JP2011173198A - Mixed liquid supply device - Google Patents

Mixed liquid supply device Download PDF

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JP2011173198A
JP2011173198A JP2010038311A JP2010038311A JP2011173198A JP 2011173198 A JP2011173198 A JP 2011173198A JP 2010038311 A JP2010038311 A JP 2010038311A JP 2010038311 A JP2010038311 A JP 2010038311A JP 2011173198 A JP2011173198 A JP 2011173198A
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stock solution
tank
abrasive
mixed liquid
liquid
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Makoto Maejima
信 前嶋
Naoto Takada
直人 高田
Kentaro Wada
健太郎 和田
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Disco Corp
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Disco Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a mixed liquid supply device capable of accurately perceiving the remaining amount of abrasive stock solution in an abrasive stock solution tank with a simple structure. <P>SOLUTION: The mixed liquid supply device supplying a machining device with mixed liquid in which liquid and abrasive are mixed includes: a weight measuring device; the abrasive stock solution tank for storing the abrasive stock solution loaded onto the weight measuring device; a dilution tank preparing the mixed liquid by mixing the liquid with the abrasive stock solution in a predetermined concentration; a supply tank storing the mixed liquid supplied to the machining device; an abrasive stock solution supply route for supplying the abrasive stock solution from the abrasive stock solution tank to the dilution tank; a first mixed liquid supply route for supplying the mixed liquid from the dilution tank to the supply tank; a second mixed liquid supply route for supplying the mixed liquid stored in the supply tank to the machining device; a control means to which the weight measuring device is connected; and a remaining amount display means connected to the control means, and displaying the remaining amount of the abrasive stock solution in the abrasive stock solution tank. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、研磨装置等の加工装置に砥粒と液体からなる混合液(スラリー)を供給する混合液供給装置に関する。   The present invention relates to a mixed liquid supply apparatus that supplies a mixed liquid (slurry) composed of abrasive grains and liquid to a processing apparatus such as a polishing apparatus.

IC、LSI等の複数のデバイスが分割予定ラインによって区画されて表面に形成された半導体ウエーハは、研削装置によって裏面が研削されて所定の厚みに加工された後、ダイシング装置等の分割装置によって個々のデバイスに分割され、分割されたデバイスは携帯電話、パソコン等の電気機器に広く利用されている。   A semiconductor wafer in which a plurality of devices such as IC, LSI, etc. are defined on the surface by dividing by a dividing line, the back surface is ground by a grinding device and processed to a predetermined thickness, and then individually processed by a dividing device such as a dicing device. These devices are widely used for electric devices such as mobile phones and personal computers.

近年、半導体デバイスの小型化、薄型化の要請から、半導体ウエーハの薄型化が要求されている。半導体ウエーハの裏面を研削すると、ウエーハの裏面に研削歪が残存してデバイスの抗折強度が低下することから、研削により生じた研削歪の除去や抗折強度の向上を目的として、研削後のウエーハの裏面をCMP(Chemical Mechanical Polishing)によって研磨加工することが提案され実用化されている(例えば、特開平10−329009号公報参照)。   In recent years, there has been a demand for thinner semiconductor wafers due to demands for smaller and thinner semiconductor devices. Grinding the backside of a semiconductor wafer leaves grinding strain on the backside of the wafer and lowers the device's bending strength. For the purpose of removing grinding strain caused by grinding and improving the bending strength, It has been proposed and put to practical use that the back surface of a wafer is polished by CMP (Chemical Mechanical Polishing) (see, for example, JP-A-10-329209).

CMPは、研磨パッドと半導体ウエーハ等の板状物との間に砥粒と液体からなる混合液(スラリー)を供給しつつ研磨パッドと板状物とをそれぞれ回転させながら相対的に摺動させることで遂行される。   In CMP, while a mixed liquid (slurry) composed of abrasive grains and liquid is supplied between a polishing pad and a plate-like material such as a semiconductor wafer, the polishing pad and the plate-like material are relatively slid while rotating. It is accomplished by that.

このようなCMPを実施するためには、砥粒と液体からなる混合液を研磨装置等の加工装置に供給する混合液供給装置が必要である。また、砥粒と液体の混合液を高圧で噴射することで被加工物を切断するウォータージェット装置にも、混合液を供給する混合液供給装置が備えられている。   In order to carry out such CMP, a mixed liquid supply device that supplies a mixed liquid composed of abrasive grains and liquid to a processing apparatus such as a polishing apparatus is required. Also, a water jet apparatus that cuts a workpiece by spraying a mixed liquid of abrasive grains and liquid at a high pressure is provided with a mixed liquid supply apparatus that supplies the mixed liquid.

