JP2013535675A5 - - Google Patents

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JP2013535675A5
JP2013535675A5 JP2013521248A JP2013521248A JP2013535675A5 JP 2013535675 A5 JP2013535675 A5 JP 2013535675A5 JP 2013521248 A JP2013521248 A JP 2013521248A JP 2013521248 A JP2013521248 A JP 2013521248A JP 2013535675 A5 JP2013535675 A5 JP 2013535675A5
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Japan
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measurements
pixel
reflection components
characteristic
luminance
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JP2013521248A
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JP2013535675A (ja
JP6073786B2 (ja
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Priority claimed from PCT/IB2011/002359 external-priority patent/WO2012014077A2/en
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Publication of JP2013535675A5 publication Critical patent/JP2013535675A5/ja
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JP2013521248A 2010-07-29 2011-07-29 対象物の距離特性および／または輝度特性を測定する装置および方法 Expired - Fee Related JP6073786B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US40061610P 2010-07-29 2010-07-29
US61/400,616 2010-07-29
PCT/IB2011/002359 WO2012014077A2 (en) 2010-07-29 2011-07-29 Apparatus and method for measuring the distance and/or intensity characteristics of objects

Publications (3)

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JP2013535675A JP2013535675A (ja) 2013-09-12
JP2013535675A5 true JP2013535675A5 (enExample) 2014-08-28
JP6073786B2 JP6073786B2 (ja) 2017-02-01

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JP2013521248A Expired - Fee Related JP6073786B2 (ja) 2010-07-29 2011-07-29 対象物の距離特性および／または輝度特性を測定する装置および方法

