JP2012168102A - Scratch testing machine and scratch testing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To secure reproducibility of test results of a scratch test and a determination results of a scratch on a film-like specimen and to objectively prove the reliability of the determination results.SOLUTION: A scratch testing machine 10 includes a mounting base 11 having a mounting surface 11A capable of fixing a film-like specimen 21; a scratch member 13 having a tip 13a capable of coming into contact with the surface of the film-like specimen 21 that is fixed to the mounting surface 11A; a drive device 14 capable of moving the mounting base 11 in relative to the scratch member 13 in the scratching direction, with the tip 13a of the scratch member 13 brought into contact with the surface of the film-like specimen 21 fixed to the mounting surface 11A; a microscope 15 enlargingly imaging the surface area including a contact area with which at least the tip 13a of the scratch member 13 comes into contact and a trajectory area with which the tip 13a of the scratch member 13 has come in contact, out of the surface of the film-like specimen 21, and outputting the image data of the imaging result; and a display device 16 displaying the image data.

Description

  The present invention relates to a scratch tester and a scratch test method.

  Conventionally, for example, a substrate or pencil lead is relatively moved while a pencil lead is applied to a film-like sample placed on the surface of the substrate, and the presence or absence of scratches by the pencil lead on the film-like sample is visually observed. There is known a scratch test method for determining by (see, for example, Patent Document 1).

JP 2010-44023 A

By the way, in the scratch test method according to the above-described prior art, since the presence or absence of scratches on the film-like sample is only visually determined, it is difficult to objectively confirm the reliability of the determination result. Occurs.
In addition, for example, a film-like sample made of a resin material may have a large change in scratches over time, and if the time required for visual observation after the generation of scratches varies, the reproducibility of the judgment results There arises a problem that is lost.
Also, in the scratch test with a pencil lead, when the work for polishing the pencil lead into a predetermined shape is performed manually, it is difficult to make the polishing state of the pencil lead uniform. The reproducibility of results may be impaired.

  The present invention has been made in view of the above circumstances, and it is possible to ensure the reproducibility of the determination result of the scratch test and the determination result of the film sample for scratches, and to objectively show the reliability of the determination result. An object of the present invention is to provide a scratch tester and a scratch test method.

  In order to solve the above-described problems and achieve the object, a scratch testing machine according to claim 1 of the present invention is a mounting surface on which a film sample (for example, film sample 21 in the embodiment) can be fixed. (For example, the mounting surface 11A in the embodiment) (for example, the mounting table 11 in the embodiment) and the surface of the film-like sample fixed on the mounting surface can be contacted. A scratching member (for example, the scratching member 13 in the embodiment) having a distal end portion (for example, the distal end portion 13a in the embodiment), and the scratch on the surface of the film-like sample fixed on the mounting surface. Scratch testing machine comprising a driving device (for example, the driving device 14 in the embodiment) capable of moving the mounting table relative to the scratching member in a predetermined scratching direction with the tip of the member in contact with the scratching device ( For example, scratching in the embodiment In the test machine 10), in the surface of the film-like sample, imaging is performed so that at least a surface region including a region where the tip of the scratching member contacts and a locus region where the tip of the scratching member contacts can be enlarged. Then, an imaging device that outputs image data of the imaging result (for example, the microscope 15 in the embodiment) and a display device that displays the image data output from the imaging device (for example, the display device in the embodiment) 16).

  Further, in the scratch testing machine according to claim 2 of the present invention, the mounting table is made of a translucent member, the film-like sample has translucency, and the imaging means is mounted on the mounting table. The surface of the film sample placed on the back side with respect to the surface and fixed on the mounting surface is imaged through the mounting table and the film sample.

  Furthermore, in the scratch testing machine according to claim 3 of the present invention, the vertical pressing force acting on the surface of the film-like sample that contacts the tip of the scratching member (for example, the pressing force Fn in the embodiment). And detection means (for example, the detection unit 33, the tangential force calculation unit 51, and the pressing force calculation unit 52 in the embodiment) for detecting a tangential force in the horizontal direction (for example, the tangential force Ft in the embodiment).

  Furthermore, in the scratch testing machine which concerns on Claim 4 of this invention, the contact area of the front-end | tip part of the said scratching member which contacts the surface of the said film-like sample is more than the predetermined contact area according to the shape of the said front-end | tip part.

Furthermore, in the scratch testing machine according to claim 5 of the present invention, the scratch member is made of a material having higher wear resistance than the film-like sample, and is formed into a columnar shape having the same diameter as the pencil lead. The predetermined contact area of the tip of the member is 15000 μm ² .

  A scratch test method according to claim 6 of the present invention is a scratch test method using the scratch tester according to claim 1, wherein the scratch member on the surface of the film-like sample is based on the image data. The presence or absence of scratches by the tip of the film is determined, and the film-like sample is classified according to the determination result.

