JP2012186465A5 - Substrate processing apparatus and semiconductor device manufacturing method - Google Patents

Substrate processing apparatus and semiconductor device manufacturing method Download PDF

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Publication number
JP2012186465A5
JP2012186465A5 JP2012029399A JP2012029399A JP2012186465A5 JP 2012186465 A5 JP2012186465 A5 JP 2012186465A5 JP 2012029399 A JP2012029399 A JP 2012029399A JP 2012029399 A JP2012029399 A JP 2012029399A JP 2012186465 A5 JP2012186465 A5 JP 2012186465A5
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JP
Japan
Prior art keywords
substrate
supplying
supply unit
support
semiconductor device
Prior art date
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Pending
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JP2012029399A
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Japanese (ja)
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JP2012186465A (en
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Priority to JP2012029399A priority Critical patent/JP2012186465A/en
Priority claimed from JP2012029399A external-priority patent/JP2012186465A/en
Publication of JP2012186465A publication Critical patent/JP2012186465A/en
Publication of JP2012186465A5 publication Critical patent/JP2012186465A5/en
Pending legal-status Critical Current

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Claims (2)

基板を処理する処理室と、
前記基板を支持する基板支持台と、
前記基板支持台に支持された前記基板にマイクロ波を供給するマイクロ波供給部と、
前記基板支持台に支持された前記基板に不活性ガスを供給するガス供給部と
前記基板支持台の内部に設けられた冷媒流路に冷媒を供給する冷媒供給部と、
前記処理室に連接され、前記基板を搬送する搬送機構を備える搬送室と
前記基板を前記支持台に載置する処理と、前記基板の表面に向かって前記マイクロ波を供給して加熱する処理と、前記基板の表面に向かって前記不活性ガスを供給すると共に前前冷媒を供給することにより、前記基板の表面と前記基板の裏面を同時に冷却する処理と、を行わせるように前記マイクロ波供給部、前記ガス供給部、前記冷媒供給部をそれぞれ制御するよう構成される制御手段と、
を有する基板処理装置。
A processing chamber for processing the substrate;
A substrate support for supporting the substrate;
A microwave supply unit for supplying microwaves to the substrate supported by the substrate support ;
A gas supply unit for supplying an inert gas to the substrate supported by the substrate support ;
A refrigerant supply unit for supplying a refrigerant to a refrigerant channel provided inside the substrate support;
A transfer chamber connected to the processing chamber and provided with a transfer mechanism for transferring the substrate ;
A process of placing the substrate on the support, a process of supplying and heating the microwave toward the surface of the substrate, and supplying the inert gas toward the surface of the substrate and a pre-pre-coolant Is configured to control the microwave supply unit, the gas supply unit, and the refrigerant supply unit so that the surface of the substrate and the back surface of the substrate are simultaneously cooled. Control means;
A substrate processing apparatus.
基板を処理室に搬入し基板支持台に載置する工程と、Carrying the substrate into the processing chamber and placing it on the substrate support;
基板の表面に向かってマイクロ波を供給して加熱する工程と、Supplying microwaves toward the surface of the substrate and heating;
基板の表面に向かって不活性ガスを供給すると共に前記基板支持台の内部に設けられた冷媒流路に冷媒を供給することにより、前記基板の表面と前記基板の裏面を同時に冷却する工程と、Cooling the surface of the substrate and the back surface of the substrate simultaneously by supplying an inert gas toward the surface of the substrate and supplying a coolant to a coolant channel provided inside the substrate support;
前記基板を前記処理室から搬出する工程と、Unloading the substrate from the processing chamber;
を有する半導体装置の製造方法。A method for manufacturing a semiconductor device comprising:
JP2012029399A 2011-02-18 2012-02-14 Substrate processing apparatus Pending JP2012186465A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012029399A JP2012186465A (en) 2011-02-18 2012-02-14 Substrate processing apparatus

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011033244 2011-02-18
JP2011033244 2011-02-18
JP2012029399A JP2012186465A (en) 2011-02-18 2012-02-14 Substrate processing apparatus

Publications (2)

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JP2012186465A JP2012186465A (en) 2012-09-27
JP2012186465A5 true JP2012186465A5 (en) 2015-03-19

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Family Applications (1)

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JP2012029399A Pending JP2012186465A (en) 2011-02-18 2012-02-14 Substrate processing apparatus

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Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3177152B2 (en) * 1990-07-20 2001-06-18 株式会社東芝 Heat treatment film forming method
FR2747840B1 (en) * 1996-04-22 1998-09-11 Motorola Semiconducteurs IRRADIATION APPARATUS COMBINED BY AN ION BEAM AND MICROWAVE RADIATION, AND ASSOCIATED PROCESS
WO2003069020A1 (en) * 2002-02-12 2003-08-21 Hitachi Zosen Corporation System for processing substrate and method for processing substrate
JP2007258286A (en) * 2006-03-22 2007-10-04 Tokyo Electron Ltd Heat treatment apparatus and method, and storage medium

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