JP2010515325A5 - - Google Patents

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JP2010515325A5
JP2010515325A5 JP2009543514A JP2009543514A JP2010515325A5 JP 2010515325 A5 JP2010515325 A5 JP 2010515325A5 JP 2009543514 A JP2009543514 A JP 2009543514A JP 2009543514 A JP2009543514 A JP 2009543514A JP 2010515325 A5 JP2010515325 A5 JP 2010515325A5
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Japan
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array
output
correction
individual
common
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JP2009543514A
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Japanese (ja)
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JP5091250B2 (ja
JP2010515325A (ja
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Priority claimed from GBGB0625936.0A external-priority patent/GB0625936D0/en
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JP2009543514A 2006-12-28 2007-12-21 センサアレイのレスポンスの不均一性の補正 Active JP5091250B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0625936.0A GB0625936D0 (en) 2006-12-28 2006-12-28 Correction of non-uniformity of response in sensor arrays
GB0625936.0 2006-12-28
PCT/GB2007/004962 WO2008081165A1 (en) 2006-12-28 2007-12-21 Correction of non-uniformity of response in sensor arrays

Publications (3)

Publication Number Publication Date
JP2010515325A JP2010515325A (ja) 2010-05-06
JP2010515325A5 true JP2010515325A5 (https=) 2010-12-16
JP5091250B2 JP5091250B2 (ja) 2012-12-05

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JP2009543514A Active JP5091250B2 (ja) 2006-12-28 2007-12-21 センサアレイのレスポンスの不均一性の補正

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US (1) US8645104B2 (https=)
EP (1) EP2127359B8 (https=)
JP (1) JP5091250B2 (https=)
ES (1) ES2508941T3 (https=)
GB (2) GB0625936D0 (https=)
WO (1) WO2008081165A1 (https=)

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US10996542B2 (en) * 2012-12-31 2021-05-04 Flir Systems, Inc. Infrared imaging system shutter assembly with integrated thermister
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FR3020735B1 (fr) * 2014-04-30 2017-09-15 Ulis Procede de traitement d'une image infrarouge pour une correction des non uniformites
US10842147B2 (en) 2014-11-26 2020-11-24 Microban Products Company Surface disinfectant with residual biocidal property
US10834922B2 (en) 2014-11-26 2020-11-17 Microban Products Company Surface disinfectant with residual biocidal property
FR3038194B1 (fr) * 2015-06-26 2017-08-11 Ulis Correction de pixels parasites dans un capteur d'image infrarouge
FR3038195B1 (fr) 2015-06-26 2018-08-31 Ulis Detection de pixels parasites dans un capteur d'image infrarouge
CN105371964B (zh) * 2015-12-05 2018-08-17 中国航空工业集团公司洛阳电光设备研究所 红外探测器在全温响应范围内消除非均匀性的方法和装置
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CN108426640B (zh) * 2018-02-28 2019-05-10 北京理工大学 一种针对红外探测器缺损像元的校正方法
FR3082346B1 (fr) * 2018-06-08 2020-10-23 Ulis Dispositif et procede de compensation de chaleur parasite dans une camera infrarouge
EP3879248A1 (en) * 2018-11-05 2021-09-15 Sony Group Corporation Temperature estimating device, temperature estimating method, and temperature estimating program
KR102164603B1 (ko) * 2019-03-05 2020-10-13 동국대학교 산학협력단 센서의 개체차 보정 방법 및 이를 이용한 센서의 사용 방법
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CN112504469B (zh) * 2020-11-22 2022-09-02 中国航空工业集团公司洛阳电光设备研究所 一种多段系数自适应切换的红外图像非均匀校正方法
FR3153958B1 (fr) 2023-10-06 2025-09-12 Safran Electronics & Defense Méthode de correction d'un défaut de vignettage dans une séquence d'images à partir de tables d'étalonnage
CN118376740B (zh) * 2024-06-24 2024-10-22 众信方智(苏州)智能技术有限公司 一种井下气体传感器自动调校装置
CN119251109B (zh) * 2024-09-29 2026-02-24 北京市遥感信息研究所 一种自适应超大视场红外图像非均匀性校正方法
CN119290171B (zh) * 2024-12-13 2025-03-04 西安高商智能科技有限责任公司 一种电阻阵列红外成像的温度补偿方法

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