JP2012515559A - 制御された先端部材負荷用蒸着を含む大面積均質アレイの製作方法 - Google Patents

制御された先端部材負荷用蒸着を含む大面積均質アレイの製作方法 Download PDF

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JP2012515559A
JP2012515559A JP2011548193A JP2011548193A JP2012515559A JP 2012515559 A JP2012515559 A JP 2012515559A JP 2011548193 A JP2011548193 A JP 2011548193A JP 2011548193 A JP2011548193 A JP 2011548193A JP 2012515559 A JP2012515559 A JP 2012515559A
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tip member
array
substrate
article
tip
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JP2012515559A5 (enExample
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ナビル エー. アムロ
レイモンド サネドリン
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ナノインク インコーポレーティッド
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00Applications, other than SPM, of scanning-probe techniques

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Micromachines (AREA)
  • Apparatus Associated With Microorganisms And Enzymes (AREA)
  • Micro-Organisms Or Cultivation Processes Thereof (AREA)
  • Physical Vapour Deposition (AREA)
JP2011548193A 2009-01-26 2010-01-25 制御された先端部材負荷用蒸着を含む大面積均質アレイの製作方法 Pending JP2012515559A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14744809P 2009-01-26 2009-01-26
US61/147,448 2009-01-26
PCT/US2010/022013 WO2010085767A1 (en) 2009-01-26 2010-01-25 Large area, homogeneous array fabrication including controlled tip loading vapor deposition

Publications (2)

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JP2012515559A true JP2012515559A (ja) 2012-07-12
JP2012515559A5 JP2012515559A5 (enExample) 2013-03-14

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JP2011548193A Pending JP2012515559A (ja) 2009-01-26 2010-01-25 制御された先端部材負荷用蒸着を含む大面積均質アレイの製作方法

Country Status (8)

Country Link
US (1) US20100229264A1 (enExample)
EP (1) EP2389613A1 (enExample)
JP (1) JP2012515559A (enExample)
KR (1) KR20110119665A (enExample)
AU (1) AU2010206592A1 (enExample)
CA (1) CA2750425A1 (enExample)
SG (1) SG172854A1 (enExample)
WO (1) WO2010085767A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8214916B2 (en) * 2009-01-26 2012-07-03 Nanoink, Inc. Large area, homogeneous array fabrication including leveling with use of bright spots
AU2010206594A1 (en) * 2009-01-26 2011-07-28 Nanoink, Inc. Large area, homogeneous array fabrication including homogeneous substrates
US9267963B2 (en) * 2012-11-08 2016-02-23 The Board Of Trustees Of The Leland Stanford Junior University Interferometric atomic-force microscopy device and method
US9276190B2 (en) 2013-10-01 2016-03-01 The Pen Practical method of producing an aerogel composite continuous thin film thermoelectric semiconductor material by modified MOCVD
US9040339B2 (en) 2013-10-01 2015-05-26 The Pen Practical method of producing an aerogel composite continuous thin film thermoelectric semiconductor material
CN107210353A (zh) * 2015-02-13 2017-09-26 泽·佩恩 产生气凝胶复合的连续薄膜热电半导体材料的实用方法
CN116124838B (zh) * 2023-03-27 2025-08-22 厦门大学 一种WTe2电极单分子测试芯片及其制备方法
WO2025085812A1 (en) * 2023-10-20 2025-04-24 The Regents Of The University Of California Devices for droplet deposition and methods of making thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007126689A1 (en) * 2006-04-19 2007-11-08 Northwestern University Article for parallel lithography with two-dimensional pen arrays
WO2008091279A2 (en) * 2006-06-28 2008-07-31 Northwestern University Etching and hole arrays
WO2008112713A1 (en) * 2007-03-13 2008-09-18 Nanoink, Inc. Nanolithography with use of viewports

