JP2013065875A - Package for electronic component and electronic device - Google Patents

Package for electronic component and electronic device Download PDF

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JP2013065875A
JP2013065875A JP2012252153A JP2012252153A JP2013065875A JP 2013065875 A JP2013065875 A JP 2013065875A JP 2012252153 A JP2012252153 A JP 2012252153A JP 2012252153 A JP2012252153 A JP 2012252153A JP 2013065875 A JP2013065875 A JP 2013065875A
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package
electronic component
mounting terminal
package body
mounting
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Yoji Nagano
洋二 永野
Hideo Tanaya
英雄 棚谷
Tatsuya Anzai
達也 安齊
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Seiko Epson Corp
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Seiko Epson Corp
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Abstract

PROBLEM TO BE SOLVED: To obtain a package for an electronic component capable of sufficiently withstanding a severe temperature environment for on-vehicle use and a piezoelectric vibrator.SOLUTION: A package for electronic components is composed of: a package body 6 which has a recessed part on an upper surface side, is mounted with an electronic component 20 in the recessed part, has a rectangular shape and is made of a laminated ceramic; and a lid member 30 hermetically sealing an opening space on the upper surface side of the package body 6 including the electronic component 20. A pair of electrode pads 15 is provided in the recessed part on an upper surface of the package body 6, and a pair of mounting terminals (terminal electrodes) 10 and 11 composed of terminal bases 10a and 11a and bumps 10b and 11b is formed on a mounting surface at both sides of a bottom surface of the package body 6 in a short side direction. Further, the pair of electrode pads 15 and the pair of mounting terminals 10 and 11 formed inside the package body 6 are individually and electrically connected to one another by a plurality of connection electrodes 14.

Description

本発明は、電子部品用パッケージと圧電振動子に関し、特に、回路基板との接続強度を高めるように実装端子の構造を改善した電子部品用パッケージと、それを用いた圧電振動子に関する。   The present invention relates to an electronic component package and a piezoelectric vibrator, and more particularly, to an electronic component package whose mounting terminal structure is improved so as to increase the connection strength with a circuit board, and a piezoelectric vibrator using the same.

圧電振動子、中でも表面実装型水晶振動子は小型であること、高精度、高安定な周波数が容易に得られ、経年変化が小さいこと等のため、通信用機器から民生用機器の基準周波数源として広く用いられている。近年、機器が小型化、軽量化されると共に表面実装型水晶振動子のさらなる小型化への要求が強くなっている。
周知のように、表面実装型水晶振動子は、水晶板の両主面に、真空蒸着法、あるいはスパッタリング法を用いて金属膜(励振電極)を形成し、パッケージ本体内に収容し、該パッケージ本体の周縁部に蓋をシーム溶接等で気密封止して構成される。
Piezoelectric vibrators, especially surface-mounted quartz vibrators, are small in size, easily obtain high-precision and high-stable frequencies, and have little secular change. Is widely used. In recent years, devices have become smaller and lighter, and the demand for further miniaturization of surface-mounted crystal units has been increasing.
As is well known, a surface-mount crystal unit is formed by forming a metal film (excitation electrode) on both main surfaces of a crystal plate using a vacuum deposition method or a sputtering method, and accommodating the metal film in a package body. A lid is hermetically sealed by seam welding or the like at the periphery of the main body.

水晶振動子が車載用機器に用いられる場合、回路基板との接続強度が特に重要となる。この理由は、車載用機器では低温から高温までの厳しい温度環境にさらされ、圧電振動子のパッケージの線膨張係数と、圧電振動子が実装される回路基板とのそれとに差があると、繰り返しの温度変化によりパッケージと回路基板とを接続する半田に歪みが掛かり、半田の疲労破壊が生じる虞があるためである。更に、近年表面実装型水晶振動子の形状が小型化され、パッケージの実装端子の面積も一段と小さくなっている。実装端子(端子電極)と回路基板との接続強度を強化した表面実装型水晶振動子の一例が特許文献1に開示されている。図9(a)は表面実装型水晶振動子の側面断面図、同図(b)は底面図である。表面実装型水晶振動子70は上部が開口した凹部を有する平面矩形状のパッケージ本体71と、当該パッケージ本体71の中に収容される水晶振動素子75と、パッケージ本体71の上部開口部に接合される蓋72とからなる。表面実装型水晶振動子70は回路基板90の配線パターン91上に半田85を介して接続される。   When a crystal resonator is used for a vehicle-mounted device, the connection strength with the circuit board is particularly important. The reason for this is that in-vehicle devices are exposed to severe temperature environments from low temperature to high temperature, and the linear expansion coefficient of the piezoelectric vibrator package and the circuit board on which the piezoelectric vibrator is mounted are different. This is because the solder connecting the package and the circuit board is distorted due to the temperature change, and the solder may be fatigued. Further, in recent years, the shape of the surface-mounted crystal resonator has been reduced in size, and the area of the package mounting terminal has been further reduced. Patent Document 1 discloses an example of a surface-mounted crystal resonator in which the connection strength between a mounting terminal (terminal electrode) and a circuit board is reinforced. FIG. 9A is a side sectional view of the surface-mount type crystal resonator, and FIG. 9B is a bottom view. The surface-mounted crystal resonator 70 is bonded to a planar rectangular package body 71 having a recess with an upper opening, a crystal resonator element 75 housed in the package body 71, and an upper opening of the package body 71. And a lid 72. The surface mount type crystal unit 70 is connected to the wiring pattern 91 of the circuit board 90 via the solder 85.

