JP2012069742A - Mounting method and mounting apparatus for electronic component - Google Patents

Mounting method and mounting apparatus for electronic component Download PDF

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JP2012069742A
JP2012069742A JP2010213358A JP2010213358A JP2012069742A JP 2012069742 A JP2012069742 A JP 2012069742A JP 2010213358 A JP2010213358 A JP 2010213358A JP 2010213358 A JP2010213358 A JP 2010213358A JP 2012069742 A JP2012069742 A JP 2012069742A
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mounting
electronic component
bump
bumps
mounting substrate
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Yasuhiro Hanawa
康弘 塙
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NEC Corp
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NEC Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75Apparatus for connecting with bump connectors or layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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Abstract

PROBLEM TO BE SOLVED: To check displacement including rotational deviation, that is twist, of electronic components in a plane vertical to a mounting direction before bonding.SOLUTION: A mounting method comprises the steps of: holding an electronic component 22 having ball-shaped bumps 25 on a surface thereof, in a placing head 20; displacing the placing head toward a mounting board while positioning of both the electronic component and the mounting board are conducted so as to press the bumps onto electrodes formed on a mounting surface of the mounting board; and bonding the bumps thereto by fusing the bumps in a state of pressure contact. When the electronic component held in the placing head is positioned and applied pressure contact against the mounting board, the placing head is subjected to two loads in a same direction, which are generated in a plane vertical to a mounting direction, and the two loads are measured by load measuring means S arranged at two separate points in the vertical plane so that displacement of the bump and the electrode are detected.

Description

本発明は、電子部品(半導体チップ等)を実装基板にフリップチップ実装するための実装方法及び装置に関するものである。   The present invention relates to a mounting method and apparatus for flip-chip mounting an electronic component (such as a semiconductor chip) on a mounting substrate.

実装基板上に電子部品を実装する方法のひとつとして、フリップチップ実装が知られている。フリップチップ実装とは、半導体チップ表面上の電極パッドにバンプと呼ばれる金属突起を形成し、チップをフリップ(裏返す)することで、実装基板の電極とチップバンプ部とを接続する方法である。   Flip chip mounting is known as one method for mounting electronic components on a mounting substrate. Flip chip mounting is a method of connecting electrodes on a mounting substrate and chip bump portions by forming metal protrusions called bumps on electrode pads on the surface of a semiconductor chip and flipping the chip.

ところで、フリップチップ実装は、半導体チップの実装面に形成されたバンプを介して、チップ表面の電極パッドを実装基板の電極に直接接続するため、接続部分を外から認識することができない。そのため、チップの搭載位置ずれの検査は、実装基板への搭載後に専用の検査機を用いて行うことが一般的である。従って、位置ずれ不良品が検出されても、既に接合した後であるので、不良の電子部品はそのまま廃棄せざるを得ない。また、搭載機のトラブル起因による位置ずれの場合は、搭載から検査までタイムラグがあるため、その間、不良品を作り続ける危険がある。よって、位置ずれが発生したら直ちに位置ずれを検出する方法が期待されている。   By the way, in flip chip mounting, since the electrode pads on the chip surface are directly connected to the electrodes on the mounting substrate via bumps formed on the mounting surface of the semiconductor chip, the connection portion cannot be recognized from the outside. Therefore, the inspection of the chip mounting position deviation is generally performed using a dedicated inspection machine after mounting on the mounting substrate. Accordingly, even if a misalignment defective product is detected, it has already been joined, and the defective electronic component must be discarded as it is. In addition, in the case of misalignment due to a trouble with the mounting machine, there is a time lag from mounting to inspection, and there is a risk of continuously making defective products during that time. Therefore, a method for detecting a positional deviation immediately after the positional deviation occurs is expected.

電子部品を実装基板の実装面にバンプを介して接続する実装方法における搭載位置ずれ検査の方法としては、電子部品のバンプと実装基板の電極の接続部分が容易に認識できないために、X線検査機で電子部品の上方または下方から透過画像を確認する方法、搭載した電子部品の側面からバンプと電極を直接認識する方法、バンプと電極を認識する代わりに、実装基板の位置決めマークと電子部品の外形を認識することによりバンプと電極の位置ずれを推測する方法、等がある。   As a method for inspecting the mounting position in the mounting method in which the electronic component is connected to the mounting surface of the mounting substrate via the bump, the connection portion between the bump of the electronic component and the electrode of the mounting substrate cannot be easily recognized. The method of checking the transmission image from above or below the electronic component with a machine, the method of directly recognizing the bump and electrode from the side of the mounted electronic component, instead of recognizing the bump and electrode, the positioning mark of the mounting board and the electronic component There is a method of estimating the positional deviation between the bump and the electrode by recognizing the outer shape.