こうした混合液供給装置では、研磨剤が高い濃度で液体と混合された研磨剤原液を研磨剤原液タンク内に入れてから、所望の濃度の希釈混合液を自動的に作成し、この希釈混合液を研磨装置等の加工装置に供給する。   In such a mixed solution supply device, a polishing agent stock solution mixed with a liquid with a high concentration of polishing agent is placed in the polishing agent stock solution tank, and then a diluted mixing solution having a desired concentration is automatically created. Is supplied to a processing apparatus such as a polishing apparatus.

よって、研磨剤原液タンク内の研磨剤原液の残量がなくなってしまえば、混合液を作ることができなくなり、延いては加工装置の稼動停止に繋がってしまうため、研磨剤原液タンク内の研磨剤原液の残量を正確に把握することが重要である。   Therefore, if there is no remaining amount of the abrasive stock solution in the abrasive stock solution tank, it will not be possible to make a mixed solution, which will eventually lead to the shutdown of the processing equipment. It is important to accurately grasp the remaining amount of the drug stock solution.

従来の混合液供給装置では、研磨剤原液タンク内に複数の液面センサを装着して、タンク内の研磨剤原液の残量がタンクの底近くに装着された液面センサを下回った場合、アラーム等で作業者に残量が残り少なくなったことを知らせるような構成となっている。   In the conventional mixed liquid supply device, when a plurality of liquid level sensors are mounted in the abrasive stock solution tank, and the remaining amount of the abrasive stock solution in the tank falls below the liquid level sensor mounted near the bottom of the tank, It is configured to notify the operator that the remaining amount is low by an alarm or the like.

特開平10−329009号公報Japanese Patent Laid-Open No. 10-329909

上述した従来の混合液供給装置における原液残量検出機構では、液面センサと液面センサの間に研磨剤原液の液面が位置する場合、正確な研磨剤原液の残量を把握することができない。設置する液面センサの数を増やしても原液残量を精密に測定することは困難である上、コスト増を招き、更には液面センサの故障というリスクも増えることとなる。   In the conventional stock solution remaining amount detection mechanism in the conventional mixed solution supply apparatus described above, when the level of the abrasive stock solution is located between the liquid level sensor and the liquid level sensor, it is possible to accurately grasp the remaining amount of the abrasive stock solution. Can not. Even if the number of liquid level sensors to be installed is increased, it is difficult to accurately measure the remaining amount of the stock solution. In addition, the cost increases and the risk of failure of the liquid level sensor also increases.

本発明はこのような点に鑑みてなされたものであり、その目的とするところは、簡単な構造で研磨剤原液タンク内の研磨剤原液の残量を正確に把握することが可能な混合液供給装置を提供することである。   The present invention has been made in view of the above points, and the object of the present invention is to provide a mixed liquid that can accurately grasp the remaining amount of the abrasive stock solution in the abrasive stock solution tank with a simple structure. It is to provide a feeding device.

本発明によると、加工装置に液体と研磨剤が混合された状態からなる混合液を供給する混合液供給装置であって、重量測定器と、該重量測定器上に搭載された研磨剤原液を貯留する研磨剤原液タンクと、液体と研磨剤原液を所定の濃度に混合して混合液を作成する希釈タンクと、該加工装置に供給する混合液を貯留する供給タンクと、該研磨剤原液タンクから該希釈タンクへ研磨剤原液を供給する研磨剤原液供給経路と、該希釈タンクから該供給タンクに混合液を供給する第1混合液供給経路と、該供給タンク内に貯留された混合液を該加工装置へ供給する第2混合液供給経路と、該重量測定器が接続された制御手段と、該制御手段に接続され、該研磨剤原液タンク内の研磨剤原液の残量を表示する残量表示手段と、を具備したことを特徴とする混合液供給装置が提供される。   According to the present invention, there is provided a mixed liquid supply apparatus for supplying a mixed liquid in a state in which a liquid and an abrasive are mixed to a processing apparatus, comprising: a weight measuring device; and an abrasive undiluted solution mounted on the weight measuring device. A polishing stock solution tank for storing, a dilution tank for mixing the liquid and the polishing stock solution at a predetermined concentration to create a mixed solution, a supply tank for storing the mixed solution supplied to the processing apparatus, and the polishing agent stock solution tank A polishing agent stock solution supply path for supplying a polishing agent stock solution from the dilution tank to the dilution tank, a first mixed solution supply path for supplying the mixed solution from the dilution tank to the supply tank, and a mixed solution stored in the supply tank. A second mixed solution supply path for supplying to the processing apparatus; a control unit connected to the weight measuring device; and a remaining unit that is connected to the control unit and displays the remaining amount of the abrasive stock solution in the abrasive stock solution tank. And a quantity display means. That mixture supply device is provided.

