JP2012147655A5 - - Google Patents

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Publication number
JP2012147655A5
JP2012147655A5 JP2011275229A JP2011275229A JP2012147655A5 JP 2012147655 A5 JP2012147655 A5 JP 2012147655A5 JP 2011275229 A JP2011275229 A JP 2011275229A JP 2011275229 A JP2011275229 A JP 2011275229A JP 2012147655 A5 JP2012147655 A5 JP 2012147655A5
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Japan
Prior art keywords
switching device
switching
load
switching circuit
circuit according
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JP2011275229A
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Japanese (ja)
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JP6018377B2 (en
JP2012147655A (en
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Priority claimed from GB1021453.4A external-priority patent/GB2486493B/en
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Publication of JP2012147655A publication Critical patent/JP2012147655A/en
Publication of JP2012147655A5 publication Critical patent/JP2012147655A5/ja
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Publication of JP6018377B2 publication Critical patent/JP6018377B2/en
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Claims (14)

負荷および電圧源に接続するためのスイッチング回路であって、
前記負荷への電力をスイッチオンおよびスイッチオフするための少なくとも１つのスイッチングデバイスと、
前記負荷を短絡し、それにより前記負荷を前記電圧源から隔離するためのプルダウンデバイスと、
前記少なくとも１つのスイッチングデバイスのうちの少なくとも１つを起動するために、前記負荷が短絡されている間に動作させることができるコントローラと、
を備え、
起動された前記スイッチングデバイスを通って電流が流れ、前記電流を測定して、起動された前記スイッチングデバイスが適切に動作しているかどうかを試験することができ、
前記プルダウンデバイスのインピーダンスが、前記少なくとも１つのスイッチングデバイスのインピーダンスより小さい、
スイッチング回路。 A switching circuit for connecting to a load and a voltage source,
At least one switching device for switching on and off power to the load;
A pull-down device for shorting the load, thereby isolating the load from the voltage source;
A controller that can be operated while the load is shorted to activate at least one of the at least one switching device;
With
A current flows through the activated switching device and the current can be measured to test whether the activated switching device is operating properly;
The impedance of the pull-down device is less than the impedance of the at least one switching device;
Switching circuit. 前記プルダウンデバイスが、前記負荷に並列に配置されたスイッチを含み、前記スイッチが閉じると前記負荷が短絡される、請求項１に記載のスイッチング回路。   The switching circuit according to claim 1, wherein the pull-down device includes a switch arranged in parallel with the load, and the load is short-circuited when the switch is closed. 前記プルダウンデバイスが、電界効果トランジスタ、バイポーラトランジスタ、絶縁ゲートバイポーラトランジスタ、トライアックおよび半導体リレーのうちの任意の１つまたは複数を含む、電子スイッチ、電気機械式スイッチおよび／または機械式スイッチを含む、請求項２に記載のスイッチング回路。   The pull-down device comprises an electronic switch, an electromechanical switch and / or a mechanical switch, including any one or more of a field effect transistor, a bipolar transistor, an insulated gate bipolar transistor, a triac and a semiconductor relay. Item 3. The switching circuit according to Item 2. 前記少なくとも１つのスイッチングデバイスが個々に起動される、請求項１乃至３のいずれかに記載のスイッチング回路。   4. A switching circuit according to any one of the preceding claims, wherein the at least one switching device is activated individually. 前記少なくとも１つのスイッチングデバイスを通って流れる電流を制限するための電流制限器をさらに備える、請求項１乃至４のいずれかに記載のスイッチング回路。   The switching circuit according to claim 1, further comprising a current limiter for limiting a current flowing through the at least one switching device. 前記少なくとも１つのスイッチングデバイスがその中に配置された電流制限器を有する、請求項５に記載のスイッチング回路。   The switching circuit of claim 5, wherein the at least one switching device has a current limiter disposed therein. システムインダクタンスを使用して、前記少なくとも１つのスイッチングデバイスを通って流れる電流が制限される、請求項１乃至４のいずれかに記載のスイッチング回路。   5. A switching circuit according to any preceding claim, wherein system inductance is used to limit the current flowing through the at least one switching device. 通常の動作状態における出力電圧と比較すると、試験状態下の前記少なくとも１つのスイッチングデバイスの出力電圧を無視することができる、請求項１乃至８のいずれかに記載のスイッチング回路。   The switching circuit according to claim 1, wherein an output voltage of the at least one switching device under a test state can be ignored when compared with an output voltage in a normal operation state. 前記スイッチング回路を交流電圧源または直流電圧源に接続することができる、請求項１乃至９のいずれかに記載のスイッチング回路。   The switching circuit according to claim 1, wherein the switching circuit can be connected to an AC voltage source or a DC voltage source. 前記少なくとも１つのスイッチングデバイスが半導体スイッチングデバイスを備える、請求項１乃至１０のいずれかに記載のスイッチング回路。   11. A switching circuit according to any of claims 1 to 10, wherein the at least one switching device comprises a semiconductor switching device. 少なくとも１つのスイッチングデバイスを含む、負荷を電圧源に接続するスイッチング回路の試験方法であって、
プルダウンデバイスを起動することによって前記負荷を短絡するステップと、
前記少なくとも１つのスイッチングデバイスのうちの１つを起動するステップと、
起動された前記少なくとも１つのスイッチングデバイスを通って流れる電流を測定するステップと、
測定された電流から、起動された少なくとも１つのスイッチングデバイスが適切に動作しているかどうかを決定するステップと、
を含み、
前記プルダウンデバイスのインピーダンスが、前記少なくとも１つのスイッチングデバイスのインピーダンスより小さい、
方法。 A method for testing a switching circuit for connecting a load to a voltage source, comprising at least one switching device comprising:
Shorting the load by activating a pull-down device;
Activating one of the at least one switching device;
Measuring the current flowing through the activated at least one switching device;
Determining from the measured current whether the activated at least one switching device is operating properly;
Including
The impedance of the pull-down device is less than the impedance of the at least one switching device;
Method. 前記スイッチングデバイスが逐次連続的に起動される、請求項１１に記載の方法。   The method of claim 11, wherein the switching device is activated sequentially and sequentially. 前記少なくとも１つのスイッチングデバイスが、前記少なくとも１つのスイッチングデバイスを通って流れる電流が実質的に一定になるのに十分な時間の長さにわたって起動される、請求項１１に記載の方法。   The method of claim 11, wherein the at least one switching device is activated for a length of time sufficient for a current flowing through the at least one switching device to be substantially constant. 前記少なくとも１つのスイッチングデバイスを通って流れる電流を制限するステップをさらに含む、請求項１１乃至１３のいずれか記載の方法。
14. A method according to any of claims 11 to 13, further comprising the step of limiting current flowing through the at least one switching device.
JP2011275229A 2010-12-17 2011-12-16 Switching circuit and test method Expired - Fee Related JP6018377B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB1021453.4 2010-12-17
GB1021453.4A GB2486493B (en) 2010-12-17 2010-12-17 Switching circuits and methods of testing

