JP2013131528A - Mounting method of surface-mounted electronic device, and mounting substrate for the same - Google Patents

Mounting method of surface-mounted electronic device, and mounting substrate for the same Download PDF

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JP2013131528A
JP2013131528A JP2011278211A JP2011278211A JP2013131528A JP 2013131528 A JP2013131528 A JP 2013131528A JP 2011278211 A JP2011278211 A JP 2011278211A JP 2011278211 A JP2011278211 A JP 2011278211A JP 2013131528 A JP2013131528 A JP 2013131528A
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mounting
electronic device
terminal
terminal pad
mounting substrate
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Chisato Ishimaru
千里 石丸
Tsutomu Yamakawa
務 山川
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Nihon Dempa Kogyo Co Ltd
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Nihon Dempa Kogyo Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a mounting method of a surface-mounted electronic device capable of maintaining strength of a joint portion by suppressing reduction in solder joining strength caused by void formation without reducing as much as possible an area of a joint surface of a terminal pad and a mounting terminal, and to provide a mounting substrate for the same.SOLUTION: The mounting method of the surface-mounted electronic device comprises steps of: providing a small hole 10 which captures a bubble at each central part of a plurality of terminal pads 9 provided on a mounting substrate 200 to which a surface-mounted electronic device 100 is mounted; and joining both with a solder film 12 by a solder reflow process while maintaining a surface of the electronic device on a mounting terminal 5 side to be flat.

Description

本発明は、表面実装用の電子デバイスの実装構造に係り、特に、表面実装後における端子と接続パッドを接続する半田層のクラック等を防止し、強固な接続を可能とした表面実装型電子デバイスの実装方法とその実装基板に関する。   The present invention relates to a mounting structure of an electronic device for surface mounting, and in particular, a surface mounting electronic device capable of preventing a crack of a solder layer connecting a terminal and a connection pad after surface mounting and enabling a strong connection. The mounting method and its mounting substrate.

携帯電話機や所謂タブレットなどの携帯情報端末、あるいは車載の各種電子機器の普及に伴って、これらの機器に搭載される電子部品の多くは表面実装型デバイス(Surface Mounting Device)と称する小型かつ低背な部品として搭載されるようになった。表面実装型デバイスは、その腹面(実装基板との対向面)に平坦な接続端子(表面実装端子)を備え、実装基板の表面に形成された端子パッド(ランドとも称する)に面―面対応で半田接続される。ここでは、表面実装型デバイスとして水晶振動子を例として説明する。しかし、本発明は、これに限るものではなく、SAWフィルタなどの水晶関連部品、その他の積層回路部品、各種のデスクリート部品にも同様に適用できるものである。   With the widespread use of mobile information terminals such as mobile phones and so-called tablets or various on-vehicle electronic devices, many of the electronic components mounted on these devices are small and low-profile devices called surface mounting devices. It came to be mounted as a special part. A surface mount device has a flat connection terminal (surface mount terminal) on its abdominal surface (opposite surface to the mounting substrate), and is surface-to-surface compatible with terminal pads (also referred to as lands) formed on the surface of the mounting substrate. Soldered. Here, a crystal resonator will be described as an example of the surface mount device. However, the present invention is not limited to this, and can be similarly applied to crystal-related components such as SAW filters, other laminated circuit components, and various discrete components.

ここで例として説明する水晶振動子は、小型・軽量であることから周波数や時間の基準源として単独で、あるいは他の関連回路に組み込まれ、各種の電子機器に内蔵される。近年では、車載機器のような温度環境に変化の大きい電子機器では、経時変化(ヒートサイクル)に伴う熱膨張係数差、あるいは外力印加による基板歪等の応力変化に起因する半田クラック、電子デバイスや実装基板のダメージを防止したものが求められている。   Since the crystal resonator described here as an example is small and light, it can be used alone as a reference source for frequency or time, or incorporated in other related circuits, and incorporated in various electronic devices. In recent years, in electronic devices that have a large change in temperature environment such as in-vehicle devices, differences in thermal expansion coefficient due to changes over time (heat cycle), or solder cracks due to stress changes such as substrate strain due to external force application, electronic devices, What prevents damage to the mounting board is required.

