JP2011151233A - Transfer mechanism - Google Patents

Transfer mechanism Download PDF

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JP2011151233A
JP2011151233A JP2010011788A JP2010011788A JP2011151233A JP 2011151233 A JP2011151233 A JP 2011151233A JP 2010011788 A JP2010011788 A JP 2010011788A JP 2010011788 A JP2010011788 A JP 2010011788A JP 2011151233 A JP2011151233 A JP 2011151233A
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plate
holding
suction
recess
fluid
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Kazutaka Kuwana
一孝 桑名
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Disco Corp
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Disco Abrasive Systems Ltd
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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a transfer mechanism that holds and transfers a plate-like object without damaging its held surface. <P>SOLUTION: The transfer mechanism is equipped with, on holding surface 200 of a holding pad 20 constituting a suction holding mechanism 2: a suction recess 200a communicating with a suction source 25; and a fluid supply recess 200b formed annularly at a predetermined distance from an outer periphery of the suction recess 200a and communicating with a fluid supply source 28. A fluid layer 5 flowing between the holding surface 200 and an upper surface 4a of the plate-like object is formed 4 by supplying a fluid to the fluid supply recess 200b and also sucking the fluid from the suction recess 200a. The transfer mechanism sucks and holds the plate-like object 4 on the holding surface 200 of the holding pad 20 through the fluid layer 5. Even when the plate-like object is thick and large in mass to some extents, the transfer mechanism securely holds the plate-like object without damaging the held surface. <P>COPYRIGHT: (C)2011,JPO&amp;INPIT

Description

本発明は、板状物を吸引保持して搬送する搬送機構に関するものである。   The present invention relates to a transport mechanism that sucks and holds a plate-like object.

半導体デバイス製造工程においては、IC、LSI等のデバイスが複数個形成された半導体ウエーハは、個々のデバイスに分割される前にその裏面が研削装置によって研削され所定の厚さに形成されている。半導体ウエーハの裏面研削に用いる研削装置は、ウエーハを吸引保持するチャックテーブルと、チャックテーブル上に吸引保持されたウエーハを研削する研削手段と、チャックテーブル上に加工前のウエーハを搬入するウエーハ搬入手段と、チャックテーブル上で研削されたウエーハを搬出するウエーハ搬出手段とを具備している。ウエーハ搬入手段およびウエーハ搬出手段は、保持面(下面)にウエーハの被保持面(上面)を吸引保持する保持パッドと、保持パッドを所定位置に移動する搬送移動手段とを具備している(例えば特許文献1参照)。   In a semiconductor device manufacturing process, a semiconductor wafer on which a plurality of devices such as ICs and LSIs are formed is ground to a predetermined thickness by grinding the back surface thereof using a grinding device before being divided into individual devices. A grinding apparatus used for backside grinding of a semiconductor wafer includes a chuck table for sucking and holding the wafer, a grinding means for grinding the wafer sucked and held on the chuck table, and a wafer carry-in means for carrying a wafer before processing onto the chuck table. And wafer unloading means for unloading the wafer ground on the chuck table. The wafer carry-in means and the wafer carry-out means include a holding pad that sucks and holds the held surface (upper surface) of the wafer on the holding surface (lower surface), and a transfer movement unit that moves the holding pad to a predetermined position (for example, Patent Document 1).

特開2003−282673号公報JP 2003-282673 A

しかし、上述したウエーハ搬出手段の吸引保持パッドが研削後のウエーハを吸引保持して搬送すると、デバイスの抗折強度が低下するという問題がある。この問題は、上記吸引保持パッドがセラミック材によって構成されているため、研削されたウエーハを吸引保持する際に吸引保持パッドがウエーハの被保持面に当接して傷を付け、この傷がウエーハを個々のデバイスに分割した場合にデバイスの抗折強度を低下させることに起因していると考えられる。このように被保持面に傷がつくという問題は、半導体ウェーハのみならず、他の板状物についても生ずるものである。   However, if the suction holding pad of the wafer unloading means sucks and holds the ground wafer, there is a problem that the bending strength of the device is lowered. This problem is that the suction holding pad is made of a ceramic material, so that when the ground wafer is sucked and held, the suction holding pad comes into contact with the held surface of the wafer and damages the wafer. This is considered to be caused by lowering the bending strength of the device when divided into individual devices. Thus, the problem that the held surface is damaged occurs not only in the semiconductor wafer but also in other plate-like objects.

