JP2012078133A - Inspection head of surface inspection device - Google Patents

Inspection head of surface inspection device Download PDF

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JP2012078133A
JP2012078133A JP2010221637A JP2010221637A JP2012078133A JP 2012078133 A JP2012078133 A JP 2012078133A JP 2010221637 A JP2010221637 A JP 2010221637A JP 2010221637 A JP2010221637 A JP 2010221637A JP 2012078133 A JP2012078133 A JP 2012078133A
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inspection
light
fiber
reflected light
head
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Tsunenari Tanaka
恒成 田中
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Omron Kirin Techno System Co Ltd
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Kirin Techno System Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide an inspection head for a surface inspection device, capable of detecting minute defects of the surface of an object to be inspected.SOLUTION: An inspection head 1 of a surface inspection device includes a projection/reception optical fiber 11 for guiding inspection light emitted from a laser diode 14 to project it to the surface of an object 100 to be inspected, and receiving the reflected light to guide it to a photodetector 15 for detecting the intensity of the reflected light, and inspects the surface of the object 100 to be inspected based on the detection result of the photodetector 15. The projection/reception optical fiber 11 is an optical fiber coupler that includes a molten elongation part 11c formed by melting, drawing and joining a part of two optical fibers 11a and 11b. One optical fiber 11a branched from the molten drawing part 11c guides inspection light from the laser diode 14, the other optical fiber 11b guides reflected light to the photodetector 15, inspection light is projected from the end surface 11f of the molten drawing part 11c to the surface of the object 100 to be inspected, and the reflected light is received by the end surface 11f.

Description

本発明は、被検査物の表面に検査光を照射し、受光した反射光の光量に基づいて表面状態を検査する表面検査装置における検査光を投受光するための検査ヘッドに関する。   The present invention relates to an inspection head for projecting and receiving inspection light in a surface inspection apparatus that irradiates the surface of an inspection object with inspection light and inspects the surface state based on the amount of received reflected light.

円筒状の被検査物の内周面に対して検査ヘッドから検査光を照射してその表面を検査する装置が知られている(例えば特許文献1参照)。この検査装置は、検査光を投光する投光ファイバの周りに反射光を受光する複数の受光ファイバを隣接させてこれらの光ファイバをファイバ保持筒で保持するようにした検査ヘッドを有し、反射光の光量に基づいて表面の二次元画像を生成して表面の傷等の欠陥を検査している。   There is known an apparatus for inspecting the surface of a cylindrical inspection object by irradiating inspection light from an inspection head onto the inner peripheral surface of the inspection object (for example, see Patent Document 1). This inspection apparatus has an inspection head in which a plurality of light receiving fibers for receiving reflected light are adjacent to each other around a light projecting fiber for projecting inspection light, and these optical fibers are held by a fiber holding cylinder, Based on the amount of reflected light, a two-dimensional image of the surface is generated to inspect defects such as surface scratches.

特開2007−147324号公報JP 2007-147324 A

上述の検査ヘッドを使用して被検査物の表面を検査する場合、受光ファイバで反射光を受光させるために表面で結んでいる検査光の焦点をずらし、照射するスポット径を大きくすることで投光ファイバの周りに設けられた受光ファイバに反射光が入射できるようにしている。近年、より微細な欠陥を検査することへの要求が高まっているが、上述の検査装置のようにスポット径を大きくすると、取得する二次元画像が不鮮明になり微細な傷等の欠陥が検出できないおそれがある。   When inspecting the surface of an object to be inspected using the above-described inspection head, the focus of the inspection light connected on the surface is shifted so that the reflected light is received by the light receiving fiber, and the spot diameter to be irradiated is increased. Reflected light can be incident on a light receiving fiber provided around the optical fiber. In recent years, there has been an increasing demand for inspecting finer defects. However, when the spot diameter is increased as in the above-described inspection apparatus, the acquired two-dimensional image becomes unclear and defects such as fine scratches cannot be detected. There is a fear.

そこで、本発明は被検査物表面の微細な欠陥を検出可能な表面検査装置の検査ヘッドを提供することを目的とする。   Accordingly, an object of the present invention is to provide an inspection head of a surface inspection apparatus capable of detecting minute defects on the surface of an object to be inspected.