図9(b)の底面図に示すように、パッケージ本体71の底面の対向辺に沿って形成された一対の端子電極82、83は、互いに対向して形成される領域82a、83aと、一方の端子電極のみが形成されない領域82b、83bとを有している。これらの領域は、パッケージ本体71の中心点に対して点対称に配置されている。また、パッケージ本体71の四隅にはキャスタレーションC1〜C4が形成され、キャスタレーションC1、C3は夫々端子電極82、83と接続されている。このようなパッケージ本体71を構成することにより、温度環境が変化し、パッケージ本体71と回路基板90との熱膨張差により端子電極82、83に応力が生じても、一方の端子電極が形成されない角領域82b、83bに向かって相互に応力を逃がすので、パッケージ本体71の中心点で平面的に回転させるように応力が発生し、応力が緩和される。その結果、半田クラック等の発生を飛躍的に抑制することができると開示されている。
また、特許文献2にはパッケージ裏面の四隅に4つの端子電極を形成し、各端子電極の中央部に小さな凸部を形成したパッケージが開示されている。このパッケージを用いた圧電振動子を回路基板上に搭載すると、端子電極と回路基板との間に間隙が得られ、十分な量と厚みの半田がこの間隙に入るため、十分な接合強度が得られると開示されている。
As shown in the bottom view of FIG. 9B, the pair of terminal electrodes 82 and 83 formed along the opposite sides of the bottom surface of the package main body 71 includes regions 82a and 83a formed to face each other, Regions 82b and 83b where only the terminal electrodes are not formed. These regions are arranged point-symmetrically with respect to the center point of the package body 71. Further, castellations C1 to C4 are formed at the four corners of the package body 71, and the castellations C1 and C3 are connected to terminal electrodes 82 and 83, respectively. By configuring the package body 71 as described above, even if the temperature environment changes and a stress is generated in the terminal electrodes 82 and 83 due to a difference in thermal expansion between the package body 71 and the circuit board 90, one terminal electrode is not formed. Since the stress is released from each other toward the corner regions 82b and 83b, the stress is generated so as to be rotated in a plane at the center point of the package body 71, and the stress is relieved. As a result, it is disclosed that the occurrence of solder cracks and the like can be remarkably suppressed.
Patent Document 2 discloses a package in which four terminal electrodes are formed at the four corners of the back surface of the package, and a small protrusion is formed at the center of each terminal electrode. When a piezoelectric vibrator using this package is mounted on a circuit board, a gap is obtained between the terminal electrode and the circuit board, and a sufficient amount and thickness of solder enters this gap, so that sufficient bonding strength is obtained. Is disclosed.

特開2005−108923公報JP 2005-108923 A 特開2006−186667公報JP 2006-186667 A

しかしながら、特許文献1に記載されたパッケージ本体71では、端子電極82、83が夫々パッケージ本体の角部に形成した1つのキャスタレーションC1、C3を経由してパッケージ内部に収容した圧電振動素子と導通するように構成されているため、端子電極82、83とキャスタレーションC1、C3との接続部にクラックが発生すると、水晶振動子が機能しない虞があるという問題があった。
特許文献2の手法では、パッケージの端子電極面と回路基板のランド電極面との間の半田量は多くなるものの、歪みが集中する箇所の半田量が必ずしも多くないという問題があった。
本発明は、上記問題を解決するためになされたもので、パッケージの実装端子と回路基板のランド電極との接続強度を高めた電子部品用パッケージと、それを用いた圧電振動子を提供することにある。
However, in the package main body 71 described in Patent Document 1, the terminal electrodes 82 and 83 are electrically connected to the piezoelectric vibration element accommodated in the package via one castellation C1 and C3 formed at the corners of the package main body, respectively. Therefore, there is a problem that the crystal resonator may not function if a crack occurs in the connection portion between the terminal electrodes 82 and 83 and the castellations C1 and C3.
The technique of Patent Document 2 has a problem in that although the amount of solder between the terminal electrode surface of the package and the land electrode surface of the circuit board increases, the amount of solder at a location where distortion concentrates is not necessarily large.
The present invention has been made to solve the above problem, and provides a package for an electronic component with enhanced connection strength between a package mounting terminal and a land electrode of a circuit board, and a piezoelectric vibrator using the same. It is in.

本発明は、上記の課題の少なくとも一部を解決するためになされたものであり、以下の形態又は適用例として実現することが可能である。   SUMMARY An advantage of some aspects of the invention is to solve at least a part of the problems described above, and the invention can be implemented as the following forms or application examples.

[適用例1]矩形状のパッケージ本体と、前記パッケージ本体を気密封止する蓋部材と、からなる電子部品用パッケージであって、前記パッケージ本体の内部に形成された電極パッドと、前記パッケージ本体の底面のうち少なくとも四隅の近傍に形成され、かつ実装面に段差部を有する実装端子と、前記パッドと前記実装端子とを電気的に接続する複数の接続電極と、を備えた電子部品用パッケージを特徴とする。   Application Example 1 An electronic component package comprising a rectangular package body and a lid member for hermetically sealing the package body, the electrode pad formed inside the package body, and the package body An electronic component package comprising a mounting terminal formed in the vicinity of at least four corners of the bottom surface of the substrate and having a stepped portion on the mounting surface, and a plurality of connection electrodes for electrically connecting the pad and the mounting terminal. It is characterized by.

このように電子部品用パッケージを構成すると、実装面に設けた段差部により、歪みが大きくかかる領域の半田の厚さを厚くできるので、実装端子と回路基板のランド電極との接続強度を強化できるという効果がある。   When the electronic component package is configured in this manner, the stepped portion provided on the mounting surface can increase the thickness of the solder in the region where the distortion is large, so that the connection strength between the mounting terminal and the land electrode of the circuit board can be enhanced. There is an effect.

[適用例2]前記パッケージ本体の前記四隅にキャスタレーションを形成し、該キャスタレーションにそれぞれ前記接続電極を形成した適用例1に記載の電子部品用パッケージを特徴とする。   Application Example 2 An electronic component package according to Application Example 1 in which castellations are formed at the four corners of the package body and the connection electrodes are formed on the castellations, respectively.

