JP2013068618A - 任意波形発生装置のチャンネル校正方法 - Google Patents
任意波形発生装置のチャンネル校正方法 Download PDFInfo
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- JP2013068618A JP2013068618A JP2012209439A JP2012209439A JP2013068618A JP 2013068618 A JP2013068618 A JP 2013068618A JP 2012209439 A JP2012209439 A JP 2012209439A JP 2012209439 A JP2012209439 A JP 2012209439A JP 2013068618 A JP2013068618 A JP 2013068618A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
- G01R31/2841—Signal generators
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
【解決手段】Sパラメータを用いて任意波形発生装置を校正する。任意波形発生装置が有するチャンネルとしては、単一の非インタリーブ・チャンネルでも良いし、インターリーブされた複数チャンネルでも良い。差動信号を生成する場合でも良く、2チャンネルを1対として、複数のチャンネル対を校正できる。このとき、各チャンネルは、単一の非インタリーブ・チャンネルでも良いし、インターリーブされた複数チャンネルで1つのチャンネルを構成する場合でも良い。
【選択図】図2
Description
チャンネル(τ)の出力応答を測定するステップと、
チャンネル(Γs)のソース・マッチを測定するステップと、
被測定デバイス(ΓL)の入力反射係数を決定するステップと、
τ、Γs及びΓLに基づいて、上記チャンネルのための補正フィルタ(g)を計算するステップと
を具えている。
105 プロセッサ
110 DAC
115 アナログ出力回路
120 被測定デバイス(DUT)
125 外部デバイス(ケーブルなど)
500 AWG
510A 第1DAC
510B 第2DAC
530 合成部
Claims (1)
- チャンネル(τ)の出力応答を測定するステップと、
チャンネル(Γs)のソース・マッチを測定するステップと、
被測定デバイス(ΓL)の入力反射係数を決定するステップと、
τ、Γs及びΓLに基づいて、上記チャンネルのための補正フィルタ(g)を計算するステップと
を具える任意波形発生装置のチャンネル校正方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/243,024 US20130080105A1 (en) | 2011-09-23 | 2011-09-23 | Enhanced awg wavef0rm calibration using s-parameters |
US13/243,024 | 2011-09-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013068618A true JP2013068618A (ja) | 2013-04-18 |
JP6320672B2 JP6320672B2 (ja) | 2018-05-09 |
Family
ID=47071102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012209439A Active JP6320672B2 (ja) | 2011-09-23 | 2012-09-24 | 任意波形発生装置のチャンネル校正方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20130080105A1 (ja) |
EP (1) | EP2574942A1 (ja) |
JP (1) | JP6320672B2 (ja) |
CN (1) | CN103018701B (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9599639B2 (en) * | 2013-04-05 | 2017-03-21 | Tektronix, Inc. | Device and method to prevent inter-system interference |
NL2010870C2 (en) * | 2013-05-28 | 2014-12-01 | Anteverta Mw B V | Optimally controlled waveforms for device under test bias purposes. |
US20150084656A1 (en) * | 2013-09-25 | 2015-03-26 | Tektronix, Inc. | Two port vector network analyzer using de-embed probes |
CN110446936B (zh) * | 2018-03-05 | 2021-06-22 | 深圳市汇顶科技股份有限公司 | 波形信号检测方法及装置 |
CN110557122B (zh) * | 2019-09-25 | 2022-04-19 | 电子科技大学 | 一种tiadc系统频响非一致性误差的校正方法 |
CN113760039B (zh) * | 2021-08-26 | 2024-03-08 | 深圳市腾讯计算机系统有限公司 | 量子比特控制系统及波形校准电路 |
CN115968251A (zh) | 2021-10-08 | 2023-04-14 | 腾讯科技(深圳)有限公司 | 量子比特组件、量子比特组件制备方法、芯片及设备 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08327709A (ja) * | 1995-05-31 | 1996-12-13 | Advantest Corp | Dut試験用の任意波形発生装置 |
JP2002122621A (ja) * | 2000-08-14 | 2002-04-26 | Agilent Technol Inc | ベクトルネットワーク分析における可逆マルチポートデバイスの効率的な測定方法および装置 |
JP2004512504A (ja) * | 2000-09-18 | 2004-04-22 | アジレント・テクノロジーズ・インク | 複数端子不平衡又は平衡装置の線形同定方法及び装置 |
US7256585B1 (en) * | 2006-07-21 | 2007-08-14 | Agilent Technologies, Inc. | Match-corrected power measurements with a vector network analyzer |
US20080048677A1 (en) * | 2006-08-23 | 2008-02-28 | Kan Tan | Signal analysis system and calibration method for measuring the impedance of a device under test |
