JP2012234470A - Manufacturing control system and crystal oscillator - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a manufacturing control system capable of facilitating identification of a crystal oscillator and achieving manufacturing process control and setting of control parameters according to a manufacturing history (including an inspection history), and to provide the crystal oscillator.SOLUTION: The manufacturing control system includes: a control terminal 4 for controlling processing in a manufacturing process of a crystal oscillator; a server 5 for storing a manufacturing history of the crystal oscillator; and a reader/writer 2 for receiving identification information of an IC tag 11 mounted on the crystal oscillator 1. When receiving the identification information from the reader/writer 2, the control terminal 4 makes a request to the server 5 for manufacturing history information attaching the identification information, and displays the manufacturing history information received from the server. The server 5 stores the manufacturing history information for each identification information of the IC tag 11 mounted on the crystal oscillator 1, and when receiving the request for the manufacturing history information to which the identification information is attached from the control terminal 4, the server 5 reads out the manufacturing history information corresponding to the identification information, and transmits the manufacturing history information to the control terminal 4 having made the request. There is also provided the crystal oscillator.

Description

  The present invention relates to a manufacturing management system for a crystal oscillator, and in particular, can easily identify an individual product and trace a manufacturing history, and control parameters for performing an appropriate operation reflecting the manufacturing history. The present invention relates to a manufacturing management system and a crystal oscillator that can be set to

[Description of Prior Art]
In the crystal oscillator, in order to individually identify a product and trace the history of processes and inspections in the manufacturing stage, an identification number is printed or a label is attached to the product.
As a method for printing the identification number, there are laser and direct marking.

  In addition, as a system for managing articles, an IC tag (electronic tag, RFID (Radio Frequency IDentification) tag) storing an identification number is attached to the article, and communication with the IC tag is performed. Management systems for tracing are known.

[Related technologies]
In addition, as a technique related to individual identification of a crystal oscillator, Japanese Patent Application Laid-Open No. 2004-354300 “Micro-array substrate with IC tag” (Dai Nippon Printing Co., Ltd., Patent Document 1), Japanese Patent Application Laid-Open No. 2002-118229 “Semiconductor device “Function setting method and evaluation method thereof” (Matsushita Electric Industrial Co., Ltd., Patent Document 2), Japanese Patent Application Laid-Open No. 2004-274698 “Receiver manufacturing method and receiver manufactured using the method” (Seiko Epson Corporation) Patent Document 3).

Patent Document 1 describes that in a microarray substrate, individual identification is performed by wirelessly communicating with an IC chip incorporated in the substrate.
Patent Document 2 describes that a semiconductor device is individually identified by communicating with a chip IP attached to a substrate.
Further, in Patent Document 3, the manufacturer stores the characteristic data of the piezoelectric device in the server in association with the identification number, and the customer accesses the server via the communication network and stores the characteristic data corresponding to the manufacturing number. Is acquired and written in the memory of the electronic device on which the piezoelectric device is mounted.

JP 2004-354300 A JP 2002-118229 A JP 2004-274698 A

However, in the method of printing the identification number on the crystal oscillator by laser or direct marking, the printed surface may be oxidized and the product characteristics may be changed. The above-described work is complicated, and the manufacturing cost increases due to an increase in man-hours.
Furthermore, with the miniaturization of products, there has been a problem that printing, reading of contents, or labeling becomes difficult.

  Further, in the manufacturing process, it has not been performed to change inspection or processing conditions or set control parameters for adjusting product characteristics in accordance with the manufacturing history and inspection history.

  The present invention has been made in view of the above circumstances, can easily identify individual crystal oscillators, and can realize manufacturing process control and control parameter setting according to manufacturing history (including inspection history). An object is to provide a manufacturing management system and a crystal oscillator.

  The present invention for solving the problems of the above conventional example is a crystal oscillator manufacturing management system, a control terminal for controlling processing in a crystal oscillator manufacturing process, and storing and controlling crystal oscillator manufacturing history information A server that displays and outputs to the terminal; and a reader / writer that receives the identification information transmitted from the IC tag mounted on the crystal oscillator and transmits the identification information to the control terminal. When the control terminal receives the identification information from the reader / writer, Request manufacturing history information from the server with identification information, display the manufacturing history information received from the server, and the server stores the manufacturing history information for each identification information of the IC tag mounted on the crystal oscillator. When the manufacturing history information request with the identification information is received from the control terminal, the manufacturing history information corresponding to the identification information is read and transmitted to the requesting control terminal. It is.

