JP2011170643A - Testing method, testing apparatus and program - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a technique that enables many ways of testing out test items prepared in advance. <P>SOLUTION: A testing apparatus 1 receives the input of a sample scenario 2, in which a plurality of command blocks 20 each consisting of a command element 21 and a data element 22 and regarding the operation of a device to be tested are described. The testing apparatus performs at least one among a description order switching process, a command block inserting process, a command block replacing process, a command element changing process, or a through-process on the sample scenario 2 for creating a test scenario 5 in which the plurality of command blocks 20 are described, in accordance with the order of testing; and also, each of the command blocks 20, described in the test scenario 5, is transmitted to the device to be tested, in either a default-speed transmission mode, a random-speed transmission mode, a pose insertion transmission mode, or a variable-speed transmission mode in accordance with the order of description in the test scenario 5. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to a test apparatus, and more particularly to a technique for automatically performing a plurality of tests on a machine under test in order.

  Patent Document 1 discloses a technique for automating a function test operation for software of a mobile phone and improving the efficiency of the test operation. In this technology, the mobile phone software function testing device is a test scenario in which a test procedure is described as a test item and a test scenario in which the test procedure is described, and the execution of the test scenario. A test standard in which the operation content of the specifications of the EUT is described is generated. Then, the device under test is tested according to the test procedure described in the test scenario, and whether the test result is acceptable or not is determined based on the test standard.

JP 2003-99288 A

  Since the technique described in Patent Document 1 creates a test scenario from a specification, a test other than the test items described in the specification, such as an overload test, cannot be performed. In order to perform various tests, it is necessary to create a specification in which test procedures for all these tests are compared with the contents of the operation as test items.

  The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a technique that enables various tests from test items prepared in advance.

  In order to solve the above-described problem, in the present invention, the test apparatus accepts an input of a sample scenario in which a plurality of command blocks related to operation of the device under test including a command element and a data element are described. Performing at least one of command block description order replacement processing, arbitrary command block insertion processing, arbitrary command block replacement processing, and command element replacement processing between command blocks. A test scenario in which the command blocks are described in the test order is generated. Further, each command block described in the test scenario is transmitted to the device under test at an arbitrary transmission interval determined for each command block or for each of a plurality of consecutive command blocks in accordance with the description order in the test scenario. Then, for each command block described in the test scenario, the test result by the command block is determined based on the change in the operation state of the device under test before and after the command block transmission.

For example, the present invention is a test apparatus for testing a machine under test,
Sample scenario accepting means for accepting input of a sample scenario in which a plurality of command blocks relating to operation of the device under test composed of command elements and data elements are described;
Command block storage means for storing at least one command block;
For the sample scenario received by the sample scenario receiving unit, the command block description order switching process, the arbitrary command block insertion process stored in the command block storage unit, the arbitrary command block Performing at least one of processing for replacing any command block stored in the command block storage means and processing for replacing the command element between any command blocks, and Test scenario generation means for generating a test scenario in which the command blocks are described in a test order;
Command block transmitting means for transmitting each of the command blocks described in the test scenario to the device under test in accordance with the description order of the test scenario.

Further, for example, the present invention is a test apparatus for performing a test of a device under test,
Test scenario storage means for storing a test scenario in which a plurality of command blocks related to the operation of the device under test including a command element and a data element are described in a test order;
Any command block described in the test scenario stored in the test scenario storage means is determined for each command block or a plurality of consecutive command blocks according to the description order in the test scenario. Command block transmitting means for transmitting to the device under test at a transmission interval of

  According to the present invention, a number of tests can be performed from test items prepared in advance.

FIG. 1 is a schematic functional configuration diagram of a test apparatus 1 according to an embodiment of the present invention. FIG. 2A is a diagram schematically illustrating the sample scenario 2, and FIGS. 2B to 2E are diagrams schematically illustrating the test scenario 5. FIG. FIGS. 3A to 3D are diagrams schematically illustrating the transmission timing of the command block 20. FIG. 4 is a flowchart for explaining the test scenario creation process of the test apparatus 1 according to the embodiment of the present invention. FIG. 5 is a flowchart for explaining command block transmission processing of the test apparatus 1 according to the embodiment of the present invention. FIG. 6 is a flowchart for explaining the test result output process of the test apparatus 1 according to the embodiment of the present invention.