このように電子部品用パッケージを構成すると、キャスタレーションによるパッケージ内部の圧電振動素子と実装端子との導通のみならず、パッケージと回路基板との接続強度を高めることができるという効果がある。   When the electronic component package is configured as described above, there is an effect that the connection strength between the package and the circuit board can be increased as well as conduction between the piezoelectric vibration element inside the package and the mounting terminal by castellation.

[適用例3]前記段差部は、前記実装端子を半田により回路基板に接合したときに、前記実装端子上において前記四隅の周辺に形成された半田が厚くなるような形状である適用例1又は2に記載の電子部品用パッケージを特徴とする。   Application Example 3 In the application example 1 or 2, the step portion has a shape such that the solder formed around the four corners on the mounting terminal is thick when the mounting terminal is joined to the circuit board by solder. 2 is a package for electronic components.

このように電子部品用パッケージを構成すると、実装面に設けた段差部により、歪みが大きくかかるパッケージの中心から最も離れた位置と、パッケージの中央部寄りを除く実装端子の周縁部の半田を厚くすることができるので、実装端子と回路基板のランド電極との接続強度の強化に大きく貢献するという効果がある。   When the electronic component package is configured in this manner, the stepped portion provided on the mounting surface thickens the solder at the farthest position from the center of the package where the distortion is large and the peripheral portion of the mounting terminal excluding the central portion of the package. Therefore, there is an effect that it greatly contributes to strengthening the connection strength between the mounting terminal and the land electrode of the circuit board.

[適用例4]前記パッケージに一対のダミー電極を形成した適用例1乃至3の何れか一項に記載の電子部品用パッケージを特徴とする。   Application Example 4 The electronic component package according to any one of Application Examples 1 to 3 in which a pair of dummy electrodes is formed on the package.

このように電子部品用パッケージを構成すると、実装端子による接続に加え、ダミー電極によるパッケージと回路基板との接続が加わり、実装端子に掛かる歪みが分散されるので、実装端子と回路基板との接続強度が一段と大きくなるという効果がある。   When an electronic component package is configured in this manner, the connection between the package terminal and the circuit board is added in addition to the connection using the mounting terminal, and the distortion applied to the mounting terminal is dispersed. There is an effect that the strength is further increased.

[適用例5]前記一対のダミー電極を複数形成した適用例4に記載の電子部品用パッケージを特徴とする。   Application Example 5 An electronic component package according to Application Example 4 in which a plurality of the pair of dummy electrodes are formed is characterized.

このように電子部品用パッケージを構成すると、複数のダミー電極によるパッケージと回路基板との接続が強化され、実装端子に掛かる歪みが分散されるので、実装端子と回路基板との接続が一段と強められるという効果がある。   When the electronic component package is configured in this way, the connection between the package and the circuit board by the plurality of dummy electrodes is strengthened and the distortion applied to the mounting terminal is dispersed, so that the connection between the mounting terminal and the circuit board is further strengthened. There is an effect.

[適用例6]適用例1乃至5の何れか一項に記載の電子部品用パッケージを備え、前記パッケージ本体の前記電極パッド上に圧電振動片が搭載された圧電振動子を特徴とする。   [Application Example 6] A piezoelectric vibrator including the electronic component package according to any one of Application Examples 1 to 5, wherein a piezoelectric vibrating piece is mounted on the electrode pad of the package body.

このように圧電振動子を構成すると、圧電振動子を車載用の電子機器に実装した場合、圧電振動子のパッケージと電子機器の回路基板との接続強度が大きいので、大きな温度変化と振動、衝撃に耐えられる電子機器が構成できるという効果がある。   When the piezoelectric vibrator is configured in this way, when the piezoelectric vibrator is mounted on an in-vehicle electronic device, the connection strength between the piezoelectric vibrator package and the circuit board of the electronic device is large, so a large temperature change, vibration, and shock There is an effect that an electronic device that can endure can be configured.

本発明に係る第1実施例のパッケージの構造を示す概略図で、(a)は断面図、(b)は底面図、(c)は底面図。BRIEF DESCRIPTION OF THE DRAWINGS It is the schematic which shows the structure of the package of 1st Example based on this invention, (a) is sectional drawing, (b) is a bottom view, (c) is a bottom view. 回路基板のパッケージを実装した際の要部拡大側面図。The principal part enlarged side view at the time of mounting the package of a circuit board. (a)〜(d)はパッケージの底面図、(e)は実装端子の形状と相対半田歪みとの関係を示す図。(A)-(d) is a bottom view of a package, (e) is a figure which shows the relationship between the shape of a mounting terminal, and relative solder distortion. (a)は導通抵抗測定用パターンの平面図、(b)は基板上に配した測定用パターンの平面図。(A) is a top view of the pattern for conductive resistance measurement, (b) is a top view of the pattern for measurement distribute | arranged on the board | substrate. ヒートサイクル回数と導通抵抗との関係を示す図。The figure which shows the relationship between the heat cycle frequency and conduction resistance. 第2実施例のパッケージの底面図。The bottom view of the package of 2nd Example. 第3実施例のパッケージの底面図。The bottom view of the package of 3rd Example. 第4実施例のパッケージの底面図。The bottom view of the package of 4th Example. 従来のパッケージの、(a)は断面図、(b)は底面図。(A) is sectional drawing and (b) is a bottom view of the conventional package.

