JP2013074400A - 固体撮像装置 - Google Patents

固体撮像装置 Download PDF

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Publication number
JP2013074400A
JP2013074400A JP2011210936A JP2011210936A JP2013074400A JP 2013074400 A JP2013074400 A JP 2013074400A JP 2011210936 A JP2011210936 A JP 2011210936A JP 2011210936 A JP2011210936 A JP 2011210936A JP 2013074400 A JP2013074400 A JP 2013074400A
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JP
Japan
Prior art keywords
imaging
image
substrate
microlens
solid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2011210936A
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English (en)
Japanese (ja)
Other versions
JP2013074400A5 (enExample
Inventor
Mitsuyoshi Kobayashi
光吉 小林
Hideyuki Funaki
英之 舟木
Risako Ueno
梨紗子 上野
Kazuhiro Suzuki
和拓 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP2011210936A priority Critical patent/JP2013074400A/ja
Priority to US13/361,293 priority patent/US20130075585A1/en
Publication of JP2013074400A publication Critical patent/JP2013074400A/ja
Publication of JP2013074400A5 publication Critical patent/JP2013074400A5/ja
Abandoned legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0242—Control or determination of height or angle information of sensors or receivers; Goniophotometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0429—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using polarisation elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0075—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. increasing, the depth of field or depth of focus
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/806—Optical elements or arrangements associated with the image sensors
    • H10F39/8063—Microlenses
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/806—Optical elements or arrangements associated with the image sensors
    • H10F39/8067—Reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Studio Devices (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Optical Distance (AREA)
  • Focusing (AREA)
  • Automatic Focus Adjustment (AREA)
JP2011210936A 2011-09-27 2011-09-27 固体撮像装置 Abandoned JP2013074400A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011210936A JP2013074400A (ja) 2011-09-27 2011-09-27 固体撮像装置
US13/361,293 US20130075585A1 (en) 2011-09-27 2012-01-30 Solid imaging device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011210936A JP2013074400A (ja) 2011-09-27 2011-09-27 固体撮像装置

Publications (2)

Publication Number Publication Date
JP2013074400A true JP2013074400A (ja) 2013-04-22
JP2013074400A5 JP2013074400A5 (enExample) 2014-06-19

Family

ID=47910194

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011210936A Abandoned JP2013074400A (ja) 2011-09-27 2011-09-27 固体撮像装置

Country Status (2)

Country Link
US (1) US20130075585A1 (enExample)
JP (1) JP2013074400A (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014054598A1 (ja) * 2012-10-05 2014-04-10 オリンパス株式会社 撮像装置
JP2014182299A (ja) * 2013-03-19 2014-09-29 Toshiba Corp マイクロレンズアレイユニットおよび固体撮像装置
KR20150117019A (ko) * 2014-04-09 2015-10-19 삼성전자주식회사 이미지 센서 및 이를 포함하는 이미지 센서 시스템
US9601532B2 (en) 2013-07-29 2017-03-21 Panasonic Intellectual Property Management Co., Ltd. Optical filter with Fabry-Perot resonator comprising a plate-shaped wire grid polarizer
JP2017228910A (ja) * 2016-06-22 2017-12-28 キヤノン株式会社 画像処理装置、撮像装置、画像処理プログラムおよび画像処理方法
WO2020066738A1 (ja) * 2018-09-26 2020-04-02 日本電信電話株式会社 偏光イメージング撮像システム

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5906464B2 (ja) * 2012-02-02 2016-04-20 パナソニックＩｐマネジメント株式会社 撮像装置
JP5631935B2 (ja) * 2012-07-11 2014-11-26 株式会社東芝 画像処理装置、画像処理方法およびプログラム、ならびに、撮像装置
JP2015060053A (ja) 2013-09-18 2015-03-30 株式会社東芝 固体撮像装置、制御装置及び制御プログラム
TWI617841B (zh) * 2014-10-22 2018-03-11 英特爾股份有限公司 用於光學系統的防雲紋圖樣擴散器
US10168542B2 (en) * 2015-08-26 2019-01-01 Raytheon Company Polarized pixelated filter array with reduced sensitivity to misalignment for polarimetric imaging
EP3443309A4 (en) * 2016-04-11 2019-12-18 Polaris Sensor Technologies, Inc. SHORT WAVE INFRARED POLARIMETER

