JP2014087733A - Coating device - Google Patents

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JP2014087733A
JP2014087733A JP2012238598A JP2012238598A JP2014087733A JP 2014087733 A JP2014087733 A JP 2014087733A JP 2012238598 A JP2012238598 A JP 2012238598A JP 2012238598 A JP2012238598 A JP 2012238598A JP 2014087733 A JP2014087733 A JP 2014087733A
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coating
seal member
gap
seal
pressing
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JP5828316B2 (en
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Naoki Funagayama
直樹 船ヶ山
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Denso Corp
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Denso Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a coating device capable of surely preventing flowing-out of coating liquid from the coating area to the coating inhibited area of a coated article.SOLUTION: A coating device includes a first seal member 23 and a second seal member 33 partially contacted when they oppose each other via a semiconductor device to annularly cover the front and rear surfaces of the coating area of the semiconductor device, and gap seals 41 elastically deformed according to pressing of the first seal member 23 by a first mold member 20 and pressing of the second seal member 33 by a second mold member 30. Each of the gap seals 41 is disposed to close a gap S formed between a contact part 40 between the first seal member 23 and the second seal member 33 and the outer edge vicinity of each of terminals 54 and 55 of the semiconductor device.

Description

本発明は、被塗布物に塗布液を塗布する塗布装置に関するものである。   The present invention relates to a coating apparatus that applies a coating liquid to an object to be coated.

従来、被塗布物に塗布液を塗布する塗布装置として、下記特許文献1に開示される立体構造物のコーティング装置が知られている。このコーティング装置では、被塗布物である半導体装置を第一型部材と第二型部材とにより上下から挟み込む際に、第一型部材に設けられる上部シール部材と第二型部材に設けられる下部シール部材とが半導体装置の所定領域に押し付けられる。このように半導体装置に押し付けられる両シール部材により塗布領域が封止されることで、第一型部材および第二型部材により構成される収容室内にコーティング剤が供給される場合でも、このコーティング剤が半導体装置の塗布禁止領域に流出することが抑制される。   2. Description of the Related Art Conventionally, a three-dimensional structure coating apparatus disclosed in Patent Document 1 is known as a coating apparatus that applies a coating liquid to an object to be coated. In this coating apparatus, when a semiconductor device as an object to be coated is sandwiched from above and below by a first mold member and a second mold member, an upper seal member provided on the first mold member and a lower seal provided on the second mold member The member is pressed against a predetermined region of the semiconductor device. Even when the coating agent is supplied into the storage chamber constituted by the first die member and the second die member by sealing the application region by the both sealing members pressed against the semiconductor device in this manner, the coating agent is used. Is prevented from flowing into the coating prohibited area of the semiconductor device.

特開2012−152682号公報JP 2012-152682 A

図12は、上下からシール部材101,102が押し付けられた被塗布物100の状態を説明する断面図であり、図12(A)は押し付け前の状態を示し、図12(B)は押し付け後の状態を示す。
ところで、図12(A)に示すように、例えば、薄板状の被塗布物100に対して単に上下からシール部材101,102を押し付ける構成では、図12(B)に示すように、被塗布物100の外縁100aの近傍にて上部シール部材101と下部シール部材102とが直接接触する接触部103と外縁100aとの間に隙間Sが形成されてしまう。このような隙間Sが形成されることでこの隙間Sを介して塗布液が供給される空間(塗布領域を含む空間)と塗布液が供給されない空間(塗布禁止領域を含む空間)とが連通してしまうと、塗布領域に塗布された塗布液が隙間Sを介して塗布禁止領域にまで流出してしまうという問題がある。
FIG. 12 is a cross-sectional view illustrating a state of the article 100 to which the sealing members 101 and 102 are pressed from above and below, FIG. 12 (A) shows a state before pressing, and FIG. 12 (B) is after pressing. Shows the state.
By the way, as shown in FIG. 12A, for example, in a configuration in which the seal members 101 and 102 are simply pressed from above and below against the thin plate-like object 100, as shown in FIG. In the vicinity of the outer edge 100a of 100, a gap S is formed between the outer edge 100a and the contact portion 103 where the upper seal member 101 and the lower seal member 102 are in direct contact. By forming such a gap S, a space (a space including the application area) where the coating liquid is supplied through the gap S communicates with a space (a space including the application prohibited area) where the application liquid is not supplied. As a result, there is a problem that the coating liquid applied to the application region flows out to the application prohibited region through the gap S.

本発明は、上述した課題を解決するためになされたものであり、その目的とするところは、被塗布物における塗布領域から塗布禁止領域への塗布液の流出を確実に防止し得る塗布装置を提供することにある。   The present invention has been made to solve the above-described problems, and an object of the present invention is to provide a coating apparatus that can reliably prevent the coating liquid from flowing from the coating area to the coating prohibited area in the object to be coated. It is to provide.

上記目的を達成するため、特許請求の範囲の請求項1に記載の発明は、被塗布物(50,60)に対して塗布が禁止される塗布禁止領域(50b,60b)を除く塗布領域(50a,60a)に塗布液(W)を塗布する塗布装置(10)であって、前記被塗布物に対して前記塗布禁止領域を除き前記塗布領域の一側および他側をそれぞれ環状に囲うように当該被塗布物を介して対向する際に一部が互いに接触する一側シール部材(23)および他側シール部材(33)と、前記一側シール部材を前記被塗布物に押圧する一側押圧具(20)と、前記他側シール部材を前記被塗布物に押圧する他側押圧具(30)と、前記一側押圧具による前記一側シール部材の押圧および前記他側押圧具による前記他側シール部材の押圧に応じて弾性変形する閉塞部材(41,43)と、前記一側シール部材および前記他側シール部材により囲まれた空間(11a)内に前記塗布液を供給する供給手段(13)と、を備え、前記閉塞部材は、前記弾性変形時に、前記一側シール部材と前記他側シール部材との接触部(40)と前記被塗布物との間に形成される隙間(S)を閉塞するように配置されることを特徴とする。
なお、特許請求の範囲および上記手段の括弧内の符号は、後述する実施形態に記載の具体的手段との対応関係を示すものである。
In order to achieve the above-mentioned object, the invention according to claim 1 of the claims is directed to an application area (except for an application prohibition area (50b, 60b) where application is prohibited to an object (50, 60)). 50a, 60a) a coating apparatus (10) for coating a coating liquid (W) so that one side and the other side of the coating area are annularly surrounded with respect to the object to be coated except for the coating prohibited area. The one-side sealing member (23) and the other-side sealing member (33) that are partially in contact with each other when facing the object to be coated, and one side that presses the one-side sealing member against the object to be coated The pressing tool (20), the other-side pressing tool (30) for pressing the other-side sealing member against the object to be coated, the pressing of the one-side sealing member by the one-side pressing tool, and the above-mentioned by the other-side pressing tool Elastically deforms in response to pressing of the other side seal member A closing member (41, 43), and a supply means (13) for supplying the coating liquid into a space (11a) surrounded by the one-side sealing member and the other-side sealing member, In the elastic deformation, the gap (S) formed between the contact portion (40) between the one-side seal member and the other-side seal member and the object to be coated is closed. Features.
In addition, the code | symbol in the parenthesis of a claim and the said means shows a corresponding relationship with the specific means as described in embodiment mentioned later.