本発明は、上記事実に鑑みてなされたものであり、その主たる技術課題は、板状物の被保持面に傷を付けることなく保持して搬送することができる板状物の搬送機構を実現することにある。   The present invention has been made in view of the above facts, and its main technical problem is to realize a transport mechanism for a plate-shaped object that can be held and transported without damaging the held surface of the plate-shaped object. There is to do.

本発明は、板状物の上面を吸引保持して搬送するための搬送機構に関するもので、板状物を吸引保持する吸引保持機構と吸引保持機構を移動させる移動機構とから構成され、吸引保持機構は、板状物を保持する保持面を有する保持パッドを有し、当該保持面は、吸引源に連通する吸引凹部と、吸引凹部を囲繞しかつ吸引凹部の外周から所定距離離間して環状に形成され流体供給源に連通する流体供給凹部とを有し、保持パッドの保持面を板状物の上面に対面させて位置付け、流体供給凹部に流体を供給するとともに吸引凹部から流体を吸引することによって、保持面と板状物の上面との間に流動する流体層を形成し、流体層を介して板状物を該保持パッドの保持面において吸引保持する。流体供給凹部に供給される流体としては、液体を用いることが望ましいが、空気等のその他の流体を使用してもよい。   The present invention relates to a transport mechanism for sucking and holding an upper surface of a plate-like object, and is composed of a suction holding mechanism for sucking and holding a plate-like object and a moving mechanism for moving the suction holding mechanism. The mechanism has a holding pad having a holding surface for holding a plate-like object, and the holding surface surrounds the suction recess and communicates with the suction source, and is annularly spaced from the outer periphery of the suction recess by a predetermined distance. And a fluid supply recess communicating with the fluid supply source, the holding surface of the holding pad is positioned facing the upper surface of the plate-like object, fluid is supplied to the fluid supply recess, and fluid is sucked from the suction recess Thus, a fluid layer that flows between the holding surface and the upper surface of the plate-like object is formed, and the plate-like object is sucked and held on the holding surface of the holding pad via the fluid layer. As the fluid supplied to the fluid supply recess, it is desirable to use a liquid, but other fluids such as air may be used.

本発明に係る搬送機構は、保持パッドの保持面が流体を吸引し板状物の上面との間に流動する流体層を形成し、保持パッドと板状物とが直接接触することなく流体層を介して板状物を保持パッドの保持面において保持するため、ある程度肉厚で質量の重い板状物であっても、板状物の被保持面に傷をつけることなく板状物を確実に保持することができる。また、流体が液体である場合は、板状物に加工屑等が付着していたとしても、加工屑が乾燥して強固に付着してしまうことがないため、加工屑がとれにくくなるのを防止することができる。   The conveying mechanism according to the present invention forms a fluid layer in which the holding surface of the holding pad sucks fluid and flows between the upper surface of the plate-like object, and the fluid layer without the contact between the holding pad and the plate-like object. Since the plate-like object is held on the holding surface of the holding pad through the plate, even if the plate-like object is thick to a certain extent and heavy in mass, the plate-like object can be reliably secured without damaging the held surface of the plate-like object. Can be held in. Also, if the fluid is a liquid, even if processing scraps are attached to the plate-shaped object, the processing scraps are not dried and firmly attached, so that it is difficult for the processing scraps to be removed. Can be prevented.

搬送機構の構成例を略示的に示す断面図である。It is sectional drawing which shows schematically the structural example of a conveyance mechanism. 保持パッドを示す底面図である。It is a bottom view which shows a holding pad. 保持パッドに板状物を吸着する前の状態を略示的に示す断面図である。It is sectional drawing which shows schematically the state before adsorb | sucking a plate-shaped object to a holding pad. 保持パッドと板状物との間に流体が介在した状態を略示的に示す断面図である。It is sectional drawing which shows schematically the state which the fluid intervened between the holding pad and the plate-shaped object. 保持パッドが流体層を介して板状物を保持した状態を略示的に示す断面図である。It is sectional drawing which shows schematically the state in which the holding pad hold | maintained the plate-shaped object through the fluid layer. 保持パッドが流体層を介して板状物を保持した状態を拡大して略示的に示す断面図である。It is sectional drawing which expands and shows schematically the state which the holding pad hold | maintained the plate-shaped object via the fluid layer. 搬送機構の第二の構成例を略示的に示す断面図である。It is sectional drawing which shows the 2nd structural example of a conveyance mechanism schematically.