  In the following, an embodiment of the present invention will be described by taking a mobile phone testing device as an example.

  FIG. 1 is a schematic functional configuration diagram of a test apparatus 1 according to an embodiment of the present invention.

  As shown in the figure, the test apparatus 1 includes a control terminal interface unit 101, a device under test interface unit 102, a sample scenario receiving unit 103, a sample scenario storage unit 104, a command block storage unit 105, and a random number generation unit 106. A test scenario generation unit 107, a test scenario storage unit 108, a transmission interval determination unit 109, a command block transmission unit 110, a display screen data reception unit 111, a test target command block holding unit 112, and a previous display screen The data holding unit 113, the test result determination unit 114, and the test result transmission unit 115 are included.

  The control terminal interface unit 101 is an interface for connecting to a control terminal such as a PC (Personal Computer), for example, serial bus transmission such as LAN, wireless LAN, USB (Universal Serial Bus), or short distance such as Bluetooth. Wireless communication is used.

  The device under test interface unit 102 is an interface for connecting to a mobile phone that is a device under test, and for example, serial bus transmission such as USB or short-range wireless communication such as Bluetooth is used.

  The sample scenario receiving unit 103 receives the sample scenario 2 from the control terminal via the control terminal interface unit 101. FIG. 2A is a diagram schematically illustrating Sample Scenario 2. As shown in the figure, the sample scenario 2 is configured by describing a plurality of command blocks 20 related to the operation of the device under test. The command block 20 includes a command element 21 and a data element 22.

  The sample scenario storage unit 104 stores the sample scenario 2 received by the sample scenario reception unit 103.

  The command block storage unit 105 stores in advance a plurality of command blocks 20 related to operation of the device under test. Note that the command block 20 extracted by analyzing the sample scenario 2 received by the sample scenario receiving unit 103 may be stored in the command block storage unit 105.

  The random number generation unit 106 generates a random number within a predetermined range in accordance with an instruction from the test scenario generation unit 107 or the transmission interval determination unit 109.

  The test scenario generation unit 107 replaces the description order of the command block 20 with respect to the sample scenario 2 stored in the sample scenario storage unit 104 according to the random number generated by the random number generation unit 106 (hereinafter, description order replacement process). , Insertion of an arbitrary command block 20 stored in the command block storage unit 105 (hereinafter, command block insertion processing), and replacement of an arbitrary command block 20 with an arbitrary command block 20 stored in the command block storage unit 105 ( Hereinafter, at least one of the command block replacement process), replacement of the command element 21 between arbitrary command blocks 20 (hereinafter, command element replacement process), and nothing (hereinafter referred to as through process) is performed. . Thereby, the test scenario 5 in which the plurality of command blocks 20 are described in the test order is generated.

  FIG. 2B to FIG. 2E are diagrams schematically showing the test scenario 5. Here, FIG. 2 (B) shows the test scenario 5 created by performing the description order permutation process on the sample scenario 2 shown in FIG. 2 (A), and is shown in FIG. 2 (A). At least a part of the description order of the command block 20 is changed from the sample scenario 2. FIG. 2C shows a test scenario 5 created by executing a command block insertion process on the sample scenario 2 shown in FIG. 2A, and is stored in the command block storage unit 105. The number of command blocks 20 is increased as compared to the sample scenario 2 shown in FIG. FIG. 2D shows a test scenario 5 created by executing the command block replacement process on the sample scenario 2 shown in FIG. 2A. The sample shown in FIG. At least a part of the command blocks 20 in the scenario 2 is replaced with an arbitrary command block 20 stored in the command block storage unit 105. FIG. 2E shows a test scenario 5 created by executing a command element replacement process on the sample scenario 2 shown in FIG. 2A. The sample shown in FIG. The command elements 21 between at least some command blocks 20 of the scenario 2 are exchanged.

  The test scenario storage unit 108 stores the test scenario 5 generated by the test scenario generation unit 107.

  The transmission interval determination unit 109 determines the transmission interval of the command block 20 described in the test scenario 5 stored in the test scenario storage unit 108 according to the random number generated by the random number generation unit 106.

