JP2013250478A5 - - Google Patents
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- JP2013250478A5 JP2013250478A5 JP2012126114A JP2012126114A JP2013250478A5 JP 2013250478 A5 JP2013250478 A5 JP 2013250478A5 JP 2012126114 A JP2012126114 A JP 2012126114A JP 2012126114 A JP2012126114 A JP 2012126114A JP 2013250478 A5 JP2013250478 A5 JP 2013250478A5
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- light source
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- exposure apparatus
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Description
本発明の転写方法においては、標準的なLCD用露光装置を用いることができる。この場合、例えば、開口数NAを0.06〜0.10、コヒレンスσを0.5〜1.0の範囲とすることができる。こうした露光装置は、一般に、3μm程度を解像限界としている。露光光源としては、365〜436nm(i線〜g線)を含む光源を用いることが好ましい。 In the transfer method of the present invention, a standard LCD exposure apparatus can be used. In this case, for example, the numerical aperture NA can be in the range of 0.06 to 0.10, and the coherence σ can be in the range of 0.5 to 1.0. Such an exposure apparatus generally has a resolution limit of about 3 μm. As the exposure light source, a light source including 365 to 436 nm (i-line to g-line) is preferably used.
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012126114A JP6093117B2 (en) | 2012-06-01 | 2012-06-01 | Photomask, photomask manufacturing method, and pattern transfer method |
TW102117083A TWI475316B (en) | 2012-06-01 | 2013-05-14 | A method of manufacturing a mask and a mask, and a method of transferring the pattern |
TW104136941A TWI605300B (en) | 2012-06-01 | 2013-05-14 | Photomask, pattern transfer method, flat panel display manufacturing method, and blank mask |
TW104101989A TWI516857B (en) | 2012-06-01 | 2013-05-14 | A flat panel display manufacturing mask, a pattern transfer method, and a method of manufacturing a flat panel display |
KR1020130059063A KR101528973B1 (en) | 2012-06-01 | 2013-05-24 | Photomask, method for manufacturing the photomask and pattern transfer method |
CN201510763096.1A CN105573046B (en) | 2012-06-01 | 2013-05-30 | Photomask, method for manufacturing photomask, and method for transferring pattern |
CN201310208301.9A CN103454851B (en) | 2012-06-01 | 2013-05-30 | The manufacture method of photomask, photomask and the printing transferring method of pattern |
KR1020140080183A KR101999412B1 (en) | 2012-06-01 | 2014-06-27 | Photomask, method for manufacturing the photomask and pattern transfer method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012126114A JP6093117B2 (en) | 2012-06-01 | 2012-06-01 | Photomask, photomask manufacturing method, and pattern transfer method |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016196977A Division JP6322250B2 (en) | 2016-10-05 | 2016-10-05 | Photomask blank |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2013250478A JP2013250478A (en) | 2013-12-12 |
JP2013250478A5 true JP2013250478A5 (en) | 2015-03-19 |
JP6093117B2 JP6093117B2 (en) | 2017-03-08 |
Family
ID=49737384
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012126114A Active JP6093117B2 (en) | 2012-06-01 | 2012-06-01 | Photomask, photomask manufacturing method, and pattern transfer method |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6093117B2 (en) |
KR (2) | KR101528973B1 (en) |
CN (2) | CN105573046B (en) |
TW (3) | TWI475316B (en) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103969940A (en) | 2014-04-22 | 2014-08-06 | 京东方科技集团股份有限公司 | Phase shift mask plate and source drain mask plate |
JP6581759B2 (en) * | 2014-07-17 | 2019-09-25 | Hoya株式会社 | Photomask, photomask manufacturing method, photomask blank, and display device manufacturing method |
JP6335735B2 (en) * | 2014-09-29 | 2018-05-30 | Hoya株式会社 | Photomask and display device manufacturing method |
JP6767735B2 (en) * | 2015-06-30 | 2020-10-14 | Hoya株式会社 | Photomasks, photomask design methods, photomask blanks, and display device manufacturing methods |
JP6726553B2 (en) * | 2015-09-26 | 2020-07-22 | Hoya株式会社 | Photomask manufacturing method and display device manufacturing method |