本発明の表面検査装置の検査ヘッドは、光源(14)から射出された検査光を導いて被検査物(100)の表面に投光し、その反射光を受光して反射光の強度を検出する検出手段(15)に反射光を導く投受光ファイバ(11)を有し、前記検出手段の検出結果に基づいて前記被検査物の表面を検査する表面検査装置の検査ヘッド(1)であって、前記投受光ファイバが、2本の光ファイバ(11a、11b)の一部を熔融延伸接合した熔融延伸部(11c)を有する光ファイバカプラであり、前記熔融延伸部から分岐した一方の光ファイバ(11a)は前記光源からの検査光を導き、他方の光ファイバ(11b)は前記検出手段に反射光を導き、前記熔融延伸部の端面(11f)から検査光が前記被検査物の表面に投光され、その反射光を前記端面が受光することにより上記課題を解決する。   The inspection head of the surface inspection apparatus of the present invention guides the inspection light emitted from the light source (14), projects the light onto the surface of the inspection object (100), receives the reflected light, and detects the intensity of the reflected light. An inspection head (1) of a surface inspection apparatus that has a light projecting / receiving fiber (11) for guiding reflected light to a detection means (15) that inspects the surface of the object to be inspected based on the detection result of the detection means. The light projecting / receiving fiber is an optical fiber coupler having a melt-stretching part (11c) in which a part of two optical fibers (11a, 11b) is melt-stretched and joined, and one of the lights branched from the melt-stretching part The fiber (11a) guides the inspection light from the light source, the other optical fiber (11b) guides the reflected light to the detecting means, and the inspection light is transmitted from the end surface (11f) of the melt-drawn portion to the surface of the inspection object. The reflected light is projected on Serial end face to solve the above problems by receiving.

本発明の表面検査装置の検査ヘッドによれば、熔融延伸部が被検査物の表面に検査光を投光し、かつ検査光の反射光を受光するので、従来存在していた投光用ファイバ及び受光用ファイバが共通化される。従って、スポット径を大きくする必要性がなくなり、検査光の焦点を最小値で使用することができる。よって、取得する二次元画像が鮮明になり、より微細な欠陥を検出することができる。   According to the inspection head of the surface inspection apparatus of the present invention, the melt extending portion projects inspection light onto the surface of the object to be inspected and receives reflected light of the inspection light. In addition, the light receiving fiber is shared. Therefore, there is no need to increase the spot diameter, and the focus of the inspection light can be used with the minimum value. Therefore, the acquired two-dimensional image becomes clear and a finer defect can be detected.

本発明の検査ヘッドの一形態において、前記熔融延伸部の端面が、前記端面に入射する検査光の光路の法線方向に対して傾いていてもよい。この形態によれば、熔融延伸部の端面に検査光が入射する際に、検査光の一部が反射して検出手段に入射することを防ぐことができる。   In one form of the inspection head of the present invention, the end surface of the melt extension part may be inclined with respect to the normal direction of the optical path of the inspection light incident on the end surface. According to this aspect, when the inspection light is incident on the end face of the melt extending portion, it is possible to prevent a part of the inspection light from being reflected and incident on the detection means.

熔融延伸部の端面が傾いている形態において、前記投受光ファイバを保持するファイバ保持筒(12)を備え、前記端面に入射する検査光の入射方向が前記ファイバ保持筒の軸線(AX)方向に対して傾いているとともに、前記端面から射出された検査光の光路が前記ファイバ保持筒の軸線方向に沿っていてもよい。この形態によれば、検査光の検出手段への進入防止のため端面を傾けた場合に、端面に入射する検査光の入射方向をファイバ保持筒の軸線方向に対して傾けることで、検査光の光路をセンサヘッドの軸線方向に沿うように調整することができる。   In the form in which the end surface of the melt extending portion is inclined, the fiber holding tube (12) for holding the light projecting and receiving fiber is provided, and the incident direction of the inspection light incident on the end surface is in the axis (AX) direction of the fiber holding tube. The optical path of the inspection light emitted from the end face may be along the axial direction of the fiber holding cylinder. According to this aspect, when the end surface is inclined to prevent the inspection light from entering the detection means, the inspection light incident on the end surface is inclined with respect to the axial direction of the fiber holding cylinder, thereby The optical path can be adjusted along the axial direction of the sensor head.

なお、以上の説明では本発明の理解を容易にするために添付図面の参照符号を括弧書きにて付記したが、それにより本発明が図示の形態に限定されるものではない。   In addition, in the above description, in order to make an understanding of this invention easy, the reference sign of the accompanying drawing was attached in parenthesis, but this invention is not limited to the form of illustration by it.

