JP2011043380A - Method and device for inspecting liquid crystal display device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method and a device for inspecting a liquid crystal display device which enable execution of pressing work under proper pressing conditions, and reduction in detection omission of potential short-circuit defects. <P>SOLUTION: By using the inspection device including a pressure sensor sheet 2 which has a pressure information acquisition means for quantitatively detecting a pressure applied to the image display surface 1a of a liquid crystal display device 1, and a position information acquisition means for acquiring the position of the detection of the pressure as coordinates, pressure information and position information of pressing work by an inspector 6 can be managed quantitatively. Moreover, since the quality of the pressing work can be determined by comparing pressing parameters of the pressing work calculated on the basis of these pieces of pressure information and position information, with specified pressing condition values stored in a memory 33 previously, the pressing work can be always performed under the proper pressing conditions, and detection omission of the potential short-circuit defects can be reduced, so that the accuracy of detection is enhanced. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to an inspection method and an inspection apparatus with high detection accuracy capable of reducing detection omission in an inspection process for detecting a short-circuit defect occurring between electrodes provided on opposing substrates of a liquid crystal display device. .

  A liquid crystal display device controls the orientation of liquid crystal molecules by sandwiching liquid crystal between electrodes provided on two opposing glass substrates and applying a voltage as an image display command signal to the liquid crystal. In addition, an image is displayed using incident light from outside, a color filter, and the like. In the liquid crystal display device configured in this way, in the manufacturing process, a short circuit between electrodes occurs due to contamination of metal foreign matter between opposing electrodes or etching failure at the time of electrode formation, resulting in point defects or line defects on the image display surface. It may become.

  The occurrence of such a short-circuit defect is affected by the shape and size of the mixed foreign matter and the bending of the substrate. For this reason, in the short-circuit defect inspection process that detects a short-circuit defect and specifies the position, the distance between the electrodes facing each other is reduced by pressing the image display surface, and a potential short-circuit defect that may cause a short-circuit between the electrodes is revealed. Detection was performed. This pressing operation is difficult to automate in terms of cost and inspection tact time, and has been conventionally performed manually by an inspector. For example, Patent Document 1 proposes a method of detecting a short-circuit defect by pressing with a rubber roller instead of a worker's finger for the purpose of improving workability of pressing work.

  As an inspection method for detecting a short-circuit defect of a liquid crystal panel, for example, in Patent Document 2, positioning is performed with the display panel and the touch panel facing each other, the operation point of the touch pen is specified as coordinates on the touch panel, and the specified coordinates are determined. A method for memorizing as a defective portion is proposed. In this example, a vertical positioning means is provided on the touch pen so that no deviation occurs between the coordinates specified on the touch panel and the actual defect position.

JP-A 63-293581 JP 2008-26631 A

  As described above, in the conventional short-circuit defect inspection method, the pressing operation on the image display surface is performed manually by the inspector, so that the pressing force, pressing time, pressing position, etc. in the pressing operation cannot be quantitatively managed. There was a problem. For this reason, there is a problem that the operation is not performed under proper pressing conditions, and detection of a potential short circuit defect occurs due to insufficient pressing force and insufficient pressing time. These problems cannot be solved even by the inspection method using the rubber roller presented in Patent Document 1.

  Moreover, the inspection method using the touch panel presented in the cited document 2 is a method in which the position of the touch panel corresponding to the defective part recognized by the inspector through the touch panel is pressed with a touch pen to specify coordinates, The press work for making the short circuit defect obvious is not implemented. For this reason, there is a possibility of detection failure of a potential short circuit defect. As described above, none of the conventional short-circuit defect inspection methods quantitatively manages the pressing operation for making the potential short-circuit defect manifest.

  The present invention has been made in order to solve the above-described problems. A liquid crystal display capable of performing a pressing operation under an appropriate pressing condition and capable of reducing detection failure of a potential short-circuit defect. An object is to provide a method for inspecting a device. Another object of the present invention is to provide an inspection device for a liquid crystal display device with high detection accuracy of a short-circuit defect.

  An inspection method for a liquid crystal display device according to the present invention is an inspection method for a liquid crystal display device that detects a short-circuit defect that occurs between electrodes provided on opposing substrates of the liquid crystal display device. A preparatory step in which a pressure sensor sheet is arranged facing the display surface, the liquid crystal display device is turned on by a drive signal from the control means, and a predetermined pressing condition specified value for the model of the liquid crystal display device is read from the storage means And a pressing work process in which an inspector presses the image display surface from the pressure sensor sheet, and pressure information and position information for each pressing work are acquired from the pressure sensor sheet based on the pressing condition specified value. Based on these, the pressing parameter calculation step for calculating the pressing parameter of the pressing work and the pressing parameter and the pressing condition prescribed value are compared to determine whether the pressing work is good or bad. A work pass / fail judgment step for notifying the pass / fail judgment result to the inspector, and when the inspector detects a short-circuit defect on the image display surface, a defect detection information input step for inputting this to the control means as defect detection information; , Including a defect coordinate storage step of acquiring position information of the short-circuit defect detected by the inspector from the pressure sensor sheet and storing it in the storage means.

  An inspection apparatus for a liquid crystal display device according to the present invention is an inspection apparatus for a liquid crystal display device that detects a short-circuit defect that occurs between electrodes provided on opposing substrates of the liquid crystal display device. A control means for supplying a drive signal for turning on the light, a pressure information acquisition means arranged to face the image display surface of the liquid crystal display device and quantitatively detect the pressure applied to the image display surface, and the pressure The pressure sensor sheet having a position information acquisition means for acquiring the position where the pressure is detected as coordinates, and the pressure information and position information of the pressing work are acquired from the pressure sensor sheet every time the inspector presses the image display surface. The work pass / fail judgment means for comparing the press parameters of the press work calculated based on these and the press condition stipulated values stored in advance in the storage means to judge pass / fail of the press work. The image display means, the instruction means for displaying the pass / fail judgment result and work correction instruction output by the work pass / fail judgment means, and the defect detection information when the inspector detects a short-circuit defect on the image display surface. As an input means for inputting to the control means.

  According to the inspection method of the liquid crystal display device according to the present invention, since the inspector performs the operation of pressing the image display surface from the pressure sensor sheet based on the preset pressing condition specified value, The inspection can be performed under a pressing condition suitable for the characteristics of the liquid crystal display device to be inspected, and detection failure of a potential short-circuit defect can be reduced. In addition, pressure information and position information for each pressing operation is obtained from the pressure sensor sheet, and the quality of the pressing operation is determined based on this information and notified to the inspector. Therefore, the pressing operation is always performed under appropriate pressing conditions. And detection failure of a potential short circuit defect due to an inspector's operation mistake can be reduced.

  According to the inspection apparatus for a liquid crystal display device according to the present invention, the pressure information acquisition means for quantitatively detecting the pressure applied to the image display surface of the liquid crystal display device, and the position where the pressure is detected is acquired as coordinates. Since the pressure sensor sheet having the position information acquisition means is provided, each time the inspector presses the image display surface, the pressure information and the position information of the press work are acquired and calculated based on these. Since it is possible to compare the pressing parameter of the pressing work with the pressing condition stipulated value stored in the storage means in advance, the quality of the pressing work can be determined, so that the pressing work can always be performed under appropriate pressing conditions. It is possible to reduce detection omissions of potential short circuit defects due to work mistakes of the inspector, and the detection accuracy is improved.

It is the schematic which shows the structure of the test | inspection apparatus of the liquid crystal display device which concerns on Embodiment 1 of this invention. It is a fragmentary sectional view which shows the liquid crystal display device which is a test object of the test | inspection apparatus of the liquid crystal display device which concerns on Embodiment 1 of this invention. It is a figure explaining the test | inspection method of the liquid crystal display device which concerns on Embodiment 1 of this invention.

Embodiment 1 FIG.
Hereinafter, an inspection apparatus for a liquid crystal display device according to Embodiment 1 of the present invention will be described with reference to the drawings. FIG. 1 is a schematic diagram showing an inspection apparatus for a liquid crystal display device according to Embodiment 1 of the present invention. FIG. 2 is a partial cross-sectional view schematically showing a liquid crystal display device to be inspected by the inspection apparatus in the first embodiment. The liquid crystal display device inspection apparatus according to the first embodiment detects a short-circuit defect that occurs between electrodes provided on opposing substrates of a transmissive and transflective liquid crystal display device. The configuration and arrangement of each electrode of the target liquid crystal display device are not particularly limited.

  First, a short-circuit defect of the liquid crystal display device detected by the inspection apparatus according to the first embodiment will be described with reference to FIG. Two glass substrates 101 and 103 constituting the liquid crystal display device 100 are arranged to face each other, one glass substrate 101 has a counter electrode 102, and the other glass substrate 103 has a source line (or gate line) 104 and a pixel electrode. 105 is provided. These substrates 101 and 103 sandwich a liquid crystal material 106 via a liquid crystal alignment film (not shown). In addition, a drive circuit is mounted on the periphery of the substrate of the liquid crystal display device 100, and a backlight (none of which is shown) is mounted on the back.

  In the first embodiment, the liquid crystal display device to be inspected is in a module state in which a drive circuit and a backlight are mounted, but in a panel state before mounting each circuit. Also good. In that case, an inspection signal is input from the drive circuit to display an image, and a backlight is disposed on the back of the panel.

  In the example shown in FIG. 2, dusts 107 and 108 exist in the liquid crystal material 106 of the liquid crystal display device 100. These dusts 107 and 108 are peeling generated in the patterning process, dust entering from the outside, and the like. However, when these are conductive substances, they may cause a short-circuit defect. For example, when the dust 107 is a conductive substance and contacts the counter electrode 102 and the pixel electrode 105 at the same time, the electrodes 102 and 105 are short-circuited, and a point defect or a line defect is generated on the image display surface of the liquid crystal display device 100.

  In FIG. 2, the dust 107 is in contact with the pixel electrode 105 and is not in contact with the counter electrode 102. As described above, even if the dust 107 is not in contact with the electrodes on both sides at the same time, there is a possibility that a short-circuit defect may occur due to movement in the liquid crystal material 106. That is, it can be said that the place where the dust 107 exists is a place of "potential short circuit defect". On the other hand, the dust 108 is not in contact with any electrode, does not move in the liquid crystal material 106, and does not come into contact with the electrodes on both sides due to the bending of the glass substrate 101, or non-conductive substances. In the case of dust, it is not a potential short circuit defect.

The inspection apparatus for the liquid crystal display device according to the first embodiment is intended to detect a potential short-circuit defect location as described above in addition to a location where a short-circuit defect has already occurred. In order to detect a potential short-circuit defect, it is effective to press the appropriate position of the glass substrate 101 with an appropriate pressure to make the potential short-circuit defect manifest. In the case of the example shown in FIG. 2, when the elastic glass substrate 101 is pressed and bent from the image display surface 101 a side (upper side), the counter electrode 102 provided on the glass substrate 101 is similarly bent and is made of a conductive substance. A short circuit occurs upon contact with a certain dust 107.

  Next, the pressing condition (pressing parameter) in the pressing work when making a potential short-circuit defect appear will be described. In order to reveal a potential short circuit defect, the degree of bending of the image display surface 101a of the glass substrate 101 is important, and it is necessary to press an appropriate position on the entire image display surface 101a with an appropriate pressure. The reason is that a potential short-circuit defect is likely to appear near the pressing position. Therefore, if there is a point that is not pressed in the image display surface 101a, even if a potential short-circuit defect exists in the vicinity, the potential short-circuit defect is not revealed. This is because a detection failure may occur.

  In addition, even when the pressing force and the pressing time are insufficient, sufficient deflection for revealing a potential short-circuit defect cannot be obtained, resulting in detection failure. Since the periphery of the liquid crystal display device 100 to be inspected is usually fixed by a frame, the outer side of the image display surface 101a is less likely to bend from the inner side, and is more likely to bend toward the center. For this reason, it is necessary to continuously increase the pressing force (load value) from the central portion to the end portion of the image display surface 101a. Further, since the internal structure of the liquid crystal, the image display surface size, and the pixel size are different depending on the model of the liquid crystal display device 1, the necessary pressing conditions are different. The pressing condition specified value is set in consideration of the above points.

  A configuration of the inspection apparatus for the liquid crystal display device according to the first embodiment will be described with reference to FIG. The liquid crystal display device 1 to be inspected is placed and fixed on an inspection stage (not shown). A control computer 3 for controlling the entire inspection apparatus is connected to the liquid crystal display device 1. The control unit 31 as control means supplies a drive signal for lighting the liquid crystal display device 1. When this drive signal is input, the liquid crystal display device 1 is in a drive state. Further, the control computer 3 may be connected to a network, and the inspection results of the liquid crystal display device 1 may be totaled and managed.

  The pressure sensor sheet 2 is disposed and fixed facing the image display surface 1 a of the liquid crystal display device 1. The pressure sensor sheet 2 includes pressure information acquisition means for quantitatively detecting the pressure applied to the image display surface 1a and position information acquisition means for acquiring the position where the pressure is detected as coordinates. As the position information acquisition means, for example, there is one that specifies the position of the center of gravity of the contact surface as a coordinate based on the contact of the pressing tool (not shown) on which the inspector 6 performs the pressing work with the pressure sensor sheet 2. .

  The material constituting the pressure sensor sheet 2 is preferably a transparent material that allows the inspector 6 to visually recognize the short-circuit defect on the image display surface 1 a via the pressure sensor sheet 2. However, as long as the visibility of the inspector 6 is not lowered or the visibility is improved, the material can be used even if it is not a transparent material.

  A control computer 3 is connected to the pressure sensor sheet 2. The work pass / fail judgment unit 32 that is a work pass / fail judgment unit of the control computer 3 acquires pressure information and position information of the press work from the pressure sensor sheet 2 every time the inspector 6 presses the image display surface 1a. Based on these, the pressing parameter of the pressing operation is calculated. Furthermore, the calculated pressing parameter is compared with a pressing condition specified value stored in advance in the memory 33 which is a storage means, and the quality of the pressing operation is determined. The pressing parameter includes a load value, a pressing area, a pressing force, and a pressing time on the image display surface 1a.

When the inspector 6 detects a short-circuit defect on the image display surface 1a, the input unit 4 is a unit that inputs this as "defect detection information" to the control unit 31, and is configured by a keyboard, a button switch, or the like, for example. The When the defect detection information input by the inspector 6 is received, the control unit 31 outputs a “defect position pressing instruction” that causes the inspector 6 to press the position of the short-circuit defect. Further, when the inspector 6 detects a short-circuit defect and inputs the defect detection information, the memory 33 stores the pressure information and position information of the pressing work immediately before that. Further, the memory 33 stores position information from the pressure sensor sheet 2 when the inspector 6 presses the position of the short-circuit defect based on the defect position pressing instruction as coordinate information of the short-circuit defect.

  The instruction unit 5 includes an image display unit, and displays a quality determination result and a work correction instruction output by the work quality determination unit 32. The work quality determination unit 32 displays the work correction instruction for the pressing work in real time on the instruction unit 5 when the quality determination of the pressing work by the inspector 6 is “No”. In addition, the instruction means 5 displays a pressing condition prescribed value stored in advance in the memory 33, pressure information and position information in the current pressing operation, a defect position pressing instruction, and the like, and notifies the inspector 6.

  As an example of the screen displayed on the image display means of the instruction means 5, the work correction instruction is a graph display updated in real time in the case of a numerical condition such as a pressing force, and an appropriate numerical range is displayed in the graph. This makes it easier for the inspector 6 to visually recognize. Further, all the pressed points on the image display surface 1a may be displayed, and further, the points already pressed by the inspector 6 and the unpressed points may be distinguished and displayed. Alternatively, unpressed points may be displayed, the points pressed under appropriate conditions may disappear sequentially, and the operation may be completed if all the unpressed points disappear. Thereby, the inspector 6 can easily confirm the unpressed point.

  Furthermore, it is preferable that the instruction unit 5 includes a voice notification unit so that the inspector 6 can continue the work without confirmation by the image display unit. Thereby, only when the result of the quality judgment by the work quality judgment unit 32 is “No”, the inspector 6 can be notified by voice or alarm sound, and the efficiency of the work is improved.

  Next, a short circuit defect inspection method for a liquid crystal display device will be described with reference to the flowchart of FIG. In FIG. 3, the work surrounded by the ellipse frame indicates work by the inspector 6, and the process surrounded by the square frame indicates processing by the inspection apparatus. Further, as an operation prior to step 1 (S1) shown in FIG. 3, for each model of the liquid crystal display device 1 to be inspected, a pressing condition specified value (load value on the image display surface) that is a specified value of the pressing parameter. , The pressing area, the pressing force, and the pressing time) are set and stored in the memory 33.

  First, in step 1 (S1), the liquid crystal display device 1 to be inspected and the control computer 3 are connected, and the pressure sensor sheet 2 is disposed facing the image display surface 1a of the liquid crystal display device 1. Next, in step 2 (S2), the backlight of the liquid crystal display device 1 is turned on. During the inspection, the backlight is always turned on. Next, according to a drive signal from the control unit 31 of the control computer 3, the liquid crystal display device 1 is turned on to be in a drive state. At this time, the image display surface 1a of the liquid crystal display device 1 is set to black display in which a short circuit defect is easily visible. Further, in step 2, a predetermined pressing condition value for the model of the liquid crystal display device 1 is read from the memory 33. (Preparation process).

  Subsequently, in step 3 (S3), the inspector 6 performs an operation of pressing the image display surface 1a of the liquid crystal display device 1 from the pressure sensor sheet 2 on the basis of the pressing condition specified value displayed on the instruction unit 5. Implement (press work process). This pressing work is assumed to be performed by a pressing tool operated by the inspector 6. For example, the pressing tool is moved by the inspector 6, and the pressing work is mechanically performed by a switch operation of the inspector 6. It is also possible to make a semi-automatic configuration as described in (1).

  Next, in step 4 (S <b> 4), the work quality determination unit 32 of the control computer 3 acquires pressure information and position information for each pressing work of the inspector 6 from the pressure sensor sheet 2. Subsequently, in step 5 (S5), the pressing parameter of the pressing operation is calculated based on the pressure information and position information acquired in step 4 (pressing parameter calculation step). The pressing parameters include a load value, a pressing area, a pressing force, and a pressing time on the image display surface 1a.

  Furthermore, in step 6 (S6), the work quality determination unit 32 compares the pressing parameter calculated in step 4 with the pressing condition stipulated value stored in the memory 33, and determines the quality of the pressing work. The quality determination result is displayed on the instruction means 5 and notified to the inspector 6 (operation quality determination step). If it is determined in step 6 that the current pressing operation is good or bad, the work quality determining unit 32 updates the work correction instruction and displays it on the instruction means 5 in step 7 (S7).

  In step 8 (S8), when the inspector 6 detects a short-circuit defect on the image display surface 1a, in step 9 (S9), the inspector 6 uses the input means 4 such as a keyboard to detect defects in the control unit 31. Detection information is input (defect detection information input step). Furthermore, in step 10 (S10), when the control part 31 confirms the input of defect detection information (Yes), it progresses to step 11 (S11).

  In step 11, the pressure information and position information of the pressing operation immediately before the inspector 6 inputs the defect detection information are stored in the memory 33. Subsequently, in step 12 (S 12), the control unit 31 outputs a defect position pressing instruction that causes the inspector 6 to press the position of the short-circuit defect and displays the instruction on the instruction unit 5. The inspector 6 notified of this defect position pressing instruction presses the position of the short-circuit defect from above the pressure sensor sheet 2 in step 13 (S13). Further, in step 14 (S14), the memory 33 acquires the position information (coordinates) of the short-circuit defect from the pressure sensor sheet 2, and stores this (defect coordinate storage step).

  After completing the defect coordinate storage process, the process proceeds to step 15 (S15), where the presence or absence of unpressed points is confirmed. If the entire surface inspection is not completed (No), the process returns to step 3 and the inspector 6 displays the image display screen. The operation of pressing the next point of 1a is repeated. If the entire surface inspection is completed in step 15 (Yes), the process proceeds to step 16 (S16), the liquid crystal display device 1 is removed from the inspection stage, and the inspection is terminated.

  Also, in step 10, if the control unit 31 has not received the input of defect detection information (No), the process proceeds to step 15, and if the full inspection is not completed in step 15 (No), the process proceeds to step 3. Returning, the inspector 6 repeats the operation of pressing the next point on the image display surface 1a. If the entire surface inspection has been completed in step 15 (Yes), the process proceeds to step 16 to end the inspection.

  As described above, according to the inspection method of the liquid crystal display device in the first embodiment, the pressure information acquisition unit that quantitatively detects the pressure applied to the image display surface 1a of the liquid crystal display device 1, and the pressure By using the inspection apparatus including the pressure sensor sheet 2 having the position information acquisition means for acquiring the detected position as coordinates, it is possible to quantitatively manage the pressure information and position information of the pressing work by the inspector 6. is there. In addition, since the pressing parameter of the pressing operation calculated based on the pressure information and the position information can be compared with the pressing condition specified value stored in advance in the memory 33, the quality of the pressing operation can be determined. Therefore, it is possible to always perform the pressing operation under appropriate pressing conditions, and it becomes possible to reduce detection omissions of potential short-circuit defects and improve detection accuracy.

  In addition, the quality of the pressing work is judged in real time during the inspection, and the work correction is performed, thereby preventing detection of potential short circuit defects due to work mistakes such as insufficient pressing force or insufficient pressing time of the inspector 6. can do. Furthermore, since the inspector 6 can learn an appropriate pressing work by receiving the work correction instruction, the inspection apparatus also has a function as a work training tool. Thereby, an appropriate pressing operation can be thoroughly performed by the inspector 6.

  In addition, since the pressing condition prescribed value is set for each model of the liquid crystal display device 1 to be inspected, it is appropriate to match the characteristics of the model and further the characteristics of how the position of the image display surface 1a bends in that model. Inspection can be performed with various pressing parameters, and detection failure of potential short-circuit defects can be reduced.

  In addition, since the pressure information and position information of the pressing operation immediately before the inspector 6 detects the short-circuit defect is stored in the memory 33, it is possible to accumulate a press parameter that can reveal the short-circuit defect. By analyzing the above, it is possible to extract an appropriate pressing parameter. As a result, the inspection can be performed with an appropriate pressing parameter, so that detection failure of a potential short-circuit defect can be further reduced.

  Further, when the inspector 6 detects a short-circuit defect, the position information of the short-circuit defect can be easily stored in the memory 33 by pressing the defect position from the pressure sensor sheet 2, so that repair after inspection is performed. In the process, the defect position can be identified based on the position information stored in the memory 33. In addition, the time required for data collection can be shortened also in the technical analysis such as the cause of the defect that is performed based on the inspection result.

  The present invention can be used as an inspection method in a short-circuit defect inspection process included in a manufacturing process of a liquid crystal display device and an inspection apparatus used in the inspection process.

DESCRIPTION OF SYMBOLS 1,100 Liquid crystal display device, 1a, 101a Image display surface, 2 Pressure sensor sheet,
3 control computer, 31 control unit, 32 work quality determination unit, 33 memory,
4 input means, 5 instruction means, 6 inspector, 101, 103 glass substrate,
102 counter electrode, 104 source line, 105 picture element electrode, 106 liquid crystal material,
107,108 Dust.

Claims (13)

An inspection method of a liquid crystal display device for detecting a short-circuit defect occurring between electrodes provided on opposite substrates of the liquid crystal display device,
A pressure sensor sheet is arranged opposite to the image display surface of the liquid crystal display device, the liquid crystal display device is turned on by a drive signal from the control means, and a pressing condition specified value preset for the model of the liquid crystal display device A preparation step for reading from the storage means;
Based on the pressing condition stipulated value, an inspector performs an operation of pressing the image display surface from the pressure sensor sheet; and
A pressure parameter calculation step of obtaining pressure information and position information for each pressing operation from the pressure sensor sheet, and calculating a pressing parameter of the pressing operation based on these,
A work pass / fail judgment step of comparing the press parameter and the press condition stipulated value to determine pass / fail of the press work and notifying an inspector of the pass / fail judgment result;
When an inspector detects a short-circuit defect on the image display surface, a defect detection information input step for inputting this to the control means as defect detection information;
An inspection method for a liquid crystal display device, comprising: a defect coordinate storage step of acquiring position information of a short-circuit defect detected by an inspector from the pressure sensor sheet and storing it in the storage means.   2. The liquid crystal display inspection method according to claim 1, wherein the pressing parameter includes a load value, a pressing area, a pressing force, and a pressing time at a pressing position on the image display surface. Device inspection method.   The inspection method for a liquid crystal display device according to claim 1, wherein in the work quality determination step, when the quality determination of the pressing work is “No”, a work correction instruction for the pressing work is given to an inspector in real time. A method for inspecting a liquid crystal display device.   2. The inspection method for a liquid crystal display device according to claim 1, wherein, in the defect detection information input step, when the inspector inputs the defect detection information, the storage means is pressure information and position of the pressing operation immediately before that. An inspection method for a liquid crystal display device, characterized by storing information.   2. The inspection method for a liquid crystal display device according to claim 1, wherein, in the defect detection information input step, the control means causes the inspector to press a position of a short-circuit defect when receiving the defect detection information. An inspection method for a liquid crystal display device, characterized by outputting a pressing instruction. An inspection device for a liquid crystal display device for detecting a short-circuit defect occurring between electrodes provided on opposite substrates of the liquid crystal display device,
Control means for supplying a drive signal for lighting the liquid crystal display device;
Pressure information acquisition means arranged to face the image display surface of the liquid crystal display device and quantitatively detect the pressure applied to the image display surface, and position information acquisition to acquire the position where the pressure is detected as coordinates Pressure sensor sheet having means,
Each time the inspector presses the image display surface, pressure information and position information of the pressing work are acquired from the pressure sensor sheet, and the pressing parameters of the pressing work calculated based on these are stored in advance. Work quality determination means for comparing the pressing condition prescribed values stored in the means to determine the quality of the pressing work;
Instruction means for displaying a quality determination result and a work correction instruction output by the work quality determination means;
An inspection apparatus for a liquid crystal display device, comprising: input means for inputting a short-circuit defect on the image display surface to the control means as defect detection information when an inspector detects the short-circuit defect on the image display surface. 7. The inspection apparatus for a liquid crystal display device according to claim 6, wherein the pressure sensor sheet is made of a transparent material through which the inspector can visually recognize a short-circuit defect on the image display surface via the pressure sensor sheet. An inspection apparatus for a liquid crystal display device.   The liquid crystal display inspection apparatus according to claim 6, wherein the pressing parameter includes a load value, a pressing area, a pressing force, and a pressing time at a pressing position on the image display surface. Equipment inspection device.   7. The inspection apparatus for a liquid crystal display device according to claim 6, wherein the specified value for the pressing condition is set for each model of the liquid crystal display device.   7. The inspection apparatus for a liquid crystal display device according to claim 6, wherein the work quality determination unit is configured to issue a work correction instruction for the pressing work when the quality determination of the pressing work by the inspector is "No". An inspection apparatus for a liquid crystal display device, characterized in that the display is performed in real time on the means.   7. The inspection apparatus for a liquid crystal display device according to claim 6, wherein the control means, when receiving the defect detection information, issues a defect position pressing instruction to press an inspector to press a position of a short-circuit defect. An inspection apparatus for a liquid crystal display device, characterized by comprising:   12. The inspection apparatus for a liquid crystal display device according to claim 11, wherein the storage means stores position information from the pressure sensor sheet when an inspector presses a position of a short-circuit defect based on the defect position pressing instruction. An inspection apparatus for a liquid crystal display device, wherein the inspection information is stored as coordinate information of a short-circuit defect.   7. The inspection apparatus for a liquid crystal display device according to claim 6, wherein the instruction unit further includes a voice notification unit.

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