JP2011149979A - Liquid crystal display and electronic equipment - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a liquid crystal display capable of detecting chip of wiring in a first part without detecting chip of wiring in a second part. <P>SOLUTION: Concerning the liquid crystal display 100, detection wiring 9 is arranged in the neighborhood of an end side 1a of a TFT substrate 1 in an inspection object part trying to detect the chip of common potential wiring 8. The detection wiring 9 is arranged inside rather than the neighborhood of the end side 1a of the TFT substrate 1 in a part other than the inspection object part. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to a liquid crystal display device and an electronic apparatus, and in particular, an element substrate disposed so as to face each other, and a detection provided between a liquid crystal layer side surface of the element substrate of the counter substrate and the liquid crystal layer The present invention relates to a liquid crystal display device including wiring and an electronic apparatus.

  2. Description of the Related Art Conventionally, there are known liquid crystal display devices and electronic devices that include a detection wiring provided between a liquid crystal layer and a surface on the liquid crystal layer side of the element substrate of the element substrate disposed opposite to each other and the counter substrate. (For example, refer to Patent Document 1).

  In Patent Document 1, an element substrate including a transistor element, a counter substrate disposed so as to face the element substrate, a surface of the element substrate, and whether a substrate crack has occurred in the element substrate. A liquid crystal display device including diagnostic wiring (detection wiring) for diagnosing the above is disclosed. In this liquid crystal display device, the diagnostic wiring is provided along the edge of the element substrate, and the width (interval) between the diagnostic wiring and the edge of the element substrate is substantially the entire circumference of the element substrate. It is uniform. That is, the diagnostic wiring is disposed substantially parallel to the end side of the element substrate. Further, signal lines such as data lines and wiring patterns are provided on the side opposite to the edge of the element substrate of the diagnostic wiring. Although not clearly described in Patent Document 1, the region between the diagnostic wiring and the signal line (the region inside the diagnostic wiring) is connected to the common electrode of the liquid crystal display device. It is considered that the common potential wiring is provided along the diagnostic wiring. In addition, when a substrate crack that reaches the common potential wiring beyond the diagnostic wiring occurs at the first location where the crack of the element substrate and the lack of the common potential wiring are to be detected, The provided diagnostic wiring is disconnected and the common potential wiring is missing. In this case, when performing a continuity test to determine whether or not the diagnostic wiring is disconnected, the diagnostic wiring is not conductive, and thus is determined to be a defective product.

JP 2006-171386 A

  However, in the liquid crystal display device described in Patent Document 1, a substrate crack that is similar to the substrate crack generated at the first location does not require detection of a crack in the element substrate and a lack of common potential wiring. Even when it occurs in (non-inspection location), the diagnostic wiring may be cut off. In this case, there is a problem that the lack of the common potential wiring at the second location is detected.

  The present invention has been made to solve the above-described problems, and an object of the present invention is to detect a chipping of a wiring at the first location without detecting a chipping of the wiring at the second location. It is an object to provide a liquid crystal display device and an electronic apparatus that can perform the above-described operation.

Means for Solving the Problems and Effects of the Invention

  In order to achieve the above object, a liquid crystal display device according to a first aspect of the present invention includes a substantially rectangular element substrate and a counter substrate disposed so as to face each other while sandwiching a liquid crystal layer, and an element substrate and A wiring provided along the outer edge portion between the liquid crystal layer side surface of the element substrate of the counter substrate and the liquid crystal layer, and provided along the outer periphery of the wiring, and at least the wiring depending on whether or not the wire is disconnected. And a detection wiring for detecting the chipping, and in the first location where the chipping of the wiring is to be detected, the detection wiring is arranged in the vicinity of one end of the element substrate and the counter substrate. In a second location other than the first location to be detected, the detection wiring is arranged inside the vicinity of one end side of the element substrate and the counter substrate.