Publications (3)

Publication Number Publication Date
JP2012147655A JP2012147655A (en) 2012-08-02
JP2012147655A5 true JP2012147655A5 (en) 2015-01-29
JP6018377B2 JP6018377B2 (en) 2016-11-02

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JP2011275229A Expired - Fee Related JP6018377B2 (en) 2010-12-17 2011-12-16 Switching circuit and test method

Country Status (7)

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JP (1) JP6018377B2 (en)
CN (1) CN102608526B (en)
BR (1) BRPI1105402A2 (en)
CA (1) CA2762475C (en)
DE (1) DE102011056541B4 (en)
FR (1) FR2969427B1 (en)
GB (1) GB2486493B (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5983171B2 (en) * 2012-08-10 2016-08-31 株式会社Ｇｓユアサ Switch failure diagnosis device, power storage device
US8891218B2 (en) * 2012-10-12 2014-11-18 The Boeing Company Fault tolerant fail-safe link
CN103310853B (en) * 2013-05-24 2016-02-24 南京航空航天大学 A kind of power switch circuit with built-in self-test
CN108369879B (en) * 2015-12-18 2020-04-17 佩佩尔+富克斯有限公司 Method and device for monitoring the function of redundant interconnection contacts
US10270241B2 (en) * 2016-05-16 2019-04-23 Varian Semiconductor Equipment Associates, Inc. Fault current limiter having fault checking system for power electronics and bypass circuit
US10340908B2 (en) * 2016-07-25 2019-07-02 Continental Automotive Systems, Inc. Half-bridge driver fault diagnostic system and method
GB2563069B (en) * 2017-06-02 2020-07-01 Ge Aviat Systems Ltd Apparatus to detect a fault in a wire
CN108051737B (en) * 2017-12-04 2019-12-06 华北电力大学 switch device screening system and method
US10749334B2 (en) 2018-07-12 2020-08-18 Ovh Method and power distribution unit for preventing disjunctions
EP3629039B1 (en) * 2018-09-26 2023-04-05 Aptiv Technologies Limited Solid state power switch device
CN109828169A (en) * 2019-02-01 2019-05-31 中国矿业大学(北京) Electric fireproof current-limiting protector electric performance test method, apparatus and system
CN110187269B (en) * 2019-06-21 2024-03-29 江苏伊施德创新科技有限公司 Method and device for reducing energy consumption in relay full-load test
EP3767316B1 (en) * 2019-07-19 2022-03-30 Yazaki Corporation Switch failure detection device
CN112255537B (en) * 2020-10-13 2022-03-25 南京大学 Gallium nitride triode switch test circuit and test method

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752886A (en) 1985-07-22 1988-06-21 General Electric Company Method for on-line testing of load control circuitry and the associated load
JPS6291587U (en) * 1985-11-28 1987-06-11
ES2182364T3 (en) * 1997-08-22 2003-03-01 Bosch Gmbh Robert PROCEDURE FOR THE RECOGNITION OF ERRONE CIRCUITS OF A FIRST RELAYS.
DE10127233C1 (en) * 2001-05-22 2002-11-28 Pilz Gmbh & Co Safety cut-out switch module for electrical load has 2 alternate load current paths for supplying electrical load each containing 2 series switch elements
US6593758B2 (en) * 2001-08-02 2003-07-15 Honeywell International Inc. Built-in test system for aircraft indication switches
JP2003274636A (en) * 2002-03-15 2003-09-26 Omron Corp Solid state relay
US7885043B2 (en) * 2007-06-15 2011-02-08 General Electric Company Remote-operable micro-electromechanical system based over-current protection apparatus
US7586725B2 (en) 2007-07-19 2009-09-08 Honeywell International Inc. Method of providing a secondary means of overload protection and leakage current protection in applications using solid state power controllers
US7554222B2 (en) * 2007-11-01 2009-06-30 General Electric Company Micro-electromechanical system based switching
JP5300059B2 (en) * 2009-02-13 2013-09-25 エヌイーシーコンピュータテクノ株式会社 Power supply system, diagnosis method and program thereof
US8350414B2 (en) * 2010-08-11 2013-01-08 Xantrex Technology Inc. Semiconductor assisted DC load break contactor

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