JP2010524001A5 - - Google Patents

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JP2010524001A5
JP2010524001A5 JP2010503134A JP2010503134A JP2010524001A5 JP 2010524001 A5 JP2010524001 A5 JP 2010524001A5 JP 2010503134 A JP2010503134 A JP 2010503134A JP 2010503134 A JP2010503134 A JP 2010503134A JP 2010524001 A5 JP2010524001 A5 JP 2010524001A5
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サンプルの特性を測定するシステムであって、
前記サンプルを採取する診断テストストリップと、
前記テストストリップを受入れ、かつ、前記サンプルを測定する診断測定装置と、
を含んで構成され、
前記テストストリップは１つ以上の接触パッドを含んで構成され、各接触パッドは、それぞれ、予め設定された導電性を有し、前記１つ以上の接触パッドの前記導電性は前記テストストリップ特有の情報を表すコードを形成し、
前記診断測定装置はプロセッサを更に含んで構成され、前記テストストリップ特有の前記コードを読取り、前記プロセッサは、前記コードのエラーを検出するエラー検出ルーチンを実行するように構成されるサンプル特性測定システム。 A system for measuring sample properties,
And a diagnostic test strip to collect the previous SL sample,
Receiving said test strip, One or a diagnostic measurement device for measuring said sample,
Comprising
The test strip is configured to include one or more contact pads, each contact pad having a predetermined conductivity, and the conductivity of the one or more contact pads is specific to the test strip. Form a code that represents information,
Said diagnostic measuring device is configured to further include a processor, reading the test strip specific said code, the processor, the sample characteristic measuring system configured to perform the error detection routine for detecting the error of the code. 機械可読媒体を更に含んで構成され、
前記エラー検出ルーチンは、前記媒体に保存されるエラー検出アルゴリズムを含んで構成され、該エラー検出アルゴリズムは、前記診断測定装置によって読取られた前記コードのエラーを検出する請求項１記載のサンプル特性測定システム。 Further comprising a machine readable medium,
The sample characteristic measurement according to claim 1, wherein the error detection routine includes an error detection algorithm stored in the medium, and the error detection algorithm detects an error in the code read by the diagnostic measurement device. system. 前記エラー検出アルゴリズムは、トレンディングアルゴリズムを含んで構成され、該トレンディングアルゴリズムは、前記診断測定装置によって読取られた前記コードのエラーを判定する根拠として、最近のトレンドと超過時間のトレンドとを用いる請求項２記載のサンプル特性測定システム。 The error detection algorithm includes a trending algorithm , and the trending algorithm uses a recent trend and an overtime trend as a basis for determining an error in the code read by the diagnostic measurement device. The sample characteristic measuring system according to claim 2. 前記トレンディングアルゴリズムは、前記テストストリップの特性と、過去に使用された複数のテストストリップの記録された特性を分析して得られる期待値と、を比較する請求項３記載のサンプル特性測定システム。 4. The sample characteristic measuring system according to claim 3, wherein the trending algorithm compares the characteristic of the test strip with an expected value obtained by analyzing recorded characteristics of a plurality of test strips used in the past. 前記テストストリップの特性が前記期待値と異なる場合に、前記エラー検出アルゴリズムは、前記コードがエラーを含むことを表示する請求項４記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 4, wherein when the characteristic of the test strip is different from the expected value, the error detection algorithm indicates that the code includes an error. 前記診断測定装置内のプロセッサによって前記記録された特性を分析することは、前記記録された特性に対して学習アルゴリズムを実行して前記期待値を得ることを含んで構成される請求項４記載のサンプル特性測定システム。 Analyzing the recorded characteristics by a processor in the diagnostic measuring device, according to claim 4, wherein configured to include said the recording properties by performing the hand learning algorithm to obtain said expected value Sample characteristic measurement system. 前記学習アルゴリズムは、ユーザフィードバックを組込んで前記期待値を得ることを含む請求項６記載のサンプル特性測定システム。 Before Kigaku learning algorithm, the sample characteristic measuring system according to claim 6 including obtaining said expected value incorporate user feedback. 前記エラー検出アルゴリズムは、チェックサムアルゴリズムを含んで構成され、該チェックサムアルゴリズムは、前記コードを読取るステップ、及び、前記コードに含まれるビットの係数を決定するステップ、を含んで構成され、前記係数が前記期待値と異なる場合に、前記エラー検出アルゴリズムは、前記コードがエラーを含むことを表示する請求項２記載のサンプル特性測定システム。 