JP2013061257A - X線検査装置、x線検査装置の制御方法、x線検査装置を制御するためのプログラム、および、当該プログラムを格納した記録媒体 - Google Patents
X線検査装置、x線検査装置の制御方法、x線検査装置を制御するためのプログラム、および、当該プログラムを格納した記録媒体 Download PDFInfo
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- JP2013061257A JP2013061257A JP2011200134A JP2011200134A JP2013061257A JP 2013061257 A JP2013061257 A JP 2013061257A JP 2011200134 A JP2011200134 A JP 2011200134A JP 2011200134 A JP2011200134 A JP 2011200134A JP 2013061257 A JP2013061257 A JP 2013061257A
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- 238000000034 method Methods 0.000 title claims description 25
- 238000012545 processing Methods 0.000 claims abstract description 6
- 230000007246 mechanism Effects 0.000 claims description 72
- 230000001678 irradiating effect Effects 0.000 claims description 21
- 230000008569 process Effects 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 7
- 238000003384 imaging method Methods 0.000 abstract description 71
- 230000000007 visual effect Effects 0.000 abstract description 34
- 238000004364 calculation method Methods 0.000 description 41
- 230000003287 optical effect Effects 0.000 description 15
- 238000010586 diagram Methods 0.000 description 11
- 238000002591 computed tomography Methods 0.000 description 7
- 230000007704 transition Effects 0.000 description 5
- 101100328887 Caenorhabditis elegans col-34 gene Proteins 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000013170 computed tomography imaging Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/027—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis characterised by the use of a particular data acquisition trajectory, e.g. helical or spiral
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
- A61B6/035—Mechanical aspects of CT
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/54—Control of apparatus or devices for radiation diagnosis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Medical Informatics (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Biomedical Technology (AREA)
- Veterinary Medicine (AREA)
- Public Health (AREA)
- Animal Behavior & Ethology (AREA)
- Surgery (AREA)
- Biophysics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Heart & Thoracic Surgery (AREA)
- Pulmonology (AREA)
- Theoretical Computer Science (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011200134A JP2013061257A (ja) | 2011-09-14 | 2011-09-14 | X線検査装置、x線検査装置の制御方法、x線検査装置を制御するためのプログラム、および、当該プログラムを格納した記録媒体 |
PCT/JP2012/073056 WO2013039032A1 (fr) | 2011-09-14 | 2012-09-10 | Dispositif de radiographie, procédé et programme de commande du dispositif de radiographie, et support d'informations pour sauvegarder le programme |
TW101133421A TW201312102A (zh) | 2011-09-14 | 2012-09-13 | X光檢查裝置、x光檢查裝置之控制方法、用於控制x光檢查裝置之程式及儲存該程式之記錄媒體 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011200134A JP2013061257A (ja) | 2011-09-14 | 2011-09-14 | X線検査装置、x線検査装置の制御方法、x線検査装置を制御するためのプログラム、および、当該プログラムを格納した記録媒体 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2013061257A true JP2013061257A (ja) | 2013-04-04 |
Family
ID=47883262
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011200134A Withdrawn JP2013061257A (ja) | 2011-09-14 | 2011-09-14 | X線検査装置、x線検査装置の制御方法、x線検査装置を制御するためのプログラム、および、当該プログラムを格納した記録媒体 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2013061257A (fr) |
TW (1) | TW201312102A (fr) |
WO (1) | WO2013039032A1 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021181783A1 (fr) * | 2020-03-11 | 2021-09-16 | オムロン株式会社 | Dispositif d'inspection par rayons x et procédé d'inspection par rayons x |
WO2021215217A1 (fr) * | 2020-04-22 | 2021-10-28 | 株式会社サキコーポレーション | Appareil d'inspection |
JP7460197B2 (ja) | 2019-07-12 | 2024-04-02 | エクシルム・エービー | 試料の撮像方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62172698A (ja) * | 1986-01-24 | 1987-07-29 | Hitachi Medical Corp | X線ct装置 |
JP4386812B2 (ja) * | 2003-08-27 | 2009-12-16 | パナソニック株式会社 | X線検査装置 |
JPWO2009078415A1 (ja) * | 2007-12-17 | 2011-04-28 | 株式会社ユニハイトシステム | X線検査装置および方法 |
JP5444718B2 (ja) * | 2009-01-08 | 2014-03-19 | オムロン株式会社 | 検査方法、検査装置および検査用プログラム |
JP2011149738A (ja) * | 2010-01-19 | 2011-08-04 | Saki Corp:Kk | 補正用治具を用いた検査装置の補正方法、補正用治具を搭載した検査装置 |
JP4598880B1 (ja) * | 2010-04-23 | 2010-12-15 | 東芝Itコントロールシステム株式会社 | Ct装置およびct装置の撮影方法 |
-
2011
- 2011-09-14 JP JP2011200134A patent/JP2013061257A/ja not_active Withdrawn
-
2012
- 2012-09-10 WO PCT/JP2012/073056 patent/WO2013039032A1/fr active Application Filing
- 2012-09-13 TW TW101133421A patent/TW201312102A/zh unknown
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7460197B2 (ja) | 2019-07-12 | 2024-04-02 | エクシルム・エービー | 試料の撮像方法 |
WO2021181783A1 (fr) * | 2020-03-11 | 2021-09-16 | オムロン株式会社 | Dispositif d'inspection par rayons x et procédé d'inspection par rayons x |
JP2021143912A (ja) * | 2020-03-11 | 2021-09-24 | オムロン株式会社 | X線検査装置およびx線検査方法 |
WO2021215217A1 (fr) * | 2020-04-22 | 2021-10-28 | 株式会社サキコーポレーション | Appareil d'inspection |
JP7437222B2 (ja) | 2020-04-22 | 2024-02-22 | 株式会社サキコーポレーション | 検査装置 |
Also Published As
Publication number | Publication date |
---|---|
WO2013039032A1 (fr) | 2013-03-21 |
TW201312102A (zh) | 2013-03-16 |
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A300 | Withdrawal of application because of no request for examination |
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