JP2012193984A - Test method and test device of capacitor bank opening/closing performance - Google Patents

Abstract

PROBLEM TO BE SOLVED: To enable verification of powering on function when a pre-arc occurs and a harmonic inrush current is injected, by continuously applying a voltage equivalent to the voltage of an applied system when a switching device is powered on.SOLUTION: By a capacitor bank opening/closing performance test method, a capacitor bank opening/closing test for evaluating the opening/closing performance of a capacitor bank of a sample switching device is conducted by dividing the capacitor bank opening/closing test into a powering-on test and a cutoff test. As a first step, a direct current voltage equivalent to the peak value of the voltage of a system, on which the switching device is used, is applied between electrodes of the sample switching device with the sample switching device set in an electrode opening state. As a second step, a high-frequency inrush current is injected into the sample switching device by setting the sample switching device in a powered state.

Description

  An embodiment of the present invention is a capacitor bank switching performance test method for verifying the performance of a switch circuit (hereinafter referred to as switchgear) used in a circuit of a power factor improving capacitor bank or a filter circuit used in a phase adjusting facility of a power system. And a test apparatus.

  The switchgear used in the power factor improving capacitor bank circuit or filter circuit used in the phase adjusting equipment of the power system should prevent re-ignition of the voltage applied between the electrodes of the switchgear after the charging current is cut off. There must be. The reason for this is that if re-ignition occurs between the electrodes after the charging current is interrupted, a ground fault occurs due to the effect of the surge voltage, and there is a risk of a short circuit accident between phases. Therefore, the switchgear used in such a circuit must be fully verified for the switching performance.

  In the capacitor bank charging current switching duty, the input operation must be a load input (for example, Non-Patent Document 1). Furthermore, the back-to-back capacitor bank charging current switching duty is defined in the capacitor bank charging current switching duty. This duty is a duty concerning a case where a plurality of capacitor banks are connected via a switchgear as phase adjusting equipment, and attention is paid to large inrush current, breaking current, and the like. For this reason, the existing installation capacity is insufficient, and there are cases where the test condition of shutting down following the input cannot be satisfied.

  Therefore, when it is difficult to perform the interruption following the input due to the convenience of the test facility, the series of tests may be divided into the input test and the interruption test. As an example in which the test is performed separately for the input test and the interruption test, there is an input test method based on the circuit diagram shown in FIG. As shown in FIG. 7, the switchgear test apparatus has a configuration in which a power supply capacitor 2, an inrush current reactor 3, and a test switchgear 1 are connected in series. In the test apparatus configured as described above, the power supply capacitor is charged in advance so as to satisfy the peak value of the switchgear applied system voltage while the test switchgear 1 is in an open state.

  As a result, a DC charging voltage Vd corresponding to the switchgear applied system voltage is applied between the electrodes of the test switchgear 1 as shown in FIG. Next, when the test switching device 1 is turned on, the frequency determined by C of the power supply capacitor 2 and L of the inrush current reactor 3, the surge impedance and the high frequency inrush current determined by the charging voltage of the power supply capacitor 2 are: As shown in FIG. 8 (b), it is injected into the test switching device 1. In this way, a capacitor bank insertion test can be performed.

IEC62271-100 High-voltage switchgear and controlgear Part 100: Alternating-current circuit-breakers IEC62271-101 High-voltage switchgear and controlgear Part 101: Synthetic testing

  A power source capacitor of a voltage source facility used for a combined interruption test of a switchgear has a structure in which a plurality of capacitors connected in parallel are stacked in series with a gap between stages. This is separated from the test switch terminal by a gap, and after charging, each gap is triggered and discharged to form a voltage source. The reason why the number of stages is set is that an output voltage that is several times the number of stages per stage can be obtained. Further, as described above, the output output terminal of the capacitor is separated from the load side by providing a gap.

  Here, consider a case where a capacitor having a multi-stage structure is used as the power supply capacitor 2 in the circuit example described in the standard shown in FIG. Since the power supply capacitor 2 is connected to the test circuit via a gap, the circuit configuration is as shown in FIG.

  At this time, the gap between the stages of the multi-stage capacitor is omitted in FIG. 9 and equivalently represented as a single-stage capacitor. In such a circuit, when the power supply capacitor 2 is charged to a predetermined voltage and the gap 7 is triggered, a voltage is instantaneously applied between the electrodes of the test switch 1 while the gap 7 is in a conductive state. However, the voltage cannot be applied continuously.

  Therefore, as in the example introduced in the standard, the charging operation is performed in a state where voltage is continuously applied between the electrodes of the test switchgear, and the charging performance at the time of pre-arc generation and harmonic inrush current injection is verified. I can't.

