JP2012215425A5 - - Google Patents

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Publication number
JP2012215425A5
JP2012215425A5 JP2011079632A JP2011079632A JP2012215425A5 JP 2012215425 A5 JP2012215425 A5 JP 2012215425A5 JP 2011079632 A JP2011079632 A JP 2011079632A JP 2011079632 A JP2011079632 A JP 2011079632A JP 2012215425 A5 JP2012215425 A5 JP 2012215425A5
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JP
Japan
Prior art keywords
display panel
pixel
brightness
image data
pixels
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JP2011079632A
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English (en)
Japanese (ja)
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JP2012215425A (ja
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Priority to JP2011079632A priority Critical patent/JP2012215425A/ja
Priority claimed from JP2011079632A external-priority patent/JP2012215425A/ja
Publication of JP2012215425A publication Critical patent/JP2012215425A/ja
Publication of JP2012215425A5 publication Critical patent/JP2012215425A5/ja
Pending legal-status Critical Current

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JP2011079632A 2011-03-31 2011-03-31 輝度ムラ検出装置、輝度ムラ検出方法及び表示装置 Pending JP2012215425A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011079632A JP2012215425A (ja) 2011-03-31 2011-03-31 輝度ムラ検出装置、輝度ムラ検出方法及び表示装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011079632A JP2012215425A (ja) 2011-03-31 2011-03-31 輝度ムラ検出装置、輝度ムラ検出方法及び表示装置

Publications (2)

Publication Number Publication Date
JP2012215425A JP2012215425A (ja) 2012-11-08
JP2012215425A5 true JP2012215425A5 (enExample) 2014-03-27

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JP2011079632A Pending JP2012215425A (ja) 2011-03-31 2011-03-31 輝度ムラ検出装置、輝度ムラ検出方法及び表示装置

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JP (1) JP2012215425A (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6907786B2 (ja) * 2017-07-28 2021-07-21 コニカミノルタ株式会社 二次元測色装置および二次元測色方法
CN113129389B (zh) * 2019-12-30 2024-07-05 瑞昱半导体股份有限公司 判断摩尔纹的方法、抑制摩尔纹的方法与电路系统
CN114383815B (zh) * 2021-12-13 2023-11-14 长春希达电子技术有限公司 一种显示屏像素失控点快速检测方法
CN116164937A (zh) * 2022-12-06 2023-05-26 歌尔光学科技有限公司 投影光机的投影质量检测方法、装置、设备及存储介质

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005331929A (ja) * 2004-04-19 2005-12-02 Semiconductor Energy Lab Co Ltd 画像解析方法、画像解析プログラム、及びそれらを有する画素評価システム
JP4930775B2 (ja) * 2007-01-12 2012-05-16 横河電機株式会社 欠陥検査装置および欠陥検査方法

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