JP2012113055A5 - Imaging apparatus and photometric value calculation method - Google Patents
Imaging apparatus and photometric value calculation method Download PDFInfo
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- JP2012113055A5 JP2012113055A5 JP2010260366A JP2010260366A JP2012113055A5 JP 2012113055 A5 JP2012113055 A5 JP 2012113055A5 JP 2010260366 A JP2010260366 A JP 2010260366A JP 2010260366 A JP2010260366 A JP 2010260366A JP 2012113055 A5 JP2012113055 A5 JP 2012113055A5
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上記目的を達成するために、本発明の撮像装置は、被写体の測光を行い、測光値を出力する測光手段と、測光条件を変えずに前記測光手段から複数の測光値を取得する取得手段と、前記取得手段により取得された前記複数の測光値と前記測光手段の出力変化特性とに基づいて、露出演算に用いる測光値を演算する演算手段と、を有する。 In order to achieve the above object, an imaging apparatus according to the present invention includes a photometric unit that performs photometry of a subject and outputs a photometric value, and an acquisition unit that acquires a plurality of photometric values from the photometric unit without changing photometric conditions. Calculating means for calculating a photometric value used for exposure calculation based on the plurality of photometric values acquired by the acquiring means and output change characteristics of the photometric means .
ファインダーモード選択スイッチSW138は、接眼レンズ106により被写体を確認することが可能な光学ファインダーモードと、イメージセンサ112からの画像信号を逐次、画像表示回路118に表示するライブビュー表示モードとを切り替える。また、通信インターフェース回路126は、システムコントローラ120の制御により、外部装置との通信のインターフェースを行う。
The viewfinder mode selection switch SW138 switches between an optical viewfinder mode in which a subject can be confirmed by the
図中の実線は、測光出力を基に算出されたものであり、輝度が暗くなるほど(EV値が小さくなるほど)、測定誤差及び差分測光値は共に大きくなっており、また、両者は相関関係にあることを示している。また、図中の破線は、実線で示すグラフを3次の予測関数でフィッティングしたものである。図4に示すように、EV値が2から−4程度までは良好に一致しており、予測による測光が可能であることが分かる。また、EV値が−4より低い輝度では、予測精度が徐々に失われていくのが分かる。EV値が−6のような非常な低輝度では、リセット動作を行ってフォトトランジスタQ1のベースにキャリア注入を行った後の安定待ちの初期状態では、フォトトランジスタQ1のエミッタ電流成分として、注入キャリアによるものが圧倒的に支配的である。そのため、充分な予測精度を得ることが困難となる。精度を向上させるためには、更に読み出しを行い、予測関数の次数や係数を変えて予測すればよい。予測を行うための読み出し回数は、カメラに許されるレリーズタイムラグ、連写、単写などの撮影モード、あるいは搭載されるカメラの連写速度などを考慮して、バランスの良い回数を設定すればよい。また、あるいはカメラによっては、予測読み出しを行うための安定待ち時間を変えるなどの対応も可能である。 The solid line in the figure is calculated based on the photometric output, and as the luminance becomes darker (the EV value becomes smaller), both the measurement error and the differential photometric value increase, and both are correlated. It shows that there is. Moreover, the broken line in the figure is obtained by fitting a graph indicated by a solid line with a cubic prediction function. As shown in FIG. 4, EV values are well matched from about 2 to -4, and it can be seen that photometry by prediction is possible. In addition, it is understood that the prediction accuracy is gradually lost at the luminance whose EV value is lower than −4. In an extremely low brightness such as an EV value of −6, in the initial state of waiting for stabilization after performing the reset operation and injecting carriers into the base of the phototransistor Q1, injected carriers are used as the emitter current component of the phototransistor Q1. Is overwhelmingly dominant. Therefore, it becomes difficult to obtain sufficient prediction accuracy. In order to improve the accuracy, the reading may be further performed and prediction may be performed by changing the order or coefficient of the prediction function. The number of readouts for prediction may be set to a well-balanced number in consideration of the release time lag allowed by the camera, shooting modes such as continuous shooting and single shooting, or the continuous shooting speed of the mounted camera. . Alternatively, depending on the camera, it is possible to cope with such as changing the stabilization waiting time for performing the predictive reading.