請求項1の発明では、被塗布物の塗布領域の一側および他側をそれぞれ環状に囲うように当該被塗布物を介して対向する際に一部が互いに接触する一側シール部材および他側シール部材と、一側押圧具による一側シール部材の押圧および他側押圧具による他側シール部材の押圧に応じて弾性変形する閉塞部材と、が設けられている。そして、閉塞部材は、上記弾性変形時に、一側シール部材と他側シール部材との接触部と被塗布物との間に形成される隙間を閉塞するように配置される。   According to the first aspect of the present invention, the one-side sealing member and the other side that are in contact with each other when facing each other through the coating object so as to enclose one side and the other side of the coating area of the coating object in an annular shape. A sealing member and a closing member that is elastically deformed in response to the pressing of the one-side sealing member by the one-side pressing tool and the pressing of the other-side sealing member by the other-side pressing tool are provided. The closing member is disposed so as to close a gap formed between the contact portion between the one-side seal member and the other-side seal member and the coating object during the elastic deformation.

これにより、一側押圧具および他側押圧具により一側シール部材および他側シール部材が被塗布物に押圧されるときに、弾性変形した閉塞部材により上述のように形成される隙間が閉塞される。したがって、上記隙間を介して塗布液が塗布禁止領域まで液漏れすることもないので、被塗布物における塗布領域から塗布禁止領域への塗布液の流出を確実に防止することができる。   Thereby, when the one side sealing member and the other side sealing member are pressed against the object to be coated by the one side pressing tool and the other side pressing tool, the gap formed as described above is closed by the elastically deforming closing member. The Therefore, since the coating liquid does not leak to the coating prohibited area through the gap, it is possible to reliably prevent the coating liquid from flowing from the coating area to the coating prohibited area in the coating object.

第1実施形態に係る塗布装置の概略構成を示す説明図である。It is explanatory drawing which shows schematic structure of the coating device which concerns on 1st Embodiment. 図2(A)は、半導体装置の詳細形状を示す上面図であり、図2(B)は、図2(A)に示す2B−2B線相当の切断面による断面図である。2A is a top view illustrating a detailed shape of the semiconductor device, and FIG. 2B is a cross-sectional view taken along a line 2B-2B in FIG. 2A. 半導体装置とシール部材および隙間シールとの位置関係を示す上面図である。It is a top view which shows the positional relationship of a semiconductor device, a sealing member, and a clearance seal. 隙間シールの作用を説明する説明図である。It is explanatory drawing explaining the effect | action of a clearance seal. 塗布処理の流れを示す工程図である。It is process drawing which shows the flow of an application | coating process. 塗布処理における各工程の一部を説明する説明図である。It is explanatory drawing explaining a part of each process in a coating process. 塗布処理における各工程の一部を説明する説明図である。It is explanatory drawing explaining a part of each process in a coating process. 第1実施形態の変形例に係る塗布装置の要部を示す上面図である。It is a top view which shows the principal part of the coating device which concerns on the modification of 1st Embodiment. 第2実施形態に係る塗布装置の要部を示す断面図である。It is sectional drawing which shows the principal part of the coating device which concerns on 2nd Embodiment. 被塗布物の変形例として丸棒材を示す斜視図である。It is a perspective view which shows a round bar as a modification of a to-be-coated object. 塗布装置により塗布液を丸棒材の塗布領域に塗布する工程を説明する説明図である。It is explanatory drawing explaining the process of apply | coating a coating liquid to the application | coating area | region of a round bar with a coating device. 上下からシール部材が押し付けられた被塗布物の状態を説明する断面図である。It is sectional drawing explaining the state of the to-be-coated object with which the sealing member was pressed from the upper and lower sides.

[第1実施形態]
以下、本発明に係る塗布装置を具現化した第1実施形態について、図面を参照して説明する。
図1に示す塗布装置10は、被塗布物が収容される収容タンク11の供給室11aに塗布液Wを供給することで、当該被塗布物に対して塗布が禁止される塗布禁止領域を除く塗布領域に塗布液Wを塗布する装置である。本実施形態では、図2(A)(B)に示すように、半導体チップ51を2枚のヒートシンク52およびヒートシンク53によって挟んで構成される半導体装置50に対して、塗布装置10を用いて塗布液Wとして接着剤液を塗布する場合について説明する。
[First Embodiment]
Hereinafter, a first embodiment in which a coating apparatus according to the present invention is embodied will be described with reference to the drawings.
The coating apparatus 10 shown in FIG. 1 removes a coating prohibited area where coating is prohibited for the coating object by supplying the coating liquid W to the supply chamber 11a of the storage tank 11 in which the coating object is stored. It is an apparatus for applying the coating liquid W to the application area. In the present embodiment, as shown in FIGS. 2A and 2B, coating is performed using a coating apparatus 10 on a semiconductor device 50 configured by sandwiching a semiconductor chip 51 between two heat sinks 52 and a heat sink 53. The case where an adhesive liquid is applied as the liquid W will be described.

図1に示すように、塗布装置10は、主に、収容タンク11と、回転軸部材12と、貯留タンク13と、塗布装置10全体の制御を司る制御部14とを備えている。収容タンク11は、上側に位置する第一型部材20と下側に位置する第二型部材30とを備えており、半導体装置50を挟むように両型部材20,30を上下方向から組み付けることで塗布液Wが供給される供給室11aと塗布液Wの供給が禁止される供給禁止室11bとが形成される。なお、本実施形態では、収容タンク11は、ステンレス鋼やアルミニウム等の金属材料により形成されているが、これに限らず、例えば、樹脂材料などの他の材料で形成されてもよい。また、第一型部材20および第二型部材30は、特許請求の範囲に記載の「一側押圧具」および「他側押圧具」の一例に相当し得る。   As shown in FIG. 1, the coating apparatus 10 mainly includes a storage tank 11, a rotating shaft member 12, a storage tank 13, and a control unit 14 that controls the entire coating apparatus 10. The storage tank 11 includes a first mold member 20 positioned on the upper side and a second mold member 30 positioned on the lower side, and both mold members 20 and 30 are assembled from above and below so as to sandwich the semiconductor device 50 therebetween. Thus, a supply chamber 11a to which the coating liquid W is supplied and a supply prohibition chamber 11b in which the supply of the coating liquid W is prohibited are formed. In the present embodiment, the storage tank 11 is formed of a metal material such as stainless steel or aluminum, but is not limited thereto, and may be formed of other materials such as a resin material. Moreover, the 1st type | mold member 20 and the 2nd type | mold member 30 can correspond to an example of the "one side pressing tool" and the "other side pressing tool" as described in a claim.

第一型部材20には当該第一型部材20を第二型部材30に向けて押圧する第一押圧手段(図示略)が設けられており、第二型部材30には当該第二型部材30を第一型部材20に向けて押圧する第二押圧手段(図示略)が設けられている。そして、収容タンク11に塗布液Wが供給される場合には、これら第一押圧手段および第二押圧手段による押圧により、第一型部材20および第二型部材30が互いに上下方向に押し付けられる。   The first mold member 20 is provided with first pressing means (not shown) for pressing the first mold member 20 toward the second mold member 30, and the second mold member 30 includes the second mold member. Second pressing means (not shown) for pressing 30 toward the first mold member 20 is provided. And when the coating liquid W is supplied to the storage tank 11, the 1st type | mold member 20 and the 2nd type | mold member 30 are mutually pressed up and down by the press by these 1st press means and a 2nd press means.