  Furthermore, the scratch test method according to claim 7 of the present invention detects a vertical pressing force and a horizontal tangential force acting on the surface of the film-like sample with which the tip of the scratch member contacts, The superiority or inferiority of the scratch resistance of the film-like sample is determined according to the scratch friction coefficient by the ratio of the pressing force and the tangential force, and the film-like sample is classified according to the result of the determination.

  Furthermore, in the scratch test method according to claim 8 of the present invention, the load resistance CL corresponding to the force acting on the surface of the film-like sample with which the tip of the scratch member contacts and the contact between the tip of the scratch member The scratch resistance parameter Fp (= () by the area A, the yield stress σ of the film sample, the contact length L of the tip of the scratch member, and the film thickness H corresponding to the solid amount of the film sample. (CL / A) / σ) × (L / H)), and the superiority or inferiority of the scratch resistance of the film-like sample is determined according to the scratch resistance parameter F, and according to the determination result, Sort film samples.

According to the scratch testing machine according to claim 1 of the present invention, the surface region of the surface of the film-like sample includes at least a region where the tip of the scratch member contacts and a locus region where the tip of the scratch member contacts. The image data can be displayed on the display device in real time.
For this reason, predetermined determination processing based on image data is performed at predetermined timing (for example, sequential timing during relative movement of the mounting table with respect to the scratching member, or when the relative movement of the mounting table with respect to the scratching member is completed). It can be executed, and it is possible to prevent the reproducibility of the determination result from being impaired due to variations in the timing for executing the predetermined determination process.

  Furthermore, according to the scratch testing machine according to claim 2 of the present invention, it is possible to easily image the region of the film-like sample in contact with the tip of the scratching member from the back side of the mounting table, and the surface of the film-like sample. The contact state of the tip of the scratching member with respect to the scratching member can be displayed on the display device in real time, for example, during relative movement of the mounting table with respect to the scratching member.

  Further, according to the scratch testing machine according to claim 3 of the present invention, the pressing force and the tangential force acting on the surface of the film-like sample by the tip portion of the scratching member are being moved relative to the scratching member, for example. It can be automatically detected in real time.

  Further, according to the scratch testing machine according to claim 4 of the present invention, the contact area of the tip portion of the scratch member is set to be equal to or larger than a predetermined contact area corresponding to the shape of the tip portion of the scratch member. It prevents the judgment result of the predetermined judgment process to judge the scratch resistance of the film sample by the scratch property parameter from fluctuating according to the contact area of the tip of the scratch member, and the scratch resistance of the film sample is prevented. Desired reliability and reproducibility for quantitative evaluation can be ensured.

Furthermore, according to the scratch testing machine according to claim 5 of the present invention, the contact area of the tip portion of the scratch member made of a material having the same diameter as the pencil core and higher wear resistance than the film-like sample is obtained. , By setting to 15000 μm ² or more, the determination result of the predetermined determination process for determining the scratch resistance of the film-like sample based on the predetermined scratch resistance parameter varies depending on the contact area of the tip portion of the scratch member. The desired reliability and reproducibility for the quantitative evaluation of the scratch resistance of the film-like sample can be ensured.
Moreover, unlike the pencil lead, the reproducibility of the test result of the scratch test can be ensured by the tip of the scratch member made of a material having higher wear resistance than the film sample.

According to the scratch test method of claim 6 of the present invention, the surface of the surface of the film-like sample includes at least a region where the tip of the scratch member contacts and a locus region where the tip of the scratch member contacts. The image data of the area can be displayed on the display device in real time.
Therefore, predetermined determination processing for determining the presence or absence of scratches based on image data is performed at predetermined timing (for example, sequential timing during relative movement of the mounting table with respect to the scratching member, or relative movement of the mounting table with respect to the scratching member. And the reproducibility of the determination result can be prevented from being impaired due to variations in the timing of executing the predetermined determination process.

  Furthermore, according to the scratch testing machine method according to claim 7 of the present invention, by determining the superiority or inferiority of the scratch resistance of the film-like sample according to the scratch friction coefficient, desired reliability and reproducibility of the determination result can be obtained. Can be secured.

  Furthermore, according to the scratch tester method according to claim 8 of the present invention, desired reliability and reproduction of the determination result are determined by determining the superiority or inferiority of the scratch resistance of the film-like sample according to the scratch resistance parameter F. Sex can be secured.