  The command block transmission unit 110 is described in the test scenario 5 stored in the test scenario storage unit 108 via the unit under test interface 102 in accordance with the transmission interval determined by the transmission interval determination unit 109. The command blocks 20 are transmitted in the order of description.

  FIGS. 3A to 3D are diagrams schematically illustrating the transmission timing of the command block 20. Here, FIG. 3A shows the transmission timing in the default transmission interval T1 (hereinafter, default speed transmission mode), and FIG. 3 shows the transmission timing (hereinafter, random speed transmission mode) in the transmission interval T2 determined in FIG. 3, and FIG. 3C shows the command block 20 determined at random based on the random number by the transmission interval determination unit 109. The transmission timing when the pause t is inserted into the transmission interval T3 (hereinafter referred to as pause insertion transmission mode) is shown. FIG. 3D is randomly determined by the transmission interval determination unit 109 based on the random number. For each group 23 of command blocks 20, the transmission determined at random based on the random number Interval T4 (1), T4 (2) transmission timing (hereinafter, variable speed transmission mode hereinafter).

  The display screen data receiving unit 111 receives the display screen data 3 from the device under test via the device under test interface unit 102.

  The test target command block holding unit 112 holds the latest command block 20 (hereinafter, “test target command block”) transmitted by the command block transmission unit 110.

  The immediately preceding display screen data holding unit 113 holds the display screen data 3 (hereinafter, the immediately preceding display screen data) received by the display screen data receiving unit 111 immediately before or at the time of transmission of the test target command block.

  The test result determination unit 114 is stored in the display screen data 3 received by the display screen data receiving unit 111 within a predetermined time after transmission of the test target command block (hereinafter referred to as the immediately subsequent display screen data) and the previous display screen data holding unit 113. Compare the previous display screen data. Then, the pass / fail of the test is determined according to the comparison result. Specifically, when the immediately-display screen data and the immediately-preceding display screen data are different, the UUT receives the test target command block and executes processing according to the operation indicated by the test target command block. As a result, it is determined that the test “passed” as the display screen of the EUT changed. On the other hand, if the screen data immediately after and the screen data immediately before display match, the EUT does not accept the command block to be tested, or the EUT has accepted the command block to be tested, but the command to be tested The process according to the operation indicated by the block is not executed, and therefore the test is judged as “failed” because there is no change in the display screen of the EUT. Even if the immediately following display screen data is different from the immediately preceding display screen data, if the immediately following display screen data indicates a predetermined screen display (for example, blackout), it is determined that the test is “failed”. Also good.

  The test result transmission unit 115 sets the control terminal interface unit 101 as the test result 4 with the test target command block held by the test target command block holding unit 112 indicating whether or not the test has been determined by the test result determination unit 114. To the control terminal.

  FIG. 4 is a flowchart for explaining the test scenario creation process of the test apparatus 1 according to the embodiment of the present invention. This flow starts when the sample scenario receiving unit 103 receives the sample scenario 2 from the control terminal via the control terminal interface unit 101.

  First, the sample scenario receiving unit 103 stores the sample scenario 2 in the sample scenario storage unit 104 (S101).

  Next, the test scenario generation unit 107 causes the random number generation unit 106 to generate a random number within a predetermined range (for example, 0 to 9), and sets this random number as the scheduled processing count A1. Further, the processed count A2 is set to an initial value “0” (S102).

  Next, the test scenario generation unit 107 causes the random number generation unit 106 to generate a random number within a predetermined range, and selects a processing mode for creating a test scenario according to the random number (S103). For example, the random number generation unit 106 generates a random number in the range of 0 to 4, and the processing mode for creating a test scenario is “through processing” when the random number is “0”, and “change order of description” when the random number is “1”. “Process”, random number “2”, “command block insertion process”, random number “3”, “command block replacement process”, and random number “4”, “command element replacement process” are selected.

  If “through processing” is selected in S103, the test scenario generation unit 107 does nothing with the sample scenario 2 stored in the sample scenario storage unit 104, and proceeds to S118.