第一型部材20の下面には、その中央に第一供給用凹部21が形成されるとともに、第一供給用凹部21の周囲に深さの浅い第一封止用凹部22が形成されている。また、第一供給用凹部21と第一封止用凹部22との境界となる環状境界面には、供給室11aから供給禁止室11bへの塗布液Wの流出を抑制するために、第一シール部材23が第一供給用凹部21を環状に囲うように配置されている。第一シール部材23は、その一部が上記環状境界面に埋め込まれており、当該環状境界面から下方向への突出高さが押圧状態の第一型部材20と第二型部材30との境界面に到達するように形成されている。なお、第一シール部材23は、特許請求の範囲に記載の「一側シール部材」の一例に相当し、例えば、シリコン材料等の弾性変形可能なシール部材により形成されている。   A first supply recess 21 is formed at the center of the lower surface of the first mold member 20, and a shallow first sealing recess 22 is formed around the first supply recess 21. . Moreover, in order to suppress the outflow of the coating liquid W from the supply chamber 11a to the supply inhibition chamber 11b, an annular boundary surface serving as a boundary between the first supply recess 21 and the first sealing recess 22 The seal member 23 is disposed so as to surround the first supply recess 21 in an annular shape. A part of the first seal member 23 is embedded in the annular boundary surface, and the first mold member 20 and the second mold member 30 that are pressed downward from the annular boundary surface are pressed. It is formed so as to reach the boundary surface. The first seal member 23 corresponds to an example of a “one-side seal member” recited in the claims, and is formed of an elastically deformable seal member such as a silicon material.

また、第一供給用凹部21の中央には、空気孔24が上壁面に連通するように形成されており、この空気孔24を上下方向に挿通するように、塗布液Wの供給量を検知する液面センサ25が設けられている。この液面センサ25は、第一供給用凹部21の内側に配置されるフロート25aの位置に応じて、供給室11a内部に供給された塗布液Wの供給量に応じた検知信号を出力するように構成されている。なお、液面センサ25に代えて、例えば、光学式変位計や周知の水位計など任意の方式により、塗布液Wの供給量を検知する供給量検知手段を採用してもよい。   In addition, an air hole 24 is formed in the center of the first supply recess 21 so as to communicate with the upper wall surface, and the supply amount of the coating liquid W is detected so that the air hole 24 is inserted vertically. A liquid level sensor 25 is provided. The liquid level sensor 25 outputs a detection signal corresponding to the supply amount of the coating liquid W supplied into the supply chamber 11a according to the position of the float 25a arranged inside the first supply recess 21. It is configured. Instead of the liquid level sensor 25, for example, supply amount detection means for detecting the supply amount of the coating liquid W may be employed by an arbitrary method such as an optical displacement meter or a well-known water level meter.

液面センサ25は、第一型部材20の上方に設けられて空気孔24に内室26aにて連通するセンサ保持部26により保持されている。また、内室26aに連通する配管部材27には、当該内室26aを閉塞状態と大気開放状態とのいずれかに切り替えるための切替バルブ27aが設けられている。なお、センサ保持部26は、収容タンク11とともに回転しないように、空気孔24の中心軸を回転中心として収容タンク11に対して相対回転可能に連結されている。   The liquid level sensor 25 is held by a sensor holding unit 26 that is provided above the first mold member 20 and communicates with the air hole 24 through the inner chamber 26a. The piping member 27 communicating with the inner chamber 26a is provided with a switching valve 27a for switching the inner chamber 26a between the closed state and the open air state. The sensor holding unit 26 is connected to the storage tank 11 so as to be rotatable relative to the central axis of the air hole 24 so as not to rotate with the storage tank 11.

第二型部材30の上面には、その中央に第二供給用凹部31が形成されるとともに、第二供給用凹部31の周囲に深さの浅い第二封止用凹部32が形成されている。また、第二供給用凹部31と第二封止用凹部32との境界となる環状境界面には、供給室11aから供給禁止室11bへの塗布液Wの流出を抑制するために、第二シール部材33が第二供給用凹部31を環状に囲うように配置されている。第二シール部材33は、その環状の上面にて、被塗布物を介して第一シール部材23の環状の下面に環状に対向するように形成されている。また、第二シール部材33は、その一部が上記環状境界面に埋め込まれており、当該環状境界面から上方向への突出高さが押圧状態の第一型部材20と第二型部材30との境界面に到達するように形成されている。なお、第二シール部材33は、特許請求の範囲に記載の「他側シール部材」の一例に相当し、例えば、シリコン材料等の弾性変形可能なシール部材により形成されている。   A second supply recess 31 is formed at the center of the upper surface of the second mold member 30, and a shallow second recess 32 is formed around the second supply recess 31. . Moreover, in order to suppress the outflow of the coating liquid W from the supply chamber 11a to the supply prohibition chamber 11b, an annular boundary surface serving as a boundary between the second supply recess 31 and the second sealing recess 32 is provided. The seal member 33 is disposed so as to surround the second supply recess 31 in an annular shape. The 2nd seal member 33 is formed in the cyclic | annular upper surface so that the cyclic | annular lower surface of the 1st seal member 23 may be cyclically opposed via a to-be-coated material. In addition, the second seal member 33 is partially embedded in the annular boundary surface, and the first mold member 20 and the second mold member 30 whose upward projecting heights from the annular boundary surface are pressed. It is formed to reach the boundary surface. The second seal member 33 corresponds to an example of the “other-side seal member” recited in the claims, and is formed of, for example, an elastically deformable seal member such as a silicon material.

これにより、上記両押圧手段により第一型部材20および第二型部材30が押し付けられて第一シール部材23および第二シール部材33の被塗布物に接触しない部位が互いに接触すると、第一供給用凹部21および第二供給用凹部31と両シール部材23,33とにより供給室11aが形成され、第一封止用凹部22および第二封止用凹部32と両シール部材23,33とにより供給禁止室11bが形成される。   Accordingly, when the first mold member 20 and the second mold member 30 are pressed by the both pressing means and the portions of the first seal member 23 and the second seal member 33 that are not in contact with the application object contact each other, the first supply The recess 21 for supply and the second recess 31 for supply and the seal members 23, 33 form a supply chamber 11 a, and the first seal recess 22, the second seal recess 32, and both the seal members 23, 33 A supply prohibition chamber 11b is formed.

第二供給用凹部31の中央には、給排穴34が下壁面に連通するように形成されており、この給排穴34に回転軸配管12aにて連通するように回転軸部材12が第二型部材30の下壁面に設けられている。回転軸部材12は、図示しないモータなどの駆動手段から供給される駆動力により回転するように構成されており、その回転中心と給排穴34の中心軸とが一致するように配置されている。これにより、収容タンク11は、回転軸部材12とともに回転可能に構成される。なお、回転軸部材12およびモータは、特許請求の範囲に記載の「回転手段」の一例に相当し得る。   A supply / discharge hole 34 is formed at the center of the second supply recess 31 so as to communicate with the lower wall surface. The rotary shaft member 12 is connected to the supply / discharge hole 34 via the rotary shaft pipe 12a. It is provided on the lower wall surface of the mold member 30. The rotating shaft member 12 is configured to rotate by a driving force supplied from driving means such as a motor (not shown), and is arranged so that the rotation center thereof coincides with the central axis of the supply / discharge hole 34. . Thereby, the storage tank 11 is configured to be rotatable together with the rotary shaft member 12. The rotating shaft member 12 and the motor may correspond to an example of “rotating means” described in the claims.

