JP2011154312A5 - - Google Patents

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Publication number
JP2011154312A5
JP2011154312A5 JP2010017196A JP2010017196A JP2011154312A5 JP 2011154312 A5 JP2011154312 A5 JP 2011154312A5 JP 2010017196 A JP2010017196 A JP 2010017196A JP 2010017196 A JP2010017196 A JP 2010017196A JP 2011154312 A5 JP2011154312 A5 JP 2011154312A5
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JP
Japan
Prior art keywords
scanning
laser
sample
intensity
irradiation
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Application number
JP2010017196A
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English (en)
Japanese (ja)
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JP5581707B2 (ja
JP2011154312A (ja
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Priority to JP2010017196A priority Critical patent/JP5581707B2/ja
Priority claimed from JP2010017196A external-priority patent/JP5581707B2/ja
Publication of JP2011154312A publication Critical patent/JP2011154312A/ja
Publication of JP2011154312A5 publication Critical patent/JP2011154312A5/ja
Application granted granted Critical
Publication of JP5581707B2 publication Critical patent/JP5581707B2/ja
Expired - Fee Related legal-status Critical Current
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JP2010017196A 2010-01-28 2010-01-28 制御方法 Expired - Fee Related JP5581707B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010017196A JP5581707B2 (ja) 2010-01-28 2010-01-28 制御方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010017196A JP5581707B2 (ja) 2010-01-28 2010-01-28 制御方法

Publications (3)

Publication Number Publication Date
JP2011154312A JP2011154312A (ja) 2011-08-11
JP2011154312A5 true JP2011154312A5 (https=) 2013-04-04
JP5581707B2 JP5581707B2 (ja) 2014-09-03

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ID=44540308

Family Applications (1)

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JP2010017196A Expired - Fee Related JP5581707B2 (ja) 2010-01-28 2010-01-28 制御方法

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JP (1) JP5581707B2 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10049245B2 (en) 2012-06-20 2018-08-14 Metrologic Instruments, Inc. Laser scanning code symbol reading system providing control over length of laser scan line projected onto a scanned object using dynamic range-dependent scan angle control
JP6085363B2 (ja) * 2013-02-20 2017-02-22 パイオニア株式会社 二次元光走査装置
JP6405092B2 (ja) * 2014-01-28 2018-10-17 キヤノン株式会社 画像生成装置および画像生成方法
WO2021064863A1 (ja) * 2019-10-01 2021-04-08 富士通株式会社 レーザセンサ、ミラー制御方法、及びプログラム
CN114967109B (zh) * 2021-02-25 2024-01-05 成都理想境界科技有限公司 图像矫正方法及光纤扫描成像系统
CN113660434B (zh) * 2021-08-17 2024-11-19 中国科学院上海技术物理研究所 空间红外相机参数匹配和重构方法、系统、设备及应用
CN115468746B (zh) * 2022-08-30 2026-02-03 歌尔光学科技有限公司 一种振镜性能测试系统和方法
JP2024105017A (ja) 2023-01-25 2024-08-06 株式会社日立ハイテク 光計測装置、光計測方法
CN121252730B (zh) * 2025-12-04 2026-03-13 北京正时精控科技有限公司 一种用于振镜的状态闭环监测方法及系统

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4337346B2 (ja) * 2003-01-07 2009-09-30 株式会社ニコン レーザ走査顕微鏡
JPWO2008010311A1 (ja) * 2006-07-18 2009-12-17 株式会社ニコン レーザ走査装置及びレーザ走査顕微鏡

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