JP2013539079A5 - - Google Patents
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- JP2013539079A5 JP2013539079A5 JP2013530617A JP2013530617A JP2013539079A5 JP 2013539079 A5 JP2013539079 A5 JP 2013539079A5 JP 2013530617 A JP2013530617 A JP 2013530617A JP 2013530617 A JP2013530617 A JP 2013530617A JP 2013539079 A5 JP2013539079 A5 JP 2013539079A5
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- JP
- Japan
- Prior art keywords
- laser scanning
- scanning microscope
- beam path
- polarization
- microscope according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000000051 modifying Effects 0.000 claims 5
- 238000005286 illumination Methods 0.000 claims 2
- 238000004061 bleaching Methods 0.000 claims 1
- 238000002376 fluorescence recovery after photobleaching Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 230000003287 optical Effects 0.000 claims 1
Claims (10)
切り替えのために第１のビーム路の照明ビーム路中には電気光学的変調器（ＥＯＭ）が含まれ、
該電気光学的変調器には、第１および第２の偏光回転素子が前置および後置され、
該電気光学的変調器には、第２のビーム路を形成するための少なくとも１つの第１の偏光スプリッタが後置され、
該第２のビーム路には、光影響手段が配置されている、レーザ走査顕微鏡。 A laser scanning microscope capable of switching between various operating modes,
An electro-optic modulator (EOM) is included in the illumination beam path of the first beam path for switching,
The electro-optic modulator is provided with first and second polarization rotation elements before and after,
The electro-optic modulator is followed by at least one first polarization splitter for forming a second beam path,
A laser scanning microscope in which a light-influencing means is disposed in the second beam path.
前記第１の偏光回転素子はＥＯＭの動作モードに調整され、
前記第２の偏光回転素子は前記第１または前記第２のビーム路の調整を行う、レーザ走査顕微鏡。 The laser scanning microscope according to claim 1,
The first polarization rotation element is adjusted to an EOM operation mode;
The laser scanning microscope, wherein the second polarization rotator adjusts the first or second beam path.
前記光影響手段を介して、光方向で後置された第２の偏光スプリッタが前記第１および前記第２のビーム路の統合を行い、
前記ＥＯＭは、少なくとも２つの動作状態（Ｂ１、Ｂ２）の間で切り替え可能であり、
前記動作状態は、
Ｂ１．偏光の切り替え、
Ｂ２．焦点変調（ＦＭＭ）を形成するためにＥＯＭの異なる領域を異なって変調することである、レーザ走査顕微鏡。 The laser scanning microscope according to claim 1 or 2,
Via the light influencing means, a second polarization splitter placed in the light direction integrates the first and second beam paths;
The EOM is switchable between at least two operating states (B1, B2);
The operating state is
B1. Switching polarization,
B2. A laser scanning microscope that is differently modulating different regions of the EOM to form focus modulation (FMM).
前記第１および第２の偏光回転素子は、λハーフプレートである、レーザ走査顕微鏡。 The laser scanning microscope according to any one of claims 1 to 3,
The laser scanning microscope, wherein the first and second polarization rotation elements are λ half plates.
前記第２のビーム路には光影響手段として少なくとも２つの部分ビームへのビーム分割部が設けられている、レーザ走査顕微鏡。 The laser scanning microscope according to any one of claims 1 to 4,
A laser scanning microscope, wherein the second beam path is provided with a beam splitting unit into at least two partial beams as light influencing means.
部分ビームは、互いに角度をなす、レーザ走査顕微鏡。 The laser scanning microscope according to any one of claims 1 to 5,
Laser scanning microscopes where the partial beams are angled with respect to each other.
前記第２のビーム路中で前記光影響手段の前方および前記第１のビーム路中で前記第１および前記第２の偏光スプリッタの間のうちの少なくとも一方には制御可能な光シャッタが設けられている、レーザ走査顕微鏡。 The laser scanning microscope according to any one of claims 3 to 6,
A controllable optical shutter is provided in front of the light influencing means in the second beam path and at least one of the first and second polarization splitters in the first beam path. A laser scanning microscope.
前記ＬＳＭの以下の動作モードの１つまたは複数が調整される、
・シングルスポットＬＳＭ
・マルチスポットＬＳＭ
・シングルスポットＦＭＭ
・マルチスポットＦＭＭ
・ＦＲＡＰシステム、
方法。 A method for a laser scanning microscope according to any one of claims 1 to 8, comprising:
One or more of the following operating modes of the LSM are adjusted:
・ Single spot LSM
・ Multi-spot LSM
・ Single spot FMM
・ Multi-spot FMM
・ FRAP system,
Method.