本発明によると、研磨剤原液タンクが重量測定器により支持されているため、研磨剤原液タンクの総重量から予め記憶しているタンク本体の重量を減算すれば、容易に研磨剤原液の正確な残量を把握することができる。   According to the present invention, since the abrasive stock solution tank is supported by the weight measuring device, if the weight of the tank body stored in advance is subtracted from the total weight of the abrasive stock solution tank, the exact amount of the abrasive stock solution can be easily obtained. The remaining amount can be grasped.

このように、常に研磨剤原液の補充タイミングを正確に予測することができるとともに、残った研磨剤原液でどれだけの加工が可能か否かを正確に予測することもできる。また、希釈タンク側に送られる研磨剤原液の量も把握することができるため、希釈タンク側の濃度調整手段の不具合のチェック機能を付加させることもできる。   In this way, it is possible to always accurately predict the replenishment timing of the abrasive stock solution, and to accurately predict how much processing can be performed with the remaining abrasive stock solution. In addition, since it is possible to grasp the amount of the abrasive stock solution sent to the dilution tank side, it is possible to add a function for checking the malfunction of the concentration adjusting means on the dilution tank side.

本発明実施形態に係る混合液供給装置の全体構成図である。1 is an overall configuration diagram of a mixed liquid supply apparatus according to an embodiment of the present invention.

以下、本発明の実施形態を図面を参照して詳細に説明する。図1を参照すると、本発明実施形態に係る混合液供給装置の全体構成図が示されている。符号2で示された混合液供給装置は、研磨装置4に液体と研磨剤が混合された混合液(スラリー)を供給する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Referring to FIG. 1, there is shown an overall configuration diagram of a mixed liquid supply apparatus according to an embodiment of the present invention. The liquid mixture supply apparatus indicated by reference numeral 2 supplies the polishing apparatus 4 with a liquid mixture (slurry) in which a liquid and an abrasive are mixed.

混合液供給装置2の研磨剤原液タンク6内には、純水等の液体とシリカ等の研磨剤が混合された濃度の高い研磨剤原液8を収容している。10は希釈タンクであり、研磨剤原液タンク6内の濃度の高い研磨剤原液が管路(研磨剤原液供給路)14を介して希釈タンク10内に供給されるとともに、液体供給路16を介して純水等の液体が希釈タンク10内に供給され、研磨剤原液8が液体により希釈され、希釈タンク10は濃度が希釈されたスラリー(混合液)8を収容する。   An abrasive stock solution tank 6 of the mixed solution supply device 2 contains a high concentration abrasive stock solution 8 in which a liquid such as pure water and an abrasive such as silica are mixed. Reference numeral 10 denotes a dilution tank, and a high concentration of abrasive stock solution in the abrasive stock solution tank 6 is supplied into the dilution tank 10 through a pipe line (abrasive stock solution supply passage) 14 and also through a liquid supply passage 16. Then, a liquid such as pure water is supplied into the dilution tank 10, the stock solution 8 of the abrasive is diluted with the liquid, and the dilution tank 10 contains the slurry (mixed liquid) 8 having a diluted concentration.

希釈タンク10内には図示しない攪拌装置が設置されており、この攪拌装置で研磨剤源液8と液体供給路16を介して送られた液体とを攪拌して、濃度が希釈された一様濃度のスラリー18とする。管路14にはポンプ20及び開閉弁22が挿入されている。一方、液体供給路16には流量調整弁24が挿入されている。   An agitator (not shown) is installed in the dilution tank 10. The agitator source liquid 8 and the liquid sent through the liquid supply path 16 are agitated by the agitator to uniformly dilute the concentration. A slurry 18 having a concentration is obtained. A pump 20 and an on-off valve 22 are inserted in the pipeline 14. On the other hand, a flow rate adjusting valve 24 is inserted into the liquid supply path 16.

