JP2014067796A5 - - Google Patents

Description

Semiconductor device manufacturing method, substrate processing method, and substrate processing apparatus

The present invention relates to a semiconductor device manufacturing method , a substrate processing method, and a substrate processing apparatus.

  For example, a substrate processing step of forming, for example, an a-Si (amorphous silicon) film on a substrate such as a silicon wafer may be performed as one step of a manufacturing process of a semiconductor device such as a DRAM or an IC. In such a substrate processing step, a step of loading the substrate into the processing chamber, a step of supplying a silicon-containing gas and a chlorine-containing gas onto the substrate, and a step of unloading the substrate from the processing chamber are performed.

JP2011-119644A

  However, there is a problem that a desired film cannot be formed even if the above-described method is used.

According to one aspect of the present invention, there is provided a method of manufacturing a semiconductor device for processing a substrate in a processing chamber, and supplying the chlorine-containing Yuga scan relative to said substrate, said chlorine-containing Yuga scan is supplied A step of supplying a silicon-containing gas to the substrate, a first substrate processing step of repeatedly performing a plurality of times, and a second substrate processing step of supplying a silicon-containing gas to the substrate subjected to the first substrate processing step. , A method for manufacturing a semiconductor device is provided.

  According to another aspect of the present invention, there is provided a substrate processing apparatus including a processing chamber for processing a substrate, wherein a chlorine-containing gas supply unit that supplies a chlorine-containing gas to the substrate, and a silicon-containing gas to the substrate. A silicon-containing gas supply unit for supplying, a control unit for controlling at least the chlorine-containing gas supply unit, and the silicon-containing gas supply unit, wherein the control unit supplies a chlorine-containing gas to the substrate. The chlorine-containing gas supply unit and the silicon-containing gas are supplied so that the silicon-containing gas is supplied to the substrate after repeatedly supplying the silicon-containing gas to the substrate supplied with the chlorine-containing gas a plurality of times. A substrate processing apparatus for controlling a supply unit is provided.

According to the semiconductor device manufacturing method , substrate processing method, and substrate processing apparatus of the present invention, a desired film can be formed.

It is a schematic block diagram of the substrate processing apparatus used suitably by one Embodiment of this invention. It is a schematic block diagram of the processing furnace with which the substrate processing apparatus used suitably by one Embodiment of this invention is provided. It is a flowchart of the substrate processing process which concerns on one Embodiment of this embodiment. It is a graph which shows the effect in one Embodiment of this invention. It is a graph which shows the relationship between one Embodiment of this invention and a comparative example. It is a graph which shows the relationship between the deposition time and film thickness in one Embodiment of this invention. It is a graph which shows the relationship between the deposition time as a comparative example, and a film thickness.

<One Embodiment of the Present Invention>
Hereinafter, an embodiment of the present invention will be described.

(1) Configuration of Substrate Processing Apparatus First, a configuration example of a substrate processing apparatus 101 according to an embodiment of the present invention will be described with reference to FIG. FIG. 1 is a schematic configuration diagram of a substrate processing apparatus suitably used in an embodiment of the present invention. As shown in FIG. 1, the substrate processing apparatus 101 according to the present embodiment includes a housing 111. In order to transport a wafer (substrate) 200 made of silicon or the like into or out of the casing 111, a cassette 110 as a wafer carrier (substrate storage container) that stores a plurality of wafers 200 is used. A cassette stage (substrate storage container delivery table) 114 is provided in front of the housing 111 (on the right side in the drawing). The cassette 110 is placed on the cassette stage 114 by an in-process transfer device (not shown), and is carried out of the casing 111 from the cassette stage 114.

  The cassette 110 is placed on the cassette stage 114 so that the wafer 200 in the cassette 110 is in a vertical posture and the wafer loading / unloading port of the cassette 110 faces upward by the in-process transfer device. The cassette stage 114 rotates the cassette 110 90 degrees in the vertical direction toward the rear of the casing 111 to bring the wafer 200 in the cassette 110 into a horizontal posture, and the wafer loading / unloading port of the cassette 110 is placed behind the casing 111. It is configured to be able to face.

  A cassette shelf (substrate storage container mounting shelf) 105 is installed at a substantially central portion in the front-rear direction in the housing 111. The cassette shelf 105 is configured to store a plurality of cassettes 110 in a plurality of rows and a plurality of rows. The cassette shelf 105 is provided with a transfer shelf 123 in which a cassette 110 to be transferred by a wafer transfer mechanism 125 described later is stored. Further, a preliminary cassette shelf 107 is provided above the cassette stage 114, and is configured to store the cassette 110 in a preliminary manner.

  A cassette transfer device (substrate container transfer device) 118 is provided between the cassette stage 114 and the cassette shelf 105. The cassette transport device 118 includes a cassette elevator (substrate storage container lifting mechanism) 118a that can be moved up and down while holding the cassette 110, and a cassette transport mechanism (substrate storage container transport mechanism) as a transport mechanism that can move horizontally while holding the cassette 110. 118b. The cassette 110 is transported between the cassette stage 114, the cassette shelf 105, the spare cassette shelf 107, and the transfer shelf 123 by the cooperative operation of the cassette elevator 118a and the cassette transport mechanism 118b.

  A wafer transfer mechanism (substrate transfer mechanism) 125 is provided behind the cassette shelf 105. The wafer transfer mechanism 125 includes a wafer transfer device (substrate transfer device) 125a that can rotate or linearly move the wafer 200 in the horizontal direction, and a wafer transfer device elevator (substrate transfer device) that moves the wafer transfer device 125a up and down. Elevating mechanism) 125b. The wafer transfer device 125a includes a tweezer (substrate transfer jig) 125c that holds the wafer 200 in a horizontal posture. By the cooperative operation of the wafer transfer device 125a and the wafer transfer device elevator 125b, the wafer 200 is picked up from the cassette 110 on the transfer shelf 123 and loaded (charged) into a boat (substrate support member) 217 described later. Alternatively, the wafer 200 is detached from the boat 217 (discharged) and stored in the cassette 110 on the transfer shelf 123.