It is a lineblock diagram of a scratch examination machine concerning an embodiment of the invention. It is sectional drawing which shows an example of the film-form sample which concerns on embodiment of this invention. It is a perspective view which expands and shows a part of scratch tester concerning an embodiment of the invention. It is a side view which expands and shows a part of scratch tester which concerns on embodiment of this invention. It is a side view which expands and shows a part of scratch tester which concerns on embodiment of this invention. It is a figure which shows the example of the image data output from the microscope of the scratch tester which concerns on embodiment of this invention. It is a block diagram of the processing apparatus of the scratch testing machine which concerns on embodiment of this invention. It is a figure which shows an example of the correspondence of pressing force Fn obtained by the scratch test using the scratch testing machine which concerns on embodiment of this invention, and scratch friction coefficient (micro | micron | mu) s. It is a figure which shows the example of the image data output from the microscope of the scratch tester which concerns on embodiment of this invention according to a scratch friction coefficient microsecond. It is a figure which shows the example of the image data output from the microscope of the scratch testing machine which concerns on embodiment of this invention according to the presence or absence of a scratch. It is a figure which shows an example of the correspondence of the contact area and load load which are obtained by the scratch test using the scratch testing machine which concerns on embodiment of this invention. It is a figure which shows an example of the correspondence of the contact area obtained by the scratch test using the scratch testing machine which concerns on embodiment of this invention, and the load resistance for every film-like sample. It is a figure which shows an example of the correspondence of the contact area obtained by the scratch test using the scratch testing machine which concerns on embodiment of this invention, and the scratch resistance parameter Fp.

Hereinafter, a scratch tester and a scratch test method according to an embodiment of the present invention will be described with reference to the accompanying drawings.
For example, as shown in FIG. 1, the scratch testing machine 10 according to the present embodiment includes a mounting table 11, a scratching member support 12, a scratching member 13, a driving device 14, a microscope 15, a display device 16, And a processing device 17.

The mounting table 11 is made of a translucent member such as acrylic resin or glass, and has a mounting surface 11A to which the film sample 21 can be fixed.
The mounting table 11 is configured to be able to reciprocate in a predetermined scratching direction in the horizontal direction with respect to the support table 10 a by the driving force output from the driving device 14.

  The film sample 21 is a functional film such as an optical film or a transparent conductive film. The test film sample 21 shown in FIG. 2, for example, is a base made of triacetyl cellulose (TAC). And a hard coat layer formed by applying a coating liquid obtained by diluting an ultraviolet curable resin with ethyl acetate on the surface of the substrate in a predetermined coating direction.

  In the film-like sample 21 for this test, the thickness (film thickness) of the hard coat layer is a value corresponding to the NV value (solid content wt%) of the coating liquid obtained by diluting the ultraviolet curable resin with ethyl acetate. It has become.

  For example, as shown in FIG. 1, the scratch member support portion 12 includes a four-node parallel link mechanism 31 provided on a support column 10 b that is fixed to a support base 10 a and extends upward in the vertical direction, and the four-node parallel link mechanism 31. A weight support base 32 fixed to the swinging end 31a, a detection unit 33, and a scratching member fixing unit 34 are provided.

The four-joint parallel link mechanism 31 includes, for example, two swing fulcrums 31b and 31b spaced apart in the vertical direction on a support column 10b fixed to the support base 10a and extending upward in the vertical direction, and two swings. Two parallel link levers 31c and 31c supported by the fulcrums 31b and 31b, and a swing that is formed to extend in the vertical direction similarly to the support column 10b and connects the ends of the two link levers 31c and 31c. And an end portion 31a.
The swing end portion 31a is swingable with respect to the two swing support points 31b and 31b while maintaining a state parallel to the support column 10b (that is, parallel to the vertical direction).

  Further, of the two link levers 31c and 31c, one link lever 31c is integrally formed with a balance lever 31d extending from the swing fulcrum 31b in the direction opposite to the extending direction of the link lever 31c. Is connected to a balance weight 31e.

The balance lever 31d and the balance weight 31e horizontally move the two link levers 31c and 31c in a state where the weight is not placed on the weight support base 32 and the scratch member 13 is fixed to the scratch member fixing portion 34. Set to maintain.
As a result, when an appropriate weight is placed on the weight support base 32, a load directed downward in the vertical direction acts on the distal end portion 13 a of the scratching member 13.

  For example, as shown in FIGS. 3 and 4, the weight support base 32 is fixed to the swing end 31a of the four-node parallel link mechanism 31, and when an appropriate weight is placed, the weight support base 32 swings the load caused by the weight. It is made to act on the front-end | tip part 13a of the scratching member 13 via the moving end part 31a, the detection part 33, and the scratching member fixing | fixed part 34. FIG.

The detection unit 33 is fixed to the swing end 31 a of the four-bar parallel link mechanism 31, and includes a first strain detection unit 41 and a second strain detection unit 42.
For example, the first strain detection unit 41 is disposed on each surface of the two first plate springs 41a and 41a and the two first plate springs 41a and 41a that are disposed in parallel to the horizontal direction at a predetermined interval. And two first strain gauges 41b and 41b.