希釈タンク10からは管路(第1混合液供給路)26を介して希釈された混合液(スラリー)18が供給タンク12に供給され、供給タンク12は濃度の希釈された混合液18を収容する。管路26にはポンプ28及び開閉弁30が挿入されている。   From the dilution tank 10, a diluted liquid (slurry) 18 is supplied to the supply tank 12 via a pipe line (first mixed liquid supply path) 26, and the supply tank 12 stores the diluted mixed liquid 18. To do. A pump 28 and an on-off valve 30 are inserted in the pipe line 26.

供給タンク12からは管路(第2混合液供給路)32を介して濃度の希釈された混合液(スラリー)18が研磨装置4に供給され、研磨装置4で半導体ウエーハ等の板状物の研磨が実施される。管路32にはポンプ34及び開閉弁36が挿入されている。   A liquid mixture (slurry) 18 having a diluted concentration is supplied from the supply tank 12 through a pipe line (second liquid mixture supply path) 32 to the polishing apparatus 4, and a plate-like object such as a semiconductor wafer is formed by the polishing apparatus 4. Polishing is performed. A pump 34 and an on-off valve 36 are inserted in the pipe line 32.

研磨剤原液タンク6は重量測定器38上に搭載されている。同様に、希釈タンク18も重量測定器40上に搭載されている。重量測定器38,40は制御手段(コントローラ)42に接続されている。   The abrasive stock solution tank 6 is mounted on the weight measuring device 38. Similarly, the dilution tank 18 is also mounted on the weight measuring device 40. The weight measuring devices 38 and 40 are connected to a control means (controller) 42.

制御手段42のメモリには予め研磨剤原液タンク6本体の重量が記憶されており、制御手段42では重量測定器38で測定した研磨剤原液8を含む研磨剤原液タンク6の総重量からタンク本体の重量を減算することにより、研磨剤原液8の正確な残量を算出することができ、この研磨剤原液の残量は液晶ディスプレイ等の残量表示手段44に表示される。   The weight of the abrasive stock solution tank 6 main body is stored in advance in the memory of the control means 42, and the control means 42 calculates the tank body from the total weight of the abrasive stock solution tank 6 including the abrasive stock solution 8 measured by the weight measuring device 38. Thus, the exact remaining amount of the abrasive stock solution 8 can be calculated, and the remaining amount of the abrasive stock solution is displayed on the remaining amount display means 44 such as a liquid crystal display.

供給タンク12には、複数の液面センサ46a,46b,46c,46dが設置されている。液面センサ46a〜46dは制御手段42に接続されており、供給タンク12内の混合液(スラリー)18の液面が液面センサ46cと46dの間に来た場合に、制御手段42で開閉弁30を開くとともにポンプ28を駆動して、希釈タンク10内の混合液(スラリー)18を供給タンク12内に供給する。   In the supply tank 12, a plurality of liquid level sensors 46a, 46b, 46c, 46d are installed. The liquid level sensors 46a to 46d are connected to the control means 42. When the liquid level of the mixed liquid (slurry) 18 in the supply tank 12 comes between the liquid level sensors 46c and 46d, the liquid level sensors 46a to 46d are opened and closed by the control means 42. The valve 30 is opened and the pump 28 is driven to supply the mixed liquid (slurry) 18 in the dilution tank 10 into the supply tank 12.

ポンプ20,28,34は制御手段42に接続されており、制御手段42によりその駆動が制御される。流量調整弁24も制御手段42に接続されており、流量調整弁24で純水等の液体の供給量を調整して、研磨剤原液8を所望の濃度の混合液(スラリー)18に調整する。   The pumps 20, 28 and 34 are connected to the control means 42, and their driving is controlled by the control means 42. The flow rate adjusting valve 24 is also connected to the control means 42, and the supply amount of liquid such as pure water is adjusted by the flow rate adjusting valve 24 to adjust the abrasive stock solution 8 to a mixed solution (slurry) 18 having a desired concentration. .

希釈タンク10内の混合液(スラリー)18の残量は、重量測定器40上に希釈タンク10を搭載することにより、研磨剤原液タンク6内の研磨剤原液の残量と同様な方法により、制御手段42で容易に算出することができる。   The remaining amount of the mixed liquid (slurry) 18 in the dilution tank 10 can be obtained by mounting the dilution tank 10 on the weight measuring device 40 in the same manner as the remaining amount of the abrasive stock solution in the abrasive stock solution tank 6. It can be easily calculated by the control means 42.