  A processing furnace 202 is provided above the rear portion of the casing 111. An opening is provided at the lower end of the processing furnace 202, and the opening is configured to be opened and closed by a furnace port shutter (furnace port opening / closing mechanism) 147. The configuration of the processing furnace 202 will be described later.

  Below the processing furnace 202, a boat elevator (substrate support member lifting mechanism) 115 is provided as a lifting mechanism that lifts and lowers the boat 217 and transports the boat 217 into and out of the processing furnace 202. The elevator 128 of the boat elevator 115 is provided with an arm 128 as a connecting tool. On the arm 128, a seal cap 219 is provided in a horizontal posture as a lid that supports the boat 217 vertically and that hermetically closes the lower end of the processing furnace 202 when the boat 217 is raised by the boat elevator 115. ing. Mainly, loading / unloading of at least one wafer 200 into / out of the processing chamber 201 by the wafer transfer mechanism 125 (wafer transfer device 125a, wafer transfer device elevator 125b, tweezer 125c), boat elevator 115, and arm 128. The exit means is configured.

  The boat 217 includes a plurality of holding members, and a plurality of (for example, about 50 to 150) wafers 200 are aligned in the vertical direction in a horizontal posture and in a state where the centers thereof are aligned in multiple stages. Configured to hold. The detailed configuration of the boat 217 will be described later.

  Above the cassette shelf 105, a clean unit 134a having a supply fan and a dustproof filter is provided. The clean unit 134a is configured to circulate clean air, which is a cleaned atmosphere, inside the casing 111.

  Further, a clean unit (not shown) provided with a supply fan and a dustproof filter so as to supply clean air to the left end portion of the casing 111 opposite to the wafer transfer device elevator 125b and the boat elevator 115 side. Is installed. Clean air blown out from the clean unit (not shown) is configured to be sucked into an exhaust device (not shown) and exhausted to the outside of the casing 111 after circulating around the wafer transfer device 125a and the boat 217. ing.

  Next, the operation of the substrate processing apparatus 101 according to the present embodiment will be described.

  First, the cassette 110 is placed on the cassette stage 114 by an in-process transfer device (not shown) so that the wafer 200 is in a vertical posture and the wafer loading / unloading port of the cassette 110 faces upward. Thereafter, the cassette 110 is rotated 90 ° in the vertical direction toward the rear of the casing 111 by the cassette stage 114. As a result, the wafer 200 in the cassette 110 assumes a horizontal posture, and the wafer loading / unloading port of the cassette 110 faces rearward in the housing 111.

  The cassette 110 is automatically transported to the designated shelf position of the cassette shelf 105 or the spare cassette shelf 107 by the cassette transporting device 118, delivered, temporarily stored, and then stored in the cassette shelf 105 or the spare cassette shelf. The sample is transferred from 107 to the transfer shelf 123 or directly transferred to the transfer shelf 123.

  When the cassette 110 is transferred to the transfer shelf 123, the wafer 200 is picked up from the cassette 110 through the wafer loading / unloading port by the tweezer 125c of the wafer transfer device 125a, and the wafer transfer device 125a and the wafer transfer device elevator 125b are picked up. Are loaded (charged) into the boat 217 behind the transfer chamber 124. The wafer transfer mechanism 125 that has transferred the wafer 200 to the boat 217 returns to the cassette 110 and loads the next wafer 200 into the boat 217.

  When a predetermined number of wafers 200 are loaded into the boat 217, the lower end of the processing furnace 202 closed by the furnace port shutter 147 is opened by the furnace port shutter 147. Subsequently, when the seal cap 219 is raised by the boat elevator 115, the boat 217 holding the wafer 200 group is loaded into the processing furnace 202. After loading, arbitrary processing is performed on the wafer 200 in the processing furnace 202. Such processing will be described later. After the processing, the wafer 200 and the cassette 110 are discharged to the outside of the casing 111 by a procedure reverse to the above procedure.

(2) Configuration of Processing Furnace Next, the configuration of the processing furnace 202 according to the present embodiment will be described with reference to FIG. FIG. 2 is a schematic configuration diagram of a processing furnace 202 included in the substrate processing apparatus 101 that is preferably used in an embodiment of the present invention.

As shown in FIG. 2, the processing furnace 202 includes a process tube 203 as a reaction tube. The process tube 203 includes an inner tube 204 as an internal reaction tube and an outer tube 205 as an external reaction tube provided on the outside thereof. The inner tube 204 is made of a heat resistant material such as quartz (SiO ₂ ) or silicon carbide (SiC). The inner tube 204 is formed in a cylindrical shape with an upper end and a lower end opened. A processing chamber 201 for processing a wafer 200 as a substrate is formed in a hollow cylindrical portion in the inner tube 204. The outer tube 205 is provided concentrically with the inner tube 204. The outer tube 205 has an inner diameter larger than the outer diameter of the inner tube 204, is formed in a cylindrical shape with the upper end closed and the lower end opened. The outer tube 205 is made of a heat resistant material such as quartz or silicon carbide.

  A manifold 209 is disposed below the outer tube 205 concentrically with the outer tube 205. The manifold 209 is made of, for example, stainless steel. The manifold 209 is formed in a cylindrical shape with an upper end and a lower end opened. The manifold 209 is engaged with the lower end portion of the inner tube 204 and the lower end portion of the outer tube 205, respectively. The manifold 209 is provided so as to support the lower end portion of the inner tube 204 and the lower end portion of the outer tube 205. An O-ring 220a as a seal member is provided between the manifold 209 and the outer tube 205. By supporting the manifold 209 on the heater base 251, the process tube 203 is installed vertically. A reaction vessel is mainly formed by the process tube 203 and the manifold 209.

