JP2013543127A5 - - Google Patents

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Publication number
JP2013543127A5
JP2013543127A5 JP2013537224A JP2013537224A JP2013543127A5 JP 2013543127 A5 JP2013543127 A5 JP 2013543127A5 JP 2013537224 A JP2013537224 A JP 2013537224A JP 2013537224 A JP2013537224 A JP 2013537224A JP 2013543127 A5 JP2013543127 A5 JP 2013543127A5
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JP
Japan
Prior art keywords
light source
coupled
mechanical structure
microelectromechanical sensor
photosensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013537224A
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English (en)
Japanese (ja)
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JP2013543127A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IB2011/054000 external-priority patent/WO2012059828A2/en
Publication of JP2013543127A publication Critical patent/JP2013543127A/ja
Publication of JP2013543127A5 publication Critical patent/JP2013543127A5/ja
Pending legal-status Critical Current

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JP2013537224A 2010-11-01 2011-09-13 小型で集積化されたマイクロエレクトロメカニカルシステム(メムス)の光学センサアレイ Pending JP2013543127A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US40911110P 2010-11-01 2010-11-01
US61/409,111 2010-11-01
US201161430871P 2011-01-07 2011-01-07
US61/430,871 2011-01-07
PCT/IB2011/054000 WO2012059828A2 (en) 2010-11-01 2011-09-13 Miniaturized integrated micro electo-mechanical systems (mems) optical sensor array

Publications (2)

Publication Number Publication Date
JP2013543127A JP2013543127A (ja) 2013-11-28
JP2013543127A5 true JP2013543127A5 (OSRAM) 2014-10-16

Family

ID=44774090

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013537224A Pending JP2013543127A (ja) 2010-11-01 2011-09-13 小型で集積化されたマイクロエレクトロメカニカルシステム(メムス)の光学センサアレイ

Country Status (9)

Country Link
US (1) US9267923B2 (OSRAM)
EP (1) EP2635900A2 (OSRAM)
JP (1) JP2013543127A (OSRAM)
KR (1) KR101838476B1 (OSRAM)
CN (1) CN103430018B (OSRAM)
BR (1) BR112013010927A2 (OSRAM)
CA (1) CA2816374A1 (OSRAM)
RU (1) RU2565351C2 (OSRAM)
WO (1) WO2012059828A2 (OSRAM)

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KR102059320B1 (ko) * 2012-06-28 2019-12-26 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오 고처리량 현미경 장치
GB201215546D0 (en) * 2012-08-31 2012-10-17 Infinitesima Ltd Multiple probe detection and actuation
ITTO20120789A1 (it) * 2012-09-14 2012-12-14 Fond Istituto Italiano Di Tec Nologia Iit Dispositivo automatico di misura, procedimento di misura mediante tale dispositivo e sistema dotato di tale dispositivo.
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US9557306B2 (en) * 2013-12-20 2017-01-31 Honeywell International Inc. Magnetically controlled gas detectors
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CN107343390B (zh) * 2014-10-28 2021-03-12 麻省理工学院 用于控制谐振器并根据谐振器特性确定信息的系统和方法
CN108474724B (zh) * 2015-09-30 2024-10-29 塔拉比奥斯健康技术股份公司 使用嵌入套筒的基于纤维的悬臂的感测设备
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JP7285008B2 (ja) 2017-03-31 2023-06-01 マサチューセッツ インスティテュート オブ テクノロジー 粒子を流動させるためのシステム、物品および方法、
WO2018236708A1 (en) 2017-06-19 2018-12-27 Massachusetts Institute Of Technology Systems and methods for measuring properties of particles
US10514584B2 (en) * 2017-08-10 2019-12-24 Sicoya Gmbh Optical signal generator comprising a phase shifter
CN112334867B (zh) 2018-05-24 2025-11-11 纽约州立大学研究基金会 电容传感器
CN109650328B (zh) * 2018-12-17 2020-05-19 大连理工大学 一种动态特性测试的激波底座激励装置及其工作方法
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WO2020146741A1 (en) 2019-01-10 2020-07-16 Selim Olcum Calibration of a functional biomarker instrument
DE102020203910B3 (de) * 2020-03-26 2021-06-17 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zum Detektieren einer Verunreinigung eines MEMS-Sensorelements

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