For example, the second strain detection unit 42 is disposed on each surface of two second leaf springs 42a and 42a disposed at a predetermined interval parallel to the vertical direction, and the two second leaf springs 42a and 42a. And two second strain gauges 42b and 42b.
The detection result signals output from the strain gauges 41 b and 42 b are input to the processing device 17.

  The scratch member fixing portion 34 is fixed to the swing end portion 31a of the four-node parallel link mechanism 31 via the detection portion 33, and fixes the scratch member 13 so as to be detachable.

  For example, the scratching member fixing portion 34 is arranged such that the tip end portion 13a of the scratching member 13 is positioned below the two second strain gauges 42b and 42b of the second strain detecting portion 42 in the vertical direction, and the central axis of the scratching member 13 The scratching member 13 is fixed so as to be inclined at a predetermined angle (for example, 45 °) with respect to the vertical direction.

  The scratch member 13 is, for example, a pencil or a rod-like member having a tip portion 13a made of a material (for example, steel) having a wear resistance higher than that of the cylindrical sample 21 having the same diameter as the pencil lead and the film-like sample 21. Thus, it has a tip portion 13 a that can contact the surface of the film-like sample 21 fixed on the mounting surface 11 </ b> A of the mounting table 11.

The drive device 14 includes, for example, a motor and a rack and pinion mechanism (not shown) and is disposed on the support base 10a, and the mounting base 11 is moved at a predetermined speed in a predetermined scratch direction in the horizontal direction with respect to the support base 10a. Move back and forth.
Thus, for example, as shown in FIG. 5, the mounting table 11 is placed against the scratching member 13 with the tip 13 a of the scratching member 13 being in contact with the surface of the film-like sample 21 fixed on the mounting surface 11 </ b> A. Relative movement in a predetermined scratch direction.

For example, as shown in FIG. 1, the microscope 15 is arranged on the back side with respect to the mounting surface 11 </ b> A of the mounting table 11, and the surface of the film-like sample 21 fixed on the mounting surface 11 </ b> A is placed on the mounting table 11 and The film-like sample 21 is transmitted, the image is captured so as to be enlarged, and image data of the imaging result is output.
For example, the microscope 15 has moved while the tip portion 13a of the scratching member 13 is in contact with at least the contact area of the surface of the film-like sample 21 that contacts the tip portion 13a of the scratching member 13 and the mounting table 11. The surface area including the locus area is imaged so as to be enlarged.

  The display device 16 is connected to the microscope 15 and the processing device 17, and displays, for example, image data output from the microscope 15 in real time, or displays various data output from the processing device 17, for example.

  The image data output from the microscope 15 (that is, the test result of the scratch test on the film-like sample 21 using the scratch test machine 10) is, for example, as shown in FIGS. 6 (A) to 6 (C). 13 can be classified according to the presence or absence of scratches on the surface of the film-like sample 21 and the degree of scratches.

For example, the image data shown in FIGS. 6 (A) to 6 (C) shows that the tip 13a of the scratching member (for example, pencil) 13 is in contact with the surface of the film-like sample 21 due to the relative movement of the mounting table 11 with respect to the scratching member 13. It is image data which shows the state which moved to.
For example, the image data shown in FIG. 6A is classified when there is no scratch in the trajectory area where the tip 13a of the scratching member 13 has moved in contact (when there is no scratch).
Further, for example, the image data shown in FIG. 6B is classified when a slight scratch exists in the trajectory region (when it is mild).
Further, for example, the image data shown in FIG. 6C is classified when a severe scratch exists in the trajectory area (in the case of severe).

  As illustrated in FIG. 7, for example, the processing device 17 includes a tangential force calculation unit 51, a pressing force calculation unit 52, a scratch friction coefficient calculation unit 53, a scratch resistance determination unit 54, and a storage unit 55. It is configured.

For example, as shown in FIG. 4, the tangential force calculation unit 51 acquires the bending strain Δε ₂ of the second leaf spring 42 a based on the detection result signal output from the second strain gauge 42 b.
Then, since the leading end portion 13a of the member 13 scratch just below the second strain gauge 42b are arranged, bending strain [Delta] [epsilon] ₂ is the tangential force (i.e., the tip portion 13a of the member 13 scratching the predetermined scratch direction in the horizontal direction _Suppose that the bending strain Δε ₂ Ft of the second leaf spring 42 a due to the tangential force Ft is equal to the bending strain Δε ₂ .
Then, a tangential force Ft (= C ₃ × Δε _2Ft ) is calculated from a constant C ₃ obtained in advance by calibration, and the calculation result is output.