回転軸部材12の下方には、回転軸配管12aに連通する中継タンク15が配置されている。回転軸配管12aは、当該回転軸配管12aに固定されるパッキン(図示略)と中継タンク15に固定されるパッキン(図示略)とを挟んで中継タンク15に連通されている。これら両パッキンは、互いに液密且つ摺動可能に設けられているため、収容タンク11は、中継タンク15に対して相対的に回転可能となる。また、中継タンク15に連通する配管部材16には、中継タンク15を閉塞状態と吸引機(図示略)による吸引状態とのいずれかに切り替えるための切替バルブ16aが設けられている。   A relay tank 15 communicating with the rotary shaft pipe 12a is disposed below the rotary shaft member 12. The rotary shaft pipe 12a communicates with the relay tank 15 with a packing (not shown) fixed to the rotary shaft pipe 12a and a packing (not shown) fixed to the relay tank 15 interposed therebetween. Since these two packings are provided so as to be liquid-tight and slidable with respect to each other, the storage tank 11 can rotate relative to the relay tank 15. The piping member 16 communicating with the relay tank 15 is provided with a switching valve 16a for switching the relay tank 15 between a closed state and a suction state by a suction machine (not shown).

中継タンク15の下壁には、貯留タンク13と連通するための配管部材17が配管されており、この配管部材17には、貯留タンク13内に貯留された塗布液Wを供給室11a内に供給するためのポンプ18が設けられている。このポンプ18を駆動することで、貯留タンク13内の塗布液Wが配管部材17および中継タンク15等を介して供給室11a内に供給される。また、貯留タンク13の上壁に設けられる配管部材19には、貯留タンク13を閉塞状態と大気開放状態とのいずれかに切り替えるための切替バルブ19aが設けられている。なお、貯留タンク13およびポンプ18は、特許請求の範囲に記載の「供給手段」の一例に相当し得る。   A piping member 17 for communicating with the storage tank 13 is piped on the lower wall of the relay tank 15, and the coating liquid W stored in the storage tank 13 is supplied into the supply chamber 11 a in the piping member 17. A pump 18 for supply is provided. By driving the pump 18, the coating liquid W in the storage tank 13 is supplied into the supply chamber 11 a through the piping member 17 and the relay tank 15. The piping member 19 provided on the upper wall of the storage tank 13 is provided with a switching valve 19a for switching the storage tank 13 between the closed state and the atmospheric release state. In addition, the storage tank 13 and the pump 18 may correspond to an example of a “supply unit” described in the claims.

制御部14は、CPU、ROMおよびRAMなどを有するマイクロコンピュータにより構成されており、液面センサ25,モータ,ポンプ18や各切替バルブ16a,19a,27a等に電気的に接続されている。制御部14は、ROMなどに記憶されている所定のコンピュータプログラムを実行することで、液面センサ25からの検知信号等に基づいて供給室11aに対して塗布液Wを供給または排出する塗布処理を実施するために、ポンプ18およびモータや各切替バルブ16a,19a,27a等を駆動制御する。   The control unit 14 includes a microcomputer having a CPU, a ROM, a RAM, and the like, and is electrically connected to the liquid level sensor 25, the motor, the pump 18, the switching valves 16a, 19a, 27a, and the like. The control unit 14 executes a predetermined computer program stored in a ROM or the like, thereby supplying or discharging the coating liquid W to or from the supply chamber 11a based on a detection signal from the liquid level sensor 25 or the like. In order to implement the above, the pump 18 and the motor, the switching valves 16a, 19a, 27a and the like are driven and controlled.

次に、本実施形態の特徴的構成について、図2〜図4を用いて説明する。図3は、半導体装置50とシール部材23,33および隙間シール41との位置関係を示す上面図である。図4は、隙間シール41の作用を説明する説明図であり、図4(A)は弾性変形前を示し、図4(B)は弾性変形後を示す。   Next, a characteristic configuration of the present embodiment will be described with reference to FIGS. FIG. 3 is a top view showing the positional relationship between the semiconductor device 50, the seal members 23 and 33, and the gap seal 41. 4A and 4B are explanatory diagrams for explaining the operation of the gap seal 41. FIG. 4A shows the state before elastic deformation, and FIG. 4B shows the state after elastic deformation.

図2(A)(B)に示すように、半導体装置50は、ヒートシンク52に形成される薄板状の端子54の先端側の表裏面54aとヒートシンク53に形成される薄板状の端子55,56の表裏面55a,56aとを含めた領域が塗布禁止領域50bであり、この塗布禁止領域50bを除く塗布領域50aに塗布液Wが塗布される。このため、第一シール部材23および第二シール部材33は、図3に示すように、供給室11aの形成時には、表裏面54a,55a,56aとの内側を環状に囲むように、半導体装置50の表面側および裏面側にそれぞれ接触する。   As shown in FIGS. 2A and 2B, the semiconductor device 50 includes thin plate-like terminals 55 and 56 formed on the front and rear surfaces 54 a of the thin plate-like terminals 54 formed on the heat sink 52 and the heat sink 53. The area including the front and back surfaces 55a and 56a is the application prohibited area 50b, and the coating liquid W is applied to the application area 50a excluding the application prohibited area 50b. For this reason, as shown in FIG. 3, the first seal member 23 and the second seal member 33 are configured so as to surround the front and back surfaces 54a, 55a, and 56a in a ring shape when the supply chamber 11a is formed. In contact with the front surface side and back surface side, respectively.

このとき、例えば、端子54については、薄板状に形成されることもあり、端子54の外縁54bの近傍にて第一シール部材23と第二シール部材33とが直接接触する接触部40と、外縁54bとの間に隙間Sが形成されてしまう。端子55や端子56についても同様である。   At this time, for example, the terminal 54 may be formed in a thin plate shape, and the contact portion 40 in which the first seal member 23 and the second seal member 33 are in direct contact in the vicinity of the outer edge 54b of the terminal 54; A gap S is formed between the outer edge 54b and the outer edge 54b. The same applies to the terminal 55 and the terminal 56.

そこで、本実施形態では、押圧状態の第一型部材20および第二型部材30からの押圧力に応じてこの押圧方向に対して直交する方向(水平方向)に太るように弾性変形する隙間シール41を、隙間Sが形成されうる各端子54〜56の外縁54b〜56b近傍にそれぞれ配置する。なお、隙間シール41は、特許請求の記載の「閉塞部材」の一例に相当し得る。   Therefore, in the present embodiment, a gap seal that is elastically deformed so as to be thickened in a direction (horizontal direction) perpendicular to the pressing direction in accordance with the pressing force from the pressed first mold member 20 and second mold member 30. 41 is arranged in the vicinity of the outer edges 54b to 56b of the terminals 54 to 56 where the gap S can be formed. The gap seal 41 can correspond to an example of a “closing member” recited in the claims.

