JP2011027734A - 肌理のある面の検査のための装置 - Google Patents

肌理のある面の検査のための装置 Download PDF

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Publication number
JP2011027734A
JP2011027734A JP2010154432A JP2010154432A JP2011027734A JP 2011027734 A JP2011027734 A JP 2011027734A JP 2010154432 A JP2010154432 A JP 2010154432A JP 2010154432 A JP2010154432 A JP 2010154432A JP 2011027734 A JP2011027734 A JP 2011027734A
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JP
Japan
Prior art keywords
image
radiation
value
determined
characterizing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010154432A
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English (en)
Japanese (ja)
Other versions
JP2011027734A5 (enExample
Inventor
Peter Schwartz
シュヴァルツ ペーター
Uwe Sperling
スパーリング ウーヴェ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BYK Gardner GmbH
BYK Gardner USA Inc
Original Assignee
BYK Gardner GmbH
BYK Gardner USA Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BYK Gardner GmbH, BYK Gardner USA Inc filed Critical BYK Gardner GmbH
Publication of JP2011027734A publication Critical patent/JP2011027734A/ja
Publication of JP2011027734A5 publication Critical patent/JP2011027734A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Wood Science & Technology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2010154432A 2009-07-15 2010-07-07 肌理のある面の検査のための装置 Pending JP2011027734A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102009033110A DE102009033110A1 (de) 2009-07-15 2009-07-15 Vorrichtung zum Untersuchen strukturierter Oberflächen

Publications (2)

Publication Number Publication Date
JP2011027734A true JP2011027734A (ja) 2011-02-10
JP2011027734A5 JP2011027734A5 (enExample) 2013-07-25

Family

ID=43402351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010154432A Pending JP2011027734A (ja) 2009-07-15 2010-07-07 肌理のある面の検査のための装置

Country Status (4)

Country Link
US (1) US8355141B2 (enExample)
JP (1) JP2011027734A (enExample)
CN (1) CN101957187B (enExample)
DE (1) DE102009033110A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9826172B2 (en) 2013-02-22 2017-11-21 Seiko Epson Corporation Spectroscopic camera and spectroscopic image processing method

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI425196B (zh) * 2011-01-14 2014-02-01 Chroma Ate Inc Color and brightness uniform light source with the light source of the color sensor
CN102680095A (zh) * 2011-03-08 2012-09-19 致茂电子(苏州)有限公司 色度及亮度均匀的光源及具该光源的色彩感测仪
DE102011108599A1 (de) * 2011-07-27 2013-01-31 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Untersuchung von Beschichtungen mit Effektpigmenten
BR112014021250B1 (pt) * 2012-02-27 2022-01-11 Ovio Technologies, Inc Sistema de imageamento de 360°
US9408540B2 (en) * 2012-02-27 2016-08-09 Ovio Technologies, Inc. Rotatable imaging system
US10171734B2 (en) 2012-02-27 2019-01-01 Ovio Technologies, Inc. Rotatable imaging system
WO2013160243A1 (de) * 2012-04-24 2013-10-31 Basf Coatings Gmbh Hdr-bilder als grundlage für die effektcharakterisierung
DE102014108789A1 (de) 2014-06-24 2016-01-07 Byk-Gardner Gmbh Mehrstufiges Verfahren zur Untersuchung von Oberflächen sowie entsprechende Vorrichtung
DE102015100977A1 (de) * 2015-01-23 2016-07-28 Vorwerk & Co. Interholding Gmbh Gerät zur Bearbeitung einer Oberfläche
JP6862229B2 (ja) * 2017-03-15 2021-04-21 キヤノン株式会社 解析装置、撮像装置、解析方法、および、プログラム
US10429174B2 (en) * 2017-12-20 2019-10-01 Texas Instruments Incorporated Single wavelength reflection for leadframe brightness measurement
KR102599207B1 (ko) * 2018-07-20 2023-12-15 삼성전자 주식회사 전자 디바이스의 표면 측정 장치 및 방법
CN111397547A (zh) * 2020-03-24 2020-07-10 杭州新汉杰科技有限公司 一种用于纺织面料熨烫后平整程度和方位的检测装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
JP2001041888A (ja) * 1999-07-02 2001-02-16 Byk Gardner Gmbh 表面品質を決定するためのデバイスおよび方法
JP2001205327A (ja) * 2000-01-28 2001-07-31 Sumitomo Metal Ind Ltd 表面性状判別装置
JP2006030203A (ja) * 2004-07-15 2006-02-02 Byk Gardner Gmbh 光学的表面特性の検査装置および検査方法
JP2006162601A (ja) * 2004-12-03 2006-06-22 Byk Gardner Gmbh 表面特性を特定する装置
JP2008190872A (ja) * 2007-01-31 2008-08-21 Toyota Motor Corp 表面不良検出装置、方法及びプログラム
JP2008249397A (ja) * 2007-03-29 2008-10-16 Toyota Motor Corp 表面検査装置
JP2008268190A (ja) * 2007-03-22 2008-11-06 Byk-Gardner Gmbh 表面特性の決定

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5712701A (en) * 1995-03-06 1998-01-27 Ade Optical Systems Corporation Surface inspection system and method of inspecting surface of workpiece
DE10336493A1 (de) * 2003-08-08 2005-03-03 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften
US7145656B2 (en) * 2003-12-15 2006-12-05 E. I. Du Pont De Nemours And Company Computer-implemented method for matching paint
EP1841733A2 (en) * 2004-11-08 2007-10-10 Allergan, Inc. Substituted pyrrolidone compounds as prostaglandin ep4 agonists
WO2007022212A2 (en) * 2005-08-15 2007-02-22 X-Rite, Incorporated Spectrophotometer with temperatur corrected system response

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
JP2001041888A (ja) * 1999-07-02 2001-02-16 Byk Gardner Gmbh 表面品質を決定するためのデバイスおよび方法
JP2001205327A (ja) * 2000-01-28 2001-07-31 Sumitomo Metal Ind Ltd 表面性状判別装置
JP2006030203A (ja) * 2004-07-15 2006-02-02 Byk Gardner Gmbh 光学的表面特性の検査装置および検査方法
JP2006162601A (ja) * 2004-12-03 2006-06-22 Byk Gardner Gmbh 表面特性を特定する装置
JP2008190872A (ja) * 2007-01-31 2008-08-21 Toyota Motor Corp 表面不良検出装置、方法及びプログラム
JP2008268190A (ja) * 2007-03-22 2008-11-06 Byk-Gardner Gmbh 表面特性の決定
JP2008249397A (ja) * 2007-03-29 2008-10-16 Toyota Motor Corp 表面検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9826172B2 (en) 2013-02-22 2017-11-21 Seiko Epson Corporation Spectroscopic camera and spectroscopic image processing method

Also Published As

Publication number Publication date
CN101957187B (zh) 2014-08-27
US20110013197A1 (en) 2011-01-20
US8355141B2 (en) 2013-01-15
DE102009033110A1 (de) 2011-02-03
CN101957187A (zh) 2011-01-26

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