WO2018123462A1 (en) * | 2016-12-28 | 2018-07-05 | 富士フイルム株式会社 | Pattern manufacturing method, color filter manufacturing method, method of manufacturing sold state imaging element, and method of manufacturing image display device |
JP6259509B1 (en) * | 2016-12-28 | 2018-01-10 | 株式会社エスケーエレクトロニクス | Halftone mask, photomask blank, and method of manufacturing halftone mask |
CN108319103B (en) * | 2017-01-16 | 2023-11-28 | Hoya株式会社 | Phase shift mask blank, method for manufacturing phase shift mask using the same, and method for manufacturing display device |
JP7080070B2 (en) * | 2017-03-24 | 2022-06-03 | Hoya株式会社 | Manufacturing method of photomask and display device |
JP2019012280A (en) * | 2018-09-19 | 2019-01-24 | Hoya株式会社 | Photomask, production method thereof, photomask blank, and production method of display device |
TWI712851B (en) * | 2018-10-22 | 2020-12-11 | 日商Hoya股份有限公司 | Photomask, method of manufacturing a photomask, and method of manufacturing an electronic device |
JP7261709B2 (en) * | 2019-09-13 | 2023-04-20 | Hoya株式会社 | Photomask, photomask manufacturing method, and display device manufacturing method |
JP7383490B2 (en) * | 2020-01-07 | 2023-11-20 | 株式会社エスケーエレクトロニクス | photo mask |
JP6872061B2 (en) * | 2020-05-11 | 2021-05-19 | Hoya株式会社 | Manufacturing method of photomask and display device |
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JP4009219B2 (en) * | 2003-04-10 | 2007-11-14 | 松下電器産業株式会社 | Photomask, pattern formation method using the photomask, and mask data creation method |
JP4574343B2 (en) * | 2004-12-15 | 2010-11-04 | 三星電子株式会社 | Phase shift mask and pattern forming method |
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KR20080107242A (en) * | 2006-03-06 | 2008-12-10 | 파나소닉 주식회사 | Photomask, method for manufacturing such photomask, pattern forming method using such photomask and mask data creating method |
JP4993934B2 (en) * | 2006-03-31 | 2012-08-08 | Hoya株式会社 | Pattern defect inspection method, photomask manufacturing method, and display device substrate manufacturing method |
TWI331253B (en) * | 2006-12-25 | 2010-10-01 | Nanya Technology Corp | Alternating phase shift mask and method of the same |
TWI422961B (en) * | 2007-07-19 | 2014-01-11 | Hoya Corp | Photomask and method of manufacturing the same, method of transferring a pattern, and method of manufacturing a display device |
JP4934237B2 (en) * | 2007-09-29 | 2012-05-16 | Hoya株式会社 | Gray-tone mask manufacturing method, gray-tone mask, and pattern transfer method |
JP2009128558A (en) * | 2007-11-22 | 2009-06-11 | Hoya Corp | Photomask and method for manufacturing photomask, and pattern transfer method |
JP5588633B2 (en) | 2009-06-30 | 2014-09-10 | アルバック成膜株式会社 | Phase shift mask manufacturing method, flat panel display manufacturing method, and phase shift mask |
TWI461833B (en) * | 2010-03-15 | 2014-11-21 | Hoya Corp | Multi-tone photomask, method of manufacturing a multi-tone photomask, and pattern transfer method |
JP2011215226A (en) * | 2010-03-31 | 2011-10-27 | Hoya Corp | Multi-level gradation photomask, method for manufacturing multi-level gradation photomask, blank for multi-level gradation photomask, and method for transferring pattern |
JP5400698B2 (en) * | 2010-04-28 | 2014-01-29 | Hoya株式会社 | Multi-tone photomask, multi-tone photomask manufacturing method, pattern transfer method, and multi-tone photomask use method |
-
2012
- 2012-06-01 JP JP2012126114A patent/JP6093117B2/en active Active
-
2013
- 2013-05-14 TW TW102117083A patent/TWI475316B/en active
- 2013-05-14 TW TW104101989A patent/TWI516857B/en active
- 2013-05-14 TW TW104136941A patent/TWI605300B/en active
- 2013-05-24 KR KR1020130059063A patent/KR101528973B1/en active IP Right Grant
- 2013-05-30 CN CN201510763096.1A patent/CN105573046B/en active Active
- 2013-05-30 CN CN201310208301.9A patent/CN103454851B/en active Active
-
2014
- 2014-06-27 KR KR1020140080183A patent/KR101999412B1/en active IP Right Grant
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