  In the liquid crystal display device according to the first aspect, as described above, the detection wiring is arranged in the vicinity of one end side of the element substrate and the counter substrate at the first location where the lack of the wiring is to be detected, In the second location, the detection wiring is arranged inside the vicinity of one end of the element substrate and the counter substrate, so that a substrate crack that reaches the wiring beyond the detection wiring occurs in the first location. In this case, since the detection wiring at the first location is disconnected due to the substrate cracking, it is possible to detect the occurrence of wiring chipping at one of the first location of the element substrate and the counter substrate. On the other hand, in the case where a substrate crack similar to the substrate crack occurring in the first location occurs in the second location, the one of the element substrate and the counter substrate in the second location and the detection wiring Since the width (interval) between them is larger than the width (interval) between one end of the element substrate and the counter substrate at the first location and the detection wiring, the detection wiring at the second location is not disconnected. Thereby, since the chipping of the wiring at one of the element substrate and the counter substrate is not detected, the chipping of the wiring at the first location can be detected without detecting the wiring lacking at the second location. it can.

  In the liquid crystal display device according to the first aspect, preferably, the detection wiring is disposed in the vicinity of one end side of the element substrate and the counter substrate at the first location, and the element substrate and the detection substrate at the second location. The distance between the detection wiring, the element substrate, and the vicinity of one end of the counter substrate is gradually increased as the distance from the first place is increased. It is comprised so that it may become. If comprised in this way, even if it leaves | separates from the 1st location for a while, compared with the 1st location in the 2nd location, the width | variety between one edge side of an element substrate and an opposing board | substrate and detection wiring Since the (interval) is large, when a substrate crack occurs at the first location and the second location, the detection wiring is disconnected at the first location, while the detection wiring is not disconnected at the second location. it can.

  In the liquid crystal display device according to the first aspect, preferably, the element substrate and the counter substrate are an element substrate and a counter substrate including transistor elements, respectively, and the wiring includes a surface on the liquid crystal layer side of the element substrate, a liquid crystal layer, The detection wiring is provided along the outer periphery of the common potential wiring between the liquid crystal layer side surface of the element substrate and the liquid crystal layer, and at least depending on whether or not the wire is disconnected. The common potential wiring and the detection wiring are arranged in the vicinity of the edge of the element substrate at the first location, and the common potential wiring and the detection wiring at the second location are configured to detect the lack of the common potential wiring. It is arranged inside the vicinity of the edge of the element substrate. With this configuration, when a crack in the element substrate that reaches the common potential wiring beyond the detection wiring occurs in the first location, the detection wiring in the first location is caused by the crack in the element substrate. Since it is disconnected, it can be detected that the common potential wiring is missing at the first location of the element substrate. On the other hand, when a crack in the element substrate that is similar to the crack in the element substrate occurring in the first location occurs in the second location, the width between the edge of the element substrate and the detection wiring in the second location. Since the (interval) is larger than the width (interval) between the edge of the element substrate and the detection wiring at the first location, the detection wiring at the second location is not disconnected. Thereby, since the lack of the common potential wiring at the second location of the element substrate is not detected, the lack of the common potential wiring at the first location can be detected without detecting the lack of the common potential wiring at the second location. .

  In this case, preferably, the device further includes a gate line provided on the surface of the element substrate, and a portion of the gate line that is located in a region other than the region corresponding to the first location corresponds to the first location of the gate line. The common potential wiring is arranged with a substantially uniform width at the end corresponding to the first location of the element substrate, and is disposed on the inner side of the end corresponding to the first location of the element substrate. And provided along the outer periphery of the gate line. With this configuration, the distance between the edge of the element substrate and the common potential wiring is larger in the second location than in the first location. The interval can be increased. In addition, since the common potential wiring becomes thin even at the second location by forming the width of the common potential wiring to be substantially uniform, in this case, it is preferable to detect the lack of the common potential wiring also at the second location. . According to the present invention, in this case, it is possible to detect the occurrence of the common potential wiring chipping due to a large crack in the element substrate at the second location, which is advantageous in this respect as well. Can be obtained.

  In the liquid crystal display device in which the gate line is provided on the surface of the element substrate, the gate line is preferably configured such that the distance from the edge of the element substrate gradually increases as the distance from the first location increases. The common potential wiring provided along the outer periphery of the gate line is configured such that the distance from the edge of the element substrate gradually increases as the distance from the first location increases. With this configuration, even when the distance from the first location is a little, the distance between the edge of the element substrate and the common potential wiring is larger in the second location than in the first location. The distance between the edge of the substrate and the detection wiring can be increased.