  Therefore, in the embodiment of the present invention, a voltage corresponding to the applied system voltage is continuously applied during the switching operation of the switchgear, and the capacitor bank switching that can verify the charging performance during pre-arc generation and harmonic inrush current injection A performance test method and a test apparatus are provided.

  The embodiment of the present invention is a capacitor bank switching performance test method in which a capacitor bank switching test is divided into an input test and a cutoff test in order to evaluate the capacitor bank switching performance of the test switching device. The test switchgear is opened as a step, a DC voltage corresponding to the peak value of the switchgear applied system voltage is applied between the electrodes of the test switchgear, and the test switchgear is turned on as a second step In this state, a high-frequency inrush current is injected into the test switchgear, and the switching performance of the switchgear is verified.

1 is a circuit diagram of a test apparatus that realizes a capacitor bank switching performance test method according to Embodiment 1 of the present invention. The wave form diagram of the applied voltage and high frequency inrush current to the test switchgear of Embodiment 1 of this invention. FIG. 5 is a circuit diagram of a test apparatus that realizes a capacitor bank switching performance test method according to Embodiment 2 of the present invention. The wave form diagram of the voltage applied to the test switch of Embodiment 2 of this invention, and a high frequency inrush current. FIG. 5 is a circuit diagram of a test apparatus that realizes a capacitor bank switching performance test method according to Embodiment 3 of the present invention. The wave form diagram of the applied voltage and the high frequency inrush current to the test switchgear of Embodiment 3 of the present invention. Circuit diagram of conventional switchgear test equipment The wave form diagram of the DC charging voltage and the high frequency inrush current in the testing device of the conventional switchgear. The circuit diagram at the time of using the capacitor | condenser connected via a gap as a capacitor | condenser for power supplies of the conventional switching test apparatus.

  Hereinafter, embodiments of the present invention will be described. FIG. 1 is a circuit diagram of a test apparatus for realizing a capacitor bank switching performance test method according to Embodiment 1 of the present invention. In the test apparatus according to Embodiment 1 of the present invention, a gap 7 is provided between a power supply capacitor 2 and an inrush current reactor 3 as shown in FIG. A series connection circuit of a capacitor 4 and a resistor 8 is connected in parallel with them. The inrush current reactor 3 is connected to the test switch 1 via a damping resistor 6. Further, the reactor 5 shown in FIG. 1 is shown in consideration of wiring impedance. The gap 7 is triggered at a predetermined timing by the sequence device.

  In the test apparatus having such a configuration, the power supply capacitor 2 is charged in advance so as to satisfy the peak value of the switchgear applied system voltage while the test switchgear 1 is in an open state. Next, the gap 7 is triggered by a trigger command issued from the command circuit. When the gap 7 is triggered, the electric charge stored in the power supply capacitor 2 is discharged through the inrush current reactor 3 to charge the capacitor 4, and since the test switch 1 is in the open state, the test switch 1 A DC voltage as shown in FIG. 2A is applied between the electrodes.

  Next, when the test switchgear 1 is turned on, a serial connection RLC circuit of the power supply capacitor 2, the inrush current reactor 3, the damping resistor 6, the reactor 5, and the test switchgear 1 is formed, and FIG. As shown in FIG. 2, a high-frequency inrush current is injected into the test switching device 1.

  Thus, the power supply capacitor 2 is charged while the test switch 1 is open, discharged through the inrush current reactor 3, and the capacitor 4 is charged. A DC voltage equivalent to a high value is generated. Then, by applying this DC voltage between the electrodes of the test switchgear 1 and turning on the test switchgear 1, the power supply capacitor 2, the inrush current reactor 3, the damping resistor 6, the reactor 5, the test switchgear A high-frequency inrush current is injected into the test switchgear 1 using a serially connected RLC circuit of the device 1. Thereby, it is possible to perform an input test when the capacitor bank switching performance test of the switchgear is divided into the input test and the shut-off test. In addition, a series of capacitor bank switching performances can be verified by combining with the leading current interruption test method.

  According to the first embodiment, a capacitor having a multi-stage structure is used as a power source, and the gap 7 is closed between the electrodes of the test switchgear 1 to discharge the power source capacitor 1 and connected via the inrush current reactor 3. The capacitor 4 is charged. As a result, since a DC voltage is applied between the electrodes of the test switchgear 1 as the voltage of the switchgear applied system, a DC test is performed between the electrodes of the test switchgear 1 using a multistage capacitor. A voltage can be applied continuously.

  Next, Embodiment 2 of the present invention will be described. FIG. 3 is a circuit diagram of a test apparatus for realizing a capacitor bank switching performance test method according to Embodiment 2 of the present invention. The test apparatus according to the second embodiment is different from the first embodiment shown in FIG. 1 in that an AC generating reactor 9 is provided instead of the series connection circuit of the capacitor 4 and the resistor 8.