  Further, according to the present invention, in the manufacturing management system, the control terminal requests manufacturing history information with a process number, and the server displays the manufacturing history information corresponding to the identification information corresponding to the process number. It is characterized in that manufacturing history information of related processes preset as items is transmitted to the control terminal.

  Further, in the manufacturing management system according to the present invention, the IC tag can internally set information received via the reader / writer, and the server can set a predetermined process number characteristic range in advance. The control parameters of the crystal oscillator are stored, and when the control parameter request with the identification information is received from the control terminal, the process result of the specific process number is read from the manufacturing history information corresponding to the identification information. The control parameter stored in accordance with the characteristic range including the result is read out and transmitted to the requesting control terminal, and the control terminal transmits a control parameter request with identification information to the server. The control parameter is set to the IC tag of the crystal oscillator via the reader / writer when the control parameter is received from the reader / writer.

  The present invention also provides an IC tag that stores identification information in a crystal oscillator and transmits the identification information to the reader / writer when entering the communication area of the reader / writer, and a control oscillator that controls the crystal oscillator based on the control parameter. When the IC tag receives a control parameter corresponding to the process result of the specific process number of the crystal oscillator, the IC tag stores the control parameter and notifies the control IC of the reception, and the control IC When the notification from the tag is received, the control parameter stored in the IC tag is read and set inside.

  Further, according to the present invention, in the crystal oscillator, an IC tag for storing identification information and transmitting the identification information to the reader / writer when entering the communication range of the reader / writer is provided on a substrate on which the crystal resonator is mounted. It is a feature.

  According to the present invention, a control terminal that controls processing in the manufacturing process of the crystal oscillator, a server that stores manufacturing history information of the crystal oscillator and displays it on the control terminal, and an IC tag mounted on the crystal oscillator are transmitted. A reader / writer that receives the identification information and transmits the identification information to the control terminal. When the control terminal receives the identification information from the reader / writer, it requests the manufacturing history information from the server with the identification information and receives it from the server. The manufacturing history information is displayed, and the server stores the manufacturing history information for each identification information of the IC tag mounted on the crystal oscillator, and receives the request for the manufacturing history information with the identification information from the control terminal. Since the manufacturing management system reads out the manufacturing history information corresponding to the identification information and transmits it to the requesting control terminal, the individual identification of the crystal oscillator can be easily performed. Both in the manufacturing process, with reference to the manufacturing history of the characteristics test results of far there is an effect that it is possible to perform a suitable process control.

  According to the present invention, the control terminal requests manufacturing history information with a process number, and the server presets the display item corresponding to the process number in the manufacturing history information corresponding to the identification information. Since the manufacturing management system transmits the manufacturing history information of related processes to the control terminal, only the manufacturing history information related to the request source process can be extracted and displayed, making the manufacturing history information easy to see. There is an effect that the convenience of display can be improved.

  Further, according to the present invention, the IC tag can internally set the information received via the reader / writer, and the server controls the crystal oscillator according to the characteristic range of the specific process number set in advance. When parameters are stored and a control parameter request with identification information is received from the control terminal, the process result of the specific process number is read from the manufacturing history information corresponding to the identification information, and the read process result is included. The control parameter stored in accordance with the characteristic range is read out and transmitted to the requesting control terminal. The control terminal sends a control parameter request with identification information to the server, and receives the control parameter from the server. When receiving, the above manufacturing management system sets the control parameter to the IC tag of the crystal oscillator via the reader / writer. It is able to set the appropriate control parameters, even if variations in characteristics of the crystal oscillator can be controlled to be operating in accordance with standards effective in accordance with.

  According to the present invention, the identification information is stored, and when entering the communication area of the reader / writer, the IC tag that transmits the identification information to the reader / writer, and the control IC that controls the crystal oscillator based on the control parameter, When the IC tag receives a control parameter corresponding to the process result of the specific process number of the crystal oscillator, the IC tag stores the control parameter and notifies the control IC of the reception, and the control IC Since the crystal oscillator that reads the control parameters stored in the IC tag and sets them internally is received, the control IC of each crystal oscillator is based on, for example, the characteristic value measured in a specific process. Therefore, it is possible to set appropriate control parameters, and to control the operation so as to conform to the standard even if the characteristics of the crystal oscillator vary.