  A boat 217 as a substrate holder is loaded into the processing chamber 201 from below the lower end opening of the manifold 209. The boat 217 is configured to hold the wafers 200 as a plurality of substrates in a horizontal posture and aligned at predetermined intervals in a state where the centers are aligned with each other. The boat 217 is made of a heat resistant material such as quartz or silicon carbide. Below the boat 217, a plurality of heat insulating plates 216 as disk-shaped heat insulating members are arranged in multiple stages in a horizontal posture. The heat insulating plate 216 is made of a heat resistant material such as quartz or silicon carbide, and suppresses heat conduction from the heater 206 to the manifold 209.

  At the lower end opening of the manifold 209, a seal cap 219 is provided as a furnace port lid capable of airtightly closing the reaction vessel. The seal cap 219 is made of, for example, a metal such as stainless steel and is formed in a disk shape. On the upper surface of the seal cap 219, an O-ring 220b is provided as a seal member that is joined to the lower end of the manifold 209. The seal cap 219 is configured to contact the lower end of the manifold 209 from the lower side in the vertical direction of the reaction vessel.

A rotation mechanism 254 for rotating the boat 217 is provided below the seal cap 219 (that is, on the side opposite to the processing chamber 201 side). A rotation shaft 255 provided in the rotation mechanism 254 is provided so as to penetrate the seal cap 219. The upper end of the rotating shaft 255 supports the boat 217 from below. Therefore, the boat 217 and the wafer 200 can be rotated in the processing chamber 201 by operating the rotation mechanism 254. Further, a purge gas (N ₂ or the like) can be flowed through the rotating shaft 255.

  The seal cap 219 is configured to be lifted and lowered in the vertical direction by a boat elevator 115 as a lifting mechanism provided vertically outside the process tube 203. By operating the boat elevator 115, the boat 217 can be transported (boat loading or unloading) into and out of the processing chamber 201.

  A drive control unit 237 is electrically connected to the rotation mechanism 254 and the boat elevator 115. The drive control unit 237 controls the rotation mechanism 254 and the boat elevator 115 to perform a desired operation at a desired timing.

  A heater 206 as a heating mechanism for heating the inside of the processing chamber 201 concentrically with the process tube 203 is provided outside the process tube 203. The heater 206 has a cylindrical shape and is supported by a heater base 251 as a holding plate. The heater base 251 is configured to support the manifold 209.

  A temperature sensor 263 is installed in the process tube 203 as a temperature detector. A temperature controller 238 is electrically connected to the heater 206 and the temperature sensor 263. Based on the temperature information detected by the temperature sensor 263, the temperature control unit 238 controls the energization of the heater 206 so that the temperature in the processing chamber 201 becomes a desired temperature distribution at a desired timing.

  The seal cap 219 is provided with a first gas supply nozzle 230a and a second gas supply nozzle 230b so as to penetrate in the vertical direction. The downstream end of the first gas supply nozzle 230a and the downstream end of the second gas supply nozzle 230b are respectively opened below the inner tube 204 so that gas is supplied into the inner tube 204 from below to above. It is configured. The upstream end of the first gas supply nozzle 230a is connected to the downstream end of a first gas supply pipe 270a that supplies a silicon (Si) -containing gas and an inert gas. The downstream end of the second gas supply pipe 270b that supplies the inert gas is connected to the upstream end of the second gas supply nozzle 230b.

Upstream of the first gas supply pipe 270a is a chlorine-containing gas supply pipe 271 that supplies dichlorosilane (SiH ₂ Cl ₂ ) gas as a chlorine-containing gas, and disilane (Si ₂ H ₆ ) gas as a silicon-containing gas. A silicon-containing gas supply pipe 272 to be supplied and a downstream end of a first inert gas supply pipe 273 that supplies, for example, nitrogen (N ₂ ) gas as an inert gas as a purge gas or a carrier gas are connected. The chlorine-containing gas supply pipe 271 is provided with a dichlorosilane gas supply source 271a, a mass flow controller 271b as a flow rate control unit, and a valve 271c in this order from the upstream side. The silicon-containing gas supply pipe 272 is provided with a disilane gas supply source 272a, a mass flow controller 272b, and a valve 272c in this order from the upstream side. The first inert gas supply pipe 273 is provided with a first inert gas supply source 273a, a mass flow controller 273b, and a valve 273c as a supply source of an inert gas such as nitrogen gas in order from the upstream side. The inert gas supplied from the first inert gas supply pipe 273 functions as a purge gas for purging the inside of the processing chamber 201 or a carrier gas for diluting and transporting the silicon-containing gas.

A downstream end of a second inert gas supply pipe 274 that supplies nitrogen (N ₂ ) gas as an inert gas is connected to the upstream side of the second gas supply pipe 270b. The second inert gas supply pipe 274 is provided with a second inert gas supply source 274a, a mass flow controller 274b, and a valve 274c as an inert gas supply source such as nitrogen gas in order from the upstream side. Note that the inert gas supplied from the second inert gas supply pipe 274 functions as a purge gas for purging the inside of the processing chamber 201.

  Mainly, the first gas supply nozzle 230a, the first gas supply pipe 270a, the chlorine-containing gas supply pipe 271, the silicon-containing gas supply pipe 272, the dichlorosilane gas supply source 271a, the disilane gas supply source 272a, the mass flow controllers 271b and 272b, and the valve 271c. , 272c constitute a film forming gas supply system. The first gas supply nozzle 230a, the second gas supply nozzle 230b, the first gas supply pipe 270a, the second gas supply pipe 270b, the first inert gas supply pipe 273, and the second inert gas supply pipe 274 are mainly used. The first inert gas supply source 273a, the second inert gas supply source 274a, the mass flow controllers 273b and 274b, and the valves 273c and 274c constitute an inert gas supply system. In addition, the gas supply system according to this embodiment is mainly configured by the film forming gas supply system and the inert gas supply system.

  A gas flow rate controller 235 is electrically connected to each component of the gas supply system described above. The gas flow rate control unit 235 controls each component of the gas supply system to perform a desired operation at a desired timing.