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8910566D0 (en) * 1989-05-08 1989-06-21 Amersham Int Plc Imaging apparatus and method
US5171992A (en) 1990-10-31 1992-12-15 International Business Machines Corporation Nanometer scale probe for an atomic force microscope, and method for making same
US6827979B2 (en) * 1999-01-07 2004-12-07 Northwestern University Methods utilizing scanning probe microscope tips and products therefor or produced thereby
US6635311B1 (en) * 1999-01-07 2003-10-21 Northwestern University Methods utilizing scanning probe microscope tips and products therefor or products thereby
IL134631A0 (en) * 2000-02-20 2001-04-30 Yeda Res & Dev Constructive nanolithography
EP1146376A1 (en) * 2000-04-12 2001-10-17 Triple-O Microscopy GmbH Method and apparatus for the controlled conditioning of scanning probes
US7291284B2 (en) 2000-05-26 2007-11-06 Northwestern University Fabrication of sub-50 nm solid-state nanostructures based on nanolithography
US6642129B2 (en) * 2001-07-26 2003-11-04 The Board Of Trustees Of The University Of Illinois Parallel, individually addressable probes for nanolithography
KR20040086322A (ko) 2002-01-31 2004-10-08 아토피나 정전기 방지 스티렌계 중합체 조성물
US7279046B2 (en) * 2002-03-27 2007-10-09 Nanoink, Inc. Method and apparatus for aligning patterns on a substrate
US7060977B1 (en) * 2002-05-14 2006-06-13 Nanoink, Inc. Nanolithographic calibration methods
EP1363164B1 (en) * 2002-05-16 2015-04-29 NaWoTec GmbH Procedure for etching of materials at the surface with focussed electron beam induced chemical reactions at said surface
WO2004007207A1 (en) * 2002-07-11 2004-01-22 Willett International Limited Method for coating printed images
AU2003287618A1 (en) * 2002-11-12 2004-06-03 Nanoink, Inc. Methods and apparatus for ink delivery to nanolithographic probe systems
US20050003172A1 (en) * 2002-12-17 2005-01-06 General Electric Company 7FAstage 1 abradable coatings and method for making same
US20040228962A1 (en) * 2003-05-16 2004-11-18 Chang Liu Scanning probe microscopy probe and method for scanning probe contact printing
WO2005048283A2 (en) * 2003-07-18 2005-05-26 Northwestern University Surface and site-specific polymerization by direct-write lithography
US20050088173A1 (en) * 2003-10-24 2005-04-28 Abraham David W. Method and apparatus for tunable magnetic force interaction in a magnetic force microscope
US20050196535A1 (en) * 2004-03-02 2005-09-08 Weigel Scott J. Solvents and methods using same for removing silicon-containing residues from a substrate
US7690325B2 (en) 2004-04-30 2010-04-06 Bioforce Nanosciences, Inc. Method and apparatus for depositing material onto a surface
US20060242740A1 (en) * 2004-08-11 2006-10-26 California Institute Of Technology Method and device for surfactant activated Dip-Pen Nanolithography
WO2006106818A1 (ja) * 2005-03-31 2006-10-12 Japan Science And Technology Agency 走査型プローブ顕微鏡用カンチレバー及びそれを具備する走査型プローブ顕微鏡
GB0509213D0 (en) * 2005-05-04 2005-06-15 Univ Durham A method for creating a chemically patterned surface
US8256017B2 (en) * 2006-08-31 2012-08-28 Nanoink, Inc. Using optical deflection of cantilevers for alignment
US7992431B2 (en) * 2006-11-28 2011-08-09 Drexel University Piezoelectric microcantilevers and uses in atomic force microscopy
US20080242559A1 (en) * 2007-03-28 2008-10-02 Northwestern University Protein and peptide arrays
JP5269887B2 (ja) 2007-05-09 2013-08-21 ナノインク インコーポレーティッド 小型ナノファブリケーション装置
KR20100056453A (ko) 2007-08-08 2010-05-27 노쓰웨스턴유니버시티 캔틸레버 어레이에 대해 독립적으로 어드레스 가능한 자가 보정 잉킹 방법
WO2009070796A1 (en) * 2007-11-29 2009-06-04 President And Fellows Of Harvard College Assembly and deposition of materials using a superhydrophobic surface structure
AU2009210719A1 (en) 2008-02-05 2009-08-13 Nanoink, Inc. Array and cantilever array leveling
WO2009132321A1 (en) 2008-04-25 2009-10-29 Northwestern University Polymer pen lithography
US8214916B2 (en) * 2009-01-26 2012-07-03 Nanoink, Inc. Large area, homogeneous array fabrication including leveling with use of bright spots
KR20110119666A (ko) * 2009-01-26 2011-11-02 나노잉크, 인크. 기판 온도 조절을 포함하는 넓은 면적의 균일한 어레이 제작
AU2010206594A1 (en) * 2009-01-26 2011-07-28 Nanoink, Inc. Large area, homogeneous array fabrication including homogeneous substrates

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007126689A1 (en) * 2006-04-19 2007-11-08 Northwestern University Article for parallel lithography with two-dimensional pen arrays
WO2008091279A2 (en) * 2006-06-28 2008-07-31 Northwestern University Etching and hole arrays
WO2008112713A1 (en) * 2007-03-13 2008-09-18 Nanoink, Inc. Nanolithography with use of viewports

Also Published As

Publication number Publication date
EP2389613A1 (en) 2011-11-30
KR20110119665A (ko) 2011-11-02
AU2010206592A1 (en) 2011-07-28
SG172854A1 (en) 2011-08-29
CA2750425A1 (en) 2010-07-29
WO2010085767A1 (en) 2010-07-29
US20100229264A1 (en) 2010-09-09

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