The error detection algorithm is configured to include a checksum algorithm , and the checksum algorithm includes a step of reading the code and a coefficient of a bit included in the code. The sample characteristic measurement system according to claim 2 , wherein the error detection algorithm indicates that the code includes an error when the value is different from the expected value . 前記コードは、第１の配列にてエンコードされた第１の情報を含む第１のコードと、第２の配列にてエンコードされた前記第１の情報を含む第２のコードと、を含んで構成され、前記エラー検出アルゴリズムは、冗長コードアルゴリズムを含んで構成される請求項２記載のサンプル特性測定システム。 The code includes a first code including first information encoded in a first array, and a second code including the first information encoded in a second array. 3. The sample characteristic measurement system according to claim 2, wherein the error detection algorithm is configured to include a redundant code algorithm. 前記エラー検出ルーチンによって実行される前記冗長コードアルゴリズムは、前記第１のコードを読取ること、及び、前記第２のコードを読取ること、を含んで構成され、前記第１のコードと前記第２のコードとが一致しない場合に、前記エラー検出アルゴリズムは、前記第１のコードがエラーを含むことを表示する請求項９記載のサンプル特性測定システム。 The redundant code algorithm executed by the error detection routine includes reading the first code and reading the second code, and the first code and the second code are read out. The sample characteristic measurement system according to claim 9 , wherein if the code does not match, the error detection algorithm indicates that the first code includes an error. 前記第１のコードは第１のエンコード方法を用いてエンコードされる一方、前記第２のコードは第２のエンコード方法を用いてエンコードされ、
前記第１のエンコード方法及び前記第２のエンコード方法は、各々が、プリントされた絶縁接触パッドを用いて前記コードをエンコードすること、可変抵抗を有する接触パッドを用いてエンコードすること、光学マーカーを用いてエンコードすること、又は、磁気的にエンコードすること、のうちの１つを含む請求項１０記載のサンプル特性測定システム。 The first code is encoded using a first encoding method, while the second code is encoded using a second encoding method;
Each of the first encoding method and the second encoding method includes encoding the code using a printed insulating contact pad, encoding using a contact pad having a variable resistance, and an optical marker. 11. The sample property measurement system of claim 10 , including one of using and encoding or magnetically encoding. 前記コードは複数のユニットを含んで構成され、各ユニットはそれぞれユニット値を有し、コード値は、前記ユニット値の組み合わせを含んで構成される請求項２記載のサンプル特性測定システム。 The sample characteristic measuring system according to claim 2, wherein the code includes a plurality of units, each unit has a unit value, and the code value includes a combination of the unit values. 前記ユニット値は、デジタルビット、アナログ読取値、記号、又はピクトグラムを含む請求項１２記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 12 , wherein the unit value includes a digital bit, an analog reading, a symbol, or a pictogram. 前記エラー検出アルゴリズムは、前記コード値と、所定の許容コード値群と、を比較することを含んで構成され、前記コード値が前記所定の許容コード値群に含まれていない場合に、前記エラー検出アルゴリズムは、前記コードがエラーを含むことを表示する請求項１２記載のサンプル特性測定システム。 The error detection algorithm includes comparing the code value with a predetermined allowable code value group, and when the code value is not included in the predetermined allowable code value group, the error is detected. The sample characteristic measurement system according to claim 12 , wherein the detection algorithm indicates that the code includes an error. 前記エラー検出アルゴリズムは、前記ユニット値と、所定の許容ユニット値群と、を比較することを含んで構成され、所定番目の前記ユニット値が前記所定の許容ユニット値群に含まれていない場合に、前記エラー検出アルゴリズムは、前記コードがエラーを含むことを表示する請求項１２記載のサンプル特性測定システム。 The error detection algorithm includes comparing the unit value with a predetermined allowable unit value group, and when the predetermined unit value is not included in the predetermined allowable unit value group. 13. The sample property measurement system of claim 12 , wherein the error detection algorithm indicates that the code contains an error. サンプルの特性を測定するシステムであって、
メモリを有する診断測定装置と、
組込まれた導電パターンを有し、かつ、前記サンプルを採取する診断テストストリップと、
を含んで構成され、
前記導電パターンは、少なくとも第１のデータ及び第２のデータを表し、前記第１のデータは、前記サンプルの特性の測定に関連するパラメータ、前記診断測定装置の較正に使用可能なコード、又は、前記診断測定装置と前記テストストリップとの間の正常な接続を表示するパラメータ、のうちの少なくとも１つを表すデータであり、前記第２のデータは、前記サンプルの特性の正確な測定に影響を及ぼす潜在的エラーの検出及び排除に使用可能なデータであるサンプル特性測定システム。 A system for measuring sample properties,
A diagnostic measurement device having a memory;
A diagnostic test strip having an integrated conductive pattern and taking said sample;
Comprising
The conductive pattern represents at least first data and second data, wherein the first data is a parameter associated with measurement of a characteristic of the sample, a code that can be used to calibrate the diagnostic measurement device, or Data representing at least one of the parameters indicating a normal connection between the diagnostic measurement device and the test strip, the second data affecting the accurate measurement of the characteristics of the sample. A sample characterization system that is data that can be used to detect and eliminate potential errors. 前記第１のデータは、実行予定の特定のテスト、前記テストストリップとの接続を示すパラメータ、較正係数、温度補正係数、ｐＨ値補正係数、ヘマトクリットデータ、及び、前記テストストリップの特定のタイプの認識に用いられるデータ、のうちの少なくとも１つを表すデータを更に含んで構成される請求項１６記載のサンプル特性測定システム。 The first data includes a specific test to be performed, a parameter indicating a connection with the test strip, a calibration factor, a temperature correction factor, a pH value correction factor, hematocrit data, and a recognition of the specific type of the test strip. The sample characteristic measurement system according to claim 16 , further comprising data representing at least one of the data used for. 前記サンプルの特性は、前記サンプルのグルコース濃度であり、該グルコース濃度は、被験者のグルコース濃度を示す請求項１６記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 16 , wherein the characteristic of the sample is a glucose concentration of the sample, and the glucose concentration indicates a glucose concentration of the subject. 前記第１のデータは、前記診断測定装置の自動較正の実行に用いられるデータである請求項１６記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 16 , wherein the first data is data used for execution of automatic calibration of the diagnostic measurement apparatus. トレンディングアルゴリズムは、前記テストストリップの特性と、過去に使用されたテストストリップの記録された特性を分析して得られる期待値と、を比較する請求項１６記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 16 , wherein the trending algorithm compares the characteristic of the test strip with an expected value obtained by analyzing a recorded characteristic of a test strip used in the past. 前記テストストリップの特性が、前記期待値と異なる場合に、前記診断測定装置は、エラーがあることを表示する請求項２０記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 20 , wherein when the characteristic of the test strip is different from the expected value, the diagnostic measurement apparatus displays that there is an error. 前記記録された特性を分析することは、前記記録された特性に対して自動適応学習アルゴリズムを実行して前記期待値を得ることを含んで構成される請求項２０記載のサンプル特性測定システム。 21. The sample property measurement system of claim 20 , wherein analyzing the recorded property comprises performing an automatic adaptive learning algorithm on the recorded property to obtain the expected value. 前記自動適応学習アルゴリズムは、ユーザフィードバックを組込んで前記期待値を得ることを含む請求項２２記載のサンプル特性測定システム。 The sample characteristic measurement system of claim 22 , wherein the automatic adaptive learning algorithm includes obtaining the expected value by incorporating user feedback. 前記第２のデータは、チェックサムデータを含んで構成される請求項１６記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 16 , wherein the second data includes checksum data. 前記チェックサムデータは、前記第２のデータのビットの係数を含んで構成される請求項２４記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 24 , wherein the checksum data includes a coefficient of a bit of the second data. 前記係数が期待値と異なる場合に、前記診断測定装置は、エラーがあることを表示する請求項２５記載のサンプル特性測定システム。 26. The sample characteristic measurement system according to claim 25 , wherein when the coefficient is different from an expected value, the diagnostic measurement apparatus displays that there is an error. 前記第２のデータは、所定の順に配列された第３及び第４のデータを含んで構成される請求項１６記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 16, wherein the second data includes third and fourth data arranged in a predetermined order. 前記第３及び第４のデータは、同一である請求項２７記載のサンプル特性測定システム。 28. The sample characteristic measuring system according to claim 27 , wherein the third and fourth data are the same. 前記第３及び第４のデータは、異なる順に配列される請求項２８記載のサンプル特性測定システム。 The sample characteristic measurement system according to claim 28 , wherein the third and fourth data are arranged in a different order. 前記診断測定装置は、前記第３及び第４のデータを読取り、前記第３及び第４のデータが同一ではないと判定した場合に、エラーを表示する請求項２８記載のサンプル特性測定システム。 29. The sample characteristic measurement system according to claim 28 , wherein the diagnostic measurement apparatus displays an error when the third and fourth data are read and it is determined that the third and fourth data are not the same. 前記第３のデータは、第１のエンコード方法を用いてエンコードされる一方、前記第４のデータは、第２のエンコード方法を用いてエンコードされる請求項２８記載のサンプル特性測定システム。 29. The sample characteristic measurement system according to claim 28, wherein the third data is encoded using a first encoding method, while the fourth data is encoded using a second encoding method. 前記第１のエンコード方法及び前記第２のエンコード方法は、各々が、プリントされた絶縁接触パッドを用いてエンコードすること、可変抵抗を有する接触パッドを用いてエンコードすること、光学マーカーを用いてエンコードすること、又は、磁気的にエンコードすること、のうちの１つを含む請求項３１記載のサンプル特性測定システム。 Each of the first encoding method and the second encoding method includes encoding using a printed insulating contact pad, encoding using a contact pad having a variable resistance, and encoding using an optical marker. 32. The sample property measurement system of claim 31 including one of: performing or magnetically encoding. 前記第２のデータは、コード値を有するコードを含んで構成され、該コードは複数のユニットを有し、各ユニットはそれぞれユニット値を有し、前記コード値は、前記ユニット値の組み合わせを含んで構成される請求項１６記載のサンプル特性測定システム。 The second data is configured to include a code having a code value , the code includes a plurality of units, each unit has a unit value, and the code value includes a combination of the unit values. The sample characteristic measuring system according to claim 16 , comprising: 前記ユニット値は、デジタルビット、アナログ読取値、記号、又はピクトグラムを含む請求項３３記載のサンプル特性測定システム。 34. The sample property measurement system of claim 33 , wherein the unit value comprises a digital bit, an analog reading, a symbol, or a pictogram. 前記潜在的エラーを検出及び排除することは、前記コード値と、所定の許容コード値群と、を比較することを含んで構成され、前記コード値が前記所定の許容コード値群に含まれていない場合に、前記診断測定装置は、エラーを表示する請求項３３記載のサンプル特性測定システム。 Detecting and eliminating the potential error includes comparing the code value with a predetermined allowable code value group, and the code value is included in the predetermined allowable code value group. The sample characteristic measurement system according to claim 33 , wherein the diagnostic measurement device displays an error when there is no error. 前記潜在的エラーを検出及び排除することは、前記ユニット値と、所定の許容ユニット値群と、を比較することを含んで構成され、前記ユニット値が前記所定の許容ユニット値群に含まれていない場合に、前記診断測定装置は、エラーを表示する請求項３３記載のサンプル特性測定システム。 Detecting and eliminating the potential error includes comparing the unit value with a predetermined allowable unit value group, and the unit value is included in the predetermined allowable unit value group. The sample characteristic measurement system according to claim 33 , wherein the diagnostic measurement device displays an error when there is no error. 液体中の成分濃度を測定する方法であって、
メモリ及びプロセッサを含んで構成される診断テスト測定器を提供すること、
診断テストストリップ特有の少なくとも１つのコードを表す１つ以上の接触パッドを含んで構成される前記テストストリップを提供すること、
前記テスト測定器に前記テストストリップを挿入し、前記テスト測定器が前記少なくとも１つのコードを読取ること、
前記少なくとも１つのコードに対してエラー検出及び排除アルゴリズムを実行すること、及び、
前記エラー検出及び排除アルゴリズムがエラーを検出しない場合に、前記液体の成分濃度を測定すること、
を含んで構成される成分濃度測定方法。 A method for measuring the concentration of a component in a liquid,
Providing a diagnostic test instrument comprising a memory and a processor;
Providing said test strip comprising one or more contact pads representing at least one code specific to a diagnostic test strip ;
Inserting the test strip into the test meter, the test meter reading the at least one code;
Performing an error detection and elimination algorithm on the at least one code; and
Measuring the component concentration of the liquid when the error detection and elimination algorithm does not detect an error;
Concentration measuring method comprising: 前記エラー検出及び排除アルゴリズムを実行することは、
前記テストストリップの特性と、過去に使用された複数のテストストリップの記録された特性を分析して得られる期待値と、を比較することによって、トレンディングアルゴリズムを実行すること、及び、
前記テストストリップの特性が前記期待値と異なる場合に、前記テストストリップのエラーを決定すること、
を含んで構成される請求項３７記載の成分濃度測定方法。 Performing the error detection and elimination algorithm includes
Performing a trending algorithm by comparing characteristics of the test strip with expected values obtained by analyzing recorded characteristics of a plurality of test strips used in the past; and
Determining an error in the test strip if the properties of the test strip differ from the expected value;
38. The component concentration measuring method according to claim 37 , comprising: 前記記録された特性に対して学習アルゴリズムを実行して前記期待値を得ることを更に含んで構成される請求項３８記載の成分濃度測定方法。 The recorded further comprise configured claim 38 component concentration measuring method according to obtain the expected value by executing the hand learning algorithm to properties. 前記エラー検出及び排除アルゴリズムは、
少なくとも１つのコードの係数を算出するステップ、
該係数と予め算出された期待値とを比較するステップ、及び、
前記係数が前記期待値と異なる場合に、前記テストストリップがエラーを含むことを表示するステップ、
を含んで構成される請求項３７記載の成分濃度測定方法。 Wherein the error detection and elimination algorithm is
Calculating a coefficient of at least one code,
Step comparing the pre-calculated expected value the coefficient and,
If the coefficient is different from the expected value, the step of displaying said test strip comprises an error,
38. The component concentration measuring method according to claim 37 , comprising: 前記少なくとも１つのコードは、第１の情報を含む第１のコードと、前記第１の情報も含む第２のコードと、を含んで構成される請求項３７記載の成分濃度測定方法。 Wherein said at least one code, the first code and the first even second code and the component concentration measuring method according to claim 37, wherein configured Nde containing containing information including the first information. 前記エラー検出及び排除アルゴリズムを実行することは、
前記第１のコードを読取ること、及び、
前記第２のコードを読取ること、
を含んで構成され、
前記第１のコードと前記第２のコードとが一致しない場合には、前記第１のコードのエラーが表示される請求項４１記載の成分濃度測定方法。 Performing the error detection and elimination algorithm includes
Reading the first code; and
Reading the second code ;
Comprising
The component concentration measurement method according to claim 41, wherein an error of the first code is displayed when the first code and the second code do not match. 第１の列に前記第１の情報を含むように前記第１のコードをエンコードすること、及び、
第２の列に前記第１の情報を含むように前記第２のコードをエンコードすること、
を更に含んで構成される請求項４１記載の成分濃度測定方法。 Encoding the first code to include the first information in a first column; and
Encoding the second code to include the first information in a second column;
42. The component concentration measuring method according to claim 41 , further comprising: 第１のエンコード方法を用いて前記第１のコードをエンコードすること、及び、
第２のエンコード方法を用いて前記第２のコードをエンコードすること、
を更に含んで構成される請求項４１記載の成分濃度測定方法。 Encoding the first code using a first encoding method; and
Encoding the second code using a second encoding method;
42. The component concentration measuring method according to claim 41 , further comprising: 前記第１のエンコード方法及び前記第２のエンコード方法は、各々が、プリントされた絶縁接触パッドを用いてエンコードすること、又は、可変抵抗を有する接触パッドを用いてエンコードすること、のうちの１つを含む請求項４４記載の成分濃度測定方法。 It said first encoding method and said second encoding method, each of which can be encoded using the printed insulating contact pads, or be encoded using a contact pad having a variable resistor, one of the 45. The component concentration measuring method according to claim 44 , comprising: 前記少なくとも１つのコードは複数のユニットを含んで構成され、各ユニットはそれぞれユニット値を有し、コード値は、前記ユニット値の組み合わせを含んで構成される請求項３７記載の成分濃度測定方法。 The component concentration measurement method according to claim 37, wherein the at least one code includes a plurality of units, each unit has a unit value, and the code value includes a combination of the unit values. 前記ユニット値は、デジタルビット、アナログ読取値、記号、又はピクトグラムを含む請求項４６記載の成分濃度測定方法。 The unit value, a digital bit, analog readings, symbols, or component concentration measuring method according to claim 46 further comprising a pictogram. 前記エラー検出及び排除アルゴリズムを実行することは、前記コード値と、前記テスト測定器の前記メモリに格納された許容コード値のデータ群と、を比較することを含んで構成され、前記コード値が前記許容コード値のデータ群に含まれていない場合に、前記エラー検出アルゴリズムは、前記コードがエラーを含むことを表示する請求項４６記載の成分濃度測定方法。 Executing the error detection and elimination algorithm comprises comparing the code value with a group of acceptable code values stored in the memory of the test meter , wherein the code value is 47. The component concentration measurement method according to claim 46 , wherein when the data is not included in the data group of the allowable code value, the error detection algorithm displays that the code includes an error. 前記エラー検出及び排除アルゴリズムを実行することは、前記ユニット値と、許容ユニット値のデータ群と、を比較することを含んで構成され、所定番目の前記ユニット値が前記許容ユニット値のデータ群に含まれていない場合に、前記エラー検出アルゴリズムは、前記コードがエラーを含むことを表示する請求項４６記載の成分濃度測定方法。 Executing the error detection and elimination algorithm includes comparing the unit value with a data group of allowable unit values, and the predetermined unit value becomes a data group of the allowable unit values. If not, the error detection algorithm, component concentration measuring method according to claim 46, wherein displaying said code contains an error. 前記エラー検出及び排除アルゴリズムを実行することは、
前記少なくとも１つのコードに含まれるエラーを検出すること、及び、
前記テスト測定器にて該エラーを自動的に表示すること、
を含んで構成される請求項３７記載の成分濃度測定方法。 Performing the error detection and elimination algorithm includes
Detecting an error contained in the at least one code; and
Automatically displaying the error on the test instrument ;
38. The component concentration measuring method according to claim 37 , comprising: 前記少なくとも１つのコードは、ハミングコードを含む請求項３７記載の成分濃度測定方法。 38. The component concentration measurement method according to claim 37 , wherein the at least one code includes a Hamming code. 物理的な配列にて配置された複数のビットを含んで構成される第１のコードを含む診断テストストリップを装置が読取る場合に生じ得る潜在的エラーの影響を最小化する方法であって、
各ビットが読取エラーを引き起こす確率を決定すること、
該確率に基づいて、前記物理的な配列と異なるビットの論理配列を構成すること、
を含んで構成され、
該論理配列は、潜在的な読取エラーの影響が最小化されるように配列されたビットを含んで構成されるエラー影響最小化方法。 A method for minimizing the effects of potential errors that can occur when a device reads a diagnostic test strip that includes a first code that is configured to include a plurality of bits arranged in a physical arrangement, comprising:
Determining the probability that each bit causes a read error;
Constructing a logical array of bits different from the physical array based on the probability;
Comprising
The method for minimizing error effects, wherein the logical array comprises bits arranged so that the effects of potential read errors are minimized. 前記論理配列は、読取エラーを引き起こす確率が最も高いビットを、読取エラーを引き起こす確率が最も低いビットと論理的に置き換え、かつ、読取エラーを引き起こす確率が最も低いビットを、読取エラーを引き起こす確率が最も高いビットと論理的に置き換えて配列されたビットを含んで構成される請求項５２記載のエラー影響最小化方法。 The logical array logically replaces the bit with the highest probability of causing a read error with the bit with the lowest probability of causing a read error, and the bit with the lowest probability of causing a read error has a probability of causing a read error. 53. The error effect minimizing method according to claim 52 , comprising bits arranged by logical replacement with the highest bit. 前記論理配列は、順に読取られる第２のコードになる請求項５３記載のエラー影響最小化方法。 54. The error effect minimizing method according to claim 53 , wherein the logical array is a second code read sequentially. 前記論理配列は、順には読取られない第２のコードになる請求項５３記載のエラー影響最小化方法。

54. The error effect minimizing method according to claim 53 , wherein the logical array is a second code that is not read sequentially.

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