  A gas exhaust pipe 231 for exhausting the inside of the processing chamber 201 is provided on the side surface of the manifold 209. The gas exhaust pipe 231 passes through the side surface portion of the manifold 209 and communicates with the lower end portion of the cylindrical space 250 formed by a gap between the inner tube 204 and the outer tube 205. A pressure sensor 245 as a pressure detector, an APC (Auto Pressure Controller) valve 242 as a pressure adjusting device, and a vacuum are provided on the downstream side of the gas exhaust pipe 231 (on the side opposite to the connection side with the manifold 209). A pump 246 is provided. The exhaust system according to this embodiment is mainly configured by the gas exhaust pipe 231, the pressure sensor 245, the APC valve 242, and the vacuum pump 246.

  Note that a pressure control unit 236 is electrically connected to the pressure sensor 245 and the APC valve 242. Based on the pressure information detected by the pressure sensor 245, the pressure control unit 236 controls the opening degree of the APC valve 242 so that the pressure in the processing chamber 201 becomes a desired pressure (degree of vacuum) at a desired timing. To do.

  The gas flow rate control unit 235, the pressure control unit 236, the drive control unit 237, and the temperature control unit 238 are electrically connected to a main control unit 239 that controls the entire substrate processing apparatus 101. A controller 240 as a control unit according to the present embodiment is mainly configured by the gas flow rate control unit 235, the pressure control unit 236, the drive control unit 237, the temperature control unit 238, and the main control unit 239.

(3) Substrate Processing Step Next, a substrate processing step that is performed as a step of manufacturing a semiconductor device such as a DRAM or an IC will be described mainly with reference to FIGS. FIG. 3 is a flowchart of a substrate processing process according to an embodiment of the present embodiment.
In such a substrate processing step, and supplying the chlorine-containing Yuga scan to the wafer 200, the treatment step is repeated a plurality of times and supplying a silicon-containing gas to the wafer 200 to the chlorine-containing Yuga scan is supplied And a processing step of supplying a silicon-containing gas to the wafer 200 that has been subjected to the processing step.
For example, a step of supplying a chlorine-containing gas to the wafer 200 and a step of supplying a silicon-containing gas to the wafer 200 to which the chlorine-containing gas is supplied are repeated a plurality of times, and the wafer 200 is amorphous (amorphous). ) A process for forming a silicon body or a first amorphous silicon film, and a silicon-containing gas is supplied to the wafer 200 that has been subjected to the process, so that the wafer 200 or the amorphous silicon body or the first amorphous silicon film is supplied. On the other hand, a second substrate processing step of forming a second amorphous silicon film is provided.
Specifically, for example, an amorphous silicon film is formed on the wafer 200 using the substrate processing apparatus 101 described above. In the following description, the operation of each part constituting the substrate processing apparatus 101 is controlled by the controller 240.

(Wafer carry-in process (S1, S2))
Also not a, the seal cap 219 is lowered by the baud preparative elevator 115, thereby opening the lower end of the manifold 209. Then, the wafers 200 to be processed, for example, a plurality of wafers 200 are transferred to the boat 217 and loaded (wafer charge: S1). Then, the boat 217 supporting the plurality of wafers 200 is lifted by the boat elevator 115 and loaded into the processing chamber 201 (boat loading: S 2 ). Then, the lower end opening of the manifold 209 is sealed by the seal cap 219 via the O-ring 220b.

Note that a SiO ₂ film as a natural oxide film is formed in advance on the surface of the wafer 200 to be processed, for example, by being exposed to an oxygen component in the atmosphere. The SiO ₂ film formed on the lower ground of the film becomes a factor that increases the time until the growth of the thin film is started. In other words, at the initial stage of film formation, a time delay occurs when a thin film is deposited on the substrate surface. Although the time during which the film is not formed is also referred to as an incubation time, the SiO ₂ film formed on the lower ground of the film becomes a factor that increases the incubation time until the growth of the thin film is started.

(Decompression and temperature raising step (S3, S4, S5, S6))
Subsequently, the vacuum pump 246 is operated and the APC valve 242 is opened, whereby the inside of the processing chamber 201 is evacuated through the gas exhaust pipe 231. At this time, the opening degree of the APC valve 242 is feedback controlled based on the pressure information detected (measured) by the pressure sensor 245 so that the inside of the processing chamber 201 becomes a desired pressure (processing pressure). Further, the heater 206 is energized and heated to raise the temperature of the wafer 200 surface. At this time, the energization amount to the heater 206 is feedback controlled based on the temperature information detected by the temperature sensor 263 so that the inside of the processing chamber 201 becomes a desired temperature (processing temperature), and the wafer 200 is heated. Further, the rotation mechanism 254 is operated to start the rotation of the wafer 200. At that time, the valve 274 c is opened, purge gas (N ₂ ) is allowed to flow from the shaft portion of the rotation mechanism 254, and the boat 217 and the wafer 200 are evacuated while rotating. The pressure adjustment, temperature adjustment, and rotation of the wafer 200 in the processing chamber 201 are continued until the second film forming process described later is completed (S20).

(First Film Formation Step, 1-1 Processing Step (S7))
Subsequently, the valves 271 c and 273 c are opened, and dichlorosilane (SiH ₂ Cl ₂ ) gas as a chlorine-containing gas whose flow rate is adjusted by the mass flow controller 271 b or a chlorine-containing gas containing element Cl is supplied into the processing chamber 201. As the chlorine-containing gas containing element Cl, chlorine and silicon-containing gas containing element Cl and element Si are preferably supplied.

  A gas (dichlorosilane or chlorine-containing gas) supplied into the processing chamber 201 flows from the lower side to the upper side in the inner tube 204, and in the cylindrical space 250 formed by a gap between the inner tube 204 and the outer tube 205. Then, the gas is exhausted from the gas exhaust pipe 231 to the outside of the process tube 203. When the dichlorosilane gas or the chlorine-containing gas passes through the processing chamber 201, it contacts the surface of the wafer 200.