図3および図4(A)に示すように、隙間シール41は、弾性変形前では四角柱状であって、その上下方向の長さが、押圧状態の第一型部材20および第二型部材30により上下から押しつぶされる程度に形成されている。このように形成される隙間シール41は、隙間Sを確実に閉塞するため、その角部が端子54〜56の外縁54b〜56bと両シール部材23,33の外側の面とにより形成される隅部に近接するように、その下端部が第二型部材30の第二封止用凹部32の底面に固定されている。なお、隙間シール41は、その角部が端子54〜56の外縁54b〜56bと両シール部材23,33の外側の面とにより形成される隅部に近接するように、その上端部が第一型部材20の第一封止用凹部22の底面に固定されてもよい。   As shown in FIGS. 3 and 4A, the gap seal 41 has a quadrangular prism shape before elastic deformation, and the length in the vertical direction is the pressed first mold member 20 and second mold member 30. Is formed so as to be crushed from above and below. Since the gap seal 41 formed in this way reliably closes the gap S, the corners of the gap seal 41 are formed by the outer edges 54b to 56b of the terminals 54 to 56 and the outer surfaces of the seal members 23 and 33. The lower end portion is fixed to the bottom surface of the second sealing recess 32 of the second mold member 30 so as to be close to the portion. The upper end of the gap seal 41 is first so that the corner of the gap seal 41 is close to the corner formed by the outer edges 54b to 56b of the terminals 54 to 56 and the outer surfaces of the seal members 23 and 33. The mold member 20 may be fixed to the bottom surface of the first sealing recess 22.

これにより、図4(A)に示すように、第二シール部材33の上面に各端子54〜56の裏面にて接触するように載置された半導体装置50に対して、第一シール部材23にて押圧するように第一型部材20と第二型部材30とが押し付けられると、図4(B)に示すように、各隙間シール41が太るように弾性変形して隙間Sが閉塞される。   As a result, as shown in FIG. 4A, the first seal member 23 is placed on the semiconductor device 50 placed on the upper surface of the second seal member 33 so as to be in contact with the back surfaces of the terminals 54 to 56. When the first mold member 20 and the second mold member 30 are pressed so as to be pressed with each other, as shown in FIG. 4B, the gap seals 41 are elastically deformed so as to be thick, and the gaps S are closed. The

次に、本実施形態に係る塗布装置10を用いて半導体装置50の塗布領域50aに塗布液Wを塗布する塗布処理について、図5〜図7を用いて説明する。図5は、塗布処理の流れを示す工程図である。図6(A),(B)および図7(A)〜(C)は、塗布処理における各工程を説明する説明図である。なお、図6および図7では、塗布液Wに対してクロスハッチングを付して図示している。   Next, the application | coating process which apply | coats the coating liquid W to the application | coating area | region 50a of the semiconductor device 50 using the coating device 10 which concerns on this embodiment is demonstrated using FIGS. FIG. 5 is a process diagram showing the flow of the coating process. FIGS. 6A and 6B and FIGS. 7A to 7C are explanatory diagrams for explaining each step in the coating process. 6 and 7, the coating liquid W is illustrated with cross hatching.

制御部14により塗布処理が開始されると、まず、図5のステップS1に示す収容工程がなされる。この工程では、半導体装置50が、各端子54〜56の裏面にて第二シール部材33の上面に接触するように第二型部材30上の所定の位置に載置される。この状態で、制御部14により制御されて、第二型部材30に第一型部材20が降下して組み付けられた状態で上記両押圧手段により上下方向から押圧されることで、図6(A)に示すように、半導体装置50の塗布領域50aが供給室11aに収容され、塗布禁止領域50bが供給禁止室11bに収容される。このとき、上記押圧力に応じて各隙間シール41が太るように弾性変形することで隙間Sが閉塞される(図4(B)参照)。   When the application process is started by the control unit 14, first, an accommodating process shown in step S1 of FIG. 5 is performed. In this step, the semiconductor device 50 is placed at a predetermined position on the second mold member 30 so as to come into contact with the upper surface of the second seal member 33 on the back surfaces of the terminals 54 to 56. In this state, it is controlled by the control unit 14 so that the first mold member 20 is lowered and assembled to the second mold member 30 and is pressed from above and below by the both pressing means, so that FIG. ), The application region 50a of the semiconductor device 50 is accommodated in the supply chamber 11a, and the application inhibition region 50b is accommodated in the supply inhibition chamber 11b. At this time, the gap S is closed by elastically deforming the gap seals 41 so as to be thick according to the pressing force (see FIG. 4B).

次に、ステップS2に示す供給工程がなされる。この工程では、制御部14からの制御信号に応じて切替バルブ19a,27aが大気開放状態に切り替えられるとともに切替バルブ16aが閉塞状態に切り替えられた後にポンプ18が作動することで、貯留タンク13内の塗布液Wが配管部材17および中継タンク15等を介して供給室11a内に供給される。   Next, the supply process shown in step S2 is performed. In this step, the switching valves 19a and 27a are switched to the atmospheric release state in accordance with a control signal from the control unit 14, and the pump 18 is operated after the switching valve 16a is switched to the closed state. The coating liquid W is supplied into the supply chamber 11a through the piping member 17, the relay tank 15, and the like.

図6(B)に示すように、塗布液Wがフロート25aに到達するまで供給されると、液面センサ25により規定量の塗布液Wの供給が検知されて、制御部14により制御されてポンプ18による塗布液Wの供給が停止する。このように、供給室11a内に塗布液Wが供給(充填)されることで、半導体装置50の塗布領域50aに塗布液Wが塗布されることとなる。このとき、押圧状態の第一型部材20および第二型部材30により各隙間シール41が太るように弾性変形することで各端子54〜56近傍の隙間Sが閉塞されているので、供給室11a内に供給された塗布液Wが隙間Sを通過して供給禁止室11bに漏れ出すこともない。   As shown in FIG. 6B, when the coating liquid W is supplied until it reaches the float 25a, the supply of the specified amount of the coating liquid W is detected by the liquid level sensor 25 and controlled by the control unit 14. The supply of the coating liquid W by the pump 18 is stopped. Thus, the coating liquid W is applied to the coating region 50a of the semiconductor device 50 by supplying (filling) the coating liquid W into the supply chamber 11a. At this time, the gap S in the vicinity of each of the terminals 54 to 56 is closed by elastically deforming the gap seals 41 so that the gap seals 41 are thickened by the pressed first mold member 20 and the second mold member 30, so that the supply chamber 11a The coating liquid W supplied inside does not leak through the gap S and into the supply inhibition chamber 11b.

上述のように規定量の塗布液Wが供給されると、ステップS3に示す排出工程がなされる。この工程では、制御部14からの制御信号に応じて切替バルブ19a,27aが開放状態に切り替えられることで、塗布液Wが自重で流下し貯留タンク13まで排出される。なお、切替バルブ19a,27aを開放状態とする理由は、塗布液Wが流下して貯留タンク13まで排出される際に空気を積極的に逃がすことで、塗布液Wが貯留タンク13に排出される速度を向上させるためである。また、更に排出工程の工程時間を短縮させるために、切替バルブ16aが吸引状態に切り替えられた後に、吸引機を作動させることもできる。これにより、図7(A)に示すように、供給室11a内の塗布液Wが配管部材17および中継タンク15等を介して貯留タンク13に排出される。なお、単に塗布液Wが下方に排出されただけでは、半導体装置50の塗布領域50aには、余分な塗布液Wまでもが付着している。   When the prescribed amount of coating liquid W is supplied as described above, the discharging process shown in step S3 is performed. In this step, the switching valves 19 a and 27 a are switched to the open state in accordance with a control signal from the control unit 14, whereby the coating liquid W flows down by its own weight and is discharged to the storage tank 13. The reason why the switching valves 19a and 27a are opened is that the coating liquid W is discharged to the storage tank 13 by positively releasing air when the coating liquid W flows down and is discharged to the storage tank 13. This is to improve the speed. Further, in order to further shorten the process time of the discharge process, the suction machine can be operated after the switching valve 16a is switched to the suction state. Thereby, as shown in FIG. 7A, the coating liquid W in the supply chamber 11a is discharged to the storage tank 13 through the piping member 17, the relay tank 15, and the like. Note that even if the coating liquid W is simply discharged downward, even the excessive coating liquid W adheres to the coating region 50 a of the semiconductor device 50.