図6は、実装基板に設ける端子パッドの従来例の幾つかを説明する平面図である。なお、ランドあるいはランドパターンとも称する端子パッドは、実装基板に実装する表面実装型の電子デバイスの実装端子に応じて設けられる。図6には各2個の端子パッドのみを示した。図中、9(9a,9b)は実装基板200に形成した端子パッド、11は溝であり、点線で示した符号(5a,5b)は表面実装型の電子デバイスとしての水晶振動子の実装端子を示し、実装基板に設けた端子パッドのそれぞれと半田により接続される。   FIG. 6 is a plan view for explaining some of the conventional terminal pads provided on the mounting board. Note that terminal pads, which are also referred to as lands or land patterns, are provided according to mounting terminals of a surface-mount type electronic device mounted on a mounting substrate. FIG. 6 shows only two terminal pads. In the figure, 9 (9a, 9b) is a terminal pad formed on the mounting substrate 200, 11 is a groove, and reference numerals (5a, 5b) indicated by dotted lines are mounting terminals of a crystal resonator as a surface-mount type electronic device. And connected to each of the terminal pads provided on the mounting substrate by soldering.

図6(a)は第1従来例で、端子パッド9(9a,9b)の中央を通って交差し、各端が外部に開放した縦横の溝11を設けたものである。この構成としたことで、実装端子(5a,5b)を半田で接続する際の半田リフロー時に溶融した半田層内に発生する気泡をこの溝から外部に逃がすことで、半田の固化で形成されるボイドの発生を防止している(特許文献1参照)。   FIG. 6A shows a first conventional example in which vertical and horizontal grooves 11 are provided which intersect through the center of the terminal pads 9 (9a, 9b) and open at the ends to the outside. With this configuration, the bubbles generated in the solder layer melted at the time of solder reflow when the mounting terminals (5a, 5b) are connected by solder are released from the groove to the outside, thereby forming the solidified solder. Generation of voids is prevented (see Patent Document 1).

図6(b)は第2従来例であり、端子パッド9(9a,9b)の中央を通って両端が外部に開放した縦の溝11を設けたものである。この構成としたことで、第1従来例と同様に、実装端子(5a,5b)を半田で接続する際の半田リフロー時に溶融した半田層内に発生する気泡をこの溝11から外部に逃がすことで、半田の固化で形成されるボイドの発生成を防止している(特許文献2参照)。   FIG. 6B shows a second conventional example in which a vertical groove 11 having both ends open to the outside through the center of the terminal pad 9 (9a, 9b) is provided. With this configuration, bubbles generated in the solder layer melted at the time of solder reflow when the mounting terminals (5a, 5b) are connected by solder are released from the groove 11 to the outside as in the first conventional example. Therefore, generation of voids formed by solidification of solder is prevented (see Patent Document 2).

図6(c)は第3従来例であり、端子パッド9(9a,9b)の一辺から切り込んだ横溝(切り込み溝)11を設けたものである。横溝11は対辺まで届かずに端子パッド内で留まった形状に形成されている。この構成としたことでも、第1、2従来例と同様に、実装端子(5a,5b)を半田で接続する際の半田リフロー時に溶融した半田層内に発生する気泡をこの溝11から外部に逃がすことで、半田の固化で形成されるボイドの発生成を防止している(特許文献3参照)。   FIG. 6C shows a third conventional example in which a lateral groove (cut groove) 11 cut from one side of the terminal pad 9 (9a, 9b) is provided. The lateral groove 11 is formed in a shape that does not reach the opposite side and stays in the terminal pad. Even with this configuration, as in the first and second conventional examples, bubbles generated in the solder layer melted at the time of solder reflow when the mounting terminals (5a, 5b) are connected by solder are exposed from the groove 11 to the outside. By letting it escape, generation of voids formed by solidification of solder is prevented (see Patent Document 3).

国際公開WO2006/033170号International Publication WO2006 / 033170 特開平10−75042号公報Japanese Patent Laid-Open No. 10-75042 特開2007−13043号公報JP 2007-13043 A

実装基板に設ける端子パッドは、表面実装型の電子デバイスの実装端子と当該端子パッドとの両者間に溶着した半田膜を介して接合される。この接合の強度は、半田膜の溶着強度が等しければ、端子パッドと実装端子の接合面の面積が広いほど大きい。したがって、前記した従来技術のように両端あるいは一端が外部に開放した溝を設けると、上記した接合面の面積は少なくなって、その分の接合強度は低下する場合がある。   The terminal pad provided on the mounting substrate is bonded via a solder film welded between the mounting terminal of the surface mounting type electronic device and the terminal pad. The strength of this bonding increases as the area of the bonding surface between the terminal pad and the mounting terminal increases as long as the welding strength of the solder film is equal. Therefore, when grooves having both ends or one end opened to the outside as in the prior art described above are provided, the area of the joint surface described above may be reduced, and the joint strength may be reduced accordingly.