Further, the tangential force calculation unit 51 calculates the bending strain Δε _1Ft (= C ₂ × Δε _2Ft ) of the first leaf spring 41a due to the tangential force Ft, based on a constant C ₂ obtained by calibration in advance, and the calculation result is Output to the pressing force calculation unit 52.

The pressing force calculation unit 52 acquires the bending strain Δε ₁ of the first leaf spring 41a based on the detection result signal output from the first strain gauge 41b.
Then, assuming that the bending strain Δε ₁ depends on the tangential force Ft and the pressing force (that is, the force acting on the tip portion 13a of the scratching member 13 in the vertical direction) Fn, the bending strain of the first leaf spring 41a due to the tangential force Ft. It is _{assumed that} the sum of the bending strain Δε _1Fn of the first leaf spring 41a due to Δε _1Ft and the pressing force Fn is equal to the bending strain Δε ₁ .

Then, the pressing force calculation unit 52 subtracts the bending strain Δε _1Ft (= C ₂ × Δε _2Ft ) of the first leaf spring 41a due to the tangential force Ft output from the tangential force calculation unit 51 from the bending strain Δε ₁ . A bending strain Δε _1Fn of the first leaf spring 41a due to the pressing force Fn is calculated.
Then, the pressing force Fn (= C ₁ × Δε _1Fn ) is calculated from the constant C ₁ obtained in advance by calibration, and the calculation result is output.

  For example, as shown in FIG. 7, the scratch friction coefficient calculation unit 53 determines the scratch friction coefficient μs (by the ratio of the tangential force Ft output from the tangential force calculation unit 51 and the pressing force Fn output from the pressing force calculation unit 52. = Ft / Fn), and the calculation result is output.

  Note that the image data output from the microscope 15 (that is, the test result of the scratch test on the film-like sample 21 using the scratch test machine 10) is output from the scratch friction coefficient calculation unit 53, for example, as shown in FIG. Can be classified according to the scratch friction coefficient μs.

For example, in FIG. 8, when there is no scratch on the film sample 21 visually (when there is no scratch or light (no scratch)), and when there is a scratch on the film sample 21 visually. (Slight (scratched) and severe) can be classified by a predetermined value (for example, μs = 0.14) of the scratch friction coefficient μs regardless of the magnitude of the pressing force Fn.
Thereby, the classification result according to the presence or absence of visual scratches on the film-like sample 21 and the classification result based on the predetermined value of the scratch friction coefficient μs can be matched.

For example, in FIG. 8, the case of slight (no scratch) is a case where there is no scratch in the locus region where the tip 13 a of the scratch member 13 has moved in contact with the surface of the film-like sample 21.
Further, in the case of mild (no scratch), the presence of a slight scratch in the trajectory region is recognized in the image data, but the presence of the scratch on the film-like sample 21 is not recognized.
Further, in the case of slight (with scratches), the presence of a slight scratch in the trajectory region is recognized in the image data, and the presence of the scratch on the film sample 21 is also recognized.
In the case of a severe case, the presence of a severe scratch is recognized in the trajectory region in the image data, and the presence of a scratch is also recognized visually against the film-like sample 21.

Further, for example, as shown in FIGS. 9A to 9C, in the case of a severe case where the presence of a severe scratch is recognized in the trajectory region in the image data, as the scratch friction coefficient μs increases, the scratch The degree (for example, the thickness of the scratch and the number of scratches, etc.) changes to an increasing tendency.
Thereby, the image data output from the microscope 15 can be classified by the scratch friction coefficient μs corresponding to the degree of scratching.

  The scratch resistance determination unit 54 uses at least the tangential force Ft output from the tangential force calculation unit 51 or the pressing force Fn output from the pressing force calculation unit 52 and various parameters stored in the storage unit 55 in advance. Based on this, the scratch resistance parameter Fp is calculated and the calculation result is output.

For example, the scratch resistance determination unit 54 includes the load resistance CL corresponding to the force (for example, pressing force Fn) acting on the surface of the film-like sample 21 with which the tip 13a of the scratching member 13 contacts, and the film-like sample 21. According to the contact area A of the tip 13a of the scratching member 13 that contacts the surface, the yield stress σ of the film-like sample 21, the contact length L of the tip 13a of the scratching member 13, and the solid amount of the film-like sample 21 Depending on the thickness H
The scratch resistance parameter Fp (= ((CL / A) / σ) × (L / H)) is calculated.

The load resistance CL is set based on the pressing force Fn calculated for each of a plurality of scratch tests in which the weight placed on the weight support base 32 is changed, for example.
The contact area A is set based on the area of the contact area on the surface of the film sample 21 with which the tip 13a of the scratching member 13 is in contact with the image data obtained by the scratch test, for example.
Further, the yield stress σ is, for example, a pressing force Fn calculated for each of a plurality of scratch tests in which the weight placed on the weight support base 32 is changed, and a cross-sectional observation with respect to the film-like sample 21 after each scratch test. It is set based on.