The temperature range in the processing chamber 201 when supplying dichlorosilane gas or chlorine-containing gas is 300 to 400 ° C., the pressure range is ultimate pressure to 133 Pa, the dichlorosilane gas or chlorine-containing gas supply flow rate range is 0 to 1000 sccm, and the N ₂ purge gas flow rate range. Is preferably 0 to 1000 sccm, and the flow rate of the N ₂ purge gas from the rotating mechanism shaft is preferably 300 sccm. For example, a processing temperature of 375 ° C., a pressure of 40 Pa, and a processing gas of dichlorosilane gas of 200 sccm are supplied for 5 minutes.

(Purge process (S8, S9))
After a predetermined time has passed and a thin film having a desired film thickness (for example, 1 nm or less) is formed on the wafer 200, the valve 271c is closed, and supply of dichlorosilane gas or chlorine-containing gas into the processing chamber 201 is performed. While stopping, the residual gas in the processing chamber 201 is exhausted from the gas exhaust pipe 231. Note that by keeping the valve 273c open, exhaust of residual gas from the processing chamber 201 is promoted, and the atmosphere in the processing chamber 201 is purged with nitrogen gas.

(First Film Formation Step, 1-2 Processing Step (S10))
When the discharge of dichlorosilane gas or chlorine-containing gas from the inside of the processing chamber 201 is completed after a predetermined time has elapsed, the valves 272c and 273c are opened, and Si ₂ H ₆ (Si ₂ H ₆ as a silicon-containing gas whose flow rate is adjusted by the mass flow controller 272b ( Disilane ) gas is supplied into the processing chamber 201 through the first gas supply pipe 270a. The temperature range in the processing chamber 201 at this time is 300 to 400 ° C., the pressure range is ultimate pressure to 133 Pa, the deposition gas supply flow rate range is 0 to 500 sccm, and the purge gas (N ₂ ) flow rate range is 0 to 1000 sccm. A film forming temperature of 375 ° C., a pressure of 40 Pa, and a film forming gas (disilane) flow rate of 100 sccm are supplied for 5 minutes.

(Purge process (S11, S12))
Thereafter, the residual gas in the processing chamber 201 is exhausted (S11), and the inside of the processing chamber 201 and the first gas supply pipe 270a are purged with an inert gas (for example, N ₂ gas) (S12).

  The gas (disilane gas) supplied into the processing chamber 201 is mixed in the inner tube 204 and flows upward from below, and moves upward in the cylindrical space 250 formed by the gap between the inner tube 204 and the outer tube 205. Then, the gas is discharged from the gas exhaust pipe 231 to the outside of the process tube 203. The disilane gas contacts the surface of the wafer 200 as it passes through the processing chamber 201.

A predetermined number of cycles is performed a plurality of times as one cycle by combining the above-described 1-1 processing steps and 1-2 processing steps, and a nucleus or an initial thin film (cycle seed) is formed on the substrate. If the predetermined number of cycles is not being performed, the process returns to S7 again, and the first and second processing steps are performed until the predetermined number of cycles is reached. Specifically, for example, an amorphous silicon body or a first amorphous silicon film is formed on the wafer 200. That is, the surface of the wafer 200 or the SiO ₂ film formed on the surface of the wafer 200 is covered with the amorphous silicon body or the first amorphous silicon film. The amorphous silicon body or the first amorphous silicon film facilitates the growth of the second amorphous silicon film on the wafer 200.

  For example, when chlorine-containing and silicon-containing gases are used as the processing gas in the 1-1 processing step, silicon atoms in disilane supplied onto the wafer 200 in the 1-2 processing step are further used. Are easily formed as crystal nuclei.

(Temperature adjustment, stability, purge process (S14 , S15 ))
If a predetermined number of cycles of the film forming process have been performed, the process proceeds to S14, where the purge in the supply gas piping and the supply nozzle and the temperature adjustment, temperature stabilization, and purge in the processing chamber 201 are performed. In this case, it is preferable to purge at a pressure equal to or lower than the film forming pressure in the first film forming step. The inside of the processing chamber 201 is repeatedly evacuated and purged with N ₂ to perform a cycle purge. The number of cycle purges is preferably 3 to 10 times (S15).

In order to obtain the film formation temperature in the second film formation step, the film formation temperature is adjusted, the temperature is stabilized, and the wafer 200 is heated to a desired temperature . Since the baud bets 217 is rotating, it is possible to make uniform the temperature of the wafer 200. The film forming temperature range is 300 to 420 ° C. or 400 to 525 ° C. in the first film forming step.

(Second film formation step (S16))
In the second film formation step, a silicon-containing gas such as SiH ₄ or Si ₂ H ₆ is supplied onto the nucleus or initial film formation on the wafer 200 formed in the first film formation step, and the second amorphous silicon. A film is formed.
As for the film forming conditions, the temperature range in the processing chamber 201 is 400 to 525 ° C. or 300 to 420 ° C., the pressure range is vacuum reaching to 133 Pa or vacuum reaching to 266 Pa, and the film forming supply gas flow rate range is 0 to 500 sccm. The purge gas (N ₂ ) flow rate range is 0 to 1000 sccm.
When supplying SiH ₄ , thermal decomposition is generally started from 400 ° C. Therefore, the temperature range is preferably 400 to 500 ° C. For example, a film is formed at a film formation temperature of 475 ° C., a pressure of 90 Pa, and a SiH ₄ gas supply flow rate of 150 sccm for a predetermined time.
In the case of Si ₂ H ₆ (disilane), thermal decomposition is started at 300 ° C. or lower. Therefore, it is preferable that the film forming temperature is 420 ° C. or lower. For example, a thin film is formed by supplying a predetermined time at a film formation temperature of 375 ° C., a film formation pressure of 100 Pa, and a film supply gas of 100 sccm (S16) .
(Purge process (S17, S18))
Thereafter, the residual gas in the processing chamber 201 is exhausted (S17), and the processing chamber 201 and the supply nozzle are purged with an inert gas (for example, N ₂ ) (S18).
When the second amorphous silicon film having a desired film thickness is formed on the wafer 200 after a predetermined time has elapsed, the valve 272c is closed, and the supply of SiH ₄ or Si ₂ H ₆ into the processing chamber 201 is stopped. The residual gas in the processing chamber 201 is exhausted from the gas exhaust pipe 231 (S17). Thereafter, purging the processing chamber 201 and the supply nozzles with inert gas (for example N _2). In this case, it is preferable to purge at a pressure equal to or lower than the film forming pressure in the second film forming step (S18).
(Temperature lowering and atmospheric pressure recovery step (S20))
Then, the energization of the heater 206 is stopped, and the temperature in the processing chamber 201 and the wafer 200 is lowered to a predetermined temperature. Further, by keeping the valves 273c and 274c open, the exhaust of the residual gas from the processing chamber 201 is promoted, the atmosphere in the processing chamber 201 is replaced with nitrogen gas, and the opening degree of the APC valve 242 is further increased. By adjusting, the pressure in the processing chamber 201 is returned to the atmospheric pressure (S20). Further, the rotation of the wafer 200 is stopped.