また、上記のような溝が端子パッドに存在すると、実装基板あるいは搭載部品に対して外力の印加や温度ストレスにより、上記の溝部に応力が集中して接合力の分布が不均衡になり、接合部分の分離や接合部にクラックが発生して固着部の破壊や、電子デバイスや実装基板にダメージをもたらす虞がある。   In addition, if such a groove exists in the terminal pad, the stress is concentrated on the groove portion due to the application of external force or temperature stress to the mounting substrate or mounted component, and the bonding force distribution becomes unbalanced. There is a risk that cracks may occur in the separation of the parts or in the joints, resulting in destruction of the fixed parts and damage to the electronic device or the mounting substrate.

本発明の目的は、このような従来技術における課題を解決することにあり、実装基板の端子パッドと電子デバイスの実装端子の接合面の面積を極力低減させることなく、溶融半田に発生する気泡に起因するボイドによる半田接合強度の低下を抑制して、接合部分の強度を接合面の全域でバランスよく維持できる表面実装型電子デバイスの実装方法とその実装基板を提供することにある。   An object of the present invention is to solve such a problem in the prior art, and to reduce bubbles generated in molten solder without reducing the area of the joint surface between the terminal pad of the mounting substrate and the mounting terminal of the electronic device as much as possible. It is an object of the present invention to provide a mounting method for a surface-mount type electronic device and its mounting substrate capable of suppressing a decrease in solder joint strength due to the voids caused and maintaining the strength of the joint portion in a balanced manner over the entire joint surface.

上記目的を達成するため、本発明は、表面実装型の電子デバイスを搭載(実装)する実装基板に設ける複数の端子パッドの各中心部に気泡を捕獲する小孔を設け、電子デバイスの実装端子(外部端子)側の表面は平坦のままとして半田リフロー工程で両者を接合することを特徴とする。すなわち、実装基板に設ける複数の端子パッドにのみ設ける小孔は、端子パッドを貫通して基板面に達する。その底部には実装基板の表面が露出している。実装基板はガラスエポキシ板、セラミックス板などの絶縁材料で構成される。   In order to achieve the above object, the present invention provides a mounting terminal for an electronic device by providing a small hole for capturing air bubbles in each central portion of a plurality of terminal pads provided on a mounting substrate on which a surface mounting type electronic device is mounted (mounted). The surface on the (external terminal) side is kept flat and both are joined in a solder reflow process. That is, the small holes provided only in the plurality of terminal pads provided on the mounting substrate penetrate the terminal pads and reach the substrate surface. The surface of the mounting substrate is exposed at the bottom. The mounting substrate is made of an insulating material such as a glass epoxy plate or a ceramic plate.

端子パッドと実装端子の接合面を共にフラット、すなわち、上記したような溝などを形成しないものでは、半田の溶融で当該半田膜内に発生する気泡は溶融半田膜の中央部分に集まる傾向があることが経験的に分かっている。前記従来技術の技術思想は、発生する気泡を当該端子パッドに形成した溝等を通して外部に放出することで、硬化した半田膜にボイドが形成されることを防止するものである。これに対し、本発明では、リフロー半田の溶融により発生する気泡は、実装基板に設ける複数の端子パッドの中心部に設けた小孔に捕獲される。   When both the contact surfaces of the terminal pad and the mounting terminal are flat, that is, when the groove as described above is not formed, bubbles generated in the solder film due to melting of the solder tend to collect in the central portion of the molten solder film. I know from experience. The technical idea of the prior art is to prevent voids from being formed in the hardened solder film by discharging the generated bubbles to the outside through a groove or the like formed in the terminal pad. On the other hand, in the present invention, bubbles generated by melting of the reflow solder are trapped in small holes provided at the center portions of the plurality of terminal pads provided on the mounting substrate.

気泡を捕獲する小孔を実装基板に設ける端子パッド側にのみ設けたことで、溶融した半田は当該小孔の上方にある連続して平坦な実装端子を濡れ流れて当該実装端子の全面に行き渡る。気泡の量がある程度多い場合でも、気泡は半田が存在する実装端子側よりも半田が濡れ難い実装基板の表面側(小孔の底)に寄る傾向となる。そのため、両者の接合面積は、端子パッドに設けた小孔部分に限定され、接合面積の低減は最小限に抑制される。   By providing a small hole for capturing bubbles only on the terminal pad side provided on the mounting board, the molten solder wets and flows over the entire surface of the mounting terminal continuously above the small hole. . Even when the amount of air bubbles is large to some extent, the air bubbles tend to be closer to the surface side of the mounting substrate (bottom of the small holes) where the solder is harder to wet than the mounting terminal side where the solder is present. Therefore, the bonding area between the two is limited to the small hole provided in the terminal pad, and the reduction of the bonding area is suppressed to the minimum.