  In the liquid crystal display device including the wiring including the common potential wiring, preferably, the width of the detection wiring is equal to or smaller than the width of the common potential wiring. With this configuration, the detection wiring can be easily disconnected as compared with the case where the width of the detection wiring is larger than the width of the common potential wiring, so that it is possible to easily detect the lack of the common potential wiring.

  In the liquid crystal display device including the wiring including the common potential wiring, preferably, the surface area of the counter substrate is formed smaller than the surface area of the element substrate, and the first location to be detected is seen in a plan view. In the vicinity of the region where the corner of the counter substrate and the surface of the element substrate overlap. With this configuration, it is possible to detect cracks in the detection wiring and chipping of the common potential wiring in the vicinity of the region where the corner portion of the counter substrate and the surface of the element substrate overlap.

  In the liquid crystal display device according to the first aspect described above, preferably, the detection wiring is configured to be able to inspect not only chipping of the wiring but also one of the element substrate and the counter substrate depending on whether or not the wire is disconnected. ing. With this configuration, the inspection of the chipping of the wiring and the crack of one of the element substrate and the counter substrate can be combined using one detection wiring, so that the number of detection wirings can be increased. Can be suppressed.

  An electronic apparatus according to a second aspect of the present invention includes a liquid crystal display device having any one of the configurations described above. If comprised in this way, the electronic device provided with the liquid crystal display device which can detect the lack of the wiring in a 1st location, without detecting the lack of the wiring in a 2nd location can be obtained.

It is a perspective view of the liquid crystal display device by this embodiment. It is a disassembled perspective view of the liquid crystal display device by this embodiment. It is the top view seen from the upper surface side of the liquid crystal display device by this embodiment. FIG. 3 is an equivalent circuit diagram of the liquid crystal display device according to the present embodiment. It is the figure which showed the case where the board | substrate crack generate | occur | produced in the test object location of the liquid crystal display device by this embodiment. It is the figure which showed the case where the board | substrate crack generate | occur | produced in the non-inspection location (locations other than an inspection location) of the liquid crystal display device by this embodiment. It is the figure which showed the case where the big board | substrate crack generate | occur | produced in the non-inspection location (locations other than an inspection location) of the liquid crystal display device by this embodiment. It is a figure for demonstrating the 1st example of the electronic device using the liquid crystal display device by this embodiment. It is a figure for demonstrating the 2nd example of the electronic device using the liquid crystal display device by this embodiment. It is a figure for demonstrating the 3rd example of the electronic device using the liquid crystal display device by this embodiment. It is a figure for demonstrating the modification of the liquid crystal display device by this embodiment.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  With reference to FIGS. 1-4, the structure of the liquid crystal display device 100 by one Embodiment of this invention is demonstrated.

  As shown in FIGS. 1 and 2, a liquid crystal display device 100 according to an embodiment of the present invention is disposed so as to face the TFT substrate 1 made of glass and the counter substrate 2 made of glass. And. The TFT substrate 1 is an example of the “element substrate” in the present invention. Further, the TFT substrate 1 and the counter substrate 2 have a substantially rectangular shape when seen in a plan view. Further, a TFT 14 described later is formed on the surface of the TFT substrate 1. The TFT 14 is an example of the “transistor element” in the present invention. Further, the surface area of the counter substrate 2 is smaller than the surface area of the TFT substrate 1. A liquid crystal layer (not shown) is enclosed between the TFT substrate 1 and the counter substrate 2. Further, the TFT substrate 1 and the counter substrate 2 have a substantially rectangular display region 3.

  As shown in FIG. 3, a plurality of gate lines 4 extending along the X direction and a plurality of data lines 5 extending along the Y direction are provided in a region corresponding to the display region 3 of the TFT substrate 1. It has been. A subpixel 6 is provided in a region where the gate line 4 and the data line 5 intersect.