以下、本発明の実施の形態を図面に基づいて詳細に説明する。図1(a)、(b)は、本発明に係る第1実施の形態の電子部品用パッケージと、これを用いた圧電振動子の構造を示す概略図であり、同図(a)は断面図、同図(b)は底面図である。電子部品用のパッケージ1は、図1(a)に示すように、上面側に凹部を有し、該凹部に電子部品20を搭載する矩形状の積層セラミック製のパッケージ本体6と、電子部品20を含むパッケージ本体6の上面側の開口部空間を気密封止する蓋部材30と、からなる。パッケージ本体6の上面の凹部内には、収容した電子部品20、例えば圧電振動素子の一対のリード電極と、接続する一対の電極パッド15が設けられ、パッケージ本体6の底面の短手方向両側には、実装面に実装端子ベース10a、11aと、段差部(バンプ)10b、11bとからなる一対の実装端子(端子電極)10、11が、形成されている。そして、パッケージ本体6の内部に形成した一対の電極パッド15と一対の実装端子10、11はそれぞれ複数の接続電極14により電気的に接続されている。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. 1A and 1B are schematic views showing the structure of the electronic component package according to the first embodiment of the present invention and the structure of a piezoelectric vibrator using the same. FIG. The figure and the figure (b) are bottom views. As shown in FIG. 1A, the electronic component package 1 includes a rectangular multilayer ceramic package body 6 having a concave portion on the upper surface side and mounting the electronic component 20 in the concave portion, and the electronic component 20. And a lid member 30 that hermetically seals the opening space on the upper surface side of the package main body 6. In the concave portion on the upper surface of the package body 6, a pair of lead electrodes of a housed electronic component 20, for example, a piezoelectric vibration element, and a pair of electrode pads 15 to be connected are provided. In the mounting surface, a pair of mounting terminals (terminal electrodes) 10 and 11 including mounting terminal bases 10a and 11a and step portions (bumps) 10b and 11b are formed. The pair of electrode pads 15 and the pair of mounting terminals 10 and 11 formed inside the package body 6 are electrically connected to each other by a plurality of connection electrodes 14.

図1(a)に示した例は、電子部品20として音叉型水晶振動素子を用いた場合で、音叉型水晶振動素子20の図示しない一対のリード電極は、パッケージ本体6の一対の電極パッド15に導電性接着剤を用いて接着、固定される。そして、蓋部材30として金属製の蓋を用いる場合、蓋部材30はパッケージ本体6の上部周縁部に形成したシールリング部に抵抗溶接(シーム溶接)等の手段を用いて溶接され、パッケージ本体6は気密封止される。また、図1(b)に示すように、パッケージ本体6の四隅にキャスタレーションC1、C2、C3、C4を形成し、該キャスタレーションC1、C2、C3、C4はそれぞれ実装端子10、11に接続されると共に、接続電極14として機能する。一方、キャスタレーションC1〜C4はパッケージ1を回路基板に搭載する際、半田の這い上がり(フィレット)により回路基板とパッケージ1との接続強度を大きくする効果がある。
また、図1(c)の底面図に示すように、キャスタレーションC’はパッケージ本体6底面の短手方向両側の中央部にそれぞれ1カ所ずつ設けた構成であってもよい。
The example shown in FIG. 1A is a case where a tuning fork crystal resonator element is used as the electronic component 20, and a pair of lead electrodes (not shown) of the tuning fork crystal resonator element 20 is a pair of electrode pads 15 of the package body 6. Are bonded and fixed using a conductive adhesive. When a metal lid is used as the lid member 30, the lid member 30 is welded to a seal ring formed on the upper peripheral edge of the package body 6 using means such as resistance welding (seam welding), and the package body 6. Is hermetically sealed. Further, as shown in FIG. 1B, castellations C1, C2, C3, and C4 are formed at four corners of the package body 6, and the castellations C1, C2, C3, and C4 are connected to the mounting terminals 10 and 11, respectively. In addition, it functions as the connection electrode 14. On the other hand, the castellations C1 to C4 have an effect of increasing the connection strength between the circuit board and the package 1 due to solder rising (fillet) when the package 1 is mounted on the circuit board.
Further, as shown in the bottom view of FIG. 1C, the castellation C ′ may be provided at one central portion on both sides in the short direction of the bottom surface of the package body 6.

パッケージ本体6の底面に設ける実装端子10、11は、図1(b)に示すように、短手方向両側の中央部にそれぞれ1カ所ずつ設ける。そして、これらの実装端子10、11は、始めに実装端子ベース10a、11aをスクリーン印刷等の手法を用いてパッケージ本体6に塗布し、実装端子ベース10a、11aの面上にそれぞれ段差部(バンプ)10b、11bをスクリーン印刷等の手法を用いて塗布し、パッケージ本体6と同時に焼成して形成する。スクリーン印刷の一回の塗布で焼成後の段差部の厚さは10μm〜15μm程度となるので、適切な厚さの段差部(バンプ)10b、11bを形成する。本発明の特徴は、実装端子10、11の実装端子ベース10a、11aと、段差部(バンプ)10b、11bとの位置関係にある。実装端子11を例にして説明する。実装端子ベース11aの長さ、幅をそれぞれL1、w1、段差部11bの長さ、幅をそれぞれL2、w2とし、L1>L2、w1>w2を満たすように実装端子ベース11a、段差部11bの長さ、幅をそれぞれ設定する。且つ、図1(b)の底面図に示すように、実装端子ベース11aの図中右端と、段差部11bの右端をほぼ一致させ、図中上下方向(短辺方向)では実装端子ベース11aのほぼ中央に段差部11bを位置させる。つまり、段差部11bは、実装端子11を半田により回路基板側のランド電極に接合したときに、少なくとも、電子部品用パッケージ1の中心から最も離れた位置と、パッケージ本体6の中央部寄りを除く実装端子11の周縁部との半田が厚くなるような形状とする。
実装端子10の実装端子ベース10aと段差部10bについても同様で、パッケージ本体6の中心に対して実装端子11と対称に形成される。
As shown in FIG. 1B, the mounting terminals 10 and 11 provided on the bottom surface of the package body 6 are provided at one location at each of the center portions on both sides in the short direction. The mounting terminals 10 and 11 are first applied to the package body 6 by using a method such as screen printing, and stepped portions (bumps) are respectively formed on the surfaces of the mounting terminal bases 10a and 11a. ) 10b and 11b are applied by using a method such as screen printing and baked at the same time as the package body 6. Since the thickness of the stepped portion after baking is about 10 μm to 15 μm by one application of screen printing, stepped portions (bumps) 10 b and 11 b having appropriate thicknesses are formed. The feature of the present invention is the positional relationship between the mounting terminal bases 10a and 11a of the mounting terminals 10 and 11 and the step portions (bumps) 10b and 11b. The mounting terminal 11 will be described as an example. The length and width of the mounting terminal base 11a are L1 and w1, respectively, and the length and width of the step portion 11b are L2 and w2, respectively, and the mounting terminal base 11a and the step portion 11b are set so as to satisfy L1> L2 and w1> w2. Set the length and width respectively. In addition, as shown in the bottom view of FIG. 1B, the right end of the mounting terminal base 11a in the drawing and the right end of the stepped portion 11b are substantially aligned, and in the vertical direction (short side direction) of the mounting terminal base 11a. The step portion 11b is positioned substantially at the center. That is, the stepped portion 11b excludes at least the position farthest from the center of the electronic component package 1 and the central portion of the package body 6 when the mounting terminal 11 is joined to the land electrode on the circuit board side by soldering. The shape is such that the solder with the peripheral edge of the mounting terminal 11 is thick.
The same applies to the mounting terminal base 10 a and the stepped portion 10 b of the mounting terminal 10, and is formed symmetrically with the mounting terminal 11 with respect to the center of the package body 6.