  Further, according to the present invention, the IC tag for storing the identification information and transmitting the identification information to the reader / writer when entering the communication range of the reader / writer is the crystal oscillator provided on the substrate on which the crystal resonator is mounted. Therefore, there is an effect that the individual identification of the crystal oscillator can be easily performed.

It is a schematic block diagram of a manufacturing management system according to an embodiment of the present invention. 3 is a block diagram showing the configuration of a control terminal 4. FIG. It is model explanatory drawing which shows a manufacture log | history information table. It is a model explanatory view of a history display item table. It is a model explanatory drawing of a control parameter table. It is explanatory drawing which shows the operation | movement of the display and accumulation | storage of the manufacture history information in this system. It is explanatory drawing which shows the operation | movement of the control parameter setting in this system.

Embodiments of the present invention will be described with reference to the drawings.
[Outline of the embodiment]
The crystal oscillator according to the embodiment of the present invention includes an IC tag storing identification information such as an identification number. By reading the identification information of the IC tag with a reader / writer, individual identification of the crystal oscillator and manufacturing history Tracing can be easily performed and convenience can be improved.

  A crystal oscillator manufacturing management system according to an embodiment of the present invention includes an IC tag storing identification information such as an identification number in a crystal oscillator, and an IC tag reader / writer provided in the vicinity of the manufacturing apparatus. The identification information is read from and output to the control terminal of the manufacturing apparatus, the control terminal transmits the process number, the result of the process, and the identification information to the server, and the server associates the identification number with the process number and the process result. Stored as a manufacturing history, when a history request including identification information is received from the control terminal, the manufacturing history corresponding to the identification information is read and transmitted to the control terminal, and the control terminal displays the received manufacturing history The individual number of the crystal oscillator can be easily managed, and the operator of the manufacturing apparatus can adjust the conditions and settings in the manufacturing process according to the manufacturing history up to that point. It can be one in which it is possible to perform an appropriate process control.

  The crystal oscillator of the present invention includes an IC tag storing identification information and a control IC for controlling the operation of the crystal oscillator, and the IC tag transmits a control parameter corresponding to the manufacturing history of the crystal oscillator from a reader / writer. Upon receipt, the control IC is notified of the reception, and the control IC internally sets the control parameters stored in the IC tag. The appropriate parameters are set based on the manufacturing history, and the control is performed during operation. An appropriate operation can be performed based on the parameters.

[Configuration of Manufacturing Management System According to Embodiment: FIG. 1]
The configuration of the manufacturing management system according to the embodiment of the present invention will be described with reference to FIG. FIG. 1 is a schematic block diagram of the manufacturing management system according to the embodiment of the present invention.
As shown in FIG. 1, the manufacturing management system (this system) according to the present embodiment performs management in the manufacturing process of a crystal oscillator, and includes a reader / writer 2, a process device 3, a control terminal 4, and the like. The server 5 and the database (DB) 6 are provided. The server 5, the control terminal 4 and the database 6 are connected by a LAN (Local Area Network).
Furthermore, as a feature of this system, the crystal oscillator 1 is provided with an IC tag (IC chip) 11 and a control IC 12.

Each component will be described.
[Crystal oscillator 1]
The crystal oscillator 1 includes a crystal resonator and an oscillation circuit, oscillates and outputs a specific frequency, and is an object to be managed in this system.
In the crystal oscillator 1, for example, an IC tag 11 and a control IC 12 are attached to a substrate. An external power supply uses pins or patterns.

[IC tag 11]
The IC tag 11 is a tag provided with a memory and an antenna. Specific identification information (ID) is stored in advance in the memory, and is stored by electric power generated by electromagnetic induction when entering the area of the reader / writer 2. Send identification information. The ID stored in the IC tag 11 becomes identification information of the crystal oscillator 1. Hereinafter, the ID of the IC tag 11 will be described as the ID of the crystal oscillator 1.
Further, as a feature of this system, the IC tag 11 receives the control parameter of the crystal oscillator 1 transmitted from the reader / writer 2 and stores it in the memory, and notifies the control IC 12 of the reception.

  The communication frequency band of the IC tag 11 is 960 MHz or less, the memory capacity is 8 bits or more, and conforms to the ISO / IEC standard. The readable distance of the IC tag 11 is 1 mm to 20000 mm, and the outer dimensions are a width of 100 mm or less, a depth of 100 mm or less, and a height of 10 mm or less.