  Further, on the outer periphery of the region corresponding to the display region 3 of the TFT substrate 1, a gate line 7 is provided which is made of the same layer as the gate line 4 and extends along the Y direction electrically connected to the gate line 4. ing. Further, the gate line 7 includes a plurality of gate lines, and is configured such that the number decreases as the distance from the inspection target portion in the Y1 direction. The inspection target location is an example of the “first location” in the present invention. Further, a common potential wiring 8 (Vcom wiring) is provided on the outer periphery of the gate line 7 in the X1 direction, X2 direction, and Y1 direction side with a predetermined distance from the gate line 7. The common potential wiring 8 is an example of the “wiring” in the present invention. The common potential wiring 8 has a width of about 5 μm or more and about 50 μm or less. On the outer periphery of the common potential wiring 8 in the X1 direction, X2 direction, and Y1 direction side, a detection wiring 9 made of a metal wiring is provided at a distance of about 5 μm or more and about 50 μm or less from the common potential wiring 8. . The detection wiring 9 has a width of about 5 μm or more and about 50 μm or less. In addition, the detection wiring 9 is provided to detect the lack of the common potential wiring 8 and the crack of the TFT substrate 1 by determining whether or not the detection wiring 9 is disconnected. Further, the width of the detection wiring 9 is equal to or smaller than the width of the common potential wiring 8.

  Here, in the present embodiment, the inspection target portion to detect the lack of the common potential wiring 8 and the crack of the TFT substrate 1 has a corner portion of the counter substrate 2 and the surface of the TFT substrate 1 in plan view. This is a location (common potential wiring 8 and TFT substrate 1) in the vicinity of the overlapping region. It should be noted that the TFT substrate 1 and the counter substrate 2 are easily cracked at a location in the vicinity of the region where the corner portion of the counter substrate 2 and the surface of the TFT substrate 1 overlap, and the common potential wiring is accompanied by the crack of the TFT substrate 1 and the counter substrate 2. 8 is easily missing. For this reason, a location in the vicinity of a region where the corner portion of the counter substrate 2 and the surface of the TFT substrate 1 overlap each other is set as an inspection target location. Also, the Y1 direction side location (location other than the location to be inspected) of the location to be inspected of the common potential wiring 8 (TFT substrate 1) is not the location to be detected for the lack of the common potential wiring 8 and the crack of the TFT substrate 1. This is a non-inspection location. The place other than the inspection target place is an example of the “second place” in the present invention.

  Further, the portion of the gate line 7 corresponding to the non-inspection portion (the portion other than the inspection target portion) is located on the inner side of the edge 1a of the TFT substrate 1 than the portion of the gate line 7 corresponding to the inspection target portion. Is provided. Specifically, the gate line 7 is provided so as to taper inwardly (in the display region 3 side) as it moves away from the inspection target portion of the TFT substrate 1 in the Y1 direction side. As a result, the distance between the gate line 7 and the edge 1a of the TFT substrate 1 is gradually increased in the X direction as the distance from the inspection target portion of the TFT substrate 1 toward the Y1 direction is increased.

  Further, the common potential wiring 8 is formed with a substantially uniform width. In addition, a portion of the common potential wiring 8 corresponding to a non-inspection portion (a portion other than the inspection target portion) is closer to the edge 1a of the TFT substrate 1 than a portion of the common potential wiring 8 corresponding to the inspection target portion. Is placed inside. Specifically, the common potential wiring 8 is arranged so as to enter the inner side (display area 3 side) as it is away from the inspection target portion of the TFT substrate 1 in the Y1 direction side. Thus, the distance between the common potential wiring 8 and the edge 1a of the TFT substrate 1 is gradually increased in the X direction as the distance from the inspection target portion of the TFT substrate 1 toward the Y1 direction is increased.