(Boat unloading step (S21))
Subsequently, the seal cap 219 is lowered by the boat elevator 115, causes opening the lower end of the manifold 209, lowers the boat 217 holding the processed wafers 200, draw from the processing chamber 201 (S21: boat en Load ). At this time, it is preferable that the valves 273c and 274c are kept open and nitrogen gas is always allowed to flow into the reaction vessel. Further, it is preferable to control the pressure of the vacuum evacuation by the pump 246 is kept allowed to continue, the opening degree adjustment to the processing chamber 201 of the APC valve 242. Then, the wafer 200 is cooled from the unloaded boat 217 for a certain time, and the processed wafer 200 is taken out (S22: wafer discharge), and the substrate processing process according to the present embodiment is completed.

In addition, as a process condition of the 1-1 process process (S7-9) which concerns on this embodiment,
Process temperature: 300-400 degreeC,
Dichlorosilane gas or elemental Cl-containing gas supply flow rate: 1-1000 sccm
Processing pressure: Ultimate pressure ~ 133Pa
Purge N ₂ flow range is 0 to 1000 sccm
The N ₂ flow rate from the boat rotation mechanism shaft is 300 sccm
Is exemplified.
For example, a film formation temperature of 375 ° C., a pressure of 40 Pa, a dichlorosilane gas or elemental Cl-containing gas supply flow rate of 200 sccm is supplied for 5 minutes.

Moreover, as a process condition of the 1-2 process process (S10-12) which concerns on this embodiment,
Process temperature: 300-400 degreeC,
Processing pressure: Ultimate pressure ~ 133Pa
Disilane gas supply flow rate: 0 to 500 sccm
Purge N ₂ flow range is 0 to 1000 sccm
There are shown examples.
For example, a processing temperature of 375 ° C., a pressure of 40 Pa, and a deposition gas (disilane) flow rate of 100 sccm are supplied for 5 minutes.
By maintaining the respective processing conditions in the first film forming step at a certain value within the respective ranges, island-shaped nuclei or ultrathin films are formed on the wafer 200.

The wafer 200 on which the amorphous silicon film is formed is used in a process such as a DRAM, a flash memory, and a logic, and a subsequent process, so that the film formation temperature is lowered, for example, 400 ° C. or less and the film is thinned due to miniaturization. Response is required. In general, in a gas raw material for forming an amorphous silicon film, an amorphous silicon film is formed by using SiH ₄ (monosilane) gas or Si ₂ H ₆ (disilane) gas at, for example, 525 ° C. or lower. For example, when SiH ₄ gas is used, thermal decomposition starts from 400 ° C., and an a-Si film is formed at a film formation temperature of 400 to 545 ° C. However, if the a-Si film has a thickness of, for example, 5 nm or less, pinholes are generated in the formed thin film, and it is difficult to form a continuous film.

In addition, it is considered that there are a time region in which film formation on the substrate is not formed and a film formation delay time region in which film formation is not uniformly performed on the substrate as the reason why the generation of pinholes and the continuous film cannot be formed.
FIG. 7 is a graph showing the relationship between the deposition time and the film thickness as a comparative example. The vertical axis represents the film thickness in the wafer plane. The horizontal axis represents the film formation time. As described above, in the initial stage of film formation, a time delay occurs when the thin film is deposited on the substrate surface.
It is considered that island-like nuclei are formed on the substrate during this period of no film formation (incubation time). This difference in the size of the nuclei affected the film growth and the generation of pinholes in the thin film. Further, when the film is formed at a low temperature, there is a problem that the film is not formed in the case of SiH ₄ gas when the film formation temperature is 400 ° C. or less.

Further, when Si ₂ H ₆ is used as a substitute gas for SiH ₄ , the deposition temperature is low, so that the deposition rate is slow, and the catalytic effect of BCl ₃ (boron trichloride) is required. A B-doped Si (boron doped silicon) film or the like is used. When a B-doped Si film is used, there is a problem that if the B (boron) concentration is high, the etching rate is low and processing after film formation becomes difficult. There is also concern about the influence of electrical characteristics due to B diffusion.

  On the other hand, in the present embodiment, in the first film formation step, for example, two different types of silicon-containing gases are alternately supplied to the wafer 200 as two different types of processing gases, and amorphous silicon is formed on the substrate. The core or the first amorphous silicon film, which is an island-like nucleus and the initial film formation, is formed. Preferably, a silicon-containing gas containing chlorine element is used as one of two different types of silicon-containing gases. The size of the island-like nuclei formed in the first film formation step greatly affects the film formation in the second film formation step. Therefore, in the first film forming process, it is necessary to determine the film quality and electric characteristics of the film and the film thickness to be formed in the second film forming process, the restrictions on the film forming temperature of the substrate. In addition, it is easy to control the size of the island-like nuclei. In addition to the formation of island-like nuclei, the film thickness that is predetermined in the second film-forming step is formed if necessary or by forming an initial thin film with a certain ultrathin film, for example, 0.1 nm or less Can also be processed.

  In the second film forming step, the selectivity of the film forming gas is facilitated by the film forming temperature constraint of the substrate and the film thickness to be formed.

