JP2010535343A5 - - Google Patents

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Publication number
JP2010535343A5
JP2010535343A5 JP2010520019A JP2010520019A JP2010535343A5 JP 2010535343 A5 JP2010535343 A5 JP 2010535343A5 JP 2010520019 A JP2010520019 A JP 2010520019A JP 2010520019 A JP2010520019 A JP 2010520019A JP 2010535343 A5 JP2010535343 A5 JP 2010535343A5
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JP
Japan
Prior art keywords
mask
signal
noise
image
pixel value
Prior art date
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Ceased
Application number
JP2010520019A
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English (en)
Japanese (ja)
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JP2010535343A (ja
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Publication date
Priority claimed from US11/832,442 external-priority patent/US7995829B2/en
Application filed filed Critical
Publication of JP2010535343A publication Critical patent/JP2010535343A/ja
Publication of JP2010535343A5 publication Critical patent/JP2010535343A5/ja
Ceased legal-status Critical Current

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JP2010520019A 2007-08-01 2008-06-18 部品を検査する方法及び装置 Ceased JP2010535343A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/832,442 US7995829B2 (en) 2007-08-01 2007-08-01 Method and apparatus for inspecting components
PCT/US2008/067269 WO2009017892A1 (en) 2007-08-01 2008-06-18 Method and apparatus for inspecting components

Publications (2)

Publication Number Publication Date
JP2010535343A JP2010535343A (ja) 2010-11-18
JP2010535343A5 true JP2010535343A5 (enExample) 2011-07-21

Family

ID=39865479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010520019A Ceased JP2010535343A (ja) 2007-08-01 2008-06-18 部品を検査する方法及び装置

Country Status (5)

Country Link
US (1) US7995829B2 (enExample)
EP (1) EP2176656B1 (enExample)
JP (1) JP2010535343A (enExample)
CA (1) CA2694191A1 (enExample)
WO (1) WO2009017892A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8442299B2 (en) * 2009-11-10 2013-05-14 International Business Machines Corporation Evaluation of image processing algorithms
JP2011232111A (ja) * 2010-04-26 2011-11-17 Olympus Corp 検査装置及び検査装置の用いた欠陥検出方法
JP2011232110A (ja) * 2010-04-26 2011-11-17 Olympus Corp 検査装置及び検査装置を用いた欠陥検出方法
TW201232211A (en) * 2011-01-28 2012-08-01 Hon Hai Prec Ind Co Ltd System and method of automatically testing a circuit board
US8389962B2 (en) * 2011-05-31 2013-03-05 Applied Materials Israel, Ltd. System and method for compensating for magnetic noise
US10599944B2 (en) * 2012-05-08 2020-03-24 Kla-Tencor Corporation Visual feedback for inspection algorithms and filters
DE102013001808A1 (de) 2013-02-04 2014-08-07 Ge Sensing & Inspection Technologies Gmbh Verfahren zur zerstörungsfreien Prüfung des Volumens eines Prüflings sowie zur Ausführung eines solchen Verfahrens eingerichtete Prüfvorrichtung
WO2014143258A1 (en) * 2013-03-11 2014-09-18 Untited Technologies Corporation Phased array billet data evaluation software
US10401517B2 (en) 2015-02-16 2019-09-03 Pgs Geophysical As Crosstalk attenuation for seismic imaging
US10620131B2 (en) * 2015-05-26 2020-04-14 Mitsubishi Electric Corporation Detection apparatus and detection method
US9785919B2 (en) * 2015-12-10 2017-10-10 General Electric Company Automatic classification of aircraft component distress
US10338032B2 (en) * 2016-11-22 2019-07-02 Gm Global Technology Operations Llc. Automated quality determination of joints
KR102048664B1 (ko) 2016-11-29 2019-11-25 바르실라 핀랜드 오이 필터링된 이미지 데이터를 이용한 초음파 품질 제어
US10262236B2 (en) * 2017-05-02 2019-04-16 General Electric Company Neural network training image generation system
JP7233853B2 (ja) * 2018-05-11 2023-03-07 三菱重工業株式会社 超音波検査装置、方法、プログラム及び超音波検査システム

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4442544A (en) * 1981-07-09 1984-04-10 Xerox Corporation Adaptive thresholder
NL8105256A (nl) * 1981-11-20 1983-06-16 Philips Nv Inrichting voor het dynamisch instellen van een discriminatiedrempel zwart/wit bij het bewerken van beelden met grijsheidswaarden.
US4468704A (en) * 1982-10-28 1984-08-28 Xerox Corporation Adaptive thresholder
US4561104A (en) * 1984-01-16 1985-12-24 Honeywell Inc. Automated inspection of hot steel slabs
JPS6173477A (ja) * 1984-09-19 1986-04-15 Minolta Camera Co Ltd 画像処理方法
US4751846A (en) * 1985-10-16 1988-06-21 Kontron Holding A.G. Reducing noise in ultrasonic images
FR2602387B1 (fr) * 1986-07-30 1988-10-21 Trt Telecom Radio Electr Procede d'extraction automatique d'un objet contraste dans une image numerique
US4823194A (en) * 1986-08-01 1989-04-18 Hitachi, Ltd. Method for processing gray scale images and an apparatus thereof
FR2615288B1 (fr) * 1987-05-12 1989-09-22 Commissariat Energie Atomique Procede automatique d'identification de defauts par ultrasons et systeme correspondant
DE3731947A1 (de) * 1987-09-23 1989-04-13 Kurt Dr Sauerwein Verfahren und vorrichtung zum feststellen und auswerten von oberflaechenrissen bei werkstuecken
US4887306A (en) * 1987-11-04 1989-12-12 Advanced Technology Laboratories, Inc. Adaptive temporal filter for ultrasound imaging system
US4908875A (en) * 1989-03-21 1990-03-13 Hughes Aircraft Company Adaptive thresholding technique
US5608814A (en) * 1993-08-26 1997-03-04 General Electric Company Method of dynamic thresholding for flaw detection in ultrasonic C-scan images
US5613013A (en) * 1994-05-13 1997-03-18 Reticula Corporation Glass patterns in image alignment and analysis
US6113544A (en) * 1998-12-07 2000-09-05 Mo; Larry Y. L. Method and apparatus for automatic transmit waveform optimization in B-mode ultrasound imaging
KR100308230B1 (ko) * 1999-09-09 2001-11-07 이민화 대상체 분리를 위한 초음파영상장치
US6493569B2 (en) * 2000-12-30 2002-12-10 Ge Medical Systems Global Technology Company, Llc Method and apparatus using post contrast-enhanced steady-state free precession in MR imaging
US7263240B2 (en) * 2002-01-14 2007-08-28 Eastman Kodak Company Method, system, and software for improving signal quality using pyramidal decomposition
US6679844B2 (en) * 2002-06-20 2004-01-20 Acuson Corporation Automatic gain compensation for multiple mode or contrast agent imaging
JP4050169B2 (ja) * 2003-03-11 2008-02-20 アロカ株式会社 超音波診断装置
US7328620B2 (en) * 2004-12-16 2008-02-12 General Electric Company Methods and system for ultrasound inspection
JP2007003459A (ja) * 2005-06-27 2007-01-11 Tokyo Seimitsu Co Ltd 画像欠陥検査装置、外観検査装置及び画像欠陥検査方法
US7474786B2 (en) * 2005-08-04 2009-01-06 Analogic Corporation Method of and system for classifying objects using histogram segment features of multi-energy computed tomography images
US7606445B2 (en) * 2005-11-30 2009-10-20 General Electric Company Methods and systems for ultrasound inspection

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