  Further, in the present embodiment, the detection wiring 9 is disposed in the vicinity of the edge 1 a of the TFT substrate 1 at an inspection target location where the lack of the common potential wiring 8 and the crack of the TFT substrate 1 are to be detected. Further, the detection wiring 9 is located at a non-inspection location (location other than the location to be inspected) that is not a target location for detection of chipping of the common potential wiring 8 and cracking of the TFT substrate 1 than in the vicinity of the edge 1a of the TFT substrate 1. It is provided inside. Specifically, the detection wiring 9 is arranged so as to enter the inner side (display area 3 side) as it moves away from the inspection target portion of the TFT substrate 1 in the Y1 direction side. Thus, the distance between the detection wiring 9 and the vicinity of the edge 1a of the TFT substrate 1 is gradually increased in the X direction as the distance from the inspection target portion of the TFT substrate 1 toward the Y1 direction is increased. Further, the detection wiring 9 is formed in a straight line in a region connecting the inspection target portion and the inspection non-target portion.

  A driving IC 10 for driving the liquid crystal display device 100 is provided on the surface of the TFT substrate 1. The driving IC 10 is connected to the gate line 7, the common potential wiring 8, and the detection wiring 9, and is configured to output various driving signals. The driving IC 10 includes a gate line driving circuit 11 to be described later for outputting a driving signal to the gate line 4 and a data line driving circuit 12 to be described later for outputting a driving signal to the data line 5. Yes. Further, on the surface of the TFT substrate 1, an FPC 13 (Flexible Printed Circuits) on which a connector for connecting to the electronic device main body is mounted is provided.

  Further, as shown in FIG. 4, the sub-pixel 6 includes a TFT 14 (Thin Film Transistor), a pixel electrode 15 formed for each sub-pixel 6, a voltage of the common electrode 16 and the pixel electrode 15 formed over the entire display region 3. It is comprised from the storage capacity | capacitance 17 for hold | maintaining. The TFT 14 includes a source electrode 14a, a drain electrode 14b, and a gate electrode 14c. The source electrode 14 a is connected to the data line 5. The data line 5 is connected to the data line driving circuit 12. The gate electrode 14 c is connected to the gate line 4. The gate line 4 (gate line 7) is connected to the gate line driving circuit 11. The drain electrode 14 b is connected to one electrode of the pixel electrode 15 and the storage capacitor 17. The common electrode 16 is provided so as to face the pixel electrode 15 with the liquid crystal layer interposed therebetween. The common electrode 16 is connected to the common potential wiring 8. The other electrode of the storage capacitor 17 is connected to the storage capacitor line 18.

  Next, with reference to FIG. 5 and FIG. 6, a method for detecting the lack of the common potential wiring 8 will be described.

  First, at the time of panel inspection after the TFT substrate 1 and the counter substrate 2 are bonded together, diagnostic wiring or the like is connected to both ends of the detection wiring 9 and whether or not the detection wiring 9 is conductive is confirmed. . In addition, before mounting the driving IC 10 on the TFT substrate 1, it is preferable to apply a diagnostic probe to each of the detection wirings 9 to inspect whether the detection wirings 9 are conductive. When the driving IC 10 and the FPC 13 are mounted on the TFT substrate 1, the detection wiring 9 is output by a diagnostic function built in the driving IC 10 by outputting a signal to the driving IC 10 through the FPC 13. It is possible to inspect whether or not is conducting. As shown in FIG. 5, when a substrate crack that reaches the common potential wiring 8 beyond the detection wiring 9 occurs in the inspection target portion of the TFT substrate 1, the detection wiring 9 is disconnected. The detection wiring 9 is not conductive. As a result, it is determined that the common potential wiring 8 is missing. In this case, the panel is determined to be defective.

  In addition, as shown in FIG. 6, in the case where a substrate crack similar to the crack of the TFT substrate 1 generated in the inspection target portion described above occurs in the inspection non-target portion (location other than the inspection target portion) of the TFT substrate 1. In this case, since the detection wiring 9 is not disconnected, the detection wiring 9 remains connected. In other words, the panel is determined to be a non-defective product even if a substrate crack similar to the inspection target portion occurs in the non-inspection target portion.