吸引機による供給室11a内の塗布液Wの排出がなされると、ステップS4に示す液切り工程がなされる。この工程では、図7(B)に示すように、制御部14からの制御信号に応じてモータが駆動することで、収容タンク11が回転軸部材12とともに回転する。これにより、供給室11a内の半導体装置50も回転して、塗布領域50aの余分な塗布液Wが外側へ吹き飛ばされる。このとき、弾性変形した各隙間シール41により各端子54〜56近傍の隙間Sが閉塞された状態が維持されているので、塗布領域50aの余分な塗布液Wが外側へ吹き飛ばされて第一シール部材23や第二シール部材33に吹き付けられる場合でも、供給室11a内に供給された塗布液Wが隙間Sを通過して供給禁止室11bに漏れ出すこともない。   When the coating liquid W in the supply chamber 11a is discharged by the suction machine, the liquid draining process shown in step S4 is performed. In this step, as shown in FIG. 7B, the storage tank 11 rotates together with the rotating shaft member 12 by driving the motor in accordance with a control signal from the control unit 14. As a result, the semiconductor device 50 in the supply chamber 11a also rotates, and excess coating liquid W in the coating region 50a is blown out. At this time, since the gap S in the vicinity of each of the terminals 54 to 56 is maintained closed by the elastically deformed gap seals 41, the excess coating liquid W in the coating region 50a is blown outward and the first seal is sealed. Even when sprayed to the member 23 or the second seal member 33, the coating liquid W supplied into the supply chamber 11a does not leak through the gap S and into the supply prohibition chamber 11b.

収容タンク11の回転により塗布領域50aの余分な塗布液Wが排除されると、ステップS5に示す取出工程がなされる。この工程では、第一型部材20が上昇することで、図7(C)に示すように、塗布液Wの塗布が完了した半導体装置50が取り出し可能な状態になる。これにより、本塗布装置10による塗布処理が完了し、塗布液Wが塗布された半導体装置50が次工程用の装置に搬送される。   When the excess coating liquid W in the coating region 50a is removed by the rotation of the storage tank 11, the extraction process shown in step S5 is performed. In this step, as the first mold member 20 is raised, as shown in FIG. 7C, the semiconductor device 50 in which the application of the coating liquid W has been completed can be taken out. As a result, the coating process by the coating apparatus 10 is completed, and the semiconductor device 50 coated with the coating liquid W is transported to the apparatus for the next process.

以上説明したように、本実施形態に係る塗布装置10では、半導体装置50の塗布領域50aの表面側および裏面側をそれぞれ環状に囲うように当該半導体装置50を介して対向する際に一部が互いに接触する第一シール部材23および第二シール部材33と、第一型部材20による第一シール部材23の押圧および第二型部材30による第二シール部材33の押圧に応じて弾性変形する隙間シール41と、が設けられている。そして、隙間シール41は、上記弾性変形時に、第一シール部材23と第二シール部材33との接触部40と半導体装置50の各端子54〜56の外縁54b〜56b近傍との間に形成される隙間Sを閉塞するように配置される。   As described above, in the coating apparatus 10 according to the present embodiment, a part of the coating apparatus 50 is opposed to each other through the semiconductor device 50 so as to surround the front surface side and the back surface side of the coating region 50a of the semiconductor device 50 in an annular shape. The first seal member 23 and the second seal member 33 that are in contact with each other, and the gap that is elastically deformed in response to the pressing of the first seal member 23 by the first mold member 20 and the press of the second seal member 33 by the second mold member 30 A seal 41 is provided. The gap seal 41 is formed between the contact portion 40 between the first seal member 23 and the second seal member 33 and the vicinity of the outer edges 54b to 56b of the terminals 54 to 56 of the semiconductor device 50 during the elastic deformation. It arrange | positions so that the clearance gap S may be obstruct | occluded.

これにより、第一型部材20および第二型部材30により第一シール部材23および第二シール部材33が半導体装置50の各端子54〜56に押圧されるときに、弾性変形した隙間シール41により上述のように形成される隙間Sが閉塞される。したがって、上記隙間Sを介して塗布液Wが塗布禁止領域50bまで液漏れすることもないので、半導体装置50における塗布領域50aから塗布禁止領域50bへの塗布液Wの流出を確実に防止することができる。   Accordingly, when the first seal member 23 and the second seal member 33 are pressed against the terminals 54 to 56 of the semiconductor device 50 by the first mold member 20 and the second mold member 30, the elastically deformed gap seal 41 is used. The gap S formed as described above is closed. Therefore, since the coating liquid W does not leak to the coating prohibited area 50b through the gap S, the outflow of the coating liquid W from the coating area 50a to the coating prohibited area 50b in the semiconductor device 50 is surely prevented. Can do.

特に、本実施形態では、塗布領域50aに塗布された余分な塗布液Wの少なくとも一部を第一シール部材23および第二シール部材33に向けて外側に吹き飛ばすように、半導体装置50を第一シール部材23および第二シール部材33とともに回転させる回転軸部材12が設けられている。   In particular, in the present embodiment, the first semiconductor device 50 is blown out toward the first seal member 23 and the second seal member 33 so that at least a part of the excess coating liquid W applied to the application region 50a is blown outward. A rotating shaft member 12 that rotates together with the seal member 23 and the second seal member 33 is provided.

このように、回転軸部材12の回転に応じて半導体装置50が回転することで塗布領域50aの余分な塗布液Wが外側へ吹き飛ばされて第一シール部材23や第二シール部材33に吹き付けられる場合でも、弾性変形した各隙間シール41により各端子54〜56近傍の隙間Sが閉塞された状態が維持されているので、半導体装置50における塗布領域50aから塗布禁止領域50bへの塗布液Wの流出を確実に防止することができる。   As described above, when the semiconductor device 50 is rotated in accordance with the rotation of the rotating shaft member 12, the excess coating liquid W in the coating region 50 a is blown out and sprayed to the first seal member 23 and the second seal member 33. Even in this case, since the gap S in the vicinity of each of the terminals 54 to 56 is maintained closed by the elastically deformed gap seals 41, the application liquid W from the application area 50a to the application inhibition area 50b in the semiconductor device 50 is maintained. The outflow can be reliably prevented.

図8は、第1実施形態の変形例に係る塗布装置10の要部を示す上面図である。
図8に示すように、隙間シール41は、第一シール部材23や第二シール部材33のいずれか一方と連結部42を介して一体に形成されてもよい。これにより、隙間シール41と連結されたシール部材とが位置ずれすることもなく、隙間シール41と接触部40との位置ずれが抑制されるので、隙間Sの閉塞をより確実に実施することができる。
FIG. 8 is a top view showing a main part of the coating apparatus 10 according to a modification of the first embodiment.
As shown in FIG. 8, the gap seal 41 may be integrally formed with either one of the first seal member 23 and the second seal member 33 via a connecting portion 42. Accordingly, the gap seal 41 and the seal member connected to the seal member are not displaced, and the gap seal 41 and the contact portion 40 are prevented from being displaced, so that the gap S can be more reliably closed. it can.