以上、説明したように、本発明の表面検査装置の検査ヘッドにおいては、熔融延伸部が被検査物の表面に検査光を投光し、かつ検査光の反射光を受光するので、従来存在していた投光用ファイバ及び受光用ファイバが共通化される。従って、スポット径を大きくする必要性がなくなり、検査光の焦点を最小値で使用することができる。よって、取得する二次元画像が鮮明になり、より微細な欠陥を検出することができる。   As described above, in the inspection head of the surface inspection apparatus according to the present invention, the melt extending portion projects the inspection light on the surface of the object to be inspected and receives the reflected light of the inspection light. The previously used light projecting fiber and light receiving fiber are made common. Therefore, there is no need to increase the spot diameter, and the focus of the inspection light can be used with the minimum value. Therefore, the acquired two-dimensional image becomes clear and a finer defect can be detected.

本発明の一形態に係る表面検査装置の検査ヘッドの概略図。1 is a schematic view of an inspection head of a surface inspection apparatus according to an embodiment of the present invention. 投受光ファイバの拡大図。An enlarged view of a light emitting / receiving fiber. 熔融延伸部の端面を示した平面模式図。The plane schematic diagram which showed the end surface of the melt extension part. センサヘッドの断面図。Sectional drawing of a sensor head.

図1に本発明の一形態に係る表面検査装置の検査ヘッドの概略図を示す。表面検査装置は、被検査物100に設けられた円筒形の内周面100aの検査に適した装置である。表面検査装置は、内周面100aを検査する検査ヘッド1を有し、さらに、検査ヘッド1を駆動するための駆動機構や、駆動機構の動作制御や検査ヘッド1による検出結果の処理等を実行するための制御装置を備えている。表面検査装置は、検査ヘッド1を被検査物100の内周面100aに挿入し、被検査物100又は検査ヘッド1のいずれかを回転駆動させることにより内周面100aの表面と検査ヘッド1を相対的に移動させる。検査ヘッド1は検査光を内周面100aに照射して表面を検査し、その反射光の検出結果に基づいて制御装置が二次元画像を生成して欠陥の有無を判断する。なお、表面検査装置の駆動機構や制御装置については公知技術を適用してよい。   FIG. 1 shows a schematic diagram of an inspection head of a surface inspection apparatus according to an embodiment of the present invention. The surface inspection apparatus is an apparatus suitable for inspecting a cylindrical inner peripheral surface 100 a provided on the inspection object 100. The surface inspection apparatus includes an inspection head 1 for inspecting the inner peripheral surface 100a, and further performs a drive mechanism for driving the inspection head 1, operation control of the drive mechanism, processing of detection results by the inspection head 1, and the like. A control device is provided. The surface inspection apparatus inserts the inspection head 1 into the inner peripheral surface 100a of the inspection object 100, and rotationally drives either the inspection object 100 or the inspection head 1 to connect the surface of the inner peripheral surface 100a and the inspection head 1 together. Move relative. The inspection head 1 irradiates the inner peripheral surface 100a with inspection light and inspects the surface, and based on the detection result of the reflected light, the control device generates a two-dimensional image and determines the presence or absence of a defect. In addition, you may apply a well-known technique about the drive mechanism and control apparatus of a surface inspection apparatus.

検査ヘッド1は、検査光及び反射光を投受光するセンサヘッド2と、センサヘッド2の外側に同軸(軸線AX)に設けられる中空軸状のミラー保持筒3とを備えている。ミラー保持筒3はセンサヘッド2のさらに外側にて回転自在に支持されている。ミラー保持筒3の先端部にはミラー4が固定され、ミラー保持筒3の外周にはそのミラー4と対向するようにして投光窓3aが設けられている。ミラー4は、センサヘッド2から射出された検査光の光路を投光窓3aに向けて変更し、かつ、投光窓3aからセンサヘッド2内に入射した反射光の光路をセンサヘッド2へ向けて変更する。   The inspection head 1 includes a sensor head 2 that projects and receives inspection light and reflected light, and a hollow shaft-shaped mirror holding cylinder 3 provided coaxially (axis line AX) outside the sensor head 2. The mirror holding cylinder 3 is rotatably supported on the outer side of the sensor head 2. A mirror 4 is fixed to the tip of the mirror holding tube 3, and a light projection window 3 a is provided on the outer periphery of the mirror holding tube 3 so as to face the mirror 4. The mirror 4 changes the optical path of the inspection light emitted from the sensor head 2 toward the projection window 3a, and directs the optical path of the reflected light entering the sensor head 2 from the projection window 3a toward the sensor head 2. To change.