本発明による表面実装型電子デバイスの一例としての水晶振動子の実装方法その実装基板の実施例1の説明図である。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is an explanatory diagram of a mounting method of a crystal resonator as an example of a surface mount electronic device according to an embodiment of the present invention; 本発明における電子デバイスの一例である水晶振動子の説明図である。It is explanatory drawing of the crystal oscillator which is an example of the electronic device in this invention. 本発明における電子デバイスの一例である水晶振動子を構成する水晶振動片の構成例の説明図である。It is explanatory drawing of the structural example of the quartz crystal vibrating piece which comprises the crystal oscillator which is an example of the electronic device in this invention. 本発明の電子デバイスである水晶振動子を実装する実装基板に設けた端子パッドの一例の説明図である。It is explanatory drawing of an example of the terminal pad provided in the mounting substrate which mounts the crystal oscillator which is an electronic device of this invention. 本発明による表面実装型電子デバイスの一例である水晶振動子の実装方法とその実装基板の実施例2の説明図である。It is explanatory drawing of Example 2 of the mounting method of the crystal oscillator which is an example of the surface mounted electronic device by this invention, and its mounting substrate. 実装基板に設ける端子パッドの従来例の幾つかを説明する平面図である。It is a top view explaining some of the conventional examples of the terminal pad provided in a mounting board.

以下、本発明の実施形態について、実施例の図面を参照して詳細に説明する。   DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings of the examples.

図1は、本発明による表面実装型電子デバイスの一例としての水晶振動子の実装方法その実装基板の実施例1の説明図である。図1(a)は実装基板に水晶振動子を実装した状態を示す要部断面図、同図(b)は実装基板に形成された端子パッド(ランドまたはランドパターン)の平面図、同図(c)は同図(a)のA部分を拡大して示す模式図である。   FIG. 1 is an explanatory view of a mounting method of a crystal resonator as an example of a surface-mount type electronic device according to the present invention, in a first embodiment of the mounting substrate. FIG. 1A is a cross-sectional view of a principal part showing a state where a crystal resonator is mounted on a mounting substrate, FIG. 1B is a plan view of a terminal pad (land or land pattern) formed on the mounting substrate, and FIG. c) is a schematic diagram showing an enlarged portion A of FIG.

図1(a)において、表面実装型の電子デバイスである水晶振動子100は実装基板200に搭載される。水晶振動子100の腹面(実装面)には複数の実装端子5が設けられており、実装基板200の主面(実装面)には、実装端子と対応する複数のランドパターン、すなわち端子パッド9が形成されている。実装端子5の全表面(全外面)は平坦面となっている。一方、実装基板200側の端子パッド9には、図1(b)に拡大して示したように、その中心部に小孔10が形成されている。小孔10は端子パッド9を基板方向に貫通して当該基板の表面に達し、開口している。本実施例では、図1(b)に破線で示した水晶振動子100の端子パッド5は、実線で示す端子パッド9より小さいのが一般的であるが、これに限らず、端子パッド9の方が実装端子5よりも小さい場合もある。   In FIG. 1A, a crystal resonator 100 that is a surface-mount type electronic device is mounted on a mounting substrate 200. A plurality of mounting terminals 5 are provided on the abdominal surface (mounting surface) of the crystal unit 100, and a plurality of land patterns corresponding to the mounting terminals, that is, terminal pads 9 are provided on the main surface (mounting surface) of the mounting substrate 200. Is formed. The entire surface (all outer surfaces) of the mounting terminal 5 is a flat surface. On the other hand, a small hole 10 is formed in the center portion of the terminal pad 9 on the mounting substrate 200 side as shown in an enlarged view in FIG. The small hole 10 penetrates the terminal pad 9 in the substrate direction, reaches the surface of the substrate, and is opened. In the present embodiment, the terminal pad 5 of the crystal unit 100 indicated by a broken line in FIG. 1B is generally smaller than the terminal pad 9 indicated by a solid line. The direction may be smaller than the mounting terminal 5.