The contact length L is based on the length in the direction perpendicular to the scratching of the contact area on the surface of the film-like sample 21 with which the tip 13a of the scratching member 13 is in contact with, for example, image data obtained by a scratch test. Is set.
The film thickness H is set based on the thickness corresponding to the NV value (solid content wt%) of the hard coat layer of the film-like sample 21, which is known in advance, for example.

  The image data output from the microscope 15 (that is, the test result of the scratch test on the film-like sample 21 using the scratch test machine 10) is in accordance with the scratch resistance parameter Fp output from the scratch resistance determination unit 54. Can be classified.

  For example, in the image data shown in FIGS. 10A and 10B, the scratching member 13 is made of a material (for example, steel) having a higher wear resistance than the columnar and film-like sample 21 having the same diameter as the pencil lead. In the case where the rod-shaped member having the tip portion 13a is formed, image data showing a state in which the tip portion 13a of the scratching member 13 has moved to the contact area on the surface of the film-like sample 21 due to relative movement of the mounting table 11 with respect to the scratching member 13. It is.

  Then, for example, the image data shown in FIG. 10A is classified into a case where there is a scratch in the locus region where the tip 13a of the scratch member 13 has moved in contact (with scratch), for example, FIG. The image data shown in B) is classified when there is no scratch in the trajectory area (no scratch).

For example, as shown in FIG. 11, the presence or absence of these scratches varies depending on, for example, the load applied according to the pressing force Fn and the contact area.
For example, the lower limit value of the contact area classified as having scratches changes as the load increases, and the lower limit value of the load load classified as having scratches increases as the contact area increases. To change.

  For example, as shown in FIG. 12, the scratch member 13 has a tip 13a made of a material (for example, steel) having a columnar shape having the same diameter as the pencil lead and having higher wear resistance than the film-like sample 21. In the case of a rod-shaped member, for three film samples 21 (sample a, sample b, sample c) having different film thicknesses H, for example, the load resistance according to the pressing force Fn is linear as the contact area increases. Change to an increasing trend.

On the other hand, for example, as shown in FIG. 13, the scratch member 13 has a tip portion made of a material (for example, a steel material) having a higher wear resistance than the columnar and film-like sample 21 having the same diameter as the pencil lead. In the case of the rod-shaped member having 13a, the scratch resistance parameter Fp is not less than the three film-like samples 21 (sample a, sample b, sample c) and is not less than a predetermined contact area (for example, 15000 μm ² etc.). It is constant regardless of the contact area.

  The three film-like samples 21 (sample a, sample b, sample c) have, for example, the NV value (solid content wt%) of the hard coat layer in the sample a, sample b, and sample c sequentially. It is increasing.

That is, for example, as shown in FIG. 13, the scratch resistance parameter Fp has a predetermined contact area (for example, as shown in FIG. 13, for example). 15000 μm ² or more), it becomes a constant value regardless of the change of the contact area.
Moreover, this predetermined contact area (for example, 15000 μm ² or the like) is the same regardless of the film thickness H of the film-like sample 21, that is, the thickness according to the NV value (solid content wt%) of the hard coat layer.
Thereby, the image data output from the microscope 15 can be classified by the scratch resistance parameter Fp based on the tangential force Ft or the pressing force Fn and various parameters stored in the storage unit 55 in advance.

In the case where the scratching member 13 is a rod-shaped member having a tip portion 13a made of a material (for example, steel material) having a higher wear resistance than the columnar and film-like sample 21 having the same diameter as the pencil lead, Although the contact area is 15000 μm ² , the predetermined contact area can be changed according to the shape of the tip portion 13 a of the scratching member 13.

  The scratch tester 10 according to the present embodiment has the above-described configuration. Next, a scratch test method using the scratch tester 10 will be described.

First, the film sample 21 is fixed on the mounting surface 11 </ b> A of the mounting table 11.
Next, the scratching member 13 is fixed to the scratching member fixing portion 34 so that the tip end portion 13a of the scratching member 13 is positioned below the two second strain gauges 42b and 42b of the second strain detecting portion 42 in the vertical direction. .

Next, for example, by adjusting the position of the balance weight 31e connected to the balance lever 31d, the scratching member 13 is fixed to the scratching member fixing portion 34 while the weight is not placed on the weight support base 32. In this state, the two link levers 31c and 31c are leveled.
Next, an appropriate weight is placed on the weight support base 32, and the tip portion 13 a of the scratching member 13 is brought into contact with the surface of the film-like sample 21 fixed on the placement surface 11 </ b> A of the placement base 11.

