JP2013012260A5 - Inspection and sorting method for glass substrate for HDD, method for manufacturing information recording medium for HDD, and glass substrate for HDD - Google Patents
Inspection and sorting method for glass substrate for HDD, method for manufacturing information recording medium for HDD, and glass substrate for HDD Download PDFInfo
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- JP2013012260A5 JP2013012260A5 JP2011142745A JP2011142745A JP2013012260A5 JP 2013012260 A5 JP2013012260 A5 JP 2013012260A5 JP 2011142745 A JP2011142745 A JP 2011142745A JP 2011142745 A JP2011142745 A JP 2011142745A JP 2013012260 A5 JP2013012260 A5 JP 2013012260A5
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Claims (7)
前記ＨＤＤ用ガラス基板の径方向において、中心孔の径端から０．５ｍｍの位置から、前記ＨＤＤ用ガラス基板の外径端から０．５ｍｍの位置までの位相差の最大値が、５．０ｎｍ未満であるものを選択することを特徴とするＨＤＤ用ガラス基板の検品・選別方法。 In the process of inspecting and sorting the glass substrate for HDD in which the compressive stress layer is applied to the surface layer by the chemical strengthening process,
In the radial direction of the glass substrate for HDD, the maximum value of the phase difference from the position 0.5 mm from the radial end of the central hole to the position 0.5 mm from the outer diameter end of the glass substrate for HDD is 5.0 nm A method of inspecting and sorting a glass substrate for an HDD, comprising selecting one less than the above.
前記位相差の最大値が、３．０ｎｍ未満であるものを選択することを特徴とする請求項１に記載のＨＤＤ用ガラス基板の検品・選別方法。 In the process of inspecting and sorting the glass substrate for HDD in which a compressive stress layer of less than 20 μm is applied to the surface layer by the chemical strengthening process,
2. The method according to claim 1, wherein the maximum value of the phase difference is selected to be less than 3.0 nm.
径方向において、中心孔の径端より０．５ｍｍの位置から、外径端より０．５ｍｍの位置までの位相差の最大値が、５．０ｎｍ未満であることを特徴とするＨＤＤ用ガラス基板。The glass substrate for HDD, wherein the maximum value of the phase difference from the position 0.5 mm from the diameter end of the central hole to the position 0.5 mm from the outer diameter end in the radial direction is less than 5.0 nm .
前記位相差の最大値が、３．０ｎｍ未満であることを特徴とする請求項５に記載のＨＤＤ用ガラス基板。The glass substrate for an HDD according to claim 5, wherein the maximum value of the retardation is less than 3.0 nm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011142745A JP5755952B2 (en) | 2011-06-28 | 2011-06-28 | Inspection and sorting method for HDD glass substrate, manufacturing method of HDD information recording medium, and HDD glass substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011142745A JP5755952B2 (en) | 2011-06-28 | 2011-06-28 | Inspection and sorting method for HDD glass substrate, manufacturing method of HDD information recording medium, and HDD glass substrate |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013012260A JP2013012260A (en) | 2013-01-17 |
| JP2013012260A5 true JP2013012260A5 (en) | 2014-08-07 |
| JP5755952B2 JP5755952B2 (en) | 2015-07-29 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011142745A Active JP5755952B2 (en) | 2011-06-28 | 2011-06-28 | Inspection and sorting method for HDD glass substrate, manufacturing method of HDD information recording medium, and HDD glass substrate |
Country Status (1)
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| JP (1) | JP5755952B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017217388A1 (en) * | 2016-06-17 | 2017-12-21 | 日本電気硝子株式会社 | Tempered glass plate and production method for tempered glass plate |
| JP6015876B1 (en) * | 2016-07-05 | 2016-10-26 | 旭硝子株式会社 | Glass substrate for magnetic recording medium and method for manufacturing magnetic recording medium |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09109196A (en) * | 1995-10-23 | 1997-04-28 | Mitsubishi Eng Plast Kk | Injection mold die for manufacturing optical disk |
| JP2001228034A (en) * | 2000-02-14 | 2001-08-24 | Fuji Electric Co Ltd | Measurement method for internal stress condition of disk board |
| JP5118311B2 (en) * | 2006-03-27 | 2013-01-16 | 株式会社フォトニックラティス | Measuring device for phase difference and optical axis orientation |
| JP5227711B2 (en) * | 2007-09-28 | 2013-07-03 | Ｈｏｙａ株式会社 | Glass substrate for magnetic disk and manufacturing method thereof |
| JP2012203960A (en) * | 2011-03-25 | 2012-10-22 | Konica Minolta Advanced Layers Inc | Manufacturing method for glass substrate for magnetic information recording medium |
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2011
- 2011-06-28 JP JP2011142745A patent/JP5755952B2/en active Active
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