  In the case where the width of the common potential wiring 8 is not uniform and the width of the common potential wiring 8 gradually increases as the distance from the inspection target portion in the Y1 direction, the width of the common potential wiring 8 is increased in the non-inspection portion. It is not necessary to detect the lack of the common potential wiring 8 because of the large size. That is, since the width of the common potential wiring 8 at the inspection target location is minimized, it is necessary to detect the lack of the common potential wiring 8 at the inspection target location. On the other hand, in the case where the common potential wiring 8 is formed to have a substantially uniform width, the common potential wiring 8 is thin even at a place other than the inspection target part (non-inspection target part). It is preferable to detect chipping. For example, as shown in FIG. 7, in the inspection non-target portion, the cracks of the TFT substrate 1 generated in the inspection target portion that reach the common potential wiring 8 beyond the detection wiring 9 (see FIG. 5). When a large substrate crack occurs, the detection wiring 9 is disconnected, so that the detection wiring 9 is not conductive. As a result, it is determined that the common potential wiring 8 is missing. Also in this case, the panel is determined to be defective.

  In the present embodiment, as described above, the detection wiring 9 is arranged in the vicinity of the edge 1a of the TFT substrate 1 in the inspection target portion where the lack of the common potential wiring 8 is to be detected, and in the portion other than the inspection target portion. When the detection wiring 9 is arranged inside the vicinity of the edge 1a of the TFT substrate 1 and a substrate crack occurs so as to reach the common potential wiring 8 beyond the detection wiring 9 in the inspection target portion. Since the detection wiring 9 at the inspection target location is disconnected due to the substrate cracking, it can be detected that the common potential wiring 8 is missing at the inspection target location of the TFT substrate 1. On the other hand, when a substrate crack of the same degree as a substrate crack occurring in the inspection target portion occurs in a non-inspection portion (a portion other than the inspection target portion), the edge of the TFT substrate 1 in a portion other than the inspection target portion Since the width (interval) between the side 1a and the detection wiring 9 is larger than the width (interval) between the end side 1a of the TFT substrate 1 and the detection wiring 9 at the inspection target location, the detection at the non-inspection target location is performed. The wiring 9 is not disconnected. As a result, the lack of the common potential wiring 8 in the non-inspection location of the TFT substrate 1 is not detected, so the lack of the common potential wiring 8 in the non-inspection location is not detected, and the lack of the common potential wiring 8 in the inspection location. Can be detected.

  Further, in the present embodiment, as described above, the distance between the detection wiring 9 and the vicinity of the edge 1a of the TFT substrate 1 is gradually increased as the distance from the inspection target portion increases, so that the distance from the inspection target portion is slightly increased. Even in this case, the width (interval) between the edge 1a of the TFT substrate 1 and the detection wiring 9 is larger in the inspection non-target portion than in the inspection target portion. When a substrate crack occurs, it is possible to prevent the detection wiring 9 from being disconnected at the inspection target portion while the detection wiring 9 is not disconnected from the inspection non-target portion. Further, by forming the common potential wiring 8 so as to have a substantially uniform width, the common potential wiring 8 is thinned at a portion other than the inspection target portion (non-inspection portion). However, it is preferable to detect the lack of the common potential wiring 8. According to the present invention, in this case, it is possible to detect the occurrence of a large crack in the TFT substrate 1 at a non-inspected location and the occurrence of the chipping of the common potential wiring 8 by the disconnection of the detection wiring 9. However, an advantageous effect can be obtained.

  Further, in the present embodiment, as described above, the common potential wiring 8 is formed to have a substantially uniform width on the edge 1 a corresponding to the inspection target portion of the TFT substrate 1, and is provided along the outer periphery of the gate line 7. As a result, the distance between the edge 1a of the TFT substrate 1 and the common potential wiring 8 is larger in the non-inspection area than in the inspection object area, so that the edge 1a of the TFT substrate 1 and the detection wiring 9 The interval between can be increased.

  Further, in the present embodiment, as described above, the gate line 7 is configured such that the distance from the edge 1a of the TFT substrate 1 gradually increases as the distance from the inspection target portion increases, and along the outer periphery of the gate line 7 The common potential wiring 8 provided in this manner is configured such that the distance from the edge 1a of the TFT substrate 1 gradually increases as the distance from the inspection target portion increases, so that even when the inspection target portion is slightly away from the inspection target portion, the inspection is performed. Since the distance between the edge 1a of the TFT substrate 1 and the common potential wiring 8 is larger in the non-target area than in the inspection object area, the distance between the edge 1a of the TFT substrate 1 and the detection wiring 9 is larger. Can be increased.