ΔAE≦0の場合はS715に進み、更に、S715で、ΔAEの値が−γ<ΔAE≦0の場合は、S716に進む。ΔAEが0付近の場合は、結果的に入射光がある程度大きく、測光回路107が予測動作中に充分に安定した場合である。従ってγの値は、測光出力のばらつきやカメラの露出の許容値をもとに、たとえば、1/8から1/3段程度の値が設定される。S716では、AE2とAE3の平均値を算出し、この値をもとに、S714で露出演算を行い、このサブルーチンを終了する。ΔAE≦−γの場合は、撮影シーンの変更があり、被写体輝度が明るく変化したと考えられるので、S701に戻って再測光を実施する。
If ΔAE ≦ 0, the process proceeds to S715. If the value of ΔAE is −γ <ΔAE ≦ 0 in S715, the process proceeds to S716. When ΔAE is near 0, as a result, incident light is large to some extent, and the
Claims (12)
測光条件を変えずに前記測光手段から複数の測光値を取得する取得手段と、 Acquisition means for acquiring a plurality of photometric values from the photometric means without changing the photometric conditions;
前記取得手段により取得された前記複数の測光値と前記測光手段の出力変化特性とに基づいて、露出演算に用いる測光値を演算する演算手段と、 Calculation means for calculating a photometric value used for exposure calculation based on the plurality of photometric values acquired by the acquisition means and output change characteristics of the photometric means;
を有することを特徴とする撮像装置。 An imaging device comprising:
前記演算手段は、前記取得手段により前記第3の測光値を取得した場合、当該第3の測光値と前記第2の測光値と前記測光手段の出力変化特性とに基づいて前記露出演算に用いる測光値を演算することを特徴とする請求項6に記載の撮像装置。 When the acquisition unit acquires the third photometric value, the calculation unit is used for the exposure calculation based on the third photometric value, the second photometric value, and the output change characteristic of the photometry unit. The imaging device according to claim 6, wherein a photometric value is calculated.
取得手段が、測光条件を変えずに前記測光手段から複数の測光値を取得する取得工程と、 An acquisition step for acquiring a plurality of photometric values from the photometric means without changing the photometric conditions;
演算手段が、前記取得工程で取得された前記複数の測光値と前記測光手段の出力変化特性とに基づいて、露出演算に用いる測光値を演算する演算工程と、 A calculating step for calculating a photometric value used for exposure calculation based on the plurality of photometric values acquired in the acquiring step and an output change characteristic of the photometric unit;
を有することを特徴とする測光値演算方法。 A photometric value calculation method comprising:
Priority Applications (3)
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JP2010260366A JP5646968B2 (en) | 2010-11-22 | 2010-11-22 | Imaging apparatus and photometric value calculation method |
US13/291,587 US8582965B2 (en) | 2010-11-22 | 2011-11-08 | Image capturing apparatus, method for controlling image capturing apparatus, and method for predicting photometric value |
CN201110380771.4A CN102540632B (en) | 2010-11-22 | 2011-11-22 | Image capturing apparatus, method for controlling image capturing apparatus, and method for predicting photometric value |
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JP2010260366A JP5646968B2 (en) | 2010-11-22 | 2010-11-22 | Imaging apparatus and photometric value calculation method |
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JP2012113055A JP2012113055A (en) | 2012-06-14 |
JP2012113055A5 true JP2012113055A5 (en) | 2014-01-09 |
JP5646968B2 JP5646968B2 (en) | 2014-12-24 |
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JP6028928B2 (en) * | 2013-04-16 | 2016-11-24 | オリンパス株式会社 | Imaging apparatus and imaging method |
CN111434104B (en) * | 2017-12-07 | 2021-11-19 | 富士胶片株式会社 | Image processing apparatus, image capturing apparatus, image processing method, and recording medium |
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JPH08122890A (en) * | 1994-10-21 | 1996-05-17 | Olympus Optical Co Ltd | Ac light source detecting device and camera using it |
JPH08211438A (en) * | 1995-02-06 | 1996-08-20 | Canon Inc | Photometry device for camera |
US6067422A (en) * | 1995-07-28 | 2000-05-23 | Canon Kabushiki Kaisha | Flash photography system |
JP3315651B2 (en) | 1998-08-31 | 2002-08-19 | キヤノン株式会社 | Optical sensor and solid-state imaging device |
US7027095B2 (en) * | 2001-02-09 | 2006-04-11 | Canon Kabushiki Kaisha | Apparatus and method for the exposure control of a photographing device |
JP2003043547A (en) * | 2001-07-26 | 2003-02-13 | Olympus Optical Co Ltd | Exposure controller |
JP2005077938A (en) | 2003-09-02 | 2005-03-24 | Nikon Corp | Light receiving device and camera installed with light receiving device |
JP2008309732A (en) | 2007-06-18 | 2008-12-25 | Olympus Corp | Light detection device and optical equipment using same |
JP2009047956A (en) * | 2007-08-21 | 2009-03-05 | Sony Corp | Imaging apparatus |
JP5247299B2 (en) | 2008-08-18 | 2013-07-24 | キヤノン株式会社 | Optical sensor, photometric device and camera system |
JP5335318B2 (en) | 2008-08-18 | 2013-11-06 | キヤノン株式会社 | Optical sensor, measuring device and camera system |
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2010
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2011
- 2011-11-08 US US13/291,587 patent/US8582965B2/en not_active Expired - Fee Related
- 2011-11-22 CN CN201110380771.4A patent/CN102540632B/en not_active Expired - Fee Related
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