センサヘッド2は、投受光ファイバ11と、投受光ファイバ11を保持するファイバ保持筒12とを備えている。ファイバ保持筒12の先端には、投受光ファイバ11を介して導かれた検査光をミラー保持筒3の軸線AX方向に沿ってビーム状に射出させ、かつファイバ保持筒12の軸線AX方向に沿って検査光とは逆向きに進む反射光を投受光ファイバ11に集光するレンズ13が設けられている。   The sensor head 2 includes a light projecting / receiving fiber 11 and a fiber holding cylinder 12 that holds the light projecting / receiving fiber 11. At the tip of the fiber holding cylinder 12, the inspection light guided through the light projecting / receiving fiber 11 is emitted in the form of a beam along the axis AX direction of the mirror holding cylinder 3, and along the axis AX direction of the fiber holding cylinder 12. A lens 13 that collects the reflected light traveling in the direction opposite to the inspection light on the light projecting / receiving fiber 11 is provided.

図2に投受光ファイバ11の拡大図を示す。投受光ファイバ11として、2本の光ファイバ11a、11bの一部を熔融延伸接合した熔融延伸部11cを有する光ファイバカプラが適用される。投受光ファイバ11の熔融延伸部11cから分岐する2本の光ファイバ11a、11bの端部11d、11eには、それぞれ、検査光の光源としてのレーザーダイオード14と、被検査物100から反射した反射光の単位時間当たりの光量(反射光強度)に応じた電流又は電圧の電気信号を出力する検出手段としてのフォトディテクタ15とが接続される。レーザーダイオード14から射出された検査光は、端部11にて受光し光ファイバ11a及び熔融延伸部11cに導かれ、熔融延伸部11cの端面11fからセンサヘッド2の軸線AX方向へ向けて射出される。また被検査物100からの反射光は、センサヘッド2内を軸線AX方向に進み熔融延伸部11cの端面11fに入射して、熔融延伸部11c及び光ファイバ11bに導かれてフォトディテクタ15に入射する。熔融延伸部11cは、50:50の比率で端面11fから入射した反射光を分岐し、フォトディテクタ15に分配する。   FIG. 2 shows an enlarged view of the light projecting / receiving fiber 11. As the light projecting / receiving fiber 11, an optical fiber coupler having a melt extending part 11c obtained by melt extending and joining a part of two optical fibers 11a and 11b is applied. The end portions 11d and 11e of the two optical fibers 11a and 11b branched from the melt extending portion 11c of the light projecting / receiving fiber 11 are reflected by the laser diode 14 as a light source of inspection light and the reflection reflected from the inspection object 100, respectively. A photodetector 15 is connected as detection means for outputting an electric signal having a current or voltage corresponding to the amount of light per unit time (reflected light intensity). The inspection light emitted from the laser diode 14 is received by the end portion 11, guided to the optical fiber 11a and the melt extending portion 11c, and emitted from the end surface 11f of the melt extending portion 11c toward the axis AX direction of the sensor head 2. The Further, the reflected light from the object to be inspected 100 travels in the sensor head 2 in the axis AX direction, enters the end surface 11f of the melt extending portion 11c, is guided to the melt extending portion 11c and the optical fiber 11b, and enters the photodetector 15. . The melt extending portion 11 c branches the reflected light incident from the end surface 11 f at a ratio of 50:50 and distributes it to the photodetector 15.