水晶振動子100など、この種の電子デバイスの基板への実装は、当該基板200の端子パッド9に半田膜12を塗布しておき、この端子パッド9に水晶振動子100を実装端子5が当該端子パッドの位置と一致するよう位置づけした状態で加熱炉、あるいはホットプレートを用いてリフロー処理を施す。リフロー工程において、半田膜12が溶融して水晶振動子100の実装端子5の表面に濡れ広がり、端子パッド9との間に半田膜が満たされる。その後、半田膜が冷えて硬化(固化)することで水晶振動子100が基板200に実装される。   To mount this type of electronic device such as the crystal unit 100 on a substrate, the solder film 12 is applied to the terminal pad 9 of the substrate 200, and the mounting unit 5 attaches the crystal unit 100 to the terminal pad 9. A reflow process is performed using a heating furnace or a hot plate in a state of being aligned with the position of the terminal pad. In the reflow process, the solder film 12 melts and spreads on the surface of the mounting terminal 5 of the crystal unit 100, and the solder film is filled between the terminal pads 9. Thereafter, the solder film is cooled and cured (solidified), whereby the crystal unit 100 is mounted on the substrate 200.

この半田リフロー工程において、半田膜に含まれる溶剤が気化して当該半田膜中に気泡が発生する。この気泡は溶融した半田の中を実装端子5の中心方向に移動し、実装端子5に設けた小孔10に逗留する。リフロー工程の後段で半田膜12が冷えて硬化する過程で気泡8は縮小し、気泡のあった部分にボイドが形成される。   In this solder reflow process, the solvent contained in the solder film is vaporized and bubbles are generated in the solder film. The bubbles move in the molten solder toward the center of the mounting terminal 5 and stay in the small hole 10 provided in the mounting terminal 5. In the process where the solder film 12 is cooled and hardened after the reflow process, the bubbles 8 shrink and voids are formed in the portions where the bubbles exist.

図1(c)は同(a)のA部分を拡大して示す模式図である。前記したように、半田リフロー工程で溶融した半田は端子パッド9の表面の全域を覆うと共に、実装端子5の表面を小孔10を迂回するように流動して端子パッド9の表面と実装端子5の間を充填して流動する。小孔10の底面(水晶振動子の容器本体の表面)は溶融半田に対する濡れ性が低いため、小孔10の底面には半田は流れ込みにくい。そのため、気泡が端子パッド9の表面に接していても、この接した部分の気泡と端子パッド9の間を押し広げて流動する。その結果、気泡は小孔10の基板側に寄って留まる。   FIG.1 (c) is a schematic diagram which expands and shows the A part of the same (a). As described above, the solder melted in the solder reflow process covers the entire surface of the terminal pad 9 and flows around the surface of the mounting terminal 5 so as to bypass the small hole 10, and the surface of the terminal pad 9 and the mounting terminal 5. It fills between and flows. Since the bottom surface of the small hole 10 (the surface of the container body of the crystal unit) has low wettability to the molten solder, it is difficult for the solder to flow into the bottom surface of the small hole 10. For this reason, even if the bubbles are in contact with the surface of the terminal pad 9, the bubbles flow between the bubbles in the contacted portion and the terminal pad 9. As a result, the bubbles stay on the substrate side of the small holes 10.

半田の温度が低下し、半田膜12が冷えて硬化したとき、気泡が存在する部分にボイド(空間)80が形成される。ボイド80は実装基板側に形成される。図1(c)では、ボイド80が端子パッド9の表面より高い位置にまで存在しているように図示されているが、このような状態でボイド80が形成されるものに限らず、端子パッド9の表面より低い位置に形成される場合もある。   When the temperature of the solder is lowered and the solder film 12 is cooled and hardened, a void (space) 80 is formed in a portion where bubbles exist. The void 80 is formed on the mounting substrate side. In FIG. 1 (c), the void 80 is illustrated as being present at a position higher than the surface of the terminal pad 9, but the present invention is not limited to the case where the void 80 is formed in this state, but the terminal pad. It may be formed at a position lower than the surface of 9.