  In addition, when “description order change processing” is selected in S103, the test scenario generation unit 107 causes the random number generation unit 106 to add the total number of command blocks 20 described in the sample scenario 2 from 1 (hereinafter referred to as block total description). Two random numbers are generated within a range up to (number), and these random numbers are set as replacement line numbers N1 and N2 (S104). Then, the sample scenario 2 is edited, and the command block 20 described in the N1th and the command block 20 described in the N2th of the sample scenario 2 are replaced (S105).

  Then, the test scenario generation unit 107 proceeds to S118 if the processes shown in S104 and S105 are repeated a predetermined number of times (YES in S106), and returns to S104 if it is not repeated the predetermined number of times (NO in S106).

  When “command block insertion processing” is selected in S103, the test scenario generation unit 107 causes the random number generation unit 106 to generate a random number within a range from 1 to (total number of block descriptions + 1). The insertion line number N3 is set (S107). Further, the test scenario generation unit 107 arbitrarily selects one command block 20 from the command block storage unit 105 (S108). For example, the random number generation unit 106 generates random numbers within a range from 1 to the total number of command blocks 20 stored in the command block storage unit 105 (hereinafter, the total number of stored blocks), and registers them in the order indicated by the random numbers. The selected command block 20 is selected. Next, the test scenario generation unit 107 edits the sample scenario 2 and inserts the command block 20 selected from the command block storage unit 105 immediately before the N3th command block 20 described in the sample scenario 2 ( S109). However, if (total block description count + 1) is set as the insertion line number N3, the command block 20 selected from the command block storage unit 105 is added to the end of the sample scenario 2.

  Then, the test scenario generation unit 107 proceeds to S118 if the process shown in S107 to S109 is repeated a predetermined number of times (YES in S110), and returns to S107 if it is not repeated the predetermined number of times (NO in S110).

  When “command block replacement process” is selected in S103, the test scenario generation unit 107 causes the random number generation unit 106 to generate a random number within the range from 1 to the total number of block descriptions, and this random number is replaced with the replacement line number. N4 is set (S111). In addition, the test scenario generation unit 107 arbitrarily selects one command block 20 from the command block storage unit 105 in the same manner as S108 (S112). Next, the test scenario generation unit 107 edits the sample scenario 2 and replaces the command block 20 described in the N4th in the sample scenario 2 with the command block 20 selected from the command block storage unit 105 (S113).

  Then, the test scenario generation unit 107 proceeds to S118 if the processes shown in S111 to S113 are repeated a predetermined number of times (YES in S114), and returns to S111 if it is not repeated the predetermined number of times (NO in S114).

  When “command element replacement processing” is selected in S103, the test scenario generation unit 107 causes the random number generation unit 106 to generate two random numbers within a range from 1 to the total number of block descriptions, and these random numbers. Are set to the replacement line numbers N5 and N6 (S115). Then, the sample scenario 2 is edited, and the command element 21 of the command block 20 described in the N5th in the sample scenario 2 is replaced with the command element 21 of the command block 20 described in the N6th (S116).

  Then, the test scenario generation unit 107 proceeds to S118 if the processes shown in S115 and S116 are repeated a predetermined number of times (YES in S117), and returns to S115 if it is not repeated the predetermined number of times (NO in S117).

  In S118, the test scenario generation unit 107 compares the processed count A2 with the scheduled processing count A1. If the processed count A2 is smaller than the scheduled processing count A1 (NO in S118), the processed count A2 is incremented by one (S119), and the process returns to S103. On the other hand, if the processed count A2 is equal to or greater than the scheduled processing count A1 (YES in S118), the sample scenario 2 edited as described above is stored as the test scenario 5 in the test scenario storage unit 108 (S120). End the flow.

  FIG. 5 is a flowchart for explaining command block transmission processing of the test apparatus 1 according to the embodiment of the present invention. This flow starts when the test scenario 5 is stored in the test scenario storage unit 108.

  First, the transmission interval determination unit 109 causes the random number generation unit 106 to generate a random number within a predetermined range, and selects the transmission mode of the command block 20 described in the test scenario 5 according to the random number (S201). For example, the random number generator 106 generates a random number within the range of 0 to 3, and the command block transmission mode is “default speed transmission mode” when the random number is “0” and “random speed” when the random number is “1”. “Transmission mode”, “pause insertion transmission mode” for random number “2”, and “speed variable transmission mode” for random number “3”.