Next, driving of the mounting table 11 by the driving device 14, imaging of the surface of the film-like sample 21 by the microscope 15, and detection by the strain gauges 41b and 42b are started.
As a result, the mounting table 11 moves relative to the support table 10a and the scratching member 13 at a predetermined speed in a predetermined horizontal scratching direction.
And the surface including the locus | trajectory area | region which moves while the front-end | tip part 13a of the scratching member 13 contacts with the movement of the mounting base 11 among the surfaces of the film-form sample 21 at least and the contact area | region which the front-end | tip part 13a of the scratching member 13 contacts. The image data obtained by sequentially imaging the region through the mounting table 11 and the back side of the film-like sample 21 and being able to be enlarged is sequentially output from the microscope 15.
And the signal of a detection result is output from each strain gauge 41b and 42b.

Next, display of image data sequentially output from the microscope 15 on the display device 16 is started.
Then, the pressing force Fn and the tangential force Ft are calculated based on the detection result signals sequentially output from the strain gauges 41b and 42b, and at least the scratch friction coefficient μs or the scratch resistance parameter Fp is calculated.

Then, based on the image data displayed on the display device 16, the presence or absence of scratches by the tip 13a of the scratch member 13 on the surface of the film sample 21 is determined, and the film sample 21 is determined according to the result of this determination. Classify.
Further, the superiority or inferiority of the scratch resistance of the film sample 21 is determined according to at least the scratch friction coefficient μs or the scratch resistance parameter Fp, and the film sample 21 is classified according to the determination result.

  The superiority or inferiority of the scratch resistance is, for example, the presence or absence of scratches that can be detected by visual observation, the presence or absence of scratches that can be detected on image data obtained by enlarging the surface of the film-like sample 21, for example, It is superior or inferior in relation to the extent of the wound (for example, the thickness of the scratch and the number of scratches, etc.).

  In addition, various determination processes based on the image data displayed on the display device 16 or the detection results output from the strain gauges 41 b and 42 b may be performed, for example, by sequentially moving the mounting table 11 relative to the scratching member 13. It is executed at a predetermined timing such as timing or when the relative movement of the mounting table 11 with respect to the scratching member 13 is completed.

As described above, according to the scratch testing machine 10 according to the present embodiment, at least the contact region of the surface of the film-like sample 21 that is in contact with the tip portion 13a of the scratch member 13 and the tip portion 13a of the scratch member 13 are in contact. However, the image data of the surface area including the trajectory area that has moved can be displayed on the display device 16 in real time.
Therefore, various determination processes based on the image data are performed at predetermined timing (for example, sequential timing during relative movement of the mounting table 11 with respect to the scratching member 13 and relative movement of the mounting table 11 with respect to the scratching member 13 are completed. (Predetermined timings such as time points) can be performed, and the reproducibility of determination results can be prevented from being impaired due to variations in timing for executing various determination processes. it can.

Furthermore, the region of the film-like sample 21 with which the tip 13 a of the scratching member 13 contacts can be easily imaged from the back side of the mounting table 11 by the microscope 15, and the tip of the scratching member 13 with respect to the surface of the film-like sample 21. The contact state of 13a can be displayed on the display device 16 in real time during a period in which the mounting table 11 is relatively moved with respect to the scratching member 13, for example.
Thereby, it is possible to classify | categorize the test result of the scratch test with respect to the film-form sample 21 using the scratch testing machine 10 in detail.

Further, based on detection result signals sequentially output from the strain gauges 41b and 42b, the pressing force Fn and the tangential force Ft acting on the surface of the film-like sample 21 by the tip portion 13a of the scratching member 13 are set at a predetermined timing ( For example, it can be detected at a predetermined timing such as a sequential timing during the relative movement of the mounting table 11 with respect to the scratching member 13 or a time when the relative movement of the mounting table 11 with respect to the scratching member 13 is completed. .
Thereby, for example, it is possible to automatically detect in real time such as a period during which the mounting table 11 is relatively moved with respect to the scratching member 13.

  Furthermore, by setting the contact area of the tip portion 13a of the scratching member 13 to be equal to or larger than a predetermined contact area corresponding to the shape of the tip portion 13a of the scratching member 13, the resistance of the film-like sample 21 by the predetermined scratch resistance parameter Fp. It is possible to prevent the determination result of the predetermined determination process for determining the scratch property from fluctuating according to the contact area of the tip portion 13a of the scratch member 13, and to achieve a desired evaluation for the quantitative evaluation of the scratch resistance of the film sample 21. Reliability and reproducibility can be ensured.