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US (1) US9182492B2 (enExample)
EP (1) EP2598910A4 (enExample)
JP (1) JP6073786B2 (enExample)
KR (1) KR20130129358A (enExample)
CN (1) CN103261912B (enExample)
NZ (1) NZ607441A (enExample)
WO (1) WO2012014077A2 (enExample)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101871235B1 (ko) * 2012-06-05 2018-06-27 삼성전자주식회사 깊이 영상 생성 방법 및 장치, 깊이 영상 처리 방법 및 장치
AT513589B1 (de) * 2012-11-08 2015-11-15 Bluetechnix Gmbh Aufnahmeverfahren für zumindest zwei ToF-Kameras
US10003757B2 (en) 2012-12-28 2018-06-19 Nokia Technologies Oy Method and apparatus for de-noising data from a distance sensing camera
DE102013103333A1 (de) * 2013-04-03 2014-10-09 Karl Storz Gmbh & Co. Kg Kamera zur Erfassung von optischen Eigenschaften und von Raumstruktureigenschaften
US10230934B2 (en) * 2013-06-14 2019-03-12 Microsoft Tehcnology Licensing, Llc Depth map correction using lookup tables
US9542749B2 (en) * 2014-01-06 2017-01-10 Microsoft Technology Licensing, Llc Fast general multipath correction in time-of-flight imaging
CN103760567B (zh) * 2014-01-27 2016-06-15 中国科学院半导体研究所 一种具有测距功能的被动成像系统及其测距方法
DE102014207163B4 (de) * 2014-04-15 2025-02-06 pmdtechnologies ag Lichtlaufzeitkamerasystem
JP6520053B2 (ja) * 2014-11-06 2019-05-29 株式会社デンソー 光飛行型測距装置
RU2577079C1 (ru) * 2014-12-29 2016-03-10 Владимир Владиславович Имшенецкий Оптическое устройство для определения расстояний до объекта
RU2605628C1 (ru) * 2015-06-08 2016-12-27 Владимир Владиславович Имшенецкий Способ и оптическое устройство для определения расстояний до объекта
WO2017138032A1 (en) 2016-02-08 2017-08-17 Denso Corporation Time-of-flight distance measuring device and method for detecting multipath error
EP3414599B1 (en) 2016-02-08 2019-12-18 Denso Corporation Time-of-flight distance measuring device and method for detecting multipath error
CN107543569B (zh) * 2016-06-29 2020-04-28 财团法人工业技术研究院 基于调频声波的空间扰动检测方法与装置
TWI609193B (zh) * 2016-06-29 2017-12-21 財團法人工業技術研究院 基於調頻聲波的空間擾動偵測方法與裝置
US10598783B2 (en) 2016-07-07 2020-03-24 Microsoft Technology Licensing, Llc Multi-frequency unwrapping
US10557921B2 (en) 2017-01-23 2020-02-11 Microsoft Technology Licensing, Llc Active brightness-based strategy for invalidating pixels in time-of-flight depth-sensing
KR20180102933A (ko) * 2017-03-08 2018-09-18 삼성전자주식회사 Ui를 인식하는 디스플레이 장치 및 그 디스플레이 장치의 제어 방법
EP3395875B2 (de) * 2017-04-24 2023-01-25 Covestro Deutschland AG Laserstrahl-durchlässiges substratmaterial für sensoranwendungen
EP3399757A1 (en) * 2017-05-04 2018-11-07 Thomson Licensing Method and apparatus to encode and decode two-dimension point clouds
US10705598B2 (en) * 2017-05-09 2020-07-07 Microsoft Technology Licensing, Llc Tracking wearable device and handheld object poses
US10775501B2 (en) * 2017-06-01 2020-09-15 Intel Corporation Range reconstruction using shape prior
RU2653558C9 (ru) * 2017-06-06 2018-08-17 Владимир Владиславович Имшенецкий Оптическое устройство для определения расстояний до объекта
EP3438699A1 (de) * 2017-07-31 2019-02-06 Hexagon Technology Center GmbH Distanzmesser mit spad-anordnung zur berücksichtigung von mehrfachzielen
EP3460506A1 (en) * 2017-09-25 2019-03-27 Aptiv Technologies Limited Method for monitoring the performance range of an automotive radar system
DE102017128369A1 (de) 2017-11-30 2019-06-06 Infineon Technologies Ag Vorrichtung und verfahren zum lokalisieren eines ersten bauelements, lokalisierungsvorrichtung und verfahren zur lokalisierung
US10382736B1 (en) * 2018-02-09 2019-08-13 Infineon Technologies Ag Two frequency time-of-flight three-dimensional image sensor and method of measuring object depth
WO2019181695A1 (ja) * 2018-03-23 2019-09-26 パイオニア株式会社 測距装置
CN112823293B (zh) * 2018-10-04 2024-12-06 ams有限公司 高分辨率飞行时间测量
EP3871008A4 (en) 2018-10-24 2022-06-15 Red Leader Technologies, Inc. LIDAR SYSTEM AND OPERATING PROCEDURES
DE112019005749T5 (de) 2018-11-16 2021-08-05 Ams Sensors Singapore Pte. Ltd. Tiefenabtastung mittels optischer lichtlaufzeitverfahren durch einedurchlässige abdeckung