図1に示す搬送機構1は、板状物の上面を吸引保持して搬送する機能を有するものであり、板状物を吸引保持する吸引保持機構2と、吸引保持機構2を移動させる移動機構3とから構成されている。   A transport mechanism 1 shown in FIG. 1 has a function of sucking and holding an upper surface of a plate-like object, and sucking and holding mechanism 2 for sucking and holding the plate-like object, and a moving mechanism for moving the suction and holding mechanism 2. 3.

吸引保持機構2は、保持パッド20と、表裏面を貫通する貫通孔21aを複数有する板部材21と、貫通孔21aに遊嵌し先端が保持パッド20に螺合するボルト22と、ボルト22の周囲に巻回され保持パッド20と板部材21との間に介在するコイルバネ23とから構成される。一方、移動機構3は、板部材21と連結された軸部30と、軸部30を昇降及び水平移動させることにより吸引保持機構2を移動させるアーム部(図示せず)とを備えている。   The suction holding mechanism 2 includes a holding pad 20, a plate member 21 having a plurality of through holes 21a penetrating the front and back surfaces, bolts 22 loosely fitted in the through holes 21a and screwed into the holding pads 20, and bolts 22 The coil spring 23 is wound around and is interposed between the holding pad 20 and the plate member 21. On the other hand, the moving mechanism 3 includes a shaft portion 30 connected to the plate member 21 and an arm portion (not shown) that moves the suction holding mechanism 2 by moving the shaft portion 30 up and down and horizontally.

図1及び図2に示すように、保持パッド20はほぼ円盤状に形成されている。保持パッド20の下面は、板状物を保持する平面状の保持面200であり、保持面200の中心部には吸引凹部200aが形成され、吸引凹部200aを囲繞する位置には、吸引凹部200aの外周から所定距離離間して環状の流体供給凹部200bが形成されている。保持パッド20は、例えば合成樹脂等のある程度の剛性を有した加工容易な材料によって形成されていることが望ましい。   As shown in FIGS. 1 and 2, the holding pad 20 is formed in a substantially disk shape. The lower surface of the holding pad 20 is a flat holding surface 200 that holds a plate-like object. A suction recess 200a is formed at the center of the holding surface 200, and a suction recess 200a is located at a position surrounding the suction recess 200a. An annular fluid supply recess 200b is formed at a predetermined distance from the outer periphery of the ring. The holding pad 20 is preferably formed of an easily processable material having a certain degree of rigidity, such as a synthetic resin.

吸引凹部200aは、保持パッド20の中心において、保持面200から例えば数mm程度円形に窪んだ状態で形成されており、その中心には保持パッド20の厚さ方向に貫通する吸引路201が形成されている。図1に示すように、吸引凹部200aは、保持パッド20の内部に形成された吸引路201及び切り替え弁24を介して吸引源25または流体供給源26のいずれかに連通可能となっている。一方、流体供給凹部200bは、吸引凹部200aの外周から所定距離離れた位置において、円環状に窪んだ状態で形成されており、その深さは吸引凹部200aよりも数mm程度深くなっている。吸引凹部200aと流体供給凹部200bとは中心を共通にしており、吸引凹部200aの外周と、流体供給凹部200bの内周及び外周とは同心円状となっている。流体供給凹部200bは、保持パッド20を厚さ方向に貫通して形成された流体流出路202、及び、流量調整弁27を介して流体供給源28に連通している。流体供給源26、28には、例えば水などの液体が貯留されている。   The suction recess 200a is formed in a state of being recessed in a circular shape, for example, about several mm from the holding surface 200 at the center of the holding pad 20, and a suction path 201 penetrating in the thickness direction of the holding pad 20 is formed at the center. Has been. As shown in FIG. 1, the suction recess 200 a can communicate with either the suction source 25 or the fluid supply source 26 via the suction path 201 formed in the holding pad 20 and the switching valve 24. On the other hand, the fluid supply recess 200b is formed in an annularly depressed state at a predetermined distance from the outer periphery of the suction recess 200a, and the depth is about several millimeters deeper than the suction recess 200a. The suction recess 200a and the fluid supply recess 200b have a common center, and the outer periphery of the suction recess 200a and the inner periphery and outer periphery of the fluid supply recess 200b are concentric. The fluid supply recess 200 b communicates with the fluid supply source 28 through the fluid outflow passage 202 formed through the holding pad 20 in the thickness direction and the flow rate adjustment valve 27. The fluid supply sources 26 and 28 store a liquid such as water, for example.