次に検査ヘッド1の作用を説明する。図3は、熔融延伸部11cの端面11fを示した平面模式図である。投受光ファイバ11は、熔融延伸部11cにて検査光の射出及び反射光の受光が行われる。従来の表面検査装置における検査ヘッドの光ファイバは、検査光を導く投光用ファイバと反射光を導く受光用ファイバとに分けられ、1本の投光用ファイバの周りに複数の受光用ファイバを配置して使用されている。この場合、被検査物100の内周面100aで反射した反射光を受光用ファイバで受光するには、内周面100aで結んでいる焦点をずらし、内周面100aに照射するスポット径を大きくすることで反射光が受光用ファイバに入射するように調整している。ところが、スポット径を大きくすると取得した二次元画像が不鮮明になりがちである。近年、表面検査装置の使用者の要求する欠陥検出の精度が高くなり、φ0.1[mm]以下の微細な欠陥を検出する必要が生じている。本発明の検査ヘッド1においては、投受光ファイバ11の熔融延伸部11cにより、検査光の射出及び反射光の受光が行えるため、スポット径を大きくする必要がなく、焦点を最小値で使用することができる。このため、取得する二次元画像が鮮明になり、微細な欠陥を検出することができる。   Next, the operation of the inspection head 1 will be described. FIG. 3 is a schematic plan view showing the end face 11f of the melt-extending portion 11c. The light projecting / receiving fiber 11 receives the inspection light and receives the reflected light at the melt extending portion 11c. The optical fiber of the inspection head in the conventional surface inspection apparatus is divided into a light projecting fiber for guiding the inspection light and a light receiving fiber for guiding the reflected light, and a plurality of light receiving fibers are provided around one light projecting fiber. Arranged and used. In this case, in order to receive the reflected light reflected by the inner peripheral surface 100a of the inspection object 100 with the light receiving fiber, the focal point connected by the inner peripheral surface 100a is shifted, and the spot diameter irradiated on the inner peripheral surface 100a is increased. Thus, the reflected light is adjusted to enter the light receiving fiber. However, when the spot diameter is increased, the acquired two-dimensional image tends to be unclear. In recent years, the accuracy of defect detection required by users of surface inspection apparatuses has increased, and it has become necessary to detect minute defects of φ0.1 [mm] or less. In the inspection head 1 of the present invention, since the inspection light can be emitted and the reflected light can be received by the melt extending portion 11c of the light projecting / receiving fiber 11, it is not necessary to increase the spot diameter, and the focus is used at the minimum value. Can do. For this reason, the acquired two-dimensional image becomes clear and a fine defect can be detected.

図4にセンサヘッド2の断面図を示す。センサヘッド2の熔融延伸部11cの端面11fは、端面11fに入射する検査光Lの法線方向Nに対してθ2傾いている。これにより、端面11fで反射した検査光Lがフォトディテクタ15へ入射することを防止している。一方、端面11fをθ2傾けたことで端面11fから射出後の検査光の光路が軸線AXからずれてしまう。これを防止するため、端面11fに入射する検査光Lの入射方向をセンサヘッド2の軸線AX方向に対してθ1傾けることで、端面11fから射出された検査光の光路をセンサヘッド2の軸線AX方向に沿うように調整している。熔融延伸部11cの端部は、ファイバ保持筒12に対してθ1、θ2の角度を保つように固定される。これにより、センサヘッド2と、ミラー保持筒3との相対的な移動、回転による内周面100aの検査も可能となる。一例として、θ1、θ2、θ3は、それぞれ3°、8°、79°である。   FIG. 4 shows a cross-sectional view of the sensor head 2. The end surface 11f of the melt extending portion 11c of the sensor head 2 is inclined by θ2 with respect to the normal direction N of the inspection light L incident on the end surface 11f. Thereby, the inspection light L reflected by the end face 11 f is prevented from entering the photodetector 15. On the other hand, tilting the end surface 11f by θ2 shifts the optical path of the inspection light after exiting from the end surface 11f from the axis AX. In order to prevent this, the incident direction of the inspection light L incident on the end surface 11f is inclined by θ1 with respect to the direction of the axis AX of the sensor head 2, so that the optical path of the inspection light emitted from the end surface 11f is changed to the axis AX of the sensor head 2. It is adjusted along the direction. The end of the melt extending portion 11c is fixed so as to maintain the angles θ1 and θ2 with respect to the fiber holding cylinder 12. As a result, the inner peripheral surface 100a can be inspected by relative movement and rotation between the sensor head 2 and the mirror holding cylinder 3. As an example, θ1, θ2, and θ3 are 3 °, 8 °, and 79 °, respectively.

本発明は、上述した形態に限定されることなく、種々の形態にて実施することができる。例えば、本形態では、円筒状の内周面100aの検査に適用したが、これに限られず例えば、ミラー保持筒3を回転させずに軸線AX方向へ移動させつつ、軸線AX方向と直交する方向へも移動させることにより平面状の表面を有する被検査物の検査装置として利用することもできる。   The present invention is not limited to the above-described form and can be implemented in various forms. For example, in this embodiment, the present invention is applied to the inspection of the cylindrical inner peripheral surface 100a. However, the present invention is not limited to this. For example, the mirror holding cylinder 3 is moved in the axis AX direction without rotating, and the direction orthogonal to the axis AX direction is used. It can also be used as an inspection device for an inspection object having a flat surface by moving the surface.