  When “default speed transmission mode” is selected in S201, the transmission interval determination unit 109 sets a predetermined reference value (default value) as the transmission interval T1, and notifies the command block transmission unit 110 of this transmission interval T1. (S202). In response to this, the command block transmission unit 110 sets the counter value C to the initial value “1” (S203).

  Next, the command block transmitting unit 110 sets the command block 20 described in the Cth in the test scenario 5 as a test target command block (S204), and this test target command block is set in the test target command block holding unit 112. At the same time, the display screen data receiving unit 111 holds the display screen data 3 received from the EUT in the previous display screen data holding unit 113 as the previous display screen data (S205). Then, the command block transmission unit 110 transmits the test target command block to the device under test via the device under test interface unit 102, and notifies the test result determination unit 114 of the transmission of the test target command block (S206).

  Next, the command block transmission unit 110 determines whether or not the counter value C has reached the total number of command blocks 20 described in the test scenario 5 (hereinafter referred to as total number of tests) (S207). If the counter value C has not reached the total number of tests (NO in S207), the command block transmission unit 110 increments the counter value C by one and the transmission interval T1 notified from the transmission interval determination unit 109 elapses. (S208), and then returns to S204. On the other hand, if the counter value C has reached the total number of tests (YES in S207), this flow ends.

  If “random speed transmission mode” is selected in S201, the transmission interval determination unit 109 causes the random number generation unit 106 to generate a random number within a predetermined range, and sets the time determined according to the random number as the transmission interval T2. The transmission interval T2 is set and notified to the command block transmission unit 110 (S209). Here, the time determined according to the random number may be shorter than the default value described above. Thereafter, the process proceeds to S203, and the command block transmission unit 110 transmits the test target command block in the same manner as in the “default speed transmission mode” (S203 to S208).

  When “pause insertion transmission mode” is selected in S201, the transmission interval determination unit 109 selects an arbitrary number of command blocks 20 from the test scenario 5, and sets these command blocks 20 as pause target blocks ( S210). For example, the random number generation unit 106 generates a random number within the range of the total number of tests, and randomly selects the command blocks 20 indicated by the random number from the test scenario 5. Alternatively, a predetermined number of command blocks 20 may be selected at random from the test scenario 5.

  In addition, the transmission interval determination unit 109 sets a default value to the transmission interval T3, and notifies the transmission interval T3 to the command block transmission unit 110 together with information on the command block 20 set to the pause target block (S211). In response to this, the command block transmission unit 110 sets the counter value C to the initial value “1” (S212).

  Next, the command block transmitting unit 110 sets the command block 20 described in the Cth in the test scenario 5 as a test target command block (S213), and this test target command block is stored in the test target command block holding unit 112. At the same time, the display screen data receiving unit 111 holds the display screen data 3 received from the EUT in the previous display screen data holding unit 113 as the previous display screen data. Then, the command block transmission unit 110 determines whether or not this test target command block is set as a pause target block (S214). If the test target command block is set as a pause target block (YES in S214), the command block transmission unit 110 waits for a predetermined pause time t to elapse (S215). Then, the test target command block is transmitted to the device under test via the device under test interface unit 102, and the test result determination unit 114 is notified of the transmission of the test target command block (S216). On the other hand, if the test target command block is not set as the pause target block (NO in S214), the command block transmission unit 110 immediately sends the test target command block to the test target device via the test target device interface unit 102. Transmit (S216).

  Next, the command block transmission unit 110 determines whether or not the counter value C has reached the total number of tests (S217). If the counter value C does not reach the total number of tests (NO in S217), the command block transmission unit 110 increments the counter value C by one and the transmission interval T3 notified from the transmission interval determination unit 109 elapses. (S218), and then returns to S213. On the other hand, if the counter value C has reached the total number of tests (YES in S217), this flow ends.