希釈タンク10内の混合液(スラリー)18の濃度調整は、ポンプ20の駆動時間及び流量調整弁24を介して供給される液体の量を制御するとともに、更に希釈タンク10内の混合液(スラリー)18の残量に基づいて、所望の濃度に調整することができる。   The adjustment of the concentration of the liquid mixture (slurry) 18 in the dilution tank 10 controls the driving time of the pump 20 and the amount of liquid supplied via the flow rate adjustment valve 24, and further, the liquid mixture (slurry in the dilution tank 10). ) Based on the remaining amount of 18, the desired density can be adjusted.

特に図示しないが、研磨剤原液供給路14及び液体供給路16中に流量計を設けて、希釈タンク10内に供給される研磨剤原液8及び液体供給源15から供給される純水等の液体の量を正確に測定することにより、希釈タンク10内の混合液(スラリー)18の濃度をより正確に調整することができる。   Although not particularly shown, a flowmeter is provided in the abrasive stock solution supply path 14 and the liquid supply path 16, and a liquid such as pure water supplied from the abrasive stock solution 8 and the liquid supply source 15 supplied into the dilution tank 10. By accurately measuring the amount of, the concentration of the mixed liquid (slurry) 18 in the dilution tank 10 can be adjusted more accurately.

本実施形態の混合液供給装置2では、研磨剤原液タンク6が重量測定器38で支持されているため、予め制御手段42内のメモリにタンク本体の重量を記憶しておき、制御手段42で重量測定器38で測定した総重量からタンク本体の重量を減算すれば、研磨剤原液8の正確な残量を容易に把握することができる。   In the mixed liquid supply apparatus 2 of the present embodiment, since the abrasive stock solution tank 6 is supported by the weight measuring device 38, the weight of the tank body is stored in advance in the memory in the control means 42, and the control means 42 By subtracting the weight of the tank body from the total weight measured by the weight measuring device 38, the accurate remaining amount of the abrasive stock solution 8 can be easily grasped.

これにより、常に研磨剤原液8の補充タイミングを正確に予測することができるとともに、残った研磨剤原液8でどれだけの加工が可能か否かを正確に予測することもできる。希釈タンク10側に送った研磨剤原液8の量も正確に把握することができるため、希釈タンク10側の濃度調整手段の不具合のチェック機能を付加させることもできる。   As a result, it is possible to always accurately predict the replenishment timing of the abrasive stock solution 8 and to accurately predict how much processing is possible with the remaining stock solution 8. Since the amount of the abrasive stock solution 8 sent to the dilution tank 10 side can also be accurately grasped, it is possible to add a function for checking the malfunction of the concentration adjusting means on the dilution tank 10 side.

上述した実施形態では、本発明の混合液供給装置2を研磨装置4に接続した例について説明したが、本発明の混合液供給装置はこれに限定されるものではなく、砥粒と液体の混合液を高圧で噴射することで被加工物を切断するウォータージェット装置にも同様に適用可能である。   In the above-described embodiment, the example in which the mixed liquid supply apparatus 2 of the present invention is connected to the polishing apparatus 4 has been described. However, the mixed liquid supply apparatus of the present invention is not limited to this, and a mixture of abrasive grains and liquid is used. The present invention can be similarly applied to a water jet apparatus that cuts a workpiece by injecting a liquid at a high pressure.

2 混合液供給装置
4 研磨装置
6 研磨剤原液タンク
8 研磨剤原液
10 希釈タンク
12 供給タンク
16 液体供給路
18 混合液(スラリー)
14 管路(研磨剤原液供給路)
26 管路(第1混合液供給路)
32 管路(第2混合液供給路)
20,28,34 ポンプ
38,40 重量測定器
42 制御手段
44 残量表示手段
46a〜46d 液面センサ
2 Mixture supply device 4 Polishing device 6 Abrasive stock solution tank 8 Abrasive stock solution 10 Dilution tank 12 Supply tank 16 Liquid supply path 18 Mixed solution (slurry)
14 Pipeline (Abrasive stock solution supply path)
26 Pipe line (first liquid mixture supply path)
32 pipeline (second mixed liquid supply channel)
20, 28, 34 Pump 38, 40 Weight measuring device 42 Control means 44 Remaining amount display means 46a-46d Liquid level sensor

Claims (1)