  Further, in the present embodiment, as described above, the width of the detection wiring 9 is set to be equal to or less than the width of the common potential wiring 8 as compared with the case where the width of the detection wiring 9 is larger than the width of the common potential wiring 8. Since the detection wiring 9 can be easily disconnected, it can be easily detected that the common potential wiring 8 is missing.

  Further, in the present embodiment, as described above, the inspection target portion to be detected is positioned in the vicinity of the region where the corner portion of the counter substrate 2 and the surface of the TFT substrate 1 overlap in a plan view. It is possible to detect cracks in the detection wiring 9 and chipping of the common potential wiring 8 in the vicinity of the region where the corner of the substrate 2 and the surface of the TFT substrate 1 overlap.

  Further, in the present embodiment, as described above, the detection wiring 9 is configured to be able to inspect not only the lack of the common potential wiring 8 but also the crack of the TFT substrate 1 depending on whether or not the detection wiring 9 is disconnected. Since the inspection of the chipping of the potential wiring 8 and the crack of the TFT substrate 1 can be shared by using one detection wiring 9, it is possible to suppress an increase in the number of the detection wirings 9.

  8 to 10 are diagrams for explaining first to third examples of electronic equipment using the liquid crystal display device 100 according to the present embodiment. The electronic apparatus using the liquid crystal display device 100 according to the present embodiment will be described with reference to FIGS.

  As shown in FIGS. 8 to 10, the liquid crystal display device 100 according to the present embodiment includes a PC (Personal Computer) 200 as a first example, a mobile phone 300 as a second example, and a third example. It can be used for the personal digital assistant 400 (PDA: Personal Digital Assistants).

  In the PC 200 according to the first example of FIG. 8, the liquid crystal display device 100 according to the present embodiment can be used for the input unit 210 such as a keyboard and the display screen 220. In the mobile phone 300 according to the second example of FIG. 9, the liquid crystal display device 100 according to the present embodiment is used for the display screen 310. In the information portable terminal 400 according to the third example of FIG. 10, the liquid crystal display device 100 according to the present embodiment is used for the display screen 410.

  The embodiment disclosed this time should be considered as illustrative in all points and not restrictive. The scope of the present invention is shown not by the above description of the embodiments but by the scope of claims for patent, and further includes all modifications within the meaning and scope equivalent to the scope of claims for patent.

  For example, in the above-described embodiment, the example in which the distance between the detection wiring and the vicinity of the edge of the TFT substrate gradually increases as the distance from the inspection target portion is shown, but the present invention is not limited to this. In the present invention, the detection wiring is disposed near the edge of the TFT substrate at the inspection target portion, and the detection wiring may be disposed inside the edge of the TFT substrate at the non-inspection portion. For example, the detection wiring may be formed in a curved shape, or the detection wiring may be formed in a staircase shape.

  In the above embodiment, the example in which the width of the common potential wiring is formed to be substantially uniform has been described. However, the present invention is not limited to this. For example, as in the modification shown in FIG. 11, the width of the common potential wiring may be gradually increased along the Y1 direction. However, the portion corresponding to the non-inspection portion of the common potential wiring is disposed on the inner side of the end side of the TFT substrate than the portion corresponding to the inspection target portion of the common potential wiring.

  Moreover, although the example which applies a common potential wiring as an example of the wiring which detects the lack of this invention was shown in the said embodiment, this invention is not limited to this. For example, the present invention may be applied to a wiring other than the common potential wiring as an example of the wiring for detecting a defect.

  In the above embodiment, the example in which the width of the detection wiring is formed to be equal to or smaller than the width of the common potential wiring is shown, but the present invention is not limited to this. For example, the width of the detection wiring may be larger than the width of the common potential wiring.