図3に示すように、搬送しようとする板状物4を搬送機構1が保持する場合は、保持パッド20の保持面200を板状物4の上面4aに対面する位置に位置付ける。そして、吸引路201と流体供給源26とが連通するように切り替え弁24を設定し、吸引凹部200aから液体260を流出させるとともに、流体供給凹部200bからも液体280を流出させながら、搬送機構1全体を矢印Aの方向に下降させる。そうすると、図4に示すように、板状物4の上面4aと保持パッド20との間に液体が介在する。液体としては、例えば水が使用されるが、静電気発生防止のために、炭酸水を用いることが望ましい。搬送機構1の下降時には、コイルバネ23の弾性力によって、保持面200と板状物4の上面4aとの間の液体の厚みをほぼ均一にすることができる。   As shown in FIG. 3, when the transport mechanism 1 holds the plate-like object 4 to be transported, the holding surface 200 of the holding pad 20 is positioned at a position facing the upper surface 4 a of the plate-like object 4. Then, the switching valve 24 is set so that the suction path 201 and the fluid supply source 26 communicate with each other, the liquid 260 flows out from the suction recess 200a, and the liquid 280 also flows out from the fluid supply recess 200b. The whole is lowered in the direction of arrow A. Then, as shown in FIG. 4, the liquid is interposed between the upper surface 4 a of the plate-like object 4 and the holding pad 20. As the liquid, for example, water is used, but it is desirable to use carbonated water in order to prevent generation of static electricity. When the transport mechanism 1 is lowered, the thickness of the liquid between the holding surface 200 and the upper surface 4 a of the plate-like object 4 can be made substantially uniform by the elastic force of the coil spring 23.

次に、図5に示すように、流体供給源28から流体供給凹部200bへの液体280の供給を続けつつ、切り替え弁24を切り替えて吸引路201と吸引源25とを連通させ、吸引凹部200aに負圧を作用させる。そうすると、図6に示すように、流体供給凹部200bから流出した液体280が吸引凹部200aによって吸引され、板状物4の上面4aと保持パッド20との間に水平方向に流動する流体層5が形成される。そして、流動する流体層5を介して、保持パッド20の保持面200aによって板状物4が吸引保持される。保持パッド20と板状物4との間に流体層5が介在し、保持パッド20が直接板状物4に接触しないため、板状物4を傷付けて抗折強度を低下させることがない。また、ある程度肉厚で質量の重い板状物であっても保持することができる。なお、このときの流体層5の厚みは、少なくとも数μm程度あればよい。   Next, as shown in FIG. 5, while continuing the supply of the liquid 280 from the fluid supply source 28 to the fluid supply recess 200b, the switching valve 24 is switched to connect the suction path 201 and the suction source 25, and the suction recess 200a. Apply negative pressure to Then, as shown in FIG. 6, the liquid 280 flowing out from the fluid supply recess 200b is sucked by the suction recess 200a, and the fluid layer 5 flowing in the horizontal direction between the upper surface 4a of the plate-like object 4 and the holding pad 20 is formed. It is formed. The plate-like object 4 is sucked and held by the holding surface 200 a of the holding pad 20 through the fluid layer 5 that flows. Since the fluid layer 5 is interposed between the holding pad 20 and the plate-like object 4 and the holding pad 20 does not directly contact the plate-like object 4, the plate-like object 4 is not damaged and the bending strength is not lowered. Further, even a plate-like object having a certain thickness and heavy mass can be held. The thickness of the fluid layer 5 at this time may be at least about several μm.

流体供給凹部200bから流出させる流体として液体を用いることにより、板状物が研削等の加工後のものである場合は、加工屑が乾燥して板状物4の上面4aに強固に付着してしまうことを防止することができる。また、流体としては空気を用いることもできるが、液体を用いることにより、吸引力と液体の表面張力とを利用してより強固に板状物4を保持することができる。保持中は流体供給凹部200bから液体を流し続けることにより、流体層5の厚みがほぼ一定に維持されるため、保持パッド20と板状物4とが接触することがない。   By using a liquid as the fluid that flows out from the fluid supply recess 200b, when the plate-like product is a product after processing such as grinding, the processing waste is dried and firmly adheres to the upper surface 4a of the plate-like product 4. Can be prevented. In addition, air can be used as the fluid, but by using the liquid, the plate-like object 4 can be held more firmly by using the suction force and the surface tension of the liquid. While the liquid is kept flowing from the fluid supply recess 200b during the holding, the thickness of the fluid layer 5 is maintained substantially constant, so that the holding pad 20 and the plate-like object 4 do not come into contact with each other.