加工装置に液体と研磨剤が混合された状態からなる混合液を供給する混合液供給装置であって、
重量測定器と、
該重量測定器上に搭載された研磨剤原液を貯留する研磨剤原液タンクと、
液体と研磨剤原液を所定の濃度に混合して混合液を作成する希釈タンクと、
該加工装置に供給する混合液を貯留する供給タンクと、
該研磨剤原液タンクから該希釈タンクへ研磨剤原液を供給する研磨剤原液供給経路と、
該希釈タンクから該供給タンクに混合液を供給する第1混合液供給経路と、
該供給タンク内に貯留された混合液を該加工装置へ供給する第2混合液供給経路と、
該重量測定器が接続された制御手段と、
該制御手段に接続され、該研磨剤原液タンク内の研磨液原液の残量を表示する残量表示手段と、
を具備したことを特徴とする混合液供給装置。
A mixed liquid supply apparatus that supplies a mixed liquid in a state where a liquid and an abrasive are mixed to a processing apparatus,
A weight measuring instrument;
An abrasive stock solution tank for storing an abrasive stock solution mounted on the weight measuring device;
A dilution tank that mixes liquid and abrasive stock solution to a predetermined concentration to create a mixed solution;
A supply tank for storing a mixed liquid to be supplied to the processing apparatus;
An abrasive stock solution supply path for supplying an abrasive stock solution from the abrasive stock solution tank to the dilution tank;
A first mixed solution supply path for supplying a mixed solution from the dilution tank to the supply tank;
A second mixed liquid supply path for supplying the mixed liquid stored in the supply tank to the processing apparatus;
Control means to which the weight measuring device is connected;
A remaining amount display means connected to the control means for displaying the remaining amount of the polishing liquid stock solution in the abrasive stock solution tank;
A mixed liquid supply apparatus comprising:
JP2010038311A 2010-02-24 2010-02-24 Mixed liquid supply device Pending JP2011173198A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016007652A (en) * 2014-06-23 2016-01-18 株式会社荏原製作所 Temperature control system of polishing pad and substrate treatment apparatus provided with the same
CN111604807A (en) * 2019-02-22 2020-09-01 亚泰半导体设备股份有限公司 Grinding fluid mixing and supplying system
JP7434885B2 (en) 2019-12-24 2024-02-21 栗田工業株式会社 How to manage the drug dosing system

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JPH09161142A (en) * 1995-12-14 1997-06-20 Omron Corp Residual stock solution amount detector
JPH11221768A (en) * 1998-02-06 1999-08-17 Nippei Toyama Corp Slurry managing system
JP2000233372A (en) * 1999-02-12 2000-08-29 Sumitomo Metal Ind Ltd Slurry feed system and polishing system using the same
JP2000237959A (en) * 1998-12-25 2000-09-05 Sumitomo Metal Ind Ltd Slurry circulating and supplying system, and polishing system provided with the same
JP2002113661A (en) * 2000-10-06 2002-04-16 Ebara Corp Abrasive liquid supplying device, polishing device, and operating method of abrasive liquid supplying device
JP2002230637A (en) * 2001-01-30 2002-08-16 Toshiba Electric Appliance Co Ltd Automatic beverage vending machine
JP2003197577A (en) * 2001-12-28 2003-07-11 Matsushita Environment Airconditioning Eng Co Ltd Apparatus and method for supplying liquid for polishing

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JPH09161142A (en) * 1995-12-14 1997-06-20 Omron Corp Residual stock solution amount detector
JPH11221768A (en) * 1998-02-06 1999-08-17 Nippei Toyama Corp Slurry managing system
JP2000237959A (en) * 1998-12-25 2000-09-05 Sumitomo Metal Ind Ltd Slurry circulating and supplying system, and polishing system provided with the same
JP2000233372A (en) * 1999-02-12 2000-08-29 Sumitomo Metal Ind Ltd Slurry feed system and polishing system using the same
JP2002113661A (en) * 2000-10-06 2002-04-16 Ebara Corp Abrasive liquid supplying device, polishing device, and operating method of abrasive liquid supplying device
JP2002230637A (en) * 2001-01-30 2002-08-16 Toshiba Electric Appliance Co Ltd Automatic beverage vending machine
JP2003197577A (en) * 2001-12-28 2003-07-11 Matsushita Environment Airconditioning Eng Co Ltd Apparatus and method for supplying liquid for polishing

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016007652A (en) * 2014-06-23 2016-01-18 株式会社荏原製作所 Temperature control system of polishing pad and substrate treatment apparatus provided with the same
CN111604807A (en) * 2019-02-22 2020-09-01 亚泰半导体设备股份有限公司 Grinding fluid mixing and supplying system
CN111604807B (en) * 2019-02-22 2021-11-09 亚泰半导体设备股份有限公司 Grinding fluid mixing and supplying system
JP7434885B2 (en) 2019-12-24 2024-02-21 栗田工業株式会社 How to manage the drug dosing system

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