  First, the test switch 1 is opened, and the power supply capacitor 2 is charged in advance so as to satisfy the crest value of the switch application voltage. Next, the gap 7 is triggered by a trigger command issued from the command circuit. When the gap 7 is triggered, the power supply capacitor 2 is connected to the circuit, and the electric charge stored in the power supply capacitor 2 is discharged through the inrush current reactor 3 and the AC voltage generation reactor 9. That is, an LC oscillation circuit is formed by three elements of a power supply capacitor 5, an inrush current reactor 3, and an AC voltage generating reactor 9, and by setting each element to a predetermined value, an alternating current of an arbitrary frequency is generated. It can flow.

  Here, since the AC voltage generating reactor 9 is set to the inrush current reactor 3, the charging voltage is applied to both ends of the AC voltage generating reactor 9. At this time, since the test switching device 1 is in an open circuit state, the same voltage as the voltage applied to the AC voltage generating reactor 9 is provided between the electrodes of the test switching device 1 as shown in FIG. An alternating voltage is applied.

  Next, when the test switching device 1 is turned on with the applied AC voltage corresponding to the peak value, the power source capacitor 2, the inrush current reactor 3, the damping resistor 6, the reactor 5, and the test switching device 1 are connected in series. An RLC circuit is formed, and a high-frequency inrush current is injected into the test switching device 1. Here, the frequency of the alternating voltage applied to the test switching device 1 is about the commercial frequency. The high-frequency inrush current is defined by IEC62271-100 as a frequency of 4250 Hz and the peak value of the first wave of the inrush current is 20 kA. The commercial frequency is about 1/70 slower than the frequency of the high frequency inrush current. A commercial frequency is generated by the LC oscillation circuit of the power supply capacitor 5, the inrush current reactor 3, and the AC voltage generating reactor 9, but the AC voltage generating reactor 9 is set so that the frequency is substantially determined.

  Further, since the high-frequency inrush current has a high peak value, the inrush current reactor has a very small value as compared with the AC voltage generating reactor. In response to the voltage classes of 245 kV, 145 kV, and 72.5 kV, which are considered to be frequently used for the phase-adjusting switchgear, in the test apparatus of the second embodiment, the inrush current reactor 3 is 5000 of the AC voltage generating reactor 9. The value is about 1 / 10,000.

  As described above, according to the second embodiment, the test switchgear 1 is configured by the LC oscillation circuit including the power supply capacitor 2, the inrush current reactor 3, and the AC voltage generation reactor 9 with the test switchgear 1 open. An AC voltage corresponding to the system application voltage is generated and applied between the electrodes of the test switchgear 1, and the test switchgear 1 is turned on. As a result, a high-frequency inrush current is injected into the test switchgear 1 by the RLC circuit connected in series with the power supply capacitor 2, the inrush current reactor 3, the damping resistor 6, the reactor 5 considering the impedance of the wiring, and the test switchgear. In addition, it is possible to perform a loading test in the case where the capacitor bank switching performance test of the switching device 1 is divided into a loading test and a blocking test. In addition, a series of capacitor bank switching performances can be verified by combining with the leading current interruption test method.

  Next, a third embodiment of the present invention will be described. FIG. 5 is a circuit diagram of a test apparatus for realizing a capacitor bank switching performance test method according to Embodiment 3 of the present invention. The test apparatus of the third embodiment is obtained by adding a capacitor 4 and a resistor 8 to the second embodiment shown in FIG.

  The reason for adding the capacitor 4 and the resistor 8 is to consider the stray capacitance in the actual test circuit with respect to the test apparatus of FIG. That is, when the stray capacitance is considered in the test apparatus of FIG. 3, the stray capacitance is charged and the high frequency voltage is superimposed when the charge stored in the power supply capacitor 2 is discharged. From this, a voltage about twice the test voltage may be applied between the electrodes of the test switching device 1. Therefore, a series connection of the capacitor 4 and the resistor 8 is added to the test apparatus of FIG. 3 to suppress the overvoltage and the high-frequency vibration generated there.

  In the test apparatus having such a configuration, the power supply capacitor 2 is charged in advance so as to satisfy the peak value of the switchgear applied system voltage while the test switchgear 1 is in an open state. Next, the gap 7 is triggered by a trigger command issued from the command circuit. When the gap 7 is triggered, the power supply capacitor 2 is connected to the circuit, and the charge stored in the power supply capacitor 2 is discharged through the inrush current reactor 3.

  When this discharge charge passes through the inrush current reactor 3, the charge flowing into the AC voltage generation reactor 9, that is, the power supply capacitor 2, the inrush current reactor 3, and the AC voltage generation reactor 9 as in the second embodiment. The electric charge flowing through the LC oscillation circuit formed by three elements becomes a predetermined alternating current.