図2は、本発明における電子デバイスの一例である水晶振動子の説明図である。図2(a)は一部を断面で示す側面図、同図(b)は実装面である腹面を示す平面図である。この水晶振動子100は容器本体1の内部空間(凹部、キャビティとも称する)に水晶振動片2が設置されている。容器本体1は多層のセラミック基板からなり、実装面である背面に4個の実装端子5(5a、5b、5c、5d)が設けられている。実装端子5は水晶振動子の外部端子とも称し、この水晶振動子が搭載される機器の実装基板に形成された端子パッド9に半田膜のリフロー処理で接合される。端子パッド9は実装基板に形成された配線・回路パターンに接続するランドパターンとも称する部分である。   FIG. 2 is an explanatory diagram of a crystal resonator which is an example of an electronic device according to the present invention. 2A is a side view partially showing a cross section, and FIG. 2B is a plan view showing an abdominal surface which is a mounting surface. In the crystal resonator 100, the crystal resonator element 2 is installed in an internal space (also referred to as a recess or a cavity) of the container body 1. The container body 1 is formed of a multilayer ceramic substrate, and four mounting terminals 5 (5a, 5b, 5c, 5d) are provided on the back surface as a mounting surface. The mounting terminal 5 is also referred to as an external terminal of the crystal resonator, and is bonded to a terminal pad 9 formed on a mounting substrate of a device on which the crystal resonator is mounted by reflow processing of a solder film. The terminal pad 9 is a portion also called a land pattern connected to a wiring / circuit pattern formed on the mounting substrate.

容器本体1は底壁1a、枠壁1bの積層体であり、枠壁1bで囲まれた凹部1cの内底面に設けた水晶端子(図示せず)に導電性接着剤4(4a,4b)で固定される。水晶片2を取り付けた凹部1cは金属板からなる蓋体7で密封される。なお、図2(b)で、実装端子5cにのみ向き識別部50を形成してある。この突起は、水晶振動子100の実装時の向きを識別する指標である。   The container body 1 is a laminate of a bottom wall 1a and a frame wall 1b, and a conductive adhesive 4 (4a, 4b) is attached to a crystal terminal (not shown) provided on the inner bottom surface of a recess 1c surrounded by the frame wall 1b. It is fixed with. The recess 1c to which the crystal piece 2 is attached is sealed with a lid 7 made of a metal plate. In FIG. 2B, the orientation identifying part 50 is formed only on the mounting terminal 5c. This protrusion is an index for identifying the orientation when the crystal unit 100 is mounted.

図3は、本発明における電子デバイスの一例である水晶振動子を構成する水晶振動片の構成例の説明図である。水晶片2は、略矩形の薄い水晶片の表裏に励振電極2(2a,2b)を形成してある。励振電極2(2a,2b)は引出電極3(3a,3b)で水晶片2の一端に引き出されている。この端部で前記した導電性接着剤4(4a,4b)を用いて凹部1cの内底面に設けた水晶端子に固定される。   FIG. 3 is an explanatory diagram of a configuration example of a crystal resonator element that constitutes a crystal resonator that is an example of an electronic device according to the present invention. The crystal piece 2 is formed with excitation electrodes 2 (2a, 2b) on the front and back of a substantially rectangular thin crystal piece. The excitation electrode 2 (2a, 2b) is extracted to one end of the crystal piece 2 by the extraction electrode 3 (3a, 3b). This end is fixed to a crystal terminal provided on the inner bottom surface of the recess 1c using the conductive adhesive 4 (4a, 4b) described above.

図4は、本発明の電子デバイスである水晶振動子を実装する実装基板に設けた端子パッドの一例の説明図で、同図(a)は平面図、同図(b)は同図(a)のX−X’線に沿った断面図である。端子パッド9(9a、9b、9c、9d)は前記した水晶振動子の実装端子に対応させた配置と大きさで形成されている。そして、各端子パッド9(9a、9b、9c、9d)の中心部分には小孔10(10a、10b、10c、10d)が形成されている。   FIG. 4 is an explanatory diagram of an example of a terminal pad provided on a mounting substrate on which a crystal resonator as an electronic device of the present invention is mounted. FIG. 4 (a) is a plan view, and FIG. It is sectional drawing along the XX 'line | wire of (). The terminal pads 9 (9a, 9b, 9c, 9d) are formed in an arrangement and size corresponding to the mounting terminals of the crystal resonator described above. A small hole 10 (10a, 10b, 10c, 10d) is formed in the central portion of each terminal pad 9 (9a, 9b, 9c, 9d).