FIG. 4 is a graph showing effects in one embodiment of the present invention. Specifically, an effect of film formation pressure control in the first film formation process when a film formation gas monosilane (SiH ₄ ) is supplied in the second film formation process to form a film thickness of 5 nm is shown. The vertical axis indicates the film thickness uniformity in the wafer plane, and the unit is indicated by plus or minus% (percent). The horizontal axis indicates the pressure value in the processing chamber in the first film formation step. In the first film forming step, the film forming pressure is lowered, indicating that the film forming effect is effective. That is, when the pressure value in the processing chamber in the first film forming step is lowered, the film thickness uniformity in the wafer surface can be improved. Further, when the surface of the substrate was observed at this time, it was confirmed that no pinholes were generated.

FIG. 5 is a graph showing the relationship between one embodiment of the present invention and a comparative example. Specifically, an effect in the case where film formation is performed by supplying disilane (Si ₂ H ₆ ) as a film formation gas in the second film formation step in the present embodiment will be described. In the case where the first film forming process and the second film forming process are combined so as to be continuously performed as in the present embodiment, the first film forming process and the second film forming process are made independent of each other. It can be seen that the deposition rate (deposition rate) is improved and the film thickness uniformity within the wafer surface is improved as compared with the case of implementation. This indicates that island-like nuclei are formed in the first film formation step.

  FIG. 6 is a graph showing the relationship between the deposition time and the film thickness in one embodiment of the present invention. The vertical axis represents the film thickness in the wafer plane. The horizontal axis represents the film formation time. As a comparative example, it can be seen that the incubation time can be shortened by applying the present embodiment as compared with the case where it is performed under the conditions shown in FIG.

<Still another embodiment of the present invention>
As mentioned above, although embodiment of this invention was described concretely, this invention is not limited to the above-mentioned embodiment, It can change variously in the range which does not deviate from the summary.

  For example, in the above-described embodiment, one each of the first gas supply nozzle 230a and the second gas supply nozzle 230b is provided, but the present invention is not limited to such a form. For example, a plurality of first gas supply nozzles 230a and a plurality of second gas supply nozzles 230b may be provided, and the lengths of the nozzles at that time may be different from each other. If the gas is supplied from a plurality of locations having different heights in the wafer 200 holding region, the loading effect due to the decomposition and consumption of the gas can be suppressed, and the film thickness and film quality uniformity between the wafers 200 can be improved. Is possible.

  In the above-described embodiment, the disilane gas is supplied from the first gas supply nozzle 230a and the silane gas is supplied from the second gas supply nozzle 230b. However, the present embodiment is not limited to this mode, and the same gas supply is performed. You may make it supply from a nozzle. Further, although the disilane gas and the silane gas are supplied from the first gas supply nozzle 230a, they may be supplied from different gas supply nozzles, or the disilane gas may be supplied from the second gas supply nozzle 230b. Also good. The inert gas may be supplied from another gas supply nozzle. The inert gas is not limited to nitrogen gas, and other rare gases such as Ar gas and He gas may be used.

In the above-described embodiment, an example of forming a film using a batch-type substrate processing apparatus that processes a plurality of substrates at a time has been described. However, the present invention is not limited to this, and one or several sheets are formed at a time. The present invention can also be suitably applied to the case where a film is formed using a single-wafer type substrate processing apparatus that processes a substrate .
In the above-described embodiments, the inner tube and the outer tube have been described. However, the present invention can be applied to only the outer tube having no inner tube.

< Effects according to this embodiment >
According to the present invention, one or more of the following effects can be achieved.

(A) According to the present embodiment, pinholes and voids generated at the interface on the substrate can be suppressed and controlled. In particular, in step coverage of an amorphous silicon ultrathin film, pinholes and voids generated at the interface on the wafer can be suppressed and controlled.

(B) According to the present embodiment, in the amorphous silicon film, it is possible to select a film forming gas by regulating the film forming temperature of the wafer.

(C) According to the present embodiment, an amorphous silicon thin film can be formed at 10 nm or less, preferably 5 nm or less.

(D) According to the present embodiment, there is an effect of improving the region where the film is not uniformly formed and the incubation time.

(E) An amorphous silicon ultra-thin film, for example, a pinhole-free and continuous film can be formed at 5 nm or less, and a film can be formed uniformly.
<Preferred embodiment of the present invention>
Hereinafter, preferred embodiments of the present invention will be additionally described.

(Appendix 1)
According to one aspect of the invention,
A method of manufacturing a semiconductor device for processing a substrate in a processing chamber, and supplying the chlorine-containing Yuga scan with respect to the substrate,
A step of supplying a silicon-containing gas to said chloride substrate containing Yuga scan is supplied,
A first substrate processing step of repeatedly performing a plurality of times,
And a second substrate processing step of supplying a silicon-containing gas to the substrate subjected to the first substrate processing step.

(Appendix 2)
According to another aspect of the invention,
A substrate processing apparatus including a processing chamber for processing a substrate,
A chlorine-containing gas supply unit for supplying a chlorine-containing gas to the substrate;
A silicon-containing gas supply unit for supplying a silicon-containing gas to the substrate;
A control unit for controlling at least the chlorine-containing gas supply unit and the silicon-containing gas supply unit;
The controller supplies a chlorine-containing gas to the substrate, and after repeatedly performing a silicon-containing gas supply to the substrate supplied with the chlorine-containing gas a plurality of times, There is provided a substrate processing apparatus for controlling the chlorine-containing gas supply unit and the silicon-containing gas supply unit to supply a silicon-containing gas.

(Appendix 3)
According to yet another aspect of the invention,
A method of manufacturing a semiconductor device for processing a substrate in a processing chamber, the step of supplying a chlorine-containing gas to the substrate;
A step of supplying a silicon-containing gas to said chloride substrate containing Yuga scan is supplied,
Repeatedly a plurality of times, a first substrate processing step of forming an amorphous silicon body or a first amorphous silicon film on the substrate,
The silicon-containing gas is supplied to the substrate that has been subjected to the first substrate processing step, and a second amorphous silicon film is formed on the substrate, the amorphous silicon body, or the first amorphous silicon film. And a second substrate processing step. A method for manufacturing a semiconductor device is provided.

