円弧ステージ9によって移動しながら光検出器8によって回折光以外の光を検出することで、平面回折格子の迷光を測定することができる。   In addition, after measuring the number of grooves of the planar diffraction grating 14, stray light of the planar diffraction grating is measured by detecting light other than the diffracted light by the photodetector 8 while moving the photodetector 8 by the arc stage 9. be able to.

このような本実施例とすることにより、凹面回折格子の溝本数と迷光値を実装状態と同じ条件で定量的に測定することができる。   By setting it as such a present Example, the groove number and stray light value of a concave-surface diffraction grating can be measured quantitatively on the same conditions as a mounting state.

なお、本発明は上記した実施例に限定されるものではなく、様々な変形例が含まれる。例えば、上記した実施例は本発明を分かり易く説明するために詳細に説明したものであり、必ずしも説明した全ての構成を備えるものに限定されるものではない。また、ある実施例の構成の一部を他の実施例の構成を置き換えることが可能であり、また、ある実施例の構成に他の実施例の構成を加えることも可能である。また、各実施例の構成の一部について、他の構成の追加・削除・置換をすることが可能である。   In addition, this invention is not limited to an above-described Example, Various modifications are included. For example, the above-described embodiments have been described in detail for easy understanding of the present invention, and are not necessarily limited to those having all the configurations described. Further, a part of the configuration of one embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of one embodiment. Further, it is possible to add, delete, and replace other configurations for a part of the configuration of each embodiment.

1…レーザー装置、2…レーザー電源、3…対物レンズ、4…ピンホール、5…第1の直動ステージ、6…回転ステージ、7…凹面光学素子、8…光検出器、9…円弧ステージ、10…ステージ駆動装置、11…第2の直動ステージ、12…電流計、13…ステージ制御・データ処理装置、14…平面回折格子、15a、15b…レーザー光。   DESCRIPTION OF SYMBOLS 1 ... Laser apparatus, 2 ... Laser power supply, 3 ... Objective lens, 4 ... Pinhole, 5 ... 1st linear motion stage, 6 ... Rotary stage, 7 ... Concave optical element, 8 ... Photodetector, 9 ... Arc stage DESCRIPTION OF SYMBOLS 10 ... Stage drive device, 11 ... 2nd linear motion stage, 12 ... Ammeter, 13 ... Stage control and data processing device, 14 ... Planar diffraction grating, 15a, 15b ... Laser beam.

Claims (12)