[Control IC 12]
The control IC 12 is an IC that controls the operation of the crystal oscillator 1. The control IC 12 includes a memory therein and controls the operation of the crystal oscillator 1 based on control parameters stored in the memory.
When receiving the notification from the IC tag 11, the control IC 12 of this system reads out the control parameter stored in the IC tag 11 and stores it in its own memory.
The control IC 12 may be configured as an IC having the same tag as the IC tag 11. In this case, the control IC 12 directly receives the control parameter from the reader / writer 2 and stores it in the memory in the IC.

[Reader / Writer 2]
The reader / writer 2 always outputs a weak radio wave, receives the ID transmitted from the IC tag 11 entering the area, outputs the ID to the control terminal 4, and sets the parameters input from the control terminal 4 to the ID tag 11 Send to.
In this system, the reader / writer 3 is provided in the vicinity of the process device 3 and individually identifies the crystal oscillator 1 that is the target of the process (step).

[Process device 3]
The process device 3 is a device used for manufacturing, processing, or inspection in the manufacturing process of the crystal oscillator 1.
In this system, when process parameters, conditions, and the like are set from the control terminal 4, the process device 3 performs process processing based on the process parameters and conditions, and outputs process results to the control terminal 4. The process parameter is a parameter that controls the operation of the process device 3.

[Control terminal 4]
The control terminal 4 is a terminal that manages the process, controls the reader / writer 2 and the process device 3, and is a characteristic part of the present system.
Here, it is assumed that the control terminal 4 is provided corresponding to each process apparatus 3, and the control terminal 4 stores a process number corresponding to a process performed in the process apparatus 3 managed by the control terminal 4, and the reader / writer When the ID from 2 is received, a process number is attached to the ID, the server 5 is requested to manufacture the history corresponding to the ID, and the received manufacturing history is displayed.

Further, when a process parameter or condition is selected or input by an operator's operation based on the displayed manufacturing history, the control terminal 4 sets the parameter or condition in the process device 3.
Then, the held ID, the process result from the process device 3 and the process number are associated with each other and transmitted to the server 5 as new history information.

Further, the control terminal 4 that manages the process of writing the control parameter to the crystal oscillator 1 attaches the ID from the reader / writer 2 and requests the control parameter of the crystal oscillator 1 from the server 5. Upon reception, the control parameter is output to the reader / writer 2, and the control parameter is transmitted from the reader / writer 2 to the IC tag 11.
The control parameter is a parameter for determining the operation of the crystal unit 1. In this system, a control parameter corresponding to the measured value of the characteristic measured in the manufacturing process of the crystal oscillator 1 is supplied to the crystal oscillator 1 before shipment. The control parameters can be set by the control terminal 4 that manages the process.
The configuration and operation of the control terminal 4 will be described later.

[Server 5]
The server 5 is configured by a computer including at least a control unit, a storage unit, and an interface unit connected to the LAN, manages the manufacturing history of each crystal oscillator 1, and writes and reads data to and from the database 6. .
When the server 5 receives the history request including the ID and the process number from the control terminal 4, the server 5 reads out the manufacturing history corresponding to the ID from the database 6 and transmits it to the control terminal 4.

  At this time, as a feature of this system, instead of outputting all the history information about the crystal oscillator 1 so far, the history information corresponding to the item to be displayed set in advance corresponding to the process number is extracted. To the control terminal 4. Thereby, only the history information of the process related to the process is transmitted to the control terminal 4 and can be easily confirmed by the operator.

Further, when the server 5 receives a request for a control parameter including the ID of the crystal oscillator 1 from the control terminal 4, the server 5 searches the database 6 for a specific process number set in advance from the manufacturing history corresponding to the ID. The history (process result) is read, and the control parameter information stored corresponding to the value of the process result is acquired and transmitted to the control terminal 4 as the request source.
Thereby, an appropriate control parameter can be set in the crystal oscillator 1 according to the inspection result or measurement value in a specific process, and the operation during operation is adjusted according to the characteristics of the crystal oscillator 1 measured at the time of manufacture. Is something that can be done.