しかしながら、X線検査機により位置ずれを認識する方法は、高価なX線検査装置が必要となるため、製品のコストアップの要因となる。また、搭載時間以上に検査時間がかかってしまうため、生産性が低下してしまう。よって、多くの場合、抜き取り検査とならざるを得ない。   However, the method of recognizing misalignment with an X-ray inspection machine requires an expensive X-ray inspection apparatus, which increases the cost of the product. Further, since the inspection time is longer than the mounting time, productivity is lowered. Therefore, in many cases, it must be a sampling inspection.

また、搭載した電子部品の側面から接合状態を認識する方法は、電子部品の周囲に観測用光学系を配置するスペースが必要となり、電子部品周辺の実装密度が低下するという課題がある。また、4方向から確認するため、搭載時間以上に検査時間がかかってしまい、X線検査機を用いる場合と同様に、抜き取り検査とならざるを得ない場合が多い。   In addition, the method of recognizing the bonding state from the side surface of the mounted electronic component requires a space for arranging the observation optical system around the electronic component, and there is a problem that the mounting density around the electronic component is reduced. Further, since confirmation is performed from four directions, it takes an inspection time longer than the mounting time, and in many cases, a sampling inspection is unavoidable as in the case of using an X-ray inspection machine.

また、バンプと電極を認識する代わりに、実装基板の位置決めマークと電子部品の外形を認識することにより、バンプと電極の位置ずれを推測する方法は、計測したバンプと電極との位置ずれ量に電子部品のダイシング精度が含まれる関係上、微細化の進展するバンプと電極の位置ずれ計測では測定誤差が大きくなってしまう。   In addition, instead of recognizing bumps and electrodes, the method of estimating the displacement of bumps and electrodes by recognizing the positioning marks on the mounting board and the external shape of the electronic component is based on the measured amount of displacement between the bumps and electrodes. Due to the dicing accuracy of electronic components, measurement errors increase in the measurement of positional deviations between bumps and electrodes, which are increasingly miniaturized.

また、上記3つの方法は、搭載接合後に検査を行うため、位置ずれ不良が発見できたとしても、その電子部品は廃棄しなければならない。さらに、搭載接合工程から位置ずれ検査工程までのタイムラグがあり、搭載機のトラブル起因による位置ずれが発生しても、そのトラブルの発見が遅れてしまい、その間、不良品をつくり続けてしまうという課題もある。   Further, since the above three methods perform inspection after mounting and joining, even if a misalignment is found, the electronic component must be discarded. In addition, there is a time lag from the mounting joining process to the misalignment inspection process, and even if misalignment due to the trouble of the mounting machine occurs, the discovery of the trouble is delayed, and during that time, it continues to produce defective products There is also.

一方、上述した検査方法の課題を解消することの可能な技術として、特許文献1に、基板を保持する基板保持部と、電子部品を保持する保持ヘッドと、保持ヘッドまたは基板保持部に取り付けられて、電子部品の装着方向に略垂直でかつ互いに略直交する2方向の水平荷重を受けて電圧を発生する2つの圧電素子を装着方向に重ねて有する荷重センサと、荷重センサにより検出される前記2方向の水平荷重の値を座標値とする2次元空間上の位置と、予め設定されている前記2次元空間上の許容範囲とを比較して、電子部品の装着異常を検出する装着異常検出部と、を備える電子部品装着装置の記載がなされている。   On the other hand, as a technique capable of solving the problems of the inspection method described above, Patent Document 1 discloses a substrate holding unit that holds a substrate, a holding head that holds an electronic component, and a holding head or a substrate holding unit. A load sensor having two piezoelectric elements that generate a voltage in response to a horizontal load in two directions substantially perpendicular to the mounting direction of the electronic component and substantially perpendicular to each other, and the load sensor detects the load sensor. A mounting abnormality detection that detects a mounting abnormality of an electronic component by comparing a position in a two-dimensional space having a horizontal load value in two directions as a coordinate value and a preset allowable range in the two-dimensional space. And an electronic component mounting apparatus including a unit.

特開2005−19956号公報Japanese Patent Laid-Open No. 2005-19956

特許文献1に記載された電子部品装着装置によれば、例えば、保持ヘッド(搭載ヘッド)に作用する、電子部品の装着方向(Z方向)に略垂直でかつ互いに略直交する2方向(X方向及びY方向)の水平荷重を測定することができるので、その水平荷重のデータから、電子部品の表面のバンプと実装基板の電極とのX方向及びY方向の位置ずれを検出することも可能であると思われる。   According to the electronic component mounting apparatus described in Patent Literature 1, for example, two directions (X direction) that act on the holding head (mounting head) and are substantially perpendicular to the mounting direction (Z direction) of the electronic component and substantially orthogonal to each other. Since the horizontal load in the Y and Y directions can be measured, it is also possible to detect the positional deviation in the X and Y directions between the bumps on the surface of the electronic component and the electrodes on the mounting board from the horizontal load data. It appears to be.