図2は、パッケージ1を回路基板25のランド電極26に実装した場合の実装端子11、つまり実装端子ベース11aと段差部11bとの要部拡大側面図である。図2から分かるように、半田28の厚さは、h2(段差部11bの下の半田の厚み)に比べ、h1(実装端子ベース11aの下の半田の厚み)が大きくなるようにパッケージの実装端子11を構成する。これは後で説明するように、回路基板25とパッケージ1との線膨張係数の違いにより生じる応力が、一番大きく掛かる領域の半田の量を多くするように、実装端子11に段差部11bを形成する。   FIG. 2 is an enlarged side view of a main part of the mounting terminal 11 when the package 1 is mounted on the land electrode 26 of the circuit board 25, that is, the mounting terminal base 11a and the stepped portion 11b. As can be seen from FIG. 2, the package is mounted such that the thickness of the solder 28 is larger than h2 (the thickness of the solder under the stepped portion 11b) h1 (the thickness of the solder under the mounting terminal base 11a). The terminal 11 is configured. As will be described later, the stepped portion 11b is provided on the mounting terminal 11 so that the amount of solder in the region where the stress caused by the difference in linear expansion coefficient between the circuit board 25 and the package 1 is the largest is increased. Form.

パッケージを回路基板に実装した場合、周囲の温度変化によりパッケージと回路基板との線膨張係数の差に起因して、半田接合部に歪みが生じる。パッケージの実装端子の形状と発生する歪みとの関係を調べるべく、パッケージの実装端子10、11の種類として、図3(a)〜(d)の底面図に示すような4種類を選んだ。図3(a)は、実装端子10、11が標準の面積を有するパッケージ、同図(b)は、(a)より大きな実装端子面積を有するパッケージ、同図(c)は、(a)のパッケージにそれぞれ2カ所の段差部(バンプ)10b、11bを設けたパッケージ、同図(d)は短手方向両側の中央部にそれぞれ1カ所のキャスタレーションC’を設けたパッケージである。図3(a)〜(d)に示すパッケージを回路基板に半田を介して実装する場合に、接合材の半田に生じる歪みの大きさとその領域をシミュレーションにより求めた。図3(a)、(b)、(d)に示すパッケージの場合、接合部の半田の厚さh1を70μmとし、同3(c)のように段差部10b、11bを設けた場合の接合部の半田の厚さh1を100μmとした。また、シミュレーションの条件は、半田の凝固点(+218℃)を応力の出発点(応力フリー)と仮定し、温度サイクルの温度条件(−40℃⇔+125℃)において、温度変化が最も大きい+218℃から−40℃を荷重条件として、半田にかかる歪みの大きさと歪みの大きな領域とをシミュレーションにより求めた。つまり、半田の凝固点(+218℃)ではパッケージと回路基板とには歪みは生じないが、温度が常温に戻ると歪みは発生し、−40℃では歪みは最大となる。なお、温度変動についてはモデル内で一様に起きるものとし、パッケージを構成する材料の残留応力は考慮しなかった。   When the package is mounted on a circuit board, distortion occurs in the solder joint due to a difference in linear expansion coefficient between the package and the circuit board due to a change in ambient temperature. In order to investigate the relationship between the shape of the package mounting terminals and the generated distortion, four types as shown in the bottom views of FIGS. 3A to 3D were selected as the types of package mounting terminals 10 and 11. 3A is a package in which the mounting terminals 10 and 11 have a standard area, FIG. 3B is a package having a mounting terminal area larger than that in FIG. 3A, and FIG. The package is provided with two stepped portions (bumps) 10b and 11b, and FIG. 4D is a package provided with one castellation C ′ at the center on both sides in the lateral direction. When the packages shown in FIGS. 3A to 3D are mounted on a circuit board via solder, the magnitude of distortion generated in the solder of the bonding material and its region were obtained by simulation. In the case of the package shown in FIGS. 3A, 3B, and 3D, the bonding when the solder thickness h1 of the bonding portion is 70 μm and the step portions 10b and 11b are provided as shown in FIG. 3C. The thickness h1 of the solder of the part was 100 μm. Also, the simulation conditions are that the solder freezing point (+ 218 ° C.) is assumed to be the starting point of stress (stress free), and the temperature change (−40 ° C. + 125 ° C.) has the largest temperature change from + 218 ° C. Under the load condition of −40 ° C., the magnitude of strain applied to the solder and the area with large strain were obtained by simulation. That is, no distortion occurs in the package and the circuit board at the solder freezing point (+ 218 ° C.), but distortion occurs when the temperature returns to room temperature, and the distortion is maximum at −40 ° C. Note that temperature fluctuations occur uniformly in the model, and the residual stress of the material constituting the package was not considered.