1 検査ヘッド
2 センサヘッド
3 ミラー保持筒
11 投受光ファイバ
11c 熔融延伸部
11f 端面
12 ファイバ保持筒
14 レーザーダイオード(光源)
15 フォトディテクタ(検出手段)
100 被検査物
100a 内周面
AX 軸線
DESCRIPTION OF SYMBOLS 1 Inspection head 2 Sensor head 3 Mirror holding | maintenance cylinder 11 Light transmitting / receiving fiber 11c Melt extending part 11f End surface 12 Fiber holding cylinder 14 Laser diode (light source)
15 Photodetector (detection means)
100 Inspected object 100a Inner peripheral surface AX axis

Claims (3)

光源から射出された検査光を導いて被検査物の表面に投光し、その反射光を受光して反射光の強度を検出する検出手段に反射光を導く投受光ファイバを有し、前記検出手段の検出結果に基づいて前記被検査物の表面を検査する表面検査装置の検査ヘッドであって、
前記投受光ファイバが、2本の光ファイバの一部を熔融延伸接合した熔融延伸部を有する光ファイバカプラであり、前記熔融延伸部から分岐した一方の光ファイバは前記光源からの検査光を導き、他方の光ファイバは前記検出手段に反射光を導き、前記熔融延伸部の端面から検査光が前記被検査物の表面に投光され、その反射光を前記端面が受光する表面検査装置の検査ヘッド。
A light-receiving / receiving fiber that guides the inspection light emitted from the light source, projects the light onto the surface of the object to be inspected, and receives the reflected light to detect the intensity of the reflected light; An inspection head of a surface inspection apparatus that inspects the surface of the object to be inspected based on the detection result of the means,
The light projecting / receiving fiber is an optical fiber coupler having a melt-stretched portion obtained by melt-stretching a part of two optical fibers, and one optical fiber branched from the melt-stretched portion guides inspection light from the light source. The other optical fiber guides the reflected light to the detection means, the inspection light is projected onto the surface of the object to be inspected from the end face of the melt-drawn portion, and the end face receives the reflected light. head.
前記熔融延伸部の端面が、前記端面に入射する検査光の光路の法線方向に対して傾いている請求項1に記載の検査ヘッド。   The inspection head according to claim 1, wherein an end face of the melt extending portion is inclined with respect to a normal direction of an optical path of inspection light incident on the end face. 前記投受光ファイバを保持するファイバ保持筒を備え、
前記端面に入射する検査光の入射方向が前記ファイバ保持筒の軸線方向に対して傾いているとともに、前記端面から射出された検査光の光路が前記ファイバ保持筒の軸線方向に沿っている請求項2に記載の検査ヘッド。
A fiber holding cylinder for holding the light emitting and receiving fiber;
The incident direction of the inspection light incident on the end face is inclined with respect to the axial direction of the fiber holding cylinder, and the optical path of the inspection light emitted from the end face is along the axial direction of the fiber holding cylinder. 2. Inspection head according to 2.
JP2010221637A 2010-09-30 2010-09-30 Inspection head of surface inspection device Pending JP2012078133A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013147026A1 (en) 2012-03-29 2013-10-03 武田薬品工業株式会社 Aromatic ring compound

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JPS629230A (en) * 1985-07-08 1987-01-17 Agency Of Ind Science & Technol Waveguide type photosensor
JPH0798384A (en) * 1993-04-28 1995-04-11 Sumitomo Wiring Syst Ltd Optical fiber sensor
JPH07151934A (en) * 1993-11-26 1995-06-16 Namiki Precision Jewel Co Ltd Optical collimator fiber and production of collimator fiber
JP2006242641A (en) * 2005-03-01 2006-09-14 Sumitomo Electric Ind Ltd Photo-detecting device and light source module
JP2007147324A (en) * 2005-11-24 2007-06-14 Kirin Techno-System Corp Surface inspection device

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Publication number Priority date Publication date Assignee Title
JPS629230A (en) * 1985-07-08 1987-01-17 Agency Of Ind Science & Technol Waveguide type photosensor
JPH0798384A (en) * 1993-04-28 1995-04-11 Sumitomo Wiring Syst Ltd Optical fiber sensor
JPH07151934A (en) * 1993-11-26 1995-06-16 Namiki Precision Jewel Co Ltd Optical collimator fiber and production of collimator fiber
JP2006242641A (en) * 2005-03-01 2006-09-14 Sumitomo Electric Ind Ltd Photo-detecting device and light source module
JP2007147324A (en) * 2005-11-24 2007-06-14 Kirin Techno-System Corp Surface inspection device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013147026A1 (en) 2012-03-29 2013-10-03 武田薬品工業株式会社 Aromatic ring compound

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