しかし、実際のバンプと電極の位置ずれには、X方向の位置ずれやY方向の位置ずれの他に、回転方向の位置ずれ(捩れ)も存在する可能性があり、特許文献1に記載された技術によっても、そのような回転方向の位置ずれまでは検出できないという問題があることが分かった。   However, actual positional deviation between the bump and the electrode may include positional deviation (twist) in the rotation direction in addition to positional deviation in the X direction and positional deviation in the Y direction. Even with this technique, it has been found that there is a problem that even such positional deviation in the rotational direction cannot be detected.

本発明は、上記事情を考慮し、電子部品の装着方向に垂直な面内における位置ずれを、捩れも含めて接合前に検査し得る電子部品の実装方法及び装置を提供することを目的とする。   In view of the above circumstances, an object of the present invention is to provide an electronic component mounting method and apparatus capable of inspecting positional displacement in a plane perpendicular to the mounting direction of the electronic component, including torsion, before joining. .

上記課題を解決するために、本発明の電子部品の実装方法は、表面に配列された複数の電極パッドにそれぞれボール状のバンプが形成された電子部品を、前記バンプを形成した面が実装基板の実装面に向くように搭載ヘッドに保持する工程と、前記電子部品と実装基板とを互いに位置決めしながら、前記搭載ヘッドを実装基板に向けて変位させることで、実装基板の実装面に形成された電極に前記バンプを加圧接触させる工程と、加圧接触させた状態で前記バンプを溶融させることにより、バンプを介して電子部品と実装基板とを電気的に接合する工程と、を備え、前記搭載ヘッドに保持した電子部品を実装基板に対して位置決めしながら加圧接触させた際に、前記搭載ヘッドに加わる搭載方向に対して垂直な面内に発生する同じ方向の2つの荷重を、前記垂直な面内において互いに離間した2箇所において測定することにより、前記バンプと電極との位置ずれを検出することを特徴とする。   In order to solve the above-described problems, an electronic component mounting method according to the present invention includes an electronic component in which ball-shaped bumps are respectively formed on a plurality of electrode pads arranged on the surface, and the surface on which the bumps are formed is a mounting substrate. The mounting head is formed on the mounting surface of the mounting substrate by displacing the mounting head toward the mounting substrate while positioning the electronic component and the mounting substrate relative to each other. A step of pressing and contacting the bump to the electrode, and a step of electrically bonding the electronic component and the mounting substrate via the bump by melting the bump in a pressed contact state, When the electronic components held on the mounting head are brought into pressure contact with the mounting substrate while being positioned, two of the same directions generated in a plane perpendicular to the mounting direction applied to the mounting head A load, by measuring in mutually spaced two places in the plane perpendicular to and detects the positional deviation between the bump and the electrode.

また、本発明の電子部品の実装装置は、表面に配列された複数の電極パッドにそれぞれボール状のバンプが形成された電子部品を、前記バンプを形成した面が実装基板の実装面に向くように保持する搭載ヘッドと、前記電子部品と実装基板とを互いに位置決めする手段と、前記搭載ヘッドを実装基板に向けて変位させることで、実装基板の実装面に形成された電極に前記バンプを加圧接触させる手段と、加圧接触させた状態で前記バンプを溶融させることにより、バンプを介して電子部品と実装基板とを電気的に接合する手段と、前記搭載ヘッドに保持した電子部品を実装基板に対して位置決めしながら加圧接触させた際に、前記搭載ヘッドに加わる搭載方向に対して垂直な面内に発生する同じ方向の2つの荷重を、前記垂直な面内において互いに離間した2箇所において測定する荷重測定手段と、を具備することを特徴とする。   In the electronic component mounting apparatus according to the present invention, an electronic component in which ball-like bumps are respectively formed on a plurality of electrode pads arranged on the surface is arranged such that the surface on which the bumps are formed faces the mounting surface of the mounting substrate. Mounting bumps, means for positioning the electronic component and the mounting board relative to each other, and displacing the mounting head toward the mounting board, thereby applying the bumps to the electrodes formed on the mounting surface of the mounting board. A means for pressing contact, a means for electrically joining the electronic component and the mounting substrate via the bump by melting the bump in a pressure contact state, and an electronic component held on the mounting head are mounted. Two loads in the same direction generated in a plane perpendicular to the mounting direction applied to the mounting head when pressed against the substrate while being positioned are applied in the vertical plane. Characterized in that it comprises a and a load measuring means for measuring at two points spaced are.