  When “variable transmission mode” is selected in S201, the transmission interval determination unit 109 divides the test scenario 5 into a plurality of groups 23 including a single command block 20 or a plurality of consecutive command blocks 20. (S219). For example, the random number generation unit 106 generates random numbers within the range of the total number of tests, and the test scenario 5 is divided into a plurality of groups 23 by cutting out the command blocks 20 indicated by the random numbers in order from the top of the test scenario 5. To do.

  Next, the transmission interval determination unit 109 selects one of the groups 23 created as described above, which is the unselected group 23 and located at the forefront of the test scenario 5. (S220). Then, the transmission interval determination unit 109 causes the random number generation unit 106 to generate a random number within a predetermined range, sets the time determined according to the random number to the transmission interval T4 (k), and sets the transmission interval T4 (k). The command block transmitter 110 is notified together with the information of the k-th group 23 selected from the test scenario 5 (S221). Here, the time T4 (k) determined according to the random number may be shorter than the above-described default value T1. In response to this, the command block transmission unit 110 sets the counter value C to the initial value “1” (S222).

  Next, the command block transmitting unit 110 sets the command block 20 described in the Cth in the selected group 23 as a test target command block (S223), and sets the test target command block to the test target command block holding unit 112. And the display screen data receiving unit 111 holds the display screen data 3 received from the DUT in the previous display screen data holding unit 113 as the previous display screen data (S224). Then, the command block transmission unit 110 transmits the test target command block to the device under test via the unit under test interface unit 102, and transmits the test target command block to the display screen data reception unit 111 and the test result determination unit 114. Notification is made (S225).

  Next, the command block transmission unit 110 determines whether or not the counter value C has reached the total number of command blocks 20 described in the selected group 23 (hereinafter referred to as the number of tests in the group) (S226). If the counter value C has not reached the number of tests in the group (NO in S226), the command block transmission unit 110 increments the counter value C by one and transmits the transmission interval T4 (notified by the transmission interval determination unit 109). k) waits for elapse (S227), and then returns to S223. On the other hand, if the counter value C reaches the number of tests in the group (YES in S226), the transmission interval determination unit 109 is notified accordingly. In response to this, the transmission interval determining unit 109 checks whether or not all the groups 23 created in S219 have been selected (S228). If there is an unselected group 23 (NO in S228), Returning to S220, if all groups 23 have been selected (YES in S228), this flow ends.

  FIG. 6 is a flowchart for explaining the test result output process of the test apparatus 1 according to the embodiment of the present invention. This flow is performed every time a command block to be tested is transmitted from the command block transmission unit 110 to the device under test via the device under test interface unit 102 (each time a command block transmission is notified from the command block transmission unit 110). ).

  First, the display screen data receiving unit 111 notifies the test result determination unit 114 of the display screen data 3 received from the device under test via the device under test interface unit 102 as the immediately subsequent display screen data (S301). In response to this, the test result determination unit 114 reads the immediately preceding display screen data held in the immediately preceding display screen data holding unit 113, compares the immediately preceding display screen data with the immediately following display screen data, and It is determined whether or not there is a change (302).

  When there is a change between the immediately preceding display screen data and the immediately following display screen data (YES in S303), the test result determination unit 114 determines that the test by the test target command block has passed (S304). Then, the test result transmission unit 115 is notified of the pass / fail judgment result (pass). In response to this, the test result transmission unit 115 sets the control terminal interface unit 101 as the test result 4 together with the test target command block held by the test target command block holding unit 112 as the pass / fail judgment result (pass). To the control terminal (S307), and this flow is terminated.

  On the other hand, when there is no change between the immediately preceding display screen data and the immediately following display screen data (NO in S303), the test result determination unit 114 does not pass the predetermined time since the transmission of the test target command block (S305). NO), the process returns to S301, and if the predetermined time has elapsed (YES in S305), it is determined that the test by the command block to be tested has failed (S306). Then, the test result transmission unit 115 is notified of this pass / fail judgment result (failure). In response to this, the test result transmission unit 115 sets the pass / fail judgment result (failure) as the test result 4 together with the test target command block held by the test target command block holding unit 112 as the control terminal interface unit 101. (S307), and this flow is finished.

  The embodiment of the present invention has been described above.