凹面光学素子と、該凹面光学素子を回転させる回転ステージと、該回転ステージとの距離が変更可能で、かつ、前記凹面光学素子に光を照射する光源と、該光源と前記回転ステージを結んだ直線と所定の角度をなすと共に、前記回転ステージとの距離が変更可能で、かつ、前記凹面光学素子を反射する光のうち集光点以外の位置で反射してくる光を検出する検出器とを備えていることを特徴とする凹面光学素子の測定装置。   A concave optical element, a rotary stage that rotates the concave optical element, a distance between the rotary stage and the light source that irradiates light to the concave optical element, and the light source and the rotary stage are connected. A detector that forms a predetermined angle with a straight line and that can change a distance from the rotary stage and that detects light reflected from a position other than a condensing point among light reflected from the concave optical element; An apparatus for measuring a concave optical element, comprising: 請求項1に記載の凹面光学素子の測定装置において、
前記光源は、レーザー装置と、該レーザー装置から照射されたレーザー光を焦点位置で集光する対物レンズと、該対物レンズが、前記回転ステージとの距離が変更可能なように移動可能に設置されている第1の直動ステージとから成り、かつ、前記レーザー光が焦点位置で集光する位置にはピンホールが設置されていることを特徴とする凹面光学素子の測定装置。
The concave optical element measuring apparatus according to claim 1,
The light source is installed such that a laser device, an objective lens for condensing laser light emitted from the laser device at a focal position, and the objective lens are movable so that a distance from the rotary stage can be changed. A concave optical element measuring apparatus comprising: a first linear motion stage, wherein a pinhole is installed at a position where the laser beam is focused at a focal position.
請求項2に記載の凹面光学素子の測定装置において、
前記光源と前記回転ステージを結んだ直線と所定の角度をなして第2の直動ステージが設置され、該第2の直動ステージには、前記検出器が、前記回転ステージとの距離が変更可能なように移動可能に設置されていることを特徴とする凹面光学素子の測定装置。
The concave optical element measuring apparatus according to claim 2,
A second linear motion stage is installed at a predetermined angle with the straight line connecting the light source and the rotary stage, and the distance between the detector and the rotary stage is changed on the second linear motion stage. A concave optical element measuring device, wherein the measuring device is movably installed as possible.
請求項3に記載の凹面光学素子の測定装置において、
前記検出器が、前記第2の直動ステージと共に円弧状に移動する円弧ステージを備えていることを特徴とする凹面光学素子の測定装置。
In the measuring device of the concave optical element according to claim 3,
The measuring device of a concave optical element, wherein the detector includes an arc stage that moves in an arc shape together with the second linear motion stage.
請求項4に記載の凹面光学素子の測定装置において、
前記検出器を前記円弧ステージに固定すると共に、前記回転ステージ上の前記凹面光学素子を回転させることで、前記凹面光学素子を反射する光のうち前記集光点以外の位置で反射してくる光を前記検出器で検出することを特徴とする凹面光学素子の測定装置。
The concave optical element measuring apparatus according to claim 4,
Light that is reflected at a position other than the condensing point among light reflected by the concave optical element by rotating the concave optical element on the rotary stage while fixing the detector to the arc stage. Is detected by the detector, and the concave optical element measuring apparatus.
凹面回折格子と、該凹面回折格子を回転させる回転ステージと、前記凹面回折格子に光を照射する光源と、該光源と前記回転ステージを結んだ直線と所定の角度をなすと共に、前記回転ステージとの距離が変更可能で、かつ、前記凹面回折格子を回折した回折光以外の光を検出する検出器とを備えている特徴とする凹面回折格子の測定装置。   A concave diffraction grating, a rotary stage that rotates the concave diffraction grating, a light source that irradiates light to the concave diffraction grating, a straight line connecting the light source and the rotary stage, and a predetermined angle. And a detector that detects light other than the diffracted light diffracted by the concave diffraction grating, and a concave diffraction grating measuring device. 請求項6に記載の凹面回折格子の測定装置において、
前記光源は、レーザー装置と、該レーザー装置から照射されたレーザー光を焦点位置で集光する対物レンズと、該対物レンズが、前記回転ステージとの距離が変更可能なように移動可能に設置されている第1の直動ステージとから成り、かつ、前記レーザー光が焦点位置で集光する位置にはピンホールが設置されていることを特徴とする凹面回折格子の測定装置。
In the concave diffraction grating measuring apparatus according to claim 6,
The light source is installed such that a laser device, an objective lens for condensing laser light emitted from the laser device at a focal position, and the objective lens are movable so that a distance from the rotary stage can be changed. A concave diffraction grating measuring apparatus comprising: a first linear motion stage, wherein a pinhole is provided at a position where the laser beam is focused at a focal position.
請求項7に記載の凹面回折格子の測定装置において、
前記光源と前記回転ステージを結んだ直線と所定の角度をなして第2の直動ステージが設置され、該第2の直動ステージには、前記検出器が、前記回転ステージとの距離が変更可能なように移動可能に設置されていることを特徴とする凹面回折格子の測定装置。
In the concave diffraction grating measuring apparatus according to claim 7,
A second linear motion stage is installed at a predetermined angle with the straight line connecting the light source and the rotary stage, and the distance between the detector and the rotary stage is changed on the second linear motion stage. An apparatus for measuring a concave diffraction grating, which is movably installed as possible.
請求項8に記載の凹面回折格子の測定装置において、
前記検出器が、前記第2の直動ステージと共に円弧状に移動する円弧ステージを備えていることを特徴とする凹面回折格子の測定装置。
The concave diffraction grating measuring device according to claim 8,
The measuring apparatus for a concave diffraction grating, wherein the detector includes an arc stage that moves in an arc with the second linear motion stage.
請求項9に記載の凹面回折格子の測定装置において、
前記検出器を前記円弧ステージに固定すると共に、前記回転ステージを回転させて前記回折光を前記検出器に入射し、該検出器で前記回転ステージの回転角度を検出することで、前記凹面回折格子の溝本数を計測することを特徴とする凹面回折格子の測定装置。
In the concave diffraction grating measuring device according to claim 9,
The concave diffraction grating is fixed by fixing the detector to the arc stage, rotating the rotary stage to make the diffracted light incident on the detector, and detecting the rotation angle of the rotary stage with the detector. An apparatus for measuring a concave diffraction grating, characterized in that the number of grooves of the concave diffraction grating is measured.
平面回折格子と、該平面回折格子を回転させる回転ステージと、前記平面回折格子に光を照射する光源と、該光源と前記回転ステージを結んだ直線と所定の角度をなすと共に、前記回転ステージとの距離が変更可能で、かつ、前記平面回折格子を回折した回折光以外の光を検出する検出器とを備え、
前記光源はレーザー装置であり、該レーザー装置と前記回転ステージを結んだ直線と所定の角度をなして第2の直動ステージが設置され、該第2の直動ステージには、前記回転ステージとの距離が変更可能なように前記検出器が移動可能に設置され、更に、前記検出器が前記第2の直動ステージと共に円弧状に移動する円弧ステージを備えていることを特徴とする平面回折格子の測定装置。
A planar diffraction grating, a rotary stage that rotates the planar diffraction grating, a light source that irradiates light to the planar diffraction grating, a straight line connecting the light source and the rotary stage, and a predetermined angle, and the rotary stage; And a detector that detects light other than the diffracted light diffracted by the planar diffraction grating,
The light source is a laser device, and a second linear motion stage is installed at a predetermined angle with a straight line connecting the laser device and the rotary stage, and the second linear motion stage includes the rotary stage and The plane diffraction is characterized in that the detector is movably installed so that the distance can be changed, and the detector further includes an arc stage that moves in an arc with the second linear motion stage. Grating measuring device.
請求項11に記載の平面回折格子の測定装置において、
前記検出器を前記円弧ステージに固定すると共に、前記回転ステージを回転させて前記回折光を前記検出器に入射し、該検出器で前記回転ステージの回転角度を検出することで、前記平面回折格子の溝本数を計測することを特徴とする平面回折格子の測定装置。
The planar diffraction grating measuring device according to claim 11,
The planar diffraction grating is fixed by fixing the detector to the arc stage, rotating the rotary stage to make the diffracted light enter the detector, and detecting the rotation angle of the rotary stage with the detector. An apparatus for measuring a planar diffraction grating, characterized in that the number of grooves in the plane is measured.
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JP7424061B2 (en) 2019-01-31 2024-01-30 株式会社明電舎 Surface spectrometer and optical aberration correction method for surface spectrometer
CN110631509A (en) * 2019-10-10 2019-12-31 南京理工大学 Object surface curvature detection system and method based on grating Talbot image
CN110631509B (en) * 2019-10-10 2021-10-08 南京理工大学 Object surface curvature detection system and method based on grating Talbot image

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