本発明に係る電子部品の実装方法及び装置によれば、電子部品を実装基板に接合する前の加圧している段階で、電子部品の表面のバンプと実装基板の電極との位置ずれを検出することができる。そのため、位置ずれを検出した場合でも、位置ずれした電子部品を再度搭載し直すことが可能となり、仕損を減らすことができる。また、位置ずれが発生した瞬間に直ちに位置ずれを検出できるため、搭載機トラブル等による不良品の作り続けを回避することができる。また、互いに離間した2箇所で同じ方向の2つの荷重を検出するので、2箇所の荷重検出値の差を利用して、電子部品の表面のバンプと実装基板の電極の搭載方向と垂直な面内における捩れ(θ)を検出することができる。   According to the electronic component mounting method and apparatus according to the present invention, the positional deviation between the bump on the surface of the electronic component and the electrode of the mounting substrate is detected at the stage of applying pressure before the electronic component is bonded to the mounting substrate. be able to. For this reason, even when a positional deviation is detected, it is possible to re-mount the electronic component that has been misaligned, thereby reducing the number of defects. In addition, since the positional deviation can be detected immediately at the moment when the positional deviation occurs, it is possible to avoid the continuous production of defective products due to a trouble with the mounting machine. In addition, since two loads in the same direction are detected at two locations separated from each other, a plane perpendicular to the mounting direction of the bumps on the surface of the electronic component and the electrodes on the mounting board is used by utilizing the difference between the two load detection values. It is possible to detect the torsion (θ) inside.

本発明の実施形態の電子部品の実装装置の要部概略構成を示す斜視図である。It is a perspective view which shows the principal part schematic structure of the mounting device of the electronic component of embodiment of this invention. 同実装装置の要部断面図である。It is principal part sectional drawing of the same mounting apparatus. 図2のA−A矢視図である。It is an AA arrow line view of FIG. 同装置の動作説明図で、バンプと電極の間にX方向の位置ずれがある場合を示す要部断面図である。It is operation | movement explanatory drawing of the apparatus, and is principal part sectional drawing which shows the case where there exists a position shift of a X direction between a bump and an electrode. 同装置の動作説明図で、バンプと電極の間に位置ずれがない場合を示す要部断面図である。It is operation | movement explanatory drawing of the apparatus, and is principal part sectional drawing which shows the case where there is no position shift between a bump and an electrode.

以下、本発明の実施形態について図面を参照して詳細に説明する。
図1は実施形態の実装装置の要部概略構成を示す斜視図、図2は同装置の要部断面図、図3は図2のA−A矢視図である。図4及び図5は同装置の動作説明図で、図4はバンプと電極の間にX方向の位置ずれがある場合、図5は位置ずれがない場合をそれぞれ示す要部断面図である。
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
FIG. 1 is a perspective view showing a schematic configuration of a main part of a mounting apparatus according to the embodiment, FIG. 2 is a cross-sectional view of the main part of the apparatus, and FIG. 4 and 5 are explanatory views of the operation of the apparatus. FIG. 4 is a cross-sectional view of the main part showing a case where there is a positional deviation in the X direction between the bump and the electrode, and FIG.

この実装装置は、図1〜図3に示すように、実装基板11を固定する基板ステージ10と、表面に配列された複数の電極パッド(不図示)にそれぞれボール状のバンプ25が形成された電子部品22を、バンプ25を形成した面が実装基板11の実装面に向くように保持する搭載ノズル21と、搭載ノズル21の上面と接した搭載ヘッド20と、搭載ノズル21を搭載ヘッド20の搭載ノズル接触面に押しつけ且つ搭載ヘッド20の中央方向へ搭載ノズル21を押しつける圧縮バネ23と、基板ステージ10に対して搭載ヘッド20を近接離間させる方向に移動させる搭載ヘッド移動機構(不図示)と、電子部品に対して実装基板を実装面に平行な方向の位置を位置決めする位置決め手段(不図示)と、を備えている。ここで、搭載ヘッド移動機構は、搭載ヘッド20を実装基板11に向けて変位させることで、実装基板11の実装面に形成された電極15にバンプ25を加圧接触させる手段に相当する。   In this mounting apparatus, as shown in FIGS. 1 to 3, ball-shaped bumps 25 are respectively formed on a substrate stage 10 for fixing the mounting substrate 11 and a plurality of electrode pads (not shown) arranged on the surface. The mounting nozzle 21 that holds the electronic component 22 so that the surface on which the bumps 25 are formed faces the mounting surface of the mounting substrate 11, the mounting head 20 in contact with the upper surface of the mounting nozzle 21, and the mounting nozzle 21 on the mounting head 20. A compression spring 23 that presses against the mounting nozzle contact surface and presses the mounting nozzle 21 toward the center of the mounting head 20; and a mounting head moving mechanism (not shown) that moves the mounting head 20 toward and away from the substrate stage 10. And positioning means (not shown) for positioning the mounting substrate in a direction parallel to the mounting surface with respect to the electronic component. Here, the mounting head moving mechanism corresponds to means for pressing the bumps 25 against the electrodes 15 formed on the mounting surface of the mounting substrate 11 by displacing the mounting head 20 toward the mounting substrate 11.