図3(a)の右側の実装端子上に重ね書きした図は、パッケージを回路基板に実装し、−40℃〜+125℃の温度サイクル試験を加えた場合に生じる歪みの大きな領域を示したもので、A、B、C、D、Eで示す領域、特にD、Eで示す領域に大きな歪みが生じることがシミュレーションの結果分かった。図3(a)の左側の実装端子にも右側の歪みと対称な歪みが生じることは説明するまでもない。また、図3(b)〜(d)のパッケージについても大きな歪みの生じる領域は、図3(a)の右側の図とほぼ同様の領域であった。
また、−40℃〜+125℃の温度サイクルを加えた場合に実装端子のキャスタレーションC1〜C4に生じる最大歪みを、図3(a)〜(d)のそれぞれの実装端子の形状について求めた。図3(e)は、同図(a)に示す実装端子の形状のキャスタレーションに生じる最大歪みを100とした場合の、同図(b)〜(d)の実装端子のキャスタレーションに生じる最大歪みを相対値で示した図で、横軸に実装端子の形状を示す図番(a)〜(d)を、縦軸は相対半田歪みを示す図である。図3(e)より同図(c)のパッケージのように実装端子10、11に段差部10b、11bを設けた場合が、キャスタレーションに生じる最大歪みが一番小さくなることを見出した。
The figure overwritten on the mounting terminal on the right side of FIG. 3 (a) shows a region having a large distortion generated when the package is mounted on a circuit board and a temperature cycle test of −40 ° C. to + 125 ° C. is applied. As a result of the simulation, it was found that large distortion occurs in the regions indicated by A, B, C, D, and E, particularly the regions indicated by D and E. Needless to say, distortion on the left side of the mounting terminal in FIG. In addition, in the packages of FIGS. 3B to 3D, the region where the large distortion occurs was almost the same as the right side of FIG.
Moreover, the maximum distortion which arises in the castellations C1-C4 of a mounting terminal when the temperature cycle of -40 degreeC- + 125 degreeC was added was calculated | required about the shape of each mounting terminal of Fig.3 (a)-(d). FIG. 3 (e) shows the maximum generated in the caster of the mounting terminal in FIGS. (B) to (d) when the maximum distortion generated in the castellation of the mounting terminal shape shown in FIG. In the figure which showed distortion by the relative value, the horizontal axis | shaft is the figure number (a)-(d) which shows the shape of a mounting terminal, and a vertical axis | shaft is a figure which shows a relative solder distortion. From FIG. 3 (e), it was found that when the stepped portions 10b, 11b are provided on the mounting terminals 10, 11 as in the package of FIG. 3 (c), the maximum distortion generated in the castellation is minimized.

これは、実装端子の一部に段差部10b、11bを設けることにより、回路基板と実装端子の底面との間に介在する半田が厚くなり、歪みが緩和されるのも一因とされる。また、半田の厚みと接続強度との関係は特開平5−308179号公報に開示されており、半田厚みに対し接続強度には極大値があり、適切な厚さがある。以上のシミュレーションの結果を踏まえ、歪みが大きい領域、つまりパッケージの中心から最も離れた位置と、パッケージの中央部寄りを除く実装端子の周縁部の半田厚を厚くするような実装端子を有するパッケージを種々製作した。そして、それらのクラック率(ある断面における、はんだ全長に対するクラック長さの割合)を調査した。その結果、図3(c)に示すパッケージよりも、図1に示すパッケージの方が、断面はんだクラック率が低く、すなわち、よりクラックの発生を低減できることがわかった。   This is also due to the fact that by providing the stepped portions 10b and 11b in a part of the mounting terminal, the solder interposed between the circuit board and the bottom surface of the mounting terminal becomes thick, and the distortion is alleviated. Further, the relationship between the thickness of the solder and the connection strength is disclosed in Japanese Patent Laid-Open No. 5-308179, and the connection strength has a maximum value with respect to the solder thickness and has an appropriate thickness. Based on the results of the above simulations, a package having mounting terminals that increase the solder thickness in the region where the distortion is large, that is, the position farthest from the center of the package and the peripheral edge of the mounting terminal excluding the portion near the center of the package. Various manufactured. And the crack rate (ratio of the crack length with respect to the solder full length in a certain cross section) was investigated. As a result, it was found that the package shown in FIG. 1 has a lower cross-sectional solder crack ratio than the package shown in FIG.

