JP2012255784A - 保護回路及びそれを含む絶縁抵抗測定装置 - Google Patents

保護回路及びそれを含む絶縁抵抗測定装置 Download PDF

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Publication number
JP2012255784A
JP2012255784A JP2012130466A JP2012130466A JP2012255784A JP 2012255784 A JP2012255784 A JP 2012255784A JP 2012130466 A JP2012130466 A JP 2012130466A JP 2012130466 A JP2012130466 A JP 2012130466A JP 2012255784 A JP2012255784 A JP 2012255784A
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JP
Japan
Prior art keywords
switch
current
drain
current control
constant current
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Pending
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JP2012130466A
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English (en)
Japanese (ja)
Inventor
Hiroshi Okubo
宏 大久保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electro Mechanics Co Ltd
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Samsung Electro Mechanics Co Ltd
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Application filed by Samsung Electro Mechanics Co Ltd filed Critical Samsung Electro Mechanics Co Ltd
Publication of JP2012255784A publication Critical patent/JP2012255784A/ja
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36Overload-protection arrangements or circuits for electric measuring instruments
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H75/00Protective overload circuit-breaking switches in which excess current opens the contacts by automatic release of mechanical energy stored by previous operation of power reset mechanism
    • H01H75/10Protective overload circuit-breaking switches in which excess current opens the contacts by automatic release of mechanical energy stored by previous operation of power reset mechanism having only electromagnetic release

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Amplifiers (AREA)
JP2012130466A 2011-06-09 2012-06-08 保護回路及びそれを含む絶縁抵抗測定装置 Pending JP2012255784A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2011-0055707 2011-06-09
KR1020110055707A KR101251831B1 (ko) 2011-06-09 2011-06-09 보호 회로 및 이를 포함하는 절연 저항 측정 장치

Publications (1)

Publication Number Publication Date
JP2012255784A true JP2012255784A (ja) 2012-12-27

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ID=47303170

Family Applications (1)

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JP2012130466A Pending JP2012255784A (ja) 2011-06-09 2012-06-08 保護回路及びそれを含む絶縁抵抗測定装置

Country Status (3)

Country Link
JP (1) JP2012255784A (ko)
KR (1) KR101251831B1 (ko)
CN (1) CN102818935A (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104330637A (zh) * 2014-10-10 2015-02-04 国家电网公司 500kv变压器直流电阻与直流去磁智能测试仪及方法
JP2023069273A (ja) * 2021-11-05 2023-05-18 日本電子株式会社 高電圧増幅回路、及び分析装置
US11762022B2 (en) 2019-10-29 2023-09-19 Lg Energy Solution, Ltd. Electric leakage detection apparatus, electric leakage detection method, and electric vehicle

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002082131A (ja) * 2000-09-11 2002-03-22 Murata Mfg Co Ltd 直流定電流回路及びコンデンサの絶縁抵抗測定装置
JP2004012246A (ja) * 2002-06-05 2004-01-15 Murata Mfg Co Ltd 絶縁抵抗測定装置
JP2007333529A (ja) * 2006-06-14 2007-12-27 Tokyo Weld Co Ltd 絶縁抵抗測定装置、漏洩電流測定装置、絶縁抵抗測定方法および漏洩電流測定方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7710701B1 (en) * 2007-04-09 2010-05-04 National Semiconductor Corporation System and method for providing a process, temperature and over-drive invariant over-current protection circuit
US7826191B1 (en) * 2007-05-14 2010-11-02 National Semiconductor Corporation Dynamic current limiting for switching regulators
US8174251B2 (en) * 2007-09-13 2012-05-08 Freescale Semiconductor, Inc. Series regulator with over current protection circuit
US7881031B2 (en) * 2007-12-07 2011-02-01 Micrel, Inc. Overcurrent protection circuit when setting current using a package control pin
CN101470146A (zh) * 2007-12-27 2009-07-01 华为技术有限公司 一种评估绝缘电阻劣化失效的方法、装置和系统
KR101001138B1 (ko) 2008-11-14 2010-12-15 삼화디에스피주식회사 절연저항측정을 겸한 모터보호 장치 및 그 방법
JP2010160124A (ja) 2009-01-06 2010-07-22 Ikeda Yoshihisa 絶縁抵抗測定端子を備えた接触器
CN201414238Y (zh) * 2009-06-03 2010-02-24 南京汉德森科技股份有限公司 Led路灯电源布线结构

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002082131A (ja) * 2000-09-11 2002-03-22 Murata Mfg Co Ltd 直流定電流回路及びコンデンサの絶縁抵抗測定装置
JP2004012246A (ja) * 2002-06-05 2004-01-15 Murata Mfg Co Ltd 絶縁抵抗測定装置
JP2007333529A (ja) * 2006-06-14 2007-12-27 Tokyo Weld Co Ltd 絶縁抵抗測定装置、漏洩電流測定装置、絶縁抵抗測定方法および漏洩電流測定方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104330637A (zh) * 2014-10-10 2015-02-04 国家电网公司 500kv变压器直流电阻与直流去磁智能测试仪及方法
CN104330637B (zh) * 2014-10-10 2017-05-17 国家电网公司 500kv变压器直流电阻与直流去磁智能测试方法
US11762022B2 (en) 2019-10-29 2023-09-19 Lg Energy Solution, Ltd. Electric leakage detection apparatus, electric leakage detection method, and electric vehicle
JP2023069273A (ja) * 2021-11-05 2023-05-18 日本電子株式会社 高電圧増幅回路、及び分析装置
JP7440475B2 (ja) 2021-11-05 2024-02-28 日本電子株式会社 高電圧増幅回路、及び分析装置

Also Published As

Publication number Publication date
KR101251831B1 (ko) 2013-04-09
CN102818935A (zh) 2012-12-12
KR20120136652A (ko) 2012-12-20

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