JP2010537172A - 質量割り当て精度を向上させる方法 - Google Patents
質量割り当て精度を向上させる方法 Download PDFInfo
- Publication number
- JP2010537172A JP2010537172A JP2010521271A JP2010521271A JP2010537172A JP 2010537172 A JP2010537172 A JP 2010537172A JP 2010521271 A JP2010521271 A JP 2010521271A JP 2010521271 A JP2010521271 A JP 2010521271A JP 2010537172 A JP2010537172 A JP 2010537172A
- Authority
- JP
- Japan
- Prior art keywords
- analyte
- calibration
- ion
- mass ratio
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0009—Calibration of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CA2007/001459 WO2009023946A1 (fr) | 2007-08-21 | 2007-08-21 | Procédé d'amélioration de la précision d'affectation de masse |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2010537172A true JP2010537172A (ja) | 2010-12-02 |
Family
ID=40377771
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010521271A Pending JP2010537172A (ja) | 2007-08-21 | 2007-08-21 | 質量割り当て精度を向上させる方法 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP2186111A4 (fr) |
JP (1) | JP2010537172A (fr) |
CA (1) | CA2696167A1 (fr) |
WO (1) | WO2009023946A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020021602A (ja) * | 2018-07-31 | 2020-02-06 | 株式会社島津製作所 | 質量分析装置及び質量分析方法 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB201410470D0 (en) * | 2014-06-12 | 2014-07-30 | Micromass Ltd | Self-calibration of spectra using differences in molecular weight from known charge states |
CN106024571B (zh) | 2015-03-25 | 2018-08-24 | 萨默费尼根有限公司 | 用于质量校准的系统和方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005514404A (ja) * | 2001-11-05 | 2005-05-19 | アイアールエム エルエルシー | 標識試薬とその使用方法 |
JP2005522845A (ja) * | 2002-04-05 | 2005-07-28 | エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス | 高次の多重極電界、低圧イオン・トラップ内での共振励起によるイオンのフラグメンテーション |
EP1617224A1 (fr) * | 2004-07-16 | 2006-01-18 | Agilent Technologies, Inc. | Sequencage de novo au moyen d'une spectrometrie de masse en tandem |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5572025A (en) * | 1995-05-25 | 1996-11-05 | The Johns Hopkins University, School Of Medicine | Method and apparatus for scanning an ion trap mass spectrometer in the resonance ejection mode |
WO2003040715A1 (fr) * | 2001-11-05 | 2003-05-15 | Irm, Llc. | Procedes de preparation d'echantillons pour la spectrometrie de masse maldi |
US6979816B2 (en) * | 2003-03-25 | 2005-12-27 | Battelle Memorial Institute | Multi-source ion funnel |
US7459693B2 (en) * | 2003-04-04 | 2008-12-02 | Bruker Daltonics, Inc. | Ion guide for mass spectrometers |
US7202473B2 (en) * | 2003-04-10 | 2007-04-10 | Micromass Uk Limited | Mass spectrometer |
US7855357B2 (en) * | 2006-01-17 | 2010-12-21 | Agilent Technologies, Inc. | Apparatus and method for ion calibrant introduction |
-
2007
- 2007-08-21 JP JP2010521271A patent/JP2010537172A/ja active Pending
- 2007-08-21 CA CA2696167A patent/CA2696167A1/fr not_active Abandoned
- 2007-08-21 WO PCT/CA2007/001459 patent/WO2009023946A1/fr active Application Filing
- 2007-08-21 EP EP07800487A patent/EP2186111A4/fr not_active Withdrawn
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005514404A (ja) * | 2001-11-05 | 2005-05-19 | アイアールエム エルエルシー | 標識試薬とその使用方法 |
JP2005522845A (ja) * | 2002-04-05 | 2005-07-28 | エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス | 高次の多重極電界、低圧イオン・トラップ内での共振励起によるイオンのフラグメンテーション |
EP1617224A1 (fr) * | 2004-07-16 | 2006-01-18 | Agilent Technologies, Inc. | Sequencage de novo au moyen d'une spectrometrie de masse en tandem |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020021602A (ja) * | 2018-07-31 | 2020-02-06 | 株式会社島津製作所 | 質量分析装置及び質量分析方法 |
JP7021612B2 (ja) | 2018-07-31 | 2022-02-17 | 株式会社島津製作所 | 質量分析装置及び質量分析方法 |
Also Published As
Publication number | Publication date |
---|---|
CA2696167A1 (fr) | 2009-02-26 |
WO2009023946A1 (fr) | 2009-02-26 |
WO2009023946A8 (fr) | 2009-04-23 |
EP2186111A1 (fr) | 2010-05-19 |
EP2186111A4 (fr) | 2011-12-21 |
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Legal Events
Date | Code | Title | Description |
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A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120820 |
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A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20120912 |
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A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20120920 |
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