  In the present embodiment, the test apparatus 1 receives an input of a plurality of sample scenarios 2 in which a command block 20 including a command element 21 and a data element 22 is described as a command block 20 related to operation of the device under test. A test in which a plurality of command blocks 20 are described in the test order by executing at least one of description order replacement processing, command block insertion processing, command block replacement processing, command element replacement processing, and through processing for scenario 2. Scenario 5 is generated. Therefore, according to the present embodiment, a test scenario 5 that enables a number of tests for the command block 20 not described in the sample scenario 2, that is, a test item such as an overload test that is not prepared in advance, is generated. can do.

  In the present embodiment, the test apparatus 1 causes each of the command blocks 20 described in the test scenario 5 to be transmitted in a default speed transmission mode, a random speed transmission mode, and a pause insertion transmission according to the description order in the test scenario 5. Transmit to the UUT by either mode or variable speed transmission mode. Therefore, according to the present embodiment, it is possible to test the test items by the command block 20 described in the test scenario 5 under various conditions.

  In the present embodiment, the test apparatus 1 uses the command block 20 for each command block 20 described in the test scenario 5 based on the change in the display screen of the EUT before and after the transmission of the command block 20. Determine test results. Therefore, according to the present embodiment, it is possible to determine the pass / fail of the test even if the normal operation content is not described in advance for each test item by the command block 20 described in the test scenario 5. it can.

  In addition, this invention is not limited to said embodiment, Many deformation | transformation are possible within the range of the summary.

  For example, in the above embodiment, the test scenario generation unit 107 repeats the process of selecting two command blocks 20 from the sample scenario 2 using a random number and exchanging them by a predetermined number of times, thereby performing the “description order change process”. Has been implemented. However, the “description order switching process” may be any process as long as the description order of the command blocks 20 described in the sample scenario 2 is switched at random. For example, the “description order switching process” may be performed by extracting the command blocks 20 from the sample scenario 2 at random and describing the command blocks 20 in order.

  In the above embodiment, the test scenario generation unit 107 selects the command block 20 from the sample scenario 2 using a random number, and randomly selects the command block storage unit 105 immediately before the command block 20. The “command block insertion process” is performed by repeating the process of inserting the command block 20 a predetermined number of times. However, the “command block insertion process” may be any command as long as the command block 20 selected at random from the command block storage unit 105 is inserted at an arbitrary location in the sample scenario 2.

  In the above embodiment, the test scenario generation unit 107 selects a command block 20 from the sample scenario 2 using a random number, and selects this command block 20 from the command block storage unit 105 at random. The “command block replacement process” is performed by repeating the process of replacement to 20 a predetermined number of times. However, the “command block replacement process” can be any command block 20 that replaces an arbitrary command block 20 described in the sample scenario 2 with a command block 20 randomly selected from the command block storage unit 105. Good.

  In the above-described embodiment, the test scenario generation unit 107 selects the two command blocks 20 from the sample scenario 2 using random numbers and repeats the process of replacing both command elements 21 by a predetermined number of times. "Command element replacement processing" is implemented. However, the “command element replacement process” may be any process as long as the command elements of the command block 20 described in the sample scenario 2 are replaced at random. For example, each command block 20 described in the sample scenario 2 is decomposed into a command element 21 and a data element 22 to generate a group of command elements 21 and a group of data elements 22. Then, a command block 20 is newly generated by combining the command element 21 randomly extracted from the group of command elements 21 and the data element 22 randomly extracted from the group of data elements 22, and this command block The “command element replacement process” may be performed by sequentially describing 20.

  In the above-described embodiment, the pause time t is predetermined, but the pause time t may be set at random.

  In the above embodiment, the transmission interval determination unit 109 determines the transmission interval of the command block 20 according to any one of the default speed transmission mode, random speed transmission mode, pause insertion transmission mode, and variable speed transmission mode. . However, the transmission interval determination unit 109 only needs to be able to determine an arbitrary transmission interval for each command block 20 or for each of a plurality of consecutive command blocks 20.

  In the above embodiment, the test result determination unit 114 determines the test result by the command block 20 based on the change in the display screen of the EUT before and after the transmission of the command block 20. What is necessary is just to judge the test result based on the change in the operating state of the device under test before and after 20 transmissions.