[Database 6]
The database 6 is set in the manufacturing history information table that stores the manufacturing history of the crystal oscillator 1, the history display item table that specifies items to be displayed when there is a history request from the control terminal 4, and the crystal oscillator 1. A control parameter table for storing control parameter information is stored.
Each table stored in the database 6 will be described in detail later.

[Configuration of Control Terminal 4: FIG. 2]
Next, the configuration of the control terminal 4 will be described with reference to FIG. FIG. 2 is a configuration block diagram of the control terminal 4.
As shown in FIG. 2, the control terminal 4 basically includes a control unit 41, a storage unit 42, an interface unit 43, an operation unit 44, and a display unit 45.

The control unit 41 is configured by a CPU or the like, and starts a processing program stored in the storage unit 42 to control the entire control terminal 4, and performs data communication with the reader / writer 2 and condition setting for the process device 3. In addition, acquisition of inspection results, communication control with the server 5, and the like are performed.
The storage unit 42 stores a processing program in the control unit 41 and stores process numbers of processes performed in the connected process device 3.

  The interface unit 43 is a connection unit that connects to various external devices such as the operation unit 44, the display unit 45, the reader / writer 2, and the process apparatus 3. Further, the server 5 is connected to the server 5 via the LAN, and data exchange between the control terminal 4 and the server 5 is realized.

The operation unit 44 is an input unit operated by an operator who operates the process apparatus 3, and inputs process parameters for controlling the process apparatus 3, inspection conditions, and the like.
The display unit 45 displays the state of the process device 3, the manufacturing history information about the crystal oscillator 1 being processed, and the results of processing such as processing and inspection.

The operation of the control terminal 4 will be briefly described. In the following description, a case where an inspection apparatus is used as the process apparatus 3 will be described as an example.
When the ID of the crystal oscillator 1 is input from the reader / writer 2, the control unit 41 holds the ID therein, reads the process number from the storage unit 42, attaches the ID and the process number, and sends it to the server 5. Send a history request to.

When the manufacturing history is received from the server 5, the control unit 41 outputs a display on the display unit 45. Thus, the operator can confirm various characteristics and inspection results measured in the manufacturing process of the crystal oscillator 1 so far, and can appropriately set inspection conditions and parameters in the inspection apparatus.
When an inspection condition or the like is input from the operation unit 44 by the operator who confirms the manufacturing history, the control unit 41 sets the inspection condition in the process device 3 to execute the inspection, acquires the inspection result, acquires the ID and The process number and the inspection result are transmitted to the server 5.

Further, in the control terminal 4 that controls the process of writing the control parameter to the crystal oscillator 1, when the ID is input from the reader / writer 2, the control terminal 4 transmits the control parameter request to the server 5 with the ID.
When the control parameter is received from the server 5, the control parameter is output to the reader / writer 2, and the control parameter is transmitted from the reader / writer 2 to the crystal oscillator 1.
In this way, the operation of the control terminal 4 is performed.

[Each table in database 6]
Next, information stored in the database 6 will be described.
[Manufacturing history information table: FIG. 3]
First, the manufacturing history information table will be described with reference to FIG. FIG. 3 is a schematic explanatory view showing a manufacturing history information table.
As shown in FIG. 3, the manufacturing history information table stores the manufacturing history of each crystal oscillator 1. For each crystal oscillator 1 ID, a process number, a process name, and a result (process result) ) In association with each other.
The process number is information for identifying a process performed in each process apparatus 3, the name is the name of the process, and the process result is an inspection result, a measurement value, or the like performed in the process.

The manufacturing history information table is updated when the server 5 receives an ID, a process number, and a process result from the control terminal 4, and a process result corresponding to the process number is newly added to the manufacturing history information table corresponding to the ID. And memorized.
Specifically, the process number and the process name are stored in advance according to the model number of the product, and when the server 5 receives the ID, the process number, and the process result from the control terminal 4, the manufacturing corresponding to the ID is performed. The received process result is written as the process result corresponding to the process number in the history information table.
In this system, the manufacturing history of each crystal oscillator 1 can be traced by referring to the manufacturing history information table.

[History display item table: FIG. 4]
Next, the history display item table will be described with reference to FIG. FIG. 4 is a schematic explanatory diagram of a history display item table.
The history display item table specifies history information that is read from the database 6 and displayed on the control terminal 4 when a history request is received from the control terminal 4, and as shown in FIG. The process number and the display item are stored in association with each other.