(Appendix 4)
According to yet another aspect of the invention,
A method of manufacturing a semiconductor device for processing a substrate in a processing chamber, the step of supplying chlorine and silicon-containing gas to the substrate;
A step of supplying the different gas species of the silicon-containing gas and the chlorine and silicon-containing gas to the substrate, wherein the chlorine and the silicon-containing gas is supplied,
Repeatedly a plurality of times, a first substrate processing step of forming an amorphous silicon body or a first amorphous silicon film on the substrate,
The silicon-containing gas is supplied to the substrate that has been subjected to the first substrate processing step, and a second amorphous silicon film is formed on the substrate, the amorphous silicon body, or the first amorphous silicon film. And a second substrate processing step. A method for manufacturing a semiconductor device is provided.

(Appendix 5)
A method for manufacturing a semiconductor device according to appendix 1, preferably,
The first substrate processing step is performed at a temperature of the substrate of 300 ° C. or higher and 400 ° C. or lower.

(Appendix 6)
A method for manufacturing a semiconductor device according to appendix 1, preferably,
The second substrate processing step is performed at a temperature of the substrate of 300 ° C. or more and 525 ° C. or less.

(Appendix 7)
A method for manufacturing a semiconductor device according to appendix 1, preferably,
The first substrate processing step is performed at a pressure in the processing chamber of 1 Pa or more and 133 Pa or less.

(Appendix 8)
A method for manufacturing a semiconductor device according to appendix 1, preferably,
The second substrate processing step is performed at a pressure in the processing chamber of 1 Pa or more and 133 Pa or less.

(Appendix 9)
A method for manufacturing a semiconductor device according to appendix 1, preferably,
In the first substrate processing step, dichlorosilane (SiH ₂ Cl ₂ ) gas is supplied as the chlorine-containing gas.

(Appendix 10)
A method for manufacturing a semiconductor device according to appendix 1, preferably,
In the first substrate processing step, disilane (Si ₂ H ₆ ) gas is supplied as the silicon-containing gas.

(Appendix 11)
A method for manufacturing a semiconductor device according to appendix 1, preferably,
In the second substrate processing step, disilane (Si ₂ H ₆ ) gas or monosilane (SiH ₄ ) gas is supplied as the silicon-containing gas.

(Appendix 12)
According to yet another aspect of the invention,
A substrate processing method for processing a substrate in a processing chamber, the step of supplying a chlorine-containing gas to the substrate;
Supplying a silicon-containing gas to the substrate supplied with the chlorine-containing gas;
Repeatedly a plurality of times, a first substrate processing step of forming an amorphous silicon body or a first amorphous silicon film on the substrate,
The silicon-containing gas is supplied to the substrate that has been subjected to the first substrate processing step, and a second amorphous silicon film is formed on the substrate, the amorphous silicon body, or the first amorphous silicon film. And a second substrate processing step.

101 ... Substrate processing apparatus 200 ... Wafer (substrate)
201 ... Processing chamber

Claims (12)

And supplying the chlorine-containing Yuga scan to board, and supplying the chlorine-containing Yuga scan the first silicon-containing gas to the substrate that has been supplied, a first step of repeating a plurality of times,
A second step of supplying a second silicon-containing gas to the substrate on which the first step has been performed,
A method for manufacturing a semiconductor device comprising: The method for manufacturing a semiconductor device according to claim 1, wherein in the first step, a first amorphous silicon film is formed on the substrate. The method for manufacturing a semiconductor device according to claim 2, wherein in the second step, a second amorphous silicon film is formed on the first amorphous silicon film. 4. The method of manufacturing a semiconductor device according to claim 2, wherein an oxide film is formed on a surface of the substrate, and the first amorphous silicon film is formed on the oxide film. 5. The method for manufacturing a semiconductor device according to claim 1, wherein the chlorine-containing gas is chlorine- and silicon-containing gas. The method for manufacturing a semiconductor device according to claim 1, wherein the chlorine-containing gas is dichlorosilane gas, the first silicon-containing gas is disilane gas, and the second silicon-containing gas is disilane gas or monosilane gas. The method for manufacturing a semiconductor device according to claim 1, wherein in the first step, the temperature of the substrate is set to be 300 ° C. or higher and 400 ° C. or lower. The method for manufacturing a semiconductor device according to claim 1, wherein in the second step, the temperature of the substrate is set to 300 ° C. or more and 525 ° C. or less. The method for manufacturing a semiconductor device according to claim 3, wherein a total film thickness of the first amorphous silicon film and the second amorphous silicon film is 10 nm or less. The method for manufacturing a semiconductor device according to claim 3, wherein a total film thickness of the first amorphous silicon film and the second amorphous silicon film is 5 nm or less. A step of supplying a chlorine-containing gas to the substrate; and a step of supplying a first silicon-containing gas to the substrate supplied with the chlorine-containing gas, a first step of repeating a plurality of times,
A second step of supplying a second silicon-containing gas to the substrate subjected to the first step;
A substrate processing method comprising: A processing chamber for processing the substrate ;
A chlorine-containing gas supply unit for supplying a chlorine-containing gas to the substrate in the processing chamber ;
A first silicon-containing gas supply unit for supplying a first silicon-containing gas to the substrate in the processing chamber ;
A second silicon-containing gas supply unit for supplying a second silicon-containing gas to the substrate in the processing chamber;
In the processing chamber, a process of supplying the chlorine-containing gas to the substrate, the first chlorine-containing gas is processed to supply the first silicon-containing gas to the substrate that has been supplied, intends repeated multiple times rows The chlorine-containing gas supply unit and the first silicon-containing gas supply unit are configured to perform a process and a second process of supplying the second silicon-containing gas to the substrate on which the first process has been performed. And a controller configured to control the second silicon-containing gas supply unit ;
A substrate processing apparatus comprising: