JP2011085501A - X-ray inspection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To facilitate understanding results of inspection, while reducing mistake possibility in an X-ray inspection device constituted so as to superpose results of contamination inspection and defective article inspection on the X-ray perspective image of an inspection target to display them. <P>SOLUTION: In the display form of the defective article inspection results, a mark GL exhibiting the absence of a defective article is superposed on the image P of the inspection target in addition to a mark NL exhibiting the presence of the defective article to be displayed to clarify that the inspection target is a normal article. Even if a pattern or the like appears on the image P of the inspection target, a mistake is prevented. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to an X-ray inspection apparatus that performs foreign object inspection and missing item inspection by image processing of an X-ray fluoroscopic image of an inspection object.

  In an X-ray inspection apparatus, generally, a structure in which an X-ray generator and an X-ray detector are arranged opposite to each other and a conveyor for conveying an inspection object is used between them is often used, and the inspection object generates X-rays. An X-ray fluoroscopic image of the inspection object is constructed by collecting X-rays transmitted through the inspection object when passing between the apparatus and the X-ray detector. By processing the X-ray fluoroscopic image, foreign matter inspection to determine whether foreign matter is mixed in the inspection target, whether the inspection target has cracks or chips, or whether the inspection target is specified Inspection of missing items such as whether it is within the range of size.

  The foreign substance inspection result and the missing part inspection result are displayed on the screen of a display that displays an X-ray fluoroscopic image so as to be superimposed on the corresponding inspection object image (see, for example, Patent Document 1).

  The inspection results are displayed as follows: For foreign matter inspection results, the position where foreign matter is present on the inspection object image is filled in. For out-of-stock inspection results, a specified mark is attached to the inspection subject with missing parts. By this means, the operator is notified.

JP 2009-68910 A (page 9, lines 1-6)

  By the way, foreign object inspection and missing part inspection are performed using a plurality of mutually different evaluation methods, and the foreign object inspection result and the missing part inspection result are images of defective products using colors corresponding to the respective evaluation methods. A method of overlaying and displaying a fill or a mark on the screen is often used.

  For this reason, it is difficult to determine which inspection result corresponds to the mark or fill applied to the X-ray fluoroscopic image of the inspection object, that is, it is difficult to determine whether the foreign object is mixed or missing. There is a problem.

  Further, as illustrated in FIG. 4A, when a pattern or the like appears as a grayscale image D on the X-ray fluoroscopic image P of the inspection object, the missing part inspection result as shown in FIG. There is a possibility that it will be mistaken for the mark M indicating that it is present, and there is a possibility that it will be judged as a missing item although it is a normal product.

  Further, as described above, the foreign object inspection and the shortage inspection are configured to be determined using a plurality of evaluation methods. In each determination method, for example, an image density threshold or Alternatively, the upper and lower limit values of the perimeter are used as parameters, and the operator is notified of the level of the inspection result relative to the threshold and the upper and lower limits of the perimeter, or these thresholds and perimeter In order to make it possible to finely adjust the upper and lower limits of the length, it is displayed with a level gauge, etc., but if there are multiple types of evaluation methods for foreign matter inspection and missing item inspection, A plurality of level gauges will be displayed, and there is also a problem that it is difficult to understand what effect the adjustment of the gauge parameters will have on the inspection result.

  The present invention has been made in view of such circumstances, and in an X-ray inspection apparatus configured to display a foreign object inspection result and a missing part inspection result superimposed on an X-ray fluoroscopic image of an inspection object, The first problem is to make the results easy to understand. In addition, the second problem is to provide an X-ray inspection apparatus in which parameter adjustment and the like are less likely to be mistaken than in the past.

  In order to solve the above problems, an X-ray inspection apparatus according to the present invention irradiates an inspection object with X-rays from an X-ray generation apparatus and detects the transmitted X-rays with an X-ray detector. A fluoroscopic image display means for displaying an X-ray fluoroscopic image of an object, a foreign substance inspection means for determining the presence or absence of a foreign substance in the inspection object by image processing using the X-ray fluoroscopic image, and the X-ray fluoroscopic image are used. The missing item inspection means for inspecting the missing item of the inspection object by image processing, and the inspection result by the foreign matter inspection means and the missing item inspection means are superimposed on the corresponding inspection object image on the image by the fluoroscopic image display means. In the X-ray inspection apparatus provided with the inspection result display means for displaying, the display form of the shortage inspection result by the inspection result display means is superimposed on the inspection object image with marks corresponding respectively to the presence or absence of the shortage Depending on the display format Characterized (claim 1).

  Here, in the present invention, there is provided a result display selection means for switching the display of the inspection result by the inspection result display means to one or both of the foreign matter inspection result and the missing part inspection result (claim 2). ) Can be suitably employed.

  In the present invention, there is also provided an evaluation result information display means for displaying information related to the respective evaluation results by the foreign matter inspection means and the missing part inspection means, and the display by the evaluation result information display means is the result display selection More preferably, only one of the evaluation result information by the foreign substance inspection means and the missing part inspection means is displayed corresponding to the selection status of the means (claim 3).

  The present invention relates to the display of the shortage inspection result, by marking the inspection object that is determined to have no shortage by marking a mark to that effect, It tries to solve the problem.

  That is, not only is a mark placed on an X-ray fluoroscopic image of an inspection object with a missing item, but an X-ray fluoroscopic image of an inspection object that has been determined to be missing is also marked with no mark. Attached. As a result, even when a pattern appears in the inspection object image, the possibility that the pattern or the like may be mistaken for a mark can be reduced, and the first problem can be solved.

  Further, as in the invention according to claim 2, if one or both of the display of the result of the foreign substance inspection and the result of the shortage inspection is selectively displayed, the mistake of the mark can be further reduced. Can do.

  Then, as in the invention according to claim 3, in accordance with the selection status of the display of the inspection result, that is, in conjunction with the selection status, information related to each evaluation result of the foreign object inspection and the shortage inspection (that is, the above-mentioned If only the inspection for one of the level gauges, etc.) is displayed, the possibility of erroneously setting the intended parameter during the fine adjustment of the parameter for evaluation, etc. is reduced. And the second problem can be solved.

  According to the present invention, as a result of the shortage inspection, not only a shortage but also a shortage is displayed on the X-ray fluoroscopic image of the inspection object, so that a mark to that effect is displayed. Therefore, it is possible to clearly notify the operator that there is no shortage, and it is possible to reduce the possibility that the pattern appearing on the inspection object and the mark of the inspection result are mistaken as compared with the conventional case.

  Further, as in the invention according to claim 2, it is possible to select either one or both of the display of the result of the foreign substance inspection and the result of the shortage inspection, thereby further reducing the misunderstanding of the mark. can do.

  Then, as in the invention according to claim 3, only one of the evaluation result information of the foreign substance inspection and the evaluation result information of the missing part inspection is displayed in conjunction with the selection state of the inspection result display. If configured, when a parameter of a certain evaluation method is finely adjusted, the possibility of occurrence of a malfunction such as erroneously adjusting a parameter different from the intended one can be reduced.

In the configuration diagram of the embodiment of the present invention, a schematic diagram showing a mechanical configuration and a block diagram showing a system configuration are shown together. It is a figure which shows the example of the display content of the X-ray fluoroscopic image in embodiment of this invention, (A) is the state which selected the display of only a foreign material inspection result, (B) is a display of a missing item inspection result in addition to it. It is a figure showing the state which respectively selected. In the explanatory view of the usefulness of the embodiment of the present invention, (A) does not display a mark indicating that the missing part inspection result is normal, and (B) shows that the missing part inspection result is normal. It is a figure which shows the case where a mark is displayed. It is explanatory drawing of the example which is hard to discriminate | determine the display of the missing part inspection result by the conventional X-ray inspection apparatus, and the pattern which appears in the fluoroscopic image of a test target object.

DESCRIPTION OF SYMBOLS 1 X-ray generator 2 X-ray line sensor 3 Conveyor 4 Image formation part 5 Photoelectric sensor 6 Image memory 7 Display control part 8 Monitor and operation part 9 Image processing part 10 Control part 11 Conveyance drive circuit W Inspection object

Hereinafter, embodiments of the present invention will be described with reference to the drawings.
As shown in the block diagram of the embodiment of the present invention in FIG. 1, an X-ray generator 1 and an X-ray line sensor 2 are arranged to face each other, and a conveyor 3 for conveying an inspection object W between them. Is arranged. The X-ray generator 1 outputs fan beam-shaped X-rays through a slit or the like, and the X-ray line sensor 2 is arranged so that a plurality of elements are arranged in the fan beam-shaped X-ray spreading direction. Yes. In FIG. 1, the elements of the X-ray line sensor 2 are arranged in a direction perpendicular to the paper surface. The inspection object 3 is conveyed by the conveyor at a constant speed in a direction perpendicular to the fan beam-shaped X-ray spreading direction.

  The output of the X-ray line sensor 2, that is, the one-dimensional dose distribution of incident X-rays is always taken into the image forming unit 4. A photoelectric sensor 5 is disposed upstream of the pair of the X-ray generator 1 and the X-ray line sensor 2 in the conveyance direction of the inspection object W by the conveyor 3, and the image forming unit 4 outputs the photoelectric sensor 5. The two-dimensional X-ray including the image of the inspection object W is detected by arranging the one-dimensional dose distribution output from the X-ray line sensor 2 in time order with the arrival of the inspection object W detected by Construct a perspective image.

  The fluoroscopic image constructed as described above is taken into the image memory 6, displayed on the monitor / operation unit 8 via the display control unit 7, and used for processing by the image processing unit 9. The image processing unit 9 extracts an image of the inspection object W from the X-ray fluoroscopic image using a density threshold value, and performs a foreign substance inspection process and a missing part inspection process on the extracted inspection object image. Here, for the foreign substance inspection processing, for example, a plurality of evaluation methods such as an evaluation method using a density threshold value for detecting a foreign substance and an evaluation method using a foreign substance filter, and three types of evaluation methods are prepared in this embodiment. ing. In addition, for the shortage inspection process, a plurality of evaluation methods such as an evaluation method using the upper and lower limits of the area of the image and the peripheral length, and three types of evaluation methods are prepared in this embodiment. Parameters such as the density threshold value and the upper and lower limit values of the area used in each of these evaluation methods can be set or adjusted by operating the monitor / operation unit 8, and the set values are processed by the image processing unit 10 via the control unit 10. Supplied to section 9. Here, in this embodiment, the shortage inspection process is not performed for the inspection object that has been determined to have a foreign object by the foreign object inspection process.

  The results of the foreign substance inspection process and the missing part inspection process performed by the image processing unit 9 are supplied to the display control unit 7 and used as information for displaying an inspection result mark superimposed on an image of the inspection object W, which will be described later. . Further, the display of a mark or the like on the X-ray fluoroscopic image based on the foreign substance inspection result and the missing part inspection result can be selected by the operation of the monitor / operation unit 8 as described later.

  The image forming unit 4, the image memory 6, the display control unit 7, and the image processing unit 9 are placed under the control of the control unit 10. Further, the transport drive circuit 11 that drives the conveyor 3 is also placed under the control of the control unit 10. Here, the image forming unit 4, the image memory 6, the display control unit 7, the image processing unit 9, and the control unit 10 are actually configured by a computer and its peripheral devices, and realize functions according to installed programs. However, in FIG. 1, each main function is represented by a block.

  Now, in the embodiment of the present invention having the above configuration, as described above, the X-ray fluoroscopic image of the inspection object W is displayed on the monitor / operation unit 8, and on the inspection object image, The marks representing the foreign object inspection result and the missing part inspection result are displayed in a superimposed manner, the details of which will be described below.

  2A and 2B are diagrams showing examples of display contents of the monitor and operation unit 8 in the embodiment of the present invention. Among these, (A) is a display content in a state where it is selected not to display a missing part inspection result, and (B) is a display content in a state where it is selected to display a missing part inspection result. In these drawings, T is an X-ray fluoroscopic image display unit, Q is a level gauge display unit for each evaluation method, and P is an inspection object image.

  In a state where it is selected not to display the shortage inspection, as shown in FIG. 2A, it is determined that there is a foreign object on the inspection object image P in the display unit T of the X-ray fluoroscopic image by the foreign object inspection result. The foreign object detection mark NS obtained by painting out the foreign object image is superimposed and displayed only on the printed image. At the same time, level gauges S1, S2, and S3 of the three evaluation methods for foreign matter inspection are displayed on the display unit Q of the level gauge.

  On the other hand, in the state in which the display of the shortage inspection is selected, as shown in FIG. 2 (B), there is a foreign matter on each inspection object image P in the X-ray fluoroscopic image display portion T due to the foreign matter inspection result. The foreign object detection mark NS is displayed in a superimposed manner on what is determined to be, and among those determined to have no foreign object, the defective product abnormality mark NL is displayed in a superimposed manner on those determined to be abnormal. The missing item normal mark GL is superimposed and displayed on the item determined to have a normal missing item inspection result. At the same time, level gauges L1, L2, and L3 of the two evaluation methods for the shortage inspection are displayed on the display unit Q of the level gauge.

  According to such a display, there is no foreign matter, and the inspection object for which the out-of-stock inspection result is determined to be normal, that is, the non-defective product is marked with a mark GL and is not marked with a foreign matter, or It becomes clear that the product is out of stock, and the operator does not make a mistake.

  In addition, in the non-display state of the missing part inspection result, only the level gauges S1 to S3 of the evaluation method for the foreign object inspection are displayed in conjunction with the selection, and in the display state of the missing part inspection result, the selection is similarly performed. In conjunction with this, only the level gauges L1 to L3 of the evaluation method for the missing part inspection are displayed. Therefore, in the fine adjustment of the parameter of the evaluation method of the foreign substance inspection and the fine adjustment of the parameter of the evaluation method of the missing part inspection, A level gauge corresponding to the intended evaluation method can be found without mistake.

  And according to such a display method, even if it is an inspection target with a pattern as illustrated in FIG. 4 described above, it is possible to reduce the possibility of mistaking this and the inspection result. That is, as shown in FIG. 3 (A), when a mark indicating that the missing item inspection result is normal is not displayed, and when a pattern D appears in the inspection object image P, the operator can inspect the missing item. While the mark NL is abnormal, there is a risk that a normal inspection object may be determined to be abnormal, whereas as shown in FIG. By displaying GL, even if the pattern D appears, it becomes clear that it is a normal product, and the above-described fear is unlikely to occur.

  In the above embodiment, the foreign substance inspection result is always displayed, and it is configured to select whether to display the missing part inspection result together with the display. However, only the foreign object inspection result is displayed. It is also possible to configure to select only the inspection result or both of them.

  Further, although the example in which the foreign object mark NS is filled with the foreign object image is shown, other dedicated marks may be displayed in a superimposed manner.

Claims (3)

A fluoroscopic image display means for displaying an X-ray fluoroscopic image of the inspection object obtained by irradiating the inspection object with X-rays from the X-ray generator and detecting the transmitted X-ray with an X-ray detector, and the X Foreign matter inspection means for determining the presence or absence of foreign matter in the inspection object by image processing using a fluoroscopic image, and missing part inspection means for inspecting a shortage of the inspection object by image processing using the X-ray fluoroscopic image And an X-ray inspection apparatus comprising inspection result display means for superimposing and displaying the inspection result by the foreign matter inspection means and the missing part inspection means on the corresponding inspection object image on the image by the fluoroscopic image display means,
An X-ray inspection apparatus characterized in that the display form of the shortage inspection result by the inspection result display means is a form in which marks corresponding to both the presence and absence of a shortage are respectively displayed in a superimposed manner on the inspection object image.   2. The X-ray according to claim 1, further comprising a result display selection means for switching the display of the inspection result by the inspection result display means to one or both of the foreign object inspection result and the missing part inspection result. Inspection device.   Evaluation result information display means for displaying information related to the respective evaluation results by the foreign substance inspection means and the shortage inspection means, and the display by the evaluation result information display means corresponds to the selection status of the result display selection means. 3. The X-ray inspection apparatus according to claim 2, wherein only one of the determination result information obtained by the foreign matter inspection means and the shortage inspection means is displayed.

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