In particular, by setting the contact area of the tip portion 13a of the scratch member 13 made of a columnar and film-shaped sample 21 having the same diameter as the pencil lead and having higher wear resistance to 15000 μm ² or more, The determination result of the predetermined determination process for determining the scratch resistance of the film sample 21 by the scratch resistance parameter Fp is prevented from changing according to the contact area of the tip 13a of the scratch member 13, and the film sample The desired reliability and reproducibility for the quantitative evaluation of the 21 scratch resistance can be ensured.
Moreover, the reproducibility of the test result of the scratch test can be ensured by the tip 13a of the scratch member 13 made of a material different from the pencil lead and having higher wear resistance than the film sample 21.

  Further, according to the scratch test method according to the present embodiment, the presence or absence of a scratch is determined based on the image data, and a predetermined process for classifying the film-like sample 21 according to the determination result is performed at a predetermined timing (for example, (Predetermined timing such as when the relative movement of the mounting table 11 with respect to the scratching member 13 is completed), and the processing result is reproduced due to variations in timing for executing the predetermined processing. It is possible to prevent the property from being impaired.

  Furthermore, by determining the superiority or inferiority of the scratch resistance of the film-like sample 21 according to the scratch friction coefficient μs or the scratch resistance parameter Fp, desired reliability and reproducibility of the determination result can be ensured.

In the above-described embodiment, the processing device 17 may include an image processing unit that automatically performs predetermined image processing on the image data output from the microscope 15.
The image processing unit performs predetermined image processing on the image data sequentially output from the microscope 15 in real time, for example, thereby determining whether there is a scratch generated on the surface of the film-like sample 21 by the scratch member 13, for example. Alternatively, calculation of various parameters such as the contact area A and the contact length L may be automatically executed.

DESCRIPTION OF SYMBOLS 10 Scratch testing machine 11 Mounting base 11A Mounting surface 13a Tip part 13 Scratching member 14 Drive apparatus 15 Microscope (imaging apparatus)
16 Display device 21 Film-like sample 33 Detection part (detection means)
51 Tangent force calculation unit (detection means)
52 Pushing force calculation part (detection means)

Claims (8)

A mounting table having a mounting surface to which the film-like sample can be fixed; and a scratching member having a tip portion that can contact the surface of the film-like sample fixed on the mounting surface;
A driving device capable of moving the mounting table relative to the scratching member in a predetermined scratching direction with the tip of the scratching member in contact with the surface of the film sample fixed on the mounting surface; A scratch testing machine comprising:
Of the surface of the film-like sample, at least an area where the tip of the scratching member comes into contact and a surface area including the locus region where the tip of the scratching member comes into contact are imaged to be enlarged, and image data of the imaging result is obtained. An imaging device for outputting;
A scratch testing machine comprising: a display device that displays the image data output from the imaging device. The mounting table is made of a translucent member, and the film sample has translucency,
The imaging means is disposed on the back side of the mounting surface of the mounting table, and passes through the mounting table and the film sample through the surface of the film sample fixed on the mounting surface. The scratch testing machine according to claim 1, wherein imaging is performed. The detection means which detects the vertical pressing force and horizontal tangential force which act on the surface of the said film-like sample which the front-end | tip part of the said scratching member contacts is provided. Scratch tester. The contact area of the tip part of the scratching member that contacts the surface of the film sample is equal to or greater than a predetermined contact area according to the shape of the tip part. The scratch testing machine described in 1. The scratch member is made of a material having higher wear resistance than the film sample,
5. The scratch testing machine according to claim 4, wherein the predetermined contact area of the tip of the scratch member formed in a columnar shape having the same diameter as the pencil lead is 15000 μm ² . A scratch test method using the scratch tester according to claim 1,
A scratch test characterized in that, based on the image data, the presence or absence of a scratch due to the tip of the scratch member on the surface of the film sample is determined, and the film sample is classified according to the determination result. Method. Detecting a vertical pressing force and a horizontal tangential force acting on the surface of the film-like sample with which the tip of the scratching member comes into contact;
According to the scratch friction coefficient by the ratio of the pressing force and the tangential force, determine the superiority or inferiority of the scratch resistance of the film sample,
The scratch test method according to claim 6, wherein the film-like sample is classified according to a result of the determination. The load resistance CL according to the force acting on the surface of the film-like sample that the tip of the scratching member contacts, the contact area A of the tip of the scratching member, the yield stress σ of the film-like sample, Scratch resistance parameter Fp (= ((CL / A) / σ) × (L / H)) based on the contact length L of the tip of the scratch member and the film thickness H corresponding to the solid content of the film-like sample And
Judge the superiority or inferiority of the scratch resistance of the film-like sample according to the scratch resistance parameter F,
The scratch test method according to claim 6 or 7, wherein the film-like sample is classified according to a result of the determination.