[第2実施形態]
次に、本発明の第2実施形態に係る塗布装置について図9を参照して説明する。図9は、第2実施形態に係る塗布装置10の要部を示す断面図であり、図9(A)は弾性変形前を示し、図9(B)は弾性変形後を示す。
本第2実施形態に係る塗布装置10は、より確実に隙間Sを閉塞するため、上述した隙間シール41に代えて隙間シール43を採用する点が、上記第1実施形態に係る半導体装置と異なる。したがって、第1実施形態の半導体装置と実質的に同一の構成部分には、同一符号を付し、その説明を省略する。
[Second Embodiment]
Next, a coating apparatus according to a second embodiment of the present invention will be described with reference to FIG. FIG. 9 is a cross-sectional view illustrating a main part of the coating apparatus 10 according to the second embodiment, in which FIG. 9A shows before elastic deformation, and FIG. 9B shows after elastic deformation.
The coating apparatus 10 according to the second embodiment differs from the semiconductor device according to the first embodiment in that a gap seal 43 is used instead of the gap seal 41 described above in order to more reliably close the gap S. . Therefore, substantially the same components as those of the semiconductor device of the first embodiment are denoted by the same reference numerals, and description thereof is omitted.

図9(A)に示すように、隙間シール43は、押圧方向(上下方向)の中間部位43aが隙間Sに近づくように撓んで形成されている。これにより、第二シール部材33の上面に載置された半導体装置50に対して、第一シール部材23にて押圧するように第一型部材20と第二型部材30とが押し付けられると、図9(B)に示すように、隙間シール43の中間部位43aが隙間Sに向けて撓むように弾性変形して隙間Sが閉塞される。   As shown in FIG. 9A, the gap seal 43 is formed to bend so that the intermediate portion 43a in the pressing direction (vertical direction) approaches the gap S. Thereby, when the first mold member 20 and the second mold member 30 are pressed against the semiconductor device 50 placed on the upper surface of the second seal member 33 so as to be pressed by the first seal member 23, As shown in FIG. 9B, the gap S is closed by elastic deformation so that the intermediate portion 43a of the gap seal 43 is bent toward the gap S.

特に、中間部位43aが隙間Sに近づくように予め撓んで形成されているため、僅かな上下方向の変位でも中間部位43aが隙間Sに向けて大きく変位するので、被塗布物やシール部材23,33だけでなく隙間シール43自体の形状がある程度ばらつく場合であっても、隙間Sを確実に閉塞することができる。   In particular, since the intermediate portion 43a is bent in advance so as to approach the gap S, the intermediate portion 43a is greatly displaced toward the gap S even with a slight vertical displacement. Even when the shape of the gap seal 43 itself varies to some extent as well as 33, the gap S can be reliably closed.

なお、隙間シール43は、上述した隙間シール41と同様に、第一シール部材23や第二シール部材33のいずれか一方と連結部を介して一体に形成されてもよい(図8参照)。これにより、隙間シール43と連結されたシール部材とが位置ずれすることもなく、隙間シール43と接触部40との位置ずれが抑制されるので、隙間Sの閉塞をより確実に実施することができる。   Note that the gap seal 43 may be formed integrally with either the first seal member 23 or the second seal member 33 via a connecting portion, similarly to the gap seal 41 described above (see FIG. 8). Accordingly, the gap seal 43 and the seal member connected to the seal member are not displaced, and the gap between the gap seal 43 and the contact portion 40 is suppressed, so that the gap S can be more reliably closed. it can.

なお、本発明は上記各実施形態および変形例に限定されるものではなく、例えば、以下のように具体化してもよい。
(1)図10は、被塗布物の変形例として丸棒材60を示す斜視図である。図11は、塗布装置10により塗布液Wを丸棒材60の塗布領域60aに塗布する工程を説明する説明図であり、図11(A)は供給室11a形成前の状態を示し、図11(B)は供給室11a形成後を示し、図11(C)は弾性変形した隙間シール41を拡大して示す。
塗布装置10では、半導体装置50を被塗布物としてその塗布領域50aに塗布液Wを塗布することに限らず、半導体装置50と異なる他の被塗布物の塗布領域に塗布液Wを塗布してもよい。
In addition, this invention is not limited to said each embodiment and modification, For example, you may actualize as follows.
(1) FIG. 10 is a perspective view showing a round bar 60 as a modification of the object to be coated. FIG. 11 is an explanatory view for explaining a process of applying the coating liquid W to the coating region 60a of the round bar 60 by the coating apparatus 10, and FIG. 11 (A) shows a state before the supply chamber 11a is formed. (B) shows after the supply chamber 11a is formed, and FIG. 11 (C) shows the gap seal 41 that is elastically deformed in an enlarged manner.
In the coating apparatus 10, the semiconductor device 50 is used as an object to be applied, and the application liquid W is not applied to the application area 50 a, but the application liquid W is applied to an application area of another object to be applied different from the semiconductor device 50. Also good.

具体的には、他の被塗布物として、図10に示すような丸棒状の部材(以下、丸棒材60という)を採用することができる。この丸棒材60は、両端が塗布禁止領域60bであり中央部が塗布領域60aである。このように形成される丸棒材60の塗布領域60aに塗布液Wを塗布する場合には、図11(A)に示すように、両端の塗布禁止領域60bがともに第二シール部材33よりも外側に位置して両隙間シール41により挟持されるように、丸棒材60を第二シール部材33上に配置する。   Specifically, a round bar-like member (hereinafter, referred to as a round bar member 60) as shown in FIG. 10 can be employed as another object to be coated. The round bar 60 has an application prohibited area 60b at both ends and an application area 60a at the center. When the coating liquid W is applied to the application region 60a of the round bar 60 formed in this way, the application prohibition regions 60b at both ends are both more than the second seal member 33, as shown in FIG. The round bar 60 is disposed on the second seal member 33 so as to be located outside and sandwiched by the gap seals 41.

そして、図11(B)に示すように、第一シール部材23にて丸棒材60を押圧するように第一型部材20と第二型部材30とが押し付けられると、図11(C)に示すように、各隙間シール41が太るように弾性変形して隙間Sが閉塞された状態で、供給室11aが形成される。この供給室11a内に塗布液Wを供給することで、丸棒材60の塗布領域60aに塗布液Wを塗布することができる。   Then, as shown in FIG. 11B, when the first mold member 20 and the second mold member 30 are pressed so as to press the round bar 60 with the first seal member 23, FIG. As shown, the supply chamber 11a is formed in a state where the gap seals 41 are elastically deformed so that the gap seals 41 are thick and the gap S is closed. By supplying the coating liquid W into the supply chamber 11a, the coating liquid W can be applied to the coating region 60a of the round bar 60.

このとき、押圧状態の第一型部材20および第二型部材30により各隙間シール41が太るように弾性変形することで丸棒材60近傍の隙間Sが閉塞されているので、供給室11a内に供給された塗布液Wが隙間Sを通過して漏れ出すことを防止することができる。特に、両隙間シール41により丸棒材60の両端近傍をそれぞれ挟持するため、丸棒材60のような転がりやすく位置決めがしにくい被塗布物であっても、確実に位置決めして塗布領域60aに塗布液Wを塗布することができる。   At this time, the gap S near the round bar 60 is closed by elastically deforming the gap seals 41 so that each gap seal 41 is thickened by the pressed first mold member 20 and the second mold member 30. It is possible to prevent the coating liquid W supplied to the liquid from leaking through the gap S. In particular, since both ends of the round bar 60 are sandwiched between the gap seals 41, even an object to be coated that is easy to roll and difficult to position, such as the round bar 60, is reliably positioned and applied to the coating region 60a. The coating liquid W can be applied.