  Here, since the AC voltage generating reactor 9 >> the inrush current reactor 3 is set, the charging voltage is substantially applied to the AC voltage generating reactor 9. At this time, since the test switch 1 is in an open state, the voltage between the electrodes of the test switch 1 is approximately the same as the voltage applied to the AC voltage generating reactor 9 as shown in FIG. An alternating voltage is applied. At the same time, since the capacitor 4 and the resistor 8 are connected in parallel to the AC voltage generating reactor 9, the capacitor 8 is charged, and functions to suppress overvoltage caused by charging of the stray capacitance and harmonic vibrations generated there.

  Next, when the test switch 1 is turned on with the AC voltage shown in FIG. 6A corresponding to the peak value, the power supply capacitor 2, the inrush current reactor 3, the damping resistor 6, the reactor 5, and the test switch 1 A series-connected RLC circuit is formed, and a high-frequency inrush current is injected into the test switchgear 1 as shown in FIG.

As described above, according to the third embodiment, when the test switchgear 1 is in an open state, the test switchgear 1 is configured by the LC oscillation circuit including the power supply capacitor 2, the inrush current reactor 3, and the AC voltage generation reactor 9. An AC voltage corresponding to the grid application voltage is generated and applied between the electrodes of the test switchgear 1 to suppress overvoltage caused by charging of the stray capacitance and harmonic vibrations generated there. When the test switch 1 is turned on, a high-frequency inrush current is injected into the test switch 1 by a serial connection RLC circuit of the power supply capacitor 2, the inrush current reactor 3, the damping resistor 6, the reactor 5, and the test switch 1. In addition, several embodiments of the present invention have been described, in which the input test can be performed when the capacitor bank switching performance test of the switchgear is performed separately in the input test and the interruption test. The embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, replacements, and changes can be made without departing from the scope of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, and are included in the invention described in the claims and the equivalents thereof.

DESCRIPTION OF SYMBOLS 1 ... Test switchgear, 2 ... Power supply capacitor, 3 ... Inrush current reactor, 4 ... Capacitor, 5 ... Reactor (reactor considering wiring impedance), 6 ... Damping resistance, 7 ... Gap, 8 ... Resistance, 9 ... Reactor for generating AC voltage

Claims (7)

  In the capacitor bank switching performance test method in which the capacitor bank switching test is divided into an input test and an interruption test in order to evaluate the capacitor bank switching performance of the test switching device, the test switching device is used as a first step. A DC voltage corresponding to the peak value of the switchgear applied system voltage is applied between the electrodes of the test switchgear in the open state, and the test switchgear is turned on as a second step, thereby injecting high frequency. A capacitor bank switching performance test method, wherein current is injected into the test switching device, and the switching performance of the switching device is verified.   The AC voltage of the switchgear applied system voltage is applied between the electrodes of the test switchgear instead of the DC voltage corresponding to the peak value of the switchgear applied system voltage in the first step. The capacitor bank switching performance test method according to 1.   A capacitor bank switching performance test method comprising: verifying a series of capacitor bank switching performances by combining the test method of claim 1 or 2 and a lead current cutoff testing method.   Reactor for inrush current from a capacitor for power supply through a gap in a capacitor bank switching performance test device in which the switching test is divided into an input test and an interruption test in order to evaluate the capacitor bank switching performance of the test switchgear. And a series connection circuit of a capacitor and a resistor connected in parallel to the circuit for applying a DC voltage equivalent to the peak value of the switch application voltage, and triggering the gap Charging the charge of the power supply capacitor to the capacitor of the series connection circuit to generate a DC voltage, applying the DC voltage to the test switchgear, and verifying the switching performance of the switchgear. Capacitor bank opening / closing performance testing device.   In place of the series connection circuit, an AC voltage generating reactor for applying an AC voltage equivalent to a switch application system voltage is provided, and the charge charged in the power supply capacitor by triggering the gap is used for generating the AC voltage. A capacitor bank switching performance testing device characterized in that an AC voltage is generated in a reactor, the AC voltage is applied to the test switching device, and the switching performance of the switching device is verified.   6. The capacitor bank switching performance testing device according to claim 5, further comprising an element for giving a function of suppressing overvoltage and voltage oscillation of an alternating voltage applied to the test switching device.   The reactor for AC voltage generation used in the voltage class of 245 kV, 145 kV, and 72.5 kV employs an AC voltage generation reactor in which the ratio of the inrush current reactor to the AC voltage generation reactor is about 5000 to 10,000 times. 7. The capacitor bank switching performance test apparatus according to claim 5 or 6, wherein

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