The request source process number is the process number assigned to the history request by the control terminal 4.
The display item is a process number of another process related to the request source process. That is, in the present system, when a history request is made from the control terminal 4, only the process result of the process related to the process is displayed.

When the server 5 receives a history request with an ID and a process number, it refers to the history display item table and stores it as a display item corresponding to the received process number (request source process number). The process number (display process number) read is read, the manufacturing history information table corresponding to the received ID is accessed, the process result of the display process number is extracted, and the process number, name, and process result are obtained. Transmit to the control terminal 4.
The control terminal 4 displays the process number, name and process result received from the server 5.

[Control parameter table: FIG. 5]
Next, the control parameter table will be described with reference to FIG. FIG. 5 is a schematic explanatory diagram of a control parameter table.
In this system, an appropriate control parameter is set in the control IC 12 of the crystal oscillator 1 based on a measurement result of characteristics that affect the operation of the crystal oscillator 1. That is, an appropriate control parameter is selected in accordance with the measured value measured in the characteristic measurement process.
The server 5 stores in advance a process number to be referred to when a control parameter request is received.

The control parameter table stores a characteristic range (characteristic range and measured value range) and a standard control parameter corresponding to the characteristic range for each process number of the process for measuring the characteristic.
In the example of FIG. 5, for a specific process A (process number xx), the control parameter a1 is associated if the measurement result is less than the threshold C1, and the control parameter a2 is associated if the measurement result is greater than or equal to the threshold C1.

Here, numerical values and mathematical formulas are conceivable as the control parameters to be set, and one or a plurality of parameters may be used.
For example, only the control parameter a may be set according to the result of the process A, or the control parameter a and the control parameter b may be set according to the result of the process A.

  When the server 5 receives the control parameter request including the ID, the server 5 refers to the manufacturing history information table corresponding to the ID based on the process number predetermined for the request and corresponds to the process number. The process parameter is read out, the control parameter table corresponding to the process number is referred to, the control parameter corresponding to the characteristic range including the process result is read out and transmitted to the control terminal 4.

  As shown in FIG. 5, when it is predetermined to refer to the result of the process A (process number xx) when the server 5 receives the control parameter request, when the server 5 receives the control parameter request, The process result x1 of the process A (process number xx) is read from the manufacturing history information table corresponding to the received ID, and the control parameter table (FIG. 5) corresponding to the process A (process number xx) is referred to. It is determined in which characteristic range x1 is included, and the corresponding control parameter is transmitted to the control terminal 4. In the example of FIG. 5, if x1 <C1, the control parameter a1 is transmitted, and if x1 ≧ C1, the control parameter a2 is transmitted.

  When a plurality of control parameters can be set in the crystal oscillator 1 and the process to be referred to is different for each control parameter, a control parameter table is provided for each process number corresponding to the control parameter.

In the example of FIG. 5, the characteristic range is two. However, the characteristic range may be divided more finely, or conversely, the characteristic range is set to only one corresponding to the appropriate range of the characteristic and corresponds to it. Control parameters may be stored.
If there is one characteristic range, if the measurement result read from the manufacturing history information table is outside the characteristic range, the server 5 transmits an error message to the control terminal 4.
As a result, in this system, even if the characteristics of the crystal oscillator vary, an operation conforming to the standard can be performed by setting appropriate control parameters according to the characteristics.

[Manufacturing history information display / storage operation: FIG. 6]
Next, the display / storage operation of manufacturing history information in this system will be described with reference to FIG. FIG. 6 is an explanatory diagram showing the operation of displaying and accumulating manufacturing history information in this system.
[Request manufacturing history information]
As shown in FIG. 6, first, when the crystal oscillator 1 processed in the process is carried into the area of the reader / writer 2 installed in the vicinity of the process device (herein, an inspection device) 3, the crystal oscillator The IC tag 11 mounted on 1 transmits the ID, and the reader / writer 2 receives it (S1).

The reader / writer 2 transmits the ID to the control terminal 4 (S2), and when receiving the ID, the control terminal 4 stores the ID therein (S3).
And the control terminal 4 attaches | subjects the process number which self memorize | stores to the said ID, and transmits a log | history request to the server 5 (S4).

[Search manufacturing history information]
The server 5 refers to the history display item table, reads the display item (display process number) corresponding to the process number of the request source, searches the manufacturing history information table in the database 6 using the received ID as a key, and The manufacturing history information table corresponding to the ID is specified, the specified manufacturing history information table is searched (S5), and the name and process result corresponding to the process number of the display item are read (S6).
And the process number of a display item, a name, and the group of a process result are transmitted to the control terminal 4 with ID as a manufacture history (S7). One or more manufacturing histories may be displayed.

[Display manufacturing history information]
The control terminal 4 displays a list of process numbers, names, and process results on the display unit 45 based on the received manufacturing history (S8). As a result, a history such as the previous characteristic measurement related to the inspection in the process apparatus 3 is displayed.
In the control terminal 4, when the history is displayed, the ID received from the server 5 may be compared with the ID stored in the process S3, and the manufacturing history may be displayed if they match. As a result, it is possible to prevent the manufacturing history of a crystal oscillator different from the crystal oscillator to be processed from being displayed.

[Execution]
Then, when the operator of the process apparatus 3 confirms the list display of the manufacturing history and determines and inputs appropriate conditions and set values in the inspection by the process apparatus 3 based on the result of the characteristic measurement or the like (S9) The control terminal 4 sets the conditions and setting values in the process device 3 (S10).
The process device 3 measures the crystal oscillator 1 based on the set conditions and set values (S11), and transmits the measurement result to the control terminal 4 (S12).

[Accumulation of manufacturing history information]
The control terminal 4 attaches the ID of the crystal oscillator 1 stored in step S3 and the process number stored in the storage unit 42 to the measurement result received from the process device 3, and transmits the result to the server 5 (S13). .
The server 5 writes the process number and the measurement result in association with each other in the manufacturing history information table corresponding to the received ID in the manufacturing history information table of the database 6 (S14).
The database 6 updates the updated manufacturing history information table (S15).
In this way, the display / storage operation of manufacturing history information in this system is performed.

[Control parameter setting operation: Fig. 7]
Next, the control parameter setting operation in this system will be described with reference to FIG. FIG. 7 is an explanatory diagram showing the operation of setting the control parameters in this system.
[Request control parameters]
As shown in FIG. 7, first, when the crystal oscillator 1 enters the area of the reader / writer 2 installed in the vicinity of the control terminal 4 that controls the control parameter writing process, an ID is transmitted from the IC tag 11 (S21). The reader / writer 2 receives the ID and transmits it to the control terminal 4 (S22).

  The control terminal 4 stores the received ID (S23). Then, the control terminal 4 sends a control parameter request with the ID to the server (S24). When there are a plurality of steps for setting the control parameter, the control terminal 4 transmits a control parameter request with its own step number.

[Get control parameters]
The server 5 is preset with a specific process number to be referred to when a control parameter request is received. When there are a plurality of processes for setting the control parameter, the server 5 stores in advance a process number to be referred to the control parameter table for each request process number.
Then, the server 5 identifies the manufacturing history information table corresponding to the received ID, and reads the process result of the process number set in advance as a process to be referred to when the control parameter is requested from the manufacturing history information table (S25, S26) Further, referring to the control parameter table corresponding to the process number, the control parameter corresponding to the characteristic range including the process result is read (S27, S28).

The server 5 transmits the read control parameter together with the ID to the control terminal 4 (S29), the control terminal 4 transmits the received control parameter to the reader / writer 2 (S30), and the reader / writer 2 receives the received control parameter. Is transmitted to the IC tag 11 (S31).
At that time, the control terminal 4 may compare the ID received from the server 5 with the ID stored in the process S23, and transmit the control parameter to the reader / writer 2 if they match. Thereby, it is possible to prevent an erroneous control parameter from being set based on the manufacturing history of another crystal oscillator.

[Storing control parameters]
When the IC tag 11 receives the control parameter from the reader / writer 2, the IC tag 11 stores the control parameter in the internal memory and outputs a signal notifying the reception to the control IC 12 (S 31). When the control IC 12 receives the notification signal, the IC tag 11 The control parameter is read from the memory of the tag 11 (S33) and stored in its own memory (S34).
In this way, control parameters are set in the crystal oscillator 1.

[Effect of the embodiment]
According to the manufacturing management system according to the embodiment of the present invention, the IC tag 11 storing the ID is mounted on the crystal oscillator 1, and the reader / writer 2 provided in the vicinity of the process device 3 that performs inspection and processing includes the IC It communicates with the tag 11 and receives the ID and outputs it to the control terminal 4 of the process device 3. The control terminal 4 receives the process result that is the result of the process in the process device 3 and the process number of the process. The ID is associated with each other and transmitted to the server 5, and the server 5 stores the process number, the name, and the process result in association with each other in the manufacturing history information table provided for each ID in the database 6. When the control terminal 4 receives the ID from the reader / writer 2, it sends the manufacturing history request to the server 5 with the ID, and the server 5 refers to the manufacturing history information table corresponding to the received ID. Since the process number, name and process result stored in the table are read out and transmitted to the control terminal 4, the control terminal 4 is a manufacturing management system for displaying the received process number, name and process result. The operator can view the manufacturing history up to that point before performing the processing in each process, set appropriate conditions and parameters in the process device 3, and can perform processing according to the manufacturing history. is there.

  The crystal oscillator according to the embodiment of the present invention includes the IC tag 11 and the control IC 12 that controls the crystal oscillator 1 based on the control parameter, and the IC tag 12 is transmitted from the server 5. When the control parameter corresponding to the process result of the specific process of the crystal oscillator 1 is received via the control terminal 4 and the reader / writer 3, the control parameter is stored inside and notified to the control IC 12, and the control IC 12 However, when the notification is received, the control parameters stored in the IC tag 11 are read and the crystal oscillators set in the internal memory are placed, so that appropriate control according to the measurement results and inspection results of each crystal oscillator 1 is performed. Parameters can be set, and there is an effect that the crystal oscillator 1 can be controlled to operate appropriately according to characteristics.

  The present invention provides a manufacturing management system capable of easily identifying an individual product and tracing a manufacturing history, and setting control parameters for performing an appropriate operation reflecting the manufacturing history in the product. Suitable for crystal oscillator.

  DESCRIPTION OF SYMBOLS 1 ... Crystal oscillator, 11 ... IC tag, 12 ... Control IC, 2 ... Reader / writer, 3 ... Process equipment, 4 ... Control terminal, 5 ... Server, 6 ... Database, 41 ... Control part, 42 ... Storage part, 43 ... Interface part, 44 ... Operation part, 45 ... Display part

Claims (5)

A manufacturing management system for a crystal oscillator,
A control terminal for controlling processing in the manufacturing process of the crystal oscillator;
A server that stores manufacturing history information of the crystal oscillator and displays and outputs it to the control terminal;
A reader / writer that receives identification information transmitted from an IC tag mounted on a crystal oscillator and transmits it to the control terminal;
When the control terminal receives the identification information from the reader / writer, requests the manufacturing history information from the server with the identification information, displays the manufacturing history information received from the server,
The server stores manufacturing history information for each identification information of an IC tag mounted on a crystal oscillator, and responds to the identification information when receiving a request for manufacturing history information with identification information from the control terminal. Manufacturing history information to be read out and transmitted to the requesting control terminal. The control terminal requests manufacturing history information with a process number,
The server transmits manufacturing history information of a related process preset as a display item corresponding to the process number among the manufacturing history information corresponding to the identification information to the control terminal. The manufacturing management system according to 1. The IC tag can set the information received via the reader / writer internally.
The server stores the control parameters of the crystal oscillator according to the characteristic range of the specific process number set in advance. When receiving the control parameter request with the identification information from the control terminal, the server stores the identification information in the identification information. Read the process result of the specific process number from the corresponding manufacturing history information, read out the control parameters stored according to the characteristic range including the read process result, and send it to the requesting control terminal,
The control terminal sends a control parameter request with identification information to the server, and when receiving the control parameter from the server, sets the control parameter in the IC tag of the crystal oscillator via the reader / writer. The manufacturing management system according to claim 1 or 2, characterized by the above-mentioned. An IC tag that stores identification information and transmits the identification information to the reader / writer when entering the communication area of the reader / writer;
A control IC for controlling the crystal oscillator based on the control parameters,
When the IC tag receives a control parameter corresponding to the process result of the specific process number of the crystal oscillator, it stores the control parameter inside and notifies the control IC of the reception,
When the control IC receives the notification from the IC tag, the control IC reads a control parameter stored in the IC tag and sets it inside.   A crystal oscillator comprising: a substrate on which a crystal resonator is mounted; and an IC tag for storing identification information and transmitting the identification information to the reader / writer when the reader / writer enters a communication area.

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