また、この実装装置は、さらに、加圧接触させた状態でバンプ25を溶融させることにより、バンプ25を介して電子部品22と実装基板11とを電気的に接合する手段(不図示)と、搭載ヘッド20に保持した電子部品22を実装基板11に対して位置決めしながら加圧接触させた際に、搭載ヘッド20に加わる搭載方向(Z方向)に対して垂直な面内に発生する互いに直交する第1の方向(X方向)と第2の方向(Y方向)の各荷重を測定する荷重測定手段Sと、を備えている。この場合、第1の方向(X方向)と第2の方向(Y方向)のいずれか一方の方向の荷重を測定する荷重測定手段Sが、いずれか他方の方向に互いに離間した2箇所に配置されている。   The mounting apparatus further includes means (not shown) for electrically joining the electronic component 22 and the mounting substrate 11 via the bumps 25 by melting the bumps 25 in a pressure contact state. When the electronic component 22 held by the mounting head 20 is pressed and contacted with the mounting substrate 11 while being positioned, they are perpendicular to each other and generated in a plane perpendicular to the mounting direction (Z direction) applied to the mounting head 20. Load measuring means S for measuring each load in the first direction (X direction) and the second direction (Y direction). In this case, the load measuring means S for measuring the load in one direction of the first direction (X direction) and the second direction (Y direction) are arranged at two positions separated from each other in the other direction. Has been.

荷重測定手段Sは、搭載ノズル21に加わる搭載方向(Z方向)に対して垂直方向に発生する力を圧縮バネ23を介して測定するもので、X方向に1個、Y方向に適当な間隔をあけて2個の合計で3個設けられており、X方向の1個の荷重測定手段Sxは、搭載ヘッド20に加わるX方向の力を検出し、Y方向の2個の荷重測定手段Sy1、Sy2は、搭載ヘッド20に加わるY方向の力をX方向に離れた2箇所で検出する。従って、回転方向であるθ方向の力を検出することができる。なお、荷重測定手段Sの配置は、Y方向に1個、X方向に適当な間隔をあけて2個配置してもよい。   The load measuring means S measures the force generated in the direction perpendicular to the mounting direction (Z direction) applied to the mounting nozzle 21 via the compression spring 23, one in the X direction and an appropriate interval in the Y direction. A total of two is provided with a gap of two, and one load measuring means Sx in the X direction detects a force in the X direction applied to the mounting head 20, and two load measuring means Sy1 in the Y direction. , Sy2 detects the force in the Y direction applied to the mounting head 20 at two locations separated in the X direction. Therefore, it is possible to detect the force in the θ direction that is the rotational direction. Note that one load measuring means S may be arranged in the Y direction and two at an appropriate interval in the X direction.

次に、図3及び図4を参照して電子部品の実装方法を説明する。
まず、パッケージ表面に配列された複数の電極パッド(不図示)にそれぞれボール状のバンプ25が形成された電子部品22を、バンプ25を形成した面が実装基板11の実装面に向くように搭載ノズル21で吸着して搭載ヘッド20に保持する。次に位置決め手段により、電子部品22のバンプ25と実装基板11の電極との位置が一致するように、実装基板11を実装面に平行な方向に位置決めする。
Next, an electronic component mounting method will be described with reference to FIGS.
First, an electronic component 22 in which ball-like bumps 25 are respectively formed on a plurality of electrode pads (not shown) arranged on the package surface is mounted so that the surface on which the bumps 25 are formed faces the mounting surface of the mounting substrate 11. The nozzle 21 adsorbs and holds it on the mounting head 20. Next, the mounting substrate 11 is positioned in a direction parallel to the mounting surface by the positioning means so that the positions of the bumps 25 of the electronic component 22 and the electrodes of the mounting substrate 11 coincide.

次に搭載ヘッド移動機構により、搭載ヘッド20を基板ステージ10方向へ移動させ、電子部品22のバンプ25と実装基板11の電極15を加圧力Fをかけて加圧接触させる。このとき、図4に示すように、実装基板11の電極15に対して電子部品22側のバンプ25がずれていると、搭載ヘッド20に加えた加圧力Fの分散荷重fの反力rは、電極15とバンプ25の接触位置において垂直方向(Z方向)の力rzと水平方向(X方向及びY方向)の力rx(ryは不図示)に分解され、搭載ノズル21には、全てのバンプ25と電極15の接触位置で発生した水平方向の力の総和が負荷される。   Next, the mounting head 20 is moved in the direction of the substrate stage 10 by the mounting head moving mechanism, and the bumps 25 of the electronic component 22 and the electrodes 15 of the mounting substrate 11 are pressed and brought into pressure contact with each other. At this time, as shown in FIG. 4, when the bump 25 on the electronic component 22 side is displaced with respect to the electrode 15 of the mounting substrate 11, the reaction force r of the distributed load f of the applied pressure F applied to the mounting head 20 is In the contact position between the electrode 15 and the bump 25, the force rz in the vertical direction (Z direction) and the force rx (ry is not shown) in the horizontal direction (X direction and Y direction) are disassembled. The sum of horizontal forces generated at the contact position between the bump 25 and the electrode 15 is loaded.