前記動作モードの切り替えは、ブリーチング過程または他の試料領域のマニピュレーションの後に、ＬＳＭのマルチスポットモードへの直接的切り替えが行われるように実行される、方法。 The method of claim 9, comprising:
Switching of the operation mode, after the manipulation of the bleaching process or other specimen regions, direct switching to the multi-spot mode of LSM is performed as is done, method.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102010047353.7 | 2010-10-01 | ||
| DE102010047353A DE102010047353A1 (en) | 2010-10-01 | 2010-10-01 | Laser Scanning Microscope with switchable mode of operation |
| PCT/EP2011/004873 WO2012041502A1 (en) | 2010-10-01 | 2011-09-29 | Laser scanning microscope with switchable operating mode |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013539079A JP2013539079A (en) | 2013-10-17 |
| JP2013539079A5 true JP2013539079A5 (en) | 2015-03-19 |
| JP5926266B2 JP5926266B2 (en) | 2016-05-25 |
Family
ID=44741266
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013530617A Active JP5926266B2 (en) | 2010-10-01 | 2011-09-29 | Laser scanning microscope with switchable operating configuration |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9632298B2 (en) |
| EP (1) | EP2622401B1 (en) |
| JP (1) | JP5926266B2 (en) |
| DE (1) | DE102010047353A1 (en) |
| WO (1) | WO2012041502A1 (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012010207B4 (en) | 2012-05-15 | 2024-02-29 | Carl Zeiss Microscopy Gmbh | Microscope and microscopy methods |
| DE102012019464A1 (en) * | 2012-09-28 | 2014-04-03 | Carl Zeiss Microscopy Gmbh | Confocal direct-light scanning microscope for multi-leak scanning |
| DE102013227108A1 (en) * | 2013-09-03 | 2015-03-05 | Leica Microsystems Cms Gmbh | Apparatus and method for assaying a sample |
| DE102013218231A1 (en) * | 2013-09-11 | 2015-03-12 | Sirona Dental Systems Gmbh | Optical system for generating a time-varying pattern for a confocal microscope |
| DE102013021182B4 (en) * | 2013-12-17 | 2023-06-07 | Carl Zeiss Microscopy Gmbh | Device and method for scanning microscopy |
| DE102014201472B4 (en) | 2014-01-28 | 2017-10-12 | Leica Microsystems Cms Gmbh | Method for reducing mechanical vibrations in electro-optical modulators and arrangement with an electro-optical modulator |
| DE102014117596A1 (en) * | 2014-12-01 | 2016-06-02 | Carl Zeiss Microscopy Gmbh | Light microscope and method for examining a microscopic sample with a light microscope |
| DE102016102286A1 (en) | 2016-02-10 | 2017-08-10 | Carl Zeiss Microscopy Gmbh | Apparatus and method for multispot scanning microscopy |
| DE102016120308A1 (en) | 2016-10-25 | 2018-04-26 | Carl Zeiss Microscopy Gmbh | Optical arrangement, multi-spot scanning microscope and method for operating a microscope |
| DE102017206203A1 (en) | 2017-04-11 | 2018-10-11 | Carl Zeiss Microscopy Gmbh | Optical arrangement for spectral selection, as well as device and microscope |
| DE102017207611A1 (en) * | 2017-05-05 | 2018-11-08 | Carl Zeiss Microscopy Gmbh | Illumination device for structuring illumination light and method for its operation |
| DE102018110083A1 (en) | 2018-04-26 | 2019-10-31 | Carl Zeiss Microscopy Gmbh | Optical arrangement for flexible multi-color lighting for a light microscope and method for this purpose |
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| US5034613A (en) | 1989-11-14 | 1991-07-23 | Cornell Research Foundation, Inc. | Two-photon laser microscopy |
| JP3816632B2 (en) | 1997-05-14 | 2006-08-30 | オリンパス株式会社 | Scanning microscope |
| CN1096004C (en) * | 1997-11-05 | 2002-12-11 | 朱润枢 | Phased array optical equipment and method |
| DE19829981C2 (en) | 1998-07-04 | 2002-10-17 | Zeiss Carl Jena Gmbh | Method and arrangement for confocal microscopy |
| DE19904592C2 (en) | 1999-02-05 | 2001-03-08 | Lavision Gmbh | Beam splitter device |
| JP2001091842A (en) * | 1999-09-21 | 2001-04-06 | Olympus Optical Co Ltd | Confocal microscope |
| JP4519987B2 (en) | 2000-04-13 | 2010-08-04 | オリンパス株式会社 | Focus detection device |
| DE10139754B4 (en) * | 2001-08-13 | 2004-07-08 | Leica Microsystems Heidelberg Gmbh | Illumination method for a scanning microscope and scanning microscope |
| JP4030838B2 (en) * | 2002-08-30 | 2008-01-09 | 独立行政法人科学技術振興機構 | Quantum circuit and quantum computer |
| US7463410B2 (en) * | 2003-07-16 | 2008-12-09 | Soreq Nuclear Research Center | Optical frequency converter for non-polarized light |
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| JP2007275908A (en) | 2006-04-03 | 2007-10-25 | Nippon Sharyo Seizo Kaisha Ltd | Laser machining apparatus |
| US7738079B2 (en) * | 2006-11-14 | 2010-06-15 | Asml Netherlands B.V. | Radiation beam pulse trimming |
| JP5551069B2 (en) | 2007-07-06 | 2014-07-16 | ナショナル ユニヴァーシティー オブ シンガポール | Fluorescence focus modulation microscope system and method |
| US20100277580A1 (en) * | 2007-11-23 | 2010-11-04 | Koninklijke Philips Electronics N.V. | Multi-modal spot generator and multi-modal multi-spot scanning microscope |
| US7817688B2 (en) * | 2008-02-19 | 2010-10-19 | Lockheed Martin Coherent Technologies, Inc. | Phase and polarization controlled beam combining devices and methods |
| DE102010013829A1 (en) | 2010-03-26 | 2011-09-29 | Carl Zeiss Microlmaging Gmbh | Microscope and method for detecting sample light |
| US9772484B2 (en) * | 2012-11-29 | 2017-09-26 | Citizen Watch Co., Ltd. | Light modulating device |
-
2010
- 2010-10-01 DE DE102010047353A patent/DE102010047353A1/en not_active Ceased
-
2011
- 2011-09-29 JP JP2013530617A patent/JP5926266B2/en active Active
- 2011-09-29 US US13/825,722 patent/US9632298B2/en active Active
- 2011-09-29 WO PCT/EP2011/004873 patent/WO2012041502A1/en active Application Filing
- 2011-09-29 EP EP11764482.3A patent/EP2622401B1/en active Active
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