JP2008286699A (ja) * | 2007-05-18 | 2008-11-27 | Advantest Corp | 信号入出力装置、試験装置および電子デバイス |
JP2009204610A (ja) * | 2008-02-01 | 2009-09-10 | Tektronix Internatl Sales Gmbh | 信号発生装置及びシリアル・データ・パターン生成方法 |
JP2011228815A (ja) * | 2010-04-15 | 2011-11-10 | Tektronix Inc | 任意波形発生器の周波数特性補正方法 |
JP2013068619A (ja) * | 2011-09-23 | 2013-04-18 | Tektronix Inc | 任意波形発生装置のインターリーブ・チャンネル校正方法 |
Family Cites Families (6)
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US5748000A (en) * | 1996-08-01 | 1998-05-05 | Hewlett-Packard Company | Error correction method for transmission measurements in vector network analyzers |
US7957461B2 (en) * | 2005-03-31 | 2011-06-07 | Teradyne, Inc. | Calibrating automatic test equipment |
DE112007001595T5 (de) * | 2006-06-30 | 2009-07-30 | Teradyne, Inc., North Reading | Kalibrierungsvorrichtung |
US7873980B2 (en) * | 2006-11-02 | 2011-01-18 | Redmere Technology Ltd. | High-speed cable with embedded signal format conversion and power control |
US20090052556A1 (en) * | 2007-08-23 | 2009-02-26 | Fernandez Andrew D | Frequency interleaving method for wideband signal generation |
US20080265911A1 (en) * | 2008-07-14 | 2008-10-30 | Agilent Technologies, Inc. | Power Sensing Module with Built-In Mismatch and Correction |
-
2011
- 2011-09-23 US US13/243,024 patent/US20130080105A1/en not_active Abandoned
-
2012
- 2012-09-03 EP EP12182838A patent/EP2574942A1/en not_active Withdrawn
- 2012-09-21 CN CN201210371162.7A patent/CN103018701B/zh not_active Expired - Fee Related
- 2012-09-24 JP JP2012209439A patent/JP6320672B2/ja active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08327709A (ja) * | 1995-05-31 | 1996-12-13 | Advantest Corp | Dut試験用の任意波形発生装置 |
JP2002122621A (ja) * | 2000-08-14 | 2002-04-26 | Agilent Technol Inc | ベクトルネットワーク分析における可逆マルチポートデバイスの効率的な測定方法および装置 |
JP2004512504A (ja) * | 2000-09-18 | 2004-04-22 | アジレント・テクノロジーズ・インク | 複数端子不平衡又は平衡装置の線形同定方法及び装置 |
US7256585B1 (en) * | 2006-07-21 | 2007-08-14 | Agilent Technologies, Inc. | Match-corrected power measurements with a vector network analyzer |
US20080048677A1 (en) * | 2006-08-23 | 2008-02-28 | Kan Tan | Signal analysis system and calibration method for measuring the impedance of a device under test |
JP2008286699A (ja) * | 2007-05-18 | 2008-11-27 | Advantest Corp | 信号入出力装置、試験装置および電子デバイス |
JP2009204610A (ja) * | 2008-02-01 | 2009-09-10 | Tektronix Internatl Sales Gmbh | 信号発生装置及びシリアル・データ・パターン生成方法 |
JP2011228815A (ja) * | 2010-04-15 | 2011-11-10 | Tektronix Inc | 任意波形発生器の周波数特性補正方法 |
JP2013068619A (ja) * | 2011-09-23 | 2013-04-18 | Tektronix Inc | 任意波形発生装置のインターリーブ・チャンネル校正方法 |
Non-Patent Citations (1)
Title |
---|
JOAN MERCADE: ""DAC Interleaving in Ultra-High-Speed Arbs"", EVALUATION ENGINEERING, JPN6016025476, December 2009 (2009-12-01), pages 14 - 16, ISSN: 0003351542 * |
Also Published As
Publication number | Publication date |
---|---|
CN103018701A (zh) | 2013-04-03 |
EP2574942A1 (en) | 2013-04-03 |
CN103018701B (zh) | 2018-02-16 |
US20130080105A1 (en) | 2013-03-28 |
JP6320672B2 (ja) | 2018-05-09 |
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