搭載ノズル21は、搭載ヘッド20に対して圧縮バネ23を介して水平方向の自由度があるため、搭載ノズル21に負荷される力により、搭載ノズル21が、搭載ヘッド20に対して移動し(移動量は搭載ノズル21に負荷される力を圧縮バネ23のバネ定数で除した値)、圧縮バネ23を変形させる。そして、圧縮バネ23の変形により、搭載ノズル21に負荷される力が、荷重測定手段Sにより測定される。   Since the mounting nozzle 21 has a degree of freedom in the horizontal direction with respect to the mounting head 20 via the compression spring 23, the mounting nozzle 21 moves relative to the mounting head 20 by the force applied to the mounting nozzle 21 ( The amount of movement is a value obtained by dividing the force applied to the mounting nozzle 21 by the spring constant of the compression spring 23), and the compression spring 23 is deformed. Then, the force applied to the mounting nozzle 21 due to the deformation of the compression spring 23 is measured by the load measuring means S.

例えば、実装基板11に対して電子部品22がX方向にずれている場合は、搭載ノズル21にはX方向の力が負荷され、その力の大きさは、X方向に配置されている荷重測定手段Sxで検出される。また、実装基板11に対して電子部品22がY方向にずれている場合は、搭載ノズル21にはY方向の力が負荷され、その力の大きさは、Y方向に配置されている2つの荷重測定手段Sy1、Sy2で検出される値の和となる。   For example, when the electronic component 22 is displaced in the X direction with respect to the mounting substrate 11, a force in the X direction is applied to the mounting nozzle 21, and the magnitude of the force is a load measurement arranged in the X direction. It is detected by means Sx. Further, when the electronic component 22 is displaced in the Y direction with respect to the mounting substrate 11, a force in the Y direction is applied to the mounting nozzle 21, and the magnitude of the force is two in the Y direction. This is the sum of the values detected by the load measuring means Sy1, Sy2.

また、実装基板11に対して電子部品22がθ方向(回転方向)にずれている場合は、搭載ノズル21にはθ方向の力が負荷され、その力の大きさは、Y方向に配置されている2つの荷重測定手段Sy1、Sy2で検出される値の差となる。   Further, when the electronic component 22 is displaced in the θ direction (rotation direction) with respect to the mounting substrate 11, a force in the θ direction is applied to the mounting nozzle 21, and the magnitude of the force is arranged in the Y direction. This is the difference between the values detected by the two load measuring means Sy1 and Sy2.

また、各方向のずれ量と、各荷重測定手段Sx,Sy1、Sy2により検出される搭載ノズル21に負荷される各方向の力の大きさとは相関関係があり、予めずれ量と、搭載ノズル21に負荷される力の関係の相関データを取得することにより、電子部品22を実装基板11に搭載する工程において、電子部品22のバンプ25と実装基板11の電極15が接触した時に各荷重測定手段S(Sx、Sy1、Sy2)の測定値を観測し、搭載ノズル21に負荷される力が検出されたら、その力の方向と大きさから、実装基板11と電子部品22の位置ずれ方向と位置ずれ量を算出し、電子部品22を把持したまま搭載ヘッド20を上昇させ、各方向(X、Y、θ)の位置ずれ量を位置決めステージで補正した後に再度、搭載ヘッド20を下降させ、電子部品22を実装基板11上に搭載する。その後、再度荷重力検出手段Sの測定値を観測し、搭載ノズル21に負荷される力が検出されなければ、電子部品22は精度良く実装基板11に搭載されていることとなり、搭載工程を完了する。   Further, the amount of deviation in each direction and the magnitude of the force in each direction applied to the mounting nozzle 21 detected by each load measuring means Sx, Sy1, Sy2 have a correlation, and the amount of deviation and the mounting nozzle 21 in advance are correlated. In the process of mounting the electronic component 22 on the mounting substrate 11 by acquiring the correlation data of the relationship of the force applied to the load, each load measuring means when the bump 25 of the electronic component 22 and the electrode 15 of the mounting substrate 11 come into contact with each other. When the measured value of S (Sx, Sy1, Sy2) is observed, and the force applied to the mounting nozzle 21 is detected, the displacement direction and position of the mounting substrate 11 and the electronic component 22 are determined from the direction and magnitude of the force. The amount of deviation is calculated, the mounting head 20 is raised while holding the electronic component 22, the position deviation amount in each direction (X, Y, θ) is corrected by the positioning stage, and the mounting head 20 is lowered again. , Mounting the electronic component 22 on the mounting substrate 11. Thereafter, the measurement value of the load force detection means S is observed again, and if the force applied to the mounting nozzle 21 is not detected, the electronic component 22 is accurately mounted on the mounting substrate 11 and the mounting process is completed. To do.