CN109298408B (zh) * 2018-11-22 2021-07-20 深圳天眼激光科技有限公司 一种激光扫描仪控制系统
KR102664396B1 (ko) 2019-01-15 2024-05-08 삼성전자주식회사 라이다 장치 및 그 동작 방법
US11272156B2 (en) 2019-02-15 2022-03-08 Analog Devices International Unlimited Company Spatial correlation sampling in time-of-flight imaging
US11874403B2 (en) * 2019-05-17 2024-01-16 Infineon Technologies Ag Reflectance sensing with time-of-flight cameras
WO2021005102A1 (en) * 2019-07-09 2021-01-14 Sony Semiconductor Solutions Corporation Electronic device and method for time-of-flight measurement
US11885880B2 (en) * 2019-07-31 2024-01-30 Microsoft Technology Licensing, Llc Unwrapped phases for time-of-flight modulation light
CN110596725B (zh) * 2019-09-19 2022-03-04 深圳奥锐达科技有限公司 基于插值的飞行时间测量方法及测量系统
WO2021114080A1 (zh) * 2019-12-10 2021-06-17 深圳市速腾聚创科技有限公司 激光雷达测距方法、装置、计算机设备和存储介质
WO2021258236A1 (zh) * 2020-06-22 2021-12-30 深圳市汇顶科技股份有限公司 飞时测距方法与装置
CN111474553B (zh) * 2020-06-22 2020-11-27 深圳市汇顶科技股份有限公司 飞时测距方法与装置
US20230116798A1 (en) * 2021-10-13 2023-04-13 Red Leader Technologies, Inc. Lidar system and method of operation
KR20230074273A (ko) 2020-10-13 2023-05-26 레드 리더 테크놀로지스, 인크. 라이다 시스템 및 동작 방법
US11762095B2 (en) 2022-02-01 2023-09-19 Red Leader Technologies, Inc. Lidar system and method of operation
CN116299363A (zh) * 2023-03-20 2023-06-23 福建杰木科技有限公司 一种iToF模组的两相位采样标定与校正方法及装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2543690B1 (fr) 1983-03-29 1986-01-17 Thomson Csf Systeme de telemetrie laser et de mesure doppler, a compression d'impulsions
US5534993A (en) 1994-06-15 1996-07-09 United Technologies Corporation Dual-wavelength frequency-chirped microwave AMCW ladar system
US5835199A (en) 1996-05-17 1998-11-10 Coherent Technologies Fiber-based ladar transceiver for range/doppler imaging with frequency comb generator
JP3631325B2 (ja) * 1996-06-19 2005-03-23 オリンパス株式会社 ３次元画像入力装置
DE60009565T2 (de) * 2000-01-26 2005-02-24 Instro Precision Ltd., Broadstairs Optische distanzmessung
US6798523B2 (en) * 2001-12-04 2004-09-28 Honeywell International Inc. Sensor and method for detecting fiber optic faults
US7561255B1 (en) * 2002-04-19 2009-07-14 Billmers Richard I System for viewing objects at a fire scene and method of use
US7420148B2 (en) * 2002-09-13 2008-09-02 Conti Temic Microelectronic Gmbh Method and device for determining a pixel gray scale value image
NZ525241A (en) 2003-04-08 2006-02-24 Univ Waikato Range sensing system with shuttered receiver.
US8242428B2 (en) 2007-12-06 2012-08-14 The United States Of America As Represented By The Secretary Of The Army Method and system for lidar using spatial information from a light source in combination with nonspatial information influenced by the subject to derive an image
NZ535322A (en) * 2004-09-13 2006-07-28 Univ Waikato Range sensing system
US7239983B2 (en) * 2005-07-08 2007-07-03 Enerlab, Inc. System and method for measuring characteristics of continuous media and/or localized targets using at least one multi-frequency sensor
JP4855749B2 (ja) * 2005-09-30 2012-01-18 株式会社トプコン 距離測定装置
DE102005056265A1 (de) * 2005-11-14 2007-05-16 Pilz Gmbh & Co Kg Vorrichtung und Verfahren zum Überwachen eines Raumbereichs, insbesondere zum Absichern eines Gefahrenbereichs einer automatisiert arbeitenden Anlage
EP1793243A1 (de) * 2005-12-05 2007-06-06 Leica Geosystems AG Verfahren zur Auflösung einer Phasenmehrdeutigkeit
US7995191B1 (en) * 2006-06-29 2011-08-09 Sandia Corporation Scannerless laser range imaging using loss modulation
JP4831760B2 (ja) * 2007-03-29 2011-12-07 日本放送協会 ３次元情報検出方法及びその装置
US7495748B1 (en) * 2007-08-20 2009-02-24 Sandia Corporation Scannerless loss modulated flash color range imaging
US7420656B1 (en) * 2007-08-20 2008-09-02 Sandia Corporation Scannerless loss modulated flash color range imaging
NZ562739A (en) * 2007-10-19 2010-04-30 Waikatolink Ltd Signal simulation apparatus and method
JP5019117B2 (ja) * 2007-11-14 2012-09-05 スタンレー電気株式会社 距離画像生成装置

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