このようにして、流体層5を介して板状物4を保持パッド20が保持した状態で搬送機構1全体が上昇し、水平方向に移動することにより、板状物4が所望の位置に搬送される。   In this way, the transport mechanism 1 ascends while the plate-like object 4 is held by the holding pad 20 via the fluid layer 5 and moves in the horizontal direction, so that the plate-like object 4 is conveyed to a desired position. Is done.

図7に示すように、保持パッド20の外径が板状物6の外径より小さい場合は、板状物6の上面6aの全面が保持されないため、保持状態が不安定となり、板状物が水平方向に動きやすくなる。そこで、図7に示すように、保持パッド20の側部に、板状物6の水平方向の移動を規制する規制手段29を3つ以上、好ましくは等間隔に配設する。規制手段29は、例えばL字を上下に反転させた断面形状を有する爪状部材であり、規制手段29の内周面29aの内径が板状物6の外径より若干大きくなるような関係とすることにより、板状物6が水平方向に若干動いたときに規制手段29の内周面29aと板状物6の側面6bとが接触して板状物6が水平方向にスライドするのを防止し、安定的に吸引保持することができる。また、規制手段29は、水平方向にスライド可能または水平方向の回転軸を中心に回動可能に配設することが望ましい。   As shown in FIG. 7, when the outer diameter of the holding pad 20 is smaller than the outer diameter of the plate-like object 6, the entire upper surface 6 a of the plate-like object 6 is not held. Becomes easier to move horizontally. Therefore, as shown in FIG. 7, three or more restricting means 29 for restricting the horizontal movement of the plate-like object 6 are arranged on the side of the holding pad 20, preferably at equal intervals. The restricting means 29 is, for example, a claw-like member having a cross-sectional shape obtained by inverting the L shape up and down. Thus, when the plate-like object 6 moves slightly in the horizontal direction, the inner peripheral surface 29a of the restricting means 29 and the side surface 6b of the plate-like object 6 come into contact with each other and the plate-like object 6 slides in the horizontal direction. It can be prevented and stably held by suction. Further, it is desirable that the regulating means 29 is disposed so as to be slidable in the horizontal direction or to be rotatable around a horizontal rotation axis.

図1〜7に示した例では、吸引凹部200aと流体供給凹部200bとが1つずつ形成されているが、これらを交互に同心円状に複数設ける構成としてもよい。その場合は、外周側に流体を逃がすことができるように、最外周部を流体供給凹部とする。   In the example shown in FIGS. 1 to 7, one suction recess 200 a and one fluid supply recess 200 b are formed. Alternatively, a plurality of these concentric circles may be alternately provided. In that case, the outermost peripheral portion is made a fluid supply concave portion so that the fluid can escape to the outer peripheral side.

搬送機構1において保持する板状物の種類は特に限定はされないが、吸引凹部200a及び液体供給凹部200bの形状や断面積は、板状物の厚み、質量等にあわせて適宜変更することができる。また、板状物の厚み、質量等に応じて、吸引凹部200aにおける負圧の圧力値及び液体供給凹部200bからの水の流出量も流体層5の厚みが一定に維持され且つ板状物が吸引保持されるバランスになるように適宜調整することができる。   The type of plate-like object held in the transport mechanism 1 is not particularly limited, but the shape and cross-sectional area of the suction recess 200a and the liquid supply recess 200b can be appropriately changed according to the thickness, mass, etc. of the plate-like object. . Further, depending on the thickness, mass, etc. of the plate-like object, the negative pressure value in the suction recess 200a and the amount of water flowing out from the liquid supply recess 200b are also maintained constant and the thickness of the fluid layer 5 is maintained. It can adjust suitably so that it may become the balance hold | maintained by suction.