  Further, in the above-described embodiment, the functional configuration of the test apparatus 1 shown in FIG. 1 may be realized by an integrated logic IC such as an application specific integrated circuit (ASIC) or a field programmable gate array (FPGA). Alternatively, it may be realized by software by a computer such as a DSP (Digital Signal Processor). Alternatively, in a computer system such as a PC having an auxiliary storage device such as a CPU, memory, HDD, DVD-ROM, and an external connection interface such as NIC (Network Interface Card), USB, Bluetooth, etc., the CPU assists a predetermined program. It may be realized by loading the program from the storage device onto the memory and executing it.

  In the above-described embodiment, the case where the mobile phone is a device under test has been described as an example. However, the present invention can test various devices under test having interfaces for receiving command blocks and outputting operation statuses. It is applicable to.

  1: test apparatus, 2: sample scenario, 3: display screen data, 4: test result, 5: test scenario, 20: command block, 21: command element, 22: data element, 101: control terminal interface unit, 102: Device under test interface unit 103: Sample scenario reception unit 104: Sample scenario storage unit 105: Command block storage unit 106: Random number generation unit 107: Test scenario generation unit 108: Test scenario storage unit 109: Transmission Interval determination unit, 110: command block transmission unit, 111: display screen data reception unit, 112: test target command block holding unit, 113: previous display screen data holding unit, 114: test result determination unit, 115: test result transmission unit

Claims (5)

A test method for a machine under test using a test apparatus,
Accepts input of a sample scenario in which a plurality of command blocks related to operation of the device under test consisting of command elements and data elements are described,
For the sample scenario, processing for replacing the command blocks in the description order, processing for inserting the arbitrary command block, processing for replacing the arbitrary command block, and replacement of the command elements between arbitrary command blocks Performing at least one of the processes to generate a test scenario in which a plurality of the command blocks are described in a test order;
Each of the command blocks described in the test scenario is transmitted to the device under test at an arbitrary transmission interval determined for each of the single or a plurality of consecutive command blocks according to the description order in the test scenario,
A test method for determining, for each command block described in the test scenario, a test result by the command block based on a change in an operating state of the device under test before and after transmission of the command block. A test apparatus for testing a machine under test,
Sample scenario accepting means for accepting input of a sample scenario in which a plurality of command blocks relating to operation of the device under test composed of command elements and data elements are described;
Command block storage means for storing at least one command block;
For the sample scenario received by the sample scenario receiving unit, the command block description order switching process, the arbitrary command block insertion process stored in the command block storage unit, the arbitrary command block Performing at least one of processing for replacing any command block stored in the command block storage means and processing for replacing the command element between any command blocks, and Test scenario generation means for generating a test scenario in which the command blocks are described in a test order;
Command block transmitting means for transmitting each of the command blocks described in the test scenario to the device under test in accordance with the description order of the test scenario. A test apparatus for testing a machine under test,
Test scenario storage means for storing a test scenario in which a plurality of command blocks related to the operation of the device under test including a command element and a data element are described in a test order;
Arbitrary transmission intervals for each of the command blocks described in the test scenario stored in the test scenario storage means for each of the single or continuous command blocks according to the description order of the test scenario. And a command block transmitting means for transmitting to the device under test. The test apparatus according to claim 2 or 3, wherein
A test for determining a test result of the command block for each command block described in the test scenario based on a change in an operating state of the device under test before and after transmission of the command block by the command block transmission unit. A test apparatus further comprising a result judging means. A computer readable program,
The program causes the computer to
Sample scenario accepting means for accepting an input of a sample scenario in which a plurality of command blocks relating to operation of the device under test consisting of command elements and data elements are described;
Command block storage means for storing at least one command block;
For the sample scenario received by the sample scenario receiving unit, the command block description order switching process, the arbitrary command block insertion process stored in the command block storage unit, the arbitrary command block Performing at least one of processing for replacing any command block stored in the command block storage means and processing for replacing the command element between any command blocks, and Test scenario generation means for generating test scenarios in which the command blocks are described in test order, and command block transmission for transmitting each of the command blocks described in the test scenario to the EUT in accordance with the description order of the test scenarios Function as a means A computer-readable program characterized by the above.

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