  In the above embodiment, an example in which the detection wiring and the common potential wiring are formed on the TFT substrate has been described, but the present invention is not limited to this. For example, the detection wiring and the common potential wiring may be formed on the counter substrate.

  Moreover, although the said embodiment showed the example which made the location vicinity of the area | region where the corner | angular part of a counter substrate and the surface of a TFT substrate overlap as an inspection object location, this invention is not limited to this. For example, the inspection target location may be a location other than the location in the vicinity of the region where the corner portion of the counter substrate and the surface of the TFT substrate overlap.

DESCRIPTION OF SYMBOLS 1 TFT substrate (element substrate) 1a Edge 2 Opposite substrate 8 Common potential wiring (wiring) 9 Detection wiring 13 TFT (transistor element) 100 Liquid crystal display device 200 PC (electronic device) 300 Mobile phone (electronic device) 400 Information portable terminal (Electronics)

Claims (9)

A substantially rectangular element substrate and a counter substrate disposed so as to face each other while sandwiching the liquid crystal layer;
Wiring provided along the outer edge portion between the liquid crystal layer side surface of the element substrate and the liquid crystal layer of the element substrate and the counter substrate;
The wiring is provided along the outer periphery of the wiring, and includes at least a detection wiring for detecting a chipping of the wiring depending on whether or not it is disconnected,
In the first location where the chipping of the wiring is to be detected, the detection wiring is arranged in the vicinity of one end side of the element substrate and the counter substrate, and the first part of the wiring board is to detect the chipping of the wiring. In the second place other than the place, the detection wiring is arranged inside the vicinity of one end side of the element substrate and the counter substrate.   The detection wiring is arranged in the vicinity of one end of the element substrate and the counter substrate at the first location, and one of the element substrate and the counter substrate at the second location. It is arranged inside the vicinity of the end side, and the distance between the detection wiring and the vicinity of one end side of the element substrate and the counter substrate gradually increases as the distance from the first location increases. The liquid crystal display device according to claim 1, which is configured. The element substrate and the counter substrate are an element substrate including a transistor element and a counter substrate, respectively.
The wiring includes a common potential wiring provided between the liquid crystal layer side surface of the element substrate and the liquid crystal layer,
The detection wiring is provided along the outer periphery of the common potential wiring between the surface of the element substrate on the liquid crystal layer side and the liquid crystal layer, and at least the common potential wiring is missing depending on whether or not it is disconnected. Is configured to be detectable,
In the first place, the common potential wiring and the detection wiring are arranged in the vicinity of the edge of the element substrate. In the second place, the common potential wiring and the detection wiring are in the vicinity of the edge of the element substrate. The liquid crystal display device according to claim 1, wherein the liquid crystal display device is disposed on the inner side. A gate line provided on the surface of the element substrate;
A portion of the gate line that is located in a region other than the region corresponding to the first location is closer to the first location of the element substrate than a portion of the gate line that is located in a region corresponding to the first location. It is located inside the corresponding edge,
4. The liquid crystal according to claim 3, wherein the common potential wiring is formed with a substantially uniform width at an end corresponding to the first portion of the element substrate, and is provided along an outer periphery of the gate line. Display device. The gate line is configured such that the distance from the edge of the element substrate gradually increases as the distance from the first location increases.
The said common potential wiring provided along the outer periphery of the said gate line is comprised so that the space | interval with the edge of the said element substrate may become large gradually as it leaves | separates from the said 1st location. Liquid crystal display device.   The liquid crystal display device according to claim 3, wherein a width of the detection wiring is equal to or less than a width of the common potential wiring. The surface area of the counter substrate is formed smaller than the surface area of the element substrate,
The liquid crystal according to any one of claims 3 to 6, wherein the first location to be detected is in the vicinity of a region where a corner portion of the counter substrate and a surface of the element substrate overlap in plan view. Display device.   The detection wiring according to any one of claims 1 to 7, wherein the detection wiring is configured to be capable of inspecting not only the chipping of the wiring but also one of the element substrate and the counter substrate depending on whether or not the wire is disconnected. 2. A liquid crystal display device according to item 1.   An electronic apparatus comprising the liquid crystal display device according to claim 1.

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