1:搬送機構
2:吸引保持機構
20:保持パッド
200:保持面 200a:吸引凹部 200b:液体供給凹部
201:吸引路 202:流体流出路
21:板部材 21a:貫通孔
22:ボルト 23:コイルバネ
24:切り替え弁 25:吸引源
26:流体供給源 260:液体
27:流量調整弁
28:流体供給源 280:液体
29:規制手段 29a:内周面
3:移動機構
30:軸部
4:板状物 4a:上面
5:流体層
6:板状物 6a:上面 6b:側面
1: Transport mechanism 2: Suction holding mechanism 20: Holding pad 200: Holding surface 200a: Suction recess 200b: Liquid supply recess 201: Suction channel 202: Fluid outlet channel 21: Plate member 21a: Through hole 22: Bolt 23: Coil spring 24 : Switching valve 25: suction source 26: fluid supply source 260: liquid 27: flow rate adjusting valve 28: fluid supply source 280: liquid 29: regulating means 29a: inner peripheral surface 3: moving mechanism 30: shaft portion 4: plate-like object 4a: upper surface 5: fluid layer 6: plate-like object 6a: upper surface 6b: side surface

Claims (2)

板状物の上面を吸引保持して搬送するための搬送機構であって、
板状物を吸引保持する吸引保持機構と該吸引保持機構を移動させる移動機構とから構成され、
該吸引保持機構は、板状物を保持する保持面を有する保持パッドを有し、
該保持面は、吸引源に連通する吸引凹部と、該吸引凹部を囲繞しかつ該吸引凹部の外周から所定距離離間して環状に形成され流体供給源に連通する流体供給凹部とを有し、
該保持パッドの該保持面を該板状物の上面に対面させて位置付け、該流体供給凹部に流体を供給するとともに該吸引凹部から流体を吸引することによって、該保持面と該板状物の上面との間に流動する流体層を形成し、該流体層を介して該板状物を該保持パッドの保持面において吸引保持する搬送機構。
A transport mechanism for sucking and holding the upper surface of a plate-shaped object,
A suction holding mechanism for sucking and holding a plate-like object and a moving mechanism for moving the suction holding mechanism;
The suction holding mechanism has a holding pad having a holding surface for holding a plate-like object,
The holding surface includes a suction recess that communicates with a suction source, and a fluid supply recess that surrounds the suction recess and is annularly formed at a predetermined distance from the outer periphery of the suction recess and communicates with a fluid supply source.
The holding surface of the holding pad is positioned so as to face the upper surface of the plate-like object, the fluid is supplied to the fluid supply recess and the fluid is sucked from the suction recess, whereby the holding surface and the plate-like object are A transport mechanism that forms a fluid layer flowing between the upper surface and the plate-like object by suction on the holding surface of the holding pad via the fluid layer.
前記流体供給凹部に供給される流体は液体である
請求項1に記載の搬送機構。
The transport mechanism according to claim 1, wherein the fluid supplied to the fluid supply recess is a liquid.
JP2010011788A 2010-01-22 2010-01-22 Transfer mechanism Pending JP2011151233A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015126174A (en) * 2013-12-27 2015-07-06 芝浦メカトロニクス株式会社 Substrate holding device and substrate holding method
JP2015135888A (en) * 2014-01-17 2015-07-27 株式会社ディスコ Cutting device
WO2016013565A1 (en) * 2014-07-23 2016-01-28 株式会社ハーモテック Control device and control method
JPWO2015083613A1 (en) * 2013-12-03 2017-03-16 株式会社ハーモテック Holding device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05335404A (en) * 1991-07-17 1993-12-17 Hiroshi Akashi Non-contact retaining equipment
JP2008160021A (en) * 2006-12-26 2008-07-10 Dainippon Screen Mfg Co Ltd Substrate transfer apparatus and substrate processing apparatus provided with the same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05335404A (en) * 1991-07-17 1993-12-17 Hiroshi Akashi Non-contact retaining equipment
JP2008160021A (en) * 2006-12-26 2008-07-10 Dainippon Screen Mfg Co Ltd Substrate transfer apparatus and substrate processing apparatus provided with the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2015083613A1 (en) * 2013-12-03 2017-03-16 株式会社ハーモテック Holding device
JP2015126174A (en) * 2013-12-27 2015-07-06 芝浦メカトロニクス株式会社 Substrate holding device and substrate holding method
JP2015135888A (en) * 2014-01-17 2015-07-27 株式会社ディスコ Cutting device
WO2016013565A1 (en) * 2014-07-23 2016-01-28 株式会社ハーモテック Control device and control method
JP5945641B1 (en) * 2014-07-23 2016-07-05 株式会社ハーモテック Control apparatus and control method

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