バンプ25と電極15の位置ずれがない場合は、図5に示すように、搭載ヘッドに付加した加圧力Fの分散荷重fと反力rとが搭載方向(Z方向)に釣り合った関係になることで、全ての分散荷重fが基板ステージ10に伝えられ、搭載ヘッド20には搭載方向に対して垂直方向の力は発生せず、よって荷重測定手段Sは3個とも力を検出しない。   When there is no positional deviation between the bump 25 and the electrode 15, as shown in FIG. 5, the distributed load f of the applied force F applied to the mounting head and the reaction force r are balanced in the mounting direction (Z direction). As a result, all the distributed loads f are transmitted to the substrate stage 10, and no force is generated in the mounting head 20 in the direction perpendicular to the mounting direction. Therefore, the load measuring means S does not detect any force.

以上のように、本実施形態の実装装置及び方法によれば、電子部品22を実装基板11に接合する前の加圧している段階で、電子部品22の表面のバンプ25と実装基板11の電極15との位置ずれを検出することができる。そのため、位置ずれを検出した場合でも、位置ずれした電子部品22を再度搭載し直すことが可能となり、仕損を減らすことができる。また、位置ずれが発生した瞬間に直ちに位置ずれを検出できるため、搭載機トラブル等による不良品の作り続けを回避することができる。   As described above, according to the mounting apparatus and method of the present embodiment, the bump 25 on the surface of the electronic component 22 and the electrode of the mounting substrate 11 are applied at the stage of pressurization before the electronic component 22 is bonded to the mounting substrate 11. 15 can be detected. For this reason, even when a positional shift is detected, the electronic component 22 that has been shifted can be mounted again, and the loss of work can be reduced. In addition, since the positional deviation can be detected immediately at the moment when the positional deviation occurs, it is possible to avoid the continuous production of defective products due to a trouble with the mounting machine.

また、互いに離間した2箇所で同じ方向の2つの荷重を検出するので、2箇所の荷重検出値の差を利用して、電子部品22の表面のバンプ25と実装基板11の電極15の搭載方向と垂直な面内における捩れ(θ)を検出することができる。   In addition, since two loads in the same direction are detected at two locations separated from each other, the mounting direction of the bumps 25 on the surface of the electronic component 22 and the electrodes 15 on the mounting substrate 11 is made using the difference between the two load detection values. Torsion (θ) in a plane perpendicular to the axis can be detected.

11 実装基板
15 電極
20 搭載ヘッド
22 電子部品
25 バンプ
S 荷重測定手段
11 Mounting board 15 Electrode 20 Mounting head 22 Electronic component 25 Bump S Load measuring means

Claims (4)