実施例1によれば、実装基板200に形成された端子パッド9と電子デバイスである水晶振動子100の実装端子5の間に介在して両者を接合する半田膜12は、端子パッド9に設けた小孔10の位置でも実装端子5の表面に存在する。したがって、小孔を形成しても、両者の接合面積の減少は少なく、接合強度に大幅な低下はない。これに加えて、小孔を端子パッドの中心部に形成したことで、外力印加や温度ストレスによる接続領域の接合強度のバランス崩れが抑制され、水晶振動子の接続不良や破壊などの発生が回避される。   According to the first embodiment, the solder film 12 that is interposed between the terminal pad 9 formed on the mounting substrate 200 and the mounting terminal 5 of the crystal resonator 100 that is an electronic device and bonds the two is provided on the terminal pad 9. Even the position of the small hole 10 exists on the surface of the mounting terminal 5. Therefore, even if a small hole is formed, there is little decrease in the bonding area between the two, and there is no significant decrease in bonding strength. In addition, by forming a small hole in the center of the terminal pad, the imbalance of the bonding strength of the connection area due to external force application or temperature stress is suppressed, and the occurrence of poor crystal connection or breakage is avoided. Is done.

図5は、本発明による表面実装型電子デバイスの一例である水晶振動子の実装方法とその実装基板の実施例2の説明図である。ここには、(a)(b)2つの例を示した。この実施例2では、実装基板200に形成する端子パッドに複数の小孔10を設けたものである。そして、図5(a)では、小孔10が全体として端子パッド9の中央部分に集まるように形成される。また、図5(b)では、小孔10が端子パッド9の領域内に均一に配置される。この小孔10の1個の構成は前記した実施例1と同様である。実施例2は、複数の小孔を設けたものであるが、これらの小孔は端子パッドの中心に対してバランスよく配置され、そのうちの一個は端子パッド9の中心部に設けるのが望ましい。また、中心部に設ける小孔を他のものより大きくしてもよい。実施例2のその他の工程及び構成は実施例1とほぼ同様なので、説明は省略する。   FIG. 5 is an explanatory view of a mounting method of a crystal resonator as an example of a surface-mount type electronic device according to the present invention and a mounting substrate according to a second embodiment. Here, two examples (a) and (b) are shown. In the second embodiment, a plurality of small holes 10 are provided in a terminal pad formed on the mounting substrate 200. In FIG. 5A, the small holes 10 are formed so as to collect at the central portion of the terminal pad 9 as a whole. In FIG. 5B, the small holes 10 are uniformly arranged in the region of the terminal pad 9. The configuration of one small hole 10 is the same as that of the first embodiment. In the second embodiment, a plurality of small holes are provided. These small holes are arranged in a balanced manner with respect to the center of the terminal pad, and one of them is preferably provided in the center of the terminal pad 9. Moreover, you may make the small hole provided in a center part larger than another thing. Since the other steps and configuration of the second embodiment are almost the same as those of the first embodiment, the description thereof is omitted.

実施例2によっても、実装基板200に形成された端子パッド9と水晶振動子100の実装端子5の間に介在して両者を接合する半田膜12は、端子パッド9に設けた各小孔10の位置でも実装端子5の表面に存在する。したがって、複数の小孔を形成しても、両者の接合面積の減少は比較的少なく、接合強度に大幅な低下はない。そのため、外力印加や温度ストレスによる説具領域の接合強度の低下が抑制され、水晶振動子の接続不良や破壊などの発生が回避される。   Also in the second embodiment, the solder film 12 that is interposed between the terminal pad 9 formed on the mounting substrate 200 and the mounting terminal 5 of the crystal unit 100 and joins the two is provided in each small hole 10 provided in the terminal pad 9. Also on the surface of the mounting terminal 5 at the position of. Therefore, even if a plurality of small holes are formed, the reduction of the bonding area between the two is relatively small, and the bonding strength is not significantly reduced. For this reason, a decrease in the bonding strength of the hypothesis region due to external force application or temperature stress is suppressed, and the occurrence of poor connection or destruction of the crystal resonator is avoided.

本発明は、実施例で説明した実装基板への水晶振動子の実装に限るものではなく、水晶発振器やSAWデバイスなどの水晶関連部品、デスクリート部品、その他の表面実装型の電子デバイスの実装にも同様に適用できる。   The present invention is not limited to the mounting of the crystal resonator on the mounting substrate described in the embodiments, but for mounting crystal-related components such as crystal oscillators and SAW devices, discrete components, and other surface-mount type electronic devices. Can be applied similarly.