図1に示した本発明に係るパッケージを実装基板に実装した場合、つまりパッケージの実装端子を実装基板のランド電極に半田を介して接合した場合に、ランド電極と実装端子間の導通抵抗が−40℃〜+125℃の温度サイクル(ヒートサイクル)の回数により、どのように変化するか実験した。図4(a)はパッケージを搭載する基板上の測定用パターン40であり、41a、41bはランド電極、42a、42bは配線導体、43a、43bは導通抵抗測定用の端子電極である。図4(b)は、複数の測定用パターン40を格子状に配した、導通抵抗測定に実際に用いた基板45の平面図である。
導通抵抗の実験に用いたパッケージは、図1に示した段差部付実装端子を有するパッケージと、比較のために図3(a)〜(d)に示した一般的な実装端子を有するパッケージとを用いた。なお、実装端子とランド電極とを接合する半田の導通抵抗を測定するためであるので、パッケージ本体内部の電極パッド同士、例えば図1(a)の2個の電極パッド15は短絡したパッケージを用いた。測定点は、ヒートサイクル前、500回、1000回、1500回、2000回、2500回、3000回のヒートサイクル試験後の導通抵抗を測定した。
When the package according to the present invention shown in FIG. 1 is mounted on a mounting board, that is, when the mounting terminal of the package is joined to the land electrode of the mounting board via solder, the conduction resistance between the land electrode and the mounting terminal is − An experiment was conducted on how the temperature cycle (heat cycle) of 40 ° C. to + 125 ° C. changed. FIG. 4A shows a measurement pattern 40 on a substrate on which a package is mounted. 41a and 41b are land electrodes, 42a and 42b are wiring conductors, and 43a and 43b are terminal electrodes for measuring conduction resistance. FIG. 4B is a plan view of the substrate 45 actually used for the conduction resistance measurement in which a plurality of measurement patterns 40 are arranged in a lattice pattern.
The package used in the conduction resistance experiment includes a package having a stepped mounting terminal shown in FIG. 1 and a package having a general mounting terminal shown in FIGS. 3A to 3D for comparison. Was used. Since it is for measuring the conduction resistance of the solder that joins the mounting terminal and the land electrode, the electrode pads inside the package body, for example, the two electrode pads 15 in FIG. It was. The measurement point measured the conduction | electrical_connection resistance after the heat cycle test of 500 times, 1000 times, 1500 times, 2000 times, 2500 times, and 3000 times before a heat cycle.

図5は、各ヒートサイクル試験後の導通抵抗を示した折れ線グラフである。折れ線イ、ロ、ハは、それぞれ図3(a)、図3(d)、図1(c)に示した実装端子を有するパッケージの、ヒートサイクル回数と導通抵抗との関係を示す図である。
図5より本発明の段差部付実装端子を有するパッケージが、導通抵抗のヒートサイクル試験でも良好な結果を示すことが判明した。
FIG. 5 is a line graph showing the conduction resistance after each heat cycle test. The broken lines A, B, and C are diagrams showing the relationship between the number of heat cycles and the conduction resistance of the package having the mounting terminals shown in FIGS. 3A, 3D, and 1C, respectively. .
From FIG. 5, it was found that the package having the mounting terminal with a stepped portion of the present invention shows a good result even in a heat cycle test of conduction resistance.

図6は、第2の実施例のパッケージ2の構成を示す底面図で、4つの実装端子10、11、12、13を備えている。各実装端子10〜13はそれぞれ実装端子ベース10a〜13aと、段差部10b〜13bとからなり、各実装端子ベース10a〜13aはパッケージ底面の四隅に配置され、各角部にはキャスタレーションC1〜C4が形成される。各段差部10b〜13bは各実装端子ベース10a〜13aの面上で、パッケージの中心寄りの角部に配置される。このような各実装端子ベース10a〜13aと各段差部10b〜13bとの位置関係により、歪みが最も大きく掛かる領域の半田の厚さを厚くすることができる。   FIG. 6 is a bottom view showing the configuration of the package 2 of the second embodiment, and includes four mounting terminals 10, 11, 12, and 13. Each of the mounting terminals 10 to 13 includes a mounting terminal base 10a to 13a and a stepped portion 10b to 13b. The mounting terminal bases 10a to 13a are arranged at the four corners of the bottom surface of the package. C4 is formed. The step portions 10b to 13b are arranged at corners near the center of the package on the surfaces of the mounting terminal bases 10a to 13a. Due to the positional relationship between each of the mounting terminal bases 10a to 13a and each of the step portions 10b to 13b, the thickness of the solder in the region where the distortion is the largest can be increased.

図7は、第3の実施例のパッケージ3の構成を示す底面図で、2つの実装端子10、11と2つのダミー電極16、17とを備えている。実装端子10、11は、それぞれ実装端子ベース10a、11aと、段差部10b、11bとからなり、段差部10b、11bは実装端子ベース10a、11aに対し、図1(b)の例と同様に配置される。ダミー電極16、17はパッケージ3の長手方向両側で、短辺方向の端部寄りに形成され、ダミー電極ベース16a、17aと段差部16b、17bとより構成される。段差部16b、17bはダミー電極ベース16a、17aの面上でパッケージ3の中央部寄りに形成する。段差部16b、17bを付加したダミー電極16、17を設けることによりパッケージ3と回路基板との接続強度が強化される。   FIG. 7 is a bottom view showing the configuration of the package 3 of the third embodiment, which includes two mounting terminals 10 and 11 and two dummy electrodes 16 and 17. The mounting terminals 10 and 11 include mounting terminal bases 10a and 11a and stepped portions 10b and 11b, respectively. The stepped portions 10b and 11b are similar to the mounting terminal bases 10a and 11a as in the example of FIG. Be placed. The dummy electrodes 16 and 17 are formed on both sides in the longitudinal direction of the package 3 and closer to the end in the short side direction, and are composed of dummy electrode bases 16a and 17a and step portions 16b and 17b. The step portions 16b and 17b are formed near the center of the package 3 on the surfaces of the dummy electrode bases 16a and 17a. By providing the dummy electrodes 16 and 17 to which the step portions 16b and 17b are added, the connection strength between the package 3 and the circuit board is enhanced.