(2)また、上記実施形態において、隙間シール41,43は、四角柱状に形成されることに限らず、端子54〜56の外縁と両シール部材23,33の外側の面とにより形成される隅部の形状等に応じて、例えば、三角柱など多角柱状に形成されてもよいし、円柱状に形成されてもよい。 (2) In the above-described embodiment, the gap seals 41 and 43 are not limited to being formed in a quadrangular prism shape, but are formed by the outer edges of the terminals 54 to 56 and the outer surfaces of both the seal members 23 and 33. Depending on the shape of the corner, etc., for example, it may be formed in a polygonal column shape such as a triangular prism, or may be formed in a columnar shape.

(3)また、上記実施形態において、塗布装置10は、余分な塗布液Wの排除が不要または他の手段により余分な塗布液Wを排除する場合には、収容タンク11を回転させなくてもよい。この場合には、回転軸部材12やモータ等の回転に関する機構を廃止することができる。 (3) Further, in the above embodiment, the coating apparatus 10 does not need to rotate the storage tank 11 when it is unnecessary to remove the excess coating liquid W or to eliminate the excess coating liquid W by other means. Good. In this case, a mechanism relating to rotation such as the rotating shaft member 12 and the motor can be eliminated.

10…塗布装置 11…収容タンク 11a…供給室 11b…供給禁止室
12…回転軸部材(回転手段) 13…貯留タンク(供給手段)
20…第一型部材(一側押圧具)
23…第一シール部材(一側シール部材)
30…第二型部材(他側押圧具)
33…第二シール部材(他側シール部材)
40…接触部
41,43…隙間シール(閉塞部材)
50…半導体装置(被塗布物) 50a…塗布領域 50b…塗布禁止領域
60…丸棒材(被塗布物) 60a…塗布領域 60b…塗布禁止領域
S…隙間 W…塗布液
DESCRIPTION OF SYMBOLS 10 ... Coating apparatus 11 ... Storage tank 11a ... Supply chamber 11b ... Supply prohibition chamber 12 ... Rotating shaft member (rotating means) 13 ... Storage tank (supply means)
20 ... 1st type | mold member (one side pressing tool)
23. First seal member (one-side seal member)
30 ... Second mold member (other-side pressing tool)
33 ... Second seal member (other side seal member)
40 ... contact part 41, 43 ... gap seal (blocking member)
DESCRIPTION OF SYMBOLS 50 ... Semiconductor device (to-be-applied object) 50a ... Application | coating area | region 50b ... Application | coating prohibition area | region 60 ... Round bar material (to-be-applied object) 60a ... Application | coating area 60b ... Application | coating prohibition area | region S ... Gap W ... Application | coating liquid

Claims (4)

被塗布物(50,60)に対して塗布が禁止される塗布禁止領域(50b,60b)を除く塗布領域(50a,60a)に塗布液(W)を塗布する塗布装置(10)であって、
前記被塗布物に対して前記塗布禁止領域を除き前記塗布領域の一側および他側をそれぞれ環状に囲うように当該被塗布物を介して対向する際に一部が互いに接触する一側シール部材(23)および他側シール部材(33)と、
前記一側シール部材を前記被塗布物に押圧する一側押圧具(20)と、
前記他側シール部材を前記被塗布物に押圧する他側押圧具(30)と、
前記一側押圧具による前記一側シール部材の押圧および前記他側押圧具による前記他側シール部材の押圧に応じて弾性変形する閉塞部材(41,43)と、
前記一側シール部材および前記他側シール部材により囲まれた空間(11a)内に前記塗布液を供給する供給手段(13)と、
を備え、
前記閉塞部材は、前記弾性変形時に、前記一側シール部材と前記他側シール部材との接触部(40)と前記被塗布物との間に形成される隙間(S)を閉塞するように配置されることを特徴とする塗布装置。
A coating apparatus (10) for coating a coating liquid (W) on a coating area (50a, 60a) excluding a coating prohibited area (50b, 60b) where coating is prohibited on an object (50, 60). ,
One-side sealing member that is partly in contact with each other when facing the coating object so as to surround one side and the other side of the coating area in a ring shape except for the coating-prohibited area with respect to the coating object (23) and the other side sealing member (33);
A one-side pressing tool (20) for pressing the one-side seal member against the object to be coated;
The other side pressing member (30) for pressing the other side sealing member against the object to be coated;
A closing member (41, 43) that is elastically deformed in response to the pressing of the one-side sealing member by the one-side pressing tool and the pressing of the other-side sealing member by the other-side pressing tool;
Supply means (13) for supplying the coating liquid into a space (11a) surrounded by the one-side seal member and the other-side seal member;
With
The closing member is disposed so as to close a gap (S) formed between the contact portion (40) between the one-side seal member and the other-side seal member and the coating object during the elastic deformation. An applicator characterized by being made.
前記閉塞部材(43)は、押圧方向の中間部位(43a)が前記隙間に近づくように撓んで形成されることを特徴とする請求項1に記載の塗布装置。   The coating device according to claim 1, wherein the closing member (43) is formed to bend so that an intermediate portion (43a) in the pressing direction approaches the gap. 前記閉塞部材は、前記一側シール部材および前記他側シール部材のいずれか一方と一体に形成されることを特徴とする請求項1または2に記載の塗布装置。   The coating device according to claim 1, wherein the closing member is formed integrally with one of the one-side seal member and the other-side seal member. 前記塗布領域に塗布された余分な前記塗布液の少なくとも一部を前記一側シール部材および前記他側シール部材に向けて吹き飛ばすように、前記被塗布物を前記一側シール部材および前記他側シール部材とともに回転させる回転手段(12)を備えることを特徴とする請求項1〜3のいずれか一項に記載の塗布装置。   The one-side seal member and the other-side seal are arranged so that at least a part of the excess coating liquid applied to the application region is blown toward the one-side seal member and the other-side seal member. The coating device according to any one of claims 1 to 3, further comprising a rotating means (12) that rotates together with the member.
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Cited By (4)

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Publication number Priority date Publication date Assignee Title
JP2019141760A (en) * 2018-02-16 2019-08-29 アイテック株式会社 Applying device and applying method
JP2019188325A (en) * 2018-04-25 2019-10-31 株式会社エナテック Coating device and coating method
JP2021030144A (en) * 2019-08-22 2021-03-01 株式会社デンソー Liquid medicine applicator
JP2021034527A (en) * 2019-08-22 2021-03-01 株式会社デンソー Manufacturing method of semiconductor module

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019141760A (en) * 2018-02-16 2019-08-29 アイテック株式会社 Applying device and applying method
JP2019188325A (en) * 2018-04-25 2019-10-31 株式会社エナテック Coating device and coating method
JP7050563B2 (en) 2018-04-25 2022-04-08 株式会社エナテック Coating device and coating method
JP2021030144A (en) * 2019-08-22 2021-03-01 株式会社デンソー Liquid medicine applicator
JP2021034527A (en) * 2019-08-22 2021-03-01 株式会社デンソー Manufacturing method of semiconductor module
JP7253201B2 (en) 2019-08-22 2023-04-06 株式会社デンソー liquid coating equipment
JP7295532B2 (en) 2019-08-22 2023-06-21 株式会社デンソー Semiconductor module manufacturing method

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