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001061109A (ja) * 1999-08-20 2001-03-06 Japan Science & Technology Corp 画像入力装置
JP2007086720A (ja) * 2005-08-23 2007-04-05 Photonic Lattice Inc 偏光イメージング装置
JP2008167395A (ja) * 2006-12-04 2008-07-17 Sony Corp 撮像装置及び撮像方法
JP2008167154A (ja) * 2006-12-28 2008-07-17 Sony Corp 撮像装置
JP2009224982A (ja) * 2008-03-14 2009-10-01 Sony Corp 画像処理装置、画像処理プログラムおよび表示装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2004036284A1 (ja) * 2002-09-30 2006-02-16 独立行政法人科学技術振興機構 共焦点顕微鏡、共焦点顕微鏡を用いた蛍光測定方法及び偏光測定方法
US7130047B2 (en) * 2004-04-30 2006-10-31 Optimum Technologies, Inc. Method of producing polarizers for polarized optical probes
US20090021598A1 (en) * 2006-12-06 2009-01-22 Mclean John Miniature integrated multispectral/multipolarization digital camera
US8228417B1 (en) * 2009-07-15 2012-07-24 Adobe Systems Incorporated Focused plenoptic camera employing different apertures or filtering at different microlenses

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001061109A (ja) * 1999-08-20 2001-03-06 Japan Science & Technology Corp 画像入力装置
JP2007086720A (ja) * 2005-08-23 2007-04-05 Photonic Lattice Inc 偏光イメージング装置
JP2008167395A (ja) * 2006-12-04 2008-07-17 Sony Corp 撮像装置及び撮像方法
JP2008167154A (ja) * 2006-12-28 2008-07-17 Sony Corp 撮像装置
JP2009224982A (ja) * 2008-03-14 2009-10-01 Sony Corp 画像処理装置、画像処理プログラムおよび表示装置

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014054598A1 (ja) * 2012-10-05 2014-04-10 オリンパス株式会社 撮像装置
JP2014074690A (ja) * 2012-10-05 2014-04-24 Olympus Corp 撮像装置
US9756304B2 (en) 2012-10-05 2017-09-05 Olympus Corporation Image-acquisition apparatus for performing distance measurement using parallax
JP2014182299A (ja) * 2013-03-19 2014-09-29 Toshiba Corp マイクロレンズアレイユニットおよび固体撮像装置
US9601532B2 (en) 2013-07-29 2017-03-21 Panasonic Intellectual Property Management Co., Ltd. Optical filter with Fabry-Perot resonator comprising a plate-shaped wire grid polarizer
KR20150117019A (ko) * 2014-04-09 2015-10-19 삼성전자주식회사 이미지 센서 및 이를 포함하는 이미지 센서 시스템
KR102211862B1 (ko) * 2014-04-09 2021-02-03 삼성전자주식회사 이미지 센서 및 이를 포함하는 이미지 센서 시스템
JP2017228910A (ja) * 2016-06-22 2017-12-28 キヤノン株式会社 画像処理装置、撮像装置、画像処理プログラムおよび画像処理方法
US10984566B2 (en) 2016-06-22 2021-04-20 Canon Kabushiki Kaisha Image processing apparatus that calculates using luminance values of one or more input images produced by photoelectric conversion of multiple polarized lights, image-capturing apparatus and image processing method
WO2020066738A1 (ja) * 2018-09-26 2020-04-02 日本電信電話株式会社 偏光イメージング撮像システム
JP2020051868A (ja) * 2018-09-26 2020-04-02 日本電信電話株式会社 偏光イメージング撮像システム

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US20130075585A1 (en) 2013-03-28

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