図8は、第4実施例のパッケージ4の構成を示す底面図で、図6に示した第2実施例のパッケージ2の長手方向両側に4つのダミー電極16、17、18、19を付加したパッケージである。各ダミー電極16、17、18、19はダミー電極ベース16a、17a、18a、19aと、段差部16b、17b、18b、19bとからなり、段差部16b〜19bはダミー電極ベース16a〜19aの面上でパッケージ4の中央部寄りに形成される。パッケージに複数のダミー電極16〜19を設けることにより、パッケージと回路基板との接続強度がさらに大きくなる。   FIG. 8 is a bottom view showing the configuration of the package 4 of the fourth embodiment, and four dummy electrodes 16, 17, 18, 19 are added to both sides in the longitudinal direction of the package 2 of the second embodiment shown in FIG. It is a package. Each dummy electrode 16, 17, 18, 19 comprises a dummy electrode base 16a, 17a, 18a, 19a and stepped portions 16b, 17b, 18b, 19b. The stepped portions 16b-19b are the surfaces of the dummy electrode bases 16a-19a. It is formed near the center of the package 4 above. By providing the plurality of dummy electrodes 16 to 19 on the package, the connection strength between the package and the circuit board is further increased.

図1に示した第1実施例では、パッケージ1の凹部に形成した電極パッド15上に音叉型水晶振動素子を搭載した例を示したが、図6、7、8に示した第2〜4実施例のパッケージ2、3、4の凹部に圧電振動素子を搭載し、表面実装型の圧電振動子を構成してもよい。
端子電極に凸部を有するパッケージが特許文献2に開示されているが、本発明に係るパッケージの実装端子の構成は大きな歪みが加わる、パッケージの中心から遠い領域と、パッケージの中央部寄りを除く実装端子の周縁部の領域の半田の厚さを厚くするような実装端子の構造とする点が異なる。
In the first embodiment shown in FIG. 1, an example in which a tuning fork type crystal vibrating element is mounted on the electrode pad 15 formed in the concave portion of the package 1 is shown, but the second to fourth shown in FIGS. A piezoelectric vibration element may be mounted in the recesses of the packages 2, 3, and 4 of the embodiment to constitute a surface-mount type piezoelectric vibrator.
A package having a convex portion on the terminal electrode is disclosed in Patent Document 2, but the configuration of the mounting terminal of the package according to the present invention is greatly strained, excluding a region far from the center of the package and a portion near the center of the package. The difference is that the structure of the mounting terminal is such that the thickness of the solder in the peripheral region of the mounting terminal is increased.

1、2、3、4…パッケージ、6…パッケージ本体、10、11…実装端子、10a、11a、12a、13a…実装端子ベース、10b、11b、12b、13b、16b、17b、18b、19b…段差部(バンプ)、16、17、18、19…ダミー電極、16a、17a、18a、19a…ダミー電極ベース、14…接続電極、15…電極パッド、20…電子部品、25…回路基板、26…ランド電極、28…半田、30…蓋部材、C’、C1、C2、C3、C4…キャスタレーション、A、B、C、D、E…歪みの大きな領域、40…測定用パターン、41a、41b…ランド電極、42a、42b…配線導体、43a、43b…測定用の端子電極、45…基板。   1, 2, 3, 4 ... package, 6 ... package body, 10, 11 ... mounting terminal, 10a, 11a, 12a, 13a ... mounting terminal base, 10b, 11b, 12b, 13b, 16b, 17b, 18b, 19b ... Step part (bump), 16, 17, 18, 19 ... dummy electrode, 16a, 17a, 18a, 19a ... dummy electrode base, 14 ... connection electrode, 15 ... electrode pad, 20 ... electronic component, 25 ... circuit board, 26 ... land electrode, 28 ... solder, 30 ... lid member, C ', C1, C2, C3, C4 ... castellation, A, B, C, D, E ... large distortion region, 40 ... measurement pattern, 41a, 41b ... land electrodes, 42a, 42b ... wiring conductors, 43a, 43b ... terminal electrodes for measurement, 45 ... substrate.

Claims (6)

矩形状のパッケージ本体と、前記パッケージ本体を気密封止する蓋部材と、からなる電子部品用パッケージであって、
前記パッケージ本体の内部に形成された電極パッドと、
前記パッケージ本体の底面のうち少なくとも四隅の近傍に形成され、かつ実装面に段差部を有する実装端子と、
前記パッドと前記実装端子とを電気的に接続する複数の接続電極と、を備えたことを特徴とする電子部品用パッケージ。
An electronic component package comprising a rectangular package body and a lid member for hermetically sealing the package body,
An electrode pad formed inside the package body;
A mounting terminal formed in the vicinity of at least four corners of the bottom surface of the package body and having a stepped portion on the mounting surface;
An electronic component package comprising: a plurality of connection electrodes that electrically connect the pad and the mounting terminal.
前記パッケージ本体の前記四隅にキャスタレーションを形成し、該キャスタレーションにそれぞれ前記接続電極を形成したことを特徴とする請求項1に記載の電子部品用パッケージ。   2. The electronic component package according to claim 1, wherein a castellation is formed at each of the four corners of the package body, and the connection electrode is formed on each of the castellations. 前記段差部は、前記実装端子を半田により回路基板に接合したときに、前記実装端子上において前記四隅の周辺に形成された半田が厚くなるような形状であることを特徴とする請求項1又は2に記載の電子部品用パッケージ。   The step portion is shaped such that when the mounting terminal is joined to a circuit board with solder, the solder formed around the four corners on the mounting terminal is thickened. The package for electronic components as described in 2. 前記パッケージに一対のダミー電極を形成したことを特徴とする請求項1乃至3の何れか一項に記載の電子部品用パッケージ。   The electronic component package according to any one of claims 1 to 3, wherein a pair of dummy electrodes is formed on the package. 前記一対のダミー電極を複数形成したことを特徴とする請求項4に記載の電子部品用パッケージ。   The electronic component package according to claim 4, wherein a plurality of the pair of dummy electrodes are formed. 請求項1乃至5の何れか一項に記載の電子部品用パッケージを備え、前記パッケージ本体の前記電極パッド上に圧電振動片が搭載されたことを特徴とする圧電振動子。   A piezoelectric vibrator comprising the electronic component package according to claim 1, wherein a piezoelectric vibrating piece is mounted on the electrode pad of the package body.
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