表面に配列された複数の電極パッドにそれぞれボール状のバンプが形成された電子部品を、前記バンプを形成した面が実装基板の実装面に向くように搭載ヘッドに保持する工程と、
前記電子部品と実装基板とを互いに位置決めしながら、前記搭載ヘッドを実装基板に向けて変位させることで、実装基板の実装面に形成された電極に前記バンプを加圧接触させる工程と、
加圧接触させた状態で前記バンプを溶融させることにより、バンプを介して電子部品と実装基板とを電気的に接合する工程と、
を備え、
前記搭載ヘッドに保持した電子部品を実装基板に対して位置決めしながら加圧接触させた際に、前記搭載ヘッドに加わる搭載方向に対して垂直な面内に発生する同じ方向の2つの荷重を、前記垂直な面内において互いに離間した2箇所において測定することにより、前記バンプと電極との位置ずれを検出することを特徴とする電子部品の実装方法。
A step of holding an electronic component in which a ball-shaped bump is formed on each of a plurality of electrode pads arranged on the surface on a mounting head so that a surface on which the bump is formed faces a mounting surface of the mounting substrate;
While pressing the electronic component and the mounting substrate relative to each other, by displacing the mounting head toward the mounting substrate, pressurizing the bumps to the electrodes formed on the mounting surface of the mounting substrate; and
A step of electrically bonding the electronic component and the mounting substrate via the bump by melting the bump in a pressure contact state;
With
When the electronic component held by the mounting head is brought into pressure contact with the mounting substrate while being positioned, two loads generated in a plane perpendicular to the mounting direction applied to the mounting head are the same. A method of mounting an electronic component, wherein a positional deviation between the bump and the electrode is detected by measuring at two positions separated from each other in the vertical plane.
前記搭載ヘッドに保持した電子部品を実装基板に対して位置決めしながら加圧接触させた際に、前記搭載ヘッドに加わる搭載方向に対して垂直な面内に発生する互いに直交する第1の方向と第2の方向の各荷重を測定し、しかも、前記第1の方向と第2の方向のいずれか一方の方向の荷重は、いずれか他方の方向に互いに離間した2箇所において測定することにより、前記バンプと電極との位置ずれを検出することを特徴とする請求項1に記載の電子部品の実装方法。   A first direction perpendicular to each other generated in a plane perpendicular to the mounting direction applied to the mounting head when the electronic component held by the mounting head is brought into pressure contact with the mounting substrate while being positioned; By measuring each load in the second direction, and by measuring the load in one direction of the first direction and the second direction at two locations separated from each other in the other direction, The electronic component mounting method according to claim 1, wherein a positional deviation between the bump and the electrode is detected. 表面に配列された複数の電極パッドにそれぞれボール状のバンプが形成された電子部品を、前記バンプを形成した面が実装基板の実装面に向くように保持する搭載ヘッドと、
前記電子部品と実装基板とを互いに位置決めする手段と、
前記搭載ヘッドを実装基板に向けて変位させることで、実装基板の実装面に形成された電極に前記バンプを加圧接触させる手段と、
加圧接触させた状態で前記バンプを溶融させることにより、バンプを介して電子部品と実装基板とを電気的に接合する手段と、
前記搭載ヘッドに保持した電子部品を実装基板に対して位置決めしながら加圧接触させた際に、前記搭載ヘッドに加わる搭載方向に対して垂直な面内に発生する同じ方向の2つの荷重を、前記垂直な面内において互いに離間した2箇所において測定する荷重測定手段と、
を具備することを特徴とする電子部品の実装装置。
A mounting head for holding electronic components each having a ball-shaped bump formed on each of a plurality of electrode pads arranged on the surface so that the surface on which the bump is formed faces the mounting surface of the mounting substrate;
Means for positioning the electronic component and the mounting substrate relative to each other;
Means for pressing and contacting the bumps to the electrodes formed on the mounting surface of the mounting substrate by displacing the mounting head toward the mounting substrate;
Means for electrically bonding the electronic component and the mounting substrate via the bumps by melting the bumps in a pressure contact state;
When the electronic component held by the mounting head is brought into pressure contact with the mounting substrate while being positioned, two loads generated in a plane perpendicular to the mounting direction applied to the mounting head are the same. Load measuring means for measuring at two points spaced apart from each other in the vertical plane;
An electronic component mounting apparatus comprising:
前記搭載ヘッドに保持した電子部品を実装基板に対して位置決めしながら加圧接触させる際に、前記搭載ヘッドに加わる搭載方向に対して垂直な面内に発生する互いに直交する第1の方向と第2の方向の各荷重を測定する荷重測定手段を有し、しかも、前記第1の方向と第2の方向のいずれか一方の方向の荷重を測定する荷重測定手段が、いずれか他方の方向に互いに離間した2箇所に配置されていることを特徴とする請求項3に記載の電子部品の実装装置。   A first direction and a first direction perpendicular to each other generated in a plane perpendicular to the mounting direction applied to the mounting head when the electronic component held by the mounting head is brought into pressure contact with the mounting substrate while being positioned. Load measuring means for measuring each load in the two directions, and the load measuring means for measuring the load in one of the first direction and the second direction is in either one of the directions. 4. The electronic component mounting apparatus according to claim 3, wherein the electronic component mounting apparatus is disposed at two positions spaced apart from each other.
JP2010213358A 2010-09-24 2010-09-24 Mounting method and mounting apparatus for electronic component Pending JP2012069742A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016039244A (en) * 2014-08-07 2016-03-22 富士ゼロックス株式会社 Determination device of relative position of light-emitting element, and manufacturing apparatus of light-emitting board and determination device of relative position of light-emitting element, and manufacturing apparatus of light-emitting board
CN112259481A (en) * 2020-11-13 2021-01-22 深圳市踏路科技有限公司 COB die bonder and COB die bonding method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016039244A (en) * 2014-08-07 2016-03-22 富士ゼロックス株式会社 Determination device of relative position of light-emitting element, and manufacturing apparatus of light-emitting board and determination device of relative position of light-emitting element, and manufacturing apparatus of light-emitting board
CN112259481A (en) * 2020-11-13 2021-01-22 深圳市踏路科技有限公司 COB die bonder and COB die bonding method

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