1・・・容器本体、1a・・・底壁、1b・・・枠壁、1c・・・凹部、2・・・水晶片、2a,2b・・・励振電極、3(3a,3b)・・・引出電極、4(4a,4b)・・・導電性接着剤、5(5a,5b,5c,5d)・・・実装端子、50・・・向き識別部、6・・・金属膜、7・・・蓋体、8・・・気泡、80・・・ボイド、9(9a,9b,9c,9d)・・・端子パッド、10(10a,10b,10c,10d)・・・小孔、100・・・電子デバイス(水晶振動子)、200・・・実装基板。   DESCRIPTION OF SYMBOLS 1 ... Container main body, 1a ... Bottom wall, 1b ... Frame wall, 1c ... Recessed part, 2 ... Crystal piece, 2a, 2b ... Excitation electrode, 3 (3a, 3b) ..Extract electrodes, 4 (4a, 4b)... Conductive adhesive, 5 (5a, 5b, 5c, 5d)... Mounting terminals, 50. 7 ... Lid, 8 ... Bubble, 80 ... Void, 9 (9a, 9b, 9c, 9d) ... Terminal pad, 10 (10a, 10b, 10c, 10d) ... Small hole , 100... Electronic device (quartz crystal resonator), 200.

Claims (6)

端子パッドを形成した実装基板に表面が平坦な表面実装用の実装端子が形成された表面実装型の電子デバイスを実装する表面実装型電子デバイスの実装方法であって、
前記小孔を設けた前記端子パッドの上層を覆って、前記電子デバイスの実装端子をリフローにより接合するための半田膜を形成し、
前記電子デバイスの実装端子を前記実装基板の前記端子パッドに位置付けた状態で前記半田膜を加熱し、リフローすることにより、前記半田膜の溶融で発生する気泡が前記端子パッドの小孔に滞留させ、
前記半田膜を固化することで、前記気泡に起因するボイドを前記小孔の部分に形成することを特徴とする表面実装型電子デバイスの実装方法。
A mounting method of a surface mounting type electronic device for mounting a surface mounting type electronic device in which a mounting terminal for surface mounting having a flat surface is formed on a mounting substrate on which a terminal pad is formed,
Covering the upper layer of the terminal pad provided with the small hole, to form a solder film for bonding the mounting terminal of the electronic device by reflow,
By heating and reflowing the solder film with the mounting terminal of the electronic device positioned on the terminal pad of the mounting substrate, bubbles generated by melting of the solder film are retained in the small holes of the terminal pad. ,
A method for mounting a surface-mount type electronic device, wherein the solder film is solidified to form voids due to the bubbles in the small hole portions.
請求項1において、
前記端子パッドの小孔の部分に形成される前記ボイドと前記電子デバイスの実装端子の間に当該実装端子に接合した半田膜を形成することを特徴とする表面実装型電子デバイスの実装方法。
In claim 1,
A mounting method for a surface-mount type electronic device, wherein a solder film bonded to the mounting terminal is formed between the void formed in the small hole portion of the terminal pad and the mounting terminal of the electronic device.
表面実装型の電子デバイスを実装する端子パッドを形成した表面実装型の電子デバイスを搭載する実装基板であって、
前記端子パッドは、前記実装する電子デバイスの表面実装型の実装端子に対応した配置に形成されており、
前記端子パッドの各中心部で、かつ当該端子パッドの表面から前記実装基板の表面に貫通した小孔を有することを特徴とする表面実装型の電子デバイスを搭載する実装基板。
A mounting substrate on which a surface mounting type electronic device on which a terminal pad for mounting a surface mounting type electronic device is formed,
The terminal pad is formed in an arrangement corresponding to a surface mounting type mounting terminal of the electronic device to be mounted,
A mounting substrate on which a surface-mount type electronic device is mounted, characterized by having small holes penetrating from the surface of the terminal pad to the surface of the mounting substrate at each central portion of the terminal pad.
請求項3において、
前記小孔は各端子パッドに一個形成されていることを特徴とする表面実装型の電子デバイスを搭載する実装基板。
In claim 3,
A mounting substrate on which a surface-mount type electronic device is mounted, wherein one small hole is formed in each terminal pad.
請求項3において、
前記小孔は各端子パッドに複数個形成されていることを特徴とする表面実装型の電子デバイスを搭載する実装基板。
In claim 3,
A mounting substrate on which a surface mount type electronic device is mounted, wherein a plurality of the small holes are formed in each terminal pad.
請求項5において、
前記複数の小孔の一つは各端子パッドの中央に形成されていることを特徴とする表面実装型の電子デバイスを搭載する実装基板。
In claim 5,
One of the plurality of small holes is formed at the center of each terminal pad. A mounting substrate on which a surface mount type electronic device is mounted.
JP2011278211A 2011-12-20 2011-12-20 Mounting method of surface-mounted electronic device